MITSUBISHI RA55H3340M

MITSUBISHI RF MOSFET MODULE
ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
RA55H3340M
330-400MHz 55W 12.5V, 3 Stage Amp. For MOBILE RADIO
DESCRIPTION
The RA55H3340M is a 55-watt RF MOSFET Amplifier
Module for 12.5-volt mobile radios that operate in the 330- to
400-MHz range.
The battery can be connected directly to the drain of the
enhancement-mode MOSFET transistors. Without the gate
voltage (VGG=0V), only a small leakage current flows into the
drain and the RF input signal attenuates up to 60 dB. The
output power and drain current increase as the gate voltage
increases. With a gate voltage around 4V (minimum), output
power and drain current increases substantially. The nominal
output power becomes available at 4.5V (typical) and 5V
(maximum). At VGG=5V, the typical gate current is 1 mA.
This module is designed for non-linear FM modulation, but
may also be used for linear modulation by setting the drain
quiescent current with the gate voltage and controlling the
output power with the input power.
FEATURES
• Enhancement-Mode MOSFET Transistors
(IDD≅0 @ VDD=12.5V, VGG=0V)
• Pout>55W, ηT>35% @ VDD=12.5V, VGG=5V, Pin=50mW
• Broadband Frequency Range: 330-400MHz
• Low-Power Control Current IGG=1mA (typ) at VGG=5V
• Module Size: 66 x 21 x 9.88 mm
• Linear operation is possible by setting the quiescent drain
current with the gate voltage and controlling the output power
with the input power
BLOCK DIAGRAM
2
3
1
4
5
1
RF Input (Pin)
2
Gate Voltage (VGG), Power Control
3
Drain Voltage (VDD), Battery
4
RF Output (Pout)
5
RF Ground (Case)
PACKAGE CODE: H2S
ORDERING INFORMATION:
ORDER NUMBER
SUPPLY FORM
RA55H3340M-101
Antistatic tray,
10 modules/tray
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ELECTROSTATIC SENSITIVE DEVICE
MITSUBISHI RF POWER MODULE
RA55H3340M
OBSERVE HANDLING PRECAUTIONS
MAXIMUM RATINGS (Tcase=+25°C, unless otherwise specified)
SYMBOL PARAMETER
VDD
CONDITIONS
Drain Voltage
VGG<5V
VGG
Gate Voltage
VDD<12.5V, Pin=0mW
Pin
Input Power
Pout
Output Power
Tcase(OP)
Tstg
RATING
UNIT
17
V
6
V
100
mW
65
W
Operation Case Temperature Range
-30 to +110
°C
Storage Temperature Range
-40 to +110
°C
f=330-400MHz,
ZG=ZL=50Ω
Note.1.The above parameters are independently guaranteed.
Note.2.In order to keep high reliability of the equipment, it is better to keep the module temperature of the module is
recommended to keep lower than 90°C under all conditions, and to keep lower than 60°C under standard conditions.
ELECTRICAL CHARACTERISTICS (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified)
SYMBOL PARAMETER
f
Pout
ηT
CONDITIONS
Frequency Range
nd
2fo
2
ρin
Input VSWR
Harmonic
IGG
Gate Current
—
Stability
—
Load VSWR Tolerance
TYP
330
Output Power
Total Efficiency
MIN
VDD=12.5V
VGG=5V
Pin=50mW
VDD=10.0-15.2V, Pin=25-70mW,
Pout<65W (VGG control), Load VSWR=3:1
VDD=15.2V, Pin=50mW, Pout=55W (VGG control),
Load VSWR=20:1
MAX
UNIT
400
MHz
55
W
35
%
-50
dBc
3:1
—
1
mA
No parasitic oscillation
—
No degradation or
destroy
—
Note. All parameters, conditions, ratings, and limits are subject to change without notice.
