FUJITSU FAR-C4CA-04194-M01-R

FUJITSU SEMICONDUCTOR
DATA SHEET
DS07-20101-7E
Resonator
Piezoelectric Resonator
FAR Family (C1, C3, C4 series)
■ DESCRIPTION
Fujitsu resonators (C1, C3, C4 series) feature originally developed single crystals with a high electromechanical
coupling coefficient (LiTaO3: lithium tantalate, LiNbO3: lithium niobate), the result is compact packaging. Three
series are available: the C3 and C4 series with built-in capacitors for high integration, for exclusive use in
microcomputer clocks; and the C1 series for high precision. All series include the CHIP type device for surfacemount and the SIP type device for general PC boards.
■ FEATURES
•
•
•
•
Surface-mount technology can be applied to the CHIP type to increase packaging density. The SIP type is
only half the height of conventional quartz crystal resonators, and can be easily mounted on general PC boards.
The C3 and C4 series have been developed for exclusive use in microcomputer clocks. They have built-in
capacitors, and the number of components has been reduced to one-third of that of conventional circuits.
Both the SIP and CHIP types can be shipped in taped packages for automatic mounting.
The resonators have superior shock and vibration resistance, preventing damage during automatic insertion
process.
■ PACKAGE
FAR Family (C1, C3, C4 series)
■ STANDARD CHARACTERISTICS
Series
C1 series
Parameter
Material
C3 series
C4 series
Lithium Tantalate (LiTaO3)
Lithium Niobate (LiNbO3)
3.58 to 16 MHz
3 to 16 MHz
Frequency
Standard frequency
See “■ Standard frequency.”
Initial frequency
tolerance
±0.05% (G)
±0.1% (J)
±0.3% (K)
±0.5% (M)
±0.1% (J)
±0.3% (K)
±0.5% (M)
±0.5% (M)
±0.3% (K)
±1% (L)
±0.02%
±0.05%
±0.5%
Temperature
characteristics
(–20 to 60°C)
Capacity of built-in
capacitor
—
20±8 pF (standard)*
Aging stability
Within ±0.1%
Operating temperature
–30 to 85°C
Storage temperature
–40 to 100°C
(Resonant frequency and serial
resonant resistance)
30 pF
R
(Oscillation frequency)
R:
Resonator
3 MHz to 10 MHz max.
IC; 1/6MB84069B x 2
10 MHz to 16 MHz
IC; MC74HC04
VCC; 5 VDC
R; Resonator
C1, C2: Loading capacitors
(built-in)
1 MΩ
R
75 Ω
75 Ω
C1 C2
OSC
LM
Standard measuring
circuit
FAR
(Serial resonant resistance)
R
75 Ω
OSC
C1 C2
R: Resonator
75 Ω
LM
*: The capacity of the built-in capacitor is 20±8 pF by standard.
10±4 pF and 30±8 pF types are also available. However, the characteristics of 10±4 pF and 30±8 pF types are specified by
Fujitsu, considering matching data with applied IC (mainly microcomputer).
2
FAR Family (C1, C3, C4 series)
■ STANDARD FREQUENCY
Standard
frequency (kHz)
•
C1/C3 series
C4 series
Package
size
Resonant
resistance
Package
size
Resonant
resistance
3,580
4,000
4,194
4,915
A
A
A
A
300 Ω max.
(00)
A
A
A
A
150 Ω max.
(01)
6,000
6,144
7,373
8,000
10,000
11,000
11,059
12,000
14,746
16.000
B
B
B
B
B
B
B
B
B
B
150 Ω max.
(01)
B
B
B
B
B
B
B
B
B
B
75 Ω max.
(02)
Package sizes and resonant resistance
There are two package sizes according to frequency:
Frequency
Package size
3 to 5.99 MHz
A
6 to 16 MHz
B
For resonant resistance, standard values are specified according to frequency:
Frequency
Standard resonant resistance
C1/C3 series
C4 series
3 to 3.57 MHz
—
300 Ω max.
(00)
3.58 to 5.99 MHz
300 Ω max.
(00)
150 Ω max.
(01)
6 to 16 MHz
150 Ω max.
(01)
75 Ω max.
(02)
Note: For resonant resistance other than the standard values, they are specified by Fujitsu considering matching data with
applied IC (mainly micro computer).
