TI UC2914DW

SLUS425C − DECEMBER 2003 − REVISED JULY 2004
FEATURES
D 5-V to 35-V Operation
D Precision Maximum Current Control
D Precision Fault Threshold
D Programmable Average Power Limiting
D Programmable Overcurrent Limit
D Shutdown Control
D Charge Pump for Low RDS(on) High-Side
The UC3914 family of hot swap power managers
provides complete power management, hot swap
and fault handling capability. Integrating this part
and a few external components, allows a board to
be swapped in or out upon failure or system
modification without removing power to the
hardware, while maintaining the integrity of the
powered system. Complementary output drivers
and diodes have been integrated for use with
external capacitors as a charge pump to ensure
sufficient gate drive to the external N-channel
MOSFET transistor for low RDS(on). All control and
housekeeping functions are integrated and
externally programmable and include the fault
current level, maximum output sourcing current,
maximum fault time and average power limiting of
the external FET. The UC3914 features a duty
ratio current limiting technique, which provides
peak load capability while limiting the average
power dissipation of the external pass transistor
during fault conditions. The fault level is fixed at
50 mV with respect to VCC to minimize total
dropout.
Drive
Latch Reset Function Available
Output Drive VGS Clamping
Fault Output Indication
18-Pin DIL and SOIC Packages
SIMPLIFIED APPLICATION DIAGRAM
6
9
18
16
OSC PMP REF
1
VCC
IMAX
PMPB
VCC
2
SENSE
17
OUT
11
The fault current level is set with an external
current sense resistor. The maximum allowable
sourcing current is programmed by using a
resistor divider from VCC to REF to set the voltage
on IMAX. The maximum current level, when the
output appears as a current source is (VVCC −
VIMAX)/RSENSE.
VOUTS
12
This part is offered in both 18-pin DW wide-body
(SOIC) and dual-in-line (DIL) packages.
UC2914/UC3914
5
OSCB
7
VPUMP
4
VOUT
10
SD
FAULT
PLIM 14
GND
LR
CT
1
13
15
VOUT
VCC
UDG−03114
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
!" ##$% &'(#% )$ !"*$ '$%+ &)"%$ '$*$,&!$- )""#$%# '"" "' )$
%&$##"% "$ '$%+ +",%- $."% %(!$% $%$*$% )$ +) #)"+$ '%#($ )$%$ &'(#% /)( #$-
Copyright  2003, Texas Instruments Incorporated
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1
PRODUCT PREVIEW
D
D
D
D
DESCRIPTION
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
DESCRIPTION (continued)
When the output current is less than the fault level, the external output transistor remains switched on. When
the output current exceeds the fault level, but is less than the maximum sourcing level programmed by IMAX,
the output remains switched on, and the fault timer starts to charge CT, a timing capacitor. Once CT charges
to 2.5 V, the output device is turned off and CT is slowly discharged. Once CT is discharged to 0.5 V, the device
performs a retry and the output transistor is switched on again. The UC3914 offers two distinct reset modes.
In one mode with LR left floating or held low, the device tries to reset itself repeatedly if a fault occurs as
described above. In the second mode with LR held high, once a fault occurs, the output is latched off until either
LR is toggled low, the part is shutdown then re−enabled using SD, or the power to the part is turned off and then
on again.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted.(1)(2)
UC2914
UC3914
Input supply voltage
PRODUCT PREVIEW
Maximum forced voltage
Maximum current
Maximum voltage
VCC
40
SD, LR
12
IMAX
VCC
FAULT
20
PLIM
10
FAULT
Reference output current
UNIT
V
mA
40
V
internally limited
A
Storage temperature range, Tstg
−65 to 150
Junction temperature range, TJ
−55 to 150
°C
C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds
300
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is
not implied. Exposure to Absolute Maximum Rated conditions for extended periods may affect device reliability
(2) Currents are positive into and negative out of the specifief terminal unless otherwise noted. All voltage values are with respect to the network
ground terminal.
RECOMMENDED OPERATING CONDITIONS
MIN
MAX
UNIT
5
35
V
UC2914
−40
85
UC3914
0
70
Supply voltage, VCC
Operating free-air temperature range, TA
2
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NOM
°C
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
ELECTRICAL CHARACTERISTICS
TA = 0°C to 70°C for the UC3914, −40°C to 85°C for the UC2914, VCC = 12V, VPUMP = VPUMP(max), SD = 5 V, CP1 = CP2 = CPUMP= 0.01 µF.
