SANYO ENA0710

JCH3101
Ordering number : ENA0710
JCH3101
PNP Epitaxial Planar Silicon Transistors
For Automotive Audios
Features
•
•
•
•
Adoption of MBIT processes.
High breakdown voltage and large current capacity.
High-speed switching.
High reliability. / Reliability test 2000 hours guarantee.
Specifications
Absolute Maximum Ratings at Ta=25°C
Parameter
Collector-to-Base Voltage
Symbol
Conditions
Ratings
Unit
--100
V
Collector-to-Emitter Voltage
VCBO
VCEO
--100
V
Emitter-to-Base Voltage
VEBO
--6
V
IC
--1
A
Collector Current
Collector Current (Pulse)
ICP
Collector Dissipation
PC
Junction Temperature
Tj
Storage Temperature
Tstg
--2
A
0.9
W
150
°C
--55 to +150
°C
When mounted on ceramic substrate (600mm2✕0.8mm)
Electrical Characteristics at Ta=25°C
Parameter
Symbol
Conditions
Ratings
min
typ
max
Unit
Collector Cutoff Current
ICBO
VCB=--100V, IE=0A
--100
nA
Emitter Cutoff Current
IEBO
hFE
VEB=--4V, IC=0A
--100
nA
DC Current Gain
Gain-Bandwidth Product
Output Capacitance
Marking : 5A
fT
Cob
VCE=--5V, IC=--100mA
VCE=--10V, IC=--100mA
VCB=--10V, f=1MHz
140
400
120
MHz
13
pF
Continued on next page.
Any and all SANYO Semiconductor Co.,Ltd. products described or contained herein are, with regard to
"standard application", intended for the use as general electronics equipment (home appliances, AV equipment,
communication device, office equipment, industrial equipment etc.). The products mentioned herein shall not be
intended for use for any "special application" (medical equipment whose purpose is to sustain life, aerospace
instrument, nuclear control device, burning appliances, transportation machine, traffic signal system, safety
equipment etc.) that shall require extremely high level of reliability and can directly threaten human lives in case
of failure or malfunction of the product or may cause harm to human bodies, nor shall they grant any guarantee
thereof. If you should intend to use our products for applications outside the standard applications of our
customer who is considering such use and/or outside the scope of our intended standard applications, please
consult with us prior to the intended use. If there is no consultation or inquiry before the intended use, our
customer shall be solely responsible for the use.
Specifications of any and all SANYO Semiconductor Co.,Ltd. products described or contained herein stipulate
the performance, characteristics, and functions of the described products in the independent state, and are not
guarantees of the performance, characteristics, and functions of the described products as mounted in the
customer' s products or equipment. To verify symptoms and states that cannot be evaluated in an independent
device, the customer should always evaluate and test devices mounted in the customer' s products or
equipment.
TOKYO OFFICE Tokyo Bldg., 1-10, 1 Chome, Ueno, Taito-ku, TOKYO, 110-8534 JAPAN
22008EA TI IM TC-00001203 No. A0710-1/4
JCH3101
Continued from preceding page.
Parameter
Symbol
Collector-to-Emitter Saturation Voltage
VCE(sat)
VBE(sat)
Base-to-Emitter Saturation Voltage
Collector-to-Base Breakdown Voltage
V(BR)CBO
Collector-to-Emitter Breakdown Voltage
V(BR)CEO
Emitter-to-Base Breakdown Voltage
V(BR)EBO
ton
tstg
tf
Turn-ON Time
Storage Time
Fall Time
Ratings
Conditions
min
typ
IC=--400mA, IB=--40mA
IC=--400mA, IB=--40mA
IC=--10μA, IE=0A
IC=--1mA, RBE=∞
Unit
max
--0.2
--0.6
V
--0.85
--1.2
V
--100
V
--100
V
IE=--10μA, IC=0A
See specified Test Circuit.
--6
V
80
ns
See specified Test Circuit.
700
ns
See specified Test Circuit.
