E737 Per-Pin Precision Measurement Unit TEST AND MEASUREMENT PRODUCTS Description Features The E737 is a precision measurement unit designed for automatic test equipment and instrumentation. Manufactured in a wide voltage CMOS process, it is a monolithic solution for a per pin PMU. • FV / MI Capability • FI / MV Capability • 4 Current Ranges (±40 mA, ±1 mA, ±100 µA, ±10 µA) • -5V/+7V I / O Range • Short Circuit Protection • Clamps for limiting mode and range select transients The E737 supports two modes of operation: force current/measure voltage and force voltage/measure current. The E737 can force or measure voltage in the range of -5V to +7V. In addition, the E737 can force or measure a current of up to 40 mA over four distinct ranges: ±40 mA, ±1 mA, ±100 µA and ±10 µA. Applications The E737 has an on board window comparator that provides three bits of information: DUT too high, DUT too low, and DUT fail. There is also a monitor function which provides a real time analog voltage signal proportional to either the DUT voltage or current. • On board clamps prevent large transient spikes when changing operating mode or current range. Also, the PMU will survive a direct short over the legal voltage range. Automatic Test Equipment - Memory Testers - VLSI Testers - Mixed Signal Tester The E737 is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per pin. Functional Block Diagram HiZ VINP FORCE / SENSE IVIN MODE SEL SENSE DUT LTH I/V MAX Comparators I/V MIN Detector Logic PASS/FAIL* Voltage Monitor DUT GTL DISABLE I/V MONITOR Revision 6 / February 20, 2007 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Pin Description Pin Name Pin # VINP 20 IVIN 21 Analog voltage input which forces the output current at FORCE (FI/MV mode). FORCE 3 Analog output pin which forces current or voltage. SENSE 2 Analog input pin which senses voltage (typically connected to FORCE). MODE SEL 10 Digital input which determines whether the PMU is forcing voltage or forcing current. RS1, RS2 9, 11 I/V MIN I/V MAX 24 31 Analog input voltages which establish the lower and upper threshold level for the measurement comparator. DUT LTH DUT GTL 32 26 Digital comparator open drain outputs that indicate the DUT measurement is less than the upper threshold and greater than the lower threshold. PASS/FAIL* 25 Digital output that indicates whether or not the monitored voltage is between the comparator thresholds. Logic1 corresponds to a measurement that is between comparator thresholds. DISABLE 18 Digital input which places the digital comparator outputs a I/V MONITOR in high impedance. HiZ 8 Digital input which places the FORCE output into high impedance. RA, RB RC, RD 5,16 19,22 I/V MONITOR 12 Analog voltage output that provides a real time monitor of either the measured voltage or measured current level. COMP1 COMP2 15 14 External compensation pins that require an external capacitor connected between the two pins. VCC 27 Positive analog power supply. VEE 13, 30 Negative analog power supply. CA CB 1 23 External compensation pins that require an external capacitor connected between the two pins. CAPI 7 External compensation pin that requires an external capacitor connected to ground. GND 4 Ground. © 2007 Semtech Corp. / Rev. 6, 2/20/07 Description Analog voltage input which forces the output voltage at FORCE (FV/MI mode). Digital inputs which select one of the four current ranges. External resistors corresponding to ranges A through D. www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Pin Description (continued) 32 Pin LQFP (7 mm x 7 mm x 1.4 mm) (Top View) 25 1 17 9 © 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Circuit Description Circuit Overview Comparator Outputs The E737 is a