IXYS IXDN504SIAT/R

IXDF504 / IXDI504 / IXDN504
4 Ampere Dual Low-Side Ultrafast MOSFET Drivers
Features
General Description
• Built using the advantages and compatibility
of CMOS and IXYS HDMOSTM processes
• Latch-Up Protected up to 4 Amps
• High Peak Output Current: 4A Peak
• Wide Operating Range: 4.5V to 30V
• -55°C to +125°C Extended Operating
Temperature
• High Capacitive Load
Drive Capability: 1800pF in <15ns
• Matched Rise And Fall Times
• Low Propagation Delay Time
• Low Output Impedance
• Low Supply Current
• Two Drivers in Single Chip
The IXDF504, IXDI504 and IXDN504 each consist of two 4Amp CMOS high speed MOSFET Gate Drivers for driving
the latest IXYS MOSFETs & IGBTs. Each of the outputs
can source and sink 4 Amps of Peak Current while producing voltage rise and fall times of less than 15ns. The input
of each driver is TTL or CMOS compatible and is virtually
immune to latch up. Patented* design innovations eliminate
cross conduction and current "shoot-through". Improved
speed and drive capabilities are further enhanced by very
fast, matched rise and fall times.
Applications
•
•
•
•
•
•
•
•
•
•
Driving MOSFETs and IGBTs
Motor Controls
Line Drivers
Pulse Generators
Local Power ON/OFF Switch
Switch Mode Power Supplies (SMPS)
DC to DC Converters
Pulse Transformer Driver
Class D Switching Amplifiers
Power Charge Pumps
The IXDF504 is configured with one Gate Driver Inverting +
one Gate Driver Non-Inverting. The IXDI504 is configured as
a Dual Inverting Gate Driver, and the IXDN504 is configured
as a Dual Non-Inverting Gate Driver.
The IXDF504, IXDI504 and IXDN504 are each available in
the 8-Pin P-DIP (PI) package, the 8-Pin SOIC (SIA) package, and the 6-Lead DFN (D1) package, (which occupies
less than 65% of the board area of the 8-Pin SOIC).
*United States Patent 6,917,227
Ordering Information
Part Number
IXDF504PI
IXDF504SIA
IXDF504SIAT/R
IXDF504D1
IXDF504D1T/R
IXDI504PI
IXDI504SIA
IXDI504SIAT/R
IXDI504D1
IXDI504D1T/R
IXDN504PI
IXDN504SIA
IXDN504SIAT/R
IXDN504D1
IXDN504D1T/R
Description
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
4A Low Side Gate Driver I.C.
Package
Type
8-Pin PDIP
8-Pin SOIC
8-Pin SOIC
6-Lead DFN
6-Lead DFN
8-Pin PDIP
8-Pin SOIC
8-Pin SOIC
6-Lead DFN
6-Lead DFN
8-Pin PDIP
8-Pin SOIC
8-Pin SOIC
6-Lead DFN
6-Lead DFN
Packing Style
Tube
Tube
13” Tape and Reel
2” x 2” Waffle Pack
13” Tape and Reel
Tube
Tube
13” Tape and Reel
2” x 2” Waffle Pack
13” Tape and Reel
Tube
Tube
13” Tape and Reel
2” x 2” Waffle Pack
13” Tape and Reel
Pack
Qty
50
94
2500
56
2500
50
94
2500
56
2500
50
94
2500
56
2500
Configuration
Dual Drivers,
one Inverting
and one NonInverting
Dual Inverting
Drivers
Dual NonInverting
Drivers
NOTE: All parts are lead-free and RoHS Compliant
DS99567A(10/07)