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MITSUBISHI RF POWER MODULE
ELECTROSTATIC SENSITIVE DEVICE
RA55H3340M
OBSERVE HANDLING PRECAUTIONS
TYPICAL PERFORMANCE (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified)
2nd, 3rd HARMONICS versus FREQUENCY
OUTPUT POWER, TOTAL EFFICIENCY,
and INPUT VSWR versus FREQUENCY
TOTAL
EFFICIENCYηT(%)
60
50
50
ηT
40
40
30
30
VDD=12.5V
VGG=5V
Pin=50mW
20
20
ρin
3rd
-60
2nd
-70
-80
320 330 340 350 360 370 380 390 400 410
FREQUENCY f(MHz)
OUTPUT POWER, POWER GAIN and
DRAIN CURRENT versus INPUT POWER
OUTPUT POWER, POWER GAIN and
DRAIN CURRENT versus INPUT POWER
24
Gp
20
40
16
30
12
IDD
20
8
f=330MHz,
VDD=12.5V,
VGG=5V
10
4
0
60
OUTPUT POWER
Pout(dBm)
POWER GAIN Gp(dB)
Pout
DRAIN CURRENT IDD(A)
60
OUTPUT POWER
Pout(dBm)
POWER GAIN Gp(dB)
-50
10
0
320 330 340 350 360 370 380 390 400 410
FREQUENCY f(MHz)
50
0
-10
VDD=12.5V
VGG=5V
Pin=50mW
-40
-5
0
5
10
15
INPUT POWER Pin(dBm)
24
Pout
Gp
50
20
40
16
30
12
20
IDD
8
f=365MHz,
VDD=12.5V,
VGG=5V
10
4
0
20
DRAIN CURRENT IDD(A)
10
HARMONICS (dBc)
70
Pout
60
0
-30
80
70
INPUT VSWR ρin (-)
OUTPUT POWER P out(W)
80
0
-10
-5
0
5
10
15
20
INPUT POWER Pin(dBm)
OUTPUT POWER, POWER GAIN and
DRAIN CURRENT versus INPUT POWER
24
Pout
Gp
50
20
40
16
30
12
IDD
20
8
f=400MHz,
VDD=12.5V,
VGG=5V
10
0
-10
-5
0
5
10
4
DRAIN CURRENT IDD(A)
OUTPUT POWER
Pout(dBm)
POWER GAIN Gp(dB)
60
0
15
20
INPUT POWER Pin(dBm)
Pout
IDD
2
RA55H3340M
24
22
20
18
16
14
12
10
8
6
4
2
0
4
6
8
10
12
14
DRAIN VOLTAGE VDD(V)
16
120
110
100
90
80
70
60
50
40
30
20
10
0
f=365MHz,
VGG=5V,
Pin=50mW
24
22
20
18
16
14
12
10
8
6
4
2
0
Pout
IDD
2
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4
6
8
10
12
DRAIN VOLTAGE VDD(V)
14
DRAIN CURRENT IDD(A)
f=330MHz,
VGG=5V,
Pin=50mW
OUTPUT POWER P out(W)
120
110
100
90
80
70
60
50
40
30
20
10
0
OUTPUT POWER and DRAIN CURRENT
versus DRAIN VOLTAGE
DRAIN CURRENT IDD(A)
OUTPUT POWER P out(W)
OUTPUT POWER and DRAIN CURRENT
versus DRAIN VOLTAGE
16
18 July 2007
MITSUBISHI RF POWER MODULE
ELECTROSTATIC SENSITIVE DEVICE
RA55H3340M
OBSERVE HANDLING PRECAUTIONS
TYPICAL PERFORMANCE (Tcase=+25°C, ZG=ZL=50Ω, unless otherwise specified)
f=400MHz,
VGG=5V,
Pin=50mW
24
22
20
18
16
14
12
10
8
6
4
2
0
Pout
IDD
2
4
6
8
10
12
DRAIN VOLTAGE VDD(V)
14
16
OUTPUT POWER and DRAIN CURRENT
versus GATE VOLTAGE
18
70
14
Pout
60
12
IDD
50
10
40
8
30
6
20
4
10
2
0
0
2.5
3
90
16
3.5
4
4.5
GATE VOLTAGE VGG(V)
5
5.5
OUTPUT POWER P out(W)
f=330MHz,
VDD=12.5V,
Pin=50mW
80
DRAIN CURRENT IDD(A)
OUTPUT POWER P out(W)
90
OUTPUT POWER and DRAIN CURRENT
versus GATE VOLTAGE
18
f=365MHz,
VDD=12.5V,
Pin=50mW
80
70
16
14
Pout
60
12
50
10
IDD
40
8
30
6
20
4
10
2
0
0
2.5
3
3.5
4
4.5
GATE VOLTAGE VGG(V)
5
DRAIN CURRENT IDD(A)
120