parametric test and measurement unit that can : • Force Voltage / Measure Current • Force Current / Measure Voltage. The comparator outputs DUT GTL, DUT LTH, and PASS/FAIL* are open drain outputs. When active (logical 0), they will pull to ground. When disabled (logical 1 or DISABLE = 1), they require an external pull up resistor to a positive voltage to achieve a high state. The E737 can force or measure voltage over a -5V to +7V range, and force or measure current over four distinct ranges: • ± 40 mA • ± 1 mA • ± 100 µA • ± 10 µA. An on board window comparator provides three-bit measurement range classification. Also, a monitor passes a real time analog signal which tracks either the DUT’s current or voltage performance. Control Inputs MODE SEL is a digital input which determines whether the PMU forces voltage or current, when it is not placed in a high impedance state by the HIZ input (see Table 1). HiZ Mode SEL PMU Operation 1 X High Impedance 0 0 FV/MI 0 1 FI/MV Table 1. RS1 and RS2 are digital inputs to an analog MUX which establishes the full scale current range of the PMU. One of four current ranges can be selected by using RS1 and RS2 as shown in Table 2. Rext Nom RS1 RS2 RA = 200KW 0 0 A: ±10μA RB = 20KW 0 1 B: ±100μA RC = 2KW 1 1 C: ±1mA RD = 50W 1 0 D: ±40mA Force / Sense FORCE is an analog output which either forces a current or forces a voltage, depending on which operating mode is selected. The SENSE pin is a high impedance analog input which measures the DUT voltage input in the FI / MV operating mode. FORCE and SENSE are brought out to separate pins to allow for remote sensing. I/V MONITOR I/V MONITOR is a real time analog output which tracks the sensed parameter. I/V MONITOR functionality is described in Table 3. Disable Mode SEL I/V Monitor 1 X High Impedance 0 0 Measured Current 0 1 Measured Voltage Table 3. In the FI / MV mode, the output voltage is a 1:1 mapping of the DUT voltage. In the FV / MI mode, I/V MONITOR follows the equation: I(measured) = I/V MONITOR / (4.0 * REXT). Current Range Using nominal values for the external resistors, I/V MONITOR of +8.0V corresponds to Imax and –8.0V corresponds to Imin of the selected current range. Table 2. © 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) HIZ HIZ is a digital input which places the FORCE output into a high impedance state, regardless of the operating mode (forcing current or voltage.) This function allows the PMU to be connected directly to the pin electronics without an isolation relay while NOT adding any leakage current. The voltage at I/V MONITOR follows the equation: I(measured) = I/V MONITOR / (4.0 * REXT). DISABLE Force Current / Measure Voltage Mode DISABLE is a digital input which places DUT LTH, DUT GTL, I/V MONITOR, and PASS/FAIL* into high impedance states. In the FI / MV mode, IVIN is a high input impedance, analog voltage input that is converted into a current (see Table 5) using the following relationship: Force Voltage / Measure Current Mode In the FV / MI mode, VINP is a high input impedance, analog voltage input that maps directly to the voltage forced at the DUT (see Figure 1), where FORCE = VINP. where positive current is defined as current flowing out of the PMU. A current monitor is connected in series with the Op Amp driving the FORCE voltage. This monitor generates a voltage that is proportional to the current passing through it, and its output is brought out to I/V MONITOR. The monitor’s voltage may also be evaluated using the Window Comparator whose operation is in accordance with the FV/MI functional truth table (Table 6). I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for the window comparator (see Table 4). In the FV / MI mode, a maximum