TI CDCUN1208LPRHBR

CDCUN1208LP
www.ti.com
SCAS928 – MAY 2012
400 MHz Low Power 2:8 Fan-Out Buffer with
Universal Inputs and Outputs
Check for Samples: CDCUN1208LP
FEATURES
•
1
•
•
•
•
2
Configuration Options (via pins or SPI/I C):
– Input Type (HCSL, LVDS, LVCMOS)
– Output Type (HCSL, LVDS, LVCMOS)
– Signal Edge Rate (Slow, Medium, Fast)
– Clock Input Divide Value (/1, /2, /4, /8) – IN2
only
Low Power Consumption and Power
Management Features Including 1.8V
Operation and Output Enable Control
Integrated Voltage Regulators Improve PSNR
Excellent Additive Jitter Performance
– 200 fs RMS (10kHz-20MHz), LVDS at
100MHz
•
•
•
Maximum Operating Frequency:
– Differential Mode: up to 400 MHz
– LVCMOS Mode: up to 250 MHz
ESD Protection Exceeds 2kV HBM, 500V CDM
Industrial Temperature Range (–40°C to 85°C)
Wide Supply Range (1.8V, 2.5V, or 3.3V)
APPLICATIONS
•
•
•
•
Communications Systems (Ethernet, PCI
Express)
Computing Systems (Ethernet, PCIe, USB)
Consumer (Set top boxes, video equipment)
Office Automation
DESCRIPTION
The CDCUN1208LP is a 2:8 fan-out buffer featuring a wide operating supply range, two universal
differential/single-ended inputs, and universal outputs (HCSL, LVDS, or LVCMOS) with edge rate control. One of
the device inputs includes a divider that provides divide values of /1, /2, /4, or /8. The CDCUN1208LP is offered
in a 32 pin QFN package reducing the solution footprint. The device is flexible and easy to use. The state of
certain pins determines device configuration at power up. Alternately, the CDCUN1208LP provides a SPI/I2C port
with which a host processor controls device settings. The CDCUN1208LP delivers excellent additive jitter
performance, and low power consumption. The output section includes four dedicated supply pins enabling the
operation of output ports from different power supply domains. This provides the ability to clock devices switching
at different LVCMOS levels without the need for external logic level translation circuitry.
VDD
VDD
INSEL
HCSL P
LVCMOS
NC
HCSL
ITTP
HCSL N
LVDS
INSEL
LVDS P
LVCMOS
NC
ITTP
LVDS P
HCSL P
IN2N
LVDS N
INMUX
/1,/2,/4,/8
INMUX
IN1N
IN2P
IN1P
HCSL N
IN1P
IN1N
HCSL P
IN2P
HCSL N
/1,/2,/4,/8
IN2N
LVDS N
HCSL P
LVDS P
HCSL N
LVDS N
HCSL P
NC
MODE
LVDS P
LVDS N
HCSL N
VDD
LVCMOS
NC
HCSL P
LVDS
LVDS P
VDD
HCSL P
HCSL N
HCSL OTTP
LVCMOS
LVDS N
HCSL OTTP
LVDS P
LVDS
LVDS N
HCSL N
OE
OE
CDCUN1208LP
LVDS N
DIVIDE
DIVIDE
MODE
LVDS P
LVDS P
HCSL P
HCSL N
NC
LVDS N
ERC
CDCUN1208LP
ERC
Figure 1. CDCUN1208LP Applications – HCSL and LVDS Fan-Out Buffer Mode
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2012, Texas Instruments Incorporated
CDCUN1208LP
SCAS928 – MAY 2012
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
LVCMOS
VDD
GND
Voltage
Regulator
Power
Management
LVCMOS
1.8V, 2.5V, or 3.3V
LVCMOS
LVCMOS
LVCMOS
INSEL
VDD
LVCMOS
LVCMOS
1.8V, 2.5V, or 3.3V
HCSL ITTP
LVCMOS
LVDS
LVCMOS
IN1P
IN2N
/1,/2,/4,/8
INMUX
IN1N
IN2P
LVCMOS
LVCMOS
1.8V, 2.5V, or 3.3V
LVCMOS
DIVIDE
NC
LVCMOS
MODE
LVCMOS
LVCMOS
1.8V, 2.5V, or 3.3V
VDD
LVCMOS
LVCMOS
HCSL OTTP
LVCMOS
LVDS
OE
CDCUN1208LP
ERC
Figure 2. CDCUN1208LP Typical Application Example – LVCMOS Output Mode
2
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RHB PACKAGE
(TOP VIEW)
OUT6N
OUT6P
VDDO3
OUT5N
OUT5P
OTTP
OUT4N
OUT4P
24
23
22
21
20
19
18
17
OUT7P
25
16
OUT3N
OUT7N
26
15
OUT3P
VDDO4
27
14
VDDO2
OUT8P
28
13
OUT2N
OUT8N
MODE
29
12
OUT2P
30
11
VDDO1
ERC
31
10
OUT1N
OE
32
9
OUT1P
UN1208LP
GND
(thermal pad )
7
8
ITTP
6
IN2P
3
IN2N
5
VDD
2
INSEL
DIVIDE
4
IN1N
IN1P
1
PIN FUNCTIONS (1)
NAME
GND
PIN
NUMBER
DESCRIPTION
Thermal Pad Power supply ground and thermal relief
5
Device Power Supply, Provides power to the input section and clock distribution section. Use a power supply
voltage that corresponds to the switching levels of clock input(s) (i.e. 1.8V, 2.5V, or 3.3V).
MODE
30
Device Control Mode Select
OPEN = Device Configured via pins (Pin Mode)
HIGH = Device Configured via I2C
LOW = Device Configured via SPI
Note: For information on control via the serial interface (I2C/ SPI), see DEVICE CONTROL USING THE HOST
INTERFACE section.
DIVIDE
1
Input Divider Pin Control
(HIGH = /4, LOW = /2, OPEN = /1)
OE
32
Device Output Enable
HIGH = Enable, LOW = Disable
ERC
31
Output Edge Rate Control
HIGH = Medium, LOW = Slow, OPEN = Fast
INSEL
2
Input Multiplexer Control
ITTP
8
Input Type Select (HIGH = HCSL, LOW = LVDS, OPEN = LVCMOS)
IN1P
3
Universal Input 1 – Positive Terminal
IN1N
4
Universal Input 1 – Negative Terminal, Ground if using IN1 in single-ended mode
IN2P
6
Universal Input 2 – Positive Terminal
IN2N
7
Universal Input 2 – Negative Terminal, Ground if using IN2 in single-ended mode
OTTP
19
Output Type Select (HIGH = HCSL, LOW = LVDS, OPEN = LVCMOS)
OUT1P
9
Output 1 – Positive Terminal
OUT1N
10
Output 1 – Negative Terminal
VDDO1
11
Output Power Supply – OUT1, OUT2
OUT2P
12
Output 2 – Positive Terminal
VDD
(1)
This pin list applies to operation of the device in pin mode. In host mode, certain pins take on an alternate function as outlined in
Table 9.
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PIN FUNCTIONS(1) (continued)
NAME
PIN
NUMBER
OUT2N
13
Output 2 – Negative Terminal
VDDO2
14
Output Power Supply – OUT3, OUT4; Output bank OUT1 – OUT4 regulator power supply (apply power if any
of OUT1 – OUT4 are needed)
OUT3P
15
Output 3 – Positive Terminal
OUT3N
16
Output 3 – Negative Terminal
OUT4P
17
Output 4 – Positive Terminal
OUT4N
18
Output 4 – Negative Terminal
OUT5P
20
Output 5 – Positive Terminal
OUT5N
21
Output 5 – Negative Terminal
VDDO3
22
Output Power Supply - OUT5, OUT6
OUT6P
23
Output 6 – Positive Terminal
OUT6N
24
Output 6 – Negative Terminal
OUT7P
25
Output 7 – Positive Terminal
OUT7N
26
Output 7 – Negative Terminal
VDDO4
27
Output Power Supply – OUT7, OUT8 Output bank OUT5 – OUT8 regulator power supply (apply power if any of
OUT5 – OUT8 are needed)
OUT8P
28
Output 8 – Positive Terminal
OUT8N
29
Output 8 – Negative Terminal
DESCRIPTION
ORDERING INFORMATION
TA
PACKAGED DEVICES
FEATURES
–40°C to 85°C
CDCUN1208LPRHBT
32-pin QFN (RHB) package, small tape and reel
–40°C to 85°C
CDCUN1208LPRHBR
32-pin QFN (RHB) package, tape and reel
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
VDDxx
Supply voltage range (2)
VIN
Input voltage range (3)
(3)
VOUT
Output voltage range
IIN
Input current
IOUT
Output current
TSTG
Storage temperature range
(1)
(2)
(3)
4
(1)
VALUE
UNIT
–0.5 to 4.6
V
–0.5 to VDDIx + 0.5
V
–0.5 to VDDOx + 0.5
V
20
mA
50
mA
–65 to 150
°C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
All supply voltages must be supplied simultaneously
The input and output negative voltage ratings may be exceeded if the input and output clamp–current ratings are observed.
