TI ADS6425IRGCRG4

ADS6425
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SLWS197 – MARCH 2007
QUAD CHANNEL, 12-BIT, 125-MSPS ADC WITH SERIAL LVDS INTERFACE
FEATURES
APPLICATIONS
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Maximum Sample Rate: 125 MSPS
12-Bit Resolution with No Missing Codes
1.65-W Total Power
Simultaneous Sample and Hold
70.3 dBFS SNR at Fin = 50 MHz
83 dBc SFDR at Fin = 50 MHz, 0 dB Gain
79 dBc SFDR at Fin = 170 MHz, 3.5 dB Gain
3.5 dB Coarse Gain and up to 6 dB
Programmable Fine Gain for SFDR/SNR
Trade-Off
Serialized LVDS Outputs with Programmable
Internal Termination Option
Supports Sine, LVCMOS, LVPECL, LVDS
Clock Inputs and Amplitude Down to 400 mVpp
differential
Internal Reference with External Reference
Support
No External Decoupling Required for
References
3.3-V Analog and Digital Supply
64 QFN Package (9 mm × 9 mm)
Pin Compatible 14-Bit Family (ADS644X)
Base-station IF Receivers
Diversity Receivers
Medical Imaging
Test Equipment
DESCRIPTION
The ADS6425 is a high performance 12-bit,
125-MSPS quad channel ADC. Serial LVDS data
outputs reduce the number of interface lines,
resulting in a compact 64-pin QFN package (9 mm ×
9 mm) that allows for high system integration density.
The device includes 3.5 dB coarse gain option that
can be used to improve SFDR performance with little
degradation in SNR. In addition to the coarse gain,
fine gain options also exist, programmable in 1dB
steps up to 6dB.
The output interface is 2-wire, where each ADC's
data is serialized and output over two LVDS pairs.
This makes it possible to halve the serial data rate
(compared to a 1-wire interface) and restrict it to less
than 1Gbps easing receiver design. The ADS6425
also includes the traditional 1-wire interface that can
be used at lower sampling frequencies.
An internal phase locked loop (PLL) multiplies the
incoming ADC sampling clock to derive the bit clock.
The bit clock is used to serialize the 12-bit data from
each channel. In addition to the serial data streams,
the frame and bit clocks are also transmitted as
LVDS outputs. The LVDS output buffers have
features such as programmable LVDS currents,
current doubling modes and internal termination
options. These can be used to widen eye-openings
and improve signal integrity, easing capture by the
receiver.
The ADC channel outputs can be transmitted either
as MSB or LSB first and 2s complement or straight
binary.
ADS6425 has internal references, but can also
support an external reference mode. The device is
specified over the industrial temperature range
(–40°C to 85°C).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007, Texas Instruments Incorporated
ADS6425
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SLWS197 – MARCH 2007
LVDD
LGND
CAP
AVDD
AGND
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
CLKP
CLKM
BIT Clock
DCLKP
DCLKM
FRAME Clock
FCLKP
FCLKM
PLL
12-Bit
ADC
Digital
Encoder
and
Serializer
12-Bit
ADC
Digital
Encoder
and
Serializer
SHA
12-Bit
ADC
Digital
Encoder
and
Serializer
SHA
12-Bit
ADC
Digital
Encoder
and
Serializer
INA_P
SHA
INA_M
INB_P
SHA
INB_M
INC_P
INC_M
IND_P
VCM
DA1_P
DA1_M
DB0_P
DB0_M
DB1_P
DB1_M
DC0_P
DC0_M
DC1_P
DC1_M
DD0_P
DD0_M
DD1_P
DD1_M
REFM
REFP
IND_M
DA0_P
DA0_M
Reference
Parallel
Interface
Serial
Interface
SCLK
RESET
SEN
SDATA
CFG4
CFG3
CFG1
CFG2
PDN
ADS6425
B0199-02
PACKAGE/ORDERING INFORMATION (1)
PRODUCT
PACKAGE-LEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ADS6425
QFN-64 (2)
RGC
–40°C to 85°C
AZ6425
(1)
(2)
2
ORDERING NUMBER
TRANSPORT
MEDIA,
QUANTITY
ADS6425IRGCT
250, Tape/reel
ADS6425IRGCR
2000, Tape/reel
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
For thermal pad size on the package, see the mechanical drawings at the end of this data sheet. θJA = 23.17 °C/W (0 LFM air flow), θJC
= 22.1 °C/W when used with 2 oz. copper trace and pad soldered directly to a JEDEC standard four layer 3 in. x 3 in. PCB.
