Si5318 SONET/SDH P R E C I S I O N C L O C K M U L T I P L I E R I C Features Jitter generation as low as 0.7 psRMS (typ), compliant with GR-253-CORE OC-48 specifications No external components (other than a resistor and standard bypassing) Input clock ranges at 19, 39, 78, and 155 MHz Output clock ranges at 19 or 155 MHz Digital hold for loss of input clock Selectable loop bandwidth Loss-of-signal alarm output Low power Small size (9x9 mm) Si5318 Si5318 Ordering Information: Applications SONET/SDH line/port cards Optical modules Core switches Digital cross connects Terabit routers See page 26. Description The Si5318 is a precision clock multiplier designed to exceed the requirements of high-speed communication systems, including OC-48. The device phase locks to an input clock in the 19, 39, 78, or 155 MHz frequency range and generates a low jitter output clock in the 19 or 155 MHz range. Silicon Laboratories’ DSPLL® technology delivers all PLL functionality with unparalleled performance while eliminating external loop filter components, providing programmable loop parameters, and simplifying design. The Si5318 establishes a new standard in performance and integration for ultra-low-jitter clock generation. It operates from a single 3.3 V supply. Functional Block Diagram REXT VDD GND Biasing & Supply Regulation FXDDELAY CLKIN+ CLKIN– VALTIME LOS CAL_ACTV 2 ÷ ÷ Signal Detect 3 INFRQSEL[2:0] Rev. 1.0 4/05 DSPLL DH_ACTV ® 2 Calibration BWSEL[1:0] 2 CLKOUT+ CLKOUT– FRQSEL[1:0] RSTN/CAL DBLBW Copyright © 2005 by Silicon Laboratories Si5318 This information applies to a product under development. Its characteristics and specifications are subject to change without notice. Si5318 NOTES: 2 Rev. 1.0 Si5318 TA B L E O F C O N T E N TS Section Page 1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 2. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 2.1. DSPLL® . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 2.2. Clock Input and Output Rate Selection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14 2.3. PLL Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 2.4. Digital Hold of the PLL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 2.5. Hitless Recovery from Digital Hold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 2.6. Loss-of-Signal Alarm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 2.7. Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.8. PLL Self-Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.9. Bias Generation Circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17 2.10. Differential Input Circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.11. Differential Output Circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.12. Power Supply Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 2.13. Design and Layout Guidelines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 3. Pin Descriptions: Si5318 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 4. Ordering Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 5. Package Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 6. 9x9 mm CBGA Card Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .29 Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30 Rev. 1.0 3 Si5318 1. Electrical Specifications Table 1. Recommended Operating Conditions Parameter Ambient Temperature Si5318 Supply Voltage3 Symbol Test Condition Min1 Typ Max1 Unit TA –202 25 85 °C VDD33 3.135 3.3 3.465 V Notes: 1. All minimum and maximum specifications are guaranteed and apply across the recommended operating conditions. Typical values apply at nominal supply voltages and an operating temperature of 25 °C unless otherwise stated. 2. The Si5318 is guaranteed by design to operate at –40° C. All electrical specifications are guaranteed for an ambient temperature of –20 to 85° C. 3. The Si5318 specifications are guaranteed when using the recommended application circuit (including component tolerance) of Figure 5 on page 13. 4 Rev. 1.0 Si5318 CLKIN+ CLKIN– VIS A. Operation with Single-Ended Clock Input Note: When using single-ended clock sources, the unused clock input on the Si5318 must be ac-coupled to ground. CLKIN+ 0.5 VID CLKIN– (CLKIN+) – (CLKIN–) VID B. Operation with Differential Clock Input Note: Transmission line termination, when required, must be provided externally. Figure 1. CLKIN Voltage Characteristics 80% 20% tF tR Figure 2. Rise/Fall Time Measurement (C L K IN + ) – (C L K IN – ) 0 V tLOS Figure 3. Transitionless Period on CLKIN for Detecting a LOS Condition Rev. 1.0 5 Si5318 Table 2. DC Characteristics, VDD = 3.3 V (VDD33 = 3.3 V ±5%, TA = –20 to 85 °C) Parameter Supply Current Power Dissipation Using 3.3 V Supply Common Mode Input Voltage (CLKIN) 1,2,3 Symbol Test Condition Min Typ Max Unit IDD Clock in = 19.44 MHz Clock out = 155.52 MHz — 135 145 mA PD Clock in = 19.44 MHz Clock out = 155.52 MHz — 445 479 mW 1.0 1.5 2.0 V VICM Single-Ended Input Voltage2,3,4 (CLKIN) VIS See Figure 1A 200 — 5004 mVPP Differential Input Voltage Swing2,3,4 (CLKIN) VID See Figure 1B 200 — 5004 mVPP Input Impedance (CLKIN+, CLKIN–) RIN — 80 — kΩ Differential Output Voltage Swing (CLKOUT) VOD 100 Ω Load Line-to-Line 720 938 1155 mVPP Output Common Mode Voltage (CLKOUT) VOCM 100 Ω Load Line-to-Line 1.4 1.8 2.2 V Output Short to GND (CLKOUT) ISC(–) –60 — — mA Output Short to VDD25 (CLKOUT) ISC(+) — 15 — mA Input Voltage Low (LVTTL Inputs) VIL — — 0.8 V Input Voltage High (LVTTL Inputs) VIH 2.0 — — V Input Low Current (LVTTL Inputs) IIL — — 50 µA Input High Current (LVTTL Inputs) IIH — — 50 µA Internal Pulldowns (All LVTTL Inputs) Ipd — — 50 µA Input Impedance (LVTTL Inputs) RIN 50 — — kΩ Output Voltage Low (LVTTL Outputs) VOL IO = .5 mA — — 0.4 V Output Voltage High (LVTTL Outputs) VOH IO = .5 mA 2.0 — — V Notes: 1. The Si5318 device provides weak 1.5 V internal biasing that enables ac-coupled operation. 