■ NOTES ON USE
•
•
•
•
•
•
Handle carefully.
Solder under the following conditions.
CHIP type: 5 seconds max. at 230°C (PCB)
SIP type: 10 seconds max. at 260°C
Do not apply extreme heat to the resonator. Recommended preheating for the CHIP type is 150°C for one
minute.
Avoid extreme fluctuations in temperature during use.
There is no specific direction in resonator mounting.
Additional information is available separately, if required, for designing microcomputer oscillation circuits.
CHIP type is for reflow solder, not for flow solder.
3
FAR Family (C1, C3, C4 series)
■ PART NUMBERING SYSTEM
FAR
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(1) Series
Series
Single crystal
Capacitor
C1
LiTaO3
—
C3
LiTaO3
With built-in capacitors
C4
LiNbO3
With built-in capacitors
(2) Package type
Specification
Type
C
CHIP
S
SIP
(3) Package size
See Table 1 in “■ Dimensions.”
Specification
Size
A
Large
B
Small
(4) Frequency (kHz)
Frequency Designation Frequency Designation Frequency Designation Frequency Designation
3,580 kHz
03580
6,000 kHz
06000
10,000 kHz
10000
14,746 kHz
14746
4,000 kHz
04000
6,144 kHz
06144
11,000 kHz
11000
16,000 kHz
16000
4,194 kHz
04194
7,373 kHz
07373
11,059 kHz
11059
4,195 kHz
04915
8,000 kHz
08000
12,000 kHz
12000
(5) Initial tolerance of frequency
See “■ Standard Frequency.”
4
Specification
Tolerance
C1 series
C3 series
C4 series
G
±0.05%
available
—
—
J
±0.1%
available
available
—
K
±0.3%
available
available
available
M
±0.5%
avaialble
available
available
L
±1%
—
—
available
FAR Family (C1, C3, C4 series)
(6) Capacity of built-in capacitor
Specification
Capacitance
0
20±8 pF
1
10±4 pF
2
30±8 pF
Note: For C1 series, only “0” is available.
(7) Resonant resistance
Specification
Resonant resistance
0
300 Ω max.
1
150 Ω max.
2
75 Ω max.
(8) User-specific Special Symbols
Specification
Description
Name
No specification, no taping specification
—
No specification, with taping specification
A to Z
Serial number for custom design
(9)Taping specification
• SIP type
Specification
Description
–T
Reel pack
–U
Ammo pack
Specification
Description
–R
16 mm carrier pack
• CHIP type
5
FAR Family (C1, C3, C4 series)
■ MARKING
(CHIP type)
(SIP type)
Fujitsu’s parts abbreviation
Fujitsu’s parts abbreviation
Frequency (kHz)
F
4000
T
k
m
Frequency (kHz)
Lot No. (Date of manufacture,
conforms to EIAJ)
Initial frequency tolerance
Characteristics:
T: LiTaO3 N: LiNbO3
F
1200 T k
m
Lot No. (Date of manufacture,
conforms to EIAJ)
Initial frequency tolerance
Characteristics:
T: LiTaO3 N: LiNbO3
The stamp color varies with the capacity of the capacitor.
Capacitance
Marking clolr
10 pF
Yellow
20 pF
White
30 pF
Gray
Data code (EIAJ standard) is specified as follows in a four-year cycle.
Year
1977
1981
1985
1989
1993
6
Month Symbol
Year
Month Symbol
Year
Month Symbol
Year
Month Symbol
1
A
1
N
1
a
1
2
B
2
P
2
b
2
3
C
3
Q
3
4
D
4
R
5
E
5
E
6
F
6
T
7
G
7
U
8
H
9
J
10
1978
1982
1986
1990
1994
8
V
1979
1983
1987
1991
1995
3
4
d
5
e
6
f
7
1980
1984
1988
1992
8
9
n
j
1996
4
r
5
6
t
7
u
8
9
W
9
K
10
X
10
10
11
L
11
Y
11
11
12
M
12
Z
12
12
FAR Family (C1, C3, C4 series)
■ PIN ASSIGNMENT
• C1 series
SIP type
CHIP type
1
1
2
2
(Equivalent circuit)
2
1
• C3 and C4 series
SIP type
CHIP type
1
1
2
2
3
3
(Equivalent circuit)
3
1
2
7
FAR Family (C1, C3, C4 series)
■ DIMENSIONS
Table 1 Package size
Unit: mm (in.)