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SLWS197 – MARCH 2007
ABSOLUTE MAXIMUM RATINGS (1)
VALUE
UNIT
AVDD
Supply voltage range
–0.3 to 3.9
V
LVDD
Supply voltage range
–0.3 to 3.9
V
Voltage between AGND and DGND
–0.3 to 0.3
V
Voltage between AVDD to LVDD
–0.3 to 3.3
V
Voltage applied to external pin, VCM
–0.3 to 2.0
V
Voltage applied to analog input pins
– 0.3V to minimum ( 3.6, AVDD + 0.3V)
V
TA
Operating free-air temperature range
–40 to 85
°C
TJ
Operating junction temperature range
125
°C
Tstg
Storage temperature range
–65 to 150
°C
220
°C
Lead temperature 1,6 mm (1/16") from the case for 10 seconds
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
AVDD Analog supply voltage
3.0
3.3
3.6
V
LVDD
3.0
3.3
3.6
V
SUPPLIES
LVDS Buffer supply voltage
ANALOG INPUTS
Differential input voltage range
2
Vpp
1.5
±0.1
Input common-mode voltage
Voltage applied on VCM in external reference mode
1.45
1.50
V
1.55
V
125
MSPS
CLOCK INPUT
Input clock sample rate
5
Sine wave, ac-coupled
Input clock amplitude differential (VCLKP– VCLKM)
0.4
± 0.8
LVPECL, ac-coupled
Vpp
± 0.35
LVDS, ac-coupled
LVCMOS, ac-coupled
Input Clock duty cycle
1.5
3.3
35%
50%
65%
DIGITAL OUTPUTS
CLOAD
Maximum external load capacitance from each output pin to
DGND
Without internal termination
5
With internal termination
RLOAD Differential load resistance (external) between the LVDS output pairs
TA
Operating free-air temperature
Ω
100
–40
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pF
10
85
°C
3
ADS6425
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SLWS197 – MARCH 2007
ELECTRICAL CHARACTERISTICS
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3V, sampling rate = 125MSPS, 50% clock duty cycle, –1dBFS differential analog input, internal reference mode
(unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
RESOLUTION
TYP
MAX
UNIT
12
Bits
2.0
Vpp
ANALOG INPUT
Differential input voltage range
Differential input capacitance
7
pF
Analog input bandwidth
500
MHz
Analog input common mode current
(per input pin of each ADC)
155
µA
REFERENCE VOLTAGES
VREFB
Internal reference bottom voltage
1.0
V
VREFT
Internal reference top voltage
2.0
V
VCM
Common mode output voltage
1.5
V
VCM Output current capability
±4
mA
DC ACCURACY
No missing codes
EO
Assured
Offset error
-15
±2
+15
mV
Offset error temperature coefficient
0.05
Offset error temperature coefficient,
channel-channel
Internal reference error
(VREFT-VREFB)
-15
Internal reference error temperature
coefficient
EG
Gain error
(1)
±5
mV/°C
15
0.25
Does not include gain error caused due to
internal reference error
-1
0.3
mV
mV/°C
+1
% FS
Gain error temperature coefficient
∆%/°C
0.005
Gain error temperature coefficient,
channel-channel
DNL
Differential nonlinearity
-0.9
INL
Integral nonlinearity
-2.5
PSRR
DC Power supply rejection ratio
0.5
2.0
1.0
2.5
LSB
LSB
–0.5
mV/V
POWER SUPPLY
ICC
Total supply current
412
mA
IAVDD
Analog supply current
90
mA
ILVDD
LVDS supply current
502
mA
Total Power
Power down
(1)
4
Input clock running
This is specified by design and characterization. It is not tested in production.
