KEC PG05BAUSM_08

SEMICONDUCTOR
PG05BAUSM
TECHNICAL DATA
TVS Diode for ESD
Protection in Portable Electronics
Protection in Portable Electronics Applications.
FEATURES
E
M
Transient protection for data lines to
B
M
IEC 61000-4-2(ESD) 15kV(Air), 8kV(Contact)
D
G
A
Small package for use in portable electronics.
J
2
Suitable replacement for Multi-Layer Varistors in ESD protection applications.
3
1
Protects one I/O or power line.
Low clamping voltage.
H
L
C
Low leakage current.
N
N
K
DIM
A
B
C
D
E
G
H
J
K
L
M
N
MILLIMETERS
_ 0.20
2.00 +
_ 0.15
1.25 +
_ 0.10
0.90 +
0.3+0.10/-0.05
_ 0.20
2.10 +
0.65
0.15+0.1/-0.06
1.30
0.00~0.10
0.70
0.42
0.10 MIN
APPLICATIONS
Cell phone handsets and accessories.
1. (TVS) D1 CATHODE
Microprocessor based equipment.
2. (TVS) D2 CATHODE
Personal digital assistants (PDA’s)
3. COMMON ANODE
Notebooks, desktops, & servers.
Portable instrumentation.
USM
Pagers peripherals.
MAXIMUM RATING (Ta=25
CHARACTERISTIC
Marking
)
SYMBOL
RATING
UNIT
PPK
200
mW
Junction Temperature
Tj
150
Storage Temperature
Tstg
-55 150
Total Power Dissipation
Lot No.
BA
Type Name
3
D1
D2
2
ELECTRICAL CHARACTERISTICS (Ta=25
CHARACTERISTIC
Reverse Stand-Off Voltage
)
SYMBOL
TEST CONDITION
MIN.
TYP.
MAX.
UNIT
VRWM
-
-
-
5
V
6.46
-
7.14
V
VBR
Reverse Breakdown Voltage
1
It=5mA
Reverse Leakage Current
IR
VRWM=5V
-
-
0.5
A
Junction Capacitance
CJ
VR=0V, f=1MHz
-
3
-
pF
2008. 9. 8
Revision No : 3
1/2
PG05BAUSM
POWER DERATION CURVE
1K
110
RATED POWER OR IPP (%)
PEAK PULSE POWER PP P (W)
NON-REPETITIVE PEAK PULSE
POWER VS. PULSE TIME
100
10
1
10
100
90
80
70
60
50
40
Peak Pulse Power
8/20us
30
20
10
0
Average Power
0
100
PULSE DURATION tP (µs)
25
50
75
150
CJ - VR
4
110
(pF)
Waveform
Parameters :
tr=8µs
td=20µs
100
90
80
70
60
50
40
CAPACITANCE CJ
PEAK PULSE CURRENT IPP (%)
125
AMBIENT TEMPERATURE Ta ( C)
PULSE WAVEFORM
e -t
td=lpp/2
30
20
10
0
0
5
10
15
20
TIME (µs)
2008. 9. 8
100
Revision No : 3
25
30
3
2
1
0
0
1
2
3
4
5
REVERSE VOLTAGE VR (V)
2/2