SN74ALVC125 QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS SCES110D – JULY 1997 – REVISED DECEMBER 1998 D D D D EPIC (Enhanced-Performance Implanted CMOS) Submicron Process ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Latch-Up Performance Exceeds 250 mA Per JESD 17 Package Options Include Plastic Small-Outline (D), Thin Very Small-Outline (DGV), and Thin Shrink Small-Outline (PW) Packages D, DGV, OR PW PACKAGE (TOP VIEW) 1OE 1A 1Y 2OE 2A 2Y GND 1 14 2 13 3 12 4 11 5 10 6 9 7 8 VCC 4OE 4A 4Y 3OE 3A 3Y description This quadruple bus buffer gate is designed for 1.65-V to 3.6-V VCC operation. The SN74ALVC125 features independent line drivers with 3-state outputs. Each output is disabled when the associated output-enable (OE) input is high. To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver. The SN74ALVC125 is characterized for operation from –40°C to 85°C. FUNCTION TABLE (each buffer) INPUTS OE A OUTPUT Y L H H L L L H X Z logic symbol† 1 1OE 1A EN 2 1 3 4 2OE 2A 3OE 3A 4OE 4A 6 5 1Y 2Y 10 8 9 13 11 12 3Y 4Y † This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. EPIC is a trademark of Texas Instruments Incorporated. Copyright 1998, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 SN74ALVC125 QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS SCES110D – JULY 1997 – REVISED DECEMBER 1998 logic diagram (positive logic) 1OE 1A 2OE 2A 1 2 3OE 3 1Y 4 5 3A 4OE 6 2Y 4A 10 9 8 3Y 13 12 11 4Y absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4.6 V Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 4.6 V Output voltage range, VO (see Notes 1 and 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V Input clamp current, IIK (VI < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA Output clamp current, IOK (VO < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA Continuous output current, IO . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA Package thermal impedance, θJA (see Note 3): D package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 127°C/W DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 182°C/W PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 170°C/W Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed. 2. This value is limited to 4.6 V maximum. 3. The package thermal impedance is calculated in accordance with JESD 51. 2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN74ALVC125 QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS SCES110D – JULY 1997 – REVISED DECEMBER 1998 recommended operating conditions (see Note 4) VCC Supply voltage VIH High-level input voltage VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 2.7 V to 3.6 V MIN MAX 1.65 3.6 2 0.35 × VCC Low-level input voltage VI VO Input voltage 0 Output voltage 0 0.7 VCC = 2.7 V to 3.6 V IOL High level output current High-level VCC = 2.7 V VCC = 3 V VCC = 1.65 V VCC = 2.3 V Low level output current Low-level VCC = 2.7 V VCC = 3 V V 1.7 VIL IOH V 0.65 × VCC VCC = 1.65 V to 1.95 V VCC = 2.3 V to 2.7 V VCC = 1.65 V VCC = 2.3 V UNIT V 0.8 VCC VCC V V –4 –12 –12 mA –24 4 12 12 mA 24 TA Operating free-air temperature –40 85 °C NOTE 4: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3 SN74ALVC125 QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS SCES110D – JULY 1997 – REVISED DECEMBER 1998 electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS IOH = –100 µA IOH = –4 mA VOH IOH = –12 mA IOH = –24 mA IOL = 100 µA Ci Control inputs Data inputs 1.7 2.7 V 2.2 3V 2.4 3V 2 2.3 V 0.4 2.3 V 0.7 2.7 V 0.4 VI = VCC or GND V 3V 0.55 3.6 V ±5 µA 3.6 V ±10 µA 3.6 V 10 µA 3 V to 3.6 V 750 µA 3.5 33V 3.3 Co Outputs VO = VCC or GND † All typical values are at VCC = 3.3 V, TA = 25°C. UNIT V 0.2 IO = 0 Other inputs at VCC or GND One input at VCC – 0.6 V, 2 2.3 V 0.45 IOL = 24 mA VI = VCC or GND VO = VCC or GND VI = VCC or GND, 2.3 V 1.65 V IOL = 12 mA ICC ∆ICC MAX 1.65 V to 3.6 V IOL = 4 mA IOL = 6 mA II IOZ TYP† VCC–0.2 1.2 1.65 V IOH = –6 mA VOL MIN VCC 1.65 V to 3.6 V pF 3.5 3.3 V 5.5 pF switching characteristics over recommended operating free-air temperature range (unless otherwise noted) (see Figures 1 through 3) FROM (INPUT) TO (OUTPUT) tpd A ten tdis PARAMETER VCC = 1.8 V ± 0.15 V VCC = 2.5 V ± 0.2 V MIN MAX MIN MAX Y 1.3 5.3 1 