2. Clock inputs may be driven differentially or single-endedly. When driven single-endedly, the unused input should be ac coupled to ground. 3. Transmission line termination, when required, must be provided externally. 4. Although the Si5318 device can operate with input clock swings as high as 1500 mVPP, Silicon Laboratories recommends maintaining the input clock amplitude below 500 mVPP for optimal performance. 6 Rev. 1.0 Si5318 Table 3. AC Characteristics (VDD33 = 3.3 V ±5%, TA = –20 to 85 °C) Parameter Symbol Test Condition Min Typ Max Unit 19.436 38.872 77.744 155.48 — — — — 21.685 43.369 86.738 173.48 MHz Input Clock Frequency (CLKIN) INFRQSEL[2:0] = 001 INFRQSEL[2:0] = 010 INFRQSEL[2:0] = 011 INFRQSEL[2:0] = 100 fCLKIN Input Clock Rise Time (CLKIN) tR Figure 2 — — 11 ns Input Clock Fall Time (CLKIN) tF Figure 2 — — 11 ns CDUTY_IN 40 50 60 % fO_19 fO_155 — 19.436 155.48 — — — — 21.685 173.48 MHz Input Clock Duty Cycle CLKOUT Frequency Range* FRQSEL[1:0] = 00 (no output) FRQSEL[1:0] = 01 FRQSEL[1:0] = 10 CLKOUT Rise Time tR Figure 2; single-ended; after 3 cm of 50 Ω FR4 stripline — 213 260 ps CLKOUT Fall Time tF Figure 2; single-ended; after 3 cm of 50 Ω FR4 stripline — 191 260 ps CDUTY_O Differential: (CLKOUT+) – (CLKOUT–) 48 — 52 % 20 — — ns 6/ fo_155 8/ fo_155 s /fo_155 3 /fo_155 5/ 2 x fo_155 9 /4 x fo_155 9 /4 x fo_155 — — — — — — 0.09 12.0 — — 0.22 14.1 s CLKOUT Duty Cycle UT RSTN/CAL Pulse Width tRSTN Transitionless Period Required on CLKIN for Detecting a LOS Condition. INFRQSEL[2:0] = 001 INFRQSEL[2:0] = 010 INFRQSEL[2:0] = 011 INFRQSEL[2:0] = 100 INFRQSEL[2:0] = 101 INFRQSEL[2:0] = 110 tLOS Recovery Time for Clearing an LOS Condition VALTIME = 0 VALTIME = 1 tVAL Figure 3 4 Measured from when a valid reference clock is applied until the LOS flag clears 8 /fo_155 8 /fo_155 8/ fo_155 8 /fo_155 8 /fo_155 *Note: The Si5318 provides a 1/8, 1/4, 1/2, 1, 2, 4 or 8x clock frequency multiplication function. Rev. 1.0 7 Si5318 Table 4. AC Characteristics (PLL Performance Characteristics) (VDD33 = 3.3 V ±5%, TA = –20 to 85 °C) Parameter Symbol Test Condition Min Typ Max Unit JTOL(PP) f = 8 Hz 1000 — — ns f = 80 Hz 100 — — ns f = 800 Hz 10 — — ns JGEN(RMS) 12 kHz to 20 MHz — 0.87 1.2 ps JGEN(PP) 12 kHz to 20 MHz — 7.3 10.0 ps FBW BW = 800 Hz — 800 — Hz JP < 800 Hz — 0.0 0.05 dB f = 16 Hz 500 — — ns f = 160 Hz 50 — — ns f = 1600 Hz 5 — — ns JGEN(RMS) 12 kHz to 20 MHz — 0.78 1.2 ps JGEN(PP) 12 kHz to 20 MHz — 7.0 9.0 ps FBW BW = 1600 Hz — 1600 — Hz JP < 1600 Hz — 0.00 0.05 dB JTOL(PP) f = 16 Hz 1000 — — ns f = 160 Hz 100 — — ns f = 1600 Hz 10 — — ns JGEN(RMS) 12 kHz to 20 MHz — 0.82 1.0 ps JGEN(PP) 12 kHz to 20 MHz — 7.3 10.0 ps FBW BW = 1600 Hz — 1600 — Hz JP < 1600 Hz — 0.0 0.1 dB Wander/Jitter at 800 Hz Bandwidth (BWSEL[1:0] = 10 and DBLBW = 0) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 6) Wander/Jitter Transfer Peaking Wander/Jitter at 1600 Hz Bandwidth (BWSEL[1:0] = 10 and DBLBW = 1) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 6) Wander/Jitter Transfer Peaking Wander/Jitter at 1600 Hz Bandwidth (BWSEL[1:0] = 01 and DBLBW = 0) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 10) Wander/Jitter Transfer Peaking Notes: 1. Higher PLL bandwidth settings provide smaller clock output wander with temperature gradient. 2. For reliable device operation, temperature gradients should be limited to 10 °C/min. 3. Telcordia GR-1244-CORE requirements specify maximum phase transient slope during clock rearrangement in terms of nanoseconds per millisecond. The equivalent ps/µs unit is used here since the maximum phase transient magnitude for the Si5318 (tPT_MTIE) never reaches one nanosecond. 8 Rev. 1.0 Si5318 Table 4. AC Characteristics (PLL Performance Characteristics) (Continued) (VDD33 = 3.3 V ±5%, TA = –20 to 85 °C) Parameter Symbol Test Condition Min Typ Max Unit f = 32 Hz 500 — — ns f = 320 Hz 50 — — ns f = 3200 Hz 5 — — ns JGEN(RMS) 12 kHz to 20 MHz — 0.72 0.9 ps JGEN(PP) 12 kHz to 20 MHz — 6.8 10.0 ps FBW BW = 3200 Hz — 3200 — Hz JP < 3200 Hz — 0.05 0.1 dB JTOL(PP) f = 32 Hz 1000 — — ns f = 320 Hz 100 — — ns f = 3200 Hz 10 — — ns JGEN(RMS) 12 kHz to 20 MHz — 0.86 1.2 ps JGEN(PP) 12 kHz to 20 MHz — 7.7 10.0 ps FBW BW = 3200 Hz — 3200 — Hz JP < 3200 Hz — 0.05 0.1 dB f = 64 Hz 500 — — ns f = 640 Hz 50 — — ns f = 6400 Hz 5 — — ns JGEN(RMS) 12 kHz to 20 MHz — 0.7 1.0 ps JGEN(PP) 12 kHz to 20 MHz — 6.6 9.0 ps FBW BW = 6400 Hz — 6400 — Hz JP < 6400 Hz — 0.05 0.1 dB Wander/Jitter at 3200 Hz Bandwidth (BWSEL[1:0] = 01 and DBLBW = 1) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 6) Wander/Jitter Transfer Peaking Wander/Jitter at 3200 Hz Bandwidth (BWSEL[1:0] = 00 and DBLBW = 0) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 6) Wander/Jitter Transfer Peaking Wander/Jitter at 6400 Hz Bandwidth (BWSEL[1:0] = 00 and DBLBW = 1) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 6) Wander/Jitter Transfer Peaking Notes: 1. Higher PLL bandwidth settings provide smaller clock output wander with temperature gradient. 