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SCAS928 – MAY 2012
THERMAL INFORMATION
CDCUN1208LP
THERMAL METRIC (1)
QFN32
UNITS
32 PINS
θJA
Junction-to-ambient thermal resistance
32.5
θJCtop
Junction-to-case (top) thermal resistance
24.2
θJB
Junction-to-board thermal resistance
6.6
ψJT
Junction-to-top characterization parameter
0.3
ψJB
Junction-to-board characterization parameter
6.6
θJCbot
Junction-to-case (bottom) thermal resistance
1.6
°C/W
SPACER
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
RECOMMENDED OPERATING CONDITIONS
TA = –40°C TO 85°C
MIN
NOM
MAX
UNIT
POWER SUPPLIES (1)
VDD
DC Power Supply - Core
1.8V Mode
1.7
1.8
1.9
V
VDDOx
DC Power Supply - Output
1.8V Mode
1.7
1.8
1.9
V
VDD
DC Power Supply - Core
2.5V Mode
2.375
2.5
2.625
V
VDDOx
DC Power Supply - Output
2.5V Mode
2.375
2.5
2.625
V
VDD
DC Power Supply - Core
3.3V Mode
2.97
3.3
3.63
V
VDDOx
DC Power Supply - Output
3.3V Mode
2.97
3.3
3.63
V
85
°C
TEMPERATURE
TA
(1)
Free- Air Temperature
–40
For proper device operation, the core power supply voltage (pin 5) must be applied either before the application of any output power
supply or simultaneously with the application of the output power supplies. The application of an output power supply prior to the
application of the core power supply could result in improper device behavior.
Table 1. CDCUN1208LP Power Consumption (TA = –40°C to 85°C)
DEVICE SETTINGS (See Table 2) (1)
PARAMETER
IPD1.8,3.3
ICORE1.8,3.3
IHCSL1.8,3.3
MAX CURRENT
VDD= 1.8V
fOUT = fin = 100 MHz
MAX CURRENT
VDD = 3.3V
fOUT = fin = 100MHz
UNIT
Device Power Down
3
4
mA
Device Outputs Off
26
35
mA
Figure 19a
HCSL Buffer Current
Consumption (2)
23
23
mA
9
9
mA
TEST
CONFIGURATION
MODE
OE
ERC
OTTP
INSEL
ITTP
PD Bit
L or H
L
X
X
X
L
H
Host Configuration
Mode
(see Host
Configuration Mode)
O
L
X
X
X
L
X
Figure 19a,b,c
O
H
O
H
L
O
X
DESCRIPTION
ILVDS1.8,3.3
O
H
O
L
L
O
X
Figure 19b
LVDS Buffer Current
Consumption (2)
ILVCMOS1.8,3.3
O
H
O
O
L
O
X
Figure 19c
LVCMOS Buffer
Current Consumption
(one side) (2)
8
11
mA
IDEV-HCSL1.8,3.3
O
H
O
H
L
O
X
Figure 19a
Device Current
Consumption – HCSL
Mode
200
200
mA
IDEV-LVDS1.8,3.3
O
H
O
L
L
O
X
Figure 19b
Device Current
Consumption – LVDS
Mode
80
90
mA
IDEV-LVCMOS1.8,3.3
O
H
O
O
L
O
X
Figure 19c
Device Current
Consumption –
LVCMOS Mode
130
210
mA
(1)
(2)
H = Input High, L = Input Low; O = Input Open
Buffer current consumption values represent the average of the current drawn by VDDO1, VDDO2, VDDO3, and VDDO4 divided by 8
(differential mode) or 16 (single-ended mode).
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DIGITAL INPUT ELECTRICAL CHARACTERISTICS – OE (SCL), INSEL, ITTP, OTTP, DIVIDE
(SDA/MOSI), ERC(ADDR/CS), MODE
TA = –40°C to 85°C
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
LVCMOS INPUT
VIL1.8
Low level LVCMOS input voltage
VDD = 1.8 V
VIH1.8
High level LVCMOS input voltage
VDD = 1.8 V
1.35
0.7
VIOPEN1.8
OPEN level LVCMOS input voltage
VDD = 1.8 V
0.9
VIL2.5
Low level LVCMOS input voltage
VDD = 2.5 V
VIH2.5
High level LVCMOS input voltage
VDD = 2.5 V
1.71
VIOPEN2.5
OPEN level LVCMOS input voltage
VDD = 2.5 V
1.0
VIL3.3
Low level LVCMOS input voltage
VDD = 3.3 V
VIH3.3
High level LVCMOS input voltage
VDD = 3.3 V
2.3
VIOPEN3.3
OPEN level LVCMOS input voltage
VDD = 3.3 V
1.3
IIL
Low level LVCMOS input current
VDD = VDDmax, VILCMOS = 0 V
IIH
High level LVCMOS input current
VDD = VDDmax, VIHCMOS = 1.9 V
CI
LVCMOS Input capacitance
VIK
Digital input clamp voltage
V
V
1.2
V
0.7
V
V
1.6
V
1.0
V
V
1.9
V
–120
μA
65
μA
6
VDD = 1.7V, II = –18 mA
pF
–1.2
V
UNIVERSAL INPUT (IN1, IN2) CHARACTERISTICS
VDD = 1.8V, 2.5V, 3.3V, TA = –40°C to 85°C
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
250
MHz
VDD
V
0.2 × VDD
V
SINGLE-ENDED MODE
fIN1,2
Input frequency
Single ended (1)
VIH
Input voltage - high
250 MHz
VIL
Input voltage - low
250 MHz
0.008
0.7 × VDD
DIFFERENTIAL MODE
fINDIFF
Input frequency
|VIN-DIFF|
Input swing
0.008
400
MHz
VDD = 2.5 V, 3.3 V
0.15
1.6
V
VDD = 1.8 V
0.15
1
V
0.8
2.5
0.8
VDD – 0.3
–0.15
0.75
ITTP = LVDS, VDD = 3.3 V
VCM
Input common mode voltage
ITTP = LVDS, VDD = 2.5 V, 1.8 V
ITTP = HCSL
V
GENERAL CHARACTERISTICS
IIH
Input current - high
VDD = 3.63 V, VIH = 3.63 V
IIL
Input current - low
VDD = 3.63 V, VIL = 0 V
ΔV/ΔT
Input edge rate
20%–80%
DCIN
Input duty cycle
CIN
Input capacitance
(1)
6
30
µA
–30
0.75
µA
V/ns
40
60%
3.5
pF
When using an input in single-ended mode, ground the negative terminal (IN1N and/or IN2N) and drive the positive terminal (IN1P
and/or IN2P).
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CLOCK OUTPUT BUFFER CHARACTERISTICS (OUTPUT MODE = LVDS)
Unless otherwise noted, VDDOX = 1.8V, 2.5V, 3.3V; TA = –40°C to 85°C. See Figure 9, Figure 10, and Figure 11.
PARAMETER
fOUT
TEST CONDITIONS
MIN
Output frequency
TYP
0.008
MAX
UNIT
400
MHz
Output common mode voltage,
VDDOx = 2.5/3.3 V
RL = 100 Ω
Output common mode voltage,
VDDOx = 1.8 V
RL = 100 Ω
|VOD|
Differential output voltage
RL = 100 Ω, single-ended Pk-Pk
250
ΔVOD
Change in magnitude of VOD for
complementary output states
RL = 100 Ω
–50
Vring
Output overshoot and undershoot
Percentage of output amplitude VOD
VOS
Output AC common mode
VIN, DIFF, PP = 0.9V, RL = 100 Ω, 2 pF
150 mVP-P
fout = 100 MHz, 10k-20M integration bandwidth,
RL = 100Ω
200
fout = 400 MHz, 10k-20M integration bandwidth,
RL = 100Ω
180
VCM
TADDJIT
tR/tF
Additive jitter (1)
Output rise/fall time
1.125
700
ERC = Medium., 20% to 80%, ZL = 100Ω, 1pF,
VDDOx = 3.3V
600
ERC = Medium., 20% to 80%, ZL = 100Ω, 1pF,
VDDOx = 1.8V
500
ISP
ISN
Output Short Circuit Current (single
ended)
Shorted to GND
|IPN|
Output Short Circuit Current (differential)
V
550
mV
50
mV
fs, rms
ERC = Slow, 20% to 80%, ZL = 100Ω, 1pF,
VDDOx = 1.8V
50/50 Input duty cycle
V
20%
ERC = Fast, 20% to 80%, Z L = 100Ω, 1 pF
Propagation Delay
400
800
Output Duty Cycle
1.275
0.9
ERC = Slow, 20% to 80%, ZL = 100Ω, 1pF,
VDDOx = 3.3V
ODC
TDLYO
1.2
ps
300
45%
55%
-24
24
mA
Complementary outputs shorted together
12
mA
ERC set to high rate. Input tr, tf > 0.6 V/ns, RL =
100Ω, VDD = 2.5V, 3.3V
3.3
ERC set to high rate. Input tr, tf > 0.6 V/ns, RL =
100Ω, VDD = 1.8V
3.8
ns
tSKEW
Skew between outputs
ERC set to high rate. Input tr, tf > 0.6 V/ns, Equal
VDDOx,
RL = 100Ω
35
tOE
Output enable to stable clock output
Pin mode. fout = 100 MHz, device in active mode
with outputs disabled, OE asserted
20
µs
tPD
PD de-asserted to stable clock output
Host mode, fout = 100 MHz, device in power down
mode, PD de-asserted
20
µs
tPU
Time from power applied to stable clock
output (2)
Pin mode, fout = 100 MHz, OE asserted, measured
from time VDD is valid to stable output.
