INTEGRAL IZ74LV273

TECHNICAL DATA
IN74LV273
Octal D Flip-Flop with Common Clock and Reset
The IN74LV273 is a low-voltage Si-gate CMOS device and is pin and
function compatible with the 74HC/HCT273.
The IN74LV273 has eight edge-triggered, D-type flip-flops with
individual D inputs and Q outputs. The common clock (CP) and master
reset (MR) inputs load and reset (clear) all flip-flops simultaneously. The
state of each D input, one set-up time before the LOW-to-HIGH clock
transition, is transferred to the corresponding output (Qn) of the flipflop. All outputs will be forced LOW independently of clock or data
inputs by a LOW voltage level on the MR input. The device is useful for
applications where the true output only is required and the clock and
master reset are common to all storage elements.
• Output voltage levels are compatible with input levels of CMOS,
NMOS and TTL ICS
• Supply voltage range: 1.2 to 5.5 V
• Low input current: 1.0 µÀ; 0.1 µÀ at Ò = 25 °Ñ
• High Noise Immunity Characteristic of CMOS Devices
N SUFFIX
PLASTIC DIP
20
1
DW SUFFIX
SO
20
1
ORDERING INFORMATION
IN74LV273N
IN74LV273DW
IZ74LV273
Plastic DIP
SOIC
chip
TA = -40° to 125° C for all packages
PIN ASSIGNMENT
LOGIC DIAGRAM
RESET
1
20
V CC
Q0
2
19
Q7
D0
3
18
D7
D1
4
17
D6
Q1
5
16
Q6
Q2
6
15
Q5
D2
7
14
D5
D3
8
13
D4
Q3
9
12
Q4
10
11
CLOCK
GND
FUNCTION TABLE
Inputs
PIN 20=VCC
PIN 10 = GND
Output
Reset
Clock
D
Q
L
X
X
L
H
H
H
H
L
L
X
no change
X
no change
H
L
H
H= high level
L = low level
X = don’t care
Z = high impedance
INTEGRAL
1
IN74LV273
MAXIMUM RATINGS *
Symbol
VCC
IIK *
Value
Unit
DC supply voltage
-0.5 to +7.0
V
1
Input diode current
±20
mA
2
Output diode current
±50
mA
Output source or sink current
±25
mA
VCC current
±50
mA
GND current
±50
mA
Power dissipation per package:
Plastic DIP * 4
SO * 4
750
500
IOK *
IO *
Parameter
3
ICC
IGND
PD
Tstg
mW
Storage Temperature
TL
-65 to +150
°C
260
°C
Lead Temperature, 1.5 mm (Plastic DIP Package), 0.3 mm (SO
Package) from Case for 4 Seconds
*
Maximum Ratings are those values beyond which damage to the device may occur.
Functional operation should be restricted to the Recommended Operating Conditions.
* 1 VI < -0.5 V or VI > VCC + 0.5 V.
* 2 VO < -0.5 V or VO > VCC + 0.5 V.
* 3 -0.5 V < VO < VCC + 0.5 V.
* 4 Derating - Plastic DIP: - 12 mW/°C from 70° to 125°C
SO Package: - 8 mW/°C from 70° to 125°C
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
1.2
5.5
V
VCC
DC Supply Voltage
VI
DC Input Voltage
0
VCC
V
VO
DC Output Voltage
0
VCC
V
TA
Operating Temperature, All Package Types
-40
+125
°C
tr, t f
Input Rise and Fall Time (Figure 1)
0
0
0
0
500
200
100
50
ns
0 V ≤ VCC ≤ 2.0 V
2.0 V ≤ VCC ≤ 2.7 V
2.7 V ≤ VCC ≤ 3.6 V
3.6 V ≤ VCC ≤ 5.5 V
This device contains protection circuitry to guard against damage due to high static voltages or electric
fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages
to this high-impedance circuit. For proper operation, VIN and VOUT should be constrained to the range GND≤(VIN or
VOUT)≤VCC.
