XICOR X25F047S

X25F047
4K
512 x 8 Bit
SPI SerialFlash with Block LockTM Protection
FEATURES
DESCRIPTION
• 1MHz Clock Rate
• SPI Modes (0,0 & 1,1)
• 512 x 8 Bits
—16 Byte Small Sector Program Mode
• Low Power CMOS
—<1µA Standby Current
—<3mA Active Current during Program
—<400µA Active Current during Read
• 1.8V to 3.6V or 5V “Univolt” Read and Program
Power Supply Versions
• Block Lock Protection
—Block Lock Protect 0, any 1/4, 1st 1/2, First or
Last Sector of SerialFlash Array
• Built-in Inadvertent Program Protection
—Power-Up/Power-Down Protection Circuitry
—Program Enable Latch
—Program Protect Pin
• Self-Timed Program Cycle
—5ms Program Cycle Time (Typical)
• High Reliability
—Endurance: 100,000 Cycles/Byte
—Data Retention: 100 Years
—ESD: 2000V on all pins
• 8-Lead SOIC Package
• 8-Lead MSOP Package
• 8-Lead TSSOP Package
• 8-Pin Mini-DIP Package
The X25F047 is a CMOS 4K-bit SerialFlash, internally
organized as 512 x 8. The X25F047 features a Serial
Peripheral Interface (SPI) and software protocol
allowing operation on a simple four-wire bus. The bus
signals are a clock input (SCK) plus separate data in (SI)
and data out (SO) lines. Access to the device is
controlled through a chip select (CS) input, allowing any
number of devices to share the same bus.
There are eight options for programmable, nonvolatile,
Block Lock Protection available to the end user. These
options are implemented via special instructions
programmed to the part. The X25F047 also features a
PP pin that can be used for hardwire protection of the
part, disabling all programming attempts, as well as a
Program Enable Latch that must be set before a program
operation can be initiated.
The X25F047 utilizes Xicor’s proprietary Direct WriteTM
cell, providing a minimum endurance of 100,000 cycles
per sector and a minimum data retention of 100 years.
FUNCTIONAL DIAGRAM
DATA REGISTER
SI
Y DECODE LOGIC
SO
16
SCK
COMMAND
DECODE
AND
CONTROL
LOGIC
X
DECODE
LOGIC
8
32
SERIALFLASH
ARRAY
(512 x 8)
CS
PP
PROGRAM CONTROL LOGIC
HIGH VOLTAGE
CONTROL
7005 FRM 01.3
Xicor, Inc. 1994, 1995, 1996 Patents Pending
7005-0.9 5/7/97 T4/C0/D1
1
Characteristics subject to change without notice
X25F047
PIN DESCRIPTIONS
PIN CONFIGURATION
Serial Output (SO)
SO is a push/pull serial data output pin. During a read
cycle, data is shifted out on this pin. Data is clocked out
by the falling edge of the serial clock.
*0.197"
Serial Input (SI)
SI is a serial data input pin. All opcodes, byte addresses,
and data to be programmed to the memory are input on
this pin. Data is latched by the rising edge of the serial
clock.
CS
1
SO
2
PP
3
V SS
4
X25F047
8
V CC
7
NC
6
SCK
5
SI
*0.244"
8-LEAD MSOP
Serial Clock (SCK)
The Serial Clock controls the serial bus timing for data
input and output. Opcodes, addresses, or data present
on the SI pin are latched on the rising edge of the clock
input, while data on the SO pin change after the falling
edge of the clock input.
0.120"
SO
1
8
V CC
CS
VSS
2
7
NC
6
SI
PP
4
5
SCK
3
X25F047
0.193"
8-LEAD TSSOP
Chip Select (CS)
When CS is HIGH, the X25F047 is deselected and the
SO output pin is at high impedance and unless a nonvolatile write cycle is underway, the X25F047 will be in the
standby power mode. CS LOW enables the X25F047,
placing it in the active power mode. It should be noted
that after power-up, a HIGH to LOW transition on CS is
required prior to the start of any operation.
0.122"
NC
1
8
SCK
VCC
CS
2
7
SI
6
V SS
SO
4
5
PP
3
X25F047
0.252"
*SOIC Measurement
Program Protect (PP)
When PP is LOW, nonvolatile writes to the X25F047 are
disabled, but the part otherwise functions normally. When
PP is held HIGH, all functions, including nonvolatile
writes, operate normally. PP going LOW while CS is still
LOW will interrupt a programming cycle to the X25F047.
