LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only TAPE AND BOX ROUND TYPE LED LAMPS LUR2043/TBS-X DATA SHEET DOC. NO : QW0905-LUR2043/TBS-X REV. : A DATE : 23 - Mar. - 2005 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LUR2043/TBS-X Page 1/5 Package Dimensions ΔH P2 W2 H2 H1 L W0 W1 W3 D P1 F P T LUR2043 3.0 4.0 4.2 5.2 1.5MAX 25.0MIN □0.5 TYP 1.0MIN 2.54TYP Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LUR2043/TBS-X Page 2/5 Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT UR Forward Current IF 40 mA Peak Forward Current Duty 1/10@10KHz IFP 120 mA Power Dissipation PD 120 mW Reverse Current @5V Ir 10 μA Operating Temperature Topr -40 ~ +85 ℃ Storage Temperature Tstg -40 ~ +100 ℃ Soldering Temperature Tsol Max 260 ℃ for 5 sec Max (2mm from body) Typical Electrical & Optical Characteristics (Ta=25 ℃) PART NO COLOR MATERIAL Emitted LUR2043/TBS-X GaAlAs Red Forward Peak Spectral voltage wave halfwidth length △λ nm @20mA(V) λPnm Lens Water Clear 660 20 Luminous intensity @20mA(mcd) Min. Max. Min. Typ. 1.5 900 Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ± 15% testing tolerance. 2.4 550 Viewing angle 2θ 1/2 (deg) 30 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LUR2043/TBS-X Page 3/5 •Dimensions Symbol Information SPECIFICATIONS OPTION SYMBOL CODE SYMBOL ITEMS Minimum Maximum mm inch mm inch Tape Feed Hole Diameter ------- D 3.8 0.15 4.2 0.17 Component Lead Pitch ------- F 2.3 0.09 3.0 0.12 Front-To-Rear Deflection ------- △H ------- ------- 2.0 0.08 TRS-1 TRS-2 TRS-3 TRS-4 TRS-5 TRS-6 TRS-7 TRS-8 TRS-9 TRS-10 H1 17.5 21.5 25.5 27.5 22.5 19.9 24.0 24.5 19.0 18.4 0.69 0.85 1.0 1.08 0.89 0.78 0.94 0.96 0.75 0.72 ------- H2 ------- ------- 18.5 22.5 26.5 28.5 23.5 20.9 25.0 25.5 20.0 19.4 36 0.73 0.89 1.04 1.12 0.93 0.82 0.98 1.0 0.79 0.76 1.42 Lead Length After Component Height ------- L 11.0 0.43 Feed Hole Pitch ------- P 12.4 0.49 13.0 0.51 Lead Location ------- P1 4.4 0.17 5.8 0.23 Center Of Component Location ------- P2 5.1 0.2 7.7 0.3 Overall Taped Package Thickness ------- T ------- ------- 1.42 0.06 Feed Hole Location ------- W0 8.5 0.33 9.75 0.38 Adhesive Tape Width ------- W1 14.5 0.57 15.5 0.61 Adhesive Tape Position ------- W2 0 0 4.0 0.16 Tape Width ------- W3 17.5 0.69 19.0 0.75 Feed Hole To Bottom Of Component Feed Hole To Overall Component Height W0 REMARK:TBS=Tape And Box Straight Leads • Package Dimensions • Dimensions Symbol Information Specification Description Symbol minimum maxmum W mm inch mm inch Overall Length L 330 13.0 340 13.4 Overall Width W 265 10.4 275 10.8 Overall Thickness H 50 1.97 60 2.4 Quantity/Box 2500PCS L H LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page4/5 PART NO. LUR2043/TBS-X Typical Electro-Optical Characteristics Curve UR CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0 Relative Intensity Normalize @20mA Forward Current(mA) 1000 100 10 1 01 2.5 2.0 1.5 1.0 0.5 0.0 1.0 2.0 3.0 4.0 1 5.0 10 Fig.3 Forward Voltage vs. Temperature Fig.4 Relative Intensity vs. Temperature Relative Intensity@20mA Normalize @25 ℃ Forward Voltage@20mA Normalize @25 ℃ 1.2 1.1 1.0 0.9 0.8 -20 0 20 40 60 80 100 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 80 Ambient Temperature( ℃) Ambient Temperature( ℃) Fig.5 Relative Intensity vs. Wavelength Relative Intensity@20mA 1000 Forward Current(mA) Forward Voltage(V) -40 100 Fig.6 Directivity Radiation 0° 1.0 -30° 30° -60° -60° 0.5 100% 75% 50% 0.0 600 650 700 Wavelength (nm) 750 25% 0 25% 50% 75% 100% 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LUR2043/TBS-X Page 5/5 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5℃ 2.RH=90 %~95 % 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hous. 1.Ta=105 ℃±5℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11