1
ms
(1)
(2)
50
ps
tRfin = tFfin > 0.6 V/ns.
Parameter depends significantly on power supply design and supply voltage rise time.
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CLOCK OUTPUT BUFFER CHARACTERISTICS (OUTPUT MODE = HCSL)
Unless otherwise noted, VDDOx = 1.8V, 2.5V, 3.3V; TA = –40°C to 85°C. See Figure 12, Figure 13, and Figure 14.
PARAMETER
TEST CONDITIONS
MIN
fOUT
Output frequency
Vmax
Absolute maximum output voltage (1)
See Figure 3
Vmin
Absolute minimum output voltage (2)
See Figure 3
–0.3
RL = single ended to GND = 50 Ω, CL = 2pF,
VDDOx = 2.5V, 3.3V See Figure 12
600
RL = single ended to GND = 50 Ω, CL = 2pF,
VDDOx = 1.8V See Figure 12
550
VOL
Single ended output voltage – low (3)
RL = single ended to GND = 50 Ω, CL = 2pF,
See Figure 12
VCROSS
Output crossing point voltage (3)
See Figure 3
VCROSSΔ
VCROSS Total variation (3)
See Figure 4
(3)
Ring back voltage margin
See Figure 5
–100
Time before VRB is Allowed (3), (4)
See Figure 5
500
VOS
Output AC common mode
VIN, DIFF, PP = 0.9V, RL = single ended to GND = 50 Ω,
2 pF
TjitHCSL
Additive jitter, input set to HCSL (5)
TjitLVDS
Additive jitter, input set to LVDS (5)
Output rise/fall time (6)
ODC
TDLYO
Output rise/fall time matching
Output duty cycle
(7)
Propagation delay
550
mV
140
mV
100
mV
ps
fs, rms
fOUT = 100 MHz, 10k-20M integration bandwidth.
Differential Measurement
280
fs, rms
75
Slow, +150mV differential, See Figure 6, VDDOx = 3.3V
300
Slow, +150mV differential, See Figure 6, VDDOx = 1.8V
230
Med., +150mV differential, See Figure 6, VDDOx = 3.3V
240
Med., +150mV differential, See Figure 6, VDDOx = 1.8V
180
Fast, +150mV differential, See Figure 6
140
See Figure 7
ps
20%
Differential Measurement, See Figure 8
45%
55%
ERC set to high rate. Input tr, tf > 0.6 V/ns, VDD = 2.5V,
3.3V
3.8
ERC set to high rate. Input tr, tf > 0.6 V/ns, VDD = 1.8V
4.3
Output enable to stable clock output
tPD
PD de-asserted to stable clock
output
tPU
Time from power applied to stable
clock output (9)
8
mV
380
tOE
(7)
(8)
(9)
150
fOUT = 100 MHz, 10k-20M integration bandwidth.
Differential Measurement
Pin mode, fout = 100 MHz, device in active mode with
outputs disabled, OE asserted
(5)
(6)
V
mVP-P
Differential Measurement, Input tr, tf > 0.6 V/ns
(1)
(2)
(3)
(4)
V
125
Skew between outputs (8)
tSKEW
MHz
250
TSTABLE
TMRF
400
1.15
mV
VRB
tR/tF
UNIT
0.008
Single ended output voltage –
high (3)
VOH
TYP MAX
35
50
ns
ps
2
µs
Host mode, fout = 100 MHz, device in power down
mode, PD de-asserted
15
µs
Pin mode, fout = 100 MHz, OE asserted, measured
from time VDD is valid to stable output
1
ms
Single-ended measurement includes overshoot. Measurement is taken at load capacitors CL (see Figure 12).
Single-ended measurement, includes undershoot Measurement is taken at load capacitors CL (see Figure 12 ).
Measurement is taken at load capacitors CL (see Figure 12). If VDDOx = 1.8V, the specified minimum VOH is 550 mV.
TSTABLE is the time the differential clock must maintain a minimum ±150 mV differential voltage after rising/falling edges before it is
allowed to droop back into the VRB ±100 mV differential range. See Figure 5.
tRfin = tFfin ≥ 0.6 V/ns.
Measured from –150 mV to +150 mV on the differential waveform. The signal must be monotonic through the measurement region for
rise and fall time. The 300 mV measurement window is centered on the differential zero crossing. Slow is 0.53V/ns, medium is 1.05V/ns,
and fast is 2.1V/ns. The PCIe CEM spec. has a window of 0.6V/ns to 4V/ns.
Assumes input duty cycle = 50%.
Skew measured between identical output types with identical loads, identical output power supplies, and identical edge rate settings.
Parameter depends significantly on power supply design and supply voltage rise time.
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VMAX = 1.15V
REFCLK VCROSSMAX = 550 mV
VCROSSMIN = 250 mV
REFCLK +
VMIN = -0.3 V
Figure 3. HCSL Crossing Point Voltage
REFCLK -
140 mV
REFCLK+
Figure 4. HCSL Variation of VCROSS over all Rising Clock Edges
TSTABLE
VRB
VIH = +150 mV
VRB = +150 mV
0.0 V
VRB = -150 mV
VIL = -150 mV
REFCLK+
VRB
minus
REFCLK –
TSTABLE
Figure 5. HCSL Ring Back Margin and Timing
tr
tf
VIH - +150 mV
VIL - -150 mV
REFCLK +
Minus
REFCLK -
Figure 6. HCSL Rise Fall Time and Edge Speed
T
REFCLK -
REFCLK -
FA
LL
VCROSS MEDIAN+ 75 mV
VCROSS MEDIAN
VCROSS MEDIAN - 75 mV
VCROSS MEDIAN
REFCLK +
TR
E
IS
REFCLK +
Figure 7. HCSL Rise Fall Time Matching
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Clock Period (Differential )
Positive Duty Cycle
(Differential )
Negative Duty Cycle
(Differential)
0V
REFCLK+
Minus
REFCLK -
Figure 8. HCSL Duty Cycle
10
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CLOCK OUTPUT BUFFER ELECTRICAL CHARACTERISTICS (OUTPUT MODE = LVCMOS)
Unless otherwise noted, VDDOx as shown in Table sections, TA = –40°C to 85°C. ERC = Fast. For test configurations, see
Figure 15 and Figure 16.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
250
MHz
3.3V MODE
fout
Output frequency range
0.0008
VDDOx = 2.97 V, IOH = –0.1 mA (All ERC Settings)
VDDOx = 2.97 V, IOH = –5 mA (ERC = SLOW)
LVCMOS High-level output
voltage
VOH
VDDOx = 2.97 V, IOH = –8 mA (ERC = MED, FAST)
2.9
V
2.4
V
2.2
V
VDDOx = 2.97 V, IOH = –6 mA (ERC = SLOW)
VDDOx = 2.97 V, IOH = –10 mA (ERC = MED)
VDDOx = 2.97 V, IOH = –12 mA (ERC = FAST)
VDDOx = 2.97 V, IOL = 0.1 mA (All ERC Settings)
VDDOx = 2.97 V, IOL = 5 mA (ERC = SLOW)
LVCMOS Low-level output
voltage
VOL
VDDOx = 2.97 V, IOL = 8 mA (ERC = MED, FAST)
0.1
V
0.5
V
0.8
V
VDDOx = 2.97 V, IOL = 6 mA (ERC = SLOW)
VDDOx = 2.97 V, IOL = 10 mA (ERC = MED)
VDDOx = 2.97 V, IOL = 12 mA (ERC = FAST)
LVCMOS High-level output
current
IOH
LVCMOS Low-level output
current
IOL
tPLH, tPHL
Propagation Delay
tSLEW-RATE
Output rise/fall slew rate
tjitt-add
Additive Jitter
VDDOx = 3.3 V, VO = 0.5 V; TA = 25°C
–73
VDDOx = 3.3 V, VO = 1.0 V; TA = 25°C
–64
VDDOx = 3.3 V, VO = 1.65 V; TA = 25°C
–49
VDDOx = 3.3 V, VO = 2.8 V; TA = 25°C
78
VDDOx = 3.3 V, VO = 2.3 V; TA = 25°C
72
VDDOx = 3.3 V, VO = 1.65 V; TA = 25°C
58
mA
5
ERC = Slow, 20% to 80%, fout = 100 MHz, CL = 8 pF
3
ERC = Fast, 20% to 80%, fout = 250 MHz, CL = 8 pF
6
fOUT = 100 MHz, 10k-20M integration bandwidth
(1)
Output Skew
odc
Output Duty Cycle (2), (3)
fOUT = 100 MHz; Pdiv = 1
tOE
Output enable to stable clock
output
Pin mode. fout = 100 MHz, device in active mode with
outputs disabled, OE asserted
tPD
PD de-asserted to stable clock
output
tPU
Time from power applied to
stable clock output (4)
ns
1.2
ERC = Medium 20% to 80%, fout = 100 MHz, CL = 8 pF
tsk(o)
(1)
(2)
(3)
(4)
mA
45%
V/ns
280
fs
90
ps
55%
2
µs
Host mode, fout = 100 MHz, device in power down mode,
PD de-asserted
10
µs
Pin mode, fout = 100 MHz, OE asserted, measured from
time VDD is valid to stable output.
