REVISION NUMBER: REV A PAGES: Page 1 of 18 DATE: 10/06/05 PI3041A Contact Image Sensor Preliminary Data Sheet Preliminary PI3041A datasheet PI3041A 300DPI CIS Sensor Chip Engineering Data Sheet Description: Peripheral Imaging Corporation PI3041A CIS, Contact Image Sensor, chip is a 300 dot per inch resolution, linear array image sensor chip. The sensor chip is processed using a CMOS Image Sensing Technology, a possession of ISPL (Image Sensor Product Line) group within AMIS. Designed for cascading multiple chips in a series, the image sensor chips, uses a chipon-board process. They are bonded end-to-end on a printed circuit board (PCB). This bonding process allows the CIS module manufacturers to produce variable CIS module lengths in increments of the chip array lengths. Hence, the modules are easily applied in a large number of document scanners, found in today’s facsimile market. Examples are wide format maps and architectural drawings scanners down to the narrow width scanners, such as, those found in check readers, lotto tickets, entrance gates tickets, etc. This is not to exclude the many office automation equipments, which require an even more variety in scanning widths, as well as, those with special mechanically configurations. Figure 1 is a block diagram of the imaging sensor chip. Each sensor chip consists of 96 detector elements, their associated multiplexing switches, buffers, and a chip selector. The detector's element-to-element spacing is approximately 83.3 µm. The size of each chip without scribe lines is 8080 µm by 380 µm. Each sensor chip has 7 bonding pads. The pad symbols and functions are described in Table 1. 8080 µm Row of 96 Sensors and Video Signal Multiplexers 380 µm Readout Shift Register Buffer SP Buffer CP VDD DGND Chip Select IOUT Buffer AGND EOS Figure 1. PI3041A Block Diagram SYMBOL SP CP VDD DGND IOUT AGND EOS FUNCTION Start Pulse: Input clock to start the line scan. Clock Pulse: Input clock to clock of the Shift Register. Positive Supply: +5 volt supply connected to substrate. Digital Ground: Connection topside common Signal Current Output: Output for video signal current Analog Ground: Connection topside common End of Scan Pulse: Output from the shift register at end of scan. Table 1. Pad Symbols and Functions Page 2 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Bonding Pad Outputs Locations and Die Dimensions Figure 2 shows image sensor’s die dimension and the bonding pad locations for PI3041A Sensor Chip. The location is referenced to the lower left corner of the die. Figure 2. Bonding Pad and Chip Layout: Page 3 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Wafer Scribe Lines Bordering The Die Figure 3 shows the wafer scribe lines bordering the PI3041A Sensor Chip. The wafer thickness is 350µcrons. ` Figure 3. Wafer Scribe Lines Page 4 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Output Circuit Of The Image Sensor The video signal from each photo-site is connected to a common video line on the sensor. Each photo-site is composed of a phototransistor with a series MOS switch connecting its emitter to a common video line. The video line is connected to the pad labeled IOUT. The photo-sites are readout upon the closure of the MOS switch, which is sequentially switched on and off by its internal scanning shift register, see Figure 1, PI3041A Block Diagram. For the clock and timing operation image sensor see Figure 7, Timing Diagram Of The PI3041A Sensor. The photo-sensing element is the base of the phototransistor where it detects and converts the light energy to proportional charges and stores them in its base and collector capacitance. When the MOS switch is activated, the emitter is connected to the video line and acts as source follower, producing an impulse current proportional to the stored charges in the base. This current is a discrete-time analog signal output called the video pixel. The charges in the video pixel are proportional to the light energy impinging in the neighborhood