MCP606/7/8/9 2.5V to 6.0V Micropower CMOS Op Amp Features Description • Low Input Offset Voltage: 250 µV (maximum) • Rail-to-Rail Output • Low Input Bias Current: 80 pA (maximum at +85°C) • Low Quiescent Current: 25 µA (maximum) • Power Supply Voltage: 2.5V to 6.0V • Unity-Gain Stable • Chip Select (CS) Capability: MCP608 • Industrial Temperature Range: -40°C to +85°C • No Phase Reversal • Available in Single, Dual and Quad Packages The MCP606/7/8/9 family of operational amplifiers (op amps) from Microchip Technology Inc. are unity-gain stable with low offset voltage (250 µV, maximum). Performance characteristics include rail-to-rail output swing capability and low input bias current (80 pA at +85°C, maximum). These features make this family of op amps well suited for single-supply, precision, high-impedance, battery-powered applications. Typical Applications • • • • • Battery Power Instruments High-Impedance Applications Strain Gauges Medical Instruments Test Equipment Package Types SPICE Macro Models FilterLab® Software Mindi™ Circuit Designer & Simulator Analog Demonstration and Evaluation Boards Application Notes Typical Application V OUT = V LM + I L R RG 5 kΩ SEN ( RF ⁄ RG ) RF 50 kΩ IL To Load (VLP) 2.5V to 6.0V VOUT RSEN 10Ω MCP606 To Load (VLM) Low-Side Battery Current Sensor © 2008 Microchip Technology Inc. MCP606 SOT-23-5 MCP606 PDIP, SOIC,TSSOP Design Aids • • • • • The single is available in standard 8-lead PDIP, SOIC and TSSOP packages, as well as in a SOT-23-5 package. The single MCP608 with Chip Select (CS) is offered in the standard 8-lead PDIP, SOIC and TSSOP packages. The dual MCP607 is offered in the standard 8-lead PDIP, SOIC and TSSOP packages. Finally, the quad MCP609 is offered in the standard 14-lead PDIP, SOIC and TSSOP packages. All devices are fully specified from -40°C to +85°C, with power supplies from 2.5V to 6.0V. NC VIN– VIN+ VSS 1 2 3 4 8 7 6 5 NC VDD VOUT NC MCP607 PDIP, SOIC,TSSOP VOUTA VINA– VINA+ VSS 1 2 3 4 8 7 6 5 VOUT 1 VSS 2 VIN+ 3 5 VDD 4 VIN– MCP608 PDIP, SOIC,TSSOP NC 1 VDD VOUTB VIN– 2 VINB– VIN+ 3 VINB+ VSS 4 8 7 6 5 CS VDD VOUT NC MCP609 PDIP, SOIC,TSSOP VOUTA VINA– VINA+ VDD VINB+ VINB– VOUTB 1 2 3 4 5 6 7 14 VOUTD 13 VIND– 12 VIND+ 11 VSS 10 VINC+ 9 VINC– 8 VOUTC DS11177E-page 1 MCP606/7/8/9 1.0 ELECTRICAL CHARACTERISTICS VDD – VSS ........................................................................7.0V † Notice: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at those or any other conditions above those indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. Current at Input Pins ....................................................±2 mA †† See Section 4.1.2 “Input Voltage and Current Limits”. Absolute Maximum Ratings † Analog Inputs (VIN+, VIN–) †† ........ VSS – 1.0V to VDD + 1.0V All Other Inputs and Outputs ......... VSS – 0.3V to VDD + 0.3V Difference Input Voltage ...................................... |VDD – VSS| Output Short Circuit Current .................................Continuous Current at Output and Supply Pins ............................±30 mA Storage Temperature..................................–65° C to +150° C Maximum Junction Temperature (TJ) ........................ .+150° C ESD Protection On All Pins (HBM; MM) .............. ≥ 3 kV; 200V DC CHARACTERISTICS Electrical Characteristics: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL, and CS is tied low (refer to Figure 1-2 and Figure 1-3). Parameters Sym Min Typ Max Units Conditions Input Offset VOS -250 — +250 ΔVOS/ΔTA — ±1.8 — PSRR 80 93 — Input Bias Current IB — 1 — pA At Temperature IB — — 80 pA Input Offset Bias Current IOS — 1 — pA Common Mode Input Impedance ZCM — 1013||6 — Ω||pF Differential Input Impedance ZDIFF — 1013||6 — Ω||pF Common Mode Input Range VCMR VSS – 0.3 VDD – 1.1 V CMRR ≥ 75 dB Common Mode Rejection Ratio CMRR 75 91 — dB VDD = 5V, VCM = -0.3V to 3.9V DC Open-Loop Gain (Large-signal) AOL 105 121 — dB RL = 25 kΩ to VL, VOUT = 50 mV to VDD – 50 mV DC Open-Loop Gain (Large-signal) AOL 100 118 — dB RL = 5 kΩ to VL, VOUT = 0.1V to VDD – 0.1V VOL, VOH VSS + 15 — VDD – 20 mV RL = 25 kΩ to VL, 0.5V input overdrive VOL, VOH VSS + 45 — VDD – 60 mV RL = 5 kΩ to VL, 0.5V input overdrive VOUT VSS + 50 — VDD – 50 mV RL = 25 kΩ to VL, AOL ≥ 105 dB VOUT VSS + 100 — VDD – 100 mV RL = 5 kΩ to VL, AOL ≥ 100 dB ISC — 7 — mA VDD = 2.5V ISC — 17 — mA VDD = 5.5V VDD 2.5 — 6.0 V IQ — 18.7 25 µA Input Offset Voltage Input Offset Drift with Temperature Power Supply Rejection Ratio µV µV/°C TA = -40°C to +85°C dB Input Bias Current and Impedance TA = +85°C Common Mode Open-Loop Gain Output Maximum Output Voltage Swing Linear Output Voltage Range Output Short Circuit Current Power Supply Supply Voltage Quiescent Current per Amplifier Note 1: IO = 0 All parts with date codes November 2007 and later have been screened to ensure operation at VDD = 6.0V. However, the other minimum and maximum specifications are measured at 2.5V and 5.5V. DS11177E-page 2 © 2008 Microchip Technology Inc. MCP606/7/8/9 AC CHARACTERISTICS Electrical Characteristics: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL and CL = 60 pF, and CS is tied low (refer to Figure 1-2 and Figure 1-3). Parameters Sym Min Typ Max Units Conditions AC Response Gain Bandwidth Product GBWP — 155 — kHz Phase Margin PM — 62 — ° Slew Rate SR — 0.08 — V/µs Input Noise Voltage Eni — 2.8 — µVP-P Input Noise Voltage Density eni — 38 — nV/√Hz f = 1 kHz Input Noise Current Density ini — 3 — fA/√Hz f = 1 