110
100
90
80
70
60
50
40
30
20
10
0
DRAIN CURRENT IDD(A)
OUTPUT POWER P out(W)
OUTPUT POWER and DRAIN CURRENT
versus DRAIN VOLTAGE
5.5
OUTPUT POWER and DRAIN CURRENT
versus GATE VOLTAGE
80
70
18
f=400MHz,
VDD=12.5V,
Pin=50mW
16
14
Pout
60
12
IDD
50
10
40
8
30
6
20
4
10
2
0
0
2.5
RA55H3340M
3
3.5
4
4.5
GATE VOLTAGE VGG(V)
5
DRAIN CURRENT IDD(A)
OUTPUT POWER P out(W)
90
5.5
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MITSUBISHI RF POWER MODULE
ELECTROSTATIC SENSITIVE DEVICE
RA55H3340M
OBSERVE HANDLING PRECAUTIONS
OUTLINE DRAWING (mm)
66.0 ±0.5
7.25 ±0.8
51.5 ±0.5
3
2.0 ±0.5
2
4
4.0 ±0.3
9.5 ±0.5
5
1
14.0 ±1
2-R2 ±0.5
17.0 ±0.5
60.0 ±0.5
21.0 ±0.5
3.0 ±0.3
Ø0.60 ±0.15
12.0 ±1
16.5 ±1
43.5 ±1
(50.4)
(9.88)
2.3 ±0.3
7.5 ±0.5
0.09 ±0.02
3.1 +0.6/-0.4
55.5 ±1
1 RF Input (Pin)
2 Gate Voltage (VGG)
3 Drain Voltage (VDD)
4 RF Output (Pout)
5 RF Ground (Case)
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MITSUBISHI RF POWER MODULE
ELECTROSTATIC SENSITIVE DEVICE
RA55H3340M
OBSERVE HANDLING PRECAUTIONS
TEST BLOCK DIAGRAM
Power
Meter
DUT
1
Signal
Generator
Attenuator
Preamplifier
Attenuator
Directional
Coupler
3
2
Spectrum
Analyzer
4
ZL=50Ω
ZG=50Ω
C1
5
Directional
Coupler
Attenuator
Power
Meter
C2
+
DC Power
Supply VGG
+
DC Power
Supply VDD
C1, C2: 4700pF, 22uF in parallel
1 RF Input (Pin)
2 Gate Voltage (VGG)
3 Drain Voltage (VDD)
4 RF Output (Pout)
5 RF Ground (Case)
EQUIVALENT CIRCUIT
3
2
1
4
5
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ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
MITSUBISHI RF POWER MODULE
RA55H3340M
PRECAUTIONS, RECOMMENDATIONS, and APPLICATION INFORMATION:
Construction:
This module consists of an alumina substrate soldered onto a copper flange. For mechanical protection, a plastic
cap is attached with silicone. The MOSFET transistor chips are die bonded onto metal, wire bonded to the
substrate, and coated with resin. Lines on the substrate (eventually inductors), chip capacitors, and resistors form
the bias and matching circuits. Wire leads soldered onto the alumina substrate provide the DC and RF
connection.
Following conditions must be avoided:
a) Bending forces on the alumina substrate (for example, by driving screws or from fast thermal changes)
b) Mechanical stress on the wire leads (for example, by first soldering then driving screws or by thermal
expansion)
c) Defluxing solvents reacting with the resin coating on the MOSFET chips (for example, Trichlorethylene)
d) Frequent on/off switching that causes thermal expansion of the resin
e) ESD, surge, overvoltage in combination with load VSWR, and oscillation
ESD:
This MOSFET module is sensitive to ESD voltages down to 1000V. Appropriate ESD precautions are required.
