TI ADS6445IRGCR

ADS6445, ADS6444
ADS6443, ADS6442
www.ti.com
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
QUAD CHANNEL, 14-BIT, 125/105/80/65 MSPS ADC WITH SERIAL LVDS OUTPUTS
Check for Samples: ADS6445, ADS6444, ADS6443, ADS6442
FEATURES
•
1
•
•
•
•
•
•
•
•
•
•
Maximum Sample Rate: 125 MSPS
14-Bit Resolution with No Missing Codes
Simultaneous Sample and Hold
3.5dB Coarse Gain and up to 6dB
Programmable Fine Gain for SFDR/SNR
Trade-Off
Serialized LVDS Outputs with Programmable
Internal Termination Option
Supports Sine, LVCMOS, LVPECL, LVDS Clock
Inputs and Amplitude down to 400 mVPP
Internal Reference with External Reference
Support
No External Decoupling Required for
References
3.3-V Analog and Digital Supply
64 QFN Package (9 mm × 9 mm)
•
Pin Compatible 12-Bit Family (ADS642X SLAS532A)
Feature Compatible Dual Channel Family
(ADS624X - SLAS542A, ADS644X - SLAS543A)
APPLICATIONS
•
•
•
•
Base-Station IF Receivers
Diversity Receivers
Medical Imaging
Test Equipment
Table 1. ADS64XX Quad Channel Family
125 MSPS
105 MSPS
80 MSPS
65 MSPS
ADS644X
14 Bit
ADS6445
ADS6444
ADS6443
ADS6442
ADS642X
12 Bit
ADS6425
ADS6424
ADS6423
ADS6422
Table 2. Performance Summary
Fin = 10MHz (0 dB gain)
SFDR, dBc
Fin = 170MHz (3.5 dB gain)
SINAD, dBFS
ADS6445
ADS6444
ADS6443
ADS6442
87
91
92
93
79
83
84
84
Fin = 10MHz (0 dB gain)
73.4
73.4
74.2
74.3
Fin = 170MHz (3.5 dB gain)
68.3
69.3
69.4
70
420
340
300
265
Power, per channel, mW
DESCRIPTION
The ADS6445/ADS6444/ADS6443/ADS6442 (ADS644X) is a family of high performance 14-bit 125/105/80/65
MSPS quad channel A-D converters. Serial LVDS data outputs reduce the number of interface lines, resulting in
a compact 64-pin QFN package (9 mm × 9 mm) that allows for high system integration density. The device
includes 3.5dB coarse gain option that can be used to improve SFDR performance with little degradation in SNR.
In addition to the coarse gain, fine gain options also exist, programmable in 1dB steps up to 6dB.
The output interface is 2-wire, where each ADC data is serialized and output over two LVDS pairs. This makes it
possible to halve the serial data rate (compared to a 1-wire interface) and restrict it to less than 1Gbps easing
receiver design. The ADS644X also includes the traditional 1-wire interface that can be used at lower sampling
frequencies.
An internal phase lock loop (PLL) multiplies the incoming ADC sampling clock to derive the bit clock. The bit
clock is used to serialize the 14-bit data from each channel. In addition to the serial data streams, the frame and
bit clocks are also transmitted as LVDS outputs.
The LVDS output buffers have features such as programmable LVDS currents, current doubling modes and
internal termination options. These can be used to widen eye-openings and improve signal integrity, easing
capture by the receiver.
The ADC channel outputs can be transmitted either as MSB or LSB first and 2s complement or straight binary.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007–2009, Texas Instruments Incorporated
ADS6445, ADS6444
ADS6443, ADS6442
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
DESCRIPTION (CONTINUED)
LVDD
LGND
CAP
AVDD
AGND
The ADS644X has internal references, but can also support an external reference mode. The device is specified
over the industrial temperature range (–40°C to 85°C).