kHz G = +1 V/V Noise f = 0.1 Hz to 10 Hz MCP608 CHIP SELECT CHARACTERISTICS Electrical Characteristics: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL and CL = 60 pF, and CS is tied low (refer to Figure 1-2 and Figure 1-3). Parameters Sym Min Typ Max CS Logic Threshold, Low VIL CS Input Current, Low ICSL CS Logic Threshold, High VIH CS Input Current, High ICSH Units Conditions VSS — 0.2 VDD V -0.1 0.01 — µA 0.8 VDD — VDD V — 0.01 0.1 µA CS = VDD ISS -2 -0.05 — µA CS = VDD IO(LEAK) — 10 — nA CS = VDD CS Low to Amplifier Output Turn-on Time tON — 9 100 µs CS = 0.2VDD to VOUT = 0.9 VDD/2, G = +1 V/V, RL = 1 kΩ to VSS CS High to Amplifier Output Hi-Z tOFF — 0.1 — µs CS = 0.8VDD to VOUT = 0.1 VDD/2, G = +1 V/V, RL = 1 kΩ to VSS VHYST — 0.6 — V VDD = 5.0V CS Low Specifications CS = 0.2VDD CS High Specifications CS Input High, GND Current Amplifier Output Leakage, CS High CS Dynamic Specifications CS Hysteresis VIH VIL CS tOFF tON VOUT Hi-Z ISS -50 nA (typical) ICS -50 nA (typical) Hi-Z -18.7 µA (typical) -50 nA (typical) -50 nA (typical) FIGURE 1-1: Timing Diagram for the CS Pin on the MCP608. © 2008 Microchip Technology Inc. DS11177E-page 3 MCP606/7/8/9 TEMPERATURE CHARACTERISTICS Electrical Characteristics: Unless otherwise indicated, VDD = +2.5V to +5.5V and VSS = GND. Parameters Sym Min Typ Max Units Conditions Temperature Ranges Specified Temperature Range TA -40 — +85 °C Operating Temperature Range TA -40 — +125 °C Storage Temperature Range TA -65 — +150 °C Thermal Resistance, 5L-SOT23 θJA — 256 — °C/W Thermal Resistance, 8L-PDIP θJA — 85 — °C/W Thermal Resistance, 8L-SOIC θJA — 163 — °C/W Thermal Resistance, 8L-TSSOP θJA — 124 — °C/W Thermal Resistance, 14L-PDIP θJA — 70 — °C/W Thermal Resistance, 14L-SOIC θJA — 120 — °C/W Thermal Resistance, 14L-TSSOP θJA — 100 — °C/W Note 1 Thermal Package Resistances Note 1: 1.1 The MCP606/7/8/9 operate over this extended temperature range, but with reduced performance. In any case, the Junction Temperature (TJ) must not exceed the Absolute Maximum specification of +150°C. Test Circuits The test circuits used for the DC and AC tests are shown in Figure 1-2 and Figure 1-3. The bypass capacitors are laid out according to the rules discussed in Section 4.5 “Supply Bypass”. VDD VIN RN 0.1 µF 1 µF VOUT MCP60X CL VDD/2 RG RL RF VL FIGURE 1-2: AC and DC Test Circuit for Most Non-Inverting Gain Conditions. VDD VDD/2 RN 0.1 µF 1 µF VOUT MCP60X CL VIN RG RL RF VL FIGURE 1-3: AC and DC Test Circuit for Most Inverting Gain Conditions. DS11177E-page 4 © 2008 Microchip Technology Inc. MCP606/7/8/9 2.0 TYPICAL PERFORMANCE CURVES Note: The graphs and tables provided following this note are a statistical summary based on a limited number of samples and are provided for informational purposes only. The performance characteristics listed herein are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified operating range (e.g., outside specified power supply range) and therefore outside the warranted range. 16% 14% 12% Percentage of Occurances 16% 1200 Samples VDD = 5.5V 10% 8% 6% 4% 2% 250 200 150 100 50 0 -50 -100 -150 -200 0% -250 Percentage of Occurances ( ) Note: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL, CL = 60 pF, and CS is tied low. 14% 206 Samples VDD = 5.5V 12% 10% 8% 6% 4% 2% 0% -8 -6 Input Offset Voltage (µV) 14% 12% Input Offset Voltage at 18% 1200 Samples VDD = 2.5V 10% 8% 6% 4% 2% 250 200 150 100 50 0 -50 -100 -150 -200 0% 16% 14% 10% 8% 6% 4% 2% 0% -8 -6 -4 -2 0 2 4 6 Input Offset Voltage Drift (µV/°C) 8 FIGURE 2-5: Input Offset Voltage Drift Magnitude at VDD = 2.5V. 24 TA = +85°C TA = +25°C TA = -40°C Quiescent Current per Amplifier (µA) Quiescent Current per Amplifier (µA) 22 20 18 16 14 12 10 8 6 4 2 0 Input Offset Voltage at 206 Samples VDD = 2.5V 12% Input Offset Voltage (µV) FIGURE 2-2: VDD = 2.5V. 8 FIGURE 2-4: Input Offset Voltage Drift Magnitude at VDD = 5.5V. Percentage of Occurances 16% -250 Percentage of Occurances ( ) FIGURE 2-1: VDD = 5.5V. -4 -2 0 2 4 6 Input Offset Voltage Drift (µV/°C) 22 VDD = 5.5V 20 18 16 VDD = 2.5V 14 12 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 Power Supply Voltage (V) FIGURE 2-3: Quiescent Current vs. Power Supply Voltage. © 2008 Microchip Technology Inc. -50 -25 0 25 50 75 100 Ambient Temperature (°C) FIGURE 2-6: Quiescent Current vs. Ambient Temperature. DS11177E-page 5 MCP606/7/8/9 Note: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL, CL = 60 pF, and CS is tied low. 120 Input Offset Voltage (µV) VDD =2.5V VDD = 5.5V 300 200 100 Representative Part 20 0 FIGURE 2-10: Input Offset Voltage vs. Common Mode Input Voltage. 0 Gain 60 -45 Phase 40 -90 20 -135 0 -180 -20 0.01 0.1 FIGURE 2-8: vs. Frequency. 80 40 60 30 40 20 20 10 VDD = 5.0V -50 -25 0 25 50 75 0 100 FIGURE 2-11: Gain Bandwidth Product, Phase Margin vs. Ambient Temperature. Input Noise Voltage Density (nV/√Hz) Channel to Channel Separation (dB) 140 130 120 110 100 90 DS11177E-page 6 50 Ambient Temperature (°C) Open-Loop Gain and Phase FIGURE 2-9: Channel-to-Channel Separation (MCP607 and MCP609 only). 60 Phase Margin 100 10 100 1k 10k 100k 1M Frequency (Hz) Referred to Input 80 100 1k 10k 1.E+02 1.E+03 1.E+04 Frequency (Hz) 70 GBWP 120 0 -225 1 80 140 Phase Margin (°) 80 45 160 Gain Bandwidth Product (kHz) 100 90 Open-Loop Phase (°) Open-Loop Gain (dB) RL = 25 kΩ 5.0 Common Mode Input Voltage (V) FIGURE 2-7: Input Offset Voltage vs. Ambient Temperature. 