Edge4707B Quad Channel Per-Pin Precision Measurement Unit TEST AND MEASUREMENT PRODUCTS Description Features The Edge4707B is a precision measurement unit designed for automatic test equipment and instrumentation. Manufactured in a wide voltage CMOS process, it is a monolithic solution for a quad channel per pin PMU. • • • • • • • • • • Each channel of the Edge4707B features a PMU that can force or measure voltage over a 15V I/O range, and supports 4 current ranges: 2 µA, 200 µA, 20 µA, and 2 mA. Each channel of the Edge4707B features an on-board window comparator that provides two bits of information: DUT too high and DUT too low. There is also a monitor function which provides a real time analog signal proportional to either the measured voltage or current. FV / MI Capability FI / MV Capability FV / MV Capability FI / MI Capability 4 Current Ranges (2 µA, 20 µA, 200 µA, 2mA) –2V to +13V Output Range (Zero Current) 0V to 11V Output Range (Full Scale Current) FV Linearity to ± .025% FSR Central PMU Switches Per Pin Super Voltage Switches Functional Block Diagram E_SN_IN E_FC_IN The Edge4707B is designed to be a low power, low cost, small footprint solution to allow high pin count testers to support a PMU per pin. CHANNEL 0 45Ω* 100Ω∗ VINP FORCE IVIN 1KΩ∗ FV / FI* MI / MV* In addition, two independent switches per channel (for a central PMU force and sense) plus two wide voltage analog muxes per channel are included. SENSE IVMAX COMPARATORS DUTLTH IVMIN DETECTOR LOGIC DUTGTL VOLTAGE MONITOR IVMON DISABLE CHANNEL 1 45Ω∗ 100Ω∗ VINP FORCE IVIN 1KΩ∗ Applications • FV / FI* MI / MV* Automated Test Equipment - Memory Testers - VLSI Testers - Mixed Signal Tester SENSE IVMAX COMPARATORS DUTLTH IVMIN DETECTOR LOGIC DUTGTL VOLTAGE MONITOR IVMON DISABLE CHANNEL 2 45Ω∗ 100Ω∗ VINP FORCE IVIN 1KΩ∗ FV / FI* MI / MV* SENSE IVMAX COMPARATORS DUTLTH IVMIN DETECTOR LOGIC DUTGTL VOLTAGE MONITOR IVMON DISABLE CHANNEL 3 45Ω∗ 100Ω∗ VINP FORCE IVIN 1KΩ∗ FV / FI* MI / MV* SENSE IVMAX COMPARATORS DUTLTH IVMIN DETECTOR LOGIC DUTGTL VOLTAGE MONITOR IVMON DISABLE * Typical values Revision 3 / December 18, 2002 1 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS PIN Description Pin Name Pin # Description VINP[0:3] C2, F5, H3, L2 Analog voltage input which forces the output voltage (FV/MI mode) (one per channel). IVIN[0:3] C1, F2, H4, J5 Analog voltage input which forces the output current (FI/MV mode) (one per channel). FORCE[0:3] C14, F12, H13, L12 Analog output pin which forces current or voltage. SENSE[0:3] C13, G10, H14, K11 Analog input pin which senses voltage. FV/FI*[0:3] D10, B8, A6, E6 TTL compatible input which determines whether the PMU is forcing voltage or forcing current. MI/MV*[0:3] B10, A8, C6, D5 TTL compatible input which determines whether the PMU is measuring current or measuring voltage. RS0[0:3] RS1[0:3] B11, A9, C7, C5 A12, C10, D8, A5 TTL compatible current range select inputs. IVMIN[0:3] IVMAX[0:3] G5, E1, H2, K3 C3, E3, H1, L1 Analog input voltages which establish the lower and upper threshold level for the measurement comparator. DUTLTH[0:3] DUTGTL[0:3] P11, N9, N7, N5 N11, P9, P7, P5 Digital comparator output that indicates the DUT measurement is less than the upper threshold and greater than the lower threshold. DISABLE[0:3] A11, C9, D7, A4 TTL compatible input which places the IVMON outputs in high impedance. E_SNSEL[0:3] D11, E9, B7, B5 TTL switch select for the external SENSE switch for Channels 0–3. E_SN_IN L4 Analog output for external SENSE. E_FC_IN K5 Analog input for external FORCE signal. E_FCSEL[0:3] E10, B9, A7, D6 TTL switch select for the external FORCE switch for Channels 0–3. I_FCSEL[0:3] C11, D9, B6, B4 TTL switch select for internal FORCE switch for Channels 0–3. D13, G11, J14, K10 D14, G12, J13, L11 E12, G14, J10, M14 F11, G13, K12, M13 External resistor input corresponding to Ranges A through D. RA[0:3], RB[0:3] RC[0:3], RD[0:3] RES_IN[0:3] F10, F13, J12, L13 Revision 3 / December 18, 2002 External resistor input. One side of the external resistors connect to RA[0:3], RB[0:3], RC[0:3], RD[0:3]. The other side of all resistors connect to RES_IN. 2 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS PIN Description (continued) Pin Name Pin # Description IVMON[0:3] B1, E2, G4, J4 Analog voltage output that provides a real time monitor of either the measured voltage or