TA = TJ. (Unless otherwise specified)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
SUPPLY CURRENTS
ICC
Supply current(2)
ICCSD
Shutdown supply current
8
15
12
20
500
900
µA
4.0
4.4
V
55
120
250
mV
−55
−50
−45
−57
−50
−42
1
3
−140
−100
−60
−6.0
−3.0
−1.5
mA
2.0
3.0
4.5
µA
VCC = 35 V
SD = 0 V,
UVLO turn−on threshold voltage
UVLO hysteresis
mA
FAULT TIMING
TJ = 25°C, wrt VCC
Over operating temperature wrt VCC
IMAX input bias
ICT_CHG
CT charge current
VCT = 1 V
VCT = 1 V,
ICT_DSCH
VCT_FLT
CT discharge current
VCT = 1 V
CT fault threshold voltage
2.25
2.50
2.75
VCT_RST
CT reset threshold voltage
0.45
0.50
0.55
1.5%
3.0%
4.5%
−1.5
−1.0
−2.0
−1.5
Output duty cycle
overload condition
Fault condition,
IPL = 0 A
VVOUTS = VCC,
wrt VPUMP
VPUMP = VPUMP(max),
mV
µA
A
PRODUCT PREVIEW
Overcurrent threshold
V
OUTPUT
VOH
VOL
VOUT(cl)
tRISE
High-level output voltage
Low-level output voltage
VVOUTS = VCC, VPUMP = VPUMP(max),
IOUT = −2 mA, wrt VPUMP
IOUT = 0 A
IOUT = 5 mA
IOUT = 25 mA,
VVOUTS = 0 V
overload condition
Output clamp voltage
Rise time(1)
VOUTS = 0 V
COUT = 1 nF
tFALL
Fall time(1)
LINEAR CURRENT AMPLIFIER
COUT = 1 nF
VIO
11.5
Input offset voltage
Voltage gain
VIMAX
IMAX control voltage
VIMAX = VOUT,
VIMAX = VOUT,
VSENSE = VVCC, wrt VCC
VSENSE = VREF, wrt REF
0.8
1.3
1
2
1.2
1.8
13.0
14.5
750
1250
250
500
−15
0
15
60
80
−20
0
20
−20
0
20
1.5
3.5
SENSE input bias
V
ns
mV
dB
mV
µA
SHUTDOWN
Shutdown threshold voltage
input current
0.6
SD = 5 V
Delay to output time(1)
1.5
2.0
V
150
300
µA
0.5
2.0
µs
(1) Ensured by design. Not production tested.
(2) A mathematical averaging is used to determine this value. See Application Section for more information.
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3
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
ELECTRICAL CHARACTERISTICS
TA = 0°C to 70°C for the UC3914, −40°C to 85°C for the UC2914, VCC = 12V, VPUMP = VPUMP(max), SD = 5 V, CP1 = CP2 = CPUMP= 0.01 µF.
TA = TJ. (Unless otherwise specified)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CHARGE PUMP
fOSC,
fOSCB
VOH
VOL
Oscillator frequency
OSC, OSCB
High-level output voltage
Low-level output voltage
Output clamp voltage
ILIM
Output current limit
Pump diode voltage drop
PMP clamp voltage
PRODUCT PREVIEW
VPUMP maximum voltage
VPUMP hysteresis
60
150
250
IOSC = −5 mA
IOSC = 5 mA
10.0
11.0
11.6
0.2
0.5
VCC = 25 V
High side only
18.5
20.5
22.5
−20
−10
−3
0.5
0.9
1.3
18.5
20.5
22.5
20
22
24
VVOUTS = VCC charge pump disable threshold,
VCC = 35 V
42
45
48
VVOUTS = VCC charge pump re-enable
threshold,
VCC = 12 V
0.3
0.7
1.4
VVOUTS = VCC charge pump re-enable
threshold,
VCC = 35 V
0.25
0.70
1.40
−2.25
−2.00
−1.75
V
12.5
20.0
50.0
mA
IDIODE = 10 mA, measured from PMP to
PMPB, PMPB to VPUMP
VCC = 25 V
VVOUTS = VCC charge pump disable threshold,
VCC = 12 V
kHz
V
V
mA
V
REFERENCE
REF output voltage
wrt VCC
REF current limit
Load regulation
1 mA ≤ IVREF ≤ 5 mA
25
60
Line regulation
5 V ≤ VVCC ≤ 35 V
25
100
Low-level output voltage
IFAULT = 1 mA
VFAULT = 35 V
100
200
mV
Output leakage
10
500
nA
Latch release threshold voltage
High-to-low
Input current
VLR = 5 V
mV
FAULT
LATCH
0.6
1.4
2.0
V
500
750
µA
POWER LIMITING
Duty cycle control
IPLIM = 200 µA
IPLIM = 3 mA
In fault mode
0.6%
1.3%
2.0%
In fault mode
0.05%
0.12%
0.20%
500
1250
ns
−250
−200
−150
mV
OVERLOAD
Delay-to-output time(1)
Threshold voltage
wrt IMAX
(1) Ensured by design. Not production tested.
(2) A mathematical averaging is used to determine this value. See Application Section for more information.
4
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SLUS425C − DECEMBER 2003 − REVISED JULY 2004
AVAILABLE OPTIONS
PACKAGED DEVICES
TA
PLASTIC DIL−18
(N)
PLASTIC SOIC
(DW)(1)
−40°C to 85°C
UC2914N
UC2914DW
0°C to 70°C
UC3914N
UC3914DW
(1) The DW package is available taped and reeled. Add an TR suffix
to the device type (e.g. UC2914DWTR) to order quantities of
2,000 devices per reel.