2. For reliable device operation, temperature gradients should be limited to 10 °C/min. 3. Telcordia GR-1244-CORE requirements specify maximum phase transient slope during clock rearrangement in terms of nanoseconds per millisecond. The equivalent ps/µs unit is used here since the maximum phase transient magnitude for the Si5318 (tPT_MTIE) never reaches one nanosecond. Rev. 1.0 9 Si5318 Table 4. AC Characteristics (PLL Performance Characteristics) (Continued) (VDD33 = 3.3 V ±5%, TA = –20 to 85 °C) Parameter Symbol Test Condition Min Typ Max Unit JTOL(PP) f = 64 Hz 1000 — — ns f = 640 Hz 100 — — ns f = 6400 Hz 10 — — ns JGEN(RMS) 12 kHz to 20 MHz — 1.0 1.4 ps JGEN(PP) 12 kHz to 20 MHz — 9.4 12.0 ps FBW BW = 6400 Hz — 6400 — Hz JP < 6400 Hz — 0.05 0.1 dB f = 128 Hz 500 — — ns f = 1280 Hz 50 — — ns f = 12800 Hz 5 — — ns JGEN(RMS) 12 kHz to 20 MHz — 0.74 1.0 ps JGEN(PP) 12 kHz to 20 MHz — 6.9 9.0 ps FBW BW = 12800 Hz — 12800 — Hz JP < 12800 Hz — 0.05 0.1 dB TAQ RSTN/CAL high to CAL_ACTV low, with valid clock input and VALTIME = 0 — 300 350 ms CCO_TG Stable Input Clock; Temperature Gradient <10 °C/min; 800 Hz Loop BW — — 50 ps/ °C/ min Wander/Jitter at 6400 Hz Bandwidth (BWSEL[1:0] = 11 and DBLBW = 0) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 6) Wander/Jitter Transfer Peaking Wander/Jitter at 12800 Hz Bandwidth (BWSEL[1:0] = 11 and DBLBW = 1) Jitter Tolerance (see Figure 7) CLKOUT RMS Jitter Generation CLKOUT Peak-Peak Jitter Generation Jitter Transfer Bandwidth (see Figure 6) Wander/Jitter Transfer Peaking Acquisition Time Clock Output Wander with Temperature Gradient 1,2 Notes: 1. Higher PLL bandwidth settings provide smaller clock output wander with temperature gradient. 2. For reliable device operation, temperature gradients should be limited to 10 °C/min. 3. Telcordia GR-1244-CORE requirements specify maximum phase transient slope during clock rearrangement in terms of nanoseconds per millisecond. The equivalent ps/µs unit is used here since the maximum phase transient magnitude for the Si5318 (tPT_MTIE) never reaches one nanosecond. 10 Rev. 1.0 Si5318 Table 4. AC Characteristics (PLL Performance Characteristics) (Continued) (VDD33 = 3.3 V ±5%, TA = –20 to 85 °C) Parameter Symbol Test Condition Min Typ Initial Frequency Accuracy in Digital Hold Mode (first 100 ms with supply voltage and temperature held constant) CDH_FA Stable Input Clock Selected until entering Digital Hold — — 10 ppm Clock Output Frequency Accuracy Over Temperature in Digital Hold Mode CDH_T Constant Supply Voltage — 16.7 30 ppm /°C Clock Output Frequency Accuracy Over Supply Voltage in Digital Hold Mode CDH_V33 Constant Temperature — — 250 ppm /V Clock Output Phase Step3 (See Figure 8) tPT_MTIE 0 200 ps — — — — 10 5 2.5 1.25 ps/ µs Clock Output Phase Step Slope3 (See Figure 8) BWSEL[1:0] = 11, DBLBW = 0 BWSEL[1:0] = 00, DBLBW = 0 BWSEL[1:0] = 01, DBLBW = 0 BWSEL[1:0] = 10, DBLBW = 0 mPT When hitlessly recovering –200 from Digital Hold mode When hitlessly recovering from Digital Hold mode 6400 Hz 3200 Hz 1600 Hz 800 Hz — — — — Max Unit Notes: 1. Higher PLL bandwidth settings provide smaller clock output wander with temperature gradient. 2. For reliable device operation, temperature gradients should be limited to 10 °C/min. 3. Telcordia GR-1244-CORE requirements specify maximum phase transient slope during clock rearrangement in terms of nanoseconds per millisecond. The equivalent ps/µs unit is used here since the maximum phase transient magnitude for the Si5318 (tPT_MTIE) never reaches one nanosecond. Rev. 1.0 11 Si5318 Table 5. Absolute Maximum Ratings Parameter 3.3 V DC Supply Voltage LVTTL Input Voltage Maximum Current any output PIN Operating Junction Temperature Storage Temperature Range ESD HBM Tolerance (100 pf, 1.5 kΩ) Symbol VDD33 VDIG TJCT TSTG Value –0.5 to 3.6 –0.3 to (VDD33 + 0.3) ±50 –55 to 150 –55 to 150 1.0 Unit V V mA °C °C kV Note: Permanent device damage may occur if the above Absolute Maximum Ratings are exceeded. Functional operation should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Table 6. Thermal Characteristics Parameter Thermal Resistance Junction to Ambient Symbol Test Condition Value Unit θJA Still Air 20 °C/W 0.00 -20.00 Phase Noise (dBc/Hz) -40.00 -60.00 -80.00 -100.00 -120.00 -140.00 -160.00 -180.00 10 1 10 2 10 3 10 4 10 5 10 6 10 7 10 8 Offset Frequency Figure 4. Typical Si5318 Phase Noise (CLKIN = 155.52 MHz, CLKOUT = 155.52 MHz, and Loop BW = 800 Hz) 12 Rev. 1.0 Si5318 3.3 V Supply Ferrite Bead 0.1 µF 2200 pF 22 pF 10 kΩ 1% GND VDD25 VDD33 REXT 33 µF 0.1 µF 0.1 µF CLKIN+ CLKOUT+ 100 Ω Input Clock Source 0.1 µF Input Clock Frequency Select (19, 38, 77, or 155 MHz) PLL Bandwidth Select Bandwidth Doubling Fixed Delay Mode Control LOS Validation Time Reset/Calibration Control Clock Output (19 or 155 MHz) CLKOUT– CLKIN- 0.1 µF INFRQSEL[2:0] BWSEL[1:0] Si5318 DBLBW FRQSEL[1:0] LOS FXDDELAY Clock Output Frequency Select Loss of Signal (LOS) DH_ACTV Digital Hold Active CAL_ACTV Calibration Active Status Output VALTIME RSTN/CAL Figure 5. Si5318 Typical Application Circuit (3.3 V Supply) Rev. 1.0 13 Si5318 2. Functional Description The Si5318 is a high-performance precision clock multiplication and clock generation device. This device accepts a clock input in the 19, 39, 78, or 155 MHz range, attenuates significant amounts of jitter, and generates a clock output in the 19 or 155 MHz range. The Si5318 employs Silicon Laboratories DSPLL® technology to provide excellent jitter performance while minimizing the external component count and maximizing flexibility and ease-of-use. The Si5318 DSPLL phase locks to the input clock signal, attenuates jitter, and multiplies the clock frequency to generate the device SONET/SDH-compliant clock output. The DSPLL loop bandwidth is user-selectable, allowing the Si5318 jitter performance to be optimized for different applications. The Si5318 can produce a clock output with jitter generation as low as 1.0 psRMS (see Table 4), making the device an ideal solution for clock multiplication in SONET/SDH systems. This digital technology also allows for highly stable and consistent operation over all process, temperature, and voltage variations. 