Copyright © 2007 IXYS CORPORATION All rights reserved
First Release
IXDF504 / IXDI504 / IXDN504
Figure 1 - IXDF504 Inverting + Non-Inverting 4A Gate Driver Functional Block Diagram
Vcc
P
ANTI-CROSS
CONDUCTION
CIRCUIT *
IN A
OUT A
*
N
P
ANTI-CROSS
CONDUCTION
CIRCUIT *
IN B
OUT B
*
N
GND
Figure 2 - IXDI504 Dual Inverting 4A Gate Driver Functional Block Diagram
Vcc
P
ANTI-CROSS
CONDUCTION
CIRCUIT *
IN A
OUT A
*
N
P
ANTI-CROSS
CONDUCTION
CIRCUIT *
IN B
OUT B
*
N
GND
Figure 3 - IXDN504 Dual 4A Non-Inverting Gate Driver Functional Block Diagram
Vcc
P
ANTI-CROSS
CONDUCTION
CIRCUIT *
IN A
*
OUT A
N
P
ANTI-CROSS
CONDUCTION
CIRCUIT *
IN B
*
GND
*
United States Patent 6,917,227
Copyright © 2007 IXYS CORPORATION All rights reserved
2
OUT B
N
IXDF504 / IXDI504 / IXDN504
Absolute Maximum Ratings (1)
Operating Ratings (2)
Parameter
Supply Voltage
All Other Pins (Unless specified
otherwise)
Junction Temperature
Storage Temperature
Lead Temperature (10 Sec)
Parameter
Value
Operating Supply Voltage
4.5V to 30V
Operating Temperature Range
-55 °C to 125 °C
Package Thermal Resistance *
θJ-A (typ) 125 °C/W
8-PinPDIP
(PI)
8-Pin SOIC
(SIA)
θJ-A(typ) 200 °C/W
6-Lead DFN
(D1)
θJ-A(typ) 125-200 °C/W
θJ-C(max) 2.1 °C/W
6-Lead DFN
(D1)
6-Lead DFN
(D1)
θJ-S(typ) 6.4 °C/W
Value
35 V
-0.3 V to VCC + 0.3V
150 °C
-65 °C to 150 °C
300 °C
Electrical Characteristics @ TA = 25 oC (3)
Unless otherwise noted, 4.5V ≤ VCC ≤ 30V .
All voltage measurements with respect to GND. IXD_504 configured as described in Test Conditions. All specifications are for one channel.
(4)
Symbol
Parameter
Test Conditions
Min
VIH
High input voltage
4.5V ≤ VIN ≤ 18V
3
VIL
Low input voltage
4.5V ≤ VIN ≤ 18V
VIN
Input voltage range
IIN
Input current
VOH
High output voltage
VOL
Low output voltage
ROH
High state output resistance
ROL
Low state output resistance
IPEAK
Peak output current
IDC
Continuous output current
tR
Rise time
tF
Fall time
tONDLY
On-time propagation delay
tOFFDLY
Off-time propagation delay
VCC
Power supply voltage
ICC
Power supply current
0V ≤ VIN ≤ VCC
Typ
Max
V
0.8
V
-5
VCC + 0.3
V
-10
10
µA
VCC - 0.025
VCC = 18V
IOUT = 10mA
VCC = 18V
IOUT = 10mA
VCC = 15V
V
0.025
V
1.5
2.5
Ω
1.2
2
Ω
1
A
A
9
16
ns
8
14
ns
19
40
ns
18
35
ns
18
0.25
30
10
3
10
V
4
Limited by package
dissipation
CLOAD =1000pF
VCC =18V
CLOAD =1000pF
VCC =18V
CLOAD =1000pF
VCC =18V
CLOAD =1000pF
VCC =18V
4.5
VCC = 18V, VIN = 0V
VIN = 3.5V
VIN = VCC
IXYS reserves the right to change limits, test conditions, and dimensions.
3
Units
µA
mA
mA
IXDF504 / IXDI504 / IXDN504
Electrical Characteristics @ temperatures over -55 oC to 125 oC (3)
Unless otherwise noted, 4.5V ≤ VCC ≤ 30V , Tj < 150oC
All voltage measurements with respect to GND. IXD_504 configured as described in Test Conditions. All specifications are for one channel.