1
ms
The tsk(o) specification is only valid for equal loading with identical edge rates and output supply voltages..
Assumes 50% duty cycle at the input(s)
odc depends on output rise and fall time (tR/tF).
Parameter depends significantly on power supply design and supply voltage rise time.
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CLOCK OUTPUT BUFFER ELECTRICAL CHARACTERISTICS (OUTPUT MODE = LVCMOS)
(Continued)
Unless otherwise noted, VDDOx as shown in Table sections, TA = –40°C to 85°C. ERC = Fast. For test configurations, see
Figure 15 and Figure 16.
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
UNIT
0.00
08
250
MHz
2.5V MODE
fout
Output frequency range
VDDOx = 2.375 V, IOH = -0.1 mA (All ERC Settings)
VDDOx = 2.375 V, IOH = -4 mA (ERC = SLOW)
LVCMOS High-level output
voltage
VOH
VDDOx = 2.375 V, IOH = - 6 mA (ERC = MED, FAST)
VDDOx = 2.375 V, IOH = -5 mA (ERC = SLOW)
VDDOx = 2.375 V, IOH = - 8 mA (ERC = MED, FAST)
2.2
1.7
V
1.6
V
VDDOx = 2.375 V, IOL = 0.1 mA (All ERC Settings)
VDDOx = 2.375 V, IOH = 4 mA (ERC = SLOW)
LVCMOS Low-level output
voltage
VOL
VDDOx = 2.375 V, IOH = 6 mA (ERC = MED, FAST)
VDDOx = 2.375 V, IOH = 5 mA (ERC = SLOW)
VDDOx = 2.375 V, IOL = 10 mA (ERC = MED, FAST)
LVCMOS High-level output
current
IOH
LVCMOS Low-level output
current
IOL
tPLH, tPHL
VDDOx = 2.5 V, VO = 0.5 V; TA = 25°C
–45
VDDOx = 2.5 V, VO = 0.9 V; TA = 25°C
–39
VDDOx = 2.5 V, VO = 1.25 V; TA = 25°C
–32
VDDOx = 2.5 V, VO = 2.0 V; TA = 25°C
50
VDDOx = 2.5 V, VO = 1.65 V; TA = 25°C
47
VDDOx = 2.5 V, VO = 1.25 V; TA = 25°C
40
Propagation delay
0.8
ERC = Medium 20% to 80%, fout = 100 MHz, CL = 8 pF
1.4
Output rise/fall slew rate
tjitt-add
Additive jitter
tsk(o)
Output skew (1)
odc
Output Duty Cycle (2) (3)
fOUT = 100 MHz; Pdiv = 1
tOE
Output enable to stable clock
output
Pin mode. fout = 100 MHz, device in active mode with
outputs disabled, OE asserted
tPD
PD de-asserted to stable clock
output
tPU
Time from power applied to
stable clock output (4)
ERC = Fast, 20% to 80%, fout = 250 MHz, CL = 8 pF
12
V
0.5
V
0.7
V
mA
mA
5.5
ERC = Slow, 20% to 80%, fout = 100 MHz, CL = 8 pF
tSLEW-RATE
(1)
(2)
(3)
(4)
0.1
ns
V/ns
4
fOUT = 100 MHz, 10k-20M integration bandwidth
45%
280
fs
90
ps
55%
2
µs
Host mode, fout = 100 MHz, device in power down mode,
PD de-asserted
10
µs
Pin mode, fout = 100 MHz, OE asserted, measured from
time VDD is valid to stable output.
1
ms
The tsk(o) specification is only valid for equal loading with identical edge rates and output supply voltages..
Assumes 50% duty cycle at the input(s)
odc depends on output rise and fall time (tR/tF).
Parameter depends significantly on power supply design and supply voltage rise time.
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CLOCK OUTPUT BUFFER ELECTRICAL CHARACTERISTICS (OUTPUT MODE = LVCMOS)
(Continued)
Unless otherwise noted, VDDOx as shown in Table sections, TA = –40°C to 85°C. ERC = Fast. For test configurations, see
Figure 15 and Figure 16.
PARAMETER
TEST CONDITIONS
MIN
TYP MAX
0.0008
250
UNITS
1.8V MODE
fout
Output Frequency Range
VDDOx = 1.7 V, IOH = –0.1 mA (All ERC Settings)
MHz
1.6
VDDOx = 1.7 V, IOH = –1.5 mA (ERC = SLOW)
VDDOx = 1.7 V, IOH = –3 mA (ERC = MED)
LVCMOS High-level output
voltage
VOH
1.4
V
1.1
V
VDDOx = 1.7 V, IOH = –4 mA (ERC = FAST)
VDDOx = 1.7 V, IOH = –3 mA (ERC = SLOW)
VDDOx = 1.7 V, IOH = –5 mA (ERC = MED)
VDDOx = 1.7 V, IOH = –8 mA (ERC = FAST)
VDDOx = 1.7 V, IOL = 0.1 mA (All ERC Settings)
0.1
V
0.3
V
0.6
V
VDDOx = 1.7 V, IOL = 2 mA (ERC = SLOW)
VDDOx = 1.7 V, IOL = 3 mA (ERC = MED)
LVCMOS Low-level output
voltage
VOL
VDDOx = 1.7 V, IOL = 4 mA (ERC = FAST)
VDDOx = 1.7 V, IOL = 3 mA (ERC = SLOW)
VDDOx = 1.7 V, IOL = 5 mA (ERC = MED)
VDDOx = 1.7 V, IOL = 8 mA (ERC = FAST)
IOH
LVCMOS High-level output
current
VDDOx = 1.8 V, VO = 0.5 V; TA = 25°C
–23
VDDOx = 1.8 V, VO = 0.9 V; TA = 25°C
–18
IOL
LVCMOS Low-level output
current
VDDOx = 1.8 V, VO = 1.4 V; TA = 25°C
27
VDDOx = 1.8 V, VO = 0.9 V; TA = 25°C
23
tPLH, tPHL
Propagation delay
tSLEW-RATE
tjitt-add
Output rise/fall slew rate
Additive jitter
mA
6.8
ERC = Slow, 20% to 80%, fout = 100 MHz, CL = 8 pF
0.5
ERC = Medium 20% to 80%, fout = 100 MHz, CL = 8 pF
0.8
ERC = Fast, 20% to 80%, fout = 250 MHz, CL = 8 pF
2.7
fOUT = 100 MHz, 10k-20M integration bandwidth
(1)
tsk(o)
Output skew
odc
Output duty cycle (2), (3)
fOUT = 100 MHz; Pdiv = 1, ERC = MED, FAST
tOE
Output enable to stable clock
output
Pin mode. fout = 100 MHz, device in active mode with
outputs disabled, OE asserted
tPD
PD de-asserted to stable clock
output
tPU
Time from power applied to
stable clock output (4)
(1)
(2)
(3)
(4)
mA
45%
ns
V/ns
350
fs
130
ps
55%
2
µs
Host mode, fout = 100 MHz, device in power down mode,
PD de-asserted
10
µs
Pin mode, fout = 100 MHz, OE asserted, measured from
time VDD is valid to stable output.
1
ms
The tsk(o) specification is only valid for equal loading with identical edge rates and output supply voltages.
Assumes 50% duty cycle at the input(s)
odc depends on output rise and fall time (tR/tF).
Parameter depends significantly on power supply design and supply voltage rise time.
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TEST CONFIGURATIONS
Oscilloscope
High
Impedance
Probes
CH2
CH1
50 W
100 W
LVDS
50 W
Figure 9. CDCUN1208LP LVDS Output - Test Setup
Oscilloscope
CH2
CH1
PCB Trace
50 W
Cable
50 W
LVDS
50 W
SMA
(2)
Figure 10. CDCUN1208LP LVDS Output - Propagation Delay/Skew Measurement Setup
Spec Analyzer
PCB Trace
Cable
50 W
50 W
Cable
BALUN
RF
50 W
SMA
LVDS
50 W
50 W
SMA
(2)
SMA
(2)
50 W (3)
Figure 11. CDCUN1208LP LVDS Output - Phase Noise/Jitter Measurement Setup
Figure 12 shows the configuration used to measure the HCSL buffer characteristics. Either single ended probes
with math or differential probes can be used for differential measurements. The 50Ω differential trace length is up
to 15 inches.