If the nonvolatile write cycle has already been initiated,
PP going low will have no affect on this cycle.
Symbol
The X25F047 is a 512 x 8 SerialFlash designed to interface directly with the synchronous Serial Peripheral Interface (SPI) of many popular microcontroller families.
The X25F047 contains an 8-bit instruction register. It is
accessed via the SI input, with data being clocked in on
the rising edge of SCK. CS must be LOW and the PP
input must be HIGH during the entire operation. Table 1
contains a list of the instructions and their opcodes. All
instructions, addresses and data are transferred MSB first.
Description
CS
Chip Select Input
SO
Serial Output
SI
Serial Input
Data input is sampled on the first rising edge of SCK
after CS goes LOW. SCK is static, allowing the user to
stop the clock and then start it again to resume operations where left off.
Serial Clock Input
PP
Program Protect Input
VSS
Ground
VCC
Supply Voltage
NC
No Connect
7005 FRM 02
PRINCIPLES OF OPERATION
PIN NAMES
SCK
Not to scale
8-LEAD SOIC/DIP
Program Enable Latch
The X25F047 contains a “Program Enable” latch. This
latch must be SET before a program operation is initiated. The PREN instruction will set the latch and the
PRDI instruction will reset the latch (Figure 4). This latch
is automatically reset upon a power-up condition and
after the completion of a sector program cycle.
7005 FRM T01
2
X25F047
clocks. CS must go LOW and remain LOW for the duration of the operation. The host must program 16 bytes in
each write with the restriction that these bytes reside on
one sector. If the address counter reaches the end of the
sector and the clock continues, or if fewer than 16 bytes
are clocked in, the contents of the sector cannot be guaranteed.
Block Lock Protection
There are eight Block Lock Protection options. The predefined blocks and associated address ranges are protected by programming the appropriate two byte
Program Status instruction to the device (Table 1 and
Figure 6). Once a Block Lock protect instruction has
been completed, that Block Lock Protection setup is held
in a nonvolatile Status Register (Figure 1) until the next
Program Status instruction is issued. The sections of the
memory array that are Block Lock protected can be read
but not programmed until Block Lock Protection is
removed or changed.
For a sector program operation to be completed, CS can
only be brought HIGH after bit 0 of the last data byte to
be programmed is clocked in. If it is brought HIGH at any
other time, the program operation will not be completed.
(Figure 5)
Figure 1. Status Register/Block Lock Protection Byte
7
6
0
0
5
4
3
2
1
0
0
0
0
BL2
BL1
BL0
Read Status Operation
If there is not a nonvolatile write in progress, the Read
Status instruction returns the Block Lock Protection byte
from the Status Register which contains the Block Lock
Protection bits BL2-BL0 (Figure 1). The Block Lock Protection bits define the Block Lock Protection condition
(Figure 1 and Table1). The other bits are reserved and
will return "0’s" when read (Figure 3).
Note: Bits [7:3] specified to be “0’s”
7005 FRM T02.1
Read Sequence
When reading from the SerialFlash memory array, CS is
first pulled LOW to select the device. The 8-bit READ
instruction is transmitted to the X25F047, followed by the
16-bit address, of which the last 9 bits are used (bits
[15:9] specified to be "0’s"). After the READ opcode and
address are sent, the data stored in the memory at the
selected address is shifted out on the SO line. The data
stored in memory at the next address can be read
sequentially by continuing to provide clock pulses. The
address is automatically incremented to the next higher
address after each byte of data is shifted out. When the
highest address is reached (01FFh), the address counter
rolls over to address 0000h, allowing the read cycle to be
continued indefinitely. The read operation is terminated
by taking CS HIGH (Figure 2).
If a nonvolatile write is in progress, the Read Status
instruction returns the status of the internal write operation on SO. When the nonvolatile write cycle is completed, the status register data is again read out.
During a nonvolatile write in progress, the SO pin will be
set HIGH. At the end of the nonvolatile write cycle, SO is
set to output the current bit from the status register.
Clocking SCK is valid during a nonvolatile write in
progress, but is not necessary. If the SCK line is clocked,
the pointer to the status register is also clocked, even
though the SO pin shows the status of the nonvolatile
write operation (Figure 3). When the pointer reaches the
end of the eight bit status register, it “rolls over” to the first
bit of the register.
