NSC 54174FMQB

54174/DM54174/DM74174, 54175/DM54175/DM74175
Hex/Quad D Flip-Flops with Clear
General Description
Features
These positive-edge triggered flip-flops utilize TTL circuitry
to implement D-type flip-flop logic. All have a direct clear
input, and the quad (175) version features complementary
outputs from each flip-flop.
Information at the D inputs meeting the setup and hold time
requirements is transferred to the Q outputs on the positivegoing edge of the clock pulse. Clock triggering occurs at a
particular voltage level and is not directly related to the transition time of the positive-going pulse. When the clock input
is at either the high or low level, the D input signal has no
effect at the output.
Y
Y
Y
Y
Y
Y
Y
Y
174 contains six flip-flops with single-rail outputs
175 contains four flip-flops with double-rail outputs
Buffered clock and direct clear inputs
Individual data input to each flip-flop
Applications include:
Buffer/storage registers
Shift registers
Pattern generators
Typical clock frequency 40 MHz
Typical power dissipation per flip-flop 38 mW
Alternate Military/Aerospace device (54174, 54175) is
available. Contact a National Semiconductor Sales Office/Distributor for specifications.
Connection Diagrams
Dual-In-Line Package
Dual-In-Line Package
TL/F/6557 – 2
TL/F/6557 – 1
Order Number 54175DMQB, 54175FMQB, DM54175J,
DM54175W or DM74175N
See NS Package Number J16A, N16E or W16A
Order Number 54174DMQB, 54174FMQB, DM54174J,
DM54174W or DM74174N
See NS Package Number J16A, N16E or W16A
Function Table (Each Flip-Flop)
Inputs
Outputs
Clear
Clock
D
Q
Q²
L
H
H
H
X
X
H
L
X
L
H
L
Q0
H
L
H
Q0
u
u
L
H e High Level (steady state)
L e Low Level (steady state)
X e Don’t Care
u e Transition from low to high level
Q0 e The level of Q before the indicated steady-state input conditions were established.
² e 175 only
C1995 National Semiconductor Corporation
TL/F/6557
RRD-B30M105/Printed in U. S. A.
54174/DM54174/DM74174, 54175/DM54175/DM74175 Hex/Quad D Flip-Flops with Clear
June 1989
Absolute Maximum Ratings (Note)
Note: The ‘‘Absolute Maximum Ratings’’ are those values
beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The
parametric values defined in the ‘‘Electrical Characteristics’’
table are not guaranteed at the absolute maximum ratings.
The ‘‘Recommended Operating Conditions’’ table will define
the conditions for actual device operation.
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage
7V
Input Voltage
5.5V
Operating Free Air Temperature Range
b 55§ C to a 125§ C
DM54 and 54
DM74
0§ C to a 70§ C
Storage Temperature Range
b 65§ C to a 150§ C
Recommended Operating Conditions
Symbol
DM54174
Parameter
DM74174
Nom
Max
Min
Nom
Max
4.5
5
5.5
4.75
5
5.25
VCC
Supply Voltage
VIH
High Level Input Voltage
VIL
Low Level Input Voltage
IOH
High Level Output Current
IOL
Low Level Output Current
fCLK
Clock Frequency (Note 4)
0
tW
Pulse Width
(Note 4)
25
2
V
2
V
0.8
0.8
V
b 0.8
b 0.8
mA
16
Clock Low
Units
Min
30
0
16
mA
30
MHz
25
Clock High
10
10
Clear
20
20
tSU
Data Setup Time (Note 4)
20
20
ns
tH
Data Hold Time (Note 4)
0
0
ns
tREL
Clear Release Time (Note 4)
30
30
TA
Free Air Operating Temperature
b 55
125
ns
ns
0
70
§C
’174 Electrical Characteristics
over recommended operating free air temperature range (unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
(Note 1)
Max
Units
b 1.5
V
VI
Input Clamp Voltage
VCC e Min, II e b12 mA
VOH
High Level Output
Voltage
VCC e Min, IOH e Max
VIL e Max, VIH e Min
VOL
Low Level Output
Voltage
VCC e Min, IOL e Max
VIH e Min, VIL e Max
II
Input Current @ Max
Input Voltage
VCC e Max, VI e 5.5V
IIH
High Level Input Current
VCC e Max, VI e 2.4V
40
mA
IIL
Low Level Input Current
VCC e Max, VI e 0.4V
b 1.6
mA
IOS
Short Circuit
Output Current
VCC e Max
(Note 2)
Supply Current
VCC e Max (Note 3)
ICC
2.4
V
0.4
V
1
mA
DM54
b 20
b 57
DM74
b 18
b 57
45
65
Note 1: All typicals are at VCC e 5V, TA e 25§ C.
Note 2: Not more than one output should be shorted at a time.
Note 3: With all outputs open and all DATA and CLEAR inputs at 4.5V, ICC is measured after a momentary ground, then 4.5V applied to the CLOCK input.
Note 4: TA e 25§ C and VCC e 5V.