120 4.5 100 4.0 75 3.5 50 3.0 25 Ambient Temperature (°C) 2.5 -20 2.0 0 40 1.5 -25 60 1.0 -50 TA = +85°C TA = +25°C TA = -40°C 80 0.5 0 VDD = 5.5V 100 0.0 400 -0.5 Input Offset Voltage (µV) 500 100k 1.E+05 1000 100 10 1 10 1.E+02 100 1.E+03 1k 1.E+04 10k 1.E+05 100k 0.1 1.E+00 1.E-01 1.E+01 Frequency (Hz) FIGURE 2-12: vs. Frequency. Input Noise Voltage Density © 2008 Microchip Technology Inc. MCP606/7/8/9 Note: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL, CL = 60 pF, and CS is tied low. 60 VDD = 5.5V VCM = VDD Input Bias and Offset Currents (pA) Input Bias and Offset Currents (pA) 100 10 IB 1 | IOS | 0.1 40 20 10 IOS 0 -10 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 Common Mode Input Voltage (V) Ambient Temperature (°C) FIGURE 2-13: Input Bias Current, Input Offset Current vs. Ambient Temperature. FIGURE 2-16: Input Bias Current, Input Offset Current vs. Common Mode Input Voltage. 135 DC Open-Loop Gain (dB) 150 130 125 120 VDD = 5.5V 115 110 VDD = 2.5V 105 1k 10k 1.E+03 1.E+04 Load Resistance (Ω) FIGURE 2-14: Load Resistance. 130 120 110 100 80 CMRR 60 Power Supply Voltage (V) FIGURE 2-17: DC Open-Loop Gain vs. Power Supply Voltage. 100 PSRRPSRR+ 100 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 100k 1.E+05 DC Open-Loop Gain vs. 120 40 20 0 0.1 1.E-01 RL = 25 kΩ 140 90 100 100 1.E+02 CMRR and PSRR (dB) DC Open-Loop Gain (dB) IB 30 25 30 35 40 45 50 55 60 65 70 75 80 85 CMRR and PSRR (dB) TA = 85°C VDD = 5.5V 50 95 PSRR 90 CMRR 85 80 75 1 1.E+00 FIGURE 2-15: Frequency. 10 100 1.E+01 1.E+02 Frequency (Hz) 1k 1.E+03 CMRR, PSRR vs. © 2008 Microchip Technology Inc. 10k 1.E+04 -50 -25 0 25 50 75 100 Ambient Temperature (°C) FIGURE 2-18: Temperature. CMRR, PSRR vs. Ambient DS11177E-page 7 MCP606/7/8/9 Note: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL, CL = 60 pF, and CS is tied low. 40 VDD = 2.5V 100 VDD = 5.5V VDD - VOH VOL - VSS 10 Output Voltage Headroom (mV) Output Voltage Headroom (mV) 1000 1 1 10 Output Current (mA) 30 VDD - VOH 25 VDD = 5.5V 20 15 VDD = 2.5V 10 VOL - VSS 5 100 FIGURE 2-19: Output Voltage Headroom vs. Output Current Magnitude. -50 VDD = 2.5V 1 0.1 100 1.E+02 1k 10k 1.E+03 1.E+04 Frequency (Hz) 100k 1.E+05 FIGURE 2-20: Maximum Output Voltage Swing vs. Frequency. 0.10 Low to High 0.08 High to Low 0.06 0.04 0.02 0.00 -50 -25 0 25 50 75 Ambient Temperature (°C) FIGURE 2-21: Temperature. DS11177E-page 8 5 Slew Rate vs. Ambient 100 0 25 50 75 Ambient Temperature (°C) 100 G = +2 V/V VDD = 5.0V 4 3 2 VIN 1 VOUT 0 -1 Time (100 µs/div) FIGURE 2-23: The MCP606/7/8/9 Show No Phase Reversal. Output Short Circuit Current Magnitude (mA) 0.12 Input and Output Voltages (V) 6 VDD = 5.5V -25 FIGURE 2-22: Output Voltage Headroom vs. Ambient Temperature at RL = 5 kΩ. 10 Maximum Output Voltage Swing (V) RL = 5 k8 0 0.1 Slew Rate (V/µs) 35 25 +ISC , VDD = 5.5V | -ISC |, VDD = 5.5V 20 15 10 5 +ISC , VDD = 2.5V | -ISC |, VDD = 2.5V 0 -50 -25 0 25 50 75 100 Ambient Temperature (°C) FIGURE 2-24: Output Short Circuit Current Magnitude vs. Ambient Temperature. © 2008 Microchip Technology Inc. MCP606/7/8/9 5.0 4.5 4.0 5.0 VDD = 5.0V 4.5 Output Voltage (V) 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 VDD = 5.0V 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0.0 Time (50 µs/div) Time (50 µs/div) FIGURE 2-25: Pulse Response. Large-signal, Non-inverting FIGURE 2-28: Pulse Response. VDD = 5.0V Output Voltage (20 mV/div) Output Voltage (20 mV/div) RL = 25 kΩ Time (50 µs/div) Small-signal, Non-inverting 3.5 3.0 Time (50 µs/div) Amplifier Output Active 1.5 CS Input High to Low CS Input Low to High 1.0 0.5 Hysteresis 0.0 Amplifier Output Hi-Z -0.5 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 CS Input Voltage (V) FIGURE 2-27: (MCP608 only). Chip Select (CS) Hysteresis © 2008 Microchip Technology Inc. 5.0 VDD = 5.0V 2.5 2.0 FIGURE 2-29: Response. Small-signal, Inverting Pulse 15 G = +1 V/V RL = 1 kΩ to VSS 4.5 Output Voltage (V) FIGURE 2-26: Pulse Response. Internal CS Switch Output (V) Large-signal, Inverting 4.0 10 CS 3.5 3.0 -10 2.0 -15 1.5 1.0 0.5 0 -5 Output Enabled 2.5 5 -20 VOUT Output Hi-Z Output Hi-Z 0.0 Chip Select Voltage (V) Output Voltge (V) Note: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL, CL = 60 pF, and CS is tied low. -25 -30 -35 Time (5 µs/div) FIGURE 2-30: Amplifier Output Response Times vs. Chip Select (CS) Pulse (MCP608 only). DS11177E-page 9 MCP606/7/8/9 Note: Unless otherwise indicated, VDD = +2.5V to +5.5V, VSS = GND, TA = +25°C, VCM = VDD/2, VOUT ≈ VDD/2, VL = VDD/2, RL = 100 kΩ to VL, CL = 60 pF, and CS is tied low. Input Current Magnitude (A) 1.E-02 10m 1.E-03 1m 1.E-04 100µ 1.E-05 10µ 1.E-06 1µ 100n 1.E-07 10n 1.E-08 1n 1.E-09 100p 1.E-10 10p 1.E-11 1p 1.E-12 +125°C +85°C +25°C -40°C -1.0 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 0.0 Input Voltage (V) FIGURE 2-31: Measured Input Current vs. Input Voltage (below VSS). DS11177E-page 10 © 2008 Microchip Technology Inc. MCP606/7/8/9 3.0 PIN DESCRIPTIONS Descriptions of the pins are listed in Table 3-1. TABLE 3-1: PIN FUNCTION TABLE. MCP606 MCP607 MCP608 MCP609 Symbol 1 1 6 1 VOUT, VOUTA Output (op amp A) 2 4 2 2 2 VIN–, VINA– Inverting Input (op amp A) 3 3 3 3 3 VIN+, VINA+ Non-inverting Input (op amp A) 7 5 4 7 4 VDD — — 5 — 5 VINB+ Non-inverting Input (op amp B) — — 6 — 6 VINB– Inverting Input (op amp B) — — 7 — 7 VOUTB Output (op amp B) — — — — 8 VOUTC Output (op amp B) — — — — 9 VINC– Inverting Input (op amp C) — — — — 10 VINC+ Non-inverting Input (op amp C) PDIP, SOIC, TSSOP SOT-23-5 6 3.1 Negative Power Supply 4 2 8 4 11 VSS — — — 12 VIND+ Non-inverting Input (op amp D) — — — — 13 VIND– Inverting Input (op amp D) — — — — 14 VOUTD Output (op amp D) — — — 8 — CS Chip Select 1, 5, 8 — — 1, 5 — NC No Internal Connection Analog Outputs Analog Inputs The non-inverting and inverting inputs are high-impedance CMOS inputs with low bias currents. 