Sector Program Sequence
Prior to any attempt to program data into the X25F047,
the “Program Enable” latch must first be set by issuing
the PREN instruction (Table 1 and Figure 4). CS is first
taken LOW. Then the PREN instruction is clocked into
the X25F047. After all eight bits of the instruction are
transmitted, CS must then be taken HIGH. If the user
continues the program operation without taking CS HIGH
after issuing the PREN instruction, the program operation will be ignored.
Program Status Operation
Prior to any attempt to perform a Program Status Operation, the PREN instruction must first be issued. This
instruction sets the “Program Enable” latch and allows
the part to respond to a Program Status sequence (Figure 6). The Program Status instruction follows and consists of one command byte followed by one Block Lock
Protection byte (Figure 1). This byte contains the Block
Lock Protection bits BL2-BL0. The rest of the bits [7:3]
are unused and must be programmed as “0’s”. Bringing
CS HIGH after the two byte Program Status instruction
initiates a nonvolatile write to the Status Register. Programming more than one byte to the Status Register will
overwrite the previously programmed Block Lock Protection byte (Table 1).
To program data to the SerialFlash memory array, the
user then issues the PROGRAM instruction, followed by
the 16 bit address of the first location in the sector and
then the 16 bytes of data to be programmed. Only the last
9 bits of the address are used and bits [15:9] are specified to be "0’s". The entire write operation takes 152
3
X25F047
Data Protection
The following circuitry has been included to prevent inadvertant programming of data:
Operational Notes
The X25F047 powers up in the following state:
• The device is in the low power, standby state.
• A HIGH to LOW transition on CS is required to enter
an active state and receive an instruction.
• SO pin is at high impedance.
• The “Program Enable” latch is reset.
• The “Program Enable” latch is reset upon power-up.
• A PREN instruction must be issued to set the “Program
Enable” latch.
• CS must come HIGH at the proper clock count in order
to start a program cycle.
Table 1. Instruction Set and Block Lock Protection Byte Definition
Instruction
Format*
Instruction Name and Operation
0000 0110
PREN: Set the Program Enable Latch (Program Enable Operation)
0000 0100
PRDI: Reset the Program Enable Latch (Program Disable Operation)
0000 0001
PROGRAM STATUS Instruction - followed by:
Block Lock Protection Byte: (Figure 1)
0000 0000 --->NO PROTECT: ---------------------------------->None of the Array
0000 0001 --->PROTECT Q1: --- 0000h - 007Fh ---------->Lower Quadrant (Q1)
0000 0010 --->PROTECT Q2: --- 0080h - 00FFh----------->Q2
0000 0011 --->PROTECT Q3: --- 0100h - 017Fh----------->Q3
0000 0100 --->PROTECT Q4: --- 0180h - 01FFh----------->Upper Quadrant (Q4)
0000 0101 --->PROTECT H1: --- 0000h - 00FFh----------->Lower Half of the Array (H1)
0000 0110 --->PROTECT S0: --- 0000h - 000Fh----------->Lower Sector (S0)
0000 0111 --->PROTECT Sn: --- 01F0h - 01FFh----------->Upper Sector (Sn)
0000 0101
READ STATUS: Reads Block Lock Protection & nonvolatile write in progress status on SO Pin
0000 0010
PROGRAM: Program operation followed by address and data
0000 0011
READ: Read operation followed by address
7005 FRM T03.1
*Instructions are shown with MSB in leftmost position. Instructions are transferred MSB first.
Figure 2. Read Operation Sequence
CS
0
1
2
3
4
5
6
7
8
9
20 21 22 23 24 25 26 27 28 29 30
SCK
READ INSTRUCTION
(1 BYTE)
SI
SO
BYTE ADDRESS (2 BYTE)
15 14
3
HIGH IMPEDANCE
2
1
DATA OUT
0
7
6
5
4
3
2
1
0
7005 FRM F03.1
4
X25F047
Figure 3. Read Status Operation Sequence
CS
0
1
2
3
4
5
6
7
...
SCK
READ STATUS
INSTRUCTION
...
SI
NONVOLATILE WRITE IN PROGRESS
B
L
2
SO
SO HIGH DURING
NONVOLATILE
WRITE CYCLE
SO = STATUS REG BIT
WHEN NO NONVOLATILE
WRITE CYCLE
Figure 4. Program Enable/Program Disable Sequence
CS
0
1
2
3
4
5
6
7
SCK
INSTRUCTION
(1 BYTE)
SI
SO
HIGH IMPEDANCE
7005 FRM 05.1
5
B
L
1
B
L
0
...