DIL−18
N PACKAGE
(TOP VIEW)
GND
VCC
N/C
SD
OSCB
OSC
VPUMP
PMPB
PMP
1
2
3
4
5
6
7
8
9
18
17
16
15
14
13
12
11
10
REF
SENSE
IMAX
CT
PLIM
LR
VOUTS
OUT
FAULT
GND
VCC
N/C
SD
OSCB
OSC
VPUMP
PMPB
PMP
1
18
2
17
3
16
4
15
5
14
6
13
7
12
8
11
9
10
REF
SENSE
IMAX
CT
PLIM
LR
VOUTS
OUT
FAULT
PRODUCT PREVIEW
SOIC−18
DW PACKAGE
(TOP VIEW)
BLOCK DIAGRAM
UDG−95134−2
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5
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
TERMINAL FUNCTIONS
TERMINAL
NAME
NO.
PRODUCT PREVIEW
DESCRIPTION
CT
15
I/O
A capacitor is connected to this pin in order to set the maximum fault time. The minimum fault time must be
more than the time to charge external load capacitance. The fault time is defined as shown in equation (1)
where ICH = 100 µA + IPL, where IPL is the current into the power limit pin. Once the fault time is reached the
output shuts down for a time given by equation (2) where IDIS is nominally 3 µA..
FAULT
10
O
Open collector output which pulls low upon any of the following conditions: timer fault, shutdown, UVLO. This
pin MUST be pulled up to VVCC or another supply through a suitable impedance.
GND
1
−
Ground reference for the device.
I
This pin programs the maximum allowable sourcing current. Since REF is a −2-V reference (with respect to
VCC), a voltage divider can be derived from VCC to REF in order to generate the program level for the IMAX
pin. The current level at which the output appears as a current source is equal to the voltage on the IMAX pin,
with respect to VCC, divided by the current sense resistor. If desired, a controlled current startup can be programmed with a capacitor on IMAX to VCC.
IMAX
16
LR
13
I
If this pin is held high and a fault occurs, the timer is prevented from resetting the fault latch when CT is discharged below the reset comparator threshold. The part does not retry until this pin is brought to a logic low or a
power-on-reset occurs. Pulling this pin low before the reset time is reached does not clear the fault until the
reset time is reached. Floating or holding this pin low results in the part repeatedly trying to reset itself if a fault
occurs.
OUT
11
O
Output drive to the MOSFET pass element. Internal clamping ensures that the maximum VGS drive is 15 V.
OSC
6
O
OSCB
5
O
Complementary output drivers for intermediate charge pump stages. A 0.01-µF capacitor should be placed
between OSC and PMP, and OSCB and PMPB.
PLIM
14
I
PMP
9
I
PMPB
8
I
REF
18
O
−2-V reference with respect to VCC used to program the IMAX pin voltage. A 0.1-µF ceramic or tantalum capacitor MUST be tied between this pin and VCC to ensure proper operation of the device.
SD
4
I
When this TTL-compatible input is brought to a logic low, the output of the linear amplifier is driven low, FAULT
is pulled low and the device is put into a low power mode. The ABSOLUTE maximum voltage that can be
placed on this pin is 12 V.
SENSE
17
I
Input voltage from the current sense resistor. When there is greater than 50 mV on this pin with respect to
VCC, a fault is sensed and CT begins to charge.
VCC
2
I
Input voltage to the device. The voltage range is from 4.5 V to 35 V. The minimum input voltage required for
operation is 4.5 V.
VOUTS
12
O
Source connection of external N-channel MOSFET and sensed output voltage of load.
VPUMP
7
O
Charge pump output voltage. A capacitor should be tied between this pin and VOUTS with a typical value being 0.01-µF.
T FAULT +
T SD +
2
2
This feature ensures that the average MOSFET power dissipation is controlled. A resistor is connected from this
pin to VCC. Current flows into PLIM, adding to the fault timer charge current, reducing the duty cycle from the
typical 3% level. When IPL >> 100 µA then the average MOSFET power dissipation is given by equation (3).
Complementary pins which couple charge pump capacitors to internal diodes and are used to provide charge
to the reservoir capacitor tied to VPUMP. Typical capacitor values used are 0.01-µF.
CT
I CH
(1)
CT
I DIS
P FET(avg) + I MAX
6
I/O
(2)
3
10 *6
R PL
(3)
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SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
The UC3914 is to be used in conjunction with external passive components and an N-channel MOSFET to
facilitate hot swap capability of application modules. A typical application setup is given in Figure 1.