Mounting:
Heat sink flatness must be less than 50 µm (a heat sink that is not flat or particles between module and heat sink
may cause the ceramic substrate in the module to crack by bending forces, either immediately when driving
screws or later when thermal expansion forces are added).
A thermal compound between module and heat sink is recommended for low thermal contact resistance and to
reduce the bending stress on the ceramic substrate caused by the temperature difference to the heat sink.
The module must first be screwed to the heat sink, then the leads can be soldered to the printed circuit board.
M3 screws are recommended with a tightening torque of 0.4 to 0.6 Nm.
Soldering and Defluxing:
This module is designed for manual soldering.
The leads must be soldered after the module is screwed onto the heat sink.
The soldering temperature must be lower than 260°C for a maximum of 10 seconds, or lower than 350°C for a
maximum of three seconds.
Ethyl Alcohol is recommend for removing flux. Trichlorethylene solvents must not be used (they may cause
bubbles in the coating of the transistor chips which can lift off the bond wires).
Thermal Design of the Heat Sink:
At Pout=55W, VDD=12.5V and Pin=50mW each stage transistor operating conditions are:
Pout
Rth(ch-case)
Pin
IDD @ ηT=35%
VDD
Stage
(W)
(W)
(V)
(°C/W)
(A)
st
1
0.05
1.5
23.0
0.26
12.5
2nd
1.0
13.0
2.4
3.10
rd
3
13.0
55.0
1.2
8.15
The channel temperatures of each stage transistor Tch = Tcase + (VDD x IDD - Pout + Pin) x Rth(ch-case) are:
Tch1 = Tcase + (12.5V x 0.26A – 1.5W + 0.05W) x 23.0°C/W = Tcase + 41.4 °C
Tch2 = Tcase + (12.5V x 3.10A - 13.0W + 1.5W) x 2.4°C/W = Tcase + 65.4 °C
Tch3 = Tcase + (12.5V x 8.15A - 55.0W + 13.0W) x 1.2°C/W = Tcase + 71.9 °C
For long-term reliability, it is best to keep the module case temperature (Tcase) below 90°C. For an ambient
temperature Tair=60°C and Pout=55W, the required thermal resistance Rth (case-air) = ( Tcase - Tair) / ( (Pout / ηT ) Pout + Pin ) of the heat sink, including the contact resistance, is:
Rth(case-air) = (90°C - 60°C) / (55W/38% – 55W + 0.05W) = 0.33 °C/W
When mounting the module with the thermal resistance of 0.33 °C/W, the channel temperature of each stage
transistor is:
Tch1 = Tair + 71.4 °C
Tch2 = Tair + 95.4 °C
Tch3 = Tair + 101.9 °C
The 175°C maximum rating for the channel temperature ensures application under derated conditions.
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ELECTROSTATIC SENSITIVE DEVICE
OBSERVE HANDLING PRECAUTIONS
MITSUBISHI RF POWER MODULE
RA55H3340M
Output Power Control:
Depending on linearity, the following two methods are recommended to control the output power:
a) Non-linear FM modulation:
By the gate voltage (VGG).
When the gate voltage is close to zero, the RF input signal is attenuated up to 60 dB and only a small leakage
current flows from the battery into the drain.
Around VGG=4V, the output power and drain current increases substantially.
Around VGG=4.5V (typical) to VGG=5V (maximum), the nominal output power becomes available.
b) Linear AM modulation:
By RF input power Pin.
The gate voltage is used to set the drain’s quiescent current for the required linearity.
Oscillation:
To test RF characteristics, this module is put on a fixture with two bias decoupling capacitors each on gate and
drain, a 4.700 pF chip capacitor, located close to the module, and a 22 µF (or more) electrolytic capacitor.
When an amplifier circuit around this module shows oscillation, the following may be checked:
a) Do the bias decoupling capacitors have a low inductance pass to the case of the module?
b) Is the load impedance ZL=50Ω?
c) Is the source impedance ZG=50Ω?