3.3 Positive Power Supply — The output pins are low-impedance voltage sources. 3.2 Description Chip Select Digital Input The Chip Select (CS) pin is a Schmitt-triggered, CMOS logic input. It is used to place the MCP608 op amp in a Low-power mode, with the output(s) in a Hi-Z state. © 2008 Microchip Technology Inc. 3.4 Power Supply Pins The positive power supply pin (VDD) is 2.5V to 5.5V higher than the negative power supply pin (VSS). For normal operation, the output pins are at voltages between VSS and VDD; while the input pins are at voltages between VSS – 0.3V and VDD + 0.3V. Typically, these parts are used in a single-supply (positive) configuration. In this case, VSS is connected to ground and VDD is connected to the supply. VDD will need bypass capacitors . DS11177E-page 11 MCP606/7/8/9 4.0 APPLICATIONS INFORMATION The MCP606/7/8/9 family of op amps is manufactured using Microchip’s state-of-the-art CMOS process These op amps are unity-gain stable and suitable for a wide range of general purpose applications. 4.1 VDD D1 R1 Rail-to-Rail Inputs 4.1.1 PHASE REVERSAL R2 R3 VSS – (minimum expected V1) 2 mA VSS – (minimum expected V2) R2 > 2 mA R1 > INPUT VOLTAGE AND CURRENT LIMITS The ESD protection on the inputs can be depicted as shown in Figure 4-1. This structure was chosen to protect the input transistors, and to minimize input bias current (IB). The input ESD diodes clamp the inputs when they try to go more than one diode drop below VSS. They also clamp any voltages that go too far above VDD; their breakdown voltage is high enough to allow normal operation, and low enough to bypass quick ESD events within the specified limits. Input Stage Bond V – IN Pad VSS Bond Pad FIGURE 4-1: Structures. Simplified Analog Input ESD In order to prevent damage and/or improper operation of these op amps, the circuit they are in must limit the currents and voltages at the VIN+ and VIN– pins (see Absolute Maximum Ratings † at the beginning of Section 1.0 “Electrical Characteristics”). Figure 4-2 shows the recommended approach to protecting these inputs. The internal ESD diodes prevent the input pins (VIN+ and VIN–) from going too far below ground, and the resistors R1 and R2 limit the possible current drawn out of the input pins. Diodes D1 and D2 prevent the input pins (VIN+ and VIN–) from going too far above VDD, and dump any currents onto VDD. When implemented as shown, resistors R1 and R2 also limit the current through D1 and D2. DS11177E-page 12 FIGURE 4-2: Inputs. Protecting the Analog It is also possible to connect the diodes to the left of resistors R1 and R2. In this case, current through the diodes D1 and D2 needs to be limited by some other mechanism. The resistors then serve as in-rush current limiters; the DC current into the input pins (VIN+ and VIN–) should be very small. A significant amount of current can flow out of the inputs when the common mode voltage (VCM) is below ground (VSS); see Figure 2-31. Applications that are high impedance may need to limit the useable voltage range. VDD Bond Pad VIN+ Bond Pad MCP60X V2 The MCP606/7/8/9 op amp is designed to prevent phase reversal when the input pins exceed the supply voltages. Figure 2-23 shows the input voltage exceeding the supply voltage without any phase reversal. 4.1.2 D2 V1 4.1.3 NORMAL OPERATION The input stage of the MCP606/7/8/9 op amps use a PMOS input stage. It operates at low common mode input voltage (VCM), including ground. WIth this topology, the device operates with VCM up to VDD –1.1V and 0.3V below VSS. Figure 4-3 shows a unity gain buffer. Since VOUT is the same voltage as the inverting input, VOUT must be kept below VDD–1.2V for correct operation. VIN + MCP60X – VOUT FIGURE 4-3: Unity Gain Buffer has a Limited VOUT Range. © 2008 Microchip Technology Inc. MCP606/7/8/9 4.2 Rail-to-Rail Output 10k The second specification that describes the output-swing capability of these amplifiers (Linear Output Voltage Range) defines the maximum output swing that can be achieved while the amplifier still operates in its linear region. To verify linear operation in this range, the large-signal DC Open-Loop Gain (AOL) is measured at points inside the supply rails. The measurement must meet the specified AOL conditions in the specification table. 4.3 Capacitive Loads Driving large capacitive loads can cause stability problems for voltage-feedback op amps. As the load capacitance increases, the feedback loop’s phase margin decreases and the closed-loop bandwidth is reduced. This produces gain-peaking in the frequency response, with overshoot and ringing in the step response. A unity-gain buffer (G = +1) is the most sensitive to capacitive loads, though all gains show the same general behavior. When driving large capacitive loads with these op amps (e.g., > 60 pF when G = +1), a small series resistor at the output (RISO in Figure 4-4) improves the feedback loop’s phase margin (stability) by making the output load resistive at higher frequencies. The bandwidth will be generally lower than the bandwidth with no capacitive load. RISO MCP60X VIN 1k 1000 GN = +1 GN = +2 GN ≥ +4 100 10p 100 10 100 1000 10000 100p 1n 10n Normalized Load Capacitance; CL/GN (F) FIGURE 4-5: Recommended RISO Values for Capacitive Loads. After selecting RISO for your circuit, double-check the resulting frequency response peaking and step response overshoot. Modify RISO’s value until the response is reasonable. Bench evaluation and simulations with the MCP606/7/8/9 SPICE macro model are helpful. 