PO49FCT32805 3.3V Dual 1:5 CMOS Clock Buffered Driver 11/22/05 600MHz TTL/CMOS Potato Chip FEATURES: DESCRIPTION: . Operating frequency up to 600MHz with 2pf load . Operating frequency up to 500MHz with 5pf load . Operating frequency up to 270MHz with 15pf load . Operating frequency up to 120MHz with 50pf load . Very low output pin to pin skew < 250ps . Very low pulse skew < 200ps . VCC = 1.65V to 3.6V . Propagation delay < 2.6ns max with 15pf load . Low input capacitance: 3pf typical . Dual 1:5 fanout . Available in 20pin 300mil wide SOIC package . Available in 20pin 150mil wide QSOP package Potato Semiconductor’s PO49FCT32805G is designed for world top performance using submicron CMOS technology to achieve 600MHz TTL output frequency with less than 200ps output pulse skew. Pin Configuration PO49FCT32805G is a 3.3V CMOS Dual 1 input to 5 outputs Buffered driver to achieve 600MHz output frequency with integrated series damping resistors on all outputs to match 50 ohm transmission line impedance. Typical applications are clock and signal distribution. Logic Block Diagram Pin Description Pin Name Description INA, INB Signal or clock Inputs Inputs Outputs INA, INB OAn, OBn MON Hi-Z State Output Enable Inputs (Active LOW) L L L L Signal or clock Outputs L H H H MON Monitor Output H L Z L Vcc, GND Power, Ground H H Z H OAn, OBn 1 Copyright © 2005, Potato Semiconductor Corporation PO49FCT32805 3.3V Dual 1:5 CMOS Clock Buffered Driver 11/22/05 600MHz TTL/CMOS Potato Chip Maximum Ratings Description Max Unit Storage Temperature -65 to 150 °C Operation Temperature -40 to 85 °C Operation Voltage -0.5 to +4.6 V Input Voltage -0.5 to Vcc+0.5 V Output Voltage -0.5 to Vcc+0.5 V Note: stresses greater than listed under Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability specification is not implied. DC Electrical Characteristics Symbol Description VOH Output High voltage VOL Test Conditions Min Typ Max Unit Vcc=3V Vin=VIH or VIL, IOH= -8mA 2.4 3 - V Output Low voltage Vcc=3V Vin=VIH or VIL, IOH=12mA - 0.3 0.5 V VIH Input High voltage Guaranteed Logic HIGH Level (Input Pin) 2 - Vcc V VIL Input Low voltage Guaranteed Logic LOW Level (Input Pin) -0.5 - 0.8 V IIH Input High current Vcc = 3.6V and Vin = 3.6V - - 1 uA IOZH High Impedance Output current Vcc = 3.6V and Vo = Vcc - - 1 uA IOZL High Impedance Output current Vcc = 3.6V and Vo = 0V - - -1 uA IIL Input Low current Vcc = 3.6V and Vin = 0V - - -1 uA VIK Clamp diode voltage Vcc = Min. And IIN = -18mA - -0.7 -1.2 V Notes: 1. 2. 3. 4. 5. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. Typical values are at Vcc = 3.3V, 25 °C ambient. This parameter is guaranteed but not tested. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. VoH = Vcc – 0.6V at rated current 2 Copyright © 2005, Potato Semiconductor Corporation PO49FCT32805 3.3V Dual 1:5 CMOS Clock Buffered Driver 11/22/05 600MHz TTL/CMOS Potato Chip Power Supply Characteristics Symbol IccQ Description Quiescent Power Supply Current Test Conditions (1) Min Typ Max Unit Vcc=Max, Vin=Vcc or GND - 0.1 30 uA Notes: 1. 2. 3. 4. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. Typical values are at Vcc = 3.3V, 25°C ambient. This parameter is guaranteed but not tested. Not more than one output should be shorted at one time. Duration of the test should not exceed one second. Capacitance (TA= +25°C, f= 1MHz) Parameters (1) Description Test Conditions Typ Max Unit Cin Input Capacitance Vin = 0V 3 4 pF Cout Output Capacitance Vout = 0V - 6 pF Notes: 1 This parameter is determined by device characterization but not production tested. Switching Characteristics Symbol Description Test Conditions (1) Max Unit tPLH & tPHL Propagation Delay INA to OAn, INB to OBn CL = 15pF 2.6 ns tPZH or tPZL Output Enable Time CL = 15pF 2.5 ns tPHZ or tPLZ Output Disable Time CL = 15pF 2.5 ns Rise/Fall Time 0.8V – 2.0V 1 ns tr/tf tsk(p) Pulse Skew (Same Package) CL = 15pF, 125MHz 0.2 ns tsk(o) Output Pin to Pin Skew (Same Package) CL = 15pF, 125MHz 0.25 ns Output Skew (Different Package) CL = 15pF, 125MHz 0.4 ns tsk(pp) fmax Input Frequency CL = 5 0 p F 120 MHz fmax Input Frequency CL =15pF 270 MHz fmax Input Frequency CL = 5pF 500 MHz fmax Input Frequency CL = 2pF 600 MHz Notes: 1. See test circuits and waveforms. 2. tpLH, tpHL, tsk(p), and tsk(o) are production tested. All other parameters guaranteed but not production tested. 3. Airflow of 1m/s is recommended for frequencies above 133MHz 3 Copyright © 2005, Potato Semiconductor Corporation PO49FCT32805 3.3V Dual 1:5 CMOS Clock Buffered Driver 11/22/05 600MHz TTL/CMOS Potato Chip Test Waveforms Test Circuit 500 Ω 50Ω 50 Ω 500 Ω 4 Copyright © 2005, Potato Semiconductor Corporation PO49FCT32805 3.3V Dual 1:5 CMOS Clock Buffered Driver 600MHz TTL/CMOS Potato Chip 11/22/05 Packaging Mechanical Drawing: 20 pin QSOP Packaging Mechanical Drawing: 20 pin SOIC 5 Copyright © 2005, Potato Semiconductor Corporation PO49FCT32805 3.3V Dual 1:5 CMOS Clock Buffered Driver 600MHz TTL/CMOS Potato Chip 01/05/06 Ordering Information Ordering Code PO49FCT32805S PO49FCT32805Q Package Code S Q Package Description Pb-free & Green, 20-pin SOIC Pb-free & Green, 20-pin QSOP 6 Copyright © 2005, Potato Semiconductor Corporation