CLKP
CLKM
BIT Clock
DCLKP
DCLKM
FRAME Clock
FCLKP
FCLKM
PLL
INA_P
SHA
INA_M
INB_P
SHA
14-Bit
ADC
Digital
Encoder
and
Serializer
14-Bit
ADC
Digital
Encoder
and
Serializer
14-Bit
ADC
Digital
Encoder
and
Serializer
14-Bit
ADC
Digital
Encoder
and
Serializer
INB_M
INC_P
SHA
INC_M
IND_P
SHA
VCM
DA1_P
DA1_M
DB0_P
DB0_M
DB1_P
DB1_M
DC0_P
DC0_M
DC1_P
DC1_M
DD0_P
DD0_M
DD1_P
DD1_M
REFM
REFP
IND_M
DA0_P
DA0_M
Reference
Parallel
Interface
Serial
Interface
2
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SCLK
RESET
SEN
SDATA
CFG4
CFG3
CFG1
CFG2
PDN
ADS644x
B0199-03
Copyright © 2007–2009, Texas Instruments Incorporated
Product Folder Link(s): ADS6445, ADS6444 ADS6443, ADS6442
ADS6445, ADS6444
ADS6443, ADS6442
www.ti.com
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
PACKAGE/ORDERING INFORMATION (1)
PRODUCT
PACKAGE-LEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ADS6445
QFN-64 (2)
RGC
–40°C to 85°C
AZ6445
ADS6444
QFN-64 (2)
RGC
–40°C to 85°C
AZ6444
ADS6443
QFN-64 (2)
RGC
–40°C to 85°C
AZ6443
ADS6442
QFN-64 (2)
RGC
–40°C to 85°C
AZ6442
(1)
(2)
ORDERING NUMBER
TRANSPORT
MEDIA,
QUANTITY
ADS6445IRGCT
250, Tape/reel
ADS6445IRGCR
2000, Tape/reel
ADS6444IRGCT
250, Tape/reel
ADS6444IRGCR
2000, Tape/reel
ADS6443IRGCT
250, Tape/reel
ADS6443IRGCR
2000, Tape/reel
ADS6442IRGCT
250, Tape/reel
ADS6442IRGCR
2000, Tape/reel
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
For thermal pad size on the package, see the mechanical drawings at the end of this data sheet. θJA = 23.17 °C/W (0 LFM air flow), θJC
= 22.1 °C/W when used with 2 oz. copper trace and pad soldered directly to a JEDEC standard four layer 3 in. x 3 in. PCB.
ABSOLUTE MAXIMUM RATINGS (1)
VALUE
UNIT
AVDD
Supply voltage range
–0.3 to 3.9
V
LVDD
Supply voltage range
–0.3 to 3.9
V
Voltage between AGND and DGND
–0.3 to 0.3
V
Voltage between AVDD to LVDD
–0.3 to 3.3
V
Voltage applied to external pin, VCM
–0.3 to 2.0
V
Voltage applied to analog input pins
–0.3V to minimum ( 3.6, AVDD + 0.3V)
V
TA
Operating free-air temperature range
–40 to 85
°C
TJ
Operating junction temperature range
125
°C
Tstg
Storage temperature range
–65 to 150
°C
220
°C
Lead temperature 1,6 mm (1/16") from the case for 10 seconds
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Copyright © 2007–2009, Texas Instruments Incorporated
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3
ADS6445, ADS6444
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SLAS531B – MAY 2007 – REVISED DECEMBER 2009
www.ti.com
RECOMMENDED OPERATING CONDITIONS
over operating free-air temperature range (unless otherwise noted)
MIN
NOM MAX
UNIT
SUPPLIES
AVDD
Analog supply voltage
3.0
3.3
3.6
V
LVDD
LVDS Buffer supply voltage
3.0
3.3
3.6
V
ANALOG INPUTS
Differential input voltage range
2
Input common-mode voltage
Vpp
1.5 ±0.1
Voltage applied on VCM in external reference mode
1.45
1.50
V
1.55
V
CLOCK INPUT
Input clock sample rate, Fsrated
ADS6445
5
125
ADS6444
5
105
ADS6443
5
80
ADS6442
5
Sine wave, ac-coupled
Input clock amplitude differential (VCLKP – VCLKM)
0.4
LVPECL, ac-coupled
65
1.5
± 0.8
LVDS, ac-coupled
Vpp
± 0.35
LVCMOS, ac-coupled
Input Clock duty cycle
MSPS
3.3
35%
50%
65%
DIGITAL OUTPUTS
Without internal termination
CLOAD
Maximum external load capacitance from each output pin
to DGND
RLOAD
Differential load resistance (external) between the LVDS output pairs
TA
Operating free-air temperature
4
Submit Documentation Feedback
5
With internal termination
pF
10
Ω
100
–40
85
°C
Copyright © 2007–2009, Texas Instruments Incorporated
Product Folder Link(s): ADS6445, ADS6444 ADS6443, ADS6442
ADS6445, ADS6444
ADS6443, ADS6442
www.ti.com
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
ELECTRICAL CHARACTERISTICS
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3V, maximum rated sampling frequency, 50% clock duty cycle, –1dBFS differential analog input, internal reference
mode (unless otherwise noted).