Symbol
Parameter
Test Conditions
Min
VIH
High input voltage
4.5V ≤ VCC ≤ 18V
3
VIL
Low input voltage
4.5V ≤ VCC ≤ 18V
VIN
Input voltage range
IIN
Input current
VOH
High output voltage
VOL
Low output voltage
ROH
IDC
High state output
resistance
Low state output
resistance
Continuous output current
tR
Rise time
tF
Fall time
0V ≤ VIN ≤ VCC
Typ
Max
Units
V
0.8
V
-5
VCC + 0.3
V
-10
10
µA
VCC - 0.025
V
0.025
V
VCC = 18V, IOUT = 10mA
3
Ω
VCC = 18V, IOUT = 10mA
2.5
Ω
1
A
CLOAD =1000pF VCC =18V
20
ns
CLOAD =1000pF VCC =18V
15
ns
tONDLY
On-time propagation delay CLOAD =1000pF VCC =18V
60
ns
tOFFDLY
Off-time propagation delay CLOAD =1000pF VCC =18V
50
ns
VCC
Power supply voltage
30
V
ICC
Power supply current
150
3
150
µA
mA
mA
ROL
4.5
VCC = 18V, VIN = 0V
VIN = 3.5V
VIN = VCC
18
Notes:
1. Operating the device beyond the parameters listed as “Absolute Maximum Ratings” may cause permanent
damage to the device. Exposure to absolute maximum rated conditions for extended periods may affect device
reliability.
2. The device is not intended to be operated outside of the Operating Ratings.
3. Electrical Characteristics provided are associated with the stated Test Conditions.
4. Typical values are presented in order to communicate how the device is expected to perform, but not necessarily
to highlight any specific performance limits within which the device is guaranteed to function.
* The following notes are meant to define the conditions for the θJ-A, θJ-C and θJ-S values:
1) The θJ-A (typ) is defined as junction to ambient. The θJ-A of the standard single die 8-Lead PDIP and 8-Lead SOIC are dominated by the
resistance of the package, and the IXD_5XX are typical. The values for these packages are natural convection values with vertical boards
and the values would be lower with forced convection. For the 6-Lead DFN package, the θJ-A value supposes the DFN package is soldered
on a PCB. The θJ-A (typ) is 200 °C/W with no special provisions on the PCB, but because the center pad provides a low thermal resistance
to the die, it is easy to reduce the θJ-A by adding connected copper pads or traces on the PCB. These can reduce the θJ-A (typ) to 125 °C/W
easily, and potentially even lower. The θJ-A for DFN on PCB without heatsink or thermal management will vary significantly with size,
construction, layout, materials, etc. This typical range tells the user what he is likely to get if he does no thermal management.
2) θJ-C (max) is defined as juction to case, where case is the large pad on the back of the DFN package. The θJ-C values are generally not
published for the PDIP and SOIC packages. The θJ-C for the DFN packages are important to show the low thermal resistance from junction to
the die attach pad on the back of the DFN, -- and a guardband has been added to be safe.
3) The θJ-S (typ) is defined as junction to heatsink, where the DFN package is soldered to a thermal substrate that is mounted on a heatsink.
The value must be typical because there are a variety of thermal substrates. This value was calculated based on easily available IMS in the
U.S. or Europe, and not a premium Japanese IMS. A 4 mil dialectric with a thermal conductivity of 2.2W/mC was assumed. The result was
given as typical, and indicates what a user would expect on a typical IMS substrate, and shows the potential low thermal resistance for the
DFN package.
Copyright © 2007 IXYS CORPORATION All rights reserved
4
IXDF504 / IXDI504 / IXDN504
Pin Description
SYMBOL
IN A
FUNCTION
A Channel Input
GND
Ground
IN B
B Channel Input
OUT B
B Channel Output
VCC
Supply Voltage
OUT A
A Channel Output
DESCRIPTION
A channel input signal-TTL or CMOS compatible.
