DAC0854 Quad 8-Bit Voltage-Output Serial D/A Converter with Readback General Description Features The DAC0854 is a complete quad 8-bit voltage-output digital-to-analog converter that can operate on a single 5V supply. It includes on-chip output amplifiers, internal voltage reference, and a serial microprocessor interface. By combining in one package the reference, amplifiers, and conversion circuitry for four D/A converters, the DAC0854 minimizes wiring and parts count and is hence ideally suited for applications where cost and board space are of prime concern. The DAC0854 also has a data readback function, which can be used by the microprocessor to verify that the desired input word has been properly latched into the DAC0854’s data registers. The data readback function simplifies the design and reduces the cost of systems which need to verify data integrity. The logic comprises a MICROWIRETM -compatible serial interface and control circuitry. The interface allows the user to write to any one of the input registers or to all four at once. The latching registers are double-buffered, consisting of 4 separate input registers and 4 DAC registers. Double buffering allows all 4 DAC outputs to be updated simultaneously. The four reference inputs allow the user to configure the system to have a separate output voltage range for each DAC. The output voltage of each DAC can range between 0.3V and 2.8V and is a function of VBIAS, VREF, and the input word. Y Y Y Y Y Y Y Y Key Specifications Y Y Y Y Y Y Y Y Guaranteed monotonic over temperature g (/2 LSB max Integral linearity error Output settling time 2.7 ms max Analog output voltage range 0.3V to 2.8V Supply voltage range 4.5V to 5.5V Clock frequency 10 MHz max Power dissipation (fCLK e 10 MHz) 95 mW max On-board reference 2.65V g 2% max Applications Y Y Y Y Connection Diagram Single a 5V supply operation MICROWIRE serial interface allows easy interface to many popular microcontrollers including the COPSTM and HPCTM families of microcontrollers Data readback capability Output data can be formatted to read back MSB or LSB first Versatile logic allows selective or global update of the DACs Power fail flag Output amplifiers can drive 2 kX load Synchronous/asynchronous update of the DAC outputs Automatic test equipment Industrial process controls Automotive controls and diagnostics Instrumentation Ordering Information Industrial (b40§ C k TA a 85§ C) Package DAC0854BIN, DAC0854CIN N20A Molded DIP DAC0854CIJ J20A Ceramic DIP DAC0854BIWM, DAC0854CIWM M20B Small Outline Military (b55§ C k TA k a 125§ C) DAC0854CMJ/883 J20A Ceramic DIP TL/H/11261 – 1 Top View COPSTM , HPCTM and MICROWIRETM are trademarks of National Semiconductor Corporation. C1995 National Semiconductor Corporation TL/H/11261 RRD-B30M75/Printed in U. S. A. DAC0854 Quad 8-Bit Voltage-Output Serial D/A Converter with Readback January 1995 Absolute Maximum Ratings (Notes 1 & 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Soldering Information J Package (10 sec.) N Package (10 sec.) 300§ C 260§ C (Note 24) Supply Voltage (AVCC, DVCC) SO Package Vapor Phase (60 sec.) Infrared (15 sec.) (Note 7) 215§ C 220§ C 7V g 5.5V Supply Voltage Difference (AVCC – DVCC) Voltage at Any Pin (Note 3) GND b0.3V to AVCC/DVCC a 0.3V Input Current at Any Pin (Note 3) 5 mA Package Input Current (Note 4) 20 mA Power Dissipation (Note 5) 105 mW ESD Susceptibility (Note 6) 1250V Storage Temperature b 65§ C to a 150§ C Operating Ratings (Notes 1 & 2) Supply Voltage 4.5V to 5.5V g IV Supply Voltage Difference (AVCC b DVCC) Temperature Range TMIN k TA k TMAX DAC0854BIN, DAC0854CIN, DAC0854CIJ, DAC0854BIWM, b 40§ C k TA k 85§ C DAC0854CIWM b 55§ C k TA k 125§ C DAC0854CMJ/883 Converter Electrical Characteristics The following specifications apply for AVCC e DVCC e 5V, VREF e 2.65V, VBIAS e 1.4V, RL e 2 kX (RL is the load resistor on the analog outputs – pins 1, 11, 14, and 19) and fCLK e 10 MHz unless otherwise specified. Boldface limits apply for TA e TJ from TMIN to TMAX. All other limits apply for TA e 25§ C. Conditions Typical (Note 8) Limit (Note 9) Units (Limits) Resolution fCLK e 10 MHz 8 8 bits Monotonicity (Note 10) 8 8 bits Integral Linearity Error DAC0854BIN, DAC0854BIWM DAC0854CIN, DAC0854CIJ, DAC0854CIWM, DAC0854CMJ (Note 11) g 0.5 LSB (max) g 1.0 LSB (max) g 1.0 LSB (max) Symbol Parameter STATIC CHARACTERISTICS n Differential Linearity Error Fullscale Error (Note 12) Fullscale Error Tempco (Note 13) g 35 b 30 mV ppm/§ C Zero Error (Note 14) Zero Error Tempco (Note 13) b 30 g 35 mV Power Supply Sensitivity (Note 15) b 42 b 34 dB (max) ppm/§ C DYNAMIC CHARACTERISTICS ts a Positive Voltage Output Settling Time (Note 16) CL e 200 pF 1.5 2.1 ms tsb Negative Voltage Output Settling Time (Note 16) CL e 200 pF 1.8 2.7 ms Digital Crosstalk (Note 17) 1.8 mVp-p Digital Feedthrough (Note 18) 8.5 mVp-p Clock Feedthrough (Note 19) 3.3 mVp-p Channel-to-Channel Isolation (Note 20) b 78 dB Glitch Energy (Note 21) 7 nVbs 38 mV (Note 22) b 49 dB Peak Value of Largest Glitch PSRR Power Supply Rejection Ratio 2 Converter Electrical Characteristics (Continued) The following specifications apply for AVCC e DVCC e 5V, VREF e 2.65V, VBIAS e 1.4V, RL e 2 kX (RL is the load resistor on the analog outputs – pins 1, 11, 14, and 19) and fCLK e 10 MHz unless otherwise specified. Boldface limits apply for TA e TJ from TMIN to TMAX. All other limits apply for TA e 25§ C. Symbol Parameter Conditions Typical (Note 3) Limit (Note 4) Units (Limits) DIGITAL AND DC ELECTRICAL CHARACTERISTICS VIN(1) Logical ‘‘1’’ Input Voltage AVCC e DVCC e 5.5V 2.0 V (min) VIN(0) Logical ‘‘0’’ Input Voltage AVCC e DVCC e 4.5V 0.8 V (max) IIL Digital Input Leakage Current 1 5 mA (max) CIN Input Capacitance 4 COUT Output Capacitance 5 VOUT(1) Logical ‘‘1’’ Output Voltage ISOURCE e 0