STMICROELECTRONICS STQ1NK60ZR-AP

STD1LNK60Z-1
STQ1NK60ZR - STN1NK60Z
N-CHANNEL 600V 13Ω 0.8A TO-92/IPAK/SOT-223
Zener-Protected SuperMESH™MOSFET
Table 1: General Features
Figure 1: Package
TYPE
VDSS
RDS(on)
ID
Pw
STQ1NK60ZR
STD1LNK60Z-1
STN1NK60Z
600 V
600 V
600 V
< 15 Ω
< 15 Ω
< 15 Ω
0.3 A
0.8 A
0.3 A
3W
25 W
3.3 W
■
■
■
■
■
■
TYPICAL RDS(on) = 13Ω
EXTREMELY HIGH dv/dt CAPABILITY
ESD IMPROVED CAPABILITY
100% AVALANCHE TESTED
NEW HIGH VOLTAGE BENCHMARK
GATE CHARGE MINIMIZED
TO-92 (Ammopack)
TO-92
2
3
2
1
1
DESCRIPTION
The SuperMESH™ series is obtained through an
extreme optimization of ST’s well established
strip-based PowerMESH™ layout. In addition to
pushing on-resistance significantly down, special
care is taken to ensure a very good dv/dt capability
for the most demanding applications. Such series
complements ST full range of high voltage MOSFETs including revolutionary MDmesh™ products.
IPAK
2
3
SOT-223
Figure 2: Internal Schematic Diagram
APPLICATIONS
■ AC ADAPTORS AND BATTERY CHARGERS
■ SWITH MODE POWER SUPPLIES (SMPS)
Table 2: Order Codes
SALES TYPE
MARKING
PACKAGE
PACKAGING
STQ1NK60ZR
Q1NK60ZR
TO-92
BULK
STQ1NK60ZR-AP
Q1NK60ZR
TO-92
AMMOPAK
STD1LNK60Z-1
D1LNK60Z
IPAK
TUBE
STN1NK60Z
N1NK60Z
SOT-223
TAPE & REEL
Rev. 6
September 2005
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
Table 3: Absolute Maximum ratings
Symbol
Parameter
Value
IPAK
VDS
VDGR
VGS
TO-92
Unit
SOT-223
Drain-source Voltage (VGS = 0)
600
V
Drain-gate Voltage (RGS = 20 kΩ)
600
V
Gate- source Voltage
± 30
V
ID
Drain Current (continuous) at TC = 25°C
0.8
0.3
0.3
A
ID
Drain Current (continuous) at TC = 100°C
0.5
0.189
0.189
A
Drain Current (pulsed)
3.2
1.2
1.2
A
Total Dissipation at TC = 25°C
25
3
3.3
W
0.025
0.026
W/°C
IDM ( )
PTOT
Derating Factor
VESD(G-S)
dv/dt (1)
Tj
Tstg
0.24
Gate source ESD(HBM-C=100pF, R=1.5KΩ)
800
V
Peak Diode Recovery voltage slope
4.5
V/ns
-55 to 150
°C
Operating Junction Temperature
Storage Temperature
( ) Pulse width limited by safe operating area
(1) ISD ≤0.3A, di/dt ≤200A/µs, VDD ≤ V(BR)DSS, Tj ≤ TJMAX.
Table 4: Thermal Data
Rthj-case
Thermal Resistance Junction-case Max
Rthj-amb
Thermal Resistance Junction-ambient Max
Rthj-lead
Thermal Resistance Junction-lead Max
Tl
Maximum Lead Temperature For Soldering Purpose
IPAK
TO-92
SOT-223
5
--
--
°C/W
100
120
37.87(#)
°C/W
--
40
--
°C/W
275
260
260
°C
(#) When mounted on 1 inch² Fr-4 board, 2 Oz Cu
Table 5: Avalanche Characteristics
Symbol
Parameter
Max Value
Unit
IAR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by Tj max)
0.8
A
EAS
Single Pulse Avalanche Energy
(starting Tj = 25 °C, ID = IAR, VDD = 50 V)
60
mJ
Table 6: Gate-Source Zener Diode
Symbol
BVGSO
Parameter
Gate-Source Breakdown
Voltage
Test Conditions
Min.
