SEME-LAB D1260

TetraFET
D1260UK
METAL GATE RF SILICON FET
MECHANICAL DATA
GOLD METALLISED
MULTI-PURPOSE SILICON
DMOS RF FET
60W – 12.5V – 175MHz
SINGLE ENDED
C
D
(2 pls)
E
1
B
2
3
A
G
5
4
H
I
FEATURES
• SIMPLIFIED AMPLIFIER DESIGN
F
M
J
K
N
• SUITABLE FOR BROAD BAND APPLICATIONS
DT
PIN 1
SOURCE (COMMON) PIN 2
GATE
• LOW Crss
PIN 3
SOURCE (COMMON) PIN 4
SOURCE (COMMON)
• SIMPLE BIAS CIRCUITS
PIN 5
DRAIN
• LOW NOISE
DIM
A
B
C
D
E
F
G
H
I
J
K
M
N
mm
6.35 DIA
3.17 DIA
18.41
5.46
5.21
7.62
21.59
3.94
12.70
0.13
24.76
2.59
4.06
Tol.
0.13
0.13
0.25
0.13
0.13
MAX
0.38
0.13
0.13
0.03
0.13
0.13
0.25
Inches
0.250 DIA
0.125 DIA
0.725
0.215
0.205
0.300
0.850
0.155
0.500
0.005
0.975
0.102
0.160
Tol.
0.005
0.005
0.010
0.005
0.005
MAX
0.015
0.005
0.005
0.001
0.005
0.005
0.010
• HIGH GAIN – 10 dB MINIMUM
APPLICATIONS
• HF/VHF/UHF COMMUNICATIONS
from 1 MHz to 175 MHz
ABSOLUTE MAXIMUM RATINGS (Tcase = 25°C unless otherwise stated)
PD
BVDSS
BVGSS
ID(sat)
Tstg
Tj
Semelab plc.
Power Dissipation
Drain – Source Breakdown Voltage
Gate – Source Breakdown Voltage
Drain Current
Storage Temperature
Maximum Operating Junction Temperature
Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
175W
40V
±20V
40A
–65 to 150°C
200°C
Prelim. 9/95
D1260UK
ELECTRICAL CHARACTERISTICS (Tcase = 25°C unless otherwise stated)
Parameter
Test Conditions
Min.
BVDSS
IDSS
IGSS
Drain–Source
Breakdown Voltage
Zero Gate Voltage
Drain Current
Gate Leakage Current
VGS(th) Gate Threshold Voltage *
Max. Unit
VGS = 0
ID = 100mA
VDS = 12.5V
VGS = 0
4
mA
VGS = 20V
VDS = 0
1
µA
ID = 10mA
VDS = VGS
0.5
7
V
ID = 4A
3.2
S
10
dB
50
%
20:1
—
gfs
Forward Transconductance *
VDS = 10V
GPS
Common Source Power Gain
PO = 60W
η
Drain Efficiency
VDS = 12.5V
VSWR Load Mismatch Tolerance
f = 175MHz
IDQ = 0.4A
Ciss
Input Capacitance
VDS = 0
Coss
Output Capacitance
VDS = 12.5V VGS = 0
Crss
Reverse Transfer Capacitance
VDS = 12.5V VGS = 0
* Pulse Test:
Typ.
40
VGS = –5V f = 1MHz
V
240
pF
f = 1MHz
180
pF
f = 1MHz
16
pF
Pulse Duration = 300 µs , Duty Cycle ≤ 2%
HAZARDOUS MATERIAL WARNING
The ceramic portion of the device between leads and metal flange is beryllium oxide. Beryllium oxide dust is highly
toxic and care must be taken during handling and mounting to avoid damage to this area.
THESE DEVICES MUST NEVER BE THROWN AWAY WITH GENERAL INDUSTRIAL OR DOMESTIC WASTE.
THERMAL DATA
RTHj–case
Semelab plc.
Thermal Resistance Junction – Case
Telephone (01455) 556565. Telex: 341927. Fax (01455) 552612.
Max. 1.0°C / W
Prelim. 9/95