measured current level. COMP1[0:3] COMP2[0:3] D4, F1, J2, K4 E5, F3, J1, M1 Internal compensation pins that require an external capacitor connected between the two pins. COMP3[0:3] D2, F4, J3, M2 Internal compensation pin that requires an external capacitor connected between the pin and ground. COMP4[0:3] D1, G2, H5, L3 N/C A2, A13, A14, B2, B3, B12, B13, B14, C4, C12, H10, K7, M3, M11, N2, N3, N12, N13, N14, P1, P2, P12, P13, P14 Internal compensation pin that requires an external capacitor connected between the pin and the RES_IN pin. Not connected. Analog MUX Switches VI H [ 0 : 3 ] K9, M9, M7, M5 Driver High input. VI H H [ 0 : 3 ] L10, K8, L7, K6 Super voltage input High. VI L [ 0 : 3 ] L9, M8, M6, M4 Driver Low input. VI L H [ 0 : 3 ] M10, L8, L6, L5 Super voltage input Low. SVSEL[0:3] A10, C8, E7, A3 Select for MUX. DVH[0:3] P10, N8, N6, N4 Output High. DVL[0:3] N10, P8, P6, P4 Output Low. Power Pins VCC[1:4] A1, D12, E4, E14, G3, H12, K2, K13 VDD P3 Positive analog power supply. Positive digital supply. VEE[1:4] D3, E13, G1, H11, K1, K14, M12, N1 Negative analog power supply. GND[1:4] E11, F14, J11, L14 Ground. Revision 3 / December 18, 2002 3 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS PIN Description (continued) A1 Ball Pad Indicator Bottom View 12 mm X 12 mm 180 FLEXBGA P2 P1 P3 P4 P5 P6 P7 P8 P9 P10 P11 P12 P13 P14 P N/C N/C N2 N1 VDD N3 DVL3 N4 DUTGTL3 N5 DVL2 N6 DUTGTL2 N7 DVL1 N8 DUTGTL1 N9 DVH0 N10 N/C DUTLTH0 N11 N12 N/C N13 N/C N14 N N/C VEE4 M2 M1 N/C M3 DVH3 M4 DUTLTH3 M5 DVH2 M6 DUTLTH2 M7 DVH1 M8 DUTLTH1 M9 DVL0 M10 N/C DUTGTL0 M11 M12 N/C M13 N/C M14 M COMP2_3 COMP3_3 L2 L1 N/C L3 VIH3 VIL3 L4 L5 VIH2 VIL2 L6 L7 VIH1 VIL1 L8 L9 VILH0 L10 N/C L11 VEE4 L12 RD3 L13 RC3 L14 L IVMAX3 K VEE3 COMP2_2 H1 COMP4_3 K3 VCC4 J2 J1 J VINP3 K2 K1 E_SN_IN K4 IVMIN3 J3 COMP1_3 J4 COMP1_2 COMP3_2 H2 H3 VILH3 K5 IVMON3 IVMIN2 G2 G1 VINP2 G3 IVIN2 VILH1 VIL0 COMP4_2 VIHH0 RB3 K8 J6 J7 J8 J9 J10 H6 H7 H8 H9 H10 H11 G11 VIHH3 K9 K10 VIH0 VIHH1 IVIN3 H5 H IVMAX2 VIHH2 K7 E_FC_IN J5 H4 VILH2 K6 RA3 RC2 A1 Ball Pad Corner Indicator (No Solder Ball) K11 SENSE3 J11 GND3 VEE2 G4 G5 G6 G7 G8 G9 G10 IVMON2 F4 IVMIN0 F5 F6 F7 F8 F9 F10 E6 E7 E8 E9 E10 FORCE3 K12 RD2 J12 RESIN3 K13 VCC4 J13 RESIN2 H12 VCC3 G12 GND4 K14 VEE3 J14 RB2 H13 FORCE2 G13 RA2 H14 SENSE2 G14 G VEE2 VCC3 COMP4_1 F2 F1 F3 SENSE1 RA1 F11 RB1 F12 RD1 F13 RC1 F14 F IVIN1 COMP1_1 E2 E1 COMP2_1 COMP3_1 E3 E4 VINP1 E5 RESIN0 RD0 E11 FORCE1 E12 RESIN1 E13 GND2 E14 E IVMIN1 IVMON1 D2 D1 IVMAX1 D3 VCC2 D4 COMP2_0 D5 FV/FI*3 SVSEL2 D6 D7 E_FCSEL3 DISABLE2 C6 C7 E_SNSEL1 D8 D9 E_FCSEL0 D10 GND1 D11 RC0 D12 VEE1 D13 VCC2 D14 D COMP4_0 COMP3_0 C1 C2 VEE1 C3 COMP1_0 C4 MI/MV*3 C5 RS1_2 I_FCSEL1 C8 C9 SVSEL1 DISABLE1 B8 B9 FV/FI*0 C10 E_SNSEL0 C11 VCC1 C12 RA0 C13 RB0 C14 C IVIN0 VINP0 B2 B1 N/C IVMAX0 B3 RS0_3 MI/MV*2 B4 B5 B6 I_FCSEL3 E_SNSEL3 I_FCSEL2 A4 A5 A6 RS0_2 B7 RS1_1 B10 I_FCSEL0 B11 N/C B12 SENSE0 FORCE0 B13 B14 B IVMON0 N/C A2 A1 N/C A3 E_SNSEL2 A7 FV/FI*1 A8 E_FCSEL1 MI/MV*0 A9 A10 RS0_0 A11 N/C A12 N/C A13 N/C A14 A VCC1 N/C 1 2 SVSEL3 3 Revision 3 / December 18, 2002 DISABLE3 4 RS1_3 FV/FI*2 5 6 E_FCSEL2 7 4 MI/MV*1 8 RS0_1 9 SVSEL0 10 DISABLE0 11 RS1_0 N/C 12 13 N/C 14 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS PIN Description (continued) A1 Ball Pad Indicator Top View SEMTECH 12 mm X 12 mm 180 FLEXBGA A2 A1 A3 A4 A5 A6 A7 A8 A9 A10 A11 A12 A13 A14 A VCC1 N/C B2 B1 SVSEL3 B3 DISABLE3 RS1_3 FV/FI*2 E_FCSEL2 B4 B5 B6 B7 I_FCSEL3 E_SNSEL3 I_FCSEL2 E_SNSEL2 C4 C5 C6 C7 MI/MV*1 B8 RS0_1 B9 SVSEL0 B10 DISABLE0 B11 RS1_0 B12 N/C B13 N/C B14 B N/C IVMON0 C2 C1 N/C C3 E_FCSEL1 MI/MV*0 C8 FV/FI*1 C9 C10 SVSEL1 DISABLE1 RS1_1 D8 D9 D10 RS0_0 C11 N/C C12 N/C N/C C13 C14 SENSE0 FORCE0 D13 D14 C IVIN0 VINP0 D2 D1 N/C IVMAX0 D3 D4 RS0_3 D5 MI/MV*2 RS0_2 D6 D7 E_FCSEL3 DISABLE2 E6 E7 I_FCSEL0 D11 N/C D12 D COMP4_0 E IVMIN1 IVMON1 IVIN1 G2 COMP1_0 E4 IVMAX1 F3 COMP1_1 G1 VEE1 E3 F2 F1 F COMP3_0 E2 E1 VCC2 F4 COMP2_1 G3 MI/MV*3 E5 COMP2_0 F5 COMP3_1 FV/FI*3 RS1_2 E8 I_FCSEL1 E9 SVSEL2 FV/FI*0 E10 E_SNSEL1 E_FCSEL0 F6 F7 F8 F9 F10 VINP1 RESIN0 G4 G5 G6 G7 G8 G9 G10 IVMON2 H4 IVMIN0 H5 H6 H7 H8 H9 H10 E_SNSEL0 E11 GND1 F11 RD0 G11 VCC1 E12 RC0 F12 FORCE1 G12 RA0 E13 RB0 E14 VEE1 F13 VCC2 F14 RESIN1 G13 GND2 G14 G VEE2 COMP4_1 H2 H1 VCC3 H3 H IVMAX2 IVMIN2 VINP2 IVIN2 J2 J3 COMP2_2 COMP1_2 COMP3_2 IVMON3 K1 K2 K3 K4 J1 J4 COMP4_2 