The system ground pin. Internally connected to all circuitry, this pin provides
ground reference for the entire device. This pin should be connected to a
low noise analog ground plane for optimum performance.
B channel input signal-TTL or CMOS compatible.
B channel driver output. For application purposes, this pin is connected via a
resistor to the gate of a MOSFET/IGBT.
Positive power-supply voltage input. This pin provides power to the entire
device. The range for this voltage is from 4.5V to 30V.
A channel criver output. For application purposes, this pin is connected via a
resistor to the gate of a MOSFET/IGBT.
CAUTION: Follow proper ESD procedures when handling and assembling this component.
Pin Configurations
IXDF504
1
NC
2
IN A
3
GND
4
INB
IXDN504
IXDI504
NC
8
1
NC
O UT A
7
2
IN A
VS 6
3
GND
O UT B 5
4
INB
NC
8
1
NC
O UT A
7
2
IN A
VS 6
3
GND
O UT B 5
4
INB
8 Lead PDIP (PI)
8 Pin SOIC (SI)
(SIA)
IXDF402
8 Lead PDIP (PI)
8 Pin SOIC (SI)
(SIA)
IXDI402
6 Lead DFN (D1)
(Bottom View)
6 Lead DFN (D1)
(Bottom View)
6 OUT A IN A 1
5 Vcc
4 OUT B
5 Vcc
IN B 3
O UT A
7
VS 6
O UT B 5
6 Lead DFN (D1)
(Bottom View)
GND 2
4 OUT B
8
8 Lead PDIP (PI)
(SIA)
8 Pin SOIC (SI)
IXDN402
6 OUT A IN A 1
GND 2
NC
6 OUT A
IN A 1
5
GND 2
Vcc
4 OUT B
IN B 3
IN B 3
NOTE: Solder tabs on bottoms of DFN packages are grounded
Figure 4 - Characteristics Test Diagram
Vcc
IXD_504
1
10uF
0.01uF
NC
2
In A
3
Gnd
4
In B
NC 8
7
Out A
6
Vcc
5
Out B
Agilent 1147A
Current Probe
CLOAD
IXYS reserves the right to change limits, test conditions, and dimensions.
5
Agilent 1147A
Current Probe
CLOAD
IXDF504 / IXDI504 / IXDN504
Typical Performance Characteristics
Fig. 5
Fig. 6
Rise Times vs. Supply Voltage
90
80
70
Fall Time (ns)
70
Rise Time (ns)
Fall Times vs. Supply Voltage
80
60
50
10000pF
40
30
50
10000pF
40
30
5400pF
20
5400pF
20
60
10
10
1000pF
1000pF
100pF
0
0
5
10
15
20
25
30
100pF
0
0
35
5
10
Rise / Fall Time vs. Temperature
VSUPPLY = 15V CLOAD = 1000pF
25
30
35
Fig. 8
Rise Time vs. Capacitive Load
70
10
5V
9
60
8
Rise Time (ns)
Rise / Fall Time (ns)
20
Supply Voltage (V)
Supply Voltage (V)
Fig. 7
15
7
6
5
4
3
50
15V
30V
40
30
20
2
10
1
0
-50
-30
-10
10
30
50
70
90
110
130
0
100
150
1000
Temperature (C)
Fig. 9
Fig. 10
Fall Time vs. Capacitive Load
70
Input Threshold Levels vs. Supply Voltage
2.5
Threshold Level (V)
5V
60
Fall Time (ns)
10000
Load Capacitance (pF)
50
15V
30V
40
30
20
2
Positive going input
1.5
Negative going input
1
0.5
10
0
100
0
1000
10000
0
Load Capacitance (pF)
Copyright © 2007 IXYS CORPORATION All rights reserved
5
10
15
20
Supply Voltage (V)
6
25
30
35
IXDF504 / IXDI504 / IXDN504
Fig. 11
Input Threshold Levels vs. Temperature
Propagation Delay vs. Supply Voltage
Rising Input, CLOAD = 1000pF
Fig. 12
VSUPPLY = 15V
35
Propagation Delay Time (ns)
Input Threshold Level (V)
3
2.5
2
Positive going input
1.5
Negative going input
1
0.5
30
25
20
15
10
5
0
0
-50
0