4.4 MCP608 Chip Select The MCP608 is a single op amp with Chip Select (CS). When CS is pulled high, the supply current drops to 50 nA (typical) and flows through the CS pin to VSS. When this happens, the amplifier output is put into a high-impedance state. By pulling CS low, the amplifier is enabled. The CS pin has an internal 5 MΩ (typical) pull-down resistor connected to VSS, so it will go low if the CS pins is left floating. Figure 1-1 shows the output voltage and supply current response to a CS pulse. 4.5 Supply Bypass With this family of operational amplifiers, the power supply pin (VDD for single-supply) should have a local bypass capacitor (i.e., 0.01 µF to 0.1 µF) within 2 mm for good high-frequency performance. It also needs a bulk capacitor (i.e., 1 µF or larger) within 100 mm to provide large, slow currents. This bulk capacitor can be shared with other nearby analog parts. VOUT CL FIGURE 4-4: Output Resistor, RISO stabilizes large capacitive loads. Figure 4-5 gives recommended RISO values for different capacitive loads and gains. The x-axis is the normalized load capacitance (CL/GN), where GN is the circuit’s noise gain. For non-inverting gains, GN and the Signal Gain are equal. For inverting gains, GN is 1+|Signal Gain| (e.g., -1 V/V gives GN = +2 V/V). © 2008 Microchip Technology Inc. Recommended R ISO (Ω) 10000 There are two specifications that describe the output-swing capability of the MCP606/7/8/9 family of op amps. The first specification (Maximum Output Voltage Swing) defines the absolute maximum swing that can be achieved under the specified load conditions. For instance, the output voltage swings to within 15 mV of the negative rail with a 25 kΩ load to VDD/2. Figure 2-23 shows how the output voltage is limited when the input goes beyond the linear region of operation. 4.6 Unused Op Amps An unused op amp in a quad package (MCP609) should be configured as shown in Figure 4-6. These circuits prevent the output from toggling and causing crosstalk. Circuits A sets the op amp at its minimum noise gain. The resistor divider produces any desired reference voltage within the output voltage range of the op amp; the op amp buffers that reference voltage. Circuit B uses the minimum number of components and operates as a comparator, but it may draw more current. DS11177E-page 13 MCP606/7/8/9 1. ¼ MCP604 (A) ¼ MCP604 (B) VDD R1 VDD VDD VREF R2 2. R2 V REF = V DD ⋅ -----------------R1 + R2 FIGURE 4-6: 4.7 Unused Op Amps. PCB Surface Leakage In applications where low input bias current is critical, Printed Circuit Board (PCB) surface-leakage effects need to be considered. Surface leakage is caused by humidity, dust or other contamination on the board. Under low humidity conditions, a typical resistance between nearby traces is 1012Ω. A 5V difference would cause 5 pA of current to flow, which is greater than the MCP606/7/8/9 family’s bias current at 25°C (1 pA, typical). The easiest way to reduce surface leakage is to use a guard ring around sensitive pins (or traces). The guard ring is biased at the same voltage as the sensitive pin. An example of this type of layout is shown in Figure 4-7. VIN- VIN+ VSS Non-inverting Gain and Unity-gain Buffer: a) Connect the non-inverting pin (VIN+) to the input with a wire that does not touch the PCB surface. b) Connect the guard ring to the inverting input pin (VIN–). This biases the guard ring to the common mode input voltage. Inverting Gain and Transimpedance Gain (convert current to voltage, such as photo detectors) amplifiers: a) Connect the guard ring to the non-inverting input pin (VIN+). This biases the guard ring to the same reference voltage as the op amp (e.g., VDD/2 or ground). b) Connect the inverting pin (VIN–) to the input with a wire that does not touch the PCB surface. 4.8 Application Circuits 4.8.1 LOW-SIDE BATTERY CURRENT SENSOR The MCP606/7/8/9 op amps can be used to sense the load current on the low-side of a battery using the circuit in Figure 4-8. In this circuit, the current from the power supply (minus the current required to power the MCP606) flows through a sense resistor (RSEN), which converts it to voltage. This is gained by the the amplifier and resistors, RG and RF . Since the non-inverting input of the amplifier is at the load’s negative supply (VLM), the gain from RSEN to VOUT is RF/RG . V OUT = V LM + I L R SEN ( RF ⁄ RG ) IL RG 5 kΩ Guard Ring FIGURE 4-7: for Inverting Gain. RF 50 kΩ 2.5V to 6.0V VOUT RSEN 10Ω Example Guard Ring Layout FIGURE 4-8: Sensor. To Load (VLP) MCP606 To Load (VLM) Low Side Battery Current Since the input bias current and input offset voltage of the MCP606 are low, and the input is capable of swinging below ground, there is very little error generated by the amplifier. The quiescent current is very low, which helps conserve battery power. The rail-to-rail output makes it possible to read very low currents. DS11177E-page 14 © 2008 Microchip Technology Inc. MCP606/7/8/9 4.8.2 PHOTODIODE AMPLIFIERS Sensors that produce an output current and have high output impedance can be connected to a transimpedance amplifier. The transimpedance amplifier converts the current into voltage. Photodiodes are one sensor that produce an output current. The key op amp characteristics that are needed for these circuits are: low input offset voltage, low input bias current, high input impedance and an input common mode range that includes ground. The low input offset voltage and low input bias current support a very low voltage drop across the photodiode; this gives the best photodiode linearity. Since the photodiode is biased at ground, the op amp’s input needs to function well both above and below ground. 