J5 SENSE1 A1 Ball Pad Corner Indicator (No Solder Ball) N/C J6 J7 J8 J9 J10 K6 K7 K8 K9 K10 RA1 H11 VEE2 J11 RB1 H12 VCC3 J12 RD1 H13 RC1 H14 FORCE2 SENSE2 J13 J14 J RC2 IVIN3 K5 GND3 K11 RESIN2 K12 RB2 K13 RA2 K14 K VEE3 VCC4 L2 L1 IVMIN3 L3 COMP1_3 L4 E_FC_IN L5 N/C VIHH3 L6 L7 VIHH1 L8 VIH0 L9 RA3 L10 SENSE3 L11 RD2 L12 VCC4 L13 VEE3 L14 L IVMAX3 M VINP3 M2 M1 COMP4_3 M3 COMP2_3 COMP3_3 N1 N2 E_SN_IN M4 N/C N3 VILH3 M5 VIL3 N4 VILH2 M6 VIH3 N5 VIHH2 M7 VIL2 N6 VILH1 M8 VIH2 N7 VIL0 M9 VIL1 N8 VIHH0 M10 VIH1 N9 VILH0 N10 RB3 M11 N/C N11 FORCE3 M12 VEE4 N12 RESIN3 M13 GND4 M14 RD3 N13 RC3 N14 N N/C VEE4 P2 P1 N/C P3 DVH3 P4 DUTLTH3 P5 DVH2 P6 DUTLTH2 P7 DVH1 P8 DUTLTH1 P9 DVL0 P10 DUTGTL0 P11 N/C P12 N/C P13 N/C P14 P N/C N/C VDD DVL3 1 2 3 4 Revision 3 / December 18, 2002 DUTGTL3 5 DVL2 6 DUTGTL2 7 DVL1 8 5 DUTGTL1 9 DVH0 DUTLTH0 N/C N/C N/C 10 11 12 13 14 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Circuit Description Circuit Overview Control Inputs The Edge4707B is a quad channel parametric test and measurement unit that can : • Force Voltage / Measure Current • Force Current / Measure Voltage • Force Voltage / Measure Voltage • Force Current / Measure Current FV/FI* is a TTL compatible input which determines whether the PMU forces voltage or current, and MI/MV* is a TTL compatible input which determines whether the PMU measures current or voltage. FV/FI* and MI/MV* are independent for each PMU. Table 1 describes the modes of operation controlled by these pins. Each PMU channel can force or measure voltage over a 15V range and force or measure current over four distinct ranges: • ± 2 µA • ± 20 µA • ± 200 µA • ± 2 mA. An on-board window comparator provides two bit output range classification. Also, a monitor passes a real time analog voltage which tracks either the measured current or voltage. PPMU Functionality The trapezoid in Figure 1 describes the current-voltage functionality of the PMU with VCC = 15.5V and VEE = –4.5V, in Range D. FV / FI* MI/MV* Mode of Operation 0 0 Force Current, Measure Voltage 0 1 Force Current, Measure Current 1 0 Force Voltage, Measure Voltage 1 1 Force Voltage, Measure Current Table 1. RS0 and RS1 are TTL compatible inputs to an internal analog mux which selects an external resistor corresponding to a desired current range. The truth table for RS0 to RS1, along with the associated external resistor values and current ranges, is shown in Table 2. RS0 and RS1 are independent for each channel of the 4707B. V VOUT (@ I = 0) = 13.25V VCC = +15.5V VOUT (@ 200 µA) = 12.8V (in Range D) RS1 RS0 Range Current Range "Nominal" Ext. R 0 0 A ± 2 µA RA = 1MΩ 0 1 B ± 20 µA RB = 100KΩ 1 0 C ± 200 µA RC = 10KΩ 1 1 D ± 2 mA RD = 1KΩ VOUT (@ 2 mA) = 11.25V No restrictions IMIN (–2 mA) Table 2. IMAX (2 mA) FORCE/SENSE VOUT (@ 2 mA) = –0.25V VOUT (@ –200 µA) = –1.8V (in Range D) VOUT (@ I = 0) = –2.25V VEE = –4.5V FORCE is an analog output which either forces a current or forces a voltage, depending on which operating mode is selected. SENSE is a high impedance analog input which measures the DUT voltage input in the MV operating mode. NOTE: Negative current implies current is flowing into the 4707 from DUT. FORCE and SENSE are brought out to separate pins to allow remote sensing. Figure 1. PMU Functionality Revision 3 / December 18, 2002 6 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) IVMON Force Current Mode IVMON is a real time analog voltage output which tracks the sensed parameter. In the FI mode (FV/FI* = 0), IVIN is a high impedance analog voltage input that is converted into a current at the FORCE pin using the following relationship: In the MV mode, the output voltage displayed at IVMON is a 1:1 mapping of the SENSE voltage. In the MI mode, IVMON follows the equation: Forced Current = IVIN / REXT IVMON = I(measured) * REXT (Positive current is defined as current flowing out of the FORCE pin.) The IVIN input voltage range and forced current (at FORCE) can be seen in Table 4. Using nominal values for the external resistors (RA, RB, RC, and RD), a voltage at IVMON of +2V corresponds to Imax and –2V corresponds to Imin of the selected current range. The IVMON pin can also be placed into a high impedance state by using the DISABLE input (see Table 3). IVIN Corresponding Forced Current +2V Imax (full scale) 0V 0 –2V Imin (full scale) Table 4. Disable MI / MV* Sensed