50
100
0
150
5
10
Temperature (C)
Fig. 13
Fig. 14
Propagation Delay vs. Supply Voltage
Falling Input, CLOAD = 1000pF
25
30
35
Propagation Delay vs. Temperature
VSUPPLY = 15V CLOAD = 1000pF
35
40
Propagation Delay Time (ns)
Propagation Delay Time (ns)
20
Supply Voltage (V)
45
35
30
25
20
15
10
5
0
0
5
10
15
20
25
30
30
Negative going input
25
20
15
Positve going input
10
5
0
-50
35
0
Supply Voltage (V)
Fig. 16
Quiescent Current vs. Supply Voltage
VIN = 0V
1
0.1
0.01
0
5
10
15
20
25
100
150
30
Quiescent Current vs. Temperature
VSUPPLY = 15V
1000
Quiescent Current (uA)
10
50
Temeprature (C)
Fig. 15
Quiesent Current (uA)
15
100
10
1
Non-inverting, Input= "0"
Inverting Input = "1"
0.1
0.01
-50
35
Supply Voltage (V)
-30
-10
10
30
50
70
Temperature (C)
7
90
110
130
150
IXDF504 / IXDI504 / IXDN504
Fig. 18
Fig. 17
Supply Current vs. Capacitive Load
VSUPPLY = 5V
100
2MHz
100
Supply Current vs. Frequency
VSUPPLY = 5V
10000pF
5400pF
Supply Current (mA)
Supply Current (mA)
1MHz
10
100kHz
1
10kHz
0.1
0.01
100
1000pF
10
100pF
1
0.1
0.01
1000
10
10000
1000
Fig. 20
Supply Current vs. Capacitive Load
VSUPPLY = 15V
Supply Current vs. Frequency
VSUPPLY = 15V
1000
1000
10000pF
5400pF
1MHz
Supply Current (mA)
Supply Current (mA)
2MHz
100
100kHz
10
10kHz
1
0.1
0.01
100
100
1000pF
100pF
10
1
0.1
0.01
1000
10000
10
Load Capacitance (pF)
Fig. 21
1000
100
1000
Fig. 22
Supply Current vs. Frequency
VSUPPLY = 30V
1000
2MHz
10000pF
5400pF
Supply Current (mA)
1MHz
Supply Current (mA)
10000
Frequency (kHz)
Supply Current vs. Capacitive Load
VSUPPLY = 30V
100
100kHz
10
10kHz
1
0.1
100
10000
Frequency (kHz)
Load Capacitance (pF)
Fig. 19
100
1000pF
100
100pF
10
1
0.1
1000
10000
10
Load Capacitance (pF)
Copyright © 2007 IXYS CORPORATION All rights reserved
100
1000
Frequency (kHz)
8
10000
IXDF504 / IXDI504 / IXDN504
Fig. 23
Fig. 24
Output Source Current vs. Supply Voltage
Output Sink Current vs. Supply Voltage
10
-2
Sink Current (A)
0
Source Current (A)
12
8
6
4
2
-4
-6
-8
-10
-12
0
-14
0
5
10
15
20
25
30
35
0
5
10
Supply Voltage (V)
Fig. 25
Fig. 26
Output Source Current vs. Temperature
VSUPPLY = 15V
30
35
Output Sink Current vs. Temperature
VSUPPLY = 15V
Output Sink Current (A)
Output Source Current (A)
25
0
5
4
3
2
1
-1
-2
-3
-4
-5
-6
0
-50
0
50
100
-50
150
0
50
100
150
Temperature (C)
Temperature (C)
Fig. 28
High State Output Resistance vs. Supply Voltage
3
Low State Output Resistance vs. Supply Voltage
3
Output Resistance (ohms)
Output Resistance (ohms)
20
Supply Voltage (V)
6
Fig. 27
15
2.5
2
1.5
1
0.5
0
2.5
2
1.5
1
0.5
0
0
5
10
15
20
25
30
35
0
Supply Voltage (V)
5
10
15
20
Supply Voltage (V)
9
25
30
35
IXDF504 / IXDI504 / IXDN504
Supply Bypassing, Grounding Practices And Output Lead inductance
When designing a circuit to drive a high speed MOSFET
utilizing the IXD_504, it is very important to observe certain
design criteria in order to optimize performance of the driver.