Igs=± 1mA (Open Drain)
30
Typ.
Max.
Unit
V
PROTECTION FEATURES OF GATE-TO-SOURCE ZENER DIODES
The built-in back-to-back Zener diodes have specifically been designed to enhance not only the device’s
ESD capability, but also to make them safely absorb possible voltage transients that may occasionally be
applied from gate to source. In this respect the Zener voltage is appropriate to achieve an efficient and
cost-effective intervention to protect the device’s integrity. These integrated Zener diodes thus avoid the
usage of external components.
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
ELECTRICAL CHARACTERISTICS (TCASE =25°C UNLESS OTHERWISE SPECIFIED)
Table 7: On /Off
Symbol
V(BR)DSS
Parameter
Test Conditions
Min.
Typ.
Max.
600
Unit
Drain-source
Breakdown Voltage
ID = 1 mA, VGS = 0
IDSS
Zero Gate Voltage
Drain Current (VGS = 0)
VDS = Max Rating
VDS = Max Rating,
TC = 125 °C
1
50
µA
µA
IGSS
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20V
±10
µA
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 50 µA
RDS(on)
Static Drain-source On
Resistance
VGS = 10V, ID = 0.4 A
3
V
3.75
4.5
V
13
15
Ω
Typ.
Max.
Unit
Table 8: Dynamic
Symbol
gfs (1)
Ciss
Coss
Crss
Coss eq. (3)
Parameter
Test Conditions
Min.
Forward Transconductance
VDS = V, ID = 0.4 A
0.5
S
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 25V, f = 1 MHz, VGS = 0
94
17.6
2.8
pF
pF
pF
Equivalent Output
Capacitance
VGS = 0V, VDS = 0V to 480V
11
pF
ns
ns
ns
ns
td(on)
tr
td(off)
tf
Turn-on Delay Time
Rise Time
Turn-off-Delay Time
Fall Time
VDD = 300V, ID = 0.4 A
RG = 4.7Ω VGS = 10 V
(see Figure 21)
5.5
5
13
28
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD = 480V, ID = 0.8 A,
VGS = 10V
(see Figure 25)
4.9
1
2.7
6.9
nC
nC
nC
Typ.
Max.
Unit
0.8
2.4
A
A
1.6
V
Table 9: Source Drain Diode
Symbol
Parameter
ISD
ISDM (2)
Source-drain Current
Source-drain Current (pulsed)
VSD (1)
Forward On Voltage
ISD = 0.8A, VGS = 0
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 0.8 A, di/dt = 100A/µs
VDD = 20V, Tj = 25°C
(see Figure 23)
135
216
3.2
ns
nC
A
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 0.8 A, di/dt = 100A/µs
VDD = 20V, Tj = 150°C
(see Figure 23)
140
224
3.2
ns
nC
A
trr
Qrr
IRRM
trr
Qrr
IRRM
Test Conditions
Min.
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
3. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80%
VDSS.
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
Figure 3: Safe Operating Area for IPAK
Figure 6: Thermal Impedance for IPAK
Figure 4: Safe Operating Area for TO-92
Figure 7: Thermal Impedance for TO-92
Figure 5: Safe Operating Area for SOT-223
Figure 8: Thermal Impedance for SOT-223
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
Figure 9: Output Characteristics
Figure 12: Transfer Characteristics
Figure 10: Transconductance
Figure 13: Statis Drain-Source On Resistance
Figure 11: Gate Charge vs Gate-source Voltage
Figure 14: Capacitance Variation
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
Figure 15: Normalized Gate Thereshold Voltage vs Temperature
Figure 18: Normalized On Resistance vs Temperature
Figure 16: Source-Drain Diode Forward Characteristics
Figure 19: Normalized BVdss vs Temperature
Figure 17: Maximum Avalanche Energy vs
Temperature
Figure 20: Max Id Current vs Tc
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
Figure 21: Unclamped Inductive Load Test Circuit
Figure 24: Unclamped Inductive Wafeform
Figure 22: Switching Times Test Circuit For
Resistive Load
Figure 25: Gate Charge Test Circuit
Figure 23: Test Circuit For Inductive Load
Switching and Diode Recovery Times
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
In order to meet environmental requirements, ST offers these devices in ECOPACK® packages. These
packages have a Lead-free second level interconnect . The category of second level interconnect is
marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The
maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an
ST trademark. ECOPACK specifications are available at: www.st.com
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
TO-92 AMMOPACK
DIM.
mm.
