KSH13009L KSH13009L ◎ SEMIHOW REV.A0,May 2003 KSH13009L KSH13009L Switch Mode series NPN silicon Power Transistor - High voltage, high speed power switching - Suitable for switching regulator, inverters motor controls Absolute Maximum Ratings TC=25℃ unless otherwise noted CHARACTERISTICS SYMBOL RATING UNIT VCBO VCEO VEBO IC ICP IB PC TJ TSTG 700 400 9 12 24 6 130 150 -65~150 V V V A A A W ℃ ℃ Collector-Base Voltage Collector-Emitter Voltage Emitter-Base Voltage Collector Current(DC) Collector Current(Pulse) Base Current Collector Dissipation(Tc=25℃) Junction Temperature Storage Temperature Electrical Characteristics 12 Amperes NPN Silicon Power Transistor 100 Watts TO-3P 1. Base 2. Collector 3. Emitter 12 3 TC=25℃ unless otherwise noted CHARACTERISTICS SYMBOL Collector-Emitter Sustaining Voltage VCEO(sus) Test Condition IC=10mA, IB=0 Min Typ. Max 400 Unit V Emitter Cut-off Current IEBO VEB=9V,IC=0 *DC Current Gain hFE1 hFE2 VCE=5V,IC=5A VCE=5V,IC=8A *Collector-Emitter Saturation Voltage VCE(sat) IC=5A,IB=1A IC=8A,IB=1.6A IC=12A,IB=3A 1 1.5 3 V V V *Base-Emitter Saturation Voltage VBE(sat) IC=5A,IB=1A IC=8A,IB=1.6A 1.2 1.6 V V Output Capacitance Cob Current Gain Bandwidth Product fT Turn on Time ton Storage Time tstg Fall Time tF 1 8 6 VCB=10V, f=0.1MHz VCE=10V,IC=0.5A Vcc=125V, Ic=8A IB1=1.6A, IB2= -1.6A RL=15.6Ω mA 40 30 180 pF 4 MHz 1.1 μS 3 μS 0.7 μS * Pulse Test: Pulse Width≤300μs, Duty Cycle≤2% Note : hFE1 Classification R :8 ~ 17, O : 15 ~ 28, Y : 26 ~ 39 ◎ SEMIHOW REV.A0,May 2003 KSH13009L Typical Characteristics ◎ SEMIHOW REV.A0,May 2003 KSH13009L Typical Characteristics ( Continued ) ◎ SEMIHOW REV.A0,May 2003 KSH13009L Package Dimensions Dimensions in Millimeters ◎ SEMIHOW REV.A0,May 2003 KSH13009L Reliability Qualification A. High Temperature Reverse Bias ( HTRB ) The purpose of this test is to determine the sensitivity of the product to mobile ion contamination and related failure mechanisms. Conditions: JESD22-A108, JIS C 7021 B-8 TA=150℃ VCB=80% max rated VCB Sample Size #of Fail Cum. Fail% 168hrs 300hrs 45 0 0.0% 0 0 B. Pressure Cooker Test ( PCT ) Autoclave ( ACLV ) The purpose of this test is to evaluate the moisture resistance of non-hermetic components under pressure/temperature conditions. Conditions: JESD22-A102, JIS C 7021 A-6 TA=121℃ RH=100% P=1 atmosphere (15psig) Sample Size #of Fail Cum. Fail% 48hrs 45 0 0.0% 0 C. Temperature Humidity Bias ( THBT ) The purpose of this test is to evaluate the moisture resistance of non-hermetic components. The addition of voltage bias accelerates the corrosive effect after moisture penetration has taken place. with time, this is a catastrophically destructive test. Conditions: JESD22-A101 TA=85℃ RH=85% VCB=80% max rated VCB Sample Size #of Fail Cum. Fail% 168hrs 300hrs 45 0 0.0% 0 0 ◎ SEMIHOW REV.A0,May 2003 KSH13009L Reliability Qualification ( Continued ) D. High Temperature Storage Life ( HTSL ) The purpose of this test is to expose time/temperature failure mechanisms and to evaluate long-term strong stability. Conditions: JESD22-A103, JIS C 7021 B-10 TA=Tstg(max) Sample Size #of Fail Cum. Fail% 168hrs 300hrs 45 0 0.0% 0 0 E. Temperature Cycle Air-to Air ( TMCL ) The purpose of this test is to evaluate the ability of the device to withstand both exposure to extreme temperature and the transition between temperature extreme, and to exposure excessive thermal mismatch between materials. Conditions: JESD22-A104, JIS C 7021 A-4 Air to air, -65℃~150℃, 15 minutes dwell time at each temperature Sample Size #of Fail Cum. Fail% 100cycles 200cycles 45 0 0.0% 0 0 ◎ SEMIHOW REV.A0,May 2003