Oscilloscope
High
Impedance
Probes
33.1 W (2)
HCSL
CH1
CH2
50 W
50 W
50 W (2)
2 pF (2)
Figure 12. CDCUN1208LP HCSL Output – Measurement Configuration with Load
14
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Oscilloscope
CH1
CH2
PCB Trace
50 W
50 W
HCSL
50 W
SMA
(2)
Figure 13. CDCUN1208LP HCSL Output – Propagation Delay/Skew Measurement
Spec Analyzer
BALUN
Cable
PCB Trace
50 W
Cable
RF
50 W
HCSL
50 W
SMA
50 W
50 W (2)
SMA
(2)
50 W
SMA
(2)
Figure 14. CDCUN1208LP HCSL Output – Phase Noise/Jitter Measurement Configuration
Oscilloscope
450 W
LVCMOS
PCB Trace
50 W
Cable
CH2
CH1
50 W
SMA
8 pF
Figure 15. CDCUN1208LP LVCMOS Output – Measurement Configuration
Spec Analyzer
LVCMOS
PCB Trace
50 W
Cable
RF
50 W
SMA
Figure 16. CDCUN1208LP LVCMOS Output – Phase Noise/Jitter Measurement Setup
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Signal Generator
REF
RF
BALUN
Cable
PCB Trace
50 W
50 W
50 W
50 W
100 W
Signal Generator
REF
RF
INx
(a)
50 W
50 W
50 W
50 W
INx
(b)
50 W (2)
Vbias
Figure 17. CDCUN1208LP Universal Input - Differential Mode Measurement Setup
Signal Generator
REF
RF
PCB Trace
50 W
INx
50 W
Figure 18. CDCUN1208LP Universal Input - Single-Ended Mode Measurement Setup
Power Supply
VOUT
Power Supply
IOUT
GND
VOUT
+
IOUT
GND
VOUT
+
VDD
VDD
OUTx
50W (2)
100W
OUTx
OUTx
50W (2)
OUTx
OUTx
REF
CLK
OUTx
OUTx
OUTx
8 pF (2)
A
REF
CLK
OUTx
8 pF (2)
OUTx
8 pF (2)
INx
100W
VDDOx
INx
INx
VDDOx
50W (2)
OUTx
100W
OUTx
8 pF (2)
50W (2)
OUTx
100W
OUTx
8 pF (2)
VDDOx
VDDOx
50W (2)
OUTx
100W
OUTx
8 pF (2)
50W (2)
OUTx
100W
OUTx
8 pF (2)
VDDOx
VDDOx
OUTx
100W
INx
VDDOx
OUTx
50W (2)
(a) HCSL
+
VDDOx
A
50W (2)
VDDOx
INx
OUTx
VDDOx
A
INx
IOUT
GND
VDD
OUTx
VDDOx
REF
CLK
Power Supply
OUTx
VDDOx
100W
OUTx
(b) LVDS
8 pF (2)
(c) LVCMOS
Figure 19. CDCUN1208LP Power Consumption Measurement Setup
16
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PERFORMANCE CHARACTERISTICS
3.5
VOH - High Level Output Voltage - V
3
VDDOx = 3.3 V
2.5
VDDOx = 1.8 V
2
VDDOx = 2.5 V
1.5
1
0.5
0
-80
-70
-60
-50
-40
-30
IOH - High Level Output Current - mA
-20
-10
0
Figure 20. High Level Output Voltage vs. Current - LVCMOS Mode
3.5
VDDOx = 3.3 V
VOL - Low Level Output Voltage - V
3
2.5
VDDOx = 2.5 V
2
VDDOx = 1.8 V
1.5
1
0.5
0
0
10
20
30
40
50
IOL - Low Level Output Current - mA
60
70
80
Figure 21. Low Level Output Voltage vs. Current - LVCMOS Mode
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3.5
VDD = 3.3 V,
CL = 8 pF,
TA = 25°C
LVCMOS Output Signal Swing - V
ERC_FAST
3
ERC_MED
2.5
ERC_SLOW
2
1.5
1
0
50
100
150
200
250
300
350
400
fOUT - MHz
Figure 22. CDCUN1208LP LVCMOS Signal Swing Characteristics (3.3V Mode)
LVCMOS Output Signal Swing - V
2.5
2
ERC_FAST
1.5
ERC_MED
ERC_SLOW
1
VDD = 2.5 V,
CL = 8 pF,
TA = 25°C
0.5
0
50
100
150
200
250
300
350
400
fOUT - MHz
Figure 23. CDCUN1208LP LVCMOS Signal Swing Characteristics (2.5V Mode)
18
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2
VDD = 1.8 V,
CL = 8 pF,
TA = 25°C
LVCMOS Output Signal Swing - V
ERC_FAST
1.5
ERC_MED
1
ERC_SLOW
0.5
0
0
50
100
150
200
250
300
350
400
fOUT - MHz
Figure 24. CDCUN1208LP LVCMOS Signal Swing Characteristics (1.8V Mode)
5
VDD = 3.3 V,
ERC = FAST,
TA = 25°C
LVCMOS Output Signal Swing - V
4.5
4
CL = 0 pF
CL = 10 pF
3.5
3
CL = 8 pF
2.5
2
1.5
1
0.5
0
0
50
100
150
200
250
300
350
400
fOUT - MHz
Figure 25. CDCUN1208LP LVCMOS Capacitive Load Drive Characteristics (3.3V Mode)
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3.5
LVCMOS Output Signal Swing - V
3
VDD = 2.5 V,
ERC = FAST,
TA = 25°C
CL = 10 pF
2.5
2
CL = 0 pF
CL = 8 pF
1.5
1
0.5
0
0
50
100
150
200
250
300
350
400
fOUT - MHz
Figure 26. CDCUN1208LP LVCMOS Capacitive Load Drive Characteristics (2.5V Mode)
3.5
LVCMOS Output Signal Swing - V
3
VDD = 1.8 V,
ERC = FAST,
TA = 25°C
2.5
CL = 8 pF
2
CL = 0 pF
1.5
CL = 10 pF
1
0.5
0
0
50
100
150
200
250
300
350
400
fOUT - MHz
Figure 27. CDCUN1208LP LVCMOS Capacitive Load Drive Characteristics (1.8V Mode)
20
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FUNCTIONAL DESCRIPTION
DEVICE CONTROL USING CONFIGURATION PINS
Figure 28 illustrates and Table 2 lists the CDCUN1208LP device settings using the configuration pins. Some pins
sense three different states (HIGH, LOW, OPEN) according to Figure 28 and DIGITAL INPUT ELECTRICAL
CHARACTERISTICS – OE (SCL), INSEL, ITTP, OTTP, DIVIDE (SDA/MOSI), ERC(ADDR/CS), MODE. The
device samples the state of the pins at power up and configures the device accordingly. Certain pins including
INSEL and OE are sampled continuously; thus changes of state of INSEL or OE controls the device instantly.
VDD
IN2
AUTO
NC
INSEL
IN1
VDD
HCSL
VDD
OTTP
LVCMOS
NC
HCSL
LVCMOS
NC
LVDS
ITTP
LVDS
OUT1P
IN1P
OUT1N
INMUX
IN1N
IN2P
OUT2P
OUT2N
/1,/2,/4,/8
IN2N
~
~
~ ~
~
~
VDD
NC
/4
/1
OUT8P
DIVIDE
OUT8N
/2
OE
VDD
MODE (PINS)
Fast
CDCUN1208LP
ERC
Medium
NC
Slow
Figure 28. CDCUN1208LP Pin Configuration Overview
Table 2. CDCUN1208LP Pin Configuration Summary
PIN NAME
PIN NUMBER
DEFINITION
DEVICE CONFIGURATION
DETAILS
DEVICE OUTPUTS
OTTP
19
Output Type Setting
See Table 3
ERC
31
Edge Rate Control
See Table 4
OE
32
Device Global Output Enable
See Table 5
DEVICE INPUTS
ITTP
8
Input Type Setting
See Table 6
DIVIDE
1
IN2 Input Divider Control
See Table 7
INSEL
2
Input Multiplexer Setting
See Table 8
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Configuration of Output Type (OTTP)
Table 3 shows how to set the output buffer type using the OTTP pin. This setting affects all device outputs
equally. Certain combinations of output buffers include a dedicated power supply pin which must be properly
bypassed. If the device output configuration is set to LVCMOS, then the supply voltage applied establishes the
switching thresholds corresponding to the supply provided according to CLOCK OUTPUT BUFFER
ELECTRICAL CHARACTERISTICS (OUTPUT MODE = LVCMOS). For example, if OUT1 and OUT2 are
supplied with a 1.8V power supply via the VDDO1 pin, the switching thresholds are set to the 1.8V logic domain.
The system may have other logic supplies (1.8V, 2.5V, or 3.3V) connected to the device on different output
buffer supply domains simultaneously. This enables the device to clock devices operating on different supplies
without the need for external logic level translation buffers. The CDCUN1208LP automatically adjusts the
switching thresholds corresponding to these common logic power supply voltages. For more information
regarding the power supplies for the output section, see DEVICE POWER SUPPLY CONNECTIONS AND
SEQUENCING.
Table 3. CDCUN1208LP Pin Configuration of Output Type
OTTP (Pin 19)
OUTPUT TYPE
LOW
LVDS
HIGH
HCSL
OPEN
LVCMOS
Configuration of Edge Rate Control (ERC)
The CDCUN1208LP supports Edge Rate Control (ERC) used to tailor jitter and EMI performance from device
outputs. Table 4 shows the edge rate control setting. This setting affects all device outputs equally. Each edge
rate setting is unique to the output buffer type selected as described in CLOCK OUTPUT BUFFER
CHARACTERISTICS (OUTPUT MODE = LVDS), CLOCK OUTPUT BUFFER CHARACTERISTICS (OUTPUT
MODE = HCSL), and CLOCK OUTPUT BUFFER ELECTRICAL CHARACTERISTICS (OUTPUT MODE =
LVCMOS).