2.1.1. Selectable Loop Filter Bandwidth The digital nature of the DSPLL loop filter allows control of the loop filter parameters without the need to change external components. The Si5318 provides the user with up to eight user-selectable loop bandwidth settings for different system requirements. The base loop bandwidth is selected using the BWSEL [1:0] and DBLBW = 0 pins. When DBLBW is driven high, the bandwidth selected on the BWSEL[1:0] pins is doubled. (See Table 7.) When DBLBW is asserted, the Si5318 shows improved jitter generation performance. DBLBW function is defined only when hitless recovery from digital hold is disabled. Therefore, when DBLBW is high, the user must also drive FXDDELAY high for proper operation. 2.2. Clock Input and Output Rate Selection The Si5318 monitors the clock input signal for loss-ofsignal, and provides a loss-of-signal (LOS) alarm when missing pulses are detected. The Si5318 provides a digital hold capability to continue generation of a stable output clock when the input reference is lost. The Si5318 provides a 1/8x, 1/4x, 1/2x, 1x, 2x, 4x, or 8x clock frequency multiplication function. Output rates vary in accordance with the input clock rate. The multiplication factor is configured by selecting the input and output clock frequency ranges for the device. 2.1. DSPLL® The Si5318 accepts an input clock in the 19, 39, 78, or 155 MHz frequency range. The input frequency range is selected using the INFRQSEL[2:0] pins. The INFRQSEL[2:0] settings and associated output clock rates are given in Table 8. The Si5318 phase-locked loop (PLL) uses Silicon Laboratories' DSPLL technology to eliminate jitter, noise, and the need for external loop filter components found in traditional PLL implementations. This is achieved by using a digital signal processing (DSP) algorithm to replace the loop filter commonly found in analog PLL designs. This algorithm processes the phase detector error term and generates a digital control value to adjust the frequency of the voltagecontrolled oscillator (VCO). The technology produces a low phase noise clock with less jitter than is generated using traditional methods. See Figure 4 for an example phase noise plot. In addition, because external loop filter components are not required, sensitive noise entry points are eliminated, making the DSPLL less susceptible to board-level noise sources. 14 The Si5318 DSPLL phase locks to the clock input signal to generate an internal VCO frequency that is a multiple of the input clock frequency. The internal VCO frequency is divided down to produce a clock output in the 19 or 155 MHz frequency range. The clock output range is selected using the Frequency Select (FRQSEL[1:0]) pins. The FRQSEL[1:0] settings and associated output clock rates are given in Table 9. The Si5318 clock input frequencies are variable within the range specified in Table 3 on page 7. The output rates scale accordingly. When a 19.44 MHz input clock is used, the clock output frequency is 19.44 or 155.52 MHz. Rev. 1.0 Si5318 2.3. PLL Performance Table 7. Loop Bandwidth Settings Loop Bandwidth BWSEL1 BWSEL0 DBLBW* 12800 Hz 1 1 1 6400 Hz 1 1 0 6400 Hz 0 0 1 3200 Hz 0 0 0 3200 Hz 0 1 1 1600 Hz 0 1 0 1600 Hz 1 0 1 800 Hz 1 0 0 2.3.1. Jitter Generation Jitter generation is defined as the amount of jitter produced at the output of the device with a jitter free input clock. Generated jitter arises from sources within the VCO and other PLL components. Jitter generation is also a function of the PLL bandwidth setting. Higher loop bandwidth settings may result in lower jitter generation, but may also result in less attenuation of jitter on the input clock signal. 2.3.2. Jitter Transfer *Note: When DBLBW = 1, FXDDELAY must be asserted. Table 8. Nominal Clock Input Frequencies Input Clock Frequency Range Reserved Reserved Reserved 155 MHz 78 MHz 39 MHz 19 MHz Reserved INFRQSEL2 INFRQSEL1 INFRQSEL0 1 1 1 1 0 0 0 0 1 1 0 0 1 1 0 0 1 0 1 0 1 0 1 0 Table 9. Nominal Clock Output Frequencies Output Clock Frequency Range Reserved 155 MHz 19 MHz Driver Powerdown The Si5318 PLL is designed to provide extremely low jitter generation, high jitter tolerance, and a wellcontrolled jitter transfer function with low peaking and a high degree of jitter attenuation. FRQSEL1 FRQSEL0 1 1 0 0 1 0 1 0 Jitter transfer is defined as the ratio of output signal jitter to input signal jitter for a specified jitter frequency. The jitter transfer characteristic determines the amount of input clock jitter that passes to the outputs. The DSPLL technology used in the Si5318 provides tightlycontrolled jitter transfer curves because the PLL gain parameters are determined by digital circuits that do