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1.65
1.8
W
77
150
mW
ADS6425
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SLWS197 – MARCH 2007
ELECTRICAL CHARACTERISTICS
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3V, sampling rate = 125MSPS, 50% clock duty cycle, –1dBFS differential analog input, internal reference mode
(unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DYNAMIC AC CHARACTERISTICS
Fin = 10 MHz
70.9
Fin = 50 MHz
67.5
Fin = 100 MHz
SNR
Signal to noise ratio
Fin = 170 MHz
Fin = 230 MHz
69.9
0 dB gain
68.5
3.5 dB Coarse gain
68.1
0 dB gain
67.4
3.5 dB Coarse gain
67.1
Fin = 10 MHz
67
Fin = 100 MHz
Signal to noise and distortion ratio
Fin = 170 MHz
Fin = 230 MHz
RMS Output noise
69.7
66.9
3.5 dB Coarse gain
67.4
0 dB gain
66.5
Inputs tied to common-mode
0.407
Fin = 230 MHz
73
87
75
3.5 dB Coarse gain
79
0 dB gain
74
3.5 dB Coarse gain
78
73
Fin = 100 MHz
Fin = 170 MHz
Fin = 230 MHz
90
85
3.5 dB Coarse gain
88
0 dB gain
82
3.5 dB Coarse gain
85
73
Fin = 100 MHz
Fin = 170 MHz
Fin = 230 MHz
Worst harmonic (other than HD2,
HD3)
dBc
90
Fin = 50 MHz
Third harmonic
91
0 dB gain
Fin = 10 MHz
HD3
dBc
93
Fin = 50 MHz
Second harmonic
83
0 dB gain
Fin = 10 MHz
HD2
LSB
90
Fin = 100 MHz
Fin = 170 MHz
dBFS
66
3.5 dB Coarse gain
Fin = 50 MHz
Spurious free dynamic range
70
0 dB gain
Fin = 10 MHz
SFDR
dBFS
70.7
Fin = 50 MHz
SINAD
70.5
83
87
0 dB gain
75
3.5 dB Coarse gain
79
0 dB gain
74
3.5 dB Coarse gain
78
Fin = 10 MHz
95
Fin = 50 MHz
94
Fin = 100 MHz
91
Fin = 170 MHz
88
Fin = 230 MHz
86
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dBc
dBc
5
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SLWS197 – MARCH 2007
ELECTRICAL CHARACTERISTICS (continued)
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3V, sampling rate = 125MSPS, 50% clock duty cycle, –1dBFS differential analog input, internal reference mode
(unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
Fin = 10 MHz
Fin = 50 MHz
THD
Total harmonic distortion
Effective number of bits
81
Fin = 100 MHz
84
Fin = 170 MHz
73
Fin = 50 MHz
IMD
Two-tone intermodulation distortion
Cross-talk
UNIT
88
70
Fin = 230 MHz
ENOB
MAX
dBc
72
10.8
11.4
F1= 46.09 MHz, F2 = 50.09 MHz
90
F1= 185.09 MHz, F2 = 190.09 MHz
82
Near channel, Frequency of interfering signal
= 10 MHz
92
Bits
dBFS
dBFS
Far channel, Frequency of interfering signal
= 10 MHz
105
DIGITAL CHARACTERISTICS
The DC specifications refer to the condition where the digital outputs are not switching, but are permanently at a valid logic
level 0 or 1 AVDD = LVDD = 3.3V, IO = 3.5mA, RLOAD = 100Ω (1).
All LVDS specifications are characterized, but not tested at production.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DIGITAL INPUTS
High-level input voltage
2.4
V
Low-level input voltage
0.8
V
High-level input current
10
µA
Low-level input current
10
µA
4
pF
High-level output voltage
1375
mV
Low-level output voltage
1025
Input capacitance
DIGITAL OUTPUTS
|VOD|
Output differential voltage
VOS
Output offset voltage
Common-mode voltage of OUTP and OUTM
Output capacitance
Output capacitance inside the device, from either output to
ground
(1)
6
250
350
mV
450
1200
mV
2
pF
IO refers to the LVDS buffer current setting, RLOAD is the external differential load resistance between the LVDS output pair
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mV
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SLWS197 – MARCH 2007
TIMING SPECIFICATIONS
(1)
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3 V, sampling frequency = 125 MSPS, sine wave input clock, 1.5 VPP clock amplitude, CL = 5 pF (2), IO = 3.5 mA,
RL = 100 Ω (3), no internal termination, unless otherwise noted.
PARAMETER
tJ
TEST CONDITIONS
Aperture jitter
MIN
Uncertainty in the sampling instant
Interface: 2-wire, DDR bit clock, 12x serialization
TYP
MAX
UNIT
250
fs rms
(4)
tsu
Data setup time (5) (6)
Measured from zero crossing of data transitions to
zero crossing of bit clock
0.4
0.6
ns
th
Data hold time (5) (6)
Measured from zero crossing of bit clock to zero
crossing of data transitions
0.5
0.7
ns
tpd_clk
Clock propagation delay (4)
Input clock rising edge cross-over to frame clock
rising edge cross-over
3.6
4.4
Bit clock cycle-cycle jitter
(6)
Frame clock cycle-cycle jitter
(6)
5.2
ns
350
ps pp
75
ps pp
Below specifications apply for 5 MSPS ≤ Fs ≤125 MSPS and all interface options.