Table 4. CDCUN1208LP Pin Configuration of Output Edge Rate
ERC (Pin 31)
OUTPUT EDGE RATE
LOW
SLOW
HIGH
MEDIUM
OPEN
FAST
Control of Output Enable (OE)
Table 5 shows how the output enable pin controls the device outputs. The OE pin is sampled continuously so
that the application may turn on/off the output buffers at any time.
Table 5. CDCUN1208LP Pin Control of Output Enable
(1)
22
OE (Pin 32)
OUTPUT ENABLE
LOW
DISABLED
HIGH
ENABLED
OPEN
RESERVED (1)
Leaving the Output Enable pin OPEN will cause the CDCUN1208LP to malfunction. This pin must be
driven high or low at all times
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INPUT PORTS (IN1, IN2)
Configuration of the Input Type (ITTP)
Table 6 describes how to set the input buffers to the appropriate switching levels using the ITTP pin. For proper
input termination, see Figure 43.
Table 6. CDCUN1208LP Pin Control of Input Type (ITTP)
ITTP (Pin 8)
ITTP SETTING
LOW
LVDS
HIGH
HCSL
OPEN
LVCMOS
Configuration of the IN2 Divider (INDIV)
Table 7 describes how to set the input divider using the DIVIDE pin. If the /8 setting is desired, then this feature
is accessed via the host configuration method only refer to section DEVICE CONTROL USING THE HOST
INTERFACE.
Table 7. CDCUN1208LP Pin Control of INDIV Divider
DIVIDE (Pin 1)
INDIV DIVIDER SETTING
LOW
/2
HIGH
/4
OPEN
/1
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SMART INPUT MULTIPLEXER (INMUX)
The Smart Multiplexer supports manual and automatic switching between IN1 and IN2. If enabled, the Smart
Multiplexer switches automatically between clock inputs based on a prioritization scheme shown in Table 8. If
using the Smart Multiplexer Auto Mode, the frequencies of the clocks applied to the smart multiplexer via IN1 and
IN2 (via the divider) may differ by up to 20%. The phase relationship between clock inputs has no restriction. The
smart multiplexer includes signal conditioning that provides glitch suppression.(1)
Upon the detection of a loss of signal on the input with higher priority, the smart multiplexer switches over to the
other clock input on the first incoming rising edge. During this switching operation, the output of the smart
multiplexer is low. Upon restoration of the higher priority clock, the smart multiplexer waits until it detects four
complete cycles from the higher priority clock prior to switching the output of the smart multiplexer back to the
higher priority clock. During this switching operation, the output of the smart multiplexer remains high until the
next falling edge as shown in Figure 29.
Pin Configuration of the Smart Input Multiplexer (INMUX)
Table 8 shows how to control the Smart Input Multiplexer. In Pin Configuration mode, the INSEL pin is sampled
continuously so that the application may select the input clock at any time.
Table 8. Control of INMUX via the INSEL Pin
INSEL(Pin 2)
IN1 BUFFER SETTING
IN2 BUFFER SETTING
LOW
ON and selected by INSEL Multiplexer
OFF
OFF
ON and selected by INSEL Mux
HIGH
OPEN
Smart Multiplexer selects input. IN1 is the primary input (it has the highest priority, therefore if it is available,
the smart multiplexer selects IN1)
PRI _REF
SEC _REF
Internal
Reference Clock
Primary Clock
Secondary Clock
Primary Clock
Figure 29. CDCUN1208LP Smart Multiplexer Operation
(1)
24
This implementation does not implement a phase build-out mechanism; rather, analog filtering insuring a smooth transition at device
outputs.
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DEVICE CONTROL USING THE HOST INTERFACE
Host configuration mode affords a greater degree of flexibility. Unlike pin configuration mode in which the pin
settings affect the entire device, host configuration mode enables the user to apply different settings to each
input and output port as depicted in Figure 30. This includes the ability to mix and match output type, edge rate
control, and output enable settings. The host interface is enabled/selected by strapping the MODE pin either high
(for I2C) or low (for SPI) and resetting the device. Additional device features are accessible only through the host
interface as well. For instance, the user can configure the input divider (IDIV) to /8 in host configuration mode
only. Additionally, the system can power down the device through device registers.
OE and INSEL in Host Configuration Mode
In host configuration mode, the OE pin is no longer available; therefore buffers are controlled individually via the
host interface. The input multiplexer can be controlled either via the pin or via the device registers in accordance
with Table 11.
LVCMOS
VDD
GND
Voltage
Regulator
LVCMOS
Power
Management
3.3V
LVCMOS
OUT2N
INSEL
LVCMOS
LVCMOS
IN1P
1.8V
IN2P
/1,/2,/4,/8
INMUX
IN1N
LVDS
LVDS
IN2N
LVDS
LVDS
3.3V
LVDS
Interface
&
Control
VDD
NC
PINS
I2C
Registers
SPI
LVDS
Microcontroller /
FPGA/DSP
LVDS
LVDS
3.3V
MODE
HCSL
HCSL
SPI
CDCUN1208LP
Figure 30. CDCUN1208LP Host Configuration – Typical Application
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When the host interface is enabled, certain pins take on alternative functions according to Table 9.
Table 9. CDCUN1208LP Host Configuration Pins
PIN NAME
ALT PIN NAME
IN
IN PIN MODE
HOST MODE (MODE = OPEN)
MODE
PIN
NUMBER
PIN NAME IN PIN CONFIGURATION
MODE
(only if MODE/Pin 30 is OPEN)
PIN NAME IN HOST PROGRAMMING MODE
(MODE/Pin 30 is tied high or low)
30
Programming Mode
1 = I2C, 0 = SPI,OPEN = Pins (alternative
description applies)
SDA/MOSI
DIVIDE
1
Host Interface Data (I2C), SPI MasterOutput
Slave Input (Data In)
Input Divider Pin Control
MISO
OTTP
19
SPI Master Input Slave Output (DataOut)
Output Type (OTTP) Pin Control
SCL
OE
32
Host Interface Clock
Device Output Enable
1 = Enable, 0 = Disable
ADDR/CS
ERC
31
Host Interface Address (I2C)/Chip Select (SPI)
Output Edge Rate Control
1 = Fast, 0 = Slow, OPEN = Medium
Device
Inputs
OUTn
OUT2
OUT1
INSEL
Output
Control
OE
MODE
High or Low
Pin Configuration Mode
IN2
IN1
CDCUN1208LP
INSEL
OUTn
MISO
SCK
SDA/MOSi
ADDR/CS
OUT2
OUT1
Device
Outputs
Input
Control
CDCUN1208LP
Device
Outputs
Open
IN2
IN1
Power
On
Reset
(POR)
Device
Inputs
OTTP
ERC
Power
On
Reset
(POR)
Input
Host
Interface Control
ITTP
DIVIDE
Output
Settings
Input
Settings
The CDCUN1208LP samples the MODE pin after the device exits the power on reset (POR) state. The device is
placed in the RESET state in one of two ways: a power on reset (POR) circuit automatically resets the device
after power is applied; or through the RESET bit (R15[1]) in register memory (see Table 11). This RESET bit is
only accessable in host configuration mode. If the MODE pin (pin 11) is open (no connection), then the device is
placed in the pin configuration mode and all settings are determined by the state of various pins according to
Table 2 and Figure 28. If the MODE pin is low, then device enables the SPI interface; and, if MODE is high, then
I2C is enabled.
MODE
Host Configuration Mode
Figure 31. CDCUN1208LP Pin and Host Configuration Mode
26
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DEVICE REGISTERS
Device Registers: Register 00-07
Register
Register
Register
Register
Register
Register
Register
Register
00: OUT1
01: OUT2
02: OUT3
03: OUT4
04: OUT5
05: OUT6
06: OUT7
07: OUT8
Table 10. CDCUN1208LP Register 0–7 Bit Definitions
RAM BIT
BIT NAME
RELATED BLOCK
DESCRIPTION / FUNCTION
POWER UP CONDITION
15
14
13
TI RESERVED
TI RESERVED
12
11
10
OUTx CMOS MODE
1 – both sides pseudo differential
0 – both sides in phase
OUTx_CMOS_MODE
9
8
OUTx Edge Rate Control
111 – Medium
100 - Fast
000 - Slow
OUTx_ERC[2:0]
7
6
5
TI RESERVED
4
OUTx_OE[1:0]
3
TI RESERVED
Reg 00:
Reg 01:
Reg 02:
Reg 03:
Reg 04:
Reg 05:
Reg 06:
Reg 08:
2
1
0
OUTx_OTTP[1:0]
OUTx_PD
OUT1
OUT2
OUT3
OUT4
OUT5
OUT6
OUT7
OUT8
OUTx Output Enable
OTTP = LVCMOS
11 – OUT1P: ON | OUT1N: ON
10 – OUT1P: ON |OUT1N: OFF
01 – OUT1P: OFF| OUT1N: ON
00 – OUT1P: OFF| OUT1N: OFF
0
0
0
0
0
0
0
OTTP = Differential (LVDS, HCSL)
00 – OFF
11 - ON
0
OUTx Output Type
11 – HCSL
10 – Reserved
01 – LVCMOS
00 - LVDS
0
OUTx Buffer
1 – Disabled
0 - Enabled
0
0
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Table 11. CDCUN1208LP Registers 11–15 Bit Definitions
REGISTER
Address
BIT NAME
15
TI RESERVED
14
TI RESERVED
13
TI RESERVED
12
TI RESERVED
11
TI RESERVED
10
TI RESERVED
9
TI RESERVED
8
TI RESERVED
0
7
TI RESERVED
0
6
TI RESERVED
5
IN_DIV[1]
4
IN_DIV[0]
3
IN_TYPE[1]
11
RELATED BLOCK
0
Input
(IN2 – Divider)
(1)
12-14
2
IN_TYPE[0]
1
INSEL[1]
0
INSEL[0]
ALL
TI RESERVED
2-15
TI RESERVED
1
RESET
0
PD
15
(1)
28
DESCRIPTION / FUNCTION
POWER UP
CONDITION
RAM BIT
Input
(IN1 and IN2 Type)
Input
(Multiplexer)
Input Divider Control
1 1 = /8
1 0 = /4
0 1 = /2
0 0 = /1
0
Input Type
1 1 = HCSL
1 0 = LVCMOS
0 1 = LVCMOS
0 0 = LVDS
0
Input Multiplexer Control
1 1 = Control via INSEL pin
1 0 = Smart MUX Enabled, IN
1=Primary
0 1 = IN2 Buffer Selected
0 0 = IN1 Buffer Selected
0
0
0
0
Device Reset
1 = Reset Device
0 = Run Device
0
Device Power Down
1 = Device is powered down
0 = Device is active
0
When configuring device inputs as LVCMOS, apply the signal-ended clock signal to INxP and leave INxN either floating or ground it.