C1
R1
PMP
OSC
9
REF
6
VCC
18
T
CP2
16
Overload
Comparator
250 kHz
Oscillator
Q
8
VCC
IMAX
VCC − 2 V
Reference
Toggle
PMPB
R2
+
Q
200 mV
+
CP1
−
5
+
Overcurrent
Comparator
−
To Linear
Amplifier
7
+
VCC
VCC
2
C2
−
Undervoltage
Lockout
4.0 V/ 3.8 V
CPUMP
103 µA
3 mA
To VOUT
SD
VFAULT
= 50 mV
VCC
50 mV
VPUMP
4
SENSE
H = Close
FAULT
10
To
Linear
Amplifier
2.5 V
Fault
Latch
−
Q
S
+
Q
R
17
H = Close
OUT
+
−
RSENSE
11
15 V
RFAULT
Fault
Timing
Circuitry
To VCC
GND
VOUTS
−
12
0.5 V
+
3 µA
PLIM
1.4 V
−
RPL
14
+
1
13
15
LR
CT
CT
To VOUT
UDG−98194
Figure 1. Typical Application
The term hot swap refers to the system requirement that submodules be swapped in or out upon failure or
system modification without removing power to the operating hardware. The integrity of the power bus must not
be compromised due to the addition of an unpowered module. Significant power bus glitches can occur due to
the substantial initial charging current of on-board module bypass capacitance and other load conditions (for
more information on hot swapping and power management applications, see SLUA157). The UC3914 provides
protection by monitoring and controlling the output current of an external N-channel MOSFET to charge this
capacitance and provide load current. The addition of the N-channel MOSFET, a sense resistor, RSENSE, and
two other resistors, R1 and R2, sets the programmed maximum current level the N-channel MOSFET can
source to charge the load in a controlled manner. The equation for this current, IMAX, is:
I MAX +
V VCC * V IMAX
R SENSE
(4)
where
D VIMAX is the voltage generated at the IMAX pin
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7
PRODUCT PREVIEW
VPUMP
VOUT + 10 V
(45 VMAX)
+
OSCB
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
Analysis of the application circuit shows that VIMAX (with respect to GND) can be defined as:
V IMAX + V REF )
ǒVCC * VREFǓ
R1
R1 ) R2
+ 2V R1 ) V REF
R1 ) R2
(5)
where
D VREF is the voltage on the REF pin, an internally generated potential 2-V below VCC
The UC3914 also has an internal overcurrent comparator which monitors the voltage between SENSE and
VCC. If this voltage exceeds 50 mV, the comparator determines that a fault has occurred, and a timing capacitor,
CT, begins to charge. This can be rewritten as a current which causes a fault, IFAULT:
I FAULT + 50 mV
R SENSE
(6)
FAULT TIMING
To VCC
Overload
Comparator
RPL PLIM
14
VCC
I3
VCC
IPL
I1
103 µA
SENSE
+
+
2
S1
+
S2
2.5 V
RSENSE
H=CLOSE
SENSE
IMAX
0.2 V
3 mA
50 mV
VCC
+
PRODUCT PREVIEW
Figure 2 shows the circuitry associated with the fault timing function of the UC3914. A typical fault mode, where
the overload comparator and current source I3 do not factor into operation (switch S2 is open), is first
considered. Once the voltage across RSENSE exceeds 50 mV, a fault has occurred. This causes the timing
capacitor, CT, to charge with a combination of 100 µA (I1) plus the current from the power limiting circuitry (IPL).
H=CLOSE
Fault
Comparator
FAULT
LATCH
+
S Q
R Q
17
I2
3 µA
+
Reset
Comparator
VOUTS
To
Output
0.5 V
To
Output
Drive
H=OFF
12
15
To LOAD
CT
CT
UDG−03158
Figure 2. Fault Timing Circuitry Including Power Limit and Overcurrent
8
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SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
UDG−97054
Figure 3. Typical Timing Diagram
Table 1. Fault Timing Conditions
TIME
CONDITION
t0
Normal conditions. Output current is nominal, output voltage is at positive rail, VCC
t1
Fault control reached. Output current rises above the programmed fault value, CT begins to charge at 100-µA + IPL.
t2
Maximum current reached. Output current reaches the programmed maximum level and becomes a constant current with value IMAX.
t3
Fault occurs. CT has charged to 2.5 V, fault output goes low, the FET turns off allowing no output current to flow,
VVOUTS discharges to GND.
t4
Retry. CT has discharged to 0.5 V, but fault current is still exceeded, CT begins charging again, FET is on, VOUT
increases.
t5 = t3
Illustrates < 3% duty cycle depending upon RPL selected.
t6=t4
t7=t0
Fault released, normal condition. Return to normal operation of the load.
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9
PRODUCT PREVIEW
Figure 3 shows typical fault timing waveforms for the external N-channel MOSFET output current, the voltage
on the CT pin, and the output load voltage, VOUT, with LR left floating or grounded.
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
The output voltage waveforms have assumed an R-C characteristic load and time constants vary depending
upon the component values. Prior to time t0, the load is fully charged to almost VVCC and the N-channel
MOSFET is supplying the current, IOUT, to the load. At t0, the current begins to ramp up due to a change in the
load conditions until, at t1, the fault current level, IFAULT, has been reached to cause switch S1 to close. This
results in CT being charged with the current sources I1 and IPL. During this time, VOUT remains almost equal
to VVCC except for small losses from voltage drops across the sense resistor and the N-channel MOSFET. The
output current reaches the programmed maximum level, IMAX, at t2. The CT voltage continues to rise since IMAX
is still greater than IFAULT. The load output voltage drops because the current load requirements have become
greater than the controlled maximum sourcing current. The CT voltage reaches the upper comparator threshold
(Figure 2) of 2.5 V at t3, which promptly shuts off the gate drive to the N-channel MOSFET (not shown but can
be inferred from the fact that no output current is provided to the load), latches in the fault and opens switch S1
disconnecting the charging currents I1 and IPL from CT.
PRODUCT PREVIEW
Since no output current is supplied, the load voltage decays at a rate determined by the load characteristics and
the capacitance. The 3-µA current source, I2, discharges CT to the 0.5-V reset comparator threshold. This time
is significantly longer than the charging time and is the basis for the duty cycle current limiting technique. When
the CT voltage reaches 0.5 V at t4, the part performs a retry, allowing the N-channel MOSFET to again source
current to the load and cause VOUT to rise. In this particular example, IMAX is still sourced by the N-channel
MOSFET at each attempted retry and the fault timing sequence is repeated until time t7 when the load
requirements change to IOUT. Since IOUT is less than the fault current level at this time, switch S1 is opened,
I2 discharges CT and VOUT rises almost to the level of VCC.
