HITACHI HN58S65AT-15

HN58S65A Series
64 k EEPROM (8-kword × 8-bit)
Ready/Busy function
ADE-203-691A (Z)
Preliminary
Rev. 0.3
Nov. 1997
Description
The Hitachi HN58S65A series is electrically erasable and programmable ROM organized as 8192-word
× 8-bit. It has realized high speed, low power consumption and high reliability by employing advanced
MNOS memory technology and CMOS process and circuitry technology. They also have a 64-byte
page programming function to make their write operations faster.
Features
• Single supply: 2.2 to 3.6 V
• Access time: 150 ns (max)
• Power dissipation
 Active: 10 mW/MHz (typ)
 Standby: 36 µW (max)
• On-chip latches: address, data, CE, OE, WE
• Automatic byte write: 15 ms (max)
• Automatic page write (64 bytes): 15 ms (max)
• Ready/Busy
• Data polling and Toggle bit
• Data protection circuit on power on/off
• Conforms to JEDEC byte-wide standard
• Reliable CMOS with MNOS cell technology
• 105 erase/write cycles (in page mode)
• 10 years data retention
• Software data protection
• Industrial versions (Temperature range: – 40 to + 85˚C) are also available.
Preliminary: This document contains information on a new product. Specifications and information
contained herein are subject to change without notice.
HN58S65A Series
Ordering Information
Type No.
Access time
Package
HN58S65AT-15
150 ns
28-pin plastic TSOP(TFP-28DB)
Pin Arrangement
HN58S65AT Series
A2
A1
A0
I/O0
I/O1
I/O2
VSS
I/O3
I/O4
I/O5
I/O6
I/O7
CE
A10
15
16
17
18
19
20
21
22
23
24
25
26
27
28
14
13
12
11
10
9
8
7
6
5
4
3
2
1
(Top view)
Pin Description
Pin name
Function
A0 to A12
Address input
I/O0 to I/O7
Data input/output
OE
Output enable
CE
Chip enable
WE
Write enable
VCC
Power supply
VSS
Ground
RDY/Busy
Ready busy
NC
No connection
A3
A4
A5
A6
A7
A12
RDY/Busy
VCC
WE
NC
A8
A9
A11
OE
HN58S65A Series
Block Diagram
I/O0
VCC
to
I/O7
RDY/Busy
High voltage generator
VSS
I/O buffer
and
input latch
OE
CE
Control logic and timing
WE
A0
Y gating
Y decoder
to
A5
Address
buffer and
latch
Memory array
X decoder
A6
to
A12
Data latch
Operation Table
Operation
CE
OE
WE
RDY/Busy
I/O
Read
VIL
VIL
VIH
High-Z
Dout
Standby
VIH
×*
×
High-Z
High-Z
Write
VIL
VIH
VIL
High-Z to V OL
Din
Deselect
VIL
VIH
VIH
High-Z
High-Z
Write Inhibit
×
×
VIH
—
—
×
VIL
×
—
—
VIL
VIL
VIH
VOL
Dout (I/O7)
Data Polling
Notes: 1. × : Don’t care
1
HN58S65A Series
Absolute Maximum Ratings
Parameter
Symbol
Value
Power supply voltage relative to V SS
VCC
–0.6 to +7.0
Vin
1
–0.5* to +7.0*
Operating temperature range *
Topr
0 to +70
˚C
Storage temperature range
Tstg
–55 to +125
˚C
Input voltage relative to V SS
2
Unit
V
3
V
Notes: 1. Vin min : –3.0 V for pulse width ≤ 50 ns.
2. Including electrical characteristics and data retention.
3. Should not exceed VCC + 1.0 V.
Recommended DC Operating Conditions
Parameter
Symbol
Min
Typ
Max
Unit
Supply voltage
VCC
2.2
3.0
3.6
V
VSS
0
0
0
V
—
0.4
Input voltage
Operating temperature
1
VIL
–0.3*
V
VIH
VCC × 0.7
—
VCC + 0.3*
V
Topr
0
—
70
˚C
2
Notes: 1. VIL min: –1.0 V for pulse width ≤ 50 ns.