40
ns
Package Dimensions
Switching Time Test Circuit
unit : mm (typ)
7015A-003
0.6
2.9
IB1
PW=20μs
D.C.≤1%
0.15
OUTPUT
IB2
3
INPUT
0.2
50Ω
1
2
0.95
1 : Base
2 : Emitter
3 : Collector
0.4
+
+
100μF
470μF
5V
--50V
IC= --10IB1=10IB2= --400mA
0.9
0.2
0.6
RL
0.05
1.6
2.8
RB
VR
SANYO : CPH3
IC -- VCE
0m
mA
5
--1
--2
--0.8
--0.7
--5mA
--0.6
--0.5
--3mA
--0.4
--0.8
--0.6
--0.4
--0.3
--2mA
--0.2
--1mA
--0.2
IB=0mA
0
--40°C
5
VCE= --5V
25°C
--2
A
IC -- VBE
--1.0
A
--10m
Ta=85°C
Collector Current, IC -- A
--0.9
mA
Collector Current, IC -- A
--1.0
--0.1
0
0
--0.5
--1.0
--1.5
--2.0
--2.5
--3.0
--3.5
--4.0
--4.5
Collector-to-Emitter Voltage, VCE -- V
0
--5.0
--0.2
--0.3
--0.4
--0.5
--0.6
--0.7
DC Current Gain, hFE
25°C
2
--40°C
100
7
5
3
--0.01
2
3
5
7
--0.1
2
3
Collector Current, IC -- A
5
7
--1.0
IT13163
--1.0
IT13162
VCE= --10V
Gain-Bandwidth Product, fT -- MHz
Ta=85°C
--0.9
f T -- IC
3
VCE= --5V
3
--0.8
Base-to-Emitter Voltage, VBE -- V
hFE -- IC
5
--0.1
IT07232
2
100
7
5
3
--0.01
2
3
5
7
--0.1
2
3
Collector Current, IC -- A
5
7 --1.0
IT07238
No. A0710-2/4
JCH3101
Cob -- VCB
5
Output Capacitance, Cob -- pF
Collector-to-Emitter
Saturation Voltage, VCE(sat) -- V
2
10
7
5
3
2
3
5
7
2
--10
3
5
Collector-to-Base Voltage, VCB -- V
7 --100
IT07240
--0.1
5°C
7
8
Ta=
5
2
3
5
7
Collector Current, IC -- A
5
3
5
7 --1.0
IT13164
ICP= --2A
<10μs
1m
s
IC= --1A
--1.0
7
5
Di
ssi
3
2
10
ms
10
0
e
m
ra
nL
s
im tion
ite
S
d
/B
pa
tio
--0.1
7
5
DC
op
μs
s
0μ
50
25°C
2
--0.1
ASO
3
2
7
85°C
2
5
Ta= --40°C
°C
25°C
3
2
--1.0
--40
100
Li
m
3
2
ite
d
--0.01
7
5
3
2
--0.01
2
3
5
7
2
--0.1
3
5
Collector Current, IC -- A
--1.0
IT13165
ICP= --2A
--0.1
7
5
10
o
pa pera
tio tio
nL n
im
ite
ssi
0μ
s
d
ms
S
/B
3
2
Li
m
ite
d
--0.01
7
5
Ta=85°C
Single pulse
When mounted on ceramic substrate (600mm2✕0.8mm)
--0.001
--0.1
2
3
5 7 --1.0
2
3
3
5 7 --1.0
5 7 --10
2
3
5 7--100
Collector-to-Emitter Voltage, VCE -- V
2
3
5 7 --10
2
3
5 7--100
2
IT07246
PC -- Ta
When mounted on ceramic substrate
(600mm2✕0.8mm)
0.9
μs
Di
10
0m
s
DC
2
Collector-to-Emitter Voltage, VCE -- V
<10μs
50
1m
s
IC= --1A
3
2
3
2
--0.001
--0.1
1.0
100
--1.0
7
5
7
ASO
5
3
2
Ta=25°C
Single pulse
When mounted on ceramic substrate (600mm2✕0.8mm)
3
2
Collector Dissipation, PC -- W
Base-to-Emitter
Saturation Voltage, VBE(sat) -- V
2
Collector Current, IC -- A
IC / IB=10
Collector Current, IC -- A
3
--0.01
--0.01
VBE(sat) -- IC
3
IC / IB=10
5
3
--1.0
VCE(sat) -- IC
7
f=1MHz
0.8
0.7
0.6
0.5
0.4
0.3
0.2
0.1
0
2
IT13378
0
20
40
60
80
100
120
Ambient Temperature, Ta -- °C
140
160
IT07247
No. A0710-3/4
JCH3101
JCH3101 Reliability Assurance
Test
Test Conditions
Test Time
LTPD
Environmental Test
Temperature Cycle
--55°C to 150°C (30 min each)
500 cycles
10%
Thermal Shock
100°C to 0°C (5 min each)
250 cycles
10%
Pressure Cooker Test (Autoclave)
Ta=121°C, 100%RH, 203kPa
200 hrs
10%
Steady State Operating Life
Ta=25°C, Tj=150°C
2000 hrs
10%
Intermittent Operating Life
Ta=25°C, ΔTj=90°C
20000 cycles
10%
High Temperature Reverse Bias
Ta=150°C, VCES=100V
2000 hrs
10%
Temperature Humidity Storage
Ta=85°C, 85%RH
2000 hrs
10%
High Temperature Storage
Ta=150°C
2000 hrs
10%
Low Temperature Storage
Ta=--55°C
2000 hrs
10%
Temperature Humidity Reverse Bias
Ta=85°C, 85%RH, VCES=100V
2000 hrs
10%
C=200pF, R=0Ω, 3 times
200V
Endurance Test
Electrostatic Discharges
Machine Model
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products at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition
ranges, or other parameters) listed in products specifications of any and all SANYO Semiconductor Co.,Ltd.
products described or contained herein.
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product/technology improvement, etc. When designing equipment, refer to the "Delivery Specification" for the
SANYO Semiconductor Co.,Ltd. product that you intend to use.
Information (including circuit diagrams and circuit parameters) herein is for example only; it is not guaranteed
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This catalog provides information as of February, 2008. Specifications and information herein are subject
to change without notice.
PS No. A0710-4/4