74ACT11112 DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET SCAS064A – D3339, JUNE 1989 – REVISED APRIL 1993 • • • • • • • D OR N PACKAGE (TOP VIEW) Inputs Are TTL-Voltage Compatible Fully Buffered to Offer Maximum Isolation From External Disturbance Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise EPIC (Enhanced-Performance Implanted CMOS) 1-mm Process 500-mA Typical Latch-Up Immunity at 125°C Package Options Include Plastic Small-Outline Packages and Standard Plastic 300-mil DIPs 1PRE 1Q 1Q GND 2Q 2Q 2PRE 2J t 1 16 2 15 3 14 4 13 5 12 6 11 7 10 8 9 1J 1K 1CLK 1CLR VCC 2CLR 2CLK 2K description This device contains two independent J-K negative-edge-triggered flip-flops. A low level at the PRE or CLR input sets or resets the outputs regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the J and K inputs meeting the setup time requirements are transferred to the outputs on the negative-going edge of the clock pulse. Clock triggering occurs at a voltage level and is not directly related to the fall time of the clock pulse. Following the hold-time interval, data at the J and K inputs may be changed without affecting the levels at the outputs. These versatile flip-flops can perform as toggle flip-flops by tying J and K high. The 74ACT11112 is characterized for operation from – 40°C to 85°C. FUNCTION TABLE OUTPUTS INPUTS PRE CLR CLK J K Q Q L H X X X H L H L X X X L H L L X X X H H H H ↓ L L Q0 H H ↓ H L H L H H ↓ L H L H H H ↓ H H TOGGLE H H H X X Q0 { { Q0 Q0 † This configuration is nonstable; that is, it will not persist when either PRE or CLR returns to the inactive (high) level. EPIC is a trademark of Texas Instruments Incorporated. Copyright 1993, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 2–1 74ACT11112 DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET SCAS064A – D3339, JUNE 1989 – REVISED APRIL 1993 logic symbol† 1 PRE 1 S 16 1J 1 CLK 1K 1 CLR 2 PRE 2J 2CLK 2 CLR 1Q C1 15 13 7 3 1K 1Q R S 6 8 2J 2Q 10 C2 9 2K 2 1J 14 11 5 2K 2Q R † This symbol is in accordnace with ANSI/IEEE Std 91-1984 and IEC Publication 617-42. logic diagram, each flip-flop (positive logic) PRE C J C TG Q TG C K CLK C C C C C TG TG C C Q CLR absolute maximum ratings over operating free-air temperature range (unless otherwise noted)‡ Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 7 V Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to VCC + 0.5 V Output voltage range, VO (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to VCC + 0.5 V Input clamp current, IIK (VI < 0 or VI > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 20 mA Output clamp current, IOK (VO < 0 or VO > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 50 mA Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 100 mA Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C ‡ Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability. NOTE 1: The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 2–2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 74ACT11112 DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET SCAS064A – D3339, JUNE 1989 – REVISED APRIL 1993 recommended operating conditions MIN MAX 4.5 5.5 VCC VIH Supply voltage VIL VI Low-level input voltage Input voltage 0 VO IOH Output voltage 0 IOL Dt /Dv Low-level output current TA Operating free-air temperature High-level input voltage 2 High-level output current Input transition rise or fall rate UNIT V V 0.8 V VCC VCC V – 24 mA V 24 mA 0 10 ns/ V – 40 85 °C electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS VCC 4.5 V IOH = – 50 mA VOH IOH = – 24 mA VOL MIN 4.4 4.4 5.5 V 5.4 5.4 4.5 V 3.94 3.8 5.5 V 4.94 4.8 MAX IOL = 50 mA 4.5 V 0.1 0.1 5.5 V 0.1 0.1 4.5 V 0.36 0.44 5.5 V 0.36 0.44 VI = VCC or GND, 3.85 5.5 V IO = 0 VI = VCC or GND UNIT V 5.5 V IOL = 75 mA† VI = VCC or GND DICC‡ TA = 25°C TYP MAX IOH = – 75 mA† IOL = 24 mA II ICC MIN V 1.65 5.5 V ± 0.1 ±1 5.5 V 4 40 mA mA 5.5 V 0.9 1 mA Ci VI = VCC or GND 5V 3.5 pF † Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms. ‡ This parameter is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC. timing requirements over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 1) TA = 25°C MIN MAX fclock Clock frequency tw Pulse duration tsu Setup time before CLK↓ th Hold time after CLK↓ MIN 125 PRE or CLR low 4 4 CLK high or low 4 4 Data high or low 3.5 4.5 2 2 1.5 1.5 PRE or CLR inactive POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 MAX UNIT 125 MHz ns ns ns 2–3 74ACT11112 DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET SCAS064A – D3339, JUNE 1989 – REVISED APRIL 1993 switching characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 1) FROM (INPUT) PARAMETER fmax tPLH tPHL TO (OUTPUT) MIN TA = 25°C TYP MAX MIN 125 PRE or CLR Q or Q CLK Q or Q tPLH tPHL MAX 125 UNIT MHz 1.5 3.6 6.3 1.5 6.8 1.5 4.6 7.4 1.5 8 1.5 4.2 7 1.5 7.7 1.5 4.7 7.4 1.5 8.4 ns ns operating characteristics, VCC = 5 V, TA = 25°C PARAMETER Cpd TEST CONDITIONS Power dissipation capacitance per flip-flop CL = 50 pF, f = 1 MHz TYP UNIT 39 pF PARAMETER MEASUREMENT INFORMATION From Output Under Test tw CL = 50 pF (see Note A) 3V 500 Ω Input 1.5 V 1.5 V 0V VOLTAGE WAVEFORMS LOAD CIRCUIT 3V Input (see Note B) 3V Timing Input (see Note B) 0V tsu Data Input 1.5 V 0V tPHL tPLH 1.5 V th 1.5 V In-Phase Output 50% VCC 3V 1.5 V tPLH tPHL 1.5 V 0V Out-of-Phase Output VOH 50% VCC VOL 50% VCC VOH 50% VCC VOL VOLTAGE WAVEFORMS VOLTAGE WAVEFORMS NOTES: A. CL includes probe and jig capacitance. B. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, ZO = 50 Ω, tr = 3 ns, tf = 3 ns. C. The outputs are measured one at a time with one input transition per measurement. Figure 1. Load Circuit and Voltage Waveforms 2–4 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER’S RISK. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof. Copyright 1998, Texas Instruments Incorporated