tA
Aperture delay
Delay from rising edge of input clock to the actual
sampling instant
Aperture delay variation,
channel-channel
Within the same device
ADC Latency
(7)
Wake up time
1
2
-250
Time for a sample to propagate to the ADC output
Figure 1
3
ns
250
ps
Clock
cycles
12
Time to valid data after coming out of global power
down
100
Time to valid data after input clock is re-started
100
µs
200
clock
cycles
Time to valid data after coming out of channel
standby
µs
tRISE
Data rise time
Data rise time measured from –100 mV to +100
mV
50
100
200
ps
tFALL
Data fall time
Data fall time measured from +100 mV to –100 mV
50
100
200
ps
tRISE
Bit clock and Frame clock rise time
Rise time measured from –100mV to +100mV
50
100
200
ps
tFALL
Bit clock and Frame clock fall time
Fall time measured from +100mV to –100mV
50
100
200
ps
LVDS Bit clock duty cycle
45%
50%
55%
LVDS Frame clock duty cycle
47%
50%
53%
(1)
(2)
(3)
(4)
(5)
(6)
(7)
Timing parameters are ensured by design and characterization and not tested in production.
CL is the external single-ended load capacitance between each output pin and ground.
Io refers to the LVDS buffer current setting; RL is the external differential load resistance between the LVDS output pair.
Refer to Output Timings in application section for timings at lower sampling frequencies and other interface options.
Timing parameters are measured at the end of a 2 inch pcb trace (100-Ω characteristic impedance) terminated by RLand CL.
Setup and hold time specifications take into account the effect of jitter on the output data and clock.
Note that the total latency = ADC latency + internal serializer latency. The serializer latency depends on the interface option selected as
shown in Table 25
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Sample
N+13
Sample
N+12
Sample
N+11
Sample
N
Input
Signal
tA
Input
Clock
CLKM
CLKP
tPD_CLK
Latency 12 Clocks
Bit
Clock
Output
Data
DCLKP
DCLKM
DOP
D11 D10 D9
D8
D7
D6
D5
D4
D3
D2
D1
D0 D11 D10 D9
D8
D7
Sample N–1
Frame
Clock
D6
D5
D4
D3
D2
D1
D0
DOM
Sample N
FCLKM
FCLKP
T0105-03
Figure 1. Latency
DCLKP
Bit Clock
DCLKM
tsu
th
tsu
Output Data
DOP, DOM
th
Dn+1
Dn
T0106-03
Figure 2. LVDS Timings
8
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DEVICE PROGRAMMING MODES
ADS6425 offers flexibility with several programmable features that are easily configured.
The device can be configured independently using either parallel interface control or serial interface
programming.
In addition, the device supports a third configuration mode, where both the parallel interface and the serial
control registers are used. In this mode, the priority between the parallel and serial interfaces is determined by a
priority table (Table 2). If this additional level of flexibility is not required, the user can select either the serial
interface programming or the parallel interface control.
USING PARALLEL INTERFACE CONTROL ONLY
To control the device using parallel interface, keep RESET tied to high (LVDD). Pins CFG1, CFG2, CFG3,
CFG4, PDN, SEN, SCLK, and SDATA are used to directly control certain functions of the ADC. After power-up,
the device will automatically get configured as per the parallel pin voltage settings (Table 3 to Table 6) and no
reset is required. In this mode, SEN, SCLK, and SDATA function as parallel interface control pins.
Frequently used functions are controlled in this mode—output data interface and format, power down modes,
coarse gain and internal/external reference. The parallel pins can be configured using a simple resistor string as
illustrated in Figure 3.
Table 1 briefly describes the modes controlled by the parallel pins.
Table 1. Parallel Pin Definition
PIN
SEN
SCLK, SDATA
CONTROL FUNCTIONS
Coarse gain and internal/external reference.
Sync, deskew patterns and global power down.
PDN
Dedicated pin for global power down
CFG1
1-wire/2-wire and DDR/SDR bit clock
CFG2
12x/14x serialization and SDR bit clock capture edge
CFG3
Reserved function. Tie CFG3 to Ground.
CFG4
MSB/LSB First and data format.
USING SERIAL INTERFACE PROGRAMMING ONLY
In this mode, SEN, SDATA, and SCLK function as serial interface pins and are used to access the internal
registers of ADC. The registers must first be reset to their default values either by applying a pulse on RESET
pin or by a high setting on the <RST> bit (in register ). After reset, the RESET pin must be kept low.