Unused inputs must always be tied to an appropriate logic voltage level (e.g., either GND or VCC). Unused
outputs must be left open.
INTEGRAL
2
IN74LV273
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)
Symbol
Parameter
Test
VCC
conditions
V
Guaranteed Limit
25°C
-40°C
85°C
125°C
min
max
min
max
min
max
min
max
Unit
VIH
HIGH level
input
voltage
1.2
2.0
2.7
3.0
3.6
4.5
5.5
0.9
1.4
2.0
2.0
2.0
3.15
3.85
-
0.9
1.4
2.0
2.0
2.0
3.15
3.85
-
0.9
1.4
2.0
2.0
2.0
3.15
3.85
-
0.9
1.4
2.0
2.0
2.0
3.15
3.85
-
V
VIL
LOW level
output
voltage
1.2
2.0
2.7
3.0
3.6
4.5
5.5
-
0.3
0.6
0.8
0.8
0.8
1.35
1.65
-
0.3
0.6
0.8
0.8
0.8
1.35
1.65
-
0.3
0.6
0.8
0.8
0.8
1.35
1.65
-
0.3
0.6
0.8
0.8
0.8
1.35
1.65
V
VOH
HIGH level VI = VIH or VIL
output
IO = -100 µÀ
voltage
1.2
2.0
2.7
3.0
3.6
4.5
5.5
1.05
1.85
2.55
2.85
3.45
4.35
5.35
-
1.05
1.85
2.55
2.85
3.45
4.35
5.35
-
1.0
1.8
2.5
2.8
3.4
4.3
5.3
-
1.0
1.8
2.5
2.8
3.4
4.3
5.3
-
V
VI = VIH or VIL
IO = -6 mÀ
3.0
2.48
-
2.48
-
2.40
-
2.20
-
V
VI = VIH or VIL
IO = -12 mÀ
4.5
3.70
-
3.70
-
3.60
-
3.50
-
V
LOW level VI = VIH or VIL
output
IO = 100 µÀ
voltage
1.2
2.0
2.7
3.0
3.6
4.5
5.5
-
0.15
0.15
0.15
0.15
0.15
0.15
0.15
-
0.15
0.15
0.15
0.15
0.15
0.15
0.15
-
0.2
0.2
0.2
0.2
0.2
0.2
0.2
-
0.2
0.2
0.2
0.2
0.2
0.2
0.2
V
VI = VIH or VIL
IO = 6 mÀ
3.0
-
0.33
-
0.33
-
0.40
-
0.50
V
VI = VIH or VIL
IO = 12 mÀ
4.5
-
0.40
-
0.40
-
0.55
-
0.65
V
VOL
II
Input
current
VI = VCC or 0 V
5.5
-
±0.1
-
±0.1
-
±1.0
-
±1.0
µÀ
ICC
Supply
current
VI =VCC or 0 V
IO = 0 µÀ
5.5
-
8.0
-
8.0
-
80
-
160
µÀ
ICC1
Additional VI = VCC – 0.6V
supply
current per
input
2.7
3.6
-
0.2
-
0.2
-
0.5
0.85
mA
INTEGRAL
3
IN74LV273
AC ELECTRICAL CHARACTERISTICS (CL=50 pF, t r=tf=2.5 ns)
Symbol
Parameter
tPHL, tPLH Propagation delay , Clock
to Q
tPHL
Propagation delay , Reset
to Q
CI
Test
VCC
conditions
V
Power dissipation
capacitance (per flip-flop)
-40°C to
25°C
85°C
125°C
min
max
min
max
min
max
Unit
VI = 0 V or V1
Figures 1,4
1.2
2.0
2.7
3.0
4.5
-
150
30
22
17
14
-
150
32
24
19
16
-
150
41
30
24
20
ns
VI = 0 V or V1
Figures 2,4
1.2
2.0
2.7
3.0
4.5
-
160
40
30
23
19
-
160
44
33
26
22
-
160
56
41
33
28
ns
5.0
-
6.0*
-
-
-
-
pF
5.5
-
40*
-
-
-
-
pF
Input capacitance