ADS6445
Fs = 125 MSPS
PARAMETER
MIN
RESOLUTION
TYP
ADS6444
Fs = 105 MSPS
MAX
MIN
TYP
ADS6443
Fs = 80 MSPS
MAX
MIN
TYP
ADS6442
Fs = 65 MSPS
MAX
MIN
TYP
UNIT
MAX
14
14
14
14
Bits
2.0
2.0
2.0
2.0
VPP
7
7
7
7
pF
Analog input bandwidth
500
500
500
500
MHz
Analog input common mode
current (per input pin of
each ADC)
155
130
100
81
μA
ANALOG INPUT
Differential input voltage
range
Differential input
capacitance
REFERENCE VOLTAGES
VREFB
Internal reference bottom
voltage
1.0
1.0
1.0
1.0
V
VREFT
Internal reference top
voltage
2.0
2.0
2.0
2.0
V
ΔVREF
Internal reference error
(VREFT–VREFB)
VCM
Common mode output
voltage
1.5
1.5
1.5
1.5
V
VCM output current
capability
±4
±4
±4
±4
mA
-15
±2
15
-15
±2
15
-15
±2
15
-15
±2
15
mV
DC ACCURACY
No missing codes
EO
Offset error, across devices
and across channels within
a device
Assured
–15
Offset error temperature
coefficient, across devices
and across channels within
a device
±2
Assured
15
–15
0.05
±2
Assured
15
–15
0.05
Assured
±2
15
–15
0.05
±2
15
0.05
mV
mV/°C
There are two sources of
gain error - internal
reference inaccuracy and
channel gain error
EGREF
Gain error due to internal
reference inaccuracy alone,
(ΔVREF /2.0) %
-0.75
Reference gain error
temperature coefficient
EGCHAN
Gain error of channel alone,
across devices and across
channels within a device (1)
Differential nonlinearity, Fin
= 50 MHz
INL
Integral nonlinearity, Fin =
50 MHz
PSRR
DC power supply rejection
ratio
0.75
-0.75
0.0125
–1
Channel gain error
temperature coefficient,
across devices and across
channels within a device
DNL
0.1
±0.3
0.1
0.75
-0.75
0.0125
1
–1
0.005
0.1
0.75
-0.75
0.0125
±0.3 1
–1
0.005
0.1
0.75
Δ%/°C
0.0125
±0.3 1
–1
0.005
±0.3
% FS
1
% FS
Δ%/°C
0.005
–0.9
±0.6
2.0
–0.9
±0.6
2.0
–0.9
±0.5
1.8
–0.9
±0.5
1.8
LSB
-5
±3
5
-0.5
±3
5
4.5
±2
4.5
4.5
±2
4.5
LSB
0.5
0.5
0.5
0.5
mV/V
POWER SUPPLY
ICC
Total supply current
502
410
360
320
mA
IAVDD
Analog supply current
410
322
280
245
mA
(1)
This is specified by design and characterization; it is not tested in production.
Copyright © 2007–2009, Texas Instruments Incorporated
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Product Folder Link(s): ADS6445, ADS6444 ADS6443, ADS6442
5
ADS6445, ADS6444
ADS6443, ADS6442
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3V, maximum rated sampling frequency, 50% clock duty cycle, –1dBFS differential analog input, internal reference
mode (unless otherwise noted).
PARAMETER
ADS6445
Fs = 125 MSPS
MIN
ILVDD
LVDS supply current
MAX
92
Total power
Power down (with input
clock stopped)
6
TYP
ADS6444
Fs = 105 MSPS
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MIN
TYP
ADS6443
Fs = 80 MSPS
MAX
88
MIN
TYP
ADS6442
Fs = 65 MSPS
MAX
80
MIN
TYP
UNIT
MAX
75
mA
1.65
1.8
1.35
1.5
1.18
1.3
1.05
1.2
W
77
150
77
150
77
150
77
150
mW
Copyright © 2007–2009, Texas Instruments Incorporated
Product Folder Link(s): ADS6445, ADS6444 ADS6443, ADS6442
ADS6445, ADS6444
ADS6443, ADS6442
www.ti.com
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
ELECTRICAL CHARACTERISTICS
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3 V, maximum rated sampling frequency, 50% clock duty cycle, –1dBFS differential analog input, internal reference
mode (unless otherwise noted).