7005 FRM 04.2
X25F047
Figure 5. Sector Program Operation Sequence
CS
0
1
2
3
4
5
6
7
8
9
10
20 21 22 23 24 25 26 27 28 29 30 31
SCK
PROGRAM
INSTRUCTION
BYTE ADDRESS
(2 BYTE)
15 14 13
SI
3
2
DATA BYTE 1
1
0
7
6
5
4
3
2
1
0
150
151
149
148
147
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47
146
145
CS
1
0
SCK
DATA BYTE 2
SI
7
6
5
4
3
DATA BYTE 3
2
1
0
7
6
5
4
3
DATA BYTE 16
2
1
6
0
5
4
3
2
7005 FRM 07.3
Figure 6. Program Status Operation Sequence
CS
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15
SCK
PROGRAM STATUS
INSTRUCTION
BLOCK LOCK
PROTECTION BYTE
SI
SO
0
0
0
0
0
B
L
2
B
L
1
B
L
0
HIGH IMPEDANCE
7005 ILL F08.2
ABSOLUTE MAXIMUM RATINGS*
Temperature under Bias ...................–65°C to +135°C
Storage Temperature ........................–65°C to +150°C
Voltage on any Pin with
Respect to VSS.................................... –1V to +7V
D.C. Output Current ..............................................5mA
Lead Temperature
(Soldering, 10 seconds) .............................. 300°C
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
This is a stress rating only and the functional operation of
the device at these or any other conditions above those
indicated in the operational sections of this specification
is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
6
X25F047
RECOMMENDED OPERATING CONDITIONS
Supply Voltage
Limits
+70°C
X25F047
1.8V to 3.6V
+85°C
X25F047-5
4.5V to 5.5V
Temperature
Min.
Max.
Commercial
0°C
Industrial
–40°C
7005 FRM T05
7005 FRM T04
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.)
Limits
Symbol
Parameter
Min.
Max.
Units
Test Conditions
ICC1
VCC Read Current (Active)
1
mA
SCK = VCC x 0.1/VCC x 0.9 @ 1MHz,
SO = Open, CS = VSS
ICC2
VCC Write Current (Active)
3
mA
SCK = VCC x 0.1/VCC x 0.9 @ 1MHz,
SO = Open, CS = VSS
ISB
VCC Supply Current (Standby)
1
µA
CS = VCC - 0.1, VIN = VSS or VCC
ILI
Input Leakage Current
10
µA
VIN = VSS to VCC
ILO
Output Leakage Current
10
µA
VOUT = VSS to VCC
VIL(1)
Input LOW Voltage
–0.5
VCC x 0.3
V
VIH(1)
Input HIGH Voltage
VCC x 0.7
VCC + 0.5
V
VOL1
Output LOW Voltage
0.4
V
VCC = 5.5V, IOL = 2.1mA
VOH1
Output HIGH Voltage
V
VCC = 5.5V, IOH = –1.0mA
VOL2
Output LOW Voltage
V
VCC = 3.6V, IOL = 1.0mA
VOH2
Output HIGH Voltage
V
VCC = 3.6V, IOH = –0.4mA
VOL3
Output LOW Voltage
V
VCC = 1.8V, IOL = 0.5mA
VOH3
Output HIGH Voltage
V
VCC = 1.8V, IOH = –0.25mA
VCC – 0.8
0.4
VCC – 0.4
0.4
VCC – 0.2
7005 FRM T06
POWER-UP TIMING
Symbol
Parameter
Min.
Max.
Units
tPUR(3)
Power-up to Read Operation
1
ms
tPUW(3)
Power-up to Write Operation
5
ms
7005 FRM T07.1
CAPACITANCE TA = +25°C, f = 1MHz, VCC =5V.
Symbol
(2)
COUT
CIN(2)
Parameter
Max.
Units
Conditions
Output Capacitance (SO)
8
pF
VOUT = 0V
Input Capacitance (SCK, SI, CS, PP)
6
pF
VIN = 0V
7005 FRM T08
Notes: (1) VIL Min. and VIH Max. are for reference only and are not 100% tested.
(2) This parameter is periodically sampled and not 100% tested.
(3) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated. These parameters
are periodically sampled and not 100% tested.
