Revised November 1999 74ACQ240 • 74ACTQ240 Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs General Description Features The ACQ/ACTQ240 is an inverting octal buffer and line driver designed to be employed as a memory address driver, clock driver and bus oriented transmitter or receiver which provides improved PC board density. The ACQ/ ACTQ utilizes Fairchild’s Quiet Series technology to guarantee quiet output switching and improve dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in addition to a split ground bus for superior performance. ■ ICC and IOZ reduced by 50% ■ Guaranteed simultaneous switching noise level and dynamic threshold performance ■ Guaranteed pin-to-pin skew AC performance ■ Improved latch-up immunity ■ Inverting 3-STATE outputs drive bus lines or buffer memory address registers ■ Outputs source/sink 24 mA ■ Faster prop delays than the standard ACT240 Ordering Code: Order Number Package Number Package Description 74ACQ240SC M20B 20-Lead Small Outline Integrated Circuit (SOIC)JEDEC MS-013, 0.300” Wide Body 74ACQ240SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74ACQ240PC N20A 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide 74ACTQ240SC M20B 20-Lead Small Outline Integrated Circuit (SOIC)JEDEC MS-013, 0.300” Wide Body 74ACTQ240SJ M20D 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74ACTQ240QSC MQA20 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150” Wide Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code. Connection Diagram Pin Descriptions Pin Names Description OE1, OE2 3-STATE Output Enable Inputs I0–I7 Inputs O0–O7 Outputs FACT, Quiet Series, FACT Quiet Series, and GTO are trademarks of Fairchild Semiconductor Corporation. © 1999 Fairchild Semiconductor Corporation DS010234 www.fairchildsemi.com 74ACQ240 • 74ACTQ240 Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs July 1989 74ACQ240 • 74ACTQ240 Logic Symbol IEEE/IEC Truth Tables Inputs OE1 Outputs In (Pins 12, 14, 16, 18) L L H L H L H X Z In (Pins 3, 5, 7, 9) L L H L H L H X Z Inputs OE2 Outputs H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance www.fairchildsemi.com 2 Recommended Operating Conditions −0.5V to +7.0V Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V −20 mA VI = VCC + 0.5V +20 mA Supply Voltage (VCC) −0.5V to VCC + 0.5V DC Input Voltage (VI) VO = VCC + 0.5V ACQ Devices VIN from 30% to 70% of VCC ±50 mA VCC @ 3.0V, 4.5V, 5.5V ±50 mA ACTQ Devices −65°C to +150°C VIN from 0.8V to 2.0V DC Latch-Up Source or VCC @ 4.5V, 5.5V ±300 mA Sink Current 125 mV/ns Minimum Input Edge Rate ∆V/∆t DC VCC or Ground Current per Output Pin (ICC or IGND) 0V to VCC −40°C to +85°C Minimum Input Edge Rate ∆V/∆t −0.5V to VCC + 0.5V DC Output Source Storage Temperature (TSTG) 0V to VCC Operating Temperature (TA) +20 mA or Sink Current (IO) 4.5V to 5.5V Output Voltage (VO) −20 mA DC Output Voltage (VO) 2.0V to 6.0V ACTQ Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V ACQ Junction Temperature (TJ) PDIP 125 mV/ns Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications. 