2
mA
mA
’174 Switching Characteristics
at VCC e 5V and TA e 25§ C (See Section 1 for Test Waveforms and Output Load)
Symbol
Parameter
RL e 400X, CL e 15 pF
From (Input)
To (Output)
Min
Units
Max
fMAX
Maximum Clock
Frequency
tPLH
Propagation Delay Time
Low to High Level Output
Clock to
Any Q
25
ns
tPHL
Propagation Delay Time
High to Low Level Output
Clock to
Any Q
25
ns
tPHL
Propagation Delay Time
High to Low Level Output
Clear to
Any Q
40
ns
30
MHz
Recommended Operating Conditions
Symbol
DM54175
Parameter
VCC
Supply Voltage
VIH
High Level Input Voltage
VIL
Low Level Input Voltage
DM74175
Nom
Max
Min
Nom
Max
4.5
5
5.5
4.75
5
5.25
2
2
V
V
0.8
0.8
V
b 0.8
mA
16
mA
30
MHz
IOH
High Level Output Current
b 0.8
IOL
Low Level Output Current
16
fCLK
Clock Frequency (Note 1)
0
tW
Pulse Width
(Note 1)
25
Clock Low
Units
Min
30
0
25
Clock High
10
10
Clear
20
20
tSU
Data Setup Time (Note 1)
20
20
ns
tH
Data Hold Time (Note 1)
0
0
ns
tREL
Clear Release Time (Note 1)
TA
Free Air Operating Temperature
30
ns
30
b 55
125
Note 1: TA e 25§ C and VCC e 5V.
3
0
ns
70
§C
’175 Electrical Characteristics
over recommended operating free air temperature range (unless otherwise noted)
Symbol
Parameter
Conditions
VI
Input Clamp Voltage
VCC e Min, II e b12 mA
VOH
High Level Output
Voltage
VCC e Min, IOH e Max
VIL e Max, VIH e Min
VOL
Low Level Output
Voltage
VCC e Min, IOL e Max
VIH e Min, VIL e Max
II
Input Current @ Max
Input Voltage
VCC e Max, VI e 5.5V
IIH
High Level Input Current
IIL
IOS
ICC
Min
Typ
(Note 1)
Max
Units
b 1.5
V
2.4
V
0.4
V
1
mA
VCC e Max, VI e 2.4V
40
mA
Low Level Input Current
VCC e Max, VI e 0.4V
b 1.6
mA
Short Circuit
Output Current
VCC e Max
(Note 2)
Supply Current
VCC e Max (Note 3)
DM54
b 20
b 57
DM74
b 18
b 57
30
45
mA
mA
’175 Switching Characteristics
at VCC e 5V and TA e 25§ C (See Section 1 for Test Waveforms and Output Load)
Symbol
Parameter
From (Input)
To (Output)
RL e 400X, CL e 15 pF
Min
Units
Max
fMAX
Maximum Clock
Frequency
tPLH
Propagation Delay Time
Low to High Level Output
Clock to
Any Q or Q
25
ns
tPHL
Propagation Delay Time
High to Low Level Output
Clock to
Any Q or Q
25
ns
tPLH
Propagation Delay Time
Low to High Level Output
Clear to
Any Q
25
ns
tPHL
Propagation Delay Time
High to Low Level Output
Clear to
Any Q
40
ns
30
MHz
Note 1: All typicals are at VCC e 5V, TA e 25§ C.
Note 2: Not more than one output should be shorted at a time.
Note 3: With all outputs open and 4.5V applied to all DATA and CLEAR inputs, ICC is measured after a momentary ground then 4.5V applied to the CLOCK.
4
Logic Diagrams
174
175
TL/F/6557 – 4
TL/F/6557 – 3
5
6
Physical Dimensions inches (millimeters)
16-Lead Ceramic Dual-In-Line Package (J)
Order Number 54174DMQB, 54175DMQB, DM54174J or DM54175J
NS Package Number J16A
16-Lead Molded Dual-In-Line Package (N)
Order Number DM74174N or DM74175N
NS Package Number N16E
7
54174/DM54174/DM74174, 54175/DM54175/DM74175 Hex/Quad D Flip-Flops with Clear
Physical Dimensions inches (millimeters) (Continued)
16-Lead Ceramic Flat Package (W)
Order Number 54174FMQB, 54175FMQB, DM54174W or DM54175W
NS Package Number W16A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
National Semiconductor
Corporation
1111 West Bardin Road
Arlington, TX 76017
Tel: 1(800) 272-9959
Fax: 1(800) 737-7018
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
National Semiconductor
Europe
Fax: (a49) 0-180-530 85 86
Email: cnjwge @ tevm2.nsc.com
Deutsch Tel: (a49) 0-180-530 85 85
English Tel: (a49) 0-180-532 78 32
Fran3ais Tel: (a49) 0-180-532 93 58
Italiano Tel: (a49) 0-180-534 16 80
National Semiconductor
Hong Kong Ltd.
13th Floor, Straight Block,
Ocean Centre, 5 Canton Rd.
Tsimshatsui, Kowloon
Hong Kong
Tel: (852) 2737-1600
Fax: (852) 2736-9960
National Semiconductor
Japan Ltd.
Tel: 81-043-299-2309
Fax: 81-043-299-2408
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.