The Serial Interface section describes the register programming and register reset in more detail.
Since the parallel pins (CFG1-4 and PDN) are not used in this mode, they must be tied to ground. The register
override bit <OVRD> - D10 in register 0x0D has to be set high to disable the control of parallel interface pins in
this serial interface control ONLY mode.
USING BOTH THE SERIAL INTERFACE AND PARALLEL CONTROLS
For increased flexibility, a combination of serial interface registers and parallel pin controls (CFG1-4 and PDN)
can also be used to configure the device.
The parallel interface control pins CFG1 to CFG4 and PDN are available. After power-up, the device will
automatically get configured as per the parallel pin voltage settings (Table 3 to Table 9) and no reset is required.
A simple resistor string can be used as illustrated in Figure 3.
SEN, SDATA, and SCLK function as serial interface pins and are used to access the internal registers of ADC.
The registers must first be reset to their default values either by applying a pulse on RESET pin or by a high
setting on the <RST> bit (in register ). After reset, the RESET pin must be kept low.
The Serial Interface section describes the register programming and register reset in more detail.
Since some functions are controlled using both the parallel pins and serial registers, the priority between the two
is determined by a priority table (Table 2).
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Table 2. Priority Between Parallel Pins and Serial Registers
PIN
CFG1 to
CFG4
FUNCTIONS SUPPORTED
PRIORITY
As described in Table 6 to
Table 9
Register bits can control the modes ONLY if the <OVRD> bit is high. If the <OVRD> bit is
LOW, then the control voltage on these parallel pins determines the function as per Tables
PDN
Global power down
D0 bit in register 0x00 controls global power down ONLY if PDN pin is LOW. If PDN is high,
device is in global power down mode.
SEN
Serial Interface Enable
3.5 dB coarse gain setting is controlled by bit D5 in register 0x0D ONLY if the <OVRD> bit is
high. Else, it is in default setting of 0 dB coarse gain.
Internal/External reference setting is determined by bit D5 in register 0x00.
SCLK,
SDATA
Serial Interface Clock and
Serial Interface Data
Bits D5-D7 in register 0x0A control the SYNC and DESKEW output patterns.
Power down is determined by bit D0 in 0x00 register.
AVDD
(5/8) AVDD
3R
(5/8) AVDD
GND
2R
AVDD
(3/8) AVDD
(3/8) AVDD
3R
To Parallel Pin
GND
Figure 3. Simple Scheme to Configure Parallel Pins
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DESCRIPTION OF PARALLEL PINS
Table 3. SCLK, SDATA Control Pins
SCLK
SDATA
LOW
LOW
NORMAL conversion.
DESCRIPTION
LOW
HIGH
SYNC - ADC outputs sync pattern on all channels. This pattern can be used by the receiver to align the
deserialized data to the frame boundary. See Capture Test Patterns for details.
HIGH
LOW
POWER DOWN –Global power down, all channels of the ADC are powered down, including internal references,
PLL and output buffers.
HIGH
HIGH
DESKEW - ADC outputs deskew pattern on all channels. This pattern can be used by the receiver to ensure
deserializer uses the right clock edge. See Capture Test Patterns for details.
Table 4. SEN Control Pin
SEN
0
DESCRIPTION
External reference and 0 dB coarse gain (Full-scale = 2V pp)
(3/8)LVDD
External reference and 3.5 dB coarse gain (Full-scale = 1.34V pp)
(5/8)LVDD
Internal reference and 3.5 dB coarse gain (Full-scale = 1.34V pp)
LVDD
Internal reference and 0 dB coarse gain (Full-scale = 2V pp)
Independent of the programming mode used, after power-up the parallel pins PDN, CFG1 to CFG4 will
automatically configure the device as per the voltage applied (Table 5 to Table 9).