PARAMETER
ADS6445
Fs = 125 MSPS
TEST CONDITIONS
MIN
TYP
MAX
ADS6444
Fs = 105 MSPS
MIN
TYP
MAX
ADS6443
Fs = 80 MSPS
MIN
TYP
MAX
ADS6442
Fs = 65 MSPS
MIN
TYP
UNIT
MAX
DYNAMIC AC CHARACTERISTICS
Fin = 10 MHz
Fin = 50 MHz
68.5
Fin = 70 MHz
SNR
Signal to
noise ratio
Fin = 230
MHz
74.5
73.8
70.5
74
73
73.4
73.6
72.2
72.7
72.8
69.9
70.2
70.5
70.7
3.5 dB
Coarse gain
69.4
69.7
69.7
70.2
0 dB gain
68.7
68.8
68.1
69.2
3.5 dB
Coarse gain
68.1
68.2
68.2
68.9
73.4
73.4
72.3
71.7
68
Fin = 70 MHz
71.2
Fin = 100 MHz
70
73.7
73.2
71.8
72
72.2
72
0 dB gain
67.9
69.8
69.9
70.3
3.5 dB
Coarse gain
68.3
69.3
69.4
70
0 dB gain
67.8
67.7
67.6
68.3
3.5 dB
Coarse gain
67.9
67.6
68.1
68.4
Inputs tied to common-mode
1.05
1.05
1.05
1.05
87
91
81
80
Fin = 10 MHz
Fin = 50 MHz
73
Fin = 70 MHz
78
Fin = 100 MHz
Fin = 170
MHz
Fin = 230
MHz
86
88
84
82
0 dB gain
76
79
80
81
3.5 dB
Coarse gain
79
83
84
84
0 dB gain
77
77
78
79
3.5 dB
Coarse gain
80
80
82
82
93
94
87
88
73
87
Fin = 100 MHz
Fin = 230
MHz
dBc
97
90
79
92
88
90
92
89
90
87
87
0 dB gain
83
84
86
86
3.5 dB
Coarse gain
85
86
88
88
0 dB gain
80
81
82
83
3.5 dB
Coarse gain
82
83
84
85
Copyright © 2007–2009, Texas Instruments Incorporated
74
96
77
LSB
88
86
Fin = 70 MHz
Fin = 170
MHz
79
86
Fin = 50 MHz
dBFS
93
87
81
Fin = 10 MHz
74
92
77
dBFS
74.3
73.5
73
Fin = 230
MHz
68.5
74.2
69.5
72
SINAD
Signal to
noise and
Fin = 170
distortion ratio MHz
HD2
Second
harmonic
69
74.4
70
72.1
Fin = 50 MHz
SFDR
Spurious free
dynamic
range
73.2
0 dB gain
Fin = 10 MHz
RMS
Output noise
73.8
73.1
72.7
Fin = 100 MHz
Fin = 170
MHz
73.7
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dBc
7
ADS6445, ADS6444
ADS6443, ADS6442
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3 V, maximum rated sampling frequency, 50% clock duty cycle, –1dBFS differential analog input, internal reference
mode (unless otherwise noted).