7
X25F047
A.C. TEST CONDITIONS
EQUIVALENT A.C. LOAD CIRCUIT
5V
Input Pulse Levels
3.3V
VCC x 0.1 to VCC x 0.9
Input Rise and Fall Times
2061Ω
2696Ω
OUTPUT
3025Ω
OUTPUT
5288Ω
30pF
10ns
VCC X 0.5
Input and Output Timing Level
7005 FRM T09
30pF
7005 FRM 09.1
A.C. CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.)
Data Input Timing
Symbol
Parameter
Min.
Max.
Units
0
1
MHz
fSCK
Clock Frequency
tCYC
Cycle Time
1000
ns
tLEAD
CS Lead Time
500
ns
tLAG
CS Lag Time
500
ns
tWH
Clock HIGH Time
400
ns
tWL
Clock LOW Time
400
ns
tSU
Data Setup Time
100
ns
tH
Data Hold Time
100
ns
tRI(4)
Data In Rise Time
2
µs
tFI(4)
Data In Fall Time
2
µs
tCS
CS Deselect Time
tWC(5)
Write Cycle Time
µs
2.0
10
ms
7005 FRM T10
Data Output Timing
Symbol
Parameter
Min.
Max.
Units
0
1
MHz
fSCK
Clock Frequency
tDIS
Output Disable Time
500
ns
tV
Output Valid from Clock LOW
400
ns
tHO
Output Hold Time
tRO(4)
Output Rise Time
300
ns
tFO(4)
Output Fall Time
300
ns
0
ns
7005 FRM T11
Notes: (4) This parameter is periodically sampled and not 100% tested.
(5) tWC is the time from the rising edge of CS after a valid program sequence has been sent to the end of the self-timed internal nonvolatile write cycle.
8
X25F047
Figure 7. Serial Output Timing
CS
t CYC
t LAG
t WH
SCK
tV
MSB OUT
SO
SI
t HO
t WL
t DIS
MSB–1 OUT
LSB OUT
ADDR
LSB IN
7005 FRM 10
Figure 8. Serial Input Timing
tCS
CS
t LEAD
t LAG
SCK
tSU
SI
tH
tRI
MSB IN
t FI
LSB IN
HIGH IMPEDANCE
SO
7005 FRM 11
SYMBOL TABLE
WAVEFORM
INPUTS
OUTPUTS
Must be
steady
Will be
steady
May change
from Low to
High
Will change
from Low to
High
May change
from High to
Low
Will change
from High to
Low
Don’t Care:
Changes
Allowed
N/A
Changing:
State Not
Known
Center Line
is High
Impedance
9
X25F047
PACKAGING INFORMATION
8-LEAD PLASTIC SMALL OUTLINE GULL WING PACKAGE TYPE S
0.150 (3.80)
0.158 (4.00)
0.228 (5.80)
0.244 (6.20)
PIN 1 INDEX
PIN 1
0.014 (0.35)
0.019 (0.49)
0.188 (4.78)
0.197 (5.00)
(4X) 7°
0.053 (1.35)
0.069 (1.75)
0.004 (0.19)
0.010 (0.25)
0.050 (1.27)
0.010 (0.25)
0.020 (0.50) X 45°
0.050" TYPICAL
0.050"
TYPICAL
0° – 8°
0.0075 (0.19)
0.010 (0.25)
0.250"
0.016 (0.410)
0.037 (0.937)
FOOTPRINT
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
10
0.030"
TYPICAL
8 PLACES
X25F047
PACKAGING INFORMATION
8-LEAD MINIATURE SMALL OUTLINE GULLWING PACKAGE TYPE M
0.118 ± 0.002
(3.00 ± 0.05)
0.012 + 0.006 / -0.002
(0.30 + 0.15 / -0.05)
0.0256 (0.65) TYP
R 0.014 (0.36)
0.118 ± 0.002
(3.00 ± 0.05)
0.030 (0.76)
0.0216 (0.55)
0.036 (0.91)
0.032 (0.81)
0.040 ± 0.002
(1.02 ± 0.05)
0.007 (0.18)
0.005 (0.13)
7° TYP
0.008 (0.20)
0.004 (0.10)
0.150 (3.81)
REF.
0.193 (4.90)
REF.