MIN.
TYP
inch
MAX.
MIN.
TYP.
MAX.
A1
4.45
4.95
0.170
0.194
T
3.30
3.94
0.130
0.155
T1
1.6
T2
2.3
0.56
0.06
0.09
d
0.41
0.016
0.022
P0
12.5
12.7
12.9
0.49
0.5
0.51
P2
5.65
6.35
7.05
0.22
0.25
0.27
2.54
2.94
0.09
0.1
0.11
2
-0.08
19
0.69
0.71
0.74
F1, F2
2.44
delta H
-2
W
17.5
W0
5.7
6
6.3
0.22
0.23
0.24
W1
8.5
9
9.25
0.33
0.35
0.36
18
W2
0.5
H
18.5
H0
15.5
16
H1
D0
0.08
0.02
20.5
0.72
0.80
16.5
0.61
0.63
0.65
0.15
0.157
0.16
25
3.8
4
4.2
t
0.9
L
11
l1
3
delta P
-1
0.98
0.035
0.43
0.11
1
-0.04
0.04
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
TO-251 (IPAK) MECHANICAL DATA
mm
DIM.
MIN.
inch
TYP.
MAX.
MIN.
TYP.
MAX.
A
2.2
2.4
0.086
0.094
A1
0.9
1.1
0.035
0.043
A3
0.7
1.3
0.027
0.051
B
0.64
0.9
0.025
0.031
B2
5.2
5.4
0.204
0.212
B3
0.85
B5
0.033
0.3
0.012
B6
0.95
C
0.45
C2
0.48
D
6
E
6.4
6.6
0.037
0.6
0.017
0.023
0.6
0.019
0.023
6.2
0.236
0.244
0.252
0.260
G
4.4
4.6
0.173
0.181
H
15.9
16.3
0.626
0.641
L
9
9.4
0.354
0.370
L1
0.8
1.2
0.031
0.047
L2
0.8
1
0.031
0.039
A1
C2
A3
A
C
H
B
B3
=
1
=
2
G
=
=
=
E
B2
=
3
B5
L
D
B6
L2
L1
0068771-E
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
TO-92 MECHANICAL DATA
mm.
inch
DIM.
MAX.
MIN.
A
4.32
MIN.
TYP
4.95
0.170
TYP.
0.194
MAX.
b
0.36
0.51
0.014
0.020
D
4.45
4.95
0.175
0.194
E
3.30
3.94
0.130
0.155
e
2.41
2.67
0.094
0.105
e1
1.14
1.40
0.044
0.055
L
12.70
15.49
0.50
0.610
R
2.16
2.41
0.085
0.094
S1
0.92
1.52
0.036
0.060
W
0.41
0.56
0.016
0.022
V
5°
5°
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
SOT-223 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
A
inch
MAX.
MIN.
TYP.
1.80
MAX.
0.071
B
0.60
0.70
0.80
0.024
0.027
0.031
B1
2.90
3.00
3.10
0.114
0.118
0.122
c
0.24
0.26
0.32
0.009
0.010
0.013
D
6.30
6.50
6.70
0.248
0.256
0.264
e
2.30
0.090
e1
4.60
0.181
E
3.30
3.50
3.70
0.130
0.138
0.146
H
6.70
7.00
7.30
0.264
0.276
0.287
10o
V
A1
10o
0.02
P008B
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
Table 10: Revision History
Date
Revision
19-Mar-2003
15-May-2003
09-Jun-2003
17-Nov-2004
15-Feb-2005
07-Sep-2005
1
2
3
4
5
6
Description of Changes
First Release
Removed DPAK
Final Datasheet
Inserted SOT-223.
Modified Curve 4
Inserted Ecopack indication
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STD1LNK60Z-1 - STQ1NK60ZR - STN1NK60Z
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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