MOTOROLA MCM6206BBEJ25R

MOTOROLA
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by MCM6206BB/D
SEMICONDUCTOR TECHNICAL DATA
MCM6206BB
Product Preview
32K x 8 Bit Fast Static RAM
The MCM6206BB is a 262,144 bit static random access memory organized as
32,768 words of 8 bits. Static design eliminates the need for external clocks or
timing strobes, while CMOS circuitry reduces power consumption and provides
for greater reliability.
This device meets JEDEC standards for functionality and pinout, and is available in plastic small–outline J–leaded packages.
•
•
•
•
•
Single 5 V ± 10% Power Supply
Fully Static — No Clock or Timing Strobes Necessary
Fast Access Times: 12/15/20/25 ns
Equal Address and Chip Enable Access Times
Output Enable (G) Feature for Increased System Flexibility and to
Eliminate Bus Contention Problems
• Low Power Operation: 125 – 140 mA Maximum AC
• Fully TTL Compatible — Three State Output
PIN ASSIGNMENT
BLOCK DIAGRAM
A
VCC
A
VSS
A
A
ROW
DECODER
A
MEMORY MATRIX
A
J PACKAGE
300 MIL SOJ
CASE
810B–03
A
1
28
V CC
A
2
27
W
A
3
26
A
A
4
25
A
A
5
24
A
A
6
23
A
A
7
22
G
A
8
21
A
A
9
20
E
A
10
19
DQ
DQ
11
18
DQ
DQ
12
17
DQ
DQ
13
16
DQ
VSS
14
15
DQ
A
A
PIN NAMES
A
DQ
INPUT
DATA
CONTROL
DQ
E
W
G
..
.
A . . . . . . . . . . . . . . . . . . . . Address Input
DQ . . . . . . . . . . Data Input/Data Output
W . . . . . . . . . . . . . . . . . . . . Write Enable
G . . . . . . . . . . . . . . . . . . . Output Enable
E . . . . . . . . . . . . . . . . . . . . . . Chip Enable
VCC . . . . . . . . . . . Power Supply (+ 5 V)
VSS . . . . . . . . . . . . . . . . . . . . . . . Ground
COLUMN I/O
COLUMN DECODER
A
A
A
A
A
A
CIRCUIT
CONTROL
This document contains information on a product under development. Motorola reserves the right to change or discontinue this product without notice.
6/4/97
 Motorola, Inc. 1997
MOTOROLA
FAST SRAM
MCM6206BB
1
TRUTH TABLE (X = Don’t Care)
E
G
W
Mode
VCC Current
Output
Cycle
ISB1, ISB2
ICCA
High–Z
–
High–Z
–
ICCA
ICCA
Dout
High–Z
Read Cycle
H
X
X
Not Selected
L
H
H
Output Disabled
L
L
H
Read
L
X
L
Write
Write Cycle
ABSOLUTE MAXIMUM RATINGS
Rating
Symbol
Value
Unit
VCC
– 0.5 to + 7.0
V
Vin, Vout
– 0.5 to VCC + 0.5
V
Output Current
Iout
± 20
mA
Power Dissipation
PD
1.0
W
Tbias
– 10 to + 85
°C
TA
0 to + 70
°C
Power Supply Voltage
Voltage Relative to VSS For Any Pin
Except VCC
Temperature Under Bias
Ambient Temperature
This device contains circuitry to protect the
inputs against damage due to high static voltages or electric fields; however, it is advised
that normal precautions be taken to avoid
application of any voltage higher than maximum rated voltages to this high–impedance
circuit.
This CMOS memory circuit has been designed to meet the dc and ac specifications
shown in the tables, after thermal equilibrium
has been established. The circuit is in a test
socket or mounted on a printed circuit board
and transverse air flow of at least 500 linear
feet per minute is maintained.