4.8.2.1 operate at a much higher speed. This reverse bias also increases the dark current and current noise, however. Resistor R2 converts the current into voltage. Capacitor C2 limits the bandwidth and helps stabilize the circuit when D1’s junction capacitance is large. VB < 0 V OUT = I D1 R 2 C2 R2 VOUT ID1 VDD Light Photo-Voltaic Mode D1 Figure 4-9 shows a transimpedance amplifier with a photodiode (D1) biased in the Photo-voltaic mode (0V across D1), which is used for precision photodiode sensing. As light impinges on D1, charge is generated, causing a current to flow in the reverse bias direction of D1. The op amp’s negative feedback forces the voltage across the D1 to be nearly 0V. Resistor R2 converts the current into voltage. Capacitor C2 limits the bandwidth and helps stabilize the circuit when D1’s junction capacitance is large. V OUT = I D1 R VB FIGURE 4-10: Photodiode (in Photo-conductive mode) and Transimpedance Amplifier. 4.8.3 2 R2 VOUT ID1 2R ⎞ R ⎛ VOUT = ( V 1 – V 2 ) ⎜1 + ------1 + ---------1- ⎟ + V REF R ⎝ 2 RG ⎠ VDD D1 TWO OP AMP INSTRUMENTATION AMPLIFIER The two op amp instrumentation amplifier shown in Figure 4-11 serves the function of taking the difference of two input voltages, level-shifting it and gaining it to the output. This configuration is best suited for higher gains (i.e., gain > 3 V/V). The reference voltage (VREF) is typically at mid-supply (VDD/2) in a single-supply environment. C2 Light MCP606 MCP606 RG R1 R2 R2 R1 VREF FIGURE 4-9: Photodiode (in Photo-voltaic mode) and Transimpedance Amplifier. 4.8.2.2 Photo-Conductive Mode Figure 4-9 shows a transimpedance amplifier with a photodiode (D1) biased in the Photo-conductive mode (D1 is reverse biased), which is used for high-speed applications. As light impinges on D1, charge is generated, causing a current to flow in the reverse bias direction of D1. Placing a negative bias on D1 significantly reduces its junction capacitance, which allows the circuit to © 2008 Microchip Technology Inc. V2 VOUT ½ MCP607 ½ MCP607 V1 FIGURE 4-11: Amplifier. Two op amp Instrumentation The key specifications that make the MCP606/7/8/9 family appropriate for this application circuit are low input bias current, low offset voltage and high common-mode rejection. DS11177E-page 15 MCP606/7/8/9 4.8.4 THREE OP AMP INSTRUMENTATION AMPLIFIER 4.8.5 PRECISION GAIN WITH GOOD LOAD ISOLATION A classic, three op amp instrumentation amplifier is illustrated in Figure 4-12. The two input op amps provide differential signal gain and a common mode gain of +1. The output op amp is a difference amplifier, which converts its input signal from differential to a single ended output; it rejects common mode signals at its input. The gain of this circuit is simply adjusted with one resistor (RG). The reference voltage (VREF) is typically referenced to mid-supply (VDD/2) in single-supply applications. In Figure 4-13, the MCP606 op amps, R1 and R2 provide a high gain to the input signal (VIN). The MCP606’s low offset voltage makes this an accurate circuit. 2R ⎞ ⎛ R 4⎞ ⎛ VOUT = ( V 1 – V 2 ) ⎜1 + ---------2 ⎟ ⎜ ------⎟ + V REF R G ⎠ ⎝ R 3⎠ ⎝ VOUT = V IN (1 + R 2 ⁄ R 1 ) V2 The MCP601 is configured as a unity-gain buffer. It isolates the MCP606’s output from the load, increasing the high-gain stage’s precision. Since the MCP601 has a higher output current, with the two amplifiers being housed in separate packages, there is minimal change in the MCP606’s offset voltage due to loading effect. MCP606 VIN ½ MCP607 MCP601 VOUT R3 R4 VOUT R2 RG FIGURE 4-13: Load Isolation. MCP606 R2 R1 R2 Precision Gain with Good VREF R3 V1 R4 ½ MCP607 FIGURE 4-12: Three op amp Instrumentation Amplifier. DS11177E-page 16 © 2008 Microchip Technology Inc. MCP606/7/8/9 5.0 DESIGN AIDS Microchip provides the basic design tools needed for the MCP606/7/8/9 family of op amps. 5.1 SPICE Macro Model The latest SPICE macro model for the MCP606/7/8/9 op amps is available on the Microchip web site at www.microchip.com. This model is intended to be an initial design tool that works well in the op amp’s linear region of operation over the temperature range. See the model file for information on its capabilities. Bench testing is a very important part of any design and cannot be replaced with simulations. Also, simulation results using this macro model need to be validated by comparing them to the data sheet specifications and characteristic curves. 5.2 FilterLab® Software Microchip’s FilterLab® software is an innovative software tool that simplifies analog active filter (using op amps) design. Available at no cost from the Microchip web site at www.microchip.com/filterlab, the FilterLab design tool provides full schematic diagrams of the filter circuit with component values. It also outputs the filter circuit in SPICE format, which can be used with the macro model to simulate actual filter performance. 