2. VIH max: V CC + 1.0 V for pulse width ≤ 50 ns.
DC Characteristics (Ta = 0 to + 70˚C, VCC = 2.2 to 3.6 V)
Parameter
Symbol
Min
Typ
Max
Unit
Test conditions
Input leakage current
I LI
—
—
2
µA
VCC = 5.5 V, Vin = 5.5 V
Output leakage current
I LO
—
—
2
µA
VCC = 5.5 V, Vout = 5.5/0.4 V
Standby V CC current
I CC1
—
1 to 2
3.5
µA
CE = VCC
I CC2
—
—
500
µA
CE = VIH
I CC3
—
—
6
mA
Iout = 0 mA, Duty = 100%,
Cycle = 1 µs at VCC = 3.6 V
—
—
12
mA
Iout = 0 mA, Duty = 100%,
Cycle = 150 ns at VCC = 3.6 V
—
0.4
V
I OL = 1.0 mA
—
V
I OH = –100 µA
Operating VCC current
Output low voltage
VOL
—
Output high voltage
VOH
VCC × 0.8 —
HN58S65A Series
Capacitance (Ta = 25˚C, f = 1 MHz)
Parameter
Input capacitance
Output capacitance
Note:
Symbol
1
Cin*
Cout*
1
Min
Typ
Max
Unit
Test conditions
—
—
6
pF
Vin = 0 V
—
—
12
pF
Vout = 0 V
1. This parameter is sampled and not 100% tested.
AC Characteristics (Ta = 0 to + 70˚C, VCC = 2.2 to 3.6 V)
Test Conditions
•
•
•
•
•
Input pulse levels : 0.4 V to 2.4 V (VCC = 2.7 to 3.6 V), 0.4 V to 1.9 V (VCC = 2.2 to 2.7 V)
Input rise and fall time : ≤ 5 ns
Input timing reference levels : 0.8, 1.8 V
Output load : 1TTL Gate +100 pF
Output reference levels : 1.5 V, 1.5 V (VCC = 2.7 to 3.6 V)
1.1 V, 1.1 V (VCC = 2.2 to 2.7 V)
Read Cycle
HN58S65A
-15
Parameter
Symbol
Min
Max
Unit
Test conditions
Address to output delay
t ACC
—
150
ns
CE = OE = VIL, WE = VIH
CE to output delay
t CE
—
150
ns
OE = VIL, WE = VIH
OE to output delay
t OE
10
80
ns
CE = VIL, WE = VIH
t OH
0
—
ns
CE = OE = VIL, WE = VIH
t DF
0
80
ns
CE = VIL, WE = VIH
Address to output hold
1
OE (CE) high to output float*
HN58S65A Series
Write Cycle
Parameter
Symbol
Min*2
Typ
Max
Unit
Address setup time
t AS
0
—
—
ns
Address hold time
t AH
150
—
—
ns
CE to write setup time (WE controlled)
t CS
0
—
—
ns
CE hold time (WE controlled)
t CH
0
—
—
ns
WE to write setup time (CE controlled)
t WS
0
—
—
ns
WE hold time (CE controlled)
t WH
0
—
—
ns
OE to write setup time
t OES
0
—
—
ns
OE hold time
t OEH
0
—
—
ns
Data setup time
t DS
150
—
—
ns
Data hold time
t DH
0
—
—
ns
WE pulse width (WE controlled)
t WP
200
—
—
ns
CE pulse width (CE controlled)
t CW
200
—
—
ns
Data latch time
t DL
200
—
—
ns
Byte load cycle
t BLC
0.4
—
30
µs
Byte load window
t BL
100
—
—
µs
3
Write cycle time
t WC
—
—
15*
Time to device busy
t DB
120
—
—
ns
—
—
ns
Write start time
t DW
0*
4
Test
conditions
ms
Notes: 1. t DF is defined as the time at which the outputs achieve the open circuit conditions and are no
longer driven.
2. Use this device in longer cycle than this value.
3. t WC must be longer than this value unless polling techniques or RDY/Busy are used. This
device automatically completes the internal write operation within this value.
4. Next read or write operation can be initiated after tDW if polling techniques or RDY/Busy are
used.
5. A6 through A12 are page addresses and these addresses are latched at the first falling edge
of WE.
6. A6 through A12 are page addresses and these addresses are latched at the first falling edge
of CE.