NOTE:
1. ALL DIMENSIONS IN INCHES AND (MILLIMETERS)
3003 FRM 01
11
X25F047
PACKAGING INFORMATION
8-LEAD PLASTIC, TSSOP, PACKAGE TYPE V
.025 (.65) BSC
.169 (4.3)
.252 (6.4) BSC
.177 (4.5)
.114 (2.9)
.122 (3.1)
.047 (1.20)
.0075 (.19)
.0118 (.30)
.002 (.05)
.006 (.15)
.010 (.25)
Gage Plane
0° – 8°
Seating Plane
.019 (.50)
.029 (.75)
Detail A (20X)
.031 (.80)
.041 (1.05)
See Detail “A”
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
12
X25F047
PACKAGING INFORMATION
8-LEAD PLASTIC DUAL IN-LINE PACKAGE TYPE P
0.430 (10.92)
0.360 (9.14)
0.260 (6.60)
0.240 (6.10)
PIN 1 INDEX
PIN 1
0.300
(7.62) REF.
HALF SHOULDER WIDTH ON
ALL END PINS OPTIONAL
0.145 (3.68)
0.128 (3.25)
SEATING
PLANE
0.025 (0.64)
0.015 (0.38)
0.065 (1.65)
0.045 (1.14)
0.150 (3.81)
0.125 (3.18)
0.020 (0.51)
0.016 (0.41)
0.110 (2.79)
0.090 (2.29)
0.015 (0.38)
MAX.
0.060 (1.52)
0.020 (0.51)
0.325 (8.25)
0.300 (7.62)
0°
15°
TYP. 0.010 (0.25)
NOTE:
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)
2. PACKAGE DIMENSIONS EXCLUDE MOLDING FLASH
13
X25F047
ORDERING INFORMATION
X25F047
P
T
–X
VCC Range
Blank = 1.8V to 3.6V
5 = 4.5V to 5.5V
Device
Temperature Range
Blank = Commercial = 0°C to +70°C
I = Industrial = –40°C to +85°C
Package
S = 8-Lead SOIC
M = 8-Lead MSOP
V = 8-Lead TSSOP
P = 8-Lead Plastic DIP
Part Mark Convention
8-Lead MSOP
EYWW
XXX
AAH = 1.8 to 3.6V, 0°C to +70°C
AAI = 1.8 to 3.6V, -20°C to +85°C
AAJ = 1.8 to 3.6V, -40°C to +85°C
AAK = 2.5 to 5.5V, 0°C to +70°C
AAL = 2.5 to 5.5V, -40°C to +85°C
AAM = 4.5 to 5.5V, 0°C to +70°C
AAN = 4.5 to 5.5V, -40°C to +85°C
8-Lead TSSOP
EYWW
5F47XX
8-Lead SOIC/PDIP
X25F047 X
XX
Blank = 1.8 to 3.6V, 0°C to +70°C
I = 1.8 to 3.6V, -40°C to +85°C
AE = 2.5 to 5.5V, 0°C to +70°C
AF = 2.5 to 5.5V, -40°C to +85°C
5 = 4.5 to 5.5V, 0°C to +70°C
I5 = 4.5 to 5.5V, -40°C to +85°C
Blank = 8-Lead SOIC
P = 8-Lead Plastic DIP
Blank = 1.8 to 3.6V, 0°C to +70°C
I = 1.8 to 3.6V, -40°C to +85°C
AE = 2.5 to 5.5V, 0°C to +70°C
AF = 2.5 to 5.5V, -40°C to +85°C
5 = 4.5 to 5.5V, 0°C to +70°C
I5 = 4.5 to 5.5V, -40°C to +85°C
LIMITED WARRANTY
Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc.
makes no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the
described devices from patent infringement. Xicor, Inc. makes no warranty of merchantability or fitness for any purpose. Xicor, Inc. reserves the
right to discontinue production and change specifications and prices at any time and without notice.
Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents,
licenses are implied.
U.S. PATENTS
Xicor products are covered by one or more of the following U.S. Patents: 4,263,664; 4,274,012; 4,300,212; 4,314,265; 4,326,134; 4,393,481;
4,404,475; 4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829, 482; 4,874, 967;
4,883, 976. Foreign patents and additional patents pending.
LIFE RELATED POLICY
In situations where semiconductor component failure may endanger life, system designers using this product should design the system with
appropriate error detection and correction, redundancy and back-up features to prevent such an occurence.
Xicor's products are not authorized for use in critical components in life support devices or systems.
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain
life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the
failure of the life support device or system, or to affect its safety or effectiveness.
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