Table 5. PDN Control Pin
PDN
0
AVDD
DESCRIPTION
Normal operation
Power down global
Table 6. CFG1 Control Pin
CFG1
0
DESCRIPTION
DDR bit clock and 1-wire interface
(3/8)LVDD
Not used
(5/8)LVDD
SDR bit clock and 2-wire interface
LVDD
DDR bit clock and 2-wire interface
Table 7. CFG2 Control Pin
CFG2
DESCRIPTION
0
12x serialization and capture at falling edge of bit clock (only with SDR bit clock)
(3/8)LVDD
14x serialization and capture at falling edge of bit clock (only with SDR bit clock)
(5/8)LVDD
14x serialization and capture at rising edge of bit clock (only with SDR bit clock)
LVDD
12x serialization and capture at rising edge of bit clock (only with SDR bit clock)
Table 8. CFG3 Control Pin
CFG3
RESERVED - TIE TO GROUND
Table 9. CFG4 Control Pin
CFG4
0
DESCRIPTION
MSB First and 2s complement
(3/8)LVDD
MSB First and Offset binary
(5/8)LVDD
LSB First and Offset binary
LVDD
LSB First and 2s complement
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SERIAL INTERFACE
The ADC has a serial interface formed by pins SEN (serial interface enable), SCLK (serial interface clock),
SDATA (serial interface data) and RESET. Serial shift of bits into the device is enabled when SEN is low. Serial
data SDATA is latched at every falling edge of SCLK when SEN is active (low). The serial data is loaded into the
register at every 16th SCLK falling edge when SEN is low. In case the word length exceeds a multiple of 16 bits,
the excess bits are ignored. Data can be loaded in multiple of 16-bit words within a single active SEN pulse. The
interface can work with SCLK frequency from 20 MHz down to very low speeds (few hertz) and even with
non-50% duty cycle SCLK.
The first 5-bits of the 16-bit word are the address of the register while the next 11 bits are the register data.
Register Reset
After power-up, the internal registers must be reset to their default values. This can be done in one of two ways:
1. Either by applying a high-going pulse on RESET (of width greater than 10ns) OR
2. By applying software reset. Using the serial interface, set the <RST> bit in register 0x00 to high– this
resets the registers to their default values and then self-resets the <RST> bit to LOW.
When RESET pin is not used, it must be tied to LOW.
Register Address
SDATA
A4
A3
A2
A1
Register Data
A0
D10
D9
D8
D7
D6
t(SCLK)
D5
D4
D3
D2
D1
D0
t(DH)
t(DSU)
SCLK
t(SLOADH)
t(SLOADS)
SEN
RESET
T0109-03
Figure 4. Serial Interface Timing
12
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SERIAL INTERFACE TIMING CHARACTERISTICS
Typical values at 25°C, min and max values across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = LVDD
= 3.3V, unless otherwise noted.
PARAMETER
MIN
TYP
> dc
MAX
UNIT
20
MHz
fSCLK
SCLK Frequency, fSCLK = 1/tSCLK
tSLOADS
SEN to SCLK Setup time
25
ns
tSLOADH
SCLK to SEN Hold time
25
ns
tDSU
SDATA Setup time
25
ns
tDH
SDATA Hold time
25
ns
100
ns
Time taken for register write to take effect after 16th SCLK falling edge
RESET TIMING
Typical values at 25°C, min and max values across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD = LVDD
= 3.3V, unless otherwise noted.
PARMATER
CONDITIONS
MIN
t1
Power-on delay time
Delay from power-up of AVDD and LVDD to RESET pulse
active
t2
Reset pulse width
Pulse width of active RESET signal
t3
Register write delay time Delay from RESET disable to SEN active
tPO
Power-up delay time
TYP
UNIT
5
ms
10
ns
25
Delay from power-up of AVDD and LVDD to output stable
MAX
ns
6.5
ms
Power Supply
AVDD, LVDD
t1
RESET
t2
t3
SEN
T0108-03
Figure 5. Reset Timing
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SERIAL REGISTER MAP
Table 10. Summary of Functions Supported By Serial Interface
REGISTER
ADDRESS
A4 - A0
REGISTER FUNCTIONS (1) (2)
D10
D9
D8
D7
00
<RST>
S/W RESET
0
0
0
04
0
0
0
0
0
<DF>
DATA
FORMAT 2S
COMP OR
STRAIGHT
BINARY
0
0A
0
0D
10
11
(1)
(2)
14
D5
<REF>
INTERNAL
OR
EXTERNAL
D4
D3
<PDN CHD>
POWER
DOWN CH D
<PDN CHC>
POWER
DOWN CHC
D2
<PDN CHB>
POWER
DOWN CH B
<CLKIN GAIN>
INPUT CLOCK BUFFER GAIN CONTROL
<PATTERNS>
TEST PATTERNS
0
0
0
D1
D0
<PDN CHA>
POWER
DOWN CH A
<PDN
GLOBAL>
GLOBAL
POWER
DOWN
0
0
0
0
<CUSTOM A>
CUSTOM PATTERN (LOWER 11 BITS)
0B
0C
D6
<FINE GAIN>
FINE GAIN CONTROL (1dB to 6 dB)
<OVRD>
OVERRIDE
BIT
0
0
0
0
0
BYTE-WISE
OR
BIT-WISE
MSB OR
LSB FIRST
<COARSE
GAIN>
COURSE
GAIN
ENABLE
<TERM CLK>
LVDS INTERNAL TERMINATION BIT AND WORD CLOCKS
WORD-WISE CONTROL
0
0
<CUSTOM B>
CUSTOM PATTERN (UPPER 5 BITS)
FALLING
OR RISING
BIT CLOCK
CAPTURE
EDGE
0
<LVDS CURR>
LVDS CURRENT SETTINGS
0
0
DDR OR
SDR BIT
CLOCK
1-WIRE OR
2-WIRE
INTERFACE
<CURR DOUBLE>
LVDS CURRENT DOUBLE
<TERM DATA>
LVDS INTERNAL TERMINATION - DATA OUTPUTS
The unused bits in each register (shown by white cells in above table) must be programmed as 0.
