STMICROELECTRONICS STP16NK60Z-S

STP16NK60Z - STB16NK60Z-S
STW16NK60Z
N-CHANNEL 600V - 0.38Ω - 14A TO-220 / I2SPAK / TO-247
Zener-Protected SuperMESH™ MOSFET
TYPE
STP16NK60Z
STB16NK60Z-S
STW16NK60Z
■
■
■
■
■
■
VDSS
RDS(on)
ID
Pw
600 V
600 V
600 V
< 0.42 Ω
< 0.42 Ω
< 0.42 Ω
14 A
14 A
14 A
190 W
190 W
190 W
TYPICAL RDS(on) = 0.38 Ω
EXTREMELY HIGH dv/dt CAPABILITY
100% AVALANCHE TESTED
GATE CHARGE MINIMIZED
VERY LOW INTRINSIC CAPACITANCES
VERY GOOD MANUFACTURING
REPEATIBILITY
3
12
3
1
2
I2SPAK
TO-220
3
2
1
TO-247
DESCRIPTION
The SuperMESH™ series is obtained through an
extreme optimization of ST’s well established stripbased PowerMESH™ layout. In addition to pushing
on-resistance significantly down, special care is taken to ensure a very good dv/dt capability for the
most demanding applications. Such series complements ST full range of high voltage MOSFETs including revolutionary MDmesh™ products.
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ HIGH CURRENT, HIGH SPEED SWITCHING
■ IDEAL FOR OFF-LINE POWER SUPPLIES
ORDER CODE
PART NUMBER
MARKING
PACKAGE
PACKAGING
STP16NK60Z
P16NK60Z
TO-220
TUBE
STB16NK60Z-S
B16NK60Z
I2SPAK
TUBE
STW16NK60Z
W16NK60Z
TO-247
TUBE
March 2004
1/11
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Parameter
Value
Unit
Drain-source Voltage (VGS = 0)
600
V
Drain-gate Voltage (RGS = 20 kΩ)
600
V
Gate- source Voltage
± 30
V
ID
Drain Current (continuous) at TC = 25°C
14
A
ID
Drain Current (continuous) at TC = 100°C
8.8
A
Drain Current (pulsed)
56
A
IDM ()
PTOT
VESD(G-S)
dv/dt (1)
Tj
Tstg
Total Dissipation at TC = 25°C
190
W
Derating Factor
1.51
W/°C
Gate source ESD (HBM-C= 100pF, R= 1.5KΩ)
6000
V
4.5
V/ns
-55 to 150
°C
Peak Diode Recovery voltage slope
Operating Junction Temperature
Storage Temperature
( ) Pulse width limited by safe operating area
(1) ISD ≤ 14 A, di/dt ≤ 200 A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX.
(*) Limited only by maximum temperature allowed
THERMAL DATA
TO-220/ I²SPAK
Rthj-case
Thermal Resistance Junction-case Max
Rthj-amb
Thermal Resistance Junction-ambient Max
Tl
TO-247
0.66
62.5
Maximum Lead Temperature For Soldering Purpose
°C/W
50
°C/W
300
°C
Max Value
Unit
AVALANCHE CHARACTERISTICS
Symbol
Parameter
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
14
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
360
mJ
GATE-SOURCE ZENER DIODE
Symbol
Parameter
Test Conditions
Min.
BVGSO
Gate-Source Breakdown
Voltage
Igs=± 1mA (Open Drain)
30
Typ.
Max.
Unit
V
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
2/11
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OTHERWISE SPECIFIED)
ON/OFF
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Drain-source
Breakdown Voltage
ID = 1 mA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating, TC = 125 °C
1
50
µA
µA
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20V
±10
µA
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 100 µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 7 A
V(BR)DSS
600
Unit
3
V
3.75
4.5
V
0.38
0.42
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
gfs (1)
Ciss
Coss
Crss
Coss eq. (3)
Parameter
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
Test Conditions
Min.