a
Type
L
L1
W
H
A
11.0 ± 0.2
(0.433 ± 0.008)
—
4.3 ± 0.2
(0.169 ± 0.008)
6.3 ± 0.2
(0.248 ± 0.008)
B
9.0 ± 0.2
(0.354 ± 0.008)
—
4.3 ± 0.2
(0.169 ± 0.008)
5.3 ± 0.2
(0.209 ± 0.008)
A
10.0 ± 0.5
(0.394 ± 0.020)
9.4 ± 0.2
(0.370 ± 0.008)
4.5 ± 0.5
(0.177 ± 0.020)
2.5 ± 0.3
(0.098 ± 0.012)
B
8.0 ± 0.5
(0.315 ± 0.020)
7.4 ± 0.2
(0.291 ± 0.008)
3.2 ± 0.5
(0.126 ± 0.020)
2.5 ± 0.3
(0.098 ± 0.012)
Two terminal
Three terminal
5.08 ± 0.2
(0.200 ± 0.008)
2.54 ± 0.2
(0.100 ± 0.008)
SIP type
CHIP type
SIP type
L
W
L
W
H
H
0.35 ± 0.1
(0.014 ± 0.004)
0.5 ± 0.2
(0.020 ± 0.008)
a
0.35 ± 0.1
(0.014 ± 0.004)
0.5 ± 0.2
(0.020 ± 0.008)
3.4 ± 0.2
(0.134 ± 0.008)
a
a
3.4 ± 0.2
(0.134 ± 0.008)
C1 series
C3 and C4 series
CHIP type
L1
L1
L1
H
H
L
L
1.5
(0.059)
a
W
0.45
(0.018)
C1 series
8
H
0.95
(0.037)
L
1.5
(0.059)
W
a
a
0.45
(0.018)
C3 series
0.95
(0.037)
1.5
(0.059)
W
a
a
C4 series
FAR Family (C1, C3, C4 series)
■ TAPING FORM AND DIMENSIONS
•
SIP type
3.81 ± 0.7
(0.150 ± 0.028)
6.35 ± 1.3
(0.250 ± 0.051)
Unit: mm (in.)
12.7 ± 1.0
(0.500 ± 0.394)
3.0 max. (0.118)
9.0 ± 2
(0.354 ± 0.079)
18.0 ± 0.5
(0.709 ± 0.020)
12.5 min.
(0.492)
Note:
•
Pack form
+0.040
(0.709 –0.020 )
φ4.0 ± 0.3 (0.157 ± 0.012)
12.7 ± 0.3
(0.500 ± 0.012)
Designation
+1.0
18.0 –0.5
Pack quantity (pcs)
Package size A Package size B
T
Reel pack
1000
1000
U
Ammo pack
1500
1500
1. In reel packs, the tolerance of the cumulative feed hole pitch (20 pitches) is ±1.3 (0.051) or less.
2. In ammo packs, there must be perforations every 25 pitches.
CHIP type
4 ± 0.1
(0.157 ± 0.004)
2 ± 0.1
(0.079 ± 0.004)
Unit: mm (in.)
1.5 ± 0.1
(0.059 ± 0.004)
7.65 ± 0.1
(0.301 ± 0.004)
16 ± 0.2
(0.630 ± 0.008)
±0.1 (0.004)
8 ± 0.15
(0.315 ± 0.006)
6.85 (0.270)
Package
size
W ± 0.1
(0.004)
W
A
4.9
(0.193)
10.4
(0.409)
B
3.6
(0.142)
8.4
(0.331)
3.0 ± 0.1
(0.118 ± 0.004)
Reel form
2.0 (0.080)
• Pack quantity
φ13.0
(0.512)
φ75 (2.953)
1.0
(0.039)
φ330 ± 2.0
(12.992 ± 0.079)
φ21.0
(0.827)
Package size
Pack
quantity
A
3,000 pcs
B
3,400 pcs
2.0 (0.079)
18.0 (0.709)
9
FAR Family (C1, C3, C4 series)
■ APPLICATION EXAMPLES
•
C1 series
22 pF to 47 pF
R
680 Ω
TTL oscillation circuit
(serial resonation circuit)
1.8 kΩ
220 Ω
IC
Output
IC
R: Resonator
IC: MB74LS04
•
C3, C4 series
1
MB8850
MB8850H series
2
1
3
2
R
R: Resonator
■ RELIABILITY
Parameter
10
Test conditions
Requirements
Shock
MIL-STD-883B, 2002, condtion C (3000G)
Frequency fluctuation:
within ±0.1%
Vibration
MIL-STD-202E, 201A (1.5 mm <0.059> at 10 Hz
to 55 Hz for 2 hours)
Frequency fluctuation:
within ±0.1%
Drop
5 times drop from 1 m (39.370 in.) height to
wooden board.