not vary over supply voltage, process, and temperature. In a system application, a well-controlled transfer curve minimizes the output clock jitter variation from board to board, providing more consistent system level jitter performance. The jitter transfer characteristic is a function of the BWSEL[1:0] setting. (See Table 7.) Lower bandwidth selection settings result in more jitter attenuation of the incoming clock but may result in higher jitter generation. Table 4 on page 8 gives the 3 dB bandwidth and peaking values for specified BWSEL settings. Figure 6 shows the jitter transfer curve mask. Jitter Transfer Jitter Out (s) Jitter In 0 dB Peaking –20 dB/dec. F BW f Jitter Figure 6. PLL Jitter Transfer Mask/Template Rev. 1.0 15 Si5318 2.3.3. Jitter Tolerance Clock Output Phase Jitter tolerance for the Si5318 is defined as the maximum peak-to-peak sinusoidal jitter that can be present on the incoming clock. The tolerance is a function of the jitter frequency, because tolerance improves for lower input jitter frequency. See Figure 7. Input Jitter Am plitude –20 dB/dec. mPT t PT_MTIE Excessive Input Jitter Range t 10 ns Recovery from Digital Hold Figure 8. Recovery from Digital Hold F BW f Jitter In Figure 7. Jitter Tolerance Mask/Template 2.4. Digital Hold of the PLL When no valid input clock is available, the Si5318 digitally holds the internal oscillator to its last frequency value. This provides a stable clock to the system until an input clock is again valid. This clock maintains very stable operation in the presence of constant voltage and temperature. The frequency accuracy specifications for digital hold mode are given in Table 4 on page 8. 2.5. Hitless Recovery from Digital Hold When the Si5318 device is locked to a valid input clock, a loss of the input clock causes the device to automatically switch to digital hold mode. When the input clock signal returns, the device performs a “hitless” transition from digital hold mode back to the selected input clock. That is, the device performs “phase build-out” to absorb the phase difference between the internal VCO clock operating in digital hold mode and the new/returned input clock. The maximum phase step size seen at the clock output during this transition and the maximum slope for this phase step are given in Table 4 on page 8. This feature can be disabled by asserting the FXDDELAY pin. When the FXDDELAY pin is high, the output clock is phase and frequency locked with a known phase relationship to the input clock. Consequently, any abrupt phase change on the input clock propagates through the device, and the output slews at the selected loop bandwidth until the original phase relationship is restored. Note: When the DBLBW is asserted, hitless recovery must also be disabled by driving FXDDELAY high for proper operation. 16 2.6. Loss-of-Signal Alarm The Si5318 has loss-of-signal (LOS) circuitry that constantly monitors the CLKIN input clock for missing pulses. The LOS circuitry sets a LOS output alarm signal when missing pulses are detected. The LOS circuitry operates as follows. Regardless of the selected input clock frequency range, the LOS circuitry divides down the input clock into the 19 MHz range. The LOS circuitry then over-samples this divided-down input clock to search for extended periods of time without input clock transitions. If the LOS circuitry detects four consecutive samples of the divided-down input clock that are the same state (i.e., 1111 or 0000), a LOS condition is declared, the Si5318 goes into digital hold mode, and the LOS output alarm signal is set high. The LOS sampling circuitry runs at a frequency of fO_155/2, where fO_155 is the output clock frequency when the FRQSEL[1:0] pins are set to 10. Table 3 on page 7 lists the minimum and maximum transitionless time periods required for declaring a LOS on the input clock (tLOS). Once the LOS alarm is asserted, it is held high until the input clock is validated over a time period designated by the VALTIME pin. When VALTIME is low, the validation time period is about 100 ms. When VALTIME is high, the validation time period is about 13 s. If another LOS condition is detected on the input clock during the validation time (i.e., if another set of 1111 or 0000 samples are detected), the LOS alarm remains asserted, and the validation time starts over. When the LOS alarm is finally released, the Si5318 exits digital hold mode and locks to the input clock. The LOS alarm is automatically set high at power-on and at every lowto-high transition of the RSTN/CAL pin. In these cases, the Si5318 undergoes a self-calibration before releasing the LOS alarm and locking to the input clock. Rev. 1.0 Si5318 The Si5318 also provides an output indicating the digital hold status of the device, DH_ACTV. The Si5318 only enters the digital hold mode upon the loss of the input clock. When this occurs, the LOS alarm will also be active. Therefore, applications that require monitoring of the status of the Si5318 need only monitor the CAL_ACTV and either the LOS or DH_ACTV outputs to know the state of the device. 