of its photo-sites. Figure 4, Video Pixel Output Structures, show a output structure of four photo-sites out of 128. The multiplexing MOS switch in each photo-site terminates into the output pad, IOUT, through a common video line. As the shift register sequentially accesses each photo-site the charges of the video pixel is sent to the IOUT where they are processed with an external signal conversion circuit. See the follow section, Signal Conversion Circuit. Figure 4. Video Pixel Output Structures Signal Conversion Circuit Figure 5, Video Output Test and Application Circuit is an example of the charge conversion that is used in the CIS modules. It is usually bonded on the same PCB on which the image sensors are bonded. In applications where cost is important factor, this simply circuit provides the cleanest technique in processing the video output. It integrates all the currents from each pixel element onto a capacitor, CAP. It, also, sums the switch edge’s energy along with the signal current pulses, hence minimizes the switching patterns on the video pixels. The summed charges stored on the CAP, produce a pixel voltage. Its voltage amplitude is proportional to the charge from the current pulse and the value of the CAP. Page 5 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Figure 5. Video Output Test and Application Circuit Since switching energies are high frequencies components, they tend to integrate to a 0 value and the remainder adds a constant value to offset the dark level. After the pixel is integrated, the CAP is reset to zero volts by activating the shunt switch, SW, that connects the video line to ground prior to accessing the following pixel element. As it is seen, depicting a typical pixel voltage waveform, in Figure 6, Single Pixel Output Voltage, the shunt time is controlled with CP. Simultaneous to SW activation, the pixel element storage is, also, reset to the dark reference level, hence initializing the pixel for its integration process cycle. The signal pixels Vp(n) is referenced to its Dark Level as it is seen in Figure 6. Figure 6. Single Pixel Video Output Two Test Setups For Specifications And Performance First Setup: The standard specifications are the image sensor tests that are performed on the wafer probe machine where each device on the wafer is tested in production. However, the data in these measurements are measured with a clock frequency at a fixed 500 KHz. Since the pixel rate is equal to the clock rate, the pixel rate is also at 500KHz. The specification under the section Electro-Optical Characteristics (25o C) is the wafer probe specifications, Table 2. Page 6 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Second Setup: The CIS modules made with these devices operate in excess of 5.0 MHz. Accordingly the wafer probe specifications are supplemented with high frequency clocking performance using an A6 length module’s PCB board. Electro-Optical Characteristics (25o C) The electro-optical characteristics of PI3041A imaging sensor chip are listed in Table 2. This is the wafer probe specification used to tests the each die at 25o C. Parameters Number of Photo-elements Pixel-to-pixel spacing Line scanning rate Clock frequency Symbols Output voltage Output voltage non-uniformity Dark output voltage Dark output non-uniformity Adjacent Pixel non-uniformity Chip-to-chip non-uniformity Tint (1) Fclk (2) Typical 128 ~83.3 128/Fclk 500 Units elements µm µs/line KHz Vpavg (3) Up (4) Vd (5) Ud (6) Upadj (7) Ucc (8) 1.85 ± 0.35 ± 7.5 <100 <100 <6.5 ±5 V % mV mV % % Notes See note 2 for higher clock speed. (maximum 5 MHz) Table 2. Electro-Optical Characteristic Notes: (1) (2) (3) Tint stands for the line scanning rate or the integration time. It is determined by the time interval between two start pulses, where the start pulses start the linescan process, as soon as, CP, module clock, acquires it and shifts it into the internal shift register. The minimum integration time in one line scan of the sensor is