PARAMETER
ADS6445
Fs = 125 MSPS
TEST CONDITIONS
MIN
Fin = 10 MHz
Fin = 50 MHz
HD3
Third
harmonic
THD
Total
harmonic
distortion
Cross-talk
8
TYP
91
80
Fin = 100 MHz
MIN
TYP
77
87.5
MAX
ADS6442
Fs = 65 MSPS
MIN
92
TYP
88
86
86
88
84
82
0 dB gain
76
79
80
81
3.5 dB
Coarse gain
79
83
84
84
0 dB gain
77
77
78
79
3.5 dB
Coarse gain
80
80
82
82
Fin = 10 MHz
91
91
94
95
Fin = 50 MHz
87
87
92
93
Fin = 100 MHz
90
91
92
92
Fin = 170 MHz
88
88
90
90
Fin = 230 MHz
87
87
87
87
Fin = 10 MHz
86
89.5
90
Fin = 50 MHz
71
80
Fin = 70 MHz
75
72
85.5
79
86
83
80.5
Fin = 170 MHz
73.5
77
78.5
79.5
Fin = 230 MHz
74
75
76
77
11.1
11.3
11.9
dBc
85.6
84.5
11.7
dBc
91
77
Fin = 100 MHz
11.0
UNIT
MAX
93
79
86
Fin = 170
MHz
74
MAX
ADS6443
Fs = 80 MSPS
81
11.4
dBc
12
Bits
11.7
F1= 46.09 MHz,
F2 = 50.09 MHz
88
90
96
100
F1= 185.09 MHz,
F2 = 190.09 MHz
86
88
93
96
Near channel
Cross-talk signal
frequency = 10 MHz
90
92
94
100
Far channel
Cross-talk signal
frequency = 10 MHz
103
105
106
108
1
1
1
1
Clock
cycles
35
35
35
35
dBc
Recovery to within 1% (of final
Input overload
value) for 6-dB overload with
recovery
sine wave input
AC PSRR
Power Supply
Rejection
Ratio
MIN
81
78
ENOB
Fin = 50 MHz
Effective
number of bits Fin = 70 MHz
IMD
2-Tone
intermodulatio
n distortion
MAX
87
Fin = 70 MHz
Fin = 230
MHz
Worst
harmonic
(other than
HD2, HD3)
73
TYP
ADS6444
Fs = 105 MSPS
dBFS
dBc
< 100 MHz signal, 100 mVPP
on AVDD supply
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Copyright © 2007–2009, Texas Instruments Incorporated
Product Folder Link(s): ADS6445, ADS6444 ADS6443, ADS6442
ADS6445, ADS6444
ADS6443, ADS6442
www.ti.com
SLAS531B – MAY 2007 – REVISED DECEMBER 2009
DIGITAL CHARACTERISTICS
The DC specifications refer to the condition where the digital outputs are not switching, but are permanently at a valid logic
level 0 or 1 AVDD = LVDD = 3.3V, IO = 3.5mA, RLOAD = 100Ω (1).
All LVDS specifications are characterized, but not tested at production.
PARAMETER
ASD6445/ADS6444
ADS6443/ADS6442
TEST CONDITIONS
MIN
TYP
UNIT
MAX
DIGITAL INPUTS
High-level input voltage
2.4
V
Low-level input voltage
0.8
V
High-level input current
10
μA
Low-level input current
10
μA
4
pF
1375
mV
Input capacitance
DIGITAL OUTPUTS
High-level output voltage
Low-level output voltage
1025
Output differential voltage |VOD|
250
Output offset voltage VOS
Common-mode voltage of OUTP and OUTM
Output capacitance
Output capacitance inside the device, from either output to
ground
(1)
350
mV
450
mV
1200
mV
2
pF
IO refers to the LVDS buffer current setting, RLOAD is the external differential load resistance between the LVDS output pair.
Copyright © 2007–2009, Texas Instruments Incorporated
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9
ADS6445, ADS6444
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SLAS531B – MAY 2007 – REVISED DECEMBER 2009
www.ti.com
TIMING SPECIFICATIONS (1)
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3 V, maximum rated sampling frequency, sine wave input clock, 1.5 VPP clock amplitude, CL = 5 pF (2), IO = 3.5 mA,
RL = 100 Ω (3), no internal termination, unless otherwise noted.
PARAMETER
tJ
TEST
CONDITIONS
ADS6445
Fs = 125 MSPS
MIN
Aperture jitter Uncertainty in
the sampling
instant
ADS6444
Fs = 105 MSPS
TYP MAX
MIN
250
TYP
ADS6443
Fs = 80 MSPS
MAX
MIN
250
ADS6442
Fs = 65 MSPS
TYP MAX
MIN
250
TYP
UNIT
MAX
250
fs rms
INTERFACE: 2-wire, DDR bit clock,
14x serialization
tsu
Data setup
time (4) (5) (6)
From data
cross-over to
bit clock
cross-over
0.35
0.55
0.45
0.65
0.65
0.85
0.8
1.1
ns
th
Data hold
time (4) (5) (6)
From bit clock
cross-over to
data
cross-over
0.35
0.58
0.5
0.7
0.7
0.9
0.8
1.1
ns
Frame setup
time
From frame
clock rising
edge
cross-over to
bit clock rising
edge
cross-over
0.35
0.55
0.45
0.65
0.65
0.85
0.8
1.1
ns
th
Frame hold
time
From bit clock
falling edge
cross-over to
frame clock
falling edge
cross-over
0.35
0.58
0.5
0.7
0.7
0.9
0.8
1.1
ns
tpd_cl
Clock
propagation
delay (6)
Input clock
rising edge
cross-over to
frame clock
rising edge
cross-over
3.4
4.4
3.4
4.4
3.4
4.4
3.4
4.4
tsu
k
5.4
5.4
5.4
5.4
ns
Bit clock
cycle-cycle
jitter (5)
350
350
350
350
ps pp
Frame clock
cycle-cycle
jitter (5)
75
75
75
75
ps pp
Below specifications apply for 5 MSPS ≤ Fs ≤ 125 MSPS and
all interface options.