The power supply voltage (1.8V, 2.5V, or 3.3V) applied to VDD (pin 5) establishes the switching thresholds for IN1 and IN2 in LVCMOS
mode.
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HOST INTERFACE HARDWARE INFORMATION
SPI Communication
A SPI communication link includes a master and one or more slaves. Table 9 lists the four signal lines that form
a SPI communication link. Figure 32 shows the format for SPI messages. The SPI master (host) initiates
communication by asserting SCS low. Information on SDI/SDO is latched on each rising edge of SCL. The first
bit transmitted on SDI establishes the direction of the SPI transfer. Next, the master transmits the address to be
written/read (up to 15 bits). If the operation is a write, the master transmits 16 data bits on SDI. If the transfer is a
read, the slave transmits 16 data bits on SDO (the master continues to clock the transfer via SCL). Figure 34 and
Table 12 show the timing specifications for SPI.
READ
WRITE
SCS
SCL
SDO
W
A14 A13 A12 A11 A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
SDI
R
A14 A13 A12 A11 A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
Hi-Z
SDO
D15 D14 D13 D12 D11 D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
D6
D5
D4
D3
D2
D1
D0
Don’t Care
D15 D14 D13 D12 D11 D10
D9
D8
D7
Figure 32. SPI Message Format
CDCUN1208LP SPI Addressing
READ
WRITE
Figure 33 shows how to construct the address field for SPI messages to/from the CDCUN1208LP. The device is
assigned a 4-bit fixed address (0001b). In order for the host to communicate with the CDCUN1208LP, the
address must include this fixed value in the correct position for the device to recognize the message.
SCS
SCL
SDI
W
A14 A13 A12 A11
A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
SDI
R
A14 A13 A12 A11
A10
A9
A8
A7
A6
A5
A4
A3
A2
A1
A0
SDO
Hi-Z
D15 D14 D13 D12 D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
D6
D5
D4
D3
D2
D1
D0
Don’t Care
D15 D14 D13 D12 D11
D10
D9
D8
D7
lsb
msb
0
0
0
1
0
0
SPI Fixed Address
0
0
0
0
0
A3 A2 A1 A0
CDCUN1208LP Register Address
Figure 33. CDCUN1208LP Device Addressing - SPI Mode
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Writing to the CDCUN1208LP
To initiate a SPI data transfer, the master (host) asserts the SCS (serial chip select) pin low (see Figure 32). The
first rising edge of the clock signal (SCL) transfers the bit presented on the SDI pin of the CDCUN1208LP. This
bit signals if a read (first bit high) or a write (first bit low) will transpire. The master shifts data to the slave with
each rising edge of SCL. Following the W/R bit are 4 fixed bits followed by 11 bits that specify the address of the
target register in the register file (see Figure 33). The 16 bits that follow are the data payload. If the master sends
an incomplete message, (i.e. the master de-asserts the SCS pin high prior to a complete message transmission),
then the slave aborts the transfer, and device makes no changes to the register file or the hardware. The master
signals the slave of the completed transfer and disables the SPI port by de-asserting the SCS pin high.
Reading from the CDCUN1208LP
As with the write operation, the master first initiates a SPI transfer by asserting the SCS pin low. The host signals
a read operation by shifting a logical high in the first bit position, signaling the slave that the master is initiating a
read data transfer from the slave. Thereafter, the master specifies the address of interest according to Figure 33.
During the 16 clock cycles that follow, the slave presents the data from the register specified in the first half of
the message on the SDO pin. The master signals the slave that the transfer is complete by de-asserting the SCS
pin high.
Block Write/Read Operation
The CDCUN1208LP supports a block write and block read operation. The master need only specify the lowest
address of the sequence of addresses that the host needs to access. The CDCUN1208LP will automatically
increment the internal register address pointer if the SCS pin remains active low after the SPI port finishes the
initial 32-bit transmission sequence. Each transmission of 16 bits (a data payload width) results in the slave
automatically incrementing the address pointer (provided the SCS pin remains active low for all sequences).
t1
t4
t5
SCL
t2
SDI
A31
t3
A30
D1
D0
DON’T CARE
t6
SDO
D15
DON’T CARE
D1
D0
t7
SCS
t8
Figure 34. SPI Timing Diagram
Table 12. SPI Timing Specifications
SYMBOL
PARAMETER
MIN
TYP
MAX
UNITS
20
MHz
fClock
Clock Frequency for the SCL
t1
SCS to SCL setup time
10
ns
t2
SDI to SCL setup time
10
ns
t3
SDO to SCL hold time
10
ns
t4
SCL high duration
25
ns
t5
SCL low duration
25
ns
t6
SCL to SDO Setup time
10
ns
t7
SCS Pulse Width
20
ns
t8
SCL to SCS release time
10
ns
30
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I2C Communication
The CDCUN1208LP incorporates an I2C port compliant with I2C Bus Specification V2.1 (7-bit addressing). Some
highlights are contained herein to provide clarity with respect to how communication between the host and the
CDCUN1208LP is facilitated. The I2C bus comprises two signals (clock – SCL, and data – SDA). I2C implements
a master-slave protocol and supports multi-master implementations. Unlike SPI that implements a chip select
signal for device level addressing and separate data signals for transmit and receive, I2C embeds the device
address in the serial data stream. Because of this, devices that reside on the I2C must have a unique bus
address. I2C also uses the protocol to control the direction of data flow through the data signaling line.
Message Transmission
Data and Address Bits
When transmitting address or data bits, the transmitter must only change the state of SDA when SCL is low.
During the time that SCL is high, SDA must be stable (no transitions).
SDA
SCL
SDA Stable,
Data Valid
SDA State
Change
Permitted
Figure 35. I2C Data/Address Bit Transmission
Special Symbols – Start (S) and Stop (P)
Messages are framed by the master by generating a START and a STOP symbol. The START symbol is
signaled by transitioning the SDA line from high to low while the SCL line is high. The STOP symbol is signaled
by transitioning the SDA line from low to high while the SCL line is high.
~
~
MESSAGE BODY
SDA
~
~
~
~
SCL
START
STOP
2
Figure 36. I C Bus START and STOP Symbol Generation
Special Symbols – Acknowledge (ACK)
The acknowledge symbol must be sent by the receiver during the 9th clock cycle after the transmitter sends a
byte of data. The transmitter allows the SDA pin to go high and the receiver pulls the line low to acknowledge the
receipt of the byte (leaving the SDA high indicates that the byte was not received). If this occurs the transmitter
issues a STOP and retransmits the message. If the receiver is not prepared to receive another byte, it can
suspend transmission by holding the SDA line low during the ACK time slot. When the receiver is ready to
receive another byte, it releases the SDA line.
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Generic Message Frame
Figure 37 shows a typical format for I2C messages. The message frame is bracketed by the START and STOP
symbols (both generated by the master). If a START symbol has not been transmitted, then the bus is
considered ‘available’. If a START symbol has been transmitted and a STOP symbol has not been transmitted,
the bus is considered ‘busy’. The first 8 bits transmitted include the R/W bit and a 7-bit I2C address field. The
reception of each byte grouping that is transmitted must be acknowledged by the receiver. Next, the high byte of
the data pay load is transmitted (MSB first) followed by an acknowledgement by the receiver. Finally the low byte
is sent. After acknowledgement, the master sends a STOP symbol to end the message frame.
