STMICROELECTRONICS HCF40110BEY

HCC40110B
HCF40110B
DECADE UP-DOWN COUNTER/DECODER/LATCH/DRIVER
.
.
.
.
.
..
..
SEPARATE CLOCK-UP AND CLOCK-DOWN
LINES
CAPABLE OF DRIVING COMMON CATHODE
LEDS AND OTHER DISPLAYS DIRECTLY
ALLOWS CASCADING WITHOUT ANY EXTERNAL CIRCUITRY
MAXIMUM INPUT CURRENT OF 1 µA AT 18 V
(full package-temperature range)
QUIESCENT CURRENT AT 20 V FOR HCC DEVICE
5 V, 10 V AND 15 V PARAMETRIC RATINGS
INPUT CURRENT OF 100 nA AT 18 V AND
25 °C FOR HCC DEVICE
100 % TESTED FOR QUIESCENT CURRENT
MEETS ALL REQUIREMENTS OF JEDEC TENTATIVE STANDARD No. 13 A, ”STANDARD
SPECIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
DESCRIPTION
The HCC 40110B (extended temperature range)
and HCF 40110B (intermediate temperature range)
are monolithic integrated circuits, available in 16lead dual in-line plastic or ceramic package. The
HCC/HCF 40110B is a dual-clocked up/down
counter with a special preconditioning circuit that
allows the counter to be clocked, via positive going
inputs, up or down regardless of that state or timing
(within 100 ns typ.) of the other clock line. The clock
signal is fed into the control logic and Johnson
counter after is preconditioned. The outputs of the
Johnson counter (which include antilock gating to
avoid being locked at an illegal state) are fed into a
latch. This data can be fed directly to the decoder
through the latch or can be strobed to hold a particular count while the Johnson counter continues to be
clocked. The decoder feeds a seven-segment bipolar output driver which can source up to 25 mA to
drive LEDs and other displays such as low-voltage
fluorescent and incandescent lamps. A short duration negative-going pulse appears on the BORROW
output when the count changes from 0 to 9 or the
CARRY output when the count changes from 9 to
0. At the other times the BORROW and CARRY output are a logic 1. The CARRY and BORROW outputs can be tied directly to the clock-up and
clock-down lines respectively of another HCC/HCF
40110B for easy cascading of several counters.
September 1988
EY
(Plastic Package)
F
(Ceramic Package)
C1
(Chip Carrier)
ORDER CODES :
HCC40110BF
HCF40110BEY
HCF40110BC1
PIN CONNECTIONS
1/11
HCC/HCF40110B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATING
Symbol
VDD *
Vi
Parameter
Supply Voltage: HCC Types
HCF Types
Input Voltage
II
Value
-0.5 to +20
-0.5 to +18
-0.5 to VDD + 0.5
Unit
V
V
V
DC Input Current (any one input)
± 10
mA
Ptot
Total Power Dissipation (per package)
Dissipation per Output Transistor
for Top = Full Package Temperature Range
200
mW
100
mW
Top
Operating Temperature: HCC Types
HCF Types
Storage Temperature
Tstg
-55 to +125
-40 to +85
-65 to +150
o
C
C
o
C
o
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress ratingonly and functional
operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
VDD
VI
Top
2/11
Parameter
Supply Voltage: HCC Types
HCF Types
Input Voltage
Operating Temperature: HCC Types
HCF Types
Value
3 to 18
3 to 15
0 to VDD
-55 to +125
-40 to +85
Unit
V
V
V
o
o
C
C
HCC/HCF40110
LOGIC DIAGRAMS
3/11
HCC/HCF40110B
LOGIC DIAGRAM (continued)
DISPLAY SEGMENTS
Ouptut Low (sink) Current Characterisitcs.