number of pixel sites divided by its clock frequency. In a CIS module it is the number of sensors times the number of pixel in the sensor, all over the clock frequency. Tint in the wafer probe is set with the calibration procedure use to set the amplitude of Vpavg, see note (3). Fclk is the device’s clock, CP, frequency and it is, also, equal to the pixel rate. In the wafer test Fclk is set to 500 KHz. However, PIC (recently acquired by AMIS) has been successfully mass-producing high frequency CIS modules, using only the wafer test to qualify them. Hence, the devices are constantly tested for their standard high-speed performance with each A6 modules in production. These module production tests as proven that the low speed wafer probe tests are sufficient to produce reliable image devices. Vpavg = ∑Vp(n)/Npixels (average level in one line scan). Where Vp(n) is the amplitude of nth pixel in the sensor chip and Npixels is the total number of pixels in sensor chip. Vpavg is converted from impulse current video pixel into a voltage output. See Figure 4, Video Pixel Output in section Output Circuit Of The Image Sensor and Figure 5, Video Output Test and Application Circuit in section Signal Conversion Circuit on page 6 and 7. There Is a calibration procedure to calibrate Vpavg using Tint as variable to control the exposure. Hence, Vpavg is calibrated for each image Page 7 of 18 Date: 09/23/05 Preliminary PI3041A datasheet (4) (5) (6) (7) (8) sensor type to compensate for the probe card variations, as well as, the interfacing circuits to the wafer probe machine. Up is the uniformity specification, measured under a uniform exposing light exposure. Up = [Vp(max) - Vpavg] / Vpavg x 100% or [Vpavg - Vp(min)] / Vpavg} x 100%, whichever is greater. Where Vp(max) is the maximum pixel output voltage in the light. Vp(min) is the minimum pixel output voltage in the light. The pixel Vp(n) is one nth pixel in Npixels in the sensor. Vd = Vp(n)/Npixels. Where Vp(n) is the pixels signal amplitude of the nth pixel of the sensor. Dark is where light is off, leaving the image surface unexposed. Ud = Vdmax – Vdmin. Upadj = MAX[ | (Vp(n) - Vp(n+l) | / Vp(n)) x 100%. Upadj is the nonuniformity in percentage. It is the amplitude difference between two neighboring pixels. Ucc is the uniformity specifications, measured among the good die on the wafer. Under uniform light exposure the sensors are measured and calculated with following algorithm: Vpavg of all the good dies on the wafer are averaged and assigned VGpavg. Then the die with maximum Vpavg is assigned Vpavg(max), and the one with minimum Vpavg is assigned Vpavg(min). Then UCC = {[Vpavg(max)-Vpavg(min)]/VGpavg}x100. Measuring The Device’s High Frequency Performances The PI3041A devices were tested on an A6 length standard CIS module’s PCB. Thirteen sensors bonded on the PCB board along with its support circuits, such as, clock buffer circuits, the shunt switch, SW, and its amplifier. The board’s video line capacitance, input capacitance of SW and input capacitance of the amplifier become part of the CAP. The A6 PCB was selected because together with the shunt switch, SW, and with its amplifier input, the video line had a typical value of ~100pf including its stray from its PCB copper traces. Another reason for this selection is that when the PI3041A wafer probe are tested, they use similar circuits to those as previously discussed under the section Signal Conversion Circuits. By removing RIN, the amplifier gain is set to one. Then with the total value of CAP at ~100pf the Video Pixels Voltage amplitude gives a measure of the approximate Pixel charge. Note the amplifier is a 1:1 buffer amplifier that serves to isolate the video line from the measuring instruments. Further note that when the modules are produced, RIN is in the circuit as variable resistor. Then, in production of the CIS modules, the video output amplitude, Vpavg, can be adjusted to the module’s specified level. This factory adjust is required because