SEMIHOW KSH13009L

KSH13009L
KSH13009L
◎ SEMIHOW REV.A0,May 2003
KSH13009L
KSH13009L
Switch Mode series NPN silicon Power Transistor
- High voltage, high speed power switching
- Suitable for switching regulator, inverters motor controls
Absolute Maximum Ratings
TC=25℃ unless otherwise noted
CHARACTERISTICS
SYMBOL
RATING
UNIT
VCBO
VCEO
VEBO
IC
ICP
IB
PC
TJ
TSTG
700
400
9
12
24
6
130
150
-65~150
V
V
V
A
A
A
W
℃
℃
Collector-Base Voltage
Collector-Emitter Voltage
Emitter-Base Voltage
Collector Current(DC)
Collector Current(Pulse)
Base Current
Collector Dissipation(Tc=25℃)
Junction Temperature
Storage Temperature
Electrical Characteristics
12 Amperes
NPN Silicon Power Transistor
100 Watts
TO-3P
1. Base
2. Collector
3. Emitter
12
3
TC=25℃ unless otherwise noted
CHARACTERISTICS
SYMBOL
Collector-Emitter Sustaining Voltage
VCEO(sus)
Test Condition
IC=10mA, IB=0
Min
Typ.
Max
400
Unit
V
Emitter Cut-off Current
IEBO
VEB=9V,IC=0
*DC Current Gain
hFE1
hFE2
VCE=5V,IC=5A
VCE=5V,IC=8A
*Collector-Emitter Saturation Voltage
VCE(sat)
IC=5A,IB=1A
IC=8A,IB=1.6A
IC=12A,IB=3A
1
1.5
3
V
V
V
*Base-Emitter Saturation Voltage
VBE(sat)
IC=5A,IB=1A
IC=8A,IB=1.6A
1.2
1.6
V
V
Output Capacitance
Cob
Current Gain Bandwidth Product
fT
Turn on Time
ton
Storage Time
tstg
Fall Time
tF
1
8
6
VCB=10V, f=0.1MHz
VCE=10V,IC=0.5A
Vcc=125V, Ic=8A
IB1=1.6A, IB2= -1.6A
RL=15.6Ω
mA
40
30
180
pF
4
MHz
1.1
μS
3
μS
0.7
μS
* Pulse Test: Pulse Width≤300μs, Duty Cycle≤2%
Note :
hFE1 Classification
R :8 ~ 17,
O : 15 ~ 28,
Y : 26 ~ 39
◎ SEMIHOW REV.A0,May 2003
KSH13009L
Typical Characteristics
◎ SEMIHOW REV.A0,May 2003
KSH13009L
Typical Characteristics ( Continued )
◎ SEMIHOW REV.A0,May 2003
KSH13009L
Package Dimensions
Dimensions in Millimeters
◎ SEMIHOW REV.A0,May 2003
KSH13009L
Reliability Qualification
A. High Temperature Reverse Bias ( HTRB )
The purpose of this test is to determine the sensitivity of the product to mobile ion contamination and
related failure mechanisms.
Conditions: JESD22-A108, JIS C 7021 B-8
TA=150℃ VCB=80% max rated VCB
Sample Size
#of Fail
Cum. Fail%
168hrs
300hrs
45
0
0.0%
0
0
B. Pressure Cooker Test ( PCT )
Autoclave ( ACLV )
The purpose of this test is to evaluate the moisture resistance of non-hermetic components under
pressure/temperature conditions.
Conditions: JESD22-A102, JIS C 7021 A-6
TA=121℃ RH=100% P=1 atmosphere (15psig)
Sample Size
#of Fail
Cum. Fail%
48hrs
45
0
0.0%
0
C. Temperature Humidity Bias ( THBT )
The purpose of this test is to evaluate the moisture resistance of non-hermetic components.
The addition of voltage bias accelerates the corrosive effect after moisture penetration has taken place.
with time, this is a catastrophically destructive test.
Conditions: JESD22-A101
TA=85℃ RH=85% VCB=80% max rated VCB
Sample Size
#of Fail
Cum. Fail%
168hrs
300hrs
45
0
0.0%
0
0
◎ SEMIHOW REV.A0,May 2003
KSH13009L
Reliability Qualification ( Continued )
D. High Temperature Storage Life ( HTSL )
The purpose of this test is to expose time/temperature failure mechanisms and to evaluate
long-term strong stability.
Conditions: JESD22-A103, JIS C 7021 B-10
TA=Tstg(max)
Sample Size
#of Fail
Cum. Fail%
168hrs
300hrs
45
0
0.0%
0
0
E. Temperature Cycle Air-to Air ( TMCL )
The purpose of this test is to evaluate the ability of the device to withstand both exposure to
extreme temperature and the transition between temperature extreme, and to exposure excessive
thermal mismatch between materials.
Conditions: JESD22-A104, JIS C 7021 A-4
Air to air, -65℃~150℃, 15 minutes dwell time at each temperature
Sample Size
#of Fail
Cum. Fail%
100cycles
200cycles
45
0
0.0%
0
0
◎ SEMIHOW REV.A0,May 2003