140°C DC Electrical Characteristics for ACQ Symbol VIH VIL VOH Parameter VCC TA = +25°C TA = −40°C to +85°C (V) Typ Guaranteed Limits Minimum HIGH Level 3.0 1.5 2.1 2.1 Input Voltage 4.5 2.25 3.15 3.15 5.5 2.75 3.85 3.85 Maximum LOW Level 3.0 1.5 0.9 0.9 Input Voltage 4.5 2.25 1.35 1.35 5.5 2.75 1.65 1.65 Minimum HIGH Level 3.0 2.99 2.9 2.9 Output Voltage 4.5 4.49 4.4 4.4 5.5 5.49 5.4 5.4 3.0 2.56 2.46 4.5 3.86 3.76 5.5 4.86 4.76 0.002 0.1 0.1 Units Conditions VOUT = 0.1V V or VCC − 0.1V VOUT = 0.1V V or VCC − 0.1V V IOUT = −50 µA VIN = VIL or VIH VOL Maximum LOW Level 3.0 Output Voltage 4.5 0.001 0.1 0.1 5.5 0.001 0.1 0.1 3.0 0.36 0.44 4.5 0.36 0.44 5.5 0.36 0.44 5.5 ±0.1 IOH = −12 mA V IOH = −24 mA IOH = −24 mA (Note 2) V IOUT = 50 µA VIN = VIL or VIH IIN Maximum Input IOL = 12 mA V IOL = 24 mA IOL = 24 mA (Note 2) (Note 4) Leakage Current ±1.0 µA VI = VCC, GND IOLD Minimum Dynamic 5.5 75 mA VOLD = 1.65V Max IOHD Output Current (Note 3) 5.5 −75 mA VOHD = 3.85V Min ICC Maximum Quiescent VIN = VCC or GND (Note 4) Supply Current IOZ Maximum 3-STATE Leakage Current 5.5 4.0 40.0 µA 5.5 ±0.25 ±2.5 µA VI (OE) = VIL, VIH VI = VCC, GND VO = VCC, GND 3 www.fairchildsemi.com 74ACQ240 • 74ACTQ240 Absolute Maximum Ratings(Note 1) 74ACQ240 • 74ACTQ240 DC Electrical Characteristics for ACQ Symbol VOLP Parameter Quiet Output Maximum Dynamic VOL VOLV Quiet Output Minimum Dynamic VOL VCC (Continued) TA = +25°C TA = −40°C to +85°C Units (V) Typ 5.0 1.1 1.5 V 5.0 −0.6 −1.2 V Conditions Guaranteed Limits Figure 1, Figure 2 (Note 5)(Note 6) Figure 1, Figure 2 (Note 5)(Note 6) VIHD Minimum HIGH Level Dynamic Input Voltage 5.0 3.1 3.5 V (Note 5)(Note 7) VILD Maximum LOW Level Dynamic Input Voltage 5.0 1.9 1.5 V (Note 5)(Note 7) Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. Note 5: Plastic DIP package. Note 6: Max number of outputs defined as (n). Data inputs are driven 0V to 5V. One output @ GND. Note 7: Max number of data inputs (n) switching. (n −1) inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. DC Electrical Characteristics for ACTQ Symbol VIH VIL VOH Parameter VCC (V) TA = +25°C Typ TA = −40°C to +85°C Guaranteed Limits Minimum HIGH Level 4.5 1.5 2.0 2.0 Input Voltage 5.5 1.5 2.0 2.0 Maximum LOW Level 4.5 1.5 0.8 0.8 Input Voltage 5.5 1.5 0.8 0.8 Minimum HIGH Level 4.5 4.49 4.4 4.4 Output Voltage 5.5 5.49 5.4 5.4 3.86 3.76 Units V V Conditions VOUT = 0.1V or VCC − 0.1V VOUT = 0.1V or VCC − 0.1V V IOUT = −50 µA V IOH = −24 mA VIN = VIL or VIH 4.5 5.5 VOL 4.86 4.76 Maximum LOW Level 4.5 0.001 0.1 0.1 Output Voltage 5.5 0.001 0.1 0.1 4.5 0.36 0.44 IOH = −24 mA (Note 8) V IOUT = 50 µA V IOL = 24 mA VIN = VIL or VIH IIN Maximum Input Leakage Current IOZ Maximum 3-STATE Leakage Current IOL = 24 mA (Note 8) 5.5 0.36 0.44 5.5 ±0.1 ±1.0 µA 5.5 ±0.25 ±2.5 µA 1.5 mA VI = VCC, GND VI = VIL, VIH VO = VCC, GND VI = VCC − 2.1V ICCT Maximum ICC/Input 5.5 IOLD Minimum Dynamic 5.5 75 mA VOLD = 1.65V Max IOHD Output Current (Note 9) 5.5 −75 mA VOHD = 3.85V Min ICC Maximum Quiescent Supply Current 5.5 40.0 µA VIN = VCC or GND VOLP Quiet Output Maximum Dynamic VOL VOLV Quiet Output Minimum Dynamic VOL 0.6 4.0 5.0 1.1 1.5 V 5.0 −0.6 −1.2 V Figure 1, Figure 2 (Note 10)(Note 11) Figure 1, Figure 2 (Note 10)(Note 11) VIHD Minimum HIGH Level Dynamic Input Voltage 5.0 1.9 2.2 V (Note 10)(Note 12) VILD Maximum LOW Level Dynamic Input Voltage 5.0 1.2 0.8 V (Note 10)(Note 12) Note 8: All outputs loaded; thresholds on input associated with output under test. Note 9: Maximum test duration 2.0 ms, one output loaded at a time. Note 10: Plastic DIP package. Note 11: Max number