2.7. Reset The Si5318 provides a Reset/Calibration pin, RSTN/ CAL, which resets the device and disables the outputs. When the RSTN/CAL pin is driven low, the internal circuitry enters into the reset mode, and all LVTTL outputs are forced into a high-impedance state. Also, the CLKOUT+ and CLKOUT– pins are forced to a nominal CML logic LOW and HIGH respectively (See Figure 9). This feature is useful in in-circuit test applications. A low-to-high transition on RSTN/CAL initializes all digital logic to a known condition and initiates self-calibration of the DSPLL. Upon completion of self-calibration, the DSPLL begins to lock to the clock input signal. VDD 2.5 V 100 Ω If the self-calibration is initiated without a valid clock present, the device waits for a valid clock before completing the self-calibration. The Si5318 clock output is set to the lower end of the operating frequency range while the device is waiting for a valid clock. After the clock input is validated, the calibration process runs to completion; the device locks to the clock input, and the clock output shifts to its target frequency. Subsequent losses of the input clock signal do not require recalibration. If the clock input is lost following selfcalibration, the device enters digital hold mode. When the input clock returns, the device re-locks to the input clock without performing a self-calibration. During the calibration process, the output clock frequency is indeterminate and may jump as high as 5% above the final locked value. 2.9. Bias Generation Circuitry The Si5318 makes use of an external resistor to set internal bias currents. The external resistor allows precise generation of bias currents which significantly reduces power consumption and variation as compared with traditional implementations that use an internal resistor. The bias generation circuitry requires a 10 kΩ (1%) resistor connected between REXT and GND. 2.10. Differential Input Circuitry 100 Ω CLKOUT– CLKOUT+ The Si5318 provides a differential input for the clock input, CLKIN. This input is internally biased to a voltage of VICM (see Table 2 on page 6) and may be driven by a differential or single-ended driver circuit. For differential transmission lines, the termination resistor is connected externally as shown. 2.11. Differential Output Circuitry 15 mA The Si5318 utilizes a current mode logic (CML) architecture to drive the differential clock output, CLKOUT. Figure 9. CLKOUT± Equivalent Circuit, RSTN/ CAL asserted LOW For single-ended output operation, simply connect to either CLKOUT+ or CLKOUT–, and leave the unused signal unconnected. 2.12. Power Supply Connections 2.8. PLL Self-Calibration The Si5318 achieves optimal jitter performance by using self-calibration circuitry to set the VCO center frequency and loop gain parameters within the DSPLL. Internal circuitry generates self calibration automatically on powerup or after a loss of power condition. Selfcalibration can also be manually initiated by a low-tohigh transition on the RSTN/CAL input. Whether manually initiated or automatically initiated at powerup, the self-calibration process requires the presence of a valid input clock. The Si5318 incorporates an on-chip voltage regulator. The voltage regulator requires an external compensation circuit of one resistor and one capacitor to ensure stability over all operating conditions. Internally, the Si5318 VDD33 pins are connected to the on-chip voltage regulator input, and the VDD33 pins also supply power to the device’s LVTTL I/O circuitry. The VDD25 pins supply power to the core DSPLL circuitry and are also used for connection of the external compensation circuit. Rev. 1.0 17 Si5318 The regulator’s compensation circuit is in reality a resistor and a capacitor in series between the VDD25 node and ground. (See Figure 5 on page 13.) Typically, the resistor is incorporated into the capacitor’s equivalent series resistance (ESR). The target RC time constant for this combination is 15 to 50 µs. The capacitor used in the Si5318 evaluation board is a 33 µF tantalum capacitor with an ESR of 0.8 Ω. This gives an RC time constant of 26.4 µs. The Venkel part number, TA6R3TCR336KBR, is an example of a capacitor that meets these specs. To get optimal performance from the Si5318 device, the power supply noise spectrum must comply with the plot in Figure 10. This plot shows the power supply noise tolerance mask for the Si5318. The customer should provide a 3.3 V supply that does not have noise density in excess of the amount shown in the diagram. However, the diagram cannot be used as spur criteria for a power supply that contains single tone noise. Vn (µ V/√ Hz) 2100 42 f 10 kHz 100 MHz 500 kHz Figure 10. Power Supply Noise Tolerance Mask 18 Rev. 1.0 Si5318 2.13. Design and Layout Guidelines Precision clock circuits are susceptible to board noise and EMI. To take precautions against unacceptable levels of board noise and EMI affecting performance of the Si5318, consider the following: Power the device from 3.3 V since the internal regulator provides at least 40 dB of isolation to the VDD25 pins (which power the PLL circuitry). Use an isolated local plane to connect the VDD25 pins. Avoid running signal traces over or below this plane without a ground plane in between. Route all I/O traces between ground planes as much as possible Maintain an input clock amplitude in the 200 mVPP to 500 mVPP differential range. Excessive high-frequency harmonics of the input clock should be minimized. The use of filters on the input clock signal can be used to remove highfrequency harmonics. Rev. 1.0 19 Si5318 3. Pin Descriptions: Si5318 8 7 6 5 4 3 2 1 RSVD_NC RSVD_NC RSVD_NC RSVD_NC RSVD_NC RSVD_GND RSVD_GND RSVD_NC RSVD_GND RSVD_GND RSVD_NC FXDDELAY RSVD_GND RSVD_GND BWSEL[0] B RSVD_GND