Figure 4 shows fault timing waveforms similar to those depicted in Figure 3 except that the latch reset (LR)
function is utilized. Operation is the same as described above until t4 when the voltage on CT reaches the reset
threshold. Holding LR high prevents the latch from being reset, preventing the device from performing a retry
(sourcing current to the load). The UC3914 is latched off until either LR is pulled to a logic low, or the chip is
forced into an under voltage lockout (UVLO) condition and back out of UVLO causing the latch to automatically
perform a power on reset. Figure 4 illustrates LR being toggled low at t5, causing the part to perform a retry.
Time t6 again illustrates what happens when a fault is detected. The LR pin is toggled low and back high at time
t7, prior to the voltage on the CT pin hitting the reset threshold. This information tells the UC3914 to allow the
part to perform a retry when the lower reset threshold is reached, which occurs at t8. Time t9 corresponds to
when load conditions change to where a fault is not present as described for Figure 3.
10
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SLUS425C − DECEMBER 2003 − REVISED JULY 2004
UDG−97055
Figure 4. Typical Timing Diagram Using Latch Reset (LR) Function
Table 2. Fault Timing Conditions with Latch Reset Function
TIME
CONDITION
t0
Normal conditions. Output current is nominal, output voltage is at positive rail, VCC
t1
Fault control reached. Output current rises above the programmed fault value, CT begins to charge at 100-µA + IPL.
t2
Maximum current reached. Output current reaches the programmed maximum level and becomes a constant current with value IMAX.
t3
Fault occurs. CT has charged to 2.5 V, fault output goes low, the FET turns off allowing no output current to flow,
VVOUTS discharges to GND.
t4
Reset comparator threshold reached but no retry since LR pin held high.
t5
LR toggled low, N-channel MOSFET turned on and sources current to load.
t6=t3
t7
LR toggled low before VCT reaches reset comparator threshold, causing retry.
t8
Since LR toggled low during present cycle, N-channel MOSFET turned on and sources current to load.
t9=t0
Fault released, normal condition. Return to normal operation of the load.
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11
PRODUCT PREVIEW
APPLICATION INFORMATION
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
Power Limiting
The power limiting circuitry is designed to only source current into the CT pin. To implement this feature, a
resistor, RPL, should be placed between VCC and PLIM. The current, IPL (show in Figure 2) is given by the
following expression:
I PL +
V VCC * V VOUTS
, for V VOUTS u 1 V ) V CT
R PL
(7)
where
D VCT is the voltage on the CT pin
For VVOUTS < 1 V + VCT the common mode range of the power limiting circuitry causes IPL = 0 A leaving only
the 100-µA current source to charge CT. VVCC − VVOUTS represents the voltage across the N-channel MOSFET
pass device.
PRODUCT PREVIEW
This feature limits average power dissipation in the pass device. Note that under a fault condition where the
output current is just above the fault level, but less than the maximum level, VVOUTS ~ VVCC, IPL = 0 A and the
CT charging current is 100 µA.
During a fault, the CT pin charges at a rate determined by the internal charging current and the external timing
capacitor, CT. Once CT charges to 2.5 V, the fault comparator trips and sets the fault latch. When this occurs,
OUT is pulled down to VOUTS, causing the external N-channel MOSFET to shut off and the charging switch,
S1, to open. CT is discharged with I2 until the VCT potential reaches 0.5 V. Once this occurs, the fault latch resets
(unless LR is being held high, whereby a fault can only be cleared by pulling this pin low or going through a
power-on-reset cycle), which re-enables the output of the linear amplifier and allows the fault circuitry to regain
control of the charging switch. If a fault is still present, the overcurrent comparator closes the charging switch
causing the cycle to repeat. Under a constant fault the duty cycle is given by:
Duty Cycle +
3 mA
I PL ) 100 mA
(8)
Average power dissipation can be limited using the PLIM pin. Average power dissipation in the pass element
is given by:
P FET(avg) + ǒV VCC * V VOUTSǓ
+ ǒV VCC * V VOUTSǓ
I MAX
I MAX
Duty Cycle
(9)
3 mA
I PL ) 100 mA
VVCC − VVOUTS is the drain to source voltage across the MOSFET. When IPL >> 100 µA, the duty cycle equation
given above can be rewritten as:
Duty Cycle +
R PL
3 mA
ǒVVCC * VVOUTSǓ
(10)
and the average power dissipation of the MOSFET is given by:
P FET(avg) + ǒV VCC * V VOUTSǓ
I MAX
R PL
3 mA
ǒVVCC * VVOUTSǓ
+ I MAX
R PL
3 mA
The average power is limited by the programmed IMAX current and the appropriate value for RPL.