Frequent on/off switching:
In base stations, frequent on/off switching can cause thermal expansion of the resin that coats the transistor chips
and can result in reduced or no output power. The bond wires in the resin will break after long-term thermally
induced mechanical stress.
Quality:
Mitsubishi Electric is not liable for failures resulting from base station operation time or operating conditions
exceeding those of mobile radios.
This module technology results from more than 20 years of experience, field proven in tens of millions of mobile
radios. Currently, most returned modules show failures such as ESD, substrate crack, and transistor burnout,
which are caused by improper handling or exceeding recommended operating conditions. Few degradation
failures are found.
Keep safety first in your circuit designs!
Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but
there is always the possibility that trouble may occur. Trouble with semiconductors may lead to personal injury, fire or
property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate
measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of non-flammable material, or (iii) prevention against
any malfunction or mishap.
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SALES CONTACT
JAPAN:
Mitsubishi Electric Corporation
Semiconductor Sales Promotion Department
2-2-3 Marunouchi, Chiyoda-ku
Tokyo, Japan 100
Email:
[email protected]
Phone: +81-3-3218-4854
Fax:
+81-3-3218-4861
GERMANY:
Mitsubishi Electric Europe B.V.
Semiconductor
Gothaer Strasse 8
D-40880 Ratingen, Germany
Email:
[email protected]
Phone: +49-2102-486-0
Fax:
+49-2102-486-4140
HONG KONG:
Mitsubishi Electric Hong Kong Ltd.
Semiconductor Division
41/F. Manulife Tower, 169 Electric Road
North Point, Hong Kong
Email:
[email protected]
Phone: +852 2510-0555
Fax:
+852 2510-9822
FRANCE:
Mitsubishi Electric Europe B.V.
Semiconductor
25 Boulevard des Bouvets
F-92741 Nanterre Cedex, France
Email:
[email protected]
Phone: +33-1-55685-668
Fax:
+33-1-55685-739
SINGAPORE:
Mitsubishi Electric Asia PTE Ltd
Semiconductor Division
307 Alexandra Road
#3-01/02 Mitsubishi Electric Building,
Singapore 159943
Email:
[email protected]
Phone: +65 64 732 308
Fax:
+65 64 738 984
ITALY:
Mitsubishi Electric Europe B.V.
Semiconductor
Centro Direzionale Colleoni,
Palazzo Perseo 2, Via Paracelso
I-20041 Agrate Brianza, Milano, Italy
Email:
[email protected]
Phone: +39-039-6053-10
Fax:
+39-039-6053-212
TAIWAN:
Mitsubishi Electric Taiwan Company, Ltd.,
Semiconductor Department
9F, No. 88, Sec. 6
Chung Shan N. Road
Taipei, Taiwan, R.O.C.
Email:
[email protected]
Phone: +886-2-2836-5288
Fax:
+886-2-2833-9793
U.K.:
Mitsubishi Electric Europe B.V.
Semiconductor
Travellers Lane, Hatfield
Hertfordshire, AL10 8XB, England
Email:
[email protected]
Phone: +44-1707-278-900
Fax:
+44-1707-278-837
U.S.A.:
Mitsubishi Electric & Electronics USA, Inc.
Electronic Device Group
1050 East Arques Avenue
Sunnyvale, CA 94085
Email:
[email protected]
Phone: 408-730-5900
Fax:
408-737-1129
AUSTRALIA:
Mitsubishi Electric Australia,
Semiconductor Division
348 Victoria Road
Rydalmere, NSW 2116
Sydney, Australia
Email: [email protected]
Phone: +61 2 9684-7210
+61 2 9684 7212
+61 2 9684 7214
+61 3 9262 9898
Fax:
+61 2 9684-7208
+61 2 9684 7245
CANADA:
Mitsubishi Electric Sales Canada, Inc.
4299 14th Avenue
Markham, Ontario, Canada L3R OJ2
Phone: 905-475-7728
Fax:
905-475-1918
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