Multiple functions in a register can be programmed in a single write operation.
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SERIALIZE
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DESCRIPTION OF SERIAL REGISTERS
Table 11. Serial Register A
REGISTER
ADDRESS
A4 - A0
00
BITS
D10
<RST>
S/W RESET
D9
0
D8
0
D7
0
D6
D5
D4
D3
D2
D1
D0
0
<REF>
INTERNAL
OR
EXTERNAL
<PDN CHD>
POWER
DOWN CH D
<PDN CHC>
POWER
DOWN CHC
<PDN CHB>
POWER
DOWN CH B
<PDN CHA>
POWER
DOWN CH A
<PDN>
GLOBAL
POWER
DOWN
D0 - D4
Power down modes
D0
<PDN GLOBAL>
0
Normal operation
1
Global power down, including all channels ADCs, internal references, internal PLL and output
buffers
D1
<PDN CHA>
0
CH A powered up
1
CH A ADC powered down
D2
<PDN CHB>
0
CH B powered up
1
CH B ADC powered down
D3
<PDN CHC>
0
CH C powered up
1
CH C ADC powered down
D4
<PDN CHD>
0
CH D powered up
1
CH D ADC powered down
D5
<REF> Reference
0
Internal reference enabled
1
External reference enabled
D10
<RST>
1
Software reset applied – resets all internal registers and self-clears to 0
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Table 12. Serial Register B
REGISTER
ADDRESS
A4 - A0
04
BITS
D10
0
D9
0
D8
D7
0
D6
D5
D4
D3
D2
D1
D0
0
0
<CLKIN GAIN>
INPUT CLOCK BUFFER GAIN CONTROL
0
D6 - D2
<CLKIN GAIN> Input clock buffer gain control
11000
Gain 0 Minimum gain
00000
Gain 1
01100
Gain 2
01010
Gain 3
01001
Gain 4
01000
Gain 5 Maximum gain
Table 13. Serial Register C
REGISTER
ADDRESS
A4 - A0
00
BITS
D10
D9
D8
0
<DF>
DATA
DORMAT 2S
COMP OR
STRAIGHT
BINARY
0
D7
D6
D5
<PATTERNS>
TEST PATTERNS
D4
D3
D2
D1
D0
0
0
0
0
0
D7 - D5
<PATTERNS> Capture test patterns
000
Normal ADC operation
001
Output all zeros
010
Output all ones
011
Output toggle pattern
100
Unused
101
Output custom pattern (contents of CUSTOM pattern registers 0x0B and 0x0C)
110
Output DESKEW pattern (serial stream of 1010..)