5.3 Mindi™ Circuit Designer & Simulator Microchip’s Mindi™ Circuit Designer & Simulator aids in the design of various circuits useful for active filter, amplifier and power-management applications. It is a free online circuit designer & simulator available from the Microchip web site at www.microchip.com/mindi. This interactive circuit designer & simulator enables designers to quickly generate circuit diagrams, simulate circuits. Circuits developed using the Mindi Circuit Designer & Simulator can be downloaded to a personal computer or workstation. 5.4 5.5 Analog Demonstration and Evaluation Boards Microchip offers a broad spectrum of Analog Demonstration and Evaluation Boards that are designed to help you achieve faster time to market. For a complete listing of these boards and their corresponding user’s guides and technical information, visit the Microchip web site at www.microchip.com/ analogtools. Two of our boards that are especially useful are: • P/N SOIC8EV: 8-Pin SOIC/MSOP/TSSOP/DIP Evaluation Board • P/N SOIC14EV: 14-Pin SOIC/TSSOP/DIP Evaluation Board 5.6 Application Notes The following Microchip Application Notes are available on the Microchip web site at www.microchip. com/ appnotes and are recommended as supplemental reference resources. ADN003: “Select the Right Operational Amplifier for your Filtering Circuits”, DS21821 AN722: “Operational Amplifier Topologies and DC Specifications”, DS00722 AN723: “Operational Amplifier AC Specifications and Applications”, DS00723 AN884: “Driving Capacitive Loads With Op Amps”, DS00884 AN990: “Analog Sensor Conditioning Circuits – An Overview”, DS00990 These application notes and others are listed in the design guide: “Signal Chain Design Guide”, DS21825 MAPS (Microchip Advanced Part Selector) MAPS is a software tool that helps semiconductor professionals efficiently identify Microchip devices that fit a particular design requirement. Available at no cost from the Microchip website at www.microchip.com/ maps, the MAPS is an overall selection tool for Microchip’s product portfolio that includes Analog, Memory, MCUs and DSCs. Using this tool you can define a filter to sort features for a parametric search of devices and export side-by-side technical comparasion reports. Helpful links are also provided for Datasheets, Purchase, and Sampling of Microchip parts. © 2008 Microchip Technology Inc. DS11177E-page 17 MCP606/7/8/9 6.0 PACKAGING INFORMATION 6.1 Package Marking Information Example: 5-Lead SOT-23 (MCP606) XXNN SB25 8-Lead PDIP (300 mil) MCP606 I/P256 0722 XXXXXXXX XXXXXNNN YYWW 8-Lead SOIC (150 mil) XXXXXXXX XXXXYYWW NNN OR MCP606I SN e3 0810 256 Example: MCP606 I/SN0722 256 606 YYWW I810 NNN 256 e3 DS11177E-page 18 MCP606 I/P e3256 0810 XXXX Legend: XX...X Y YY WW NNN Note: OR Example: 8-Lead TSSOP * Example: Customer-specific information Year code (last digit of calendar year) Year code (last 2 digits of calendar year) Week code (week of January 1 is week ‘01’) Alphanumeric traceability code Pb-free JEDEC designator for Matte Tin (Sn) This package is Pb-free. The Pb-free JEDEC designator ( e3 ) can be found on the outer packaging for this package. In the event the full Microchip part number cannot be marked on one line, it will be carried over to the next line, thus limiting the number of available characters for customer-specific information. © 2008 Microchip Technology Inc. MCP606/7/8/9 Package Marking Information (Continued) Example: 14-Lead PDIP (300 mil) (MCP609) MCP609-I/P XXXXXXXXXXXXXX XXXXXXXXXXXXXX YYWWNNN 0722256 MCP609 I/P e3 0810256 OR 14-Lead SOIC (150 mil) (MCP609) Example: MCP609ISL XXXXXXXXXX XXXXXXXXXX YYWWNNN 0722256 MCP609 e3 I/SL^^ 0810256 OR 14-Lead TSSOP (MCP609) Example: XXXXXXXX YYWW 609IST 0545 NNN 256 © 2008 Microchip Technology Inc. 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DS11177E-page 25 MCP606/7/8/9 /HDG3ODVWLF7KLQ6KULQN6PDOO2XWOLQH67±PP%RG\>76623@ 1RWH )RUWKHPRVWFXUUHQWSDFNDJHGUDZLQJVSOHDVHVHHWKH0LFURFKLS3DFNDJLQJ6SHFLILFDWLRQORFDWHGDW KWWSZZZPLFURFKLSFRPSDFNDJLQJ D N E E1 NOTE 1 1 2 e b A2 A c A1 φ 8QLWV 'LPHQVLRQ/LPLWV 1XPEHURI3LQV L L1 0,//,0(7(56 0,1 1 120 0$; 3LWFK H 2YHUDOO+HLJKW $ ± %6& ± 0ROGHG3DFNDJH7KLFNQHVV $ 6WDQGRII $ ± 2YHUDOO:LGWK ( 0ROGHG3DFNDJH:LGWK ( %6& 0ROGHG3DFNDJH/HQJWK ' )RRW/HQJWK / )RRWSULQW / 5() )RRW$QJOH ± /HDG7KLFNQHVV F ± /HDG:LGWK E ± 1RWHV 3LQYLVXDOLQGH[IHDWXUHPD\YDU\EXWPXVWEHORFDWHGZLWKLQWKHKDWFKHGDUHD 'LPHQVLRQV'DQG(GRQRWLQFOXGHPROGIODVKRUSURWUXVLRQV0ROGIODVKRUSURWUXVLRQVVKDOOQRWH[FHHGPPSHUVLGH 'LPHQVLRQLQJDQGWROHUDQFLQJSHU$60(<0 %6& %DVLF'LPHQVLRQ7KHRUHWLFDOO\H[DFWYDOXHVKRZQZLWKRXWWROHUDQFHV 5() 5HIHUHQFH'LPHQVLRQXVXDOO\ZLWKRXWWROHUDQFHIRULQIRUPDWLRQSXUSRVHVRQO\ 0LFURFKLS 7HFKQRORJ\ 'UDZLQJ &% DS11177E-page 26 © 2008 Microchip Technology Inc. MCP606/7/8/9 APPENDIX A: REVISION HISTORY Revision E (March 2008) The following is the list of modifications: 1. 2. 3. 4. 5. 6. 7. Increased maximum operating VDD. Added test circuits. Updated performance curves. Added Figure 2-31. Added Section 4.1.1 “Phase Reversal”, Section 4.1.2 “Input Voltage and Current Limits”, ad Section 4.1.3 “Normal Operation”. Updated Section 5.0 “Design AIDS” Updated Section 6.0 “Packaging Information”. Updated package outline drawings. Revision D (February 2005) The following is the list of modifications: 1. 2. 3. 4. 5. 