Parameter 1 X High Impedance 0 0 Measured Voltage 0 1 Measured Current Table 3. Measure Voltage Mode In the MV mode (MI/MV* = 0), DUT voltage is measured via the SENSE input pin. Note that EXT_SENSE_SEL = 0 when the Edge4707B SENSE is used. This measured voltage is also tested with the on-board window comparator. Force Voltage Mode Comparator In the FV mode (FV/FI* = 1), VINP is a high impedance analog voltage input that maps directly to the voltage forced at the FORCE pin. Measure Current Mode The Edge4707B features an on-board window comparator which provides two-bit measurement range classification. IVMAX and IVMIN are high impedance analog inputs that establish the upper and lower thresholds for the window comparator. In the MI mode (MI/MV* = 1), a current monitor is connected in series with the PMU forcing amplifier. This monitor generates a voltage that is proportional to the current passing through it, and is brought out to IVMON. This voltage (corresponding to the measured current) is also tested by the on-board window comparator. In the MI mode, an I/V MAX input of +2V will set the upper threshold of the window comparator to a voltage corresponding to +FSC (full-scale current), and an I/V MIN input of –2V will set the lower threshold to a voltage corresponding to –FSC (positive current is defined as current flowing out of the PMU). DUTGTL the DUTLTH are LVTTL compatible outputs which indicate the range of the measured parameter in relation to IVMIN and IVMAX. Comparator functionality is summarized in Table 5 for MI Mode and Table 6 for MV mode. Revision 3 / December 18, 2002 7 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) TEST CONDITION DUT LTH DUT GTL IVMON > IVMAX IVMON < IVMAX 0 1 N/A IVMON > IVMIN IVMON < IVMIN N/A 1 0 IVMON < IVMAX and IVMON > IVMIN 1 1 Table 5. MI Comparator Truth Table TEST CONDITION DUT LTH DUT GTL SENSE > IVMAX SENSE < IVMAX 0 1 N/A SENSE > IVMIN SENSE < IVMIN N/A 1 0 SENSE < IVMAX and SENSE >IVMIN 1 1 Table 6. MV Comparator Truth Table Revision 3 / December 18, 2002 8 www .semtech.com Revision 3 / December 18, 2002 9 E_SNSEL EXT_SENSE SENSE IVIN VINP EXT_FORCE_IN E_FCSEL 0 1 FV* FV 1 FV FV* COMP2 COMP3 Cext – FV* COMP4 FV A* B* C* D* D A B C D D* Cext C C* B B* A A* Edge4707B Functional Schematic COMP1 DRIVER + Cext MI ⇒ MI/MV* = 1 MI* ⇒ MI/MV* = 0 FV ⇒ FV/FI* = 1 FV* ⇒ FV/FI* = 0 INT ⇒ I_FCSEL = 1 INT* ⇒ I_FCSEL = 0 Cext's are External Capacitors FV 40KΩ 40KΩ FV* FV FV* 0 RA RB RC RD RESIN INT INT* + INST. – INT* 500Ω INT MI* MI IV_MIN IV_MAX MI MI* FORCE DUT_GTL + – 0 DUT_LTH 1 + – + – DISABLE IVMON Edge4707B TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Figure 2. Edge4707B Functional Schematic www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) REXT Selection I_FCSEL E_FCSEL FORCE 0 0 HiZ 1 1 Illegal Condition 1 0 VINP 0 1 E_FC_IN The Edge 4707B is designed for the voltage drop across RA, RB, RC, and RD to be ≤ 2V with the maximum current passing through them. However, these resistor values can be changed to support different applications. Increasing the maximum current beyond the nominal range is not recommended. However, decreasing the maximum current is allowed by increasing the external resistor using the equation IMAX = 2V / REXT. Switch Operation on Force and Sense Lines Each channel of the Edge4707B features two switches connected to the FORCE output pin (External Force = 45Ω, Internal Force = 100Ω) and one 1KΩ switch connected to the SENSE input pin. These switches are controlled by the TTL compatible inputs I_FCSEL, E_FCSEL, and E_SNSEL. Switch operation is described in Table 7. Switch Switch Select Name Open/Close State on Switch 100Ω, to internal force circuitry I_FCSEL 45Ω, to external force circuitry E_FCSEL 0 = Open 1 = Closed 1KΩ, to external sense circuitry E_SNSEL 0 = Open 1 = Closed 0 = Open 1 = Closed Table 8. For external sense operation, the switch controlled by E_SNSEL can be used to internally connect the SENSE input pin to the E_SN_IN output pin (see Figure 2). This allows the user to use the E_SN_IN pin for remote sensing. Analog MUX The Edge4707B has a separate analog mux section which is intended for 12V flash programming signal muxing with lower, more standard voltages. There are five inputs for this section, all of which are brought out to external pins (see Figure 3). The two outputs, DVH and DVL, connect to driver reference voltages of the Edge720 (or other pin electronics drivers). 