7. See AC read characteristics.
HN58S65A Series
Timing Waveforms
Read Timing Waveform
Address
tACC
CE
tOH
tCE
OE
tDF
tOE
WE
Data Out
High
Data out valid
HN58S65A Series
Byte Write Timing Waveform(1) (WE Controlled)
tWC
Address
tCS
tAH
tCH
CE
tAS
tBL
tWP
WE
tOES
tOEH
OE
tDS
tDH
Din
tDW
RDY/Busy
High-Z
tDB
High-Z
HN58S65A Series
Byte Write Timing Waveform(2) (CE Controlled)
Address
tWS
tAH
tBL
tWC
tCW
CE
tAS
tWH
WE
tOES
tOEH
OE
tDS
tDH
Din
tDW
RDY/Busy
High-Z
tDB
High-Z
HN58S65A Series
Page Write Timing Waveform(1) (WE Controlled)
*5
Address
A0 to A12
tAS
tAH
tBL
tWP
WE
tDL
tCS
tBLC
tWC
tCH
CE
tOEH
tOES
OE
tDH
tDS
Din
RDY/Busy
High-Z
tDB
tDW
High-Z
HN58S65A Series
Page Write Timing Waveform(2) (CE Controlled)
*6
Address
A0 to A12
tAS
CE
tAH
tBL
tCW
tDL
tWS
tBLC
tWC
tWH
WE
tOEH
tOES
tDH
OE
tDS
Din
High-Z
RDY/Busy
tDW
tDB
High-Z
Data Polling Timing Waveform
Address
An
An
An
CE
WE
tOEH
tCE *7
tOES
OE
tDW
tOE*7
I/O7
Din X
Dout X
Dout X
tWC
HN58S65A Series
Toggle Bit
This device provide another function to determine the internal programming cycle. If the EEPROM is
set to read mode during the internal programming cycle, I/O6 will charge from “1” to “0” (toggling) for
each read. When the internal programming cycle is finished, toggling of I/O6 will stop and the device
can be accessible for next read or program.
Toggle Bit Waveform
Notes: 1.
2.
3.
4.
I/O6 beginning state is “1”.
I/O6 ending state will vary.
See AC read characteristics.
Any address location can be used, but the address must be fixed.
Next mode
*4
Address
tCE *3
CE
WE
*3
tOE
OE
tOEH
tOES
*1
I/O6
Din
Dout
Dout
tWC
*2
*2
Dout
Dout
tDW
HN58S65A Series
Software Data Protection Timing Waveform(1) (in protection mode)
VCC
CE
WE
tBLC
Address
Data
1555
AA
0AAA
55
1555
A0
tWC
Write address
Write data
Software Data Protection Timing Waveform(2) (in non-protection mode)
VCC
tWC
CE
WE
Address
Data
1555 0AAA 1555 1555 0AAA 1555
AA
55
80
AA 55
20
Normal active
mode
HN58S65A Series
Functional Description
Automatic Page Write
Page-mode write feature allows 1 to 64 bytes of data to be written into the EEPROM in a single write
cycle. Following the initial byte cycle, an additional 1 to 63 bytes can be written in the same manner.
Each additional byte load cycle must be started within 30 µs from the preceding falling edge of WE or
CE. When CE or W E is kept high for 100 µs after data input, the EEPROM enters write mode
automatically and the input data are written into the EEPROM.
Data Polling
Data polling indicates the status that the EEPROM is in a write cycle or not. If EEPROM is set to read
mode during a write cycle, an inversion of the last byte of data outputs from I/O7 to indicate that the
EEPROM is performing a write operation.
RDY/Busy Signal
RDY/B usy signal also allows status of the EEPROM to be determined. The RDY/Busy signal has high
impedance except in write cycle and is lowered to VOL after the first write signal. At the end of a write
cycle, the RDY/Busy signal changes state to high impedance.
WE, CE Pin Operation
During a write cycle, addresses are latched by the falling edge of WE or CE, and data is latched by the
rising edge of WE or CE.
Write/Erase Endurance and Data Retention Time
The endurance is 10 5 cycles in case of the page programming and 104 cycles in case of the byte
programming (1% cumulative failure rate). The data retention time is more than 10 years when a device
is page-programmed less than 104 cycles.