6. Added Section 3.0 “Pin Descriptions”. Updated Section 4.0 “Applications Information”. Added Section 4.3 “Capacitive Loads” Updated Section 5.0 “Design AIDS” to include FilterLab® and to point to the latest SPICE macro model. Corrected and updated Section 6.0 “Packaging Information”. Added Appendix A: “Revision History”. Revision C (January 2001) • Undocumented changes Revision B (May 2000) • Undocumented changes Revision A (January 2000) • Original Release of this Document. © 2008 Microchip Technology Inc. DS11177E-page 25 MCP606/7/8/9 NOTES: DS11177E-page 26 © 2008 Microchip Technology Inc. MCP606/7/8/9 PRODUCT IDENTIFICATION SYSTEM To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office. PART NO. X /XX Device Temperature Range Package Examples: a) b) c) Device MCP606 = Single Op Amp MCP606T = Single Op Amp Tape and Reel (SOIC, TSSOP) MCP607 = Dual Op Amp MCP607T = Dual Op Amp Tape and Reel (SOIC, TSSOP) MCP608 = Single Op Amp with CS MCP608T = Single Op Amp with CS Tape and Reel (SOIC, TSSOP) MCP609 = Quad Op Amp MCP609T = Quad Op Amp Tape and Reel (SOIC, TSSOP) Temperature Range I Package OT P SN SL ST = -40°C to +85°C = = = = = Plastic SOT-23, 5-lead Plastic DIP (300 mil Body), 8-lead, 14-lead Plastic SOIC (3.90 mm body), 8-lead Plastic SOIC (3.90 mm body), 14-lead Plastic TSSOP, 8-lead, 14-lead d) e) a) b) c) a) Industrial Temperature, 8LD PDIP package. MCP606-I/SN: Industrial Temperature, 8LD SOIC package. MCP606T-I/SN: Tape and Reel, Industrial Temperature, 8LD SOIC package. MCP606-I/ST: Industrial Temperature, 8LD TSSOP package. MCP606T-I/OT: Tape and Reel, Industrial Temperature, 5LD SOT-23 package. MCP607-I/P: Industrial Temperature, 8LD PDIP package. MCP607T-I/SN: Tape and Reel, Industrial Temperature, 8LD SOIC package. b) Industrial Temperature, 8LD SOIC package. MCP608T-I/SN: Tape and Reel, Industrial Temperature, 8LD SOIC package. a) MCP609-I/P: b) c) © 2008 Microchip Technology Inc. MCP606-I/P: MCP608-I/SN: Industrial Temperature, 14LD PDIP package. MCP609T-I/SL: Tape and Reel, Industrial Temperature, 14LD SOIC package. DS11177E-page 27 MCP606/7/8/9 NOTES: DS11177E-page 28 © 2008 Microchip Technology Inc. Note the following details of the code protection feature on Microchip devices: • Microchip products meet the specification contained in their particular Microchip Data Sheet. • Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the intended manner and under normal conditions. • There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data Sheets. Most likely, the person doing so is engaged in theft of intellectual property. • Microchip is willing to work with the customer who is concerned about the integrity of their code. • Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not mean that we are guaranteeing the product as “unbreakable.” Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act. Information contained in this publication regarding device applications and the like is provided only for your convenience and may be superseded by updates. It is your responsibility to ensure that your application meets with your specifications. MICROCHIP MAKES NO REPRESENTATIONS OR WARRANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED, WRITTEN OR ORAL, STATUTORY OR OTHERWISE, RELATED TO THE INFORMATION, INCLUDING BUT NOT LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE, MERCHANTABILITY OR FITNESS FOR PURPOSE. Microchip disclaims all liability arising from this information and its use. Use of Microchip devices in life support and/or safety applications is entirely at the buyer’s risk, and the buyer agrees to defend, indemnify and hold harmless Microchip from any and all damages, claims, suits, or expenses resulting from such use. No licenses are conveyed, implicitly or otherwise, under any Microchip intellectual property rights. Trademarks The Microchip name and logo, the Microchip logo, Accuron, dsPIC, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro, PICSTART, PRO MATE, rfPIC and SmartShunt are registered trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. FilterLab, Linear Active Thermistor, MXDEV, MXLAB, SEEVAL, SmartSensor and The Embedded Control Solutions Company are registered trademarks of Microchip Technology Incorporated in the U.S.A. Analog-for-the-Digital Age, Application Maestro, CodeGuard, dsPICDEM, dsPICDEM.net, dsPICworks, dsSPEAK, ECAN, ECONOMONITOR, FanSense, In-Circuit Serial Programming, ICSP, ICEPIC, Mindi, MiWi, MPASM, MPLAB Certified logo, MPLIB, MPLINK, mTouch, PICkit, PICDEM, PICDEM.net, PICtail, PIC32 logo, PowerCal, PowerInfo, PowerMate, PowerTool, REAL ICE, rfLAB, Select Mode, Total Endurance, UNI/O, WiperLock and ZENA are trademarks of Microchip Technology Incorporated in the U.S.A. and other countries. SQTP is a service mark of Microchip Technology Incorporated in the U.S.A. All other trademarks mentioned herein are property of their respective companies. © 2008, Microchip Technology Incorporated, Printed in the U.S.A., All Rights Reserved. Printed on recycled paper. Microchip received ISO/TS-16949:2002 certification for its worldwide headquarters, design and wafer fabrication facilities in Chandler and Tempe, Arizona; Gresham, Oregon and design centers in California and India. The Company’s quality system processes and procedures are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping devices, Serial EEPROMs, microperipherals, nonvolatile memory and analog products. In addition, Microchip’s quality system for the design and manufacture of development systems is ISO 9001:2000 certified. © 2008 Microchip Technology Inc. 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