the exposure is fixed (Exposure = Light Power X Time). Example, the module’s light power is fixed and integrations time, Tint, is fixed. Note Tint is fixed in accordance to users requirement, or specified for factory adjustment procedure during production. In either case, the light exposure is fixed. Accordingly, to adjust the voltage amplitude to the specified level, RIN is used. Since the sensor response vary as a function of color, the PI3041A is measured with a Yellow-Green LED light source, as well as, the Red (660 nm) LED light source. The light sources were selected because historically, these LED light bars were used in the CIS industry and accepted in the low-cost CIS markets. Today, the users are turning towards the Light Guides or Light Pipes as the costs have been reducing and the image sensor’s technology continually improves. Yet, in low-cost applications Page 8 of 18 Date: 09/23/05 Preliminary PI3041A datasheet and, especially in mid-size volume production, the LED light bars and the older image sensors persistently continue to be in demand by the scanning industry. The high frequency performance specifications are graphical curves showing the video output, Vpavg, response to its applied light exposure. Although four exposure response graphs serve as good design reference for the designer who have prior knowledge of the image power that will be exposing the image sensors, this is not always the case, example, in designing and producing a CIS module. So to this end, the A6 PCB board, used to characterize the light exposure to video response specification, is enclosed in its A6 module housing and measured for its standard CIS parameters. These modules were fabricated exactly as their production counter part, except that the gain of the amplifier is set one. The measurements were conducted with two different LED bars, one Yellow-Green and the other Red. Video Output Response Under Exposure The four video signal output as function of light exposure are given in Graphs, A, B, C and D. The measurements are conducted in Black Box that enclosed the light source, the PCB and the instrument to measure the light power. The LED source mounted at the top radiated its light energy directly on the image sensor of the A6 PCB that is lying flat at the bottom of box. The video output was measured at the amplifier output of the A6 PCB. The PCB setup condition is described under the section, Measuring The Device’s High Frequency Performance. Note the gain of the amplifier is set to one. Also the clock duty cycle is set to 25% for the 2.0 MHz clock frequency and set to 50% for the 5.0 MHz. VIDEO OUTPUT VS EXPOSURE PI3041A RED LED RESPONSE 2.0 Mhz VIDEO OUTPUT (Volts) 4.000 3.500 3.000 2.500 2.000 EXP 1.500 1.000 0.500 0.000 0.1 0.09 0.08 0.07 0.06 0.05 0.04 0.03 0.02 0.01 0 EXPOSURE (uJ/cm^2) Graph A. A typical Video Output a as function of Light Exposure Illuminated with a RED 660 nm LED Source with the PI3041A clocked at 2.0 MHz Page 9 of 18 Date: 09/23/05 Preliminary PI3041A datasheet VIDEO OUTPUT VS EXPOSURE PI3041A Y-G LED RESPONSE 2.0 Mhz VIDEO OUTPUT (Volts) 4 3.5 3 2.5 EXP 2 1.5 1 0.5 0 0.12 0.1 0.08 0.06 0.04 0.02 0 EXPOSURE (uJ/cm^2) Graph B. A typical Video Output a as function of Light Exposure Illuminated with a Y-G LED Source with the PI3041A clocked at 2.0 MHz VIDEO OUTPUT VS EXPOSURE PI3041A RED LED RESPONSE 5.0 Mhz VIDEO OUTPUT (Volts) 3 2.5 2 EXP 1.5 1 0.5 0 0.12 0.1 0.08 0.06 0.04 0.02 0 EXPOSURE (uJ/cm^2) Graph C. A typical Video Output a as function of Light Exposure Illuminated with a RED 660 nm LED Source with the PI3041A clocked at 5.0 MHz Page 10 of 18 Date: 09/23/05 Preliminary PI3041A datasheet VIDEO OUTPUT VS EXPOSURE PI3041A Y-G LED RESPONSE 5.0 Mhz VIDEO OUTPUT (Volts) 3 2.5 2 1.5 EXP 1 0.5 0 0.12 0.1 0.08 0.06 0.04 0.02 0 EXPOSURE (uJ/cm^2) Graph D. A typical Video Output a as function of Light Exposure Illuminated with a Y-G LED Source with the PI3041A clocked at 5.0 MHz A6 Module With PI3041A High Frequency