of Data Inputs defined as (n). n−1 Data Inputs are driven 0V to 3V. One Data Input @ VIN = GND. Note 12: Max number of Data Inputs (n) switching. (n−1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz. www.fairchildsemi.com 4 Symbol Parameter VCC TA = +25°C (V) CL = 50 pF TA = −40°C to +85°C CL = 50 pF (Note 13) Min Typ Max Min Max tPHL Propagation Delay 3.3 2.0 7.0 10.0 2.0 10.5 tPLH Data to Output 5.0 1.5 5.0 6.5 1.5 7.0 tPZL Output Enable Time 3.3 2.5 8.0 12.0 2.5 12.5 5.0 1.5 5.5 8.0 1.5 8.5 3.3 1.0 8.5 13.5 1.0 14.0 5.0 1.0 6.0 9.0 1.0 9.5 tPZH Output Disable Time tPHZ tPLZ tOSHL Output to Output Skew 3.3 1.0 1.5 1.5 tOSLH Data to Output (Note 14) 5.0 0.5 1.0 1.0 Units ns ns ns ns Note 13: Voltage Range 5.0 is 5.0V ± 0.5V Voltage Range 3.3 is 3.3 ± 0.3V. Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. AC Electrical Characteristics for ACTQ Symbol Parameter VCC TA = +25°C (V) CL = 50 pF TA = −40°C to +85°C CL = 50 pF Units (Note 15) Min Typ Max Min Max 5.0 1.5 5.5 7.0 1.5 7.5 ns ns tPHL Propagation Delay tPLH Data to Output tPZL, tPZH Output Enable Time 5.0 1.5 6.5 8.5 1.5 9.0 tPHZ, tPLZ Output Disable Time 5.0 1.0 7.0 9.5 1.0 10.0 ns tOSHL Output to Output Skew tOSLH Data to Output (Note 16) 0.5 1.0 1.0 ns 5.0 Note 15: Voltage Range 5.0 is 5.0V ± 0.5V Note 16: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design. Capacitance Typ Units CIN Symbol Input Capacitance Parameter 4.5 pF VCC = OPEN CPD Power Dissipation Capacitance 70 pF VCC = 5.0V 5 Conditions www.fairchildsemi.com 74ACQ240 • 74ACTQ240 AC Electrical Characteristics for ACQ 74ACQ240 • 74ACTQ240 FACT Noise Characteristics The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. VOLP/VOLV and VOHP/V OHV: • Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture • Measure VOLP and VOLV on the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500Ω. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. VILD and VIHD: • Monitor one of the switching outputs using a 50Ω coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. • First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as V ILD. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and affect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. • Next decrease the input HIGH voltage level, VIH, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as V IHD. • Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. Note 17: VOHV and VOLP are measured with respect to ground reference. Note 18: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf = 3 ns, skew < 150 ps. FIGURE 1. Quiet Output Noise Voltage Waveforms FIGURE 2. Simultaneous Switching Test Circuit www.fairchildsemi.com 6 74ACQ240 • 74ACTQ240 Physical Dimensions inches (millimeters) unless otherwise noted 20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300” Wide Body Package Number M20B 7 www.fairchildsemi.com 74ACQ240 • 74ACTQ240 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M20D www.fairchildsemi.com 8 74ACQ240 • 74ACTQ240 Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150” Wide Package Number MQA20 9 www.fairchildsemi.com 74ACQ240 • 74ACTQ240 Quiet Series Octal Buffer/Line Driver with 3-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300” Wide Package Number N20A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com www.fairchildsemi.com 10