Storage Temperature—Plastic
Tstg
– 55 to + 125
°C
NOTE: Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are
exceeded. Functional operation should be restricted to RECOMMENDED OPERATING CONDITIONS. Exposure to higher than recommended voltages for extended periods of time could affect device reliability.
DC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ±10%, TA = 0 to 70°C, Unless Otherwise Noted)
RECOMMENDED OPERATING CONDITIONS
Parameter
Symbol
Min
Typ
Max
Unit
Supply Voltage (Operating Voltage Range)
VCC
4.5
5.0
5.5
V
Input High Voltage
VIH
2.2
—
VCC + 0.3**
V
Input Low Voltage
VIL
– 0.5*
—
0.8
V
Symbol
Min
Max
Unit
Input Leakage Current (All Inputs, Vin = 0 to VCC)
Ilkg(I)
—
±1
µA
Output Leakage Current (E = VIH or G = VIH, Vout = 0 to VCC)
Ilkg(O)
—
±1
µA
Output High Voltage (IOH = – 4.0 mA)
VOH
2.4
—
V
Output Low Voltage (IOL = 8.0 mA)
VOL
—
0.4
V
* VIL (min) = – 0.5 V dc; VIL (min) = – 2.0 V ac (pulse width ≤ 20 ns)
** VIH (max) = VCC + 0.3 V dc; VIH (max) = VCC + 2.0 V ac (pulse width ≤ 20 ns)
DC CHARACTERISTICS
Parameter
POWER SUPPLY CURRENTS
Parameter
Symbol
– 12
– 15
– 20
– 25
Unit
AC Active Supply Current (Iout = 0 mA, VCC = Max, f = fmax)
ICCA
140
135
130
125
mA
AC Standby Current (E = VIH, VCC = Max, f = fmax)
ISB1
40
35
35
30
mA
CMOS Standby Current (VCC = Max, f = 0 MHz, E ≥ VCC – 0.2 V
Vin ≤ VSS + 0.2 V, or ≥ VCC – 0.2 V)
ISB2
10
10
10
10
mA
CAPACITANCE (f = 1 MHz, dV = 3 V, TA = 25°C, Periodically sampled rather than 100% tested)
Symbol
Max
Unit
Address Input Capacitance
Cin
6
pF
Control Pin Input Capacitance (E, G, W)
Cin
8
pF
I/O Capacitance
CI/O
8
pF
Characteristic
MCM6206BB
2
MOTOROLA FAST SRAM
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V ± 10%, TA = 0 to + 70°C, Unless Otherwise Noted)
Input Timing Measurement Reference Level . . . . . . . . . . . . . . . 1.5 V
Input Pulse Levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 to 3.0 V
Input Rise/Fall Time . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 ns
Output Timing Measurement Reference Level . . . . . . . . . . . . . 1.5 V
Output Load . . . . . . . . . . . . . . . . . . Figure 1 Unless Otherwise Noted
READ CYCLE (See Note 1)
– 12
Parameter
– 15
– 20
– 25
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
Read Cycle Time
tAVAV
12
—
15
—
20
—
25
—
ns
2
Address Access Time
tAVQV
—
12
—
15
—
20
—
25
ns
Enable Access Time
tELQV
—
12
—
15
—
20
—
25
ns
Output Enable Access Time
tGLQV
—
6
—
8
—
10
—
12
ns
Output Hold from Address Change
tAXQX
3
—
3
—
3
—
3
—
ns
4,5,6
Enable Low to Output Active
tELQX
4
—
4
—
4
—
4
—
ns
4,5,6
Enable High to Output High–Z
tEHQZ
—
7
—
8
—
9
—
10
ns
4,5,6
Output Enable Low to Output Active
tGLQX
0
—
0
—
0
—
0
—
ns
4,5,6
Output Enable High to Output High–Z
tGHQZ
—
6
—
7
—
8
—
10
ns
4,5,6
Power Up Time
tELICCH
0
—
0
—
0
—
0
—
ns
Power Down Time
tEHICCL
—
12
—
15
—
20
—
25
ns
3
NOTES:
1. W is high for read cycle.
2. All timings are referenced from the last valid address to the first transitioning address.
3. Addresses valid prior to or coincident with E going low.
4. At any given voltage and temperature, tEHQZ (max) is less than tELQX (min), and tGHQZ (max) is less than tGLQX (min), both for a given
device and from device to device.