1 KΩ Switches VIH DVH VIHH VIL DVL VILH Table 7. SV_SEL These switches can be configured to route the Edge4707B for external forcing or sensing operations (see Figure 2). For external forcing operation, the switch controlled by I_FCSEL can be used to internally isolate the PMU from the FORCE output. This enables the user to connect the FORCE pin to an external device connected to the E_FC_IN pin using the switch controlled by the E_FC_SEL input. I_FCSEL and E_FCSEL functionality is described in Table 8. Figure 3. Analog MUX Section (Typically used to provide flash programming and standard voltages to driver pin electronic references.) The truth table for SV-SEL is shown in Table 9. SV_SEL 0 DVH = VIH DVL = VIL 1 DVH = VIHH DVL = VILH (supervoltage) Table 9. SV-SEL Truth Table Revision 3 / December 18, 2002 10 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Circuit Description (continued) Short Circuit Protection The Edge 4707B is designed to survive a direct short circuit to any legal voltage at the FORCE and SENSE pins, by virtue of a limited current, which results from the presence of an external current sense resistor (normally 1 KΩ to 1MΩ) in the FORCE path. Transient Clamps The Edge 4707B has on-board clamps to limit the voltage and current spikes that might result from either changing the current range or changing the operating mode. Power Supply Sequencing In order to avoid the possibility of latch-up, the following power-up requirements must be satisified: 1. VEE ≤ GND ≤ VDD ≤ VCC at all times 2. VEE ≤ All inputs ≤ VCC The following power supply sequencing can be used as a guideline when operating the Edge4707: Power Up Sequence 1. VCC (substrate) 2. VEE/VDD 3. Digital Inputs 4. Analog Inputs Power Down Sequence 1. Analog Inputs 2. Digital Inputs 3. VEE/VDD 4. VCC (substrate) Revision 3 / December 18, 2002 11 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Application Information Required External Components (Per Channel) 22 pF COMP1 COMP2 1 MΩ RA 100 KΩ RB To LVTTL Gate 10 KΩ DUT LTH RC 1 KΩ Edge4707B To LVTTL Gate RD RES_IN DUT GTL 47 pF COMP4 FORCE COMP3 To DUT 100 pF SENSE VCC .1 µF VEE VDD .01 µF .01 µF VCC .1 µF .01 µF VEE VDD Actual decoupling and compensation capacitor values depend on the system environment. Revision 3 / December 18, 2002 12 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Application Information (continued) Calibration Maximum Input Voltage Range for FV Mode In order to attain a high degree of accuracy in a typical ATE application, offset and gain errors are accounted for through software calibration. When operating the Edge4707B in the Measure Current (MI) or Force Current (FI) modes, an additional source of error, common mode error, should be accounted for. Common mode error is a measure of how the common mode voltage, VCM, at the input of the current sense amplifier affects the forced or measured current values (see Figure 4). Since this error is created by internal resistors in the current sense amplifier, it is very linear in nature. In order to ensure that the full-scale output voltage range (FSV) can be achieved by the 4707B, errors such as gain, linearity, and offset must be taken into account when determining the input voltage range required at VINP. The equations in Table 10 can be used to determine the input voltage range required at VINP to achieve full scale voltage (FSV) at the FORCE pin. VINP (Worst Case) Using the common mode error and common mode linearity specifications, one can see that with a small number of calibration steps (see Applications note PMU-A1), the effect of this error can be significantly reduced. FORCE FSV Gain + VOS + LInearity Error + FSV –FSV Gain + VOS + LInearity Error – FSV Table 10. Example: If it is desired to operate the 4707B with a FV range of –2V to 13V, the VINP input voltages in Table 11 may be required. MI Common Mode Error VOS @ IVMON CM Linearity 19.5 mV VINP FORCE 13.3V +13V –2.13V –2V CM Error = Slope Table 11. 