111
Output SYNC pattern
D9
<DF> Data format selection
0
2s complement format
1
Straight binary format
16
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Table 14. Serial Register D
REGISTER
ADDRESS
A4 - A0
BITS
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
<CUSTOM A>
CUSTOM PATTERN (LOWER 11 BITS)
0B
D10 - D0
<CUSTOM A> Lower 11 bits of custom pattern <DATAOUT10>…<DATAOUT0>
Table 15. Serial Register E
REGISTER
ADDRESS
A4 - A0
0C
BITS
D10
D9
D8
<FINE GAIN>
FINE GAIN CONTROL (1 dB to 6 dB)
D7
D6
0
D5
0
D4
D3
D2
D1
D0
<CUSTOM B>
CUSTOM PATTERN (UPPER 5 BITS)
0
D4 - D0
<CUSTOM B> Upper 5 bits of custom pattern <DATAOUT15>…<DATAOUT11>
D10-D8
<FINE GAIN> Fine gain control
000
0 dB gain (Full-scale range = 2.00 Vpp)
001
1 dB gain (Full-scale range = 1.78 Vpp)
010
2 dB gain (Full-scale range = 1.59 Vpp)
011
3 dB gain (Full-scale range = 1.42 Vpp)
100
4 dB gain (Full-scale range = 1.26 Vpp)
101
5 dB gain (Full-scale range = 1.12 Vpp)
110
6 dB gain (Full-scale range = 1.00 Vpp)
Table 16. Serial Register F
REGISTER
ADDRESS
A4 - A0
0D
BITS
D10
<OVRD>
OVER-RIDE
BITE
D9
D8
0
0
D7
BYTE-WISE
OR
BIT-WISE
D6
MSB OR
LSB FIRST
D5
D4
D3
D2
D1
D0
<COARSE
GAIN>
COURSE
GAIN
ENABLE
FALLING
OR RISING
BIT CLOCK
CAPTURE
EDGE
0
14-BIT OR
16-BIT
SERIALIZE
DDR OR
SDR BIT
CLOCK
1-WIRE OR
2-WIRE
INTERFACE
D0
Interface selection
0
1 wire interface
1
2 wire interface
D1
Bit clock selection (only in 2-wire interface)
0
DDR bit clock
1
SDR bit clock
D2
Serialization selection
0
12X serialization
1
14X serialization
D4
Bit clock capture edge (only when SDR bit clock is selected, D1=1)
0
Capture data with falling edge of bit clock
1
Capture data with rising edge of bit clock
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D5
<COARSE GAIN>Coarse gain control
0
0 dB coarse gain
1
3.5dB coarse gain (Full-scale range = 1.34 Vpp)
D6
MSB or LSB first selection
0
MSB First
1
LSB First
D7
Byte/bit wise outputs (only when 2-wire is selected)
0
Byte wise
1
Bit wise
D10
<OVRD> Over-ride bit. All the functions in register 0x0D can also be controlled using the
parallel control pins. By setting bit <OVRD> =1, the contents of register 0x0D will over-ride
the settings of the parallel pins.
0
Disable over-ride
1
Enable over-ride
Table 17. Serial Register G
REGISTER
ADDRESS
A4 - A0
10
BITS
D10
D9
D8
D7
D6
D5
<TERM CLK>
LVDS INTERNAL TERMINATION BIT AND WORD CLOCKS
D4
D3
D2
<LVDS CURR>
LVDS CURRENT SETTINGS
D0
<CURR DOUBLE> LVDS current double for data outputs
0
Nominal LVDS current, as set by <D5…D2>
1
Double the nominal value
D1
<CURR DOUBLE> LVDS current double for bit and word clock outputs
0
Nominal LVDS current, as set by <D5…D2>
1
Double the nominal value
D3-D2
<LVDS CURR> LVDS current setting for data outputs
00
3.5 mA
01
4 mA
10
2.5 mA
11
3 mA
D5-D4
<LVDS CURR> LVDS current setting for bit and word clock outputs
00
3.5 mA
01
4 mA
10
2.5 mA
11
3 mA
D10-D6
<TERM CLK> LVDS internal termination for bit and word clock outputs
00000
No internal termination
00001
166 Ω
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D1
D0
<LVDS DOUBLE>
LVDS CURRENT DOUBLE
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00010
200 Ω
00100
250 Ω
01000
333 Ω
10000
500 Ω
Any combination of above bits can also be programmed, resulting in a parallel combination
of the selected values. For example, 00101 is the parallel combination of 166||250 = 100 Ω
100 Ω
00101
Table 18. Serial Register H
REGISTER
ADDRESS
A4 - A0
11
BITS
D10
D9
WORD-WISE CONTROL
D8
D7
D6
D5
0
0
0
0
D4
D3
D2
D1
D0
<TERM DATA>
LVDS INTERNAL TERMINATION - DATA OUTPUTS
D4-D0
<TERM DATA> LVDS internal termination for data outputs
00000
No internal termination
00001
166 Ω
00010
200 Ω
00100
250 Ω
01000
333 Ω
10000
500 Ω
Any combination of above bits can also be programmed, resulting in a parallel combination
of the selected values. For example, 00101 is the parallel combination of 166||250 = 100 Ω
00101
100 Ω
D10-D9
Only when 2-wire interface is selected
00
Byte-wise or bit-wise output, 1x frame clock
11
Word-wise outp