tA
(1)
(2)
(3)
(4)
(5)
(6)
10
Aperture
delay
Delay from
input clock
rising edge to
the actual
sampling
instant
Aperture
delay
variation
Channelchannel within
same device
1
2
–250
±80
3
1
2
3
1
2
3
1
2
3
ns
250 –250
±80
250
–250
±80
250
–250
±80
250
ps
Timing parameters are ensured by design and characterization and not tested in production.
CL is the external single-ended load capacitance between each output pin and ground.
Io refers to the LVDS buffer current setting; RL is the external differential load resistance between the LVDS output pair.
Timing parameters are measured at the end of a 2 inch pcb trace (100-Ω characteristic impedance) terminated by RLand CL.
Setup and hold time specifications take into account the effect of jitter on the output data and clock.
Refer to Output Timings in application section for timings at lower sampling frequencies and other interface options.
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TIMING SPECIFICATIONS (1) (continued)
Typical values are at 25°C, min and max values are across the full temperature range TMIN = –40°C to TMAX = 85°C, AVDD =
LVDD = 3.3 V, maximum rated sampling frequency, sine wave input clock, 1.5 VPP clock amplitude, CL = 5 pF (2), IO = 3.5 mA,
RL = 100 Ω (3), no internal termination, unless otherwise noted.
PARAMETER
ADC Latency
(7)
TEST
CONDITIONS
ADS6445
Fs = 125 MSPS
MIN
TYP MAX
Time for a
sample to
propagate to
ADC outputs,
see Figure 1
ADS6444
Fs = 105 MSPS
MIN
12
Time to valid
data after
coming out of
global power
down
Time to valid
data after input
Wake up time
clock is
re-started
Time to valid
data after
coming out of
channel
standby
TYP
MAX
ADS6443
Fs = 80 MSPS
MIN
12
TYP MAX
ADS6442
Fs = 65 MSPS
MIN
12
TYP
UNIT
MAX
Clock
cycles
12
100
100
100
100
μs
100
100
100
100
μs
200
200
200
200
Clock
cycles
tRISE
Data rise
time
From –100 mV
to +100 mV
50
100
200
50
100
50
100
200
50
100
200
ps
tFALL
Data fall time
From +100 mV
to –100 mV
50
100
200
50
100
50
100
200
50
100
200
ps
tRISE
Bit clock and
frame clock
rise time
From –100mV
to +100mV
50
100
200
50
100
50
100
200
50
100
200
ps
tFALL
Bit clock and
frame clock
fall time
From +100mV
to –100mV
50
100
200
50
100
50
100
200
50
100
200
ps
LVDS Bit
clock duty
cycle
45%
50%
55%
45%
50%
55%
45%
50%
55%
45%
50%
55%
LVDS Frame
clock duty
cycle
47%
50%
53%
47%
50%
53%
47%
50%
53%
47%
50%
53%
(7)
Note that the total latency = ADC latency + internal serializer latency. The serializer latency depends on the interface option selected as
shown in Table 27.
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Sample
N+13
Sample
N+12
Sample
N+11
Sample
N
Input
Signal
tA
Input
Clock
CLKM
CLKP
tPD_CLK
Latency 12 Clocks
DCLKP
Bit
Clock
DCLKM
Output
Data
DOM
DOP
D13 D12 D11 D10
D6
D5
D4
D3
D2
D1 D0 D13 D12 D11 D10
Sample N–1
Frame
Clock
D6
D5
D4
D3
D2
D1 D0
Sample N
FCLKM
FCLKP
T0105-04
Figure 1. Latency
DCLKP
Bit Clock
DCLKM
tsu
th
tsu
Output Data P
(differential)
DA, DB, DC, DD M
th
Dn+1
Dn
tsu
th
FCLKP
Frame Clock
FCLKM
Figure 2. LVDS Timings
12
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SLAS531B – MAY 2007 – REVISED DECEMBER 2009
DEVICE PROGRAMMING MODES
ADS644X offers flexibility with several programmable features that are easily configured.