2 mV VCM @ FORCE VEE + 4.25 –2 mV VCC – 4.25 –3 mV NOTE: In some cases, slope may be negative. Figure 4. Graphical Representation of Common Mode Error Revision 3 / December 18, 2002 13 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Application Information (continued) Maximum Input Voltage Range for FI Mode In order to ensure that the full-scale output current range (FSC) can be achieved by the 4707B, errors such as gain, linearity, common mode, and offset must be taken into account when determining the input voltage range required at IVIN. The equations in Table 12 can be used to determine the input voltage range required at IVIN to achieve full scale current (FSC) at the FORCE pin. IVIN (Worst Case) Corresponding Forced Current 2V + VOS + Common Mode Error + Linearity Error Gain + FSC –2V + VOS + Common Mode Error + Linearity Error Gain – FSC Table 12. Example: To guarantee that the 4707B is capable of forcing ± 2 mA with REXT = 1KΩ (Range D), the input voltages in Table 13 may be required. IVIN Corresponding Forced Current 2.15V 2 mA –2.15V – 2 mA Table 13. Revision 3 / December 18, 2002 14 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Package Information 0.10 –A– D –B– PIN Descriptions Top View E E2 D2 Detail B 14 13 12 11 10 9 8 7 6 5 4 3 2 1 A B C D E F Bottom View G E1 H J K L M N P D1 Revision 3 / December 18, 2002 15 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Package Information (continued) Detail A Side View A / / ccc C C / / bbb C –C– A2 f 6 f A1 aaa C NX φ b e φ0.20 S C A S B S φ 0.75 S C 4 5 Detail A Detail B Dimensional References NOTES: 1. All dimensions are in millimeters. 2. ‘e’ represents the basic solder ball grid pitch. 3. ‘M’ represents the basic solder ball matrix size, and symbol ‘N’ is the maximum allowable number of balls after depopulating. REF. MIN. NOM. MAX. A 1.30 1.45 1.55 A1 0.30 0.40 0.45 A2 0.65 0.70 0.75 D 11.80 12.00 12.20 D1 10.40 BSC. D2 11.80 12.00 12.20 ‘b’ is measurable at the maximum solder ball diameter parallel E 11.80 12.00 12.20 to primary datum –C–. E1 5. Dimension ‘ccc’ is measured parallel to primary datum –C–. E2 11.80 12.00 12.20 6. Primary datum –C– and seating plane are defined by the spherical b 0.50 0.55 0.60 crowns of the solder balls. c 4. 10.40 BSC. 0.35 7. Package surface shall be matte finish charmilles 24 to 27. aaa 0.15 8. Package warp shall be 0.050 mm maximum. bbb 0.20 ccc 0.25 9. Substrate material base is BT resin. 10. The overall package thickness ‘A’ already considers collapse balls. Revision 3 / December 18, 2002 16 e 0.725 0.80 0.875 f 0.70 0.80 0.90 M 14 N 180 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Recommended Operating Conditions Parameter Symbol Min Typ Max Units Positive Analog Power Supply (relative to GND) VCC 15.25 15.5 15.75 V Negative Analog Power Supply (relative to GND) VEE –4.75 –4.5 –4.25 V VCC – VEE 19.5 20 20.5 V VDD 3.15 3.3 3.45 V Case Temperature TC 25 65 ˚C Thermal Resistance of Package (Junction to Case) θJC Total Analog Power Supply Digital Power Supply (relative to GND) 4.1 ˚C/W Absolute Maximum Ratings Parameter Symbol Min Typ Max Units 20 V Positive Power Supply VCC Negative Power Supply VEE –10 VCC – VEE 0 21 V VDD GND – .5 VCC V Digital Inputs –.5 7.0 V Analog Inputs VEE – .5 VCC + .5 V VCC – VEE V 4.8 mA VCC – VEE V Total Power Supply Digital Power Supply Analog MUX Breakdown Voltage Current Capability of MUX External Force and Sense Switch Breakdown Voltage VI[H, L, HH, LH] – DV[L, H] IMUX –4.8 E_FC_IN – FORCE E_SN_IN – FORCE V Storage Temperature –55 +125 ˚C Junction Temperature –65 +125 ˚C 260 ˚C Soldering Temperature Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Revision 3 / December 18, 2002 17 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS DC Characteristics Power Supplies Parameter Symbol Power Supply Consumption (Note 1) Positive Supply Negative Supply Digital Supply (Quiescent) Min Typ ICC IEE IDD Max Units 30 30 1 mA mA mA Power Supply Rejection Ratio (Notes 2, 3) FV/MI Mode FORCE Pin @ 100 kHz @ 500 kHz @ 1 MHz FV/MI PSRR IVMON Pin @ 100 kHz @ 500 kHz @ 1 MHz FI/MV Mode FORCE Pin @ 100 kHz @ 500 kHz @ 1 MHz 20 14 11 dB dB dB 14 3 1 dB dB dB 20 13 13 dB dB dB 18 10 7 dB dB dB FV/MI PSRR IVMON Pin @ 100 kHz @ 500 kHz @ 1 MHz Force Voltage Parameter Symbol Min Input Voltage Range @ VINP VVINP VEE + 2 Input Bias Current IVINP –1 VFORCE Output Forcing Voltage (positive full scale current through REXT) Output Forcing Voltage (zero current through REXT) Output Forcing Voltage (negative full scale current through REXT) Voltage Accuracy Offset Gain Linearity Temperature Dependence (Note 6) Temperature Coefficient of Offset Temperature Coefficient