voltage input corresponds to at least a maximum current output. Positive current is defined as current flowing out of the PMU. I/V MAX I/V MIN Comparator Threshold +8.0V > Imax (full scale) 0V 0 -8.0V < Imin (full scale) Nominally, the external resistors (RA, RB, RC, and RD) should be chosen such that Imax * REXT = 2.0V. FORCE = IVIN / (4.0 * REXT) IVIN Forced Current +8.0V Imax (full scale) 0V 0 -8.0V Imin (full scale) Table 5. The resulting DUT voltage is then tested via the SENSE input by a window comparator, whose functional truth table is shown in Table 7. I/V MAX and I/V MIN are high impedance analog inputs that establish the upper and lower thresholds for the window comparator. In the FI / MV mode, the reference inputs translate 1:1 to SENSE level thresholds. Table 4. © 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com © 2007 Semtech Corp. / Rev. 6, 2/20/07 SENSE IVIN VINP 5KW 15KW FV* FV* FV – CB FV FV* A* B* C* D* D A B C D D* Cext CAPI: Input noise filter capacitor (low pass) Cext CB, CA: Current sense resistor compensation Cext COMP1, COMP2: Force amplifier compensation COMP1 DRIVER + HiZ Cext COMP2 CAPI Cext FV ⇒ FV/FI* = 1 FV* ⇒ FV/FI* = 0 FV* FV 40KW 40KW FV FV* FV Cext C C* B B* A A* RA RB RC RD CA INST. + – FV Edge737 Functional Schematic FV* 5 KW 15 KW 4X – + IV_MIN IV_MAX FV* FV + – + – – + DISABLE 1 1 1 1 0 0 0 0 70 W typ. DUT_GTL PASS/FAIL* DUT_LTH I/V MONITOR FORCE E737 TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Figure 1. E737 Functional Schematic www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) TEST CONDITION DISABLE DUT LTH DUT GTL I/V MONITOR PASS/FAIL* X 1 HiZ HiZ HiZ I/V MONITOR > I/V MAX I/V MONITOR < I/V MAX 0 0 0 1 N/A N/A I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT 0 N/A I/V MONITOR > I/V MAX I/V MONITOR < I/V MAX 0 0 N/A N/A 1 0 I/V MONITOR = Iout * 4.0 * REXT I/V MONITOR = Iout * 4.0 * REXT N/A 0 I/V MONITOR < I/V MAX and I/V MONITOR > I/V MAX 0 1 1 I/V MONITOR = Iout * 4.0 * REXT 1 Table 6. FV / MI Truth Table TEST CONDITION DISABLE DUT LTH DUT GTL I/V MONITOR PASS/FAIL* X 1 HiZ HiZ HiZ SENSE > I/V MAX SENSE < I/V MAX 0 0 0 1 N/A N/A I/V MONITOR = SENSE I/V MONITOR = SENSE 0 N/A SENSE > I/V MIN SENSE < I/V MIN 0 0 N/A N/A 1 0 I/V MONITOR = SENSE I/V MONITOR = SENSE N/A 0 DUT < I/V MAX and DUT > I/V MAX 0 1 1 I/V MONITOR = SENSE 1 Table 7. FI / MV Truth Table © 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) REXT Selection VOS@IVMON The E737 is designed for the voltage drop across RA, RB, RC, and RD to be ≤2V with the maximum current passing through them. However, these resistor values can be changed to support different applications. Increasing the maximum current beyond the nominal range is not recommended. However, decreasing the maximum current is allowed. CM Linearity CM Error = Slope VCM@FORCE –5V 7V Short Circuit Protection The E737 is designed to survive a direct short circuit to any voltage within the supply rails at the FORCE and SENSE pins. Transient Clamps The E737 has on-board clamps to limit the voltage and current spikes that might result from either changing the current range or changing the operating mode. Common Mode Error/Calibration In order to attain a high degree of accuracy in a typical ATE application, offset and gain errors are accounted for through software calibration. When forcing or measuring a current with the E737, an additional source of error, common mode error, should be accounted for. Common mode error is a measure of how the common mode voltage, VCM, at the input of the current sense amplifier affects the forced or measured current values (see Figure 2). Since this error is created by internal resistors in the current sense amplifier, it is very linear