CPD
Guaranteed Limit
VI = 0 V or VCC
* T = 25oC
TIMING REQUIREMENTS (CL=50 pF, t r=t f=2.5 ns)
Symbol
Parameter
Test
VCC
conditions
V
Guaranteed Limit
-40°C to
25°C
85°C
125°C
min
max
min
max
min
max
Unit
tw
Pulse Width, Clock (low or VI = 0 V or V1
high), Reset (low)
Figures 1,2,4
1.2
2.0
2.7
3.0
4.5
60
28
21
16
12
-
70
34
25
20
16
-
80
41
30
24
20
-
ns
tsu
Setup Time, Data to Clock
VI = 0 V or V1
Figures 3,4
1.2
2.0
2.7
3.0
4.5
40
18
13
11
9
-
50
22
16
13
11
-
60
26
19
15
13
-
ns
trem
Removal Time, Reset to
Clock
VI = 0 V or V1
Figures 2,4
1.2
2.0
2.7
3.0
4.5
5
5
5
5
5
-
5
5
5
5
5
-
5
5
5
5
5
-
ns
th
Hold Time, Clock to Data
VI = 0 V or V1
Figures 3,4
1.2
2.0
2.7
3.0
4.5
50
5
5
5
5
-
50
5
5
5
5
-
50
5
5
5
5
-
ns
INTEGRAL
4
IN74LV273
fc
Clock Frequency
VI = 0 V or V1
Figures 1,4
1.2
2.0
2.7
3.0
4.5
-
2
17
23
30
32
-
1
14
19
24
27
-
1
12
16
20
24
MHz
VOL and VOH are the typical output voltage drop that occur with the output load.
Figure 1. Switching Waveforms
Figure 2. Switching Waveforms
INTEGRAL
5
IN74LV273
Figure 3. Switching Waveforms
Level of a signal, V
Symbol
VCC
1,2
2,0
2,7
3,0
4,5
V1
1,2
2,0
2,7
2,7
4,5
VM
0,6
1,0
1,5
1,5
2,25
TEST POINT
DEVICE
UNDER
TEST
OUTPUT
*
CL
* Includes all probe and jig capacitance
Figure 4. Test Circuit
EXPANDED LOGIC DIAGRAM
INTEGRAL
6
IN74LV273
CHIP PAD DIAGRAM
17
18
16
15
14
1.53 + 0.03
19
13
12
20
11
01
10
Chip marking
25LV273
02
03
09
04
05
06
07
08
Y
(0,0)
1.48 + 0.03
X
Location of marking (mm): left lower corner x=0.119, y=0.082.
Chip thickness: 0.46 ± 0.02 mm, (0.35 ± 0.02 mm – for SOIC).
PAD LOCATION
Pad No
Symbol
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20
Reset
Q0
D0
D1
Q1
Q2
D2
D3
Q3
GND
Clock
Q4
D4
D5
Q5
Q6
D6
D7
Q7
VCC
Location (left lower corner), mm
X
0.1415
0.1415
0.1375
0.4535
0.6245
0.7800
0.9520
1.2685
1.2480
1.2650
1.2650
1.2425
1.2465
0.9520
0.7800
0.6245
0.4535
0.1160
0.1440
0.1190
Y
0.6270
0.3880
0.1515
0.1190
0.1190
0.1190
0.1180
0.1185
0.2960
0.5160
0.8430
1.0820
1.3165
1.3120
1.3110
1.3110
1.3110
1.3115
1.1350
0.9140
Pad size, mm
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
0.100 x 0.100
Note: Pad location is given as per passivation layer.
INTEGRAL
7