of Gain Temperature Coefficient of Linearity Revision 3 / December 18, 2002 Max Units VCC – 1.75 V 1 µA VEE + 2.25 VCC – 4.25 V VFORCE VFORCE VEE + 2.25 VEE + 4.25 VCC – 2.25 VCC – 2.25 V V Vos FV Gain FV INL –100 .985 –0.025 100 1.015 +0.025 mV V/V %FSR ∆Vos/∆T ∆FVGain/∆T ∆FV INL/∆T 18 Typ 0 ±.01 –8 –.2 –2x10–7 µV/˚C µV/V˚C %FSR/˚C www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Measure Current Parameter Current Measurement Range Range A Range B Range C Range D Current Measurement Accuracy Measure Current Offset Gain Linearity (measured at IVMON) FORCE = VEE + 4.25 to VCC – 5.25V FORCE = VCC – 5.25 to VCC – 4.25V Common Mode Error Common Mode Linearity FORCE = VEE + 4.25V to VCC – 4.25V Temperature Dependence (Note 6) Temperature Coefficient of Offset Temperature Coefficient of Gain Temperature Coefficient of Linearity Symbol Min Typ Max Units –2 –20 –200 –2 2 20 200 2 µA µA µA mA –150 .985 +150 1.015 mV .05 .08 % FSR % FSR IMEASURE VOS MI Gain MI INL ±.01 –.05 –.08 CM Error –1.5 1.5 mV/V ∆CM Error –.05 .05 %FSR ∆Vos/∆T ∆MI Gain/∆T ∆MI INL/∆T –60 2 5x10–7 µV/˚C µV/V˚C %FSR/˚C Force Current Parameter Symbol Min Input Voltage Range @ IVIN VIVIN –2.25 Input Bias Current IIVIN –1 Output Forcing Current Range A Range B Range C Range D IFORCE Compliance Voltage Range Positive Full-Scale Current through REXT Zero Current through REXT Negative Full-Scale Current through REXT VFORCE Current Accuracy Offset Gain Linearity (measured at IVMON) FORCE = VEE + 4.25 to VCC – 5.25V FORCE = VCC – 5.25 to VCC – 4.25V Common Mode Error (Note 4) Common Mode Linearity FORCE = VEE + 4.25V to VCC – 4.25V Temperature Dependence (Note 6) Temperature Coefficient of Offset Temperature Coefficient of Gain Temperature Coefficient of Linearity Revision 3 / December 18, 2002 Max Units 2.25 V 1 µA –2 –20 –200 –2 2 20 200 2 µA µA µA mA VEE + 2.25 VEE + 2.25 VEE + 4.25 VCC – 4.25 VCC – 2.25 VCC – 2.25 V V V –5 .985 5 1.015 % FSR .05 .08 % FSR % FSR Ios FI Gain FI INL –.05 –.08 Typ 0 ±.01 CM Error –3 3 mV/V ∆CM Error –.05 .05 %FSR ∆Vos/∆T ∆FI Gain/∆T ∆FI INL/∆T 7x10–3 2 1x10–8 19 µV/˚C µV/V˚C %FSR/V www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Measure Voltage Parameter Symbol Min Voltage Measurement Range VSENSE Voltage Measurement Accuracy Measure Voltage Offset Gain Linearity Vos MV Gain MV INL Temperature Dependence (Note 6) Temperature Coefficient of Offset Temperature Coefficient of Gain Temperature Coefficient of Linearity Max Units VEE + 2.25 VCC – 2.25 V –100 .985 –.025 100 1.015 .025 mV ∆Vos/∆T ∆MV Gain/∆T ∆MV INL/∆T Typ ±.01 %FSR µV/˚C µV/V˚C %FSR/˚C 21 0.35 –9x10–8 Digital Inputs (FV/FI*, MI/MV*, RS0, RS1, DISABLE, I_FCSEL, E_FCSEL, E_SNSEL, SV_SEL) Parameter Symbol Min Typ Max Units 0.8 V Input Low Level VIL Input High Level VIH 2.0 Input Bias Current @ 0V to VDD IIN –1 0 1 µA Symbol Min Typ Max Units VE_FC_IN IE_FC_IN RON_E_FC_IN VEE –25 45 VCC 25 55 V mA Ω Ileak Ileak CE_FC_IN –10 –10 10 10 nA nA pF VE_SN_IN RON-E_SN_IN VEE VCC 1200 V Ω Ileak Ileak –10 –10 10 10 nA nA Ileak –10 10 nA 14 pF V External Force & Sense Switches Parameter External Force Switches Usable Input Voltage Range @ E_FC_IN Usable Input Current Range @ E_FC_IN On-resistance Leakage Current @ E_FC_IN Switch Open (E_FC_SEL = 0) Switch Closed (E_FC_SEL = 1) Input Capacitance External Sense Switches Usable Input Voltage Range @ E_SN_IN On-resistance Leakage Current Switch Open (E_SN_SEL = 0) Switch Closed (E_SN_SEL = 1) HiZ (Switches Open) Leakage Current (Note 5) VFORCE = –3V to 13V, FV/FI* = 0 Combined Capacitance of FORCE and SENSE Pins (Notes 2, 5) Revision 3 / December 18, 2002 C_FRC_SNS 20 28 1000 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS DC Characteristics (continued) Analog MUX Parameter Usable Input Voltage Range On-resistance (Force) @ 500 µA Symbol Min Vin VEE Typ 600 RON_MUX Max Units VCC V 1000 Ω On-resistance Variability (Across full VEE to VCC Range) ∆RON_MUX 400 Ω Leakage Current ILEAK_MUX 200 nA Max Units +100 nA IVMON Parameter Leakage in DISABLED Mode @ IVMON = –2.2V to +13V Symbol Min ILEAK_IVMON –100 IVMON Output Impedance Typ ROUT Ω 500 Comparator Parameter Symbol Min IVMAX Voltage Range IVMAX IVMIN Voltage Range Typ Max Units VEE + 1.75 VCC – 1.75 V IVMIN VEE + 1.75 VCC – 1.75 V Comparator Offset (IVMIN, IVMAX) Vos –100 +100 mV Input Bias Current at IVMIN, IVMAX Ibias –1 +1 µA Digital Outputs (DUTLTH, DUTGTL) Parameter Symbol Output Low Level @ IOL = –200 µA VOL Output High Level @ IOH = 200 µA VOH Min 2.4 Typ Max Units 400 mV VDD V Above DC Characteristic specifications are guaranteed over full Recommended Operating Condition ranges unless otherwise noted. Note 1: Note 2: Note 3: Note 4: Note 5: Note 6: Under no load conditions. Guaranteed by design and characterization. Not production tested. PSRR is tested from VCC/VEE supplies to FORCE and IVMON outputs. Characterized in FV/MI and FI/MV modes. The mV/V units shown are derived as follows: (∆offset current * range resistance) / ∆output force voltage. Test Conditions: E_FC_SEL = I_FC_SEL = 0; FV/FI* = 0, FORCE and SENSE tied together over full-scale voltage range. Temperature coefficients are valid over a 25˚C to 65˚C case temperature range unless otherwise noted. Revision 3 / December 18, 2002 21 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS AC Characteristics Force Voltage/Measure Current Parameter Symbol FORCE Output Voltage Settling Time (Notes 1, 2) To 0.1% of final value (CFORCE/SENSE = 100 pF) Range A Ranges B, C, D Min Typ Max Units 45 530 110 µs µs 50 1.4 110 ms µs 28 110 µs 60 60 ns ns 40 µs 4 nF Max Units 2 250 ms µs 1.75 225 ms µs 60 60 ns ns 40 µs 4 nF tsettle Measured Current Settling Time (Notes 1, 4) To 0.1% of final value (CFORCE/SENSE = 100 pF) Range A Ranges B, C, D tsettle To 2% of final value (CFORCE/SENSE = 150 pF) Ranges B, C, D tsettle I/V Monitor (Note 3) DISABLE True to HiZ Propagation Delay DISABLE False to Active Propagation Delay tz toe Force Amp Saturation Recovery Time tsat Capacitive Loading Range for Stable Operation (FORCE) 11 CLOAD Force Current/Measure Voltage Parameter Symbol FORCE Output Current Settling Time (Notes 1, 5) (To 0.1% of final value) Range A Ranges B, C, D tsettle SENSE (Measure) Voltage Settling Time (Notes 1, 6) (To 0.1% of final value) Range A Ranges B, C, D tsettle I/V Monitor (Note 3) DISABLE True to HiZ Propagation Delay DISABLE False to Active Propagation Delay tz toe Force Amp Saturation Recovery Time tsat Capacitive Loading Range for Stable Operation (FORCE) Revision 3 / December 18, 2002 CLOAD 22 Min Typ 11 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS AC Characteristics (continued) Analog MUX Parameter Symbol Switch Propagation Delay (Note 3) Min Typ tpd Max Units 60 ns Max Units 25 µs Comparator Parameter Symbol Propagation Delay tpd Min Typ AC Test Conditions (unless otherwise noted): COMP1 to COMP2 = 22 pF, COMP3 = 100 pF to Ground, COMP4 = 47 pF to RES_IN, Capacitive Load at FORCE/SENSE combined output = 150 pF to GND, Capacitive Load at IVMON = 2 nF to GND, Note 1: Note 2: Note 3: Settling times are not production tested. Guaranteed by characterization. Measured from 2V step at VINP to FORCE output. Not production tested. Guaranteed by characterization. Test Conditions for Characterization: 1. 15 pF load on output 2. input signal has 5 ns rise/fall time 3. tpd is defined as the difference between the time when the input crosses 1.5V to when the output changes 10% (of the total change) from the initial voltage level. (see timing diagram below). 100% 10% Output 10% 100% tpd1 tpd2 2V Input 1.5V 1.5V 0.8V Note 4: Note 5: Note 6: Measured from 2V step at VINP to IVMON output. Measured from 2V step at IVIN to FORCE output. Measured from 2V step at IVIN to IVMON output. Revision 3 / December 18, 2002 23 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Ordering Information Model Number Package E4707BBG 180 Lead 12 mm x 12 mm FlexBGA EVM4707BBG Edge4707 Evaluation Module This device is ESD sensitive. Care should be taken when handling and installing this device to avoid damaging it. Contact Information Semtech Corporation Test and Measurement Division 10021 Willow Creek Rd., San Diego, CA 92131 Phone: (858)695-1808 FAX (858)695-2633 Revision 3 / December 18, 2002 24 www .semtech.com Edge4707B TEST AND MEASUREMENT PRODUCTS Revision History Current Revision Date: October 3, 2002 Previous Revision Date: June 20, 2002 Page# Section Name all Status 11 Circuit Description 18 Power Supplies Break down Power Supply Rejection Ratio into FV/MI & FI/MV Modes 18-22 DC & AC Characteristics Replace all "TBDs" with numbers Revision 3 / December 18, 2002 Description of Change Change from "Target" to "Preliminary" Add: Power Supply Sequencing Section 25 www .semtech.com