in nature. Using the common mode error and common mode linearity specifications, one can see that with a small number of calibration steps (see Applications note PMU-A1), the effect of this error can be significantly reduced. Figure 2. Graphical Representation of Common Mode Error Compensation Capacitors COMP1 and COMP2 are internal op amp compensation pins that require a 120 pF capacitor connected between the two pins. CAPI is an external noise compensation pin that can be used as a low pass filter to eliminate noise from the IVIN and VINP input pins through the connection of an external capacitor from CAPI to GND. The relationship between the roll-off frequency of noise filtered (in Hz) to the external capacitance (in farads) can be seen below: 1 Filter Frequency = 80,000 π X CCAPI CA and CB are internal compensation pins that require a 120 pF capacitor connected between them. Power Supply Sequencing In order to help protect the E737 from a latch-up condition, it is important that VCC All Input Voltages ≥ VEE, and VCC ≥ GND ≥ VEE at all times. © 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Application Information FORCE Pin Output Voltage (Positive Headroom Requirement) The maximum positive voltage that can be forced at the FORCE pin by the Edge 737 in the force voltage/measure current (FV/MI) mode and the maximum compliance voltage that can appear at the FORCE pin in the force current/measure voltage mode (FI/MV) is a function of the positive power supply (VCC), device case temperature (Tc), and selected current range. The plot in Figure 3 depicts the typical positive voltage that can appear at the FORCE pin for various power supply combinations across the specified case temperature range of the device. All plots represent the Edge 737 being used with a ± 2V full-scale swing across the external current sense resistors for each range. E737 FORCE Voltage Positive Headroom 8.6 VCC = 13V, VEE = -9.5V, Ranges A, B, C VCC = 13V, VEE = -9.5V, Range D 8.4 8.2 VFORCE (V) 8.0 7.8 VCC = 12V, VEE = 10V, Ranges A, B, C 7.6 VCC = 12V, VEE = 10V, Range D 7.4 VCC = 11.5V, VEE = -9.5V, Ranges A, B, C 7.2 7.0 VCC = 11.5V, VEE = -9.5V, Range D 6.8 6.6 25 30 35 40 45 50 55 60 65 70 75 TEMPERATURE (C) Figure 3. Typical E737 FORCE Pin Voltage vs. Case Temperature © 2007 Semtech Corp. / Rev. 6, 2/20/07 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Application Information (continued) Required External Components Choose Rext such that: Iout (low) = V+ / RPU < 1mA, V+ < VCC 120pF V+ 120pF * COMP1 RPU RPU COMP2 Typical Values CAPI 200KW RPU RA DUT LTH 20KW RB DUT GTL 2KW RC PASS/FAIL* 50W RD FORCE CA 120pF CB VCC VEE .1µF .1µF VCC VEE * Optional (see Compensation Capacitors Section) Actual decoupling capacitor values depend on the actual system environment. © 2007 Semtech Corp. / Rev. 6, 2/20/07 10 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Package Information 32 Pin LQFP Package 7 mm x 7 mm x 1.4 mm DIMENSIONS INCHES DIM. D MIN NOM MAX MIN NOM MAX A .055 - .063 1.40 - 1.60 A1 .002 - .006 0.05 - 0.15 A2 .053 .055 .057 1.35 1.40 1.45 b .012 - .018 0.30 - 0.45 c .004 - .008 0.09 - 0.20 .280 6.90 D .354 BSC D1 D/2 .272 E D .272 e A E B N aaa C A-B D 4X N/4 TIPS 1 e 9.00 BSC .276 .018 .024 7.00 7.10 9.00 BSC .280 6.90 .031 BSC L E1 .276 .354 BSC E1 E/2 MILLIMETERS 7.00 7.10 0.80 BSC .030 0.45 0.60 L1 (.039) (1.00) N 32 32 q 0-7° 0-7° aaa .008 0.20 bbb .003 0.08 ccc .003 0.08 0.75 e/2 SEE DETAIL A D1 H ccc C A A2 SEATING PLANE A1 bbb bxN C A-B D c GAGE PLANE C L 0.25 0 (L1) DETAIL A NOTES: 1. CONTROLLING DIMENSIONS ARE IN MILLIMETERS (ANGLES IN DEGREES). 2. DATUMS -A- , -B- AND -C- TO BE DETERMINED AT DATUM PLANE -H- . 3. DIMENSIONS "E1" AND "D1" DO NOT INCLUDE MOLD FLASH, PROTRUSIONS OR GATE BURRS. 