GND GND GND GND GND VDD33 BWSEL[1] C DH_ACTV VDD25 VDD25 VDD33 VDD33 VDD33 DBLBW CLKIN+ D CAL_ACTV VDD25 VDD25 VDD33 VDD33 VDD33 GND LOS VDD25 VDD25 VDD25 VDD25 VDD25 GND INFRQSEL[0] F GND GND GND GND GND GND GND INFRQSEL[1] G FRQSEL[1] CLKOUT– CLKOUT+ FRQSEL[0] VALTIME RSTN/CAL REXT INFRQSEL[2] H A CLKIN– Bottom View Figure 11. Si5318 Pin Configuration (Bottom View) 20 Rev. 1.0 E Si5318 1 A 2 3 4 5 6 7 8 RSVD_GND RSVD_GND RSVD_NC RSVD_NC RSVD_NC RSVD_NC RSVD_NC B BWSEL[0] RSVD_GND RSVD_GND FXDDELAY RSVD_NC RSVD_GND RSVD_GND RSVD_NC C BWSEL[1] VDD33 GND GND GND GND GND RSVD_GND D CLKIN+ DBLBW VDD33 VDD33 VDD33 VDD25 VDD25 DH_ACTV E CLKIN– GND VDD33 VDD33 VDD33 VDD25 VDD25 CAL_ACTV F INFRQSEL[0] GND VDD25 VDD25 VDD25 VDD25 VDD25 LOS G INFRQSEL[1] GND GND GND GND GND GND GND H INFRQSEL[2] REXT RSTN/CAL VALTIME FRQSEL[0] CLKOUT+ CLKOUT– FRQSEL[1] Top View Figure 12. Si5318 Pin Configuration (Transparent Top View) Rev. 1.0 21 Si5318 Table 10. Si5318 Pin Descriptions Pin # Pin Name I/O Signal Level Description B4 FXDDELAY I* LVTTL Fixed Delay Mode. Set high to disable hitless recovery from digital hold mode. This configuration is useful in applications that require a known, or constant, input-to-output phase relationship. When this pin is high, hitless switching from digital hold mode back to a valid clock input is disabled. When switching from digital hold mode to a valid clock input with FXDDELAY high, the clock output changes as necessary to re-establish the initial/ default input-to-output phase relationship that is established after powerup or reset. The rate of change is determined by the setting of BWSEL[1:0]. When this pin is low, hitless switching from digital hold mode back to a valid clock input is enabled. When switching from digital hold mode to a valid clock input with FXDDELAY low, the device enables "phase build out" to absorb the phase difference between the clock output and the clock input so that the phase change at the clock output is minimized. In this case, the input-to-output phase relationship following the transition out of digital hold mode is determined by the phase relationship at the time that switching occurs. Note: FXDDELAY should remain at a static high or static low level during normal operation. Transitions on this pin are allowed only when the RSTN/CAL pin is low. FXDDELAY must be set high when DBLBW is set high. D1 E1 CLKIN+ CLKIN– I AC Coupled System Clock Input. 200–500 mVPPD Clock input to the DSPLL circuitry. The frequency of (See Table 2) the CLKIN signal is multiplied by the DSPLL to generate the CLKOUT clock output. The input-to-output frequency multiplication factor is set by selecting the clock input range and the clock output range. The frequency of the CLKIN clock input can be in the 19, 39, 78, or 155 MHz range (nominally 19.44, 38.88, 77.76, or 155.52 MHz) as indicated in Table 3 on page 7. The clock input frequency is selected using the INFRQSEL[2:0] pins. The clock output frequency is selected using the FRQSEL[1:0] pins. *Note: The LVTLL inputs on the Si5318 device have an internal pulldown mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source. 22 Rev. 1.0 Si5318 Table 10. Si5318 Pin Descriptions (Continued) Pin # Pin Name I/O Signal Level Description F1 G1 H1 INFRQSEL[0] INFRQSEL[1] INFRQSEL[2] I* LVTTL Input Frequency Range Select. Pins(INFRQSEL[2:0]) select the frequency range for the input clock, CLKIN. (See Table 3 on page 7.) 000 = Reserved. 001 = 19 MHz range. 010 = 39 MHz range. 011 = 78 MHz range. 100 = 155 MHz range. 101 = Reserved. 110 = Reserved. 111 = Reserved. F8 LOS O LVTTL Loss-of-Signal (LOS) Alarm for CLKIN. Active high output indicates that the Si5318 has detected missing pulses on the input clock signal. The LOS alarm is cleared after either 100 ms or 13 seconds of a valid CLKIN clock input, depending on the setting of the VALTIME input. D8 DH_ACTV O LVTTL Digital Hold Mode Active. Active high output indicates that the DSPLL is in digital hold mode. Digital hold mode locks the current state of the DSPLL and forces the DSPLL to continue generation of the output clock with no additional phase or frequency information from the input clock. H3 RSTN/CAL I* LVTTL Reset/Calibrate. When low, the internal circuitry enters the reset mode and all LVTTL outputs are forced into a high-impedance state. Also, the CLKOUT+ and CLKOUT– pins are forced to a nominal CML logic LOW and HIGH respectively. This feature is useful for in-circuit test applications. A low-to-high transition on RSTN/CAL initializes all digital logic to a known condition, enables the device outputs, and initiates self-calibration of the DSPLL. Upon completion of self-calibration, the DSPLL begins to lock to the selected clock input signal. *Note: The LVTLL inputs on the Si5318 device have an internal pulldown mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source. Rev. 1.0 23 Si5318 Table 10. Si5318 Pin Descriptions (Continued) Pin # Pin Name I/O Signal Level Description H6 H7 CLKOUT+ CLKOUT– O CML Differential Clock Output. High frequency clock output. The frequency of the CLKOUT output is a multiple of the frequency of the CLKIN input. The input-to-output frequency multiplication factor is set by selecting the clock input range and the clock output range. The frequency of the CLKOUT clock output can be in the 19 or 155 MHz range as indicated in Table 3 on page 7. The clock output frequency is selected using the FRQSEL[1:0] pins. The clock input frequency is selected using the INFRQSEL[2:0] pins. H5 H8 FRQSEL[0] FRQSEL[1] I* LVTTL Clock Output Frequency Range Select Select frequency range of the clock output, CLKOUT. (See Table 3 on page 7.) 