VDS = 15 V, ID = 7 A
VDS = 25V, f = 1 MHz, VGS = 0
12
S
2650
285
62
pF
pF
pF
Equivalent Output
Capacitance
VGS = 0V, VDS = 0V to 480V
158
pF
td(on)
tr
td(off)
tf
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
VDD = 480 V, ID = 14 A
RG = 4.7Ω VGS = 10 V
(Resistive Load see, Figure 3)
30
25
70
15
ns
ns
ns
ns
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD = 480V, ID = 14 A,
VGS = 10V
86
17
46
nC
nC
nC
SOURCE DRAIN DIODE
Symbol
Parameter
ISD
ISDM (2)
Source-drain Current
Source-drain Current (pulsed)
VSD (1)
Forward On Voltage
ISD = 14 A, VGS = 0
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 14 A, di/dt = 100 A/µs
VDD = 100 V, Tj = 25°C
(see test circuit, Figure 5)
490
5.4
22
ns
µC
A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 14 A, di/dt = 100 A/µs
VDD = 100 V, Tj = 150°C
(see test circuit, Figure 5)
585
7
24
ns
µC
A
trr
Qrr
IRRM
trr
Qrr
IRRM
Test Conditions
Min.
Typ.
Max.
Unit
14
56
A
A
1.6
V
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80%
VDSS.
3/11
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
Safe Operating Area for TO-220/I²SPAK
Thermal Impedance for TO-220/I²SPAK
Safe Operating Area for TO-247
Thermal Impedance for TO-247
Output Characteristics
4/11
Transfer Characteristics
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
5/11
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
Source-drain Diode Forward Characteristics
Maximum Avalanche Energy vs Temperature
6/11
Normalized BVDSS vs Temperature
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
7/11
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
TO-220 MECHANICAL DATA
DIM.
8/11
mm.
MIN.
TYP
inch
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
b
0.61
0.88
0.024
0.034
b1
1.15
1.70
0.045
0.066
c
0.49
0.70
0.019
0.027
D
15.25
15.75
0.60
0.620
E
10
10.40
0.393
0.409
e
2.40
2.70
0.094
0.106
e1
4.95
5.15
0.194
0.202
0.052
F
1.23
1.32
0.048
H1
6.20
6.60
0.244
0.256
J1
2.40
2.72
0.094
0.107
L
13
14
0.511
0.551
L1
3.50
3.93
0.137
0.154
L20
16.40
L30
28.90
0.645
1.137
øP
3.75
3.85
0.147
0.151
Q
2.65
2.95
0.104
0.116
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
I2SPAK MECHANICAL DATA
DIM.
mm.
MIN.
TYP
inch
MAX.
MIN.
TYP.
4.60
0.173
0.181
MAX.
0.106
A
4.40
A1
2.49
2.69
0.098
B
0.70
0.93
0.027
0.037
B2
1.14
1.70
0.045
0.067
0.024
C
0.45
0.60
0.018
C2
1.23
1.36
0.048
0.053
D
8.95
9.35
0.352
0.368
E
10.00
10.40
0.394
0.409
G
4.88
5.28
0.192
0.208
L
16.7
17.5
0.657
0.689
L2
1.27
1.4
0.05
0.055
L3
13.82
14.42
0.544
0.568
9/11
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
TO-247 MECHANICAL DATA
DIM.
mm.
MIN.
inch
MAX.
MIN.
TYP.
MAX.
A
4.85
5.15
0.19
0.20
A1
2.20
2.60
0.086
0.102
b
1.0
1.40
0.039
0.055
b1
2.0
2.40
0.079
0.094
0.134
b2
3.0
3.40
0.118
c
0.40
0.80
0.015
0.03
D
19.85
20.15
0.781
0.793
E
15.45
15.75
0.608
e
5.45
0.620
0.214
L
14.20
14.80
0.560
L1
3.70
4.30
0.14
L2
18.50
0.582
0.17
0.728
øP
3.55
3.65
0.140
0.143
øR
4.50
5.50
0.177
0.216
S
10/11
TYP
5.50
0.216
STP16NK60Z - STB16NK60Z-S - STW16NK60Z
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consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
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