~
~
~
~
~
~
SDA
1-7
8
9
I2C
ADDRESS
R/W
ACK
~
~
~
~
~
~
START
~
~
~
~
~
~
SCL
1-7
8
9
1-7
ACK
DATA
(HIGH
BYTE)
8
9
ACK
DATA
(LOW
BYTE)
STOP
Figure 37. I2C Message Format
CDCUN1208LP Message Format
Figure 38 shows the format of addressing and flow control for I2C messages to/from the CDCUN1208LP. A
message includes two address fields. The I2C Address is used to support multiple devices on the bus (each
device must have a unique I2C address). The Register Address specifies which register of the device identified
by the I2C Address is to be written/read.
Read: 1
Write: 0
1
0
I2C Address
R/W
7 Bits
1 Bit
1
0
CDCUN1208LP
I2C Address
0
A
C
K
A0
Y/B
Slave Address
7 Bits
1 Bit
0
0
Set by Pin 31
(ADDR)
0
A
C
K
~
~
0
~
~
S
T
A
R
T
Message
Addressing
and Control
Byte: 1
Block: 0
A3 A2 A1 A0
CDCUN1208LP
Register Address
Figure 38. CDCUN1208LP I2C Message - Addressing
CDCUN1208LP Device Addressing (I2C Address)
Figure 38 outlines the construction of the I2C Address shown in Figure 37. The highest 6 bits are assigned to the
target device family (are unique to a specific target device family) and are ‘hard wired’. The lowest address bit
(A0) corresponds to address bit that can be set via pin 31 on the CDCUN1208LP (see Table 9). This allows up to
two CDCUN1208LPs to reside on the same I2C bus. The next 8 bits transmitted is called the Register Address.
32
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CDCUN1208LP Device Addressing (Register Address)
Likewise, Figure 38 shows the format of the register address field of the I2C message. The first bit determines if
the transfer is a byte or a block (more than one byte). The CDCUN1208LP register width is 16 bits (2 bytes),
therefore, generally block addressing is used to access each register in its entirety. Because the I2C protocol
requires that the slave address is a 7-bit field, the leading 3-bits are all ‘0’ while the trailing 4-bits specify the
device register of interest.
I2C Master/Slave Handshaking
Figure 39 shows the handshaking between the master (host) and the slave (CDCUN1208LP) that the I2C
protocol supports. In all cases, the master drives the SCL (clock line); however, depending on the direction of
transfer/acknowledgement, the master or the slave device drives SDA (data line).
WRITE
Word
READ
Word
S
T
A
R
T
I2C Address
S
T
A
R
T
I2C Address
7 Bits
7 Bits
W
R
I
T
E
B
W
R
I
T
E
B
A L
A
0 C 0OC Slave Address C
K K
K
7 Bits
A L
A
0 C 0OC Slave Address C
K K
K
7 Bits
Data
(High Byte)
S
T
O
P
S
T
A
R
T
A
C
K
A
C
I2C Address
K
7 Bits
Data
(Low Byte)
A
R
1EA C
D
K
A
C
K
S
T
O
P
Data
(High Byte)
Slave Drives SDA
A
C
K
Data
(Low Byte)
A
C
K
S
T
O
P
Master Drives SDA
Figure 39. I2C Master/Slave Handshaking Example
Block Read/Write
For “Block Write/Read” operations, the bytes are accessed in sequential order from lowest to highest byte (with
most significant bit first) with the ability to stop after any complete byte has been transferred. The start address of
the transfer is specified in the same way a single word transfer is initiated.
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I2C Timing
Figure 40 and Table 13 provide details regarding the timing requirements for I2C:
STOP
ACK
START
tW(SCLL)
tW(SCLH)
tr(SM)
STOP
tf(SM)
~
~
VIH(SM)
SCL
VIL(SM)
~
~
th(START)
tSU(START)
tr(SM)
tSU(SDATA )
th(SDATA )
tSU(STOP)
tf(SM)
tBUS
~
~
~
~
VIH(SM)
SDA
VIL(SM)
~
~
Figure 40. I2C Timing Diagram
Table 13. I2C Timing Requirements
SYMBOL
PARAMETER
MIN
MAX
UNITS
0
100
kHz
fSCL
SCL Clock Frequency
tsu(START)
START Setup Time (SCL high before SDA low)
4.7
µs
th(START)
START Hold Time (SCL low after SDA low)
4.0
µs
tw(SCLL)
SCL Low-pulse duration
4.7
µs
tw(SCLH)
SCL High-pulse duration
4.0
th(SDA)
SDA Hold Time (SDA valid after SCL low)
tsu(SDA)
SDA Setup Time
tr
SCL / SDA input rise time
tf
SCL / SDA input fall time
tsu(STOP)
STOP Setup Time
4.0
µs
tBUS
Bus free time between a STOP and START condition
4.7
µs
34
0
µs
3.45
250
ns
1000
300
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ns
ns
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APPLICATION INFORMATION
PCI EXPRESS APPLICATIONS
Figure 41 shows a typical application in which the receiver is off board. The PCIe Specification (CEM2.0)
requires that all source termination is on the motherboard (not on the daughter card). For this reason, the
termination resistors are placed as shown. Additionally, source resistors are employed to eliminate ringing. In this
case, ZL can vary between 40Ω and 60Ω and RS can range from 22Ω to 33Ω.
RS (2)
Motherboard Traces
1" Trace
PCIe
Connector
ZL (2)
CL = 2 pF (2)
Figure 41. Typical Configuration – Off Board Receiver
Figure 42 shows a typical application in which the receiver is on-board. In this case, series resistors are not
required to eliminate ringing as proper termination is achieved. In this case two termination resistors, ZL = 49.9Ω
are placed close to the receiver.
Motherboard
Traces
1" Trace
ZL (2)
Figure 42. Typical Configuration – On Board Connection
DEVICE POWER SUPPLY CONNECTIONS AND SEQUENCING
VDD (pin 5) is the core power supply of the device while VDDOx (pins 11, 14, 22, and 27) provide power for the
output sections. The core supply must be present either before the application of the output power supplies or be
present simultaneously. Applying an output power supply voltage on any of the VDDOx pins prior to the
application of power to the core supply pin will potentially result in improper device operation.
VDDO2 (pin 14) and VDDO4 (pin 27) provide power for OUT1/OUT2 and OUT7/OUT8 respectively. Additionally,
these pins provide power to integrated voltage regulators that condition power for two banks of outputs. For
example, the regulator associated with OUT1–OUT4 receives power from the VDDO2 pin. Consequently, if the
application requires one or two outputs from a bank of four, then the application must use OUT3/OUT4 and apply
power via VDDO2 (1). Likewise, the regulator that conditions power for OUT5–OUT8 receives power from VDDO4
(pin 27). If the application uses subset of OUT5–OUT8, then OUT7/OUT8 must be used. For example, if the
application will use 6 of the 8 output channels, then VDDO1, VDDO2, and VDDO4 (along with OUT1–OUT4, and
OUT7–OUT8) must be used. If the application requires the use of 7 of the 8 output channels, the
VDDO1–VDDO4 are used, and OUT1–OUT7 or OUT1–OUT6 and OUT8 could be used.
(1)
If OUT1 or OUT2 are used and VDDO1 is powered but not VDDO2, the CDCUN1208LP will not function properly. Likewise, if OUT5 or
OUT6 are used and VDDO3 is powered but not VDDO4, then the device will not function properly either.
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Copyright © 2012, Texas Instruments Incorporated
Product Folder Link(s) :CDCUN1208LP
35
CDCUN1208LP
SCAS928 – MAY 2012
www.ti.com
DEVICE INPUTS (IN1, IN2)
Figure 43 shows how to interface certain common signaling formats to the device inputs of the CDCUN1208LP.
This entails both proper signal termination as well as input buffer configuration via the input type (ITTP) pin.
CDCUN1208LP
INxP
~
~
INxN
HCSL
100W
INxN
~
~
~
~
LVDS
INxN
CDCUN1208LP
INxP
~
~
~
~
LVCMOS
CDCUN1208LP
INxP
50W (2)
VDD
LVCMOS
NC
VDD
HCSL
ITTP
LVDS
LVCMOS
NC
HCSL
ITTP
VDD
LVDS
LVCMOS
HCSL
ITTP
NC
LVDS
Figure 43. Common Interfaces to Device Inputs – DC Coupling
spacer
36
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Copyright © 2012, Texas Instruments Incorporated
Product Folder Link(s) :CDCUN1208LP
PACKAGE OPTION ADDENDUM
www.ti.com
30-May-2012
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package
Drawing
Pins
Package Qty
Eco Plan
(2)
Lead/
Ball Finish
MSL Peak Temp
(3)
CDCUN1208LPRHBR
ACTIVE
QFN
RHB
32
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-2-260C-1 YEAR
CDCUN1208LPRHBT
ACTIVE
QFN
RHB
32
250
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-2-260C-1 YEAR
Samples
(Requires Login)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
29-May-2012
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
CDCUN1208LPRHBR
QFN
RHB
32
3000
330.0
12.4
5.3
5.3
1.5
8.0
12.0
Q2
CDCUN1208LPRHBT
QFN
RHB
32
250
180.0
12.4
5.3
5.3
1.5
8.0
12.0
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
29-May-2012
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
CDCUN1208LPRHBR
QFN
RHB
32
3000
346.0
346.0
29.0
CDCUN1208LPRHBT
QFN
RHB
32
250
210.0
185.0
35.0
Pack Materials-Page 2
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