12
www.ti.com
(11)
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
OVERLOAD COMPARATOR
The linear amplifier in the UC3914 ensures that the external N-channel MOSFET does not source more than
the current IMAX, defined in equation (4):
V VCC * V IMAX
R SENSE
In the event that output current exceeds the programmed IMAX current by more than 200-mV/RSENSE, the
output of the linear amplifier is immediately pulled low (with respect to VOUTS) providing no gate drive to the
N-channel MOSFET, and preventing current from being delivered to the load. This situation could occur if the
external N-channel MOSFET is not responding to a command from the UC3914 or output load conditions
change quickly to cause an overload condition before the linear amplifier can respond. For example, if the
N-channel MOSFET is sourcing current into a load and the load suddenly becomes short circuited, an overload
condition may occur. The short circuit causes the VGS of the N-channel MOSFET to immediately increase,
resulting in increased load current and voltage drop across RSENSE. If this drop exceeds the overload
comparator threshold, the amplifier output is quickly pulled low. It also causes the CT pin to begin charging with
I3, a 3-mA current source (refer to Figure 2) and continue to charge until approximately 1-V below VVCC, where
it is clamped. This allows a constant fault to show up on FAULT and since the voltage on CT charges past 2.5 V
only in an overload fault condition, it can be used for detection of output N-channel MOSFET failure or to build
redundancy into the system.
ESTIMATING MINIMUM TIMING CAPACITANCE
The startup time of the device may not exceed the fault time for the application. Since the timing capacitor, CT,
determines the fault time, its minimum value can be determined by calculating the startup time of the device.
The startup time is dependent upon several external components. A load capacitor, CLOAD, should be tied
between VOUTS and GND. Its value should be greater than that of CPUMP, the reservoir capacitor tied from
VPUMP to VOUTS (see Figure 4). Given values of CLOAD, RLOAD, RSENSE, VVCC and the resistors determining
the voltage on IMAX, the user can calculate the approximate startup time of the node VOUT. This time must be
less than the time it takes for CT to charge to 2.5 V. Assuming the user has determined the fault current, RSENSE
can be calculated by:
R SENSE + 50 mV
I FAULT
(12)
IMAX is the maximum current the UC3914 allows through the transistor, M1. During startup with an output
capacitor, M1 can be modeled as a constant current source of value IMAX using equation (4).
Given this information, calculation of startup time is now possible via the following:
Using a constant-current load model, use this equation:
T START +
ǒCLOAD VVCCǓ
ǒI MAX * I LOADǓ
(13)
Using a resistive load model, use this equation:
T START + * R LOAD
C LOAD
ǒ
ȏn 1 *
V VCC
I MAX R LOAD
www.ti.com
Ǔ
(14)
13
PRODUCT PREVIEW
I MAX +
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
The only remaining external component which may affect the minimum timing capacitor is the optional power
limiting resistor, RPL. If the addition of RPL is desirable, its value can be determined from the Power Limiting
section of this datasheet. The minimum timing capacitor values are now given by the following equations.
Using a constant-current load model, use this equation:
CT min + T START
ȡ10*4
ȧ
ȧ
ȧ
Ȣ
R PL )
2
ǒ Ǔȣȧ
V VCC
2
R PL
ȧ
ȧ
Ȥ
(15)
Using a resistive load model, use this equation:
PRODUCT PREVIEW
CT (min) +
ǒ10*4
R PL ) V VCC * ǒI MAX
2
R LOADǓ
Ǔ
R PL
T START
)
V VCC
2 R PL
R LOAD
C LOAD
(16)
OUTPUT CURRENT SOFTSTART
The external MOSFET output current can be increased at a user-defined rate to ensure that the output voltage
comes up in a controlled fashion by adding capacitor CSS, as shown in Figure 5. The one constraint that the
UC3914 places on the soft-start time is that the charge pump time constant must be much less than the soft-start
time constant to ensure proper soft-start operation. The time constant determining the startup time of the charge
pump is given by:
t CP + R OUT
C PUMP
(17)
ROUT is the output impedance of the charge pump given by:
R OUT +
1
f PUMP
CP
(18)
where fPUMP is the charge pump frequency (125 kHz) and CP = CP1 = CP2 are the charge pump flying capacitors.
For typical values of CP1, CP2 and CPUMP (0.01-µF) and a switching frequency of 125 kHz, the output
impedance is 800 Ω and the charge pump time constant is 8 µs. The charge pump should be close to being fully
charged in 3 time constants or 24 µs. By placing a capacitor from VCC to IMAX, the voltage at IMAX, which sets
the maximum output current of the MOSFET, exponentially decays from VCC to the desired value set by R1
and R2. The output current of the MOSFET is controlled via soft-start as long as the soft-start time constant (τSS)
is much greater than the charge pump time constant τCP, given by:
t SS + ǒR1 ø R2Ǔ
14
C SS
(19)
www.ti.com
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
MINIMIZING TOTAL DROPOUT UNDER LOW VOLTAGE OPERATION
In a typical application, the UC3914 is used to control the output current of an external N-channel MOSFET
during hot swapping situations. Once the load has been fully charged, the desired output voltage on the load,
VOUT, needs to be as close to VCC as possible to minimize total dropout. For a resistive load, RLOAD, the output
voltage is given by:
R LOAD
R LOAD ) R SENSE ) R DS(on)
V VCC
(20)
RSENSE sets the fault current, IFAULT. RDS(on), the on-resistance of the N-channel MOSFET, should be made
as small as possible to ensure VOUT is as close to VCC as possible. For a given N-channel MOSFET, the
manufacturer specifies the RDS(on) for a certain VGS (i. e., between 7 V to 10 V). The source potential of the
N-channel MOSFET is VOUT. In order to ensure sufficient VGS, this requires the gate of the N-channel MOSFET,
which is the output of the linear amplifier, to be many volts higher than VVCC. The UC3914 provides the capability
to generate this voltage through the addition of three capacitors, CP1, CP2 and CPUMP as shown in Figure 6.