Specifications RED 660 LED Bar, A6 PCB In A6 Module Housing, At 2.0 MHz CLOCK Parameters Symbols Typical Units Remarks (1) Line scanning rate Tint 627 13 dies in the scan. see µs/line note 1. (Bottom of Table 6) Clock frequency Fclk (2) 2 MHz Output voltage Vpavg (3) 1.1 V Amplifier Gain = 1.0, see note 3 % LED bar non-uniformity, Output voltage non-uniformity Up (4) ± 20 see note 4. Dark output voltage Vd (5) <25 mV Dark output non-uniformity Ud (6) <15 mV (7) Adjacent Pixel non-uniformity Upadj <20 % LED Bar Input Voltage VLED (8) 5.0 V LED Power Varies greatly. See note 8. LED Bar Input Current ILED (8) 90 mA LED Power Varies greatly. See note 8. Table 3. Electro-Optical Characteristic At High Frequency Page 11 of 18 Date: 09/23/05 Preliminary PI3041A datasheet RED 660 LED Bar, A6 PCB In A6 Module Housing, At 5.0 MHz CLOCK Parameters Symbols Typical Units Remarks (1) Line scanning rate Tint 251 13 dies in the scan. see µs/line note 1. (Bottom of Table 6) Clock frequency Fclk (2) 5 MHz Output voltage Vpavg (3) 0.5 V Amplifier Gain = 1.0, see note 3 % LED bar non-uniformity, Output voltage non-uniformity Up (4) ± 20 see note 4. Dark output voltage Vd (5) <190 mV Dark output non-uniformity Ud (6) <80 mV Adjacent Pixel non-uniformity Upadj (7) <20 % LED Bar Input Voltage VLED (8) 5.0 V LED Power Varies greatly. See note 8. (8) LED Bar Input Current ILED 90 mA LED Power Varies greatly. See note 8. Table 4. Electro-Optical Characteristic At High Frequency Y-G LED Bar, A6 PCB In A6 Module Housing, At 2.0 MHz CLOCK Parameters Symbols Typical Units Remarks Line scanning rate Tint (1) 627 13 dies in the scan. see µs/line note 1. (Bottom of Table 6) Clock frequency Fclk (2) 2 MHz Output voltage Vpavg (3) 0.150 V Amplifier Gain = 1.0, see note 3 % LED bar non-uniformity, Output voltage non-uniformity Up (4) ± 20 see note 4. (5) Dark output voltage Vd <30 mV Dark output non-uniformity Ud (6) <15 mV Adjacent Pixel non-uniformity Upadj (7) <20 % LED Bar Input Voltage VLED (8) 5.0 V LED Power Varies greatly. See note 8. LED Bar Input Current ILED (8) 380 mA LED Power Varies greatly. See note 8. Table 5. Electro-Optical Characteristic At High Frequency Y-G LED Bar, A6 PCB In A6 Module Housing, At 5.0 MHz CLOCK Parameters Symbols Typical Units Remarks Line scanning rate Tint (1) 251 13 dies in the scan. see µs/line note 1. (Bottom of Table 6) Clock frequency Fclk (2) 5 MHz Output voltage Vpavg (3) 0.080 V Amplifier Gain = 1.0, see note 3 Page 12 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Output voltage non-uniformity Up (4) Dark output voltage Dark output non-uniformity Adjacent Pixel non-uniformity LED Bar Input Voltage Vd (5) Ud (6) Upadj (7) VLED (8) <180 <60 <20 5.0 mV mV % V LED Bar Input Current ILED (8) 380 mA 25 % LED bar non-uniformity, see note 4. LED Power Varies greatly. See note 8. LED Power Varies greatly. See note 8. Table 6. Electro-Optical Characteristic At High Frequency Notes: (1) (2) (2) (4) (5) (6) (7) (8) Note 1 under Table 2, Electro-Optical Characteristic is valid definition, except that the A6 modules has 13 sensors sequentially cascaded, hence, Tint = (13X96)/Fclk is the minimum integration time. Fclk is the module’s clock, CP, frequency and equal to the pixel rate. Also, the clock duty cycle is set to 25% for the 2.0 MHz clock frequency and set to 50% for the 5.0 MHz. Vpavg = Vp(n)/Npixels (average level in one line scan). Where Vp(n) is the amplitude of nth pixel in one line scan of the modules. Npixels is the total number of pixels in the module, i.e., 13 die x 96 pixels. The amplitude of Vpavg is adjusted with RIN (which are installed in the production module) on all of CIS modules because of variations caused by the LED light sources. The low-cost production LED’s light power are known to vary as much as ± 30%. Up is the uniformity specification, measured under a uniform exposing light exposure. Up = [Vp(max) - Vpavg] / Vpavg x 100% or [Vpavg - Vp(min)] / Vpavg} x 100%, whichever is greater. Where Vp(max) is the