The device can be configured independently using either parallel interface control or serial interface
programming.
In addition, the device supports a third configuration mode, where both the parallel interface and the serial control
registers are used. In this mode, the priority between the parallel and serial interfaces is determined by a priority
table (refer to Table 4). If this additional level of flexibility is not required, the user can select either the serial
interface programming or the parallel interface control.
USING PARALLEL INTERFACE CONTROL ONLY
To control the device using parallel interface, keep RESET tied to high (LVDD). Pins CFG1, CFG2, CFG3,
CFG4, PDN, SEN, SCLK, and SDATA are used to directly control certain functions of the ADC. After power-up,
the device will automatically get configured as per the parallel pin voltage settings (refer to Table 5 to Table 8)
and no reset is required. In this mode, SEN, SCLK, and SDATA function as parallel interface control pins.
Frequently used functions are controlled in this mode—output data interface and format, power down modes,
coarse gain and internal/external reference. The parallel pins can be configured using a simple resistor string
(with 10% tolerance resistors) as illustrated in Figure 3.
Table 3 has a description of the modes controlled by the parallel pins.
Table 3. Parallel Pin Definition
PIN
SEN
SCLK, SDATA
CONTROL FUNCTIONS
Coarse gain and internal/external reference.
Sync, deskew patterns and global power down.
PDN
Dedicated pin for global power down
CFG1
1-Wire/2-wire and DDR/SDR bit clock
CFG2
14x/16x Serialization and SDR bit clock capture edge
CFG3
Reserved function. Tie CFG3 to Ground.
CFG4
MSB/LSB First and data format.
USING SERIAL INTERFACE PROGRAMMING ONLY
In this mode, SEN, SDATA, and SCLK function as serial interface pins and are used to access the internal
registers of ADC. The registers must first be reset to their default values either by applying a pulse on RESET
pin or by a high setting on the <RST> bit (in register ). After reset, the RESET pin must be kept low.
The serial interface section describes the register programming and register reset in more detail.
Since the parallel pins (CFG1-4 and PDN) are not used in this mode, they must be tied to ground. The register
override bit <OVRD> - D10 in register 0x0D has to be set high to disable the control of parallel interface pins in
this serial interface control ONLY mode.
USING BOTH THE SERIAL INTERFACE AND PARALLEL CONTROLS
For increased flexibility, a combination of serial interface registers and parallel pin controls (CFG1-4 and PDN)
can also be used to configure the device.
The parallel interface control pins CFG1 to CFG4 and PDN are available. After power-up, the device will
automatically get configured as per the parallel pin voltage settings (refer to Table 5 to Table 11) and no reset is
required. A simple resistor string can be used as illustrated in Figure 3.
SEN, SDATA, and SCLK function as serial interface pins and are used to access the internal registers of ADC.
The registers must first be reset to their default values either by applying a pulse on RESET pin or by a high
setting on the <RST> bit (in register ). After reset, the RESET pin must be kept low.
The Serial Interface section describes the register programming and register reset in more detail.
Since some functions are controlled using both the parallel pins and serial registers, the priority between the two
is determined by a priority table (refer to Table 4).
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Table 4. Priority Between Parallel Pins and Serial Registers
PIN
FUNCTIONS SUPPORTED
PRIORITY
As described in Table 8 to
Table 11
Register bits can control the modes only if the register bit <OVRD> is high. If <OVRD> bit
is low, then the control voltage on these parallel pins determines the function.
PDN
Global Power Down
Register bit <PDN GLOBAL> controls global power down only if PDN pin is low. If PDN is
high, device is in global power down.
SEN
Serial Interface Enable
CFG1 to CFG4
Coarse gain is controlled by register bit <COARSE GAIN> only if the <OVRD> bit is high.
Else, device has 0 dB coarse gain.
Internal/External Reference setting is determined by register bit <REF>.
SCLK, SDATA
Serial Interface Clock and
Serial Interface Data pins
Register bits <PATTERNS> control the sync and deskew output patterns.