OE Y 1.4 6.4 OE Y 1.8 5.9 VCC = 2.7 V MIN VCC = 3.3 V ± 0.3 V UNIT MAX MIN MAX 3.2 3.1 1.1 2.8 ns 1 4.1 4.3 1 3.5 ns 1 3.4 4 1.4 4 ns operating characteristics, TA = 25°C PARAMETER Cpd 4 Power dissipation capacitance per gate Outputs enabled Outputs disabled TEST CONDITIONS VCC = 1.8 V TYP VCC = 2.5 V TYP VCC = 3.3 V TYP CL = 0, f = 10 MHz 15 17 19 2 2 3 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 UNIT pF SN74ALVC125 QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS SCES110D – JULY 1997 – REVISED DECEMBER 1998 PARAMETER MEASUREMENT INFORMATION VCC = 1.8 V ± 0.15 V 2 × VCC S1 1 kΩ From Output Under Test Open GND CL = 30 pF (see Note A) 1 kΩ TEST S1 tpd tPLZ/tPZL tPHZ/tPZH Open 2 × VCC GND LOAD CIRCUIT tw VCC Timing Input VCC/2 VCC/2 VCC/2 0V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES VCC/2 VCC/2 0V tPLH Output Control (low-level enabling) tPLZ VCC VCC/2 VCC/2 VOL Output Waveform 2 S1 at Open (see Note B) VOL + 0.15 V VOL tPHZ tPZH VOH VCC/2 0V Output Waveform 1 S1 at 2 × VCC (see Note B) tPHL VCC/2 VCC VCC/2 tPZL VCC Input VOLTAGE WAVEFORMS PULSE DURATION th VCC Data Input VCC/2 0V 0V tsu Output VCC VCC/2 Input VCC/2 VOH VOH – 0.15 V 0V VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES NOTES: A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns. D. The outputs are measured one at a time with one transition per measurement. E. tPLZ and tPHZ are the same as tdis. F. tPZL and tPZH are the same as ten. G. tPLH and tPHL are the same as tpd. Figure 1. Load Circuit and Voltage Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 5 SN74ALVC125 QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS SCES110D – JULY 1997 – REVISED DECEMBER 1998 PARAMETER MEASUREMENT INFORMATION VCC = 2.5 V ± 0.2 V 2 × VCC S1 500 Ω From Output Under Test Open GND CL = 30 pF (see Note A) 500 Ω TEST S1 tpd tPLZ/tPZL tPHZ/tPZH Open 2 × VCC GND LOAD CIRCUIT tw VCC Timing Input VCC/2 VCC/2 VCC/2 0V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES VCC/2 VCC/2 0V tPLH Output Control (low-level enabling) tPLZ VCC VCC/2 VCC/2 VOL Output Waveform 2 S1 at GND (see Note B) VOL + 0.15 V VOL tPHZ tPZH VOH VCC/2 0V Output Waveform 1 S1 at 2 × VCC (see Note B) tPHL VCC/2 VCC VCC/2 tPZL VCC Input VOLTAGE WAVEFORMS PULSE DURATION th VCC Data Input VCC/2 0V 0V tsu Output VCC VCC/2 Input VCC/2 VOH VOH – 0.15 V 0V VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES NOTES: A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2 ns, tf ≤ 2 ns. D. The outputs are measured one at a time with one transition per measurement. E. tPLZ and tPHZ are the same as tdis. F. tPZL and tPZH are the same as ten. G. tPLH and tPHL are the same as tpd. Figure 2. Load Circuit and Voltage Waveforms 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 SN74ALVC125 QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS SCES110D – JULY 1997 – REVISED DECEMBER 1998 PARAMETER MEASUREMENT INFORMATION VCC = 2.7 V AND 3.3 V ± 0.3 V 6V S1 500 Ω From Output Under Test Open GND CL = 50 pF (see Note A) 500 Ω TEST S1 tpd tPLZ/tPZL tPHZ/tPZH Open 6V GND tw LOAD CIRCUIT 2.7 V 2.7 V Timing Input 0V 0V VOLTAGE WAVEFORMS PULSE DURATION th 2.7 V Data Input 1.5 V 1.5 V 0V VOLTAGE WAVEFORMS SETUP AND HOLD TIMES 1.5 V 1.5 V 0V tPLH tPHL VOH 1.5 V 2.7 V Output Control (low-level enabling) 1.5 V 1.5 V VOL VOLTAGE WAVEFORMS PROPAGATION DELAY TIMES tPLZ 3V Output Waveform 1 S1 at 6 V (see Note B) Output Waveform 2 S1 at GND (see Note B) 1.5 V 0V tPZL 2.7 V Output Input 1.5 V 1.5 V tsu Input 1.5 V 1.5 V tPZH VOL + 0.3 V VOL tPHZ 1.5 V VOH – 0.3 V VOH 0V VOLTAGE WAVEFORMS ENABLE AND DISABLE TIMES NOTES: A. CL includes probe and jig capacitance. B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control. Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control. C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns. D. The outputs are measured one at a time with one transition per measurement. E. tPLZ and tPHZ are the same as tdis. F. tPZL and tPZH are the same as ten. G. tPLH and tPHL are the same as tpd. Figure 3. Load Circuit and Voltage Waveforms POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 7 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. 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