These capacitors should be used in conjunction with the complementary output drivers and internal diodes
included on-chip to create a charge pump or voltage tripler. The circuit boosts VVCC by utilizing capacitors CP1,
CP2 and CPUMP in such a way that the voltage at VPUMP approximately equals three times the voltage at VCC
minus five times the voltage drop of the diodes, almost tripling the input supply voltage to the device.
V VPUMP + ǒ3
V VCCǓ * ǒ5
V DIODEǓ
(21)
On each complete cycle, CP1 is charged to approximately (VVCC − VDIODE) (unless VCC is greater than 15 V
causing internal clamping to limit this charging voltage to about 13 V) when the output Q of the toggle flip-flop
is low. When Q is transitioned low (and Q correspondingly is brought high), the negative side of CP2 is pulled
to ground, and CP1 charges CP2 up to approximately:
V CP2 + ǒ2
V VCCǓ * ǒ3
V DIODEǓ
(22)
CP1 +
C1
To VCC
PMP
CSS
OSC
VCC
9
2
6
D1
R1
18
REF
R2
16
IMAX
PMPB
2
VCC
M1
6
OSC
OUT
11
9
8
CP2
PMP
VOUT
OSCB
PMPB
D3
5
TOGGLE
FLIP FLOP
Q
QT
VOUTS 12
CPUMP
5
+ CP2
OSCB
UC2914
CP1
D3
8
VPUMP
L
O
A
D
7
250 kHz
OSC
7
+
CLOAD
VPUMP
CVPUMP
UDG−03178
To VOUT
Figure 5. MOSFET Softstart Diagram
Figure 6. Charge Pump Block Diagram
www.ti.com
15
PRODUCT PREVIEW
V OUT +
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
When Q is toggled high, the negative side of CP2 is brought to (VCC − VDIODE). Since the voltage across a
capacitor cannot change instantaneously with time, the positive side of the capacitor swings up to:
V PMPB + 3
V CC * 4
V DIODE
(23)
This charges CPUMP up to:
V CPUMP + 3
V CC * 5
V DIODE
(24)
The maximum output voltage of the linear amplifier is actually less than this because of the ability of the amplifier
to swing to within approximately 1 V of VPUMP. Due to inefficiencies of the charge pump, the UC3914 may not
have sufficient gate drive to fully enhance a standard power MOSFET when operating at input voltages below
7 V. Logic level MOSFETs could be used depending on the application but are limited by their lower current
capability. For applications requiring operation below 7 V, there are two ways to increase the charge pump
output voltage. Figure 7 shows the typical tripler of Figure 6 enhanced with three external schottky diodes.
Placing the schottky diodes in parallel with the internal charge pump diodes decreases the voltage drop across
each diode thereby increasing the overall efficiency and output voltage of the charge pump.
PRODUCT PREVIEW
Figure 8 shows a way to use the existing drivers with external diodes (or Schottky diodes for even higher pump
voltages but with additional cost) and capacitors to make a voltage quadrupler. The additional charge pump
stage provides a sufficient pump voltage to generate the maximum VGS:
V VPUMP + 4
V CC * 7
V DIODE
(25)
CP2
CP1
CP1
D2
PMP
9
VCC
2
OSC
6
D3
D1
D2
PMPB
8
D3
CP2
OSCB
5
CP3
D1
OSCB
VCC
5
Toggle
Flip−Flop
Q
8
Q
D4
250 kHz
Oscillator
9 PMP
7
7 VPUMP
CPUMP
CPUMP
QT
250 kHz
Oscillator
To VOUT
To VOUT
Figure 8. Low Voltage Operation to Produce
Higher Pump Voltage
Figure 7. Enhanced Charge Pump
16
6
PMPB
Toggle
Flip−Flop
QT
VPUMP
2
OSC
www.ti.com
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
Operation is similar to the case described above. This additional circuitry is not necessary for higher input
voltages because the UC3914 has internal clamping which only allows VPUMP to be 10 V greater than VVOUTS.
Table 3 characterizes the UCx914 charge pump in its standard configuration, with external schottky diodes, and
configured as a voltage quadrupler.
NOTE: The voltage quadrupler is unnecessary for input voltages above 7.0 V due to the internal
clamping action.