00 = Clock Driver Powerdown. 01 = 19 MHz Frequency Range. 10 = 155 MHz Frequency Range. 11 = Reserved. B1 C1 BWSEL[0] BWSEL[1] I* LVTTL Bandwidth Select. BWSEL[1:0] pins set the bandwidth of the loop filter within the DSPLL to 6400, 3200, 1600, or 800 Hz as indicated below. 00 = 3200 Hz 01 = 1600 Hz 10 = 800 Hz 11 = 6400 Hz Note: The loop filter bandwidth will be twice the value indicated when DBLBW is set high. E8 CAL_ACTV O LVTTL Calibration Mode Active. This output is driven high during the DSPLL self-calibration and the subsequent initial lock acquisition period. H4 VALTIME I* LVTTL Clock Validation Time for LOS. VALTIME sets the clock validation times for recovery from an LOS alarm condition. When VALTIME is high, the validation time is approximately 13 seconds. When VALTIME is low, the validation time is approximately 100 ms. A2, A3, B2, B3, B6, B7, C8 RSVD_GND — LVTTL Reserved—GND. This pin must be tied to GND for normal operation. *Note: The LVTLL inputs on the Si5318 device have an internal pulldown mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source. 24 Rev. 1.0 Si5318 Table 10. Si5318 Pin Descriptions (Continued) Pin # Pin Name I/O Signal Level Description A4–8, B5, B8 RSVD_NC — LVTTL Reserved—No Connect. This pin must be left unconnected for normal operation. C2, D3–D5, E3–E5 VDD33 VDD Supply 3.3 V Supply. 3.3 V power is applied to the VDD33 pins. Typical supply bypassing/decoupling for this configuration is indicated in the typical application diagram for 3.3 V supply operation. D6, D7, E6, E7, F3–F7 VDD25 VDD Supply 2.5 V Supply. These pins provide a means of connecting the compensation network for the on-chip regulator. C3–C7, E2, F2, G2–G8 GND GND Supply Ground. Must be connected to system ground. Minimize the ground path impedance for optimal performance of the device. H2 REXT I Analog External Biasing Resistor. Used by on-chip circuitry to establish bias currents within the device. This pin must be connected to GND through a 10 kΩ (1%) resistor. D2 DBLBW I* LVTTL Double Bandwidth Active high input to boost the selected bandwidth 2x. When this pin is high, the loop filter bandwidth selected on BWSEL[1:0] is doubled. When this pin is high, FXDDELAY must also be high. *Note: The LVTLL inputs on the Si5318 device have an internal pulldown mechanism that causes these inputs to default to a logic low state if the input is not driven from an external source. Rev. 1.0 25 Si5318 4. Ordering Guide Part Number Package Temperature Si5318-X-BC 63-Ball CBGA –20 to 85 °C Note: “X” denotes product revision. 26 Rev. 1.0 Si5318 5. Package Outline Figure 13 illustrates the package details for the Si5318. Table 11 lists the values for the dimensions shown in the illustration. Figure 13. 63-Ball Ceramic Ball Grid Array (CBGA) Table 11. Package Drawing Dimensions Dimension Description Minimum Nominal Maximum A Total Package Height 2.13 2.28 2.43 A1 Standoff 0.60 0.70 0.80 A2 Ceramic Thickness 0.88 0.98 1.08 A3 Mold Cap Thickness 0.55 0.60 0.65 b Solder Ball Diameter 0.65 0.70 0.75 D Ceramic Body Size 8.85 9.00 9.15 D1 Mold Cap Size 8.55 8.75 8.95 e Solder Ball Pitch 1.00 BSC S Pitch to Centerline 0.50 BSC Rev. 1.0 27 Si5318 6. 9x9 mm CBGA Card Layout Placement Courtyard Table 12. Recommended Land Pattern Dimensions Symbol Parameter Dimension Notes Min Nom Max C Column Width — 7.00 REF — D Row Height — 7.00 REF — E Pad Pitch — 1.00 BSC — F Placement Courtyard 10.00 — — 1 X Pad Diameter 0.64 0.68 0.72 2, 3 Notes: 1. The Placement Courtyard is the minimum keep-out area required to assure assembly clearances. 2. Pad Diameter is Copper Defined (Non-Solder Mask Defined/NSMD). 3. OSP Surface Finish Recommended. 4. Controlling dimension is millimeters. 5. Land Pad Dimensions comply with IPC-SM-782 guidelines. 6. Target solder paste volume per pad is 0.065 mm3 ± 0.010 mm3 (4000 mils3 ± 600 mils3). Recommended stencil aperture dimensions to achieve target solder paste volume are 0.191 mm thick x 0.68±0.01 mm diameter, with a 0.025 mm taper. 7. Recommended stencil type is chemically etched stainless steel with circularly tapered apertures. 28 Rev. 1.0 Si5318 DOCUMENT CHANGE LIST Revision 0.9 to Revision 1.0 Updated θJA in Table 6, “Thermal Characteristics,” on page 12. Rev. 1.0 29 Si5318 CONTACT INFORMATION Silicon Laboratories Inc. 4635 Boston Lane Austin, TX 78735 Tel: 1+(512) 416-8500 Fax: 1+(512) 416-9669 Toll Free: 1+(877) 444-3032 Email: [email protected] Internet: www.silabs.com The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice. Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. Silicon Laboratories products are not designed, intended, or authorized for use in applications intended to support or sustain life, or for any other application in which the failure of the Silicon Laboratories product could create a situation where personal injury or death may occur. Should Buyer purchase or use Silicon Laboratories products for any such unintended or unauthorized application, Buyer shall indemnify and hold Silicon Laboratories harmless against all claims and damages. Silicon Laboratories, Silicon Labs, and DSPLL are trademarks of Silicon Laboratories Inc. Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders. 30 Rev. 1.0