Power down is determined by bit <PDN GLOBAL>
LVDD
LVDD
(5/6) LVDD
R
(5/8) LVDD
GND
2R
(5/8) LVDD
3R
(5/6) LVDD
LVDD
GND
2R
LVDD
(3/8) LVDD
(3/6) LVDD
(3/8) LVDD
(3/6) LVDD
3R
3R
To SEN Pin
To CFGx Pins
GND
GND
Figure 3. Simple Scheme to Configure Parallel Pins
14
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DESCRIPTION OF PARALLEL PINS
Table 5. SCLK, SDATA Control Pins
SCLK
SDATA
LOW
LOW
NORMAL conversion.
DESCRIPTION
LOW
HIGH
SYNC – ADC outputs sync pattern on all channels. This pattern can be used by the receiver to align the
deserialized data to the frame boundary. See Capture Test Patterns for details.
HIGH
LOW
POWER DOWN – Global power down, all channels of the ADC are powered down, including internal references,
PLL and output buffers.
HIGH
HIGH
DESKEW – ADC outputs deskew pattern on all channels. This pattern can be used by the receiver to ensure
deserializer uses the right clock edge. See Capture Test Patterns for details.
Table 6. SEN Control Pin
SEN
0
DESCRIPTION
External reference and 0 dB coarse gain (full-scale = 2 VPP)
(3/8)LVDD
External reference and 3.5 dB coarse gain (full-scale = 1.34 VPP)
(5/8)LVDD
Internal reference and 3.5 dB coarse gain (full-scale = 1.34 VPP)
LVDD
Internal reference and 0 dB coarse gain (full-scale = 2 VPP)
Independent of the programming mode used, after power-up the parallel pins PDN, CFG1 to CFG4 will
automatically configure the device as per the voltage applied (refer to Table 7 to Table 11).
Table 7. PDN Control Pin
PDN
0
AVDD
DESCRIPTION
Normal operation
Power down global
Table 8. CFG1 Control Pin
CFG1
DESCRIPTION
0 (default)
+ 200mV
DDR Bit clock and 1-wire interface
(3/6) LVDD
+/- 200mV
Not used
(5/6) LVDD
+/- 200mV
SDR Bit clock and 2-wire interface
LVDD
- 200mV
DDR Bit clock and 2-wire interface
Table 9. CFG2 Control Pin
CFG2
DESCRIPTION
0 (default)
+ 200mV
14x Serialization and capture at falling edge of bit clock (only in 2-wire SDR bit clock mode)
(3/6) LVDD
+/- 200mV
16x Serialization and capture at falling edge of bit clock (only in 2-wire SDR bit clock mode)
(5/6) LVDD
+/- 200mV
16x Serialization and capture at rising edge of bit clock (only in 2-wire SDR bit clock mode)
LVDD
- 200mV
14x Serialization and capture at rising edge of bit clock (only in 2-wire SDR bit clock mode)
Table 10. CFG3 Control Pin
CFG3
RESERVED - TIE TO GROUND
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Table 11. CFG4 Control Pin
CFG4
DESCRIPTION
0 (default)
+ 200mV
MSB First and 2s complement
(3/6) LVDD
+/- 200mV
MSB First and offset binary
(5/6) LVDD
+/- 200mV
LSB First and offset binary
LVDD
- 200mV
LSB First and 2s complement
SERIAL INTERFACE
The ADC has a serial interface formed by pins SEN (serial interface enable), SCLK (serial interface clock),
SDATA (serial interface data) and RESET. Serial shift of bits into the device is enabled when SEN is low. Serial
data SDATA is latched at every falling edge of SCLK when SEN is active (low). The serial data is loaded into the
register at every 16th SCLK falling edge when SEN is low. In case the word length exceeds a multiple of 16 bits,
the excess bits are ignored. Data can be loaded in multiple of 16-bit words within a single active SEN pulse. The
interface can work with SCLK frequency from 20 MHz down to very low speeds (few hertz) and even with
non-50% duty cycle SCLK.
The first 5-bits of the 16-bit word are the address of the register while the next 11 bits are the register data.
Register Reset
After power-up, the internal registers must be reset to their default values. This can be done in one of two ways:
1. Either by applying a high-going pulse on RESET (of width greater than 10ns) OR
2. By applying software reset. Using the serial interface, set the <RST> bit in register 0x00 to high – this resets
the registers to their default values and then self-resets the <RST> bit to LOW.
When RESET pin is not used, it must be tied to LOW.
16
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