Particular attention needs to be paid to Supply Bypassing,
Grounding, and minimizing the Output Lead Inductance.
Say, for example, we are using the IXD_504 to charge a 2500pF
capacitive load from 0 to 25 volts in 25ns.
Using the formula: IC = C (∆V/∆t), where ∆V=25V C=2500pF &
∆t=25ns, we can determine that to charge 2500pF to 25 volts
in 25ns will take a constant current of 2.5A. (In reality, the
charging current won’t be constant and will peak somewhere
around 4A).
SUPPLY BYPASSING
In order for our design to turn the load on properly, the IXD_504
must be able to draw this 2.5A of current from the power supply
in the 25ns. This means that there must be very low impedance
between the driver and the power supply. The most common
method of achieving this low impedance is to bypass the power
supply at the driver with a capacitance value that is an order of
magnitude larger than the load capacitance. Usually, this
would be achieved by placing two different types of bypassing
capacitors, with complementary impedance curves, very close
to the driver itself. (These capacitors should be carefully
selected and should have low inductance, low resistance and
high-pulse current-service ratings). Lead lengths may radiate
at high frequency due to inductance, so care should be taken
to keep the lengths of the leads between these bypass
capacitors and the IXD_504 to an absolute minimum.
GROUNDING
In order for the design to turn the load off properly, the IXD_504
must be able to drain this 2.5A of current into an adequate
grounding system. There are three paths for returning current
that need to be considered: Path #1 is between the IXD_504
and its load. Path #2 is between the IXD_504 and its power
supply. Path #3 is between the IXD_504 and whatever logic is
driving it. All three of these paths should be as low in resistance
and inductance as possible, and thus as short as practical. In
addition, every effort should be made to keep these three
ground paths distinctly separate. Otherwise, the returning
ground current from the load may develop a voltage that would
have a detrimental effect on the logic line driving the IXD_504.
OUTPUT LEAD INDUCTANCE
Of equal importance to Supply Bypassing and Grounding are
issues related to the Output Lead Inductance. Every effort
should be made to keep the leads between the driver and its
load as short and wide as possible. If the driver must be placed
farther than 0.2” (5mm) from the load, then the output leads
should be treated as transmission lines. In this case, a twistedpair should be considered, and the return line of each twisted
pair should be placed as close as possible to the ground pin
of the driver, and connected directly to the ground terminal of the
load.
Copyright © 2007 IXYS CORPORATION All rights reserved
10
IXDF504 / IXDI504 / IXDN504
A2
b
b2
b3
c
D
D1
E
E1
e
eA
eB
L
E
H
B
C
D
E
e
H
h
L
M
N
D
A
A1
e
B
h X 45
N
L
C
]
0.018 [0.47]
0.137 [3.48]
IXYS Corporation
3540 Bassett St; Santa Clara, CA 95054
Tel: 408-982-0700; Fax: 408-496-0670
e-mail: [email protected]
www.ixys.com
0.120 [3.05]
0.020 [0.51]
[
S0.002^0.000; o S0.05^0.00;o
0.039 [1.00]
0.035 [0.90]
0.157±0.005 [3.99±0.13]
0.197±0.005 [5.00±0.13]
0.019 [0.49]
M
0.100 [2.54]
IXYS Semiconductor GmbH
Edisonstrasse15 ; D-68623; Lampertheim
Tel: +49-6206-503-0; Fax: +49-6206-503627
e-mail: [email protected]
11