5. Transition is measured ±500 mV from steady–state voltage.
6. This parameter is sampled and not 100% tested.
7. Device is continuously selected (E = VIL, G = VIL).
TIMING LIMITS
Z0 = 50 Ω
OUTPUT
50 Ω
VL = 1.5 V
The table of timing values shows either a
minimum or a maximum limit for each parameter. Input requirements are specified from
the external system point of view. Thus, address setup time is shown as a minimum
since the system must supply at least that
much time. On the other hand, responses
from the memory are specified from the device point of view. Thus, the access time is
shown as a maximum since the device never
provides data later than that time.
Figure 1. AC Test Loads
MOTOROLA FAST SRAM
MCM6206BB
3
READ CYCLE 1 (See Note 7)
tAVAV
A (ADDRESS)
tAXQX
Q (DATA OUT)
PREVIOUS DATA VALID
DATA VALID
tAVQV
READ CYCLE 2 (See Note 3)
tAVAV
A (ADDRESS)
tAVQV
tELQV
E (CHIP ENABLE)
tEHQZ
tELQX
G (OUTPUT ENABLE)
tGHQZ
tGLQV
tGLQX
Q (DATA OUT)
ICC
HIGH Z
tELICCH
HIGH Z
DATA VALID
tEHICCL
VCC
SUPPLY CURRENT
ISB
MCM6206BB
4
MOTOROLA FAST SRAM
WRITE CYCLE 1 (W Controlled, See Notes 1 and 2)
– 12
Parameter
Write Cycle Time
– 15
– 20
– 25
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Unit
Notes
tAVAV
12
—
15
—
20
—
25
—
ns
3
Address Setup Time
tAVWL
0
—
0
—
0
—
0
—
ns
Address Valid to End of Write
tAVWH
10
—
12
—
15
—
20
—
ns
Write Pulse Width
tWLWH,
tWLEH
10
—
12
—
15
—
20
—
ns
Write Pulse Width,
G High
tWLWH,
tWLEH
10
—
10
—
12
—
15
—
ns
Data Valid to End of Write
tDVWH
6
—
7
—
8
—
10
—
ns
Data Hold Time
tWHDX
0
—
0
—
0
—
0
—
ns
Write Low to Output High–Z
tWLQZ
—
6
—
7
—
8
—
10
ns
5,6,7
Write High to Output Active
tWHQX
2
—
2
—
2
—
2
—
ns
5,6,7
Write Recovery Time
tWHAX
0
—
0
—
0
—
0
—
ns
4
NOTES:
1. A write occurs during the overlap of E low and W low.
2. If G goes low coincident with or after W goes low, the output will remain in a high impedance state.
3. All timings are referenced from the last valid address to the first transitioning address.
4. If G ≥ VIH, the output will remain in a high impedance state.
5. At any given voltage and temperature, tWLQZ (max) is less than tWHQX (min), both for a given device and from device to device.