TRUTH TABLE
CLOCK UP*
CLOCK
DOWN*
LATCH
ENABLE
TOGGLE
ENABLE
RESET
X
0
0
0
Increments by 1 Follows Counter
0
0
0
Decrement by 1 Follows Counter
X
X
0
No Change
No Change
X
COUNTER
X
X
X
X
1
Goes to 00000
Follows Counter
(Display = 0 )
X
X
X
1
0
Inhibited
Remains Fixed
X
1
0
0
Increments by 1
Remains Fixed
1
0
0
Decrement by 1
Remains Fixed
X
x = Don’t care 1 = High State 2 = Low State
* Typically 100 ns between clock-up and clock-down positive transitions are required to ensure proper counting
4/11
DISPLAY
HCC/HCF40110
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Test Conditios
Symbol
IL
Parameter
Quiescent
Current
HCC
Types
HCF
Types
V OH
VOL
Output High
Voltage
Output Low
Voltage
VI
(V)
VO
(V)
|IO| VDD
(µA) (V)
V IL
IOL
0.04
5
150
0/10
0/15
10
15
10
15
0.04
0.04
10
20
300
600
0/20
20
20
0.48
100
3000
0/5
5
5
0.04
20
150
0/10
10
10
0.04
40
300
0/15
0/5
15
5
15
0.04
4.95
80
600
0/10
10
0/15
5/0
15
5
0.05
10/0
10
0.05
Input Low
Voltage
HCF
Types
IIH, IIL
CI
Input
Leakage
Current
0
0.05
0
0.05
0.05
15
5
3.5
3.5
3.5
1/8.8
10
7
7
7
1.5/3.8
0.5/3.8
15
5
11
1/8.8
11
11
1.5
1.5
10
3
3
3
15
5
4
4
4
0
10
5
4.13
25
0
5
10
3.64
9.55
10
10
9.25
25
0
10
15
8.85
14.55
10
15
14.21
25
V
0.51
13.9
1
0.36
0/10
0.5
10
1.6
1.3
2.6
0.9
0/15
0/5
1.5
0.4
15
5
4.2
0.52
3.4
0.44
6.8
1
2.4
0.36
0/10
0.5
10
1.3
1.1
2.6
0.9
0/15
1.5
15
3.6
3.0
6.8
2.4
mA
18
±0.1
±10-5
±0.1
±1
15
±0.3
±10-5
±0.3
±1
5
7.5
Any Input
Any Input
V
4.55
0.64
0/15
V
1.5
15
5
HCF
Types
V
0.05
0.4
0/18
µA
0.05
0/5
HCC
Types
Input Capacitance
14.55
0
0.05
0.05
Unit
V
9.55
0.5/3.8
Output Drive
Voltage
(for HCC/HCF)
HCC
Types
THIGH *
Min. Max.
5
Input High
Voltage
Output
Sink
Current
25 oC
Min. Typ. Max.
5
1.5/3.8
VOL
TLOW *
Min. Max.
0/5
15/0
VIH
Value
µA
pF
* TLOW = -55 oC for HCC device: -40 oC for HCF device.
* THIGH = +125 oC for HCC device: +85 oC for HCF device.
The Noise Margin for both ”1” and ”0” level is: 1V min. with VDD = 5 V, 2 V min. with VDD = 10 V, 2.5 V min. with VDD = 15 V
5/11
HCC/HCF40110B
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25 o C, C L = 50 pF, RL = 200 KΩ,
o
typical temperature coefficent for all VDD values is 03 %/ C, all input rise and fall times= 20 ns)
Symbol
Parameter
Test Conditions
VDD (V)
Min.
Value
Typ.
Max.
Unit
CLOCK UP/CLOCK DOWN
tW
fCL
Pulse Width
Maximum Frequency
tWC
Carry Pulse Width
tWB
Borrow Pulse Width
5
10
85
35
15
15
5
10
2.5
5
15
8
5
10
225
100
15
70
5
10
260
110
15
80
ns
MHz
ns
RESET
tPLH
tPHL
Propagation Delay Time
Reset to Clock
Delay from Reset to First Allowable Clock
tW
Pulse Width
5
750
10
15
285
200
5
300
10
15
125
75
5
150
10
15
60
40
TEST CIRCUITS
Quiescent Device Current.
6/11
Noise Immunity.
ns
HCC/HCF40110
TEST CIRCUITS
Input Leakage Current.
7/11
HCC/HCF40110B
Plastic DIP16 (0.25) MECHANICAL DATA
mm
DIM.
MIN.
a1
0.51
B
0.77
TYP.
inch
MAX.
MIN.
TYP.
MAX.
0.020
1.65
0.030
0.065
b
0.5
0.020
b1
0.25
0.010
D
20
0.787
E
8.5
0.335
e
2.54
0.100
e3
17.78
0.700
F
7.1
0.280
I
5.1
0.201
L
Z
3.3
0.130
1.27
0.050
P001C
8/11
HCC/HCF40110
Ceramic DIP16/1 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
20
0.787
B
7
0.276
D
E
3.3
0.130
0.38
e3
0.015
17.78
0.700
F
2.29
2.79
0.090
0.110
G
0.4
0.55
0.016
0.022
H
1.17
1.52
0.046
0.060
L
0.22
0.31
0.009
0.012
M
0.51
1.27
0.020
0.050
N
P
Q
10.3
7.8
8.05
5.08
0.406
0.307
0.317
0.200
P053D
9/11
HCC/HCF40110B
PLCC20 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
9.78
10.03
0.385
0.395
B
8.89
9.04
0.350
0.356
D
4.2
4.57
0.165
0.180
d1
2.54
0.100
d2
0.56
0.022
E
7.37
8.38
0.290
0.330
e
1.27
0.050
e3
5.08
0.200
F
0.38
0.015
G
0.101
0.004
M
1.27
0.050
M1
1.14
0.045
P027A
10/11
HCC/HCF40110
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use ascritical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
 1994 SGS-THOMSON Microelectronics - All Rights Reserved
SGS-THOMSON Microelectronics GROUP OF COMPANIES
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11/11