maximum pixel output voltage in the light. Vp(min) is the minimum pixel output voltage in the light. The pixel Vp(n) is one nth pixel in Npixels in the sensor. In applying the Up definition, Npixels must change. It must include 13 sensors, or 13x96 pixels. Additionally, because the low-cost LED power variation can be high as ± 30%, the non-uniformities may varies as much as ± 30%. Hence the uniformities are worst because of the LED Bar CIS modules. Vd = Vp(n)/Npixels. Where Vp(n) is the pixels signal amplitude of the nth pixel of the sensor. Dark is where light is off, leaving the image surface unexposed. Ud = Vdmax – Vdmin. Upadj = MAX[ | (Vp(n) - Vp(n+l) | / Vp(n)) x 100%. Upadj is the nonuniformity in percentage. It is the amplitude difference between two neighboring pixels. The low-cost LED light powers are widely specified, worst case as high as ± 30%, hense, the requirement for the Vpavg Gain Control and the wide Up specifications. Page 13 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Sensor’s Operational Specifications Absolute Maximum Ratings: Parameters Power Supply Voltage Power Supply Current Input clock pulse (high level) Input clock pulse (low level) Operating Temperature Operating Humidity Storage Temperature Storage Humidity Symbol Maximum Rating 10 <2.0 Vdd + 0.5 -0.25 0 to 50 10 to 85 -25 to 75 10 to 90 VDD IDD Vih Vil Top Hop Tstg Hstg Units Volts ma Volts Volts o C RH % o C RH % Table 7. Absolute Maximum Ratings Recommended Operating Conditions at Room Temperature Parameters Power Supply Input clock pulses high level Input clock pulse low level Operating high level exposed output Clock Frequency Clock pulse duty cycle Clock pulse high durations Integration time Operating Temperature Symbol VDD Vih (1) Vil (1) IOUT (2) Fclk (3) Duty (4) tw Tint Top Min. 4.5 3.0 0 0.1 Typical 5.0 5.0 0 See note. 2.0 25 0.125 0.864 25 Max. 5.5 VDD 0.8 Units Volts Volts Volts 5.0 MHz % µsec ms o C 10 50 Table 8. Recommended Operating Condition At Room Temperature Note (1) (2) (3) (4) Applies to both CP and SP. The output is a current that is proportional to the charges, which are integrated on the phototransistor’s base via photon-to-electron conversion. For its conversion to voltage pixels see Figure 4, Video Pixel Output Structure in section Output Circuit Of The Image Sensor. Although the clock frequency, Fclk, will operate the device at less than 100KHz, it is recommended that the device be operated above 500KHz to avoid complication of leakage current build-up. In applications using long CIS module length, such as an array of image sensor > 27, increases the readout time, i.e., increases Tint, hence, leakage current build-up occurs. The clock duty cycle typically is normally set to 25 %. However, it can operate with duty cycle as large as 50 %, which will allow more reset time at the expense of video pixel readout time. At clock frequencies approaching 5.0 MHz it is recommended to use 50% duty cycle to allow more time for the signal pixel to integrate and settle. Page 14 of 18 Date: 09/23/05 Preliminary PI3041A datasheet Switching Characteristics @ 25o C. The timing relationships of the video output voltage and its two input clocks the start pulse, SP, and the shift register clock, CP, along with the shift register EOS output clock are shown in Figure 7, Timing Diagram Of The PI3041A Sensor. The switch timing specification for the symbols on the timing diagram is given in Table 9, Timing Symbol's Definition below the timing diagram. The digital clocks' levels are +5 Volts CMOS compatible. The video, IOUT, is defined in Figure 4, Video Pixel Output in section Output Circuit Of The Image Sensor. Figure 7. Timing Diagram Of The PI3041A Sensor Item Clock cycle time Clock pulse width(1) Clock duty cycle Data setup time Data hold time Prohibit crossing time(2) EOS rise delay EOS fall delay Signal delay time(3) Signal settling time(3) Symbol to tw tds tdh tprh terdl tefdl tdl ts/h Minimum 200 50 25 20 20 Mean Maximum 10000 50 75 20 60 70 20 