4. REFERENCE JEDEC MS-026, VARIATION BBA. © 2007 Semtech Corp. / Rev. 6, 2/20/07 11 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Absolute Maximum Ratings Parameter Symbol Min Positive Power Supply VCC Negative Power Supply Total Power Supply Max Units 0 14 V VEE -13 0 V VCC – VEE 0 23 V -0.5 7 V Digital Inputs Typ Storage Temperature TS -55 150 °C Junction Temperature TJ -65 150 °C 260 °C Soldering Temperature Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for an extended period may affect device reliability. Recommended Operating Conditions Parameter Symbol Min Typ Max Units Positive Analog Power Supply (Relative to GND) VCC 11.5 12 13 V Negative Analog Power Supply (Relative to GND) VEE -11 -10 -9.5 V VCC – VEE 21 22 22.5 V Case Temperature TC 25 75 °C Junction Temperature TJ 125 °C Total Analog Power Supply θJC Thermal Resistance of Package (Junction to Case) 14.1 °C/W Production tested @ +12V, –10V for linearity and min/max parametric testing. © 2007 Semtech Corp. / Rev. 6, 2/20/07 12 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS DC Characteristics Description Symbol Min Typ Max Units ICC IEE ICCB ∆ICC IEEB ∆IEE 3 -11 3 0 -55 -3 5 -5 11 -3 11 3 -42 0 mA mA mA mA mA mA Power Supplies Power Supply Consumption Positive Supply (no-load) Negative Supply (no-load) Positive Supply Breakdown (Note 1) Positive Supply Rejection (Note 1) Negative Supply Breakdown (Note 1) Negative Supply Rejection (Note 1) Power Supply Rejection Ratio (Note 2) VCC/VEE to FORCE 0.1 kHz 1.0 kHz 10 kHz 100 kHz PSRR VCC/VEE to I/V MONITOR 0.1 kHz 1.0 kHz 10 kHz 100 kHz (MI Mode) 100 kHz (MV Mode) 65 60 50 20 dB dB dB dB 65 60 50 1.5 15 dB dB dB dB dB Force Voltage/Measure Current Mode Input Voltage Range @ VINP VINP VEE + 4 VCC - 4 V Input Bias Current @ VINP IBIAS -0.4 0.4 A Capacitive Loading Range @ FORCE for Stability CFORCE 0 12 nA Output Forcing Voltage Range VFORCE VEE + 4.5 VCC - 5.0 V VOS FV INL FV Gain -100 -0.025 -0.985 100 0.025 1.015 mV % FSVR V/V ILEAK -20 20 nA -10 -100 -1 -40 10 100 1 40 A A mA mA -400 -0.122 3.94 -10 -10.5 400 0.122 4.06 10 10.5 mV % FSCR V/V mV/V mV 150 nA 12 nF Forcing Voltage Accuracy (@ FORCE) Offset (VINP = 0V, no load) Linearity Gain FORCE/SENSE Combined Leakage Current in HiZ Mode Compliance Current Measurement Range Range A Range B Range C Range D Current Measurement Accuracy (@ I/V MONITOR) Offset Linearity (Note 3) Gain (Note 4) Common Mode Error Common Mode Linearity I/V MONITOR Output Leakage Current in Disable Mode Capacitive Loading Range @ I/V MONITOR © 2007 Semtech Corp. / Rev. 6, 2/20/07 VOS MI INL MI Gain CM Error ∆CM Error ILEAK CI/V MONITOR 13 -150 1 4 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Description Symbol Min Input Voltage Range @ IVIN Input Bias Current @ IVIN Capacitive Loading Range @ FORCE for Stability IVIN IBIAS CFORCE Output Forcing Current IFORCE Typ Max Units -9.0 -0.4 +9.0 0.4 12 V A nF -10 -100 -1 -40 10 100 1 40 A A mA mA 4 0.26 0.35 0.075 0.1 % FSCR V/V % FSCR % FSCR/V % FSCR Force Current/Measure Voltage Mode Range A Range B Range C Range D Forcing Current Accuracy (@ FORCE) Offset Gain (Note 5) Linearity @ FORCE = -5V to 7V Common Mode Error Common Mode Linearity IOS FI Gain FI INL ICM Error ∆CM Error -4 0.24 -0.35 -0.075 -0.1 ILEAK -20 20 nA VCOMPLIANCE VEE + 4.5 VCC - 5.0 V VOS MV Gain MV INL -100 0.985 -0.025 100 1.015 0.025 mV V/V % FSVR ILEAK -150 150 nA 12 nF FORCE/SENSE Combined Leakage Current in HiZ Mode Compliance Voltage Range Voltage Measurement Accuracy (@ I/V MONITOR) Offset Gain Linearity (Note 3) I/V MONITOR Output Leakage Current in Disable Mode Capacitive Loading Range @ I/V MONITOR CI/V MONITOR 0.25 1 Comparator Input Voltage Range (I/V MIN, I/V MAX) VIN VEE + 1 VCC - 3 V Input Offset Voltage VOS -100 100 mV IIN -0.4 0.4 A 400 mV Input Bias Current (I/V MIN, I/V MAX) Output Low Level @ IOL = 1mA (DUT LTH, DUT GTL, PASS/FAIL*) VOL Output Leakage in DISABLED Mode IOH -1 1 A Output Leakage in DISABLED Mode ILEAK -0.2 0.2 A IIN -0.2 0.2 A DISABLE Input Bias Current © 2007 Semtech Corp. / Rev. 6, 2/20/07 14 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Description Symbol Min Input High Level VIH 2.4 Input Low Level VIL Input Bias Current IIN -0.2 Other Digital Inputs Input High Level (MODE SEL, HiZ) VIH 2.4 Input Low Level (MODE SEL, HiZ) VIL MODE SEL Input Bias Current IIN HiZ Input Bias Current IIN Typ Max Units Analog MUX (RS1, RS2) V 0.8 V 0.2 A V 0.8 V -0.2 0.2 A -1 50 A DC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF, TA = 25°C unless otherwise noted. Note 1: Note 2: Note 3: Note 4: Test Conditions are as follows: VCC = 12 to 13V, VEE = –10V, 40 mA is externally forced into FORCE pin. Guaranteed by design and characterization. Not production tested. Characterized with a ±10 µA current load at I/V MONITOR. V/V units derived as follows: VIVMON MI Gain = (I x REXT) MEASURED Note 5: V/V units derived as follows: IFORCE x REXT FI Gain = VIVIN Unit Definitions: FSCR = Full Scale Current Range Range A, FSCR = 20 µA Range B, FSCR = 200 µA Range C, FSCR = 2 mA Range D, FSCR = 80 mA FSVR = Full Scale Voltage Range = 12V nominal (–5V to 7V) © 2007 Semtech Corp. / Rev. 6, 2/20/07 15 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Description Symbol Min Typ Max Units To 0.1% of 10V Step Range A Ranges B, C, D 150 120 s s To 0.025% of 10V Step All Ranges 300 s 35 s To 0.1% of FSCR Range A Ranges B, C, D 400 125 s s To 0.025% of FSCR Range A Ranges B, C, D 1.5 300 ms s Force Voltage/Measure Current Mode FORCE Voltage Settling Time (100pF load @ FORCE) tsettle FORCE Amp Saturation Recovery Time Tsat Measure Current Settling Time (100pF load @ I/V MONITOR) tsettle Disable Time, HiZ Low to High tZ 1 s Enable Time, HiZ High to Low toe 450 ns 700 250 s s 2 300 ms s 35 s To 0.1% of 10V Step Range A Ranges B, C, D 700 250 s s To 0.025% of 10V Step Range A Ranges B, C, D 2 350 ms s Force Current/Measure Voltage Mode FORCE Output Current Settling Time (100pF load @ FORCE) To 0.1% of FSCR Range A Ranges B, C, D tsettle To 0.025% of FSCR Range A Ranges B, C, D FORCE Amp Saturation Recovery Time Tsat Measure Voltage Settling Time (100pF load @ I/V MONITOR) tsettle Disable Time, HiZ Low to High tZ 1 s Enable Time, HiZ High to Low toe 0.45 s © 2007 Semtech Corp. / Rev. 6, 2/20/07 16 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS AC Characteristics Description Symbol Min Typ Max Units tpd 30 s Disable Time, DISABLE Low to High tZ 300 ns Enable Time, DISABLE High to Low toe 5.5 s Comparator Propagation Delay s I/V MONITOR Disable Time, DISABLE Low to High tZ 350 ns Enable Time, DISABLE High to Low toe 40 s MODE SEL Propagation Delay tpd 10 s RS0/RS1 Propagation Delay tpd 1 s I/V MONITOR AC Test Conditions: CAPI = 120 pF connected to GND, CA – CB = 120 pF, COMP1 – COMP2 = 120 pF, TA = 25°C unless otherwise noted. Settling times guaranteed by design and characterization (not production tested). © 2007 Semtech Corp. / Rev. 6, 2/20/07 17 www.semtech.com E737 TEST AND MEASUREMENT PRODUCTS Ordering Information Model Number Package E737ATF 32-Pin LQFP 7mm x 7mm E737ATFT 32-Pin LQFP 7mm x 7mm Lead Free EVM737ATF E737H Evaluation Module This device is ESD sensitive. Care should be taken when handling and installing this device to avoid damaging it. Contact Information Semtech Corporation Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 © 2007 Semtech Corp. / Rev. 6, 2/20/07 18 www.semtech.com