6. Transition is measured ±500 mV from steady–state voltage.
7. This parameter is sampled and not 100% tested.
WRITE CYCLE 1 (W Controlled, See Notes 1 and 2)
tAVAV
A (ADDRESS)
tWHAX
tAVWH
E (CHIP ENABLE)
tWLWH
tWLEH
W (WRITE ENABLE)
tAVWL
tDVWH
D (DATA IN)
DATA VALID
tWLQZ
Q (DATA OUT)
MOTOROLA FAST SRAM
tWHDX
HIGH Z
tWHQX
HIGH Z
MCM6206BB
5
WRITE CYCLE 2 (E Controlled, See Note 1)
– 12
Parameter
Write Cycle Time
– 15
– 20
– 25
Symbol
Min
Max
Min
Max
Min
Max
Min
Max
Unit
tAVAV
12
—
15
—
20
—
25
—
ns
Address Setup Time
tAVEL
0
—
0
—
0
—
0
—
ns
Address Valid to End of Write
tAVEH
10
—
12
—
15
—
20
—
ns
Enable to End of Write
tELEH,
tELWH
9
—
10
—
12
—
15
—
ns
Data Valid to End of Write
tDVEH
6
—
7
—
8
—
10
—
ns
Data Hold Time
tEHDX
0
—
0
—
0
—
0
—
ns
Write Recovery Time
tEHAX
0
—
0
—
0
—
0
—
ns
Notes
3,4
NOTES:
1. A write occurs during the overlap of E low and W low.
2. All timings are referenced from the last valid address to the first transitioning address.
3. If E goes low coincident with or after W goes low, the output will remain in a high impedance state.
4. If E goes high coincident with or before W goes high, the output will remain in a high impedance state.
WRITE CYCLE 2 (E Controlled, See Note 1)
tAVAV
A (ADDRESS)
tAVEH
E (CHIP ENABLE)
tELEH
tELWH
tAVEL
tEHAX
tWLEH
W (WRITE ENABLE)
tDVEH
D (DATA IN)
Q (DATA OUT)
MCM6206BB
6
tEHDX
DATA VALID
HIGH Z
MOTOROLA FAST SRAM
ORDERING INFORMATION
(Order by Full Part Number)
MCM 6206BB
EJ
XX
X
Motorola Memory Prefix
Shipping Method (R = Tape and Reel, Blank = Rails)
Part Number
Speed (12 = 12 ns, 15 = 15 ns, 20 = 20 ns,
25 = 25 ns)
Package (J = 300 mil SOJ, E = Evolutionary Pinout)
Full Part Numbers — MCM6206BBEJ12
MCM6206BBEJ15
MCM6206BBEJ20
MCM6206BBEJ25
MOTOROLA FAST SRAM
MCM6206BBEJ12R
MCM6206BBEJ15R
MCM6206BBEJ20R
MCM6206BBEJ25R
MCM6206BB
7
PACKAGE DIMENSIONS
CASE 810B–03
300 MIL SOJ
28 LEAD
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. DIMENSION A & B DO NOT INCLUDE MOLD
PROTRUSION. MOLD PROTRUSION SHALL NOT
EXCEED 0.15 (0.006) PER SIDE.
3. CONTROLLING DIMENSION: INCH.
4. DIM R TO BE DETERMINED AT DATUM -T-.
F
DETAIL Z
28
15
N
1
D 24 PL
14
0.18 (0.007)
-A-
M
T A
0.18 (0.007)
H BRK
S
S
T
B
S
P
-B-
L
G
M
M
E
C
0.10 (0.004)
K
DETAIL Z
-T-
SEATING PLANE
S RAD
R
0.25 (0.010)
S
T B
S
DIM
A
B
C
D
E
F
G
H
K
L
M
N
P
R
S
INCHES
MIN
MAX
0.720 0.730
0.295 0.305
0.128 0.148
0.015 0.020
0.088 0.098
0.026 0.032
0.050 BSC
0.020
—
0.035 0.045
0.025 BSC
0°
10°
0.030 0.045
0.330 0.340
0.260 0.270
0.030 0.040
MILLIMETERS
MIN
MAX
18.29 18.54
7.74
7.50
3.75
3.26
0.50
0.39
2.48
2.24
0.81
0.67
1.27 BSC
0.50
—
1.14
0.89
0.64 BSC
0°
10°
1.14
0.76
8.64
8.38
6.86
6.60
1.01
0.77
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the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and
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MCM6206BB
8
◊
MOTOROLA MCM6206BB/D
FAST SRAM