120 Units ns ns % ns ns ns ns ns ns ns Table 9. Timing Symbol's Definition Notes (1) The clock pulse width, tw, varies with frequency, as well as, the duty cycle. Page 15 of 18 Date: 09/23/05 Preliminary PI3041A datasheet (2) (3) Prohibit crossing time is to insure that no two start pulses are locked into the shift register for any single scan time. Since the start pulse is entered into the shift register during its active high level when the CP clock edges falls, the active high of the start pulse is permitted only during one falling, CP, clock edges for any given scan. Otherwise, multiple start pulses will load into the shift register. Pixel delay times and settling time depend on the output amplifier, which is employed. These values, tdl and ts/h, are measured with the amplifier see in Figure 8. Typical A6 CIS Module Circuit using the PI3041A sensors. Note, the impulse signal current out of the device has pulse width ~ 30 ns. Hence, the faster the amplifier with a faster settling time will yield a signal video pulse with faster rise and settle times. Typical A6 CIS Module Circuit See Figure 8. Typical A6 CIS Module Circuit using the PI3041A sensors. The circuit is provided as reference to illustrate the interconnection of the PI3041A for a serially cascaded line of image sensors. It is a typical A6 size CIS module produced by PIC. It provides the first time user with additional insight for designing a CIS module and supplements the circuit descriptions given in the section, Signal Conversion Circuit. The difference is in the arrangement of the two shunt switches, U3D, and U3A. U3D is a counterpart to SW in Figure 5. Video Output Test and Application Circuit. A DC restoration capacitor, C20, with value of 500pf added between the shunts switch. The first, U3D, clamps the video line to ground to reset the image sensors. Simultaneously the second, U3A, clamps the node between C15 and amplifier input to an output reference bias voltage that is on the node between R4 and R9. These resistors are voltage divider that sets the DC operating level of the amplifier’s output by applying same bias voltage to both inputs of the amplifier (See next page for the Typical A6 CIS Module Circuit.) Page 16 of 18 Date: 09/23/05 Preliminary PI3041A Datasheet C6 VD D C7 * 0.1uF * 10uF VD D C9 CONN- 10PIN * 0.1uF T12 TE STP OINT SP CP VDD DGND IOUT DGND EOS SP CP VDD DGND IOUT S4 through S11 1 3 6 C13 11 9 10 74HC00 4Y 4Z 100PF CD4066 4E CD4066 U3B 12 3Z 3E 3Y U3C Figure 8. Typical A6 CIS Module Circuit Page 17 of 18 Date: 09/23/05 Place C3 after S6 Place C4 after S9 C5 0.1UF 6 7 1 2 3 4 5 6 7 1 2 3 4 5 6 7 1 2 3 4 5 6 7 1 2 3 4 5 4 2Y 1000 U3D CD4066 U2B 5 6 4 R5 C2 0.1UF C1 0.1UF 5 2 C12 0.1uF 8 3 500 2Z 2 1Z 1Y 1 7 13 U3A CD4066 GND VCC 14 VD D VD D 1 R3 5K 3 2 3K U2A T13 TE STP OINT S13 PI3041A DGND EOS T11 TE STP OINT S12 PI3041A DGND EOS SP CP VDD DGND IOUT DGND EOS T3 TE STP OINT S3 PI3041A C11 VD D 74HC00 T2 TE STP OINT S2 PI3041A SP CP VDD DGND IOUT 74HC00 R4 2 8 10 500PF 3 1 S1 PI3041A 6 7 C10 1.5PF R2 U2C 1 2 3 4 5 4 74HC00 9 DGND EOS 11 13 2 - T1 TE STP OINT 14 12 2E 6 GL ED SMT JUMP ER PADS U2D SP CP VDD DGND IOUT VL ED V- V+ 1 2 VD D U1 AD8051 3 + 7 50 J1 7 R1 1E 1 VOUT 2 GND 3 VDD 4 VN 5 GND 6 SP 7 GND 8 CP 9 GL ED 10 VL ED P1 1 2 3 4 5 6 7 8 9 10 Preliminary PI3041A datasheet ______________________________________________________________________________ ©2005 Peripheral Imaging Corporation. Printed in the U.S.A. All rights reserved. Secifications are subject to change without notice. Contents may not be reproduced in whole or in part without the express prior written permission of Peripheral Imaging Corporation. Information furnished herein is believed to be accurate and reliable. However, no responsibility is assumed by Peripheral Imaging Corporation for its use nor for any infringement of patents or other rights granted by implication or otherwise under any patent or patent rights of Peripheral Imaging Corporation. Page 18 of 18 Date: 09/23/05