INPUT
VOLTAGE
(VCC)
INTERNAL
DIODES
(VGS)
EXTERNAL
SCHOTTKY
DIODES
(VGS)
QUADRUPLER
(VGS)
4.5
4.57
6.8
8.7
5.0
5.80
7.9
8.8
5.5
6.60
8.6
8.9
6.0
7.60
8.8
9.0
6.5
8.70
8.8
9.0
7.0
8.80
9.0
9.0
9.0
9.20
9.4
9.1
10.0
9.30
9.4
9.3
ICC SPECIFICATIONS
The ICC operating measurement is actually a mathematical calculation. The charge pump voltage is constantly
being monitored with respect to both VCC and VOUTS to determine whether the pump requires servicing. If there
is insufficient voltage on this pin, the charge pump drivers are alternately switched to raise the voltage of the
pump (see Figure 9). Once the voltage on the pump is high enough, the drivers and other charge pump related
circuitry are shutdown to conserve current. The pump voltage decays due to internal loading until it reaches a
low enough level to turn the drivers back on. The chip requires significantly different amounts of current during
these two modes of operation and the following mathematical calculation is used to calculate the average
current:
I CC +
I CCdrivers(on)
T ON ) I CCdrivers(off)
T OFF
T ON ) T OFF
(26)
Since the charge pump does not always require servicing, the user may think that the charge pump frequency
is much less than the datasheet specification. This is not the case as the free-running frequency is guaranteed
to be within the datasheet limits. The charge pump servicing frequency can make it appear as though the drivers
are operating at a much lower frequency
www.ti.com
17
PRODUCT PREVIEW
Table 3. Charge Pump Characteristics
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
APPLICATION INFORMATION
Pump Upper Level
PUMP
Pump Lower Level
Oscillator
Frequency
Pump Servicing
Frequency
PRODUCT PREVIEW
OSC
OSCB
TON
TIME
TOFF
Figure 9. Charge Pump Waveforms
18
www.ti.com
UDG−98144
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
TYPICAL CHARACTERISTICS
LINEAR AMPLIFIER OFFSET VOLTAGE
vs
JUNCTION TEMPERATURE
3.5
−48.0
−48.5
2.5
2.0
1.5
1.0
0.5
−49.0
−49.5
−50.0
−50.5
−51.0
−51.5
−52.0
−25
5
35
65
95
125
−55
−25
2.040
VREF − Reference Voltage − V
ICHG(CT) − Timing Capacitor Charge Current − µA
TIMING CAPACITOR CHARGE CURRENT
vs
JUNCTION TEMPERATURE
−96
−100
−104
−108
−112
−55
−25
5
35
35
65
95
125
Figure 11
Figure 10
−92
5
TJ − Junction Temperature − °C
TJ − Junction Temperature − °C
65
95
125
TJ − Junction Temperature − °C
REFERENCE VOLTAGE
vs
JUNCTION TEMPERATURE
2.035
2.030
2.025
2.020
2.015
−55
−25
5
35
65
95
125
TJ − Junction Temperature − °C
Figure 12
Figure 13
www.ti.com
19
PRODUCT PREVIEW
VFAULT − Fault Threshold − mV
VIO − Input Offset Voltage − mV
3.0
0
−55
FAULT THRESHOLD VOLTAGE
vs
JUNCTION TEMPERATURE
SLUS425C − DECEMBER 2003 − REVISED JULY 2004
TYPICAL CHARACTERISTICS
IDSHG(CT) − Timing Capacitor Discharge Current − µA
INPUT BIAS CURRENT
vs
JUNCTION TEMPERATURE
2.0
PRODUCT PREVIEW
IBIAS − Bias Current − µA
SENSE Input Bias
1.5
1.0
0.5
IMAX Input Bias
0
−55
−25
5
35
65
95
125
TJ − Junction Temperature − °C
3.7
TIMING CAPACITOR DISCHARGE CURRENT
vs
JUNCTION TEMPERATURE
3.6
3.5
3.4
3.3
−55
−25
5
35
65
95
125
TJ − Junction Temperature − °C
Figure 15
Figure 14
SAFETY RECOMMENDATIONS
Although the UC3914 is designed to provide system protection for all fault conditions, all integrated circuits can
ultimately fail short. For this reason, if the UC3914 is intended for use in safety critical applications where UL
or some other safety rating is required, a redundant safety device such as a fuse should be placed in series with
the device. The UC3914 prevents the fuse from blowing in virtually all fault conditions, increasing system
reliability and reducing maintainence cost, in addition to providing the hot swap benefits of the device.
20
www.ti.com
PACKAGE OPTION ADDENDUM
www.ti.com
19-May-2008
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
UC2914DW
ACTIVE
SOIC
DW
18
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC2914DWG4
ACTIVE
SOIC
DW
18
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC2914DWTR
ACTIVE
SOIC
DW
18
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC2914DWTRG4
ACTIVE
SOIC
DW
18
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC2914N
ACTIVE
PDIP
N
18
20
Green (RoHS &
no Sb/Br)
CU NIPDAU
N / A for Pkg Type
UC2914NG4
ACTIVE
PDIP
N
18
20
Green (RoHS &
no Sb/Br)
CU NIPDAU
N / A for Pkg Type
UC3914DW
ACTIVE
SOIC
DW
18
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC3914DWG4
ACTIVE
SOIC
DW
18
40
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC3914DWTR
ACTIVE
SOIC
DW
18
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC3914DWTRG4
ACTIVE
SOIC
DW
18
2000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
UC3914N
ACTIVE
PDIP
N
18
20
Green (RoHS &
no Sb/Br)
CU NIPDAU
N / A for Pkg Type
UC3914NG4
ACTIVE
PDIP
N
18
20
Green (RoHS &
no Sb/Br)
CU NIPDAU
N / A for Pkg Type
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
19-May-2008
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 2
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