Frequency fluctuation:
within ±0.1%
Sealing
Immersion in water at 85°C
No bubbles observed
Heat resistance
fluctuation:
MIL-STD-202E, 210A condition B (260°C • 5 sec.) Frequency
within ±0.1%
Temperature cycling
MIL-STD-883B, 1010, condition A (–35 to 85°C,
10 cycle)
Frequency fluctuation:
within ±0.1%
High-temperature loading test
MIL-STD-883B, 1008, condition B 1000 h (100°C •
1000 hours)
Frequency fluctuation:
within ±0.1%
High-temperature humidity test
MIL-STD-202E, 103A, condition B (96 hours at
60°C, 90% to 95% RH, 12 VDC)
Frequency fluctuation:
within ±0.1%
FAR Family (C1, C3, C4 series)
FUJITSU LIMITED
For further information please contact:
Japan
FUJITSU MEDIA DEVICES LIMITED
Marketing and Technical Support Dept.
SHINYOKOHAMA SQUARE BLDG
2-3-12,Shin-yokohama,
Kouhoku-ku, Yokohama-shi,
Kanagawa 222-0033, Japan
Tel: +81-45-471-0067
Fax: +81-45-471-0069
http://www.fujitsu.co.jp/hypertext/fmd/English/index.html
North and South America
FUJITSU MICROELECTRONICS, INC.
3545 North First Street,
San Jose, CA 95134-1804, U.S.A.
Tel: +1-408-922-9000
Fax: +1-408-922-9179
Customer Response Center
Mon. - Fri.: 7 am - 5 pm (PST)
Tel: +1-800-866-8608
Fax: +1-408-922-9179
http://www.fujitsumicro.com/
Europe
FUJITSU MICROELECTRONICS EUROPE GmbH
Am Siebenstein 6-10,
D-63303 Dreieich-Buchschlag,
Germany
Tel: +49-6103-690-0
Fax: +49-6103-690-122
http://www.fujitsu-fme.com/
Asia Pacific
FUJITSU MICROELECTRONICS ASIA PTE. LTD.
#05-08, 151 Lorong Chuan,
New Tech Park,
Singapore 556741
Tel: +65-281-0770
Fax: +65-281-0220
http://www.fmap.com.sg/
F9703
 FUJITSU LIMITED Printed in Japan
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The contents of this document are subject to change without notice.
Customers are advised to consult with FUJITSU sales
representatives before ordering.
The information and circuit diagrams in this document are
presented as examples of semiconductor device applications, and
are not intended to be incorporated in devices for actual use. Also,
FUJITSU is unable to assume responsibility for infringement of
any patent rights or other rights of third parties arising from the use
of this information or circuit diagrams.
The contents of this document may not be reproduced or copied
without the permission of FUJITSU LIMITED.
FUJITSU semiconductor devices are intended for use in standard
applications (computers, office automation and other office
equipments, industrial, communications, and measurement
equipments, personal or household devices, etc.).
CAUTION:
Customers considering the use of our products in special
applications where failure or abnormal operation may directly
affect human lives or cause physical injury or property damage, or
where extremely high levels of reliability are demanded (such as
aerospace systems, atomic energy controls, sea floor repeaters,
vehicle operating controls, medical devices for life support, etc.)
are requested to consult with FUJITSU sales representatives before
such use. The company will not be responsible for damages arising
from such use without prior approval.
Any semiconductor devices have inherently a certain rate of failure.
You must protect against injury, damage or loss from such failures
by incorporating safety design measures into your facility and
equipment such as redundancy, fire protection, and prevention of
over-current levels and other abnormal operating conditions.
If any products described in this document represent goods or
technologies subject to certain restrictions on export under the
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prior authorization by Japanese government should be required for
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