HN58S65A Series
Data Protection
1. Data Protection against Noise on Control Pins (CE, OE, WE) during Operation
During readout or standby, noise on the control pins may act as a trigger and turn the EEPROM to
programming mode by mistake.
To prevent this phenomenon, this device has a noise cancellation function that cuts noise if its width is
15 ns or less.
Be careful not to allow noise of a width of more than 15 ns on the control pins.
WE
CE
VIH
0V
VIH
OE
0V
15 ns max
2. Data protection at VCC on/off
When V CC is turned on or off, noise on the control pins generated by external circuits (CPU, etc) may
act as a trigger and turn the EEPROM to program mode by mistake. To prevent this unintentional
programming, the EEPROM must be kept in an unprogrammable state while the CPU is in an unstable
state.
Note: The EEPROM should be kept in unprogrammable state during V CC on/off by using CPU
RESET signal.
VCC
CPU
RESET
* Unprogrammable
* Unprogrammable
HN58S65A Series
(1) Protection by CE, OE, WE
To realize the unprogrammable state, the input level of control pins must be held as shown in the table
below.
CE
VCC
×
×
OE
×
VSS
×
WE
×
×
VCC
×: Don’t care.
VCC: Pull-up to VCC level.
VSS : Pull-down to V SS level.
3. Software data protection
To prevent unintentional programming caused by noise generated by external circuits, this device has
the software data protection function. In software data protection mode, 3 bytes of data must be input
before write data as follows. And these bytes can switch the non-protection mode to the protection
mode. SDP is enabled if onry the 3 byte code is input.
Address
Data
1555
AA
↓
↓
0AAA
55
↓
↓
1555
A0
↓
↓
Write address Write data } Normal data input
Software data protection mode can be canceled by inputting the following 6 bytes. After that, this
device turns to the non-protection mode and can write data normally. But when the data is input in the
canceling cycle, the data cannot be written.
Address
Data
1555
↓
0AAA
↓
1555
↓
1555
↓
0AAA
↓
1555
AA
↓
55
↓
80
↓
AA
↓
55
↓
20
The software data protection is not enabled at the shipment.
Note: There are some differences between Hitachi’s and other company’s for enable/disable sequence
of software data protection. If there are any questions , please contact with Hitachi sales
offices.
HN58S65A Series
Package Dimensions
HN58S65AT Series (TFP-28DB)
Unit: mm
8.00
8.20 Max
15
1
14
11.80
28
0.55
0.22 ± 0.08
0.10 M
0.20 ± 0.06
0.45 Max
0.80
13.40 ± 0.30
Dimension including the plating thickness
Base material dimension
+0.07
0.13 –0.08
0.10
0.17 ± 0.05
0.15 ± 0.04
1.20 Max
0° – 5°
0.50 ± 0.10
Hitachi Code
JEDEC Code
EIAJ Code
Weight (reference value)
TFP-28DB
—
—
0.23 g
HN58S65A Series
When using this document, keep the following in mind:
1. This document may, wholly or partially, be subject to change without notice.
2. All rights are reserved: No one is permitted to reproduce or duplicate, in any form, the whole or
part of this document without Hitachi’s permission.
3. Hitachi will not be held responsible for any damage to the user that may result from accidents or
any other reasons during operation of the user’s unit according to this document.
4. Circuitry and other examples described herein are meant merely to indicate the characteristics and
performance of Hitachi’s semiconductor products. Hitachi assumes no responsibility for any
intellectual property claims or other problems that may result from applications based on the
examples described herein.
5. No license is granted by implication or otherwise under any patents or other rights of any third party
or Hitachi, Ltd.
6. MEDICAL APPLICATIONS: Hitachi’s products are not authorized for use in MEDICAL
APPLICATIONS without the written consent of the appropriate officer of Hitachi’s sales company.
Such use includes, but is not limited to, use in life support systems. Buyers of Hitachi’s products are
requested to notify the relevant Hitachi sales offices when planning to use the products in
MEDICAL APPLICATIONS.
Hitachi, Ltd.
Semiconductor & IC Div.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100, Japan
Tel: Tokyo (03) 3270-2111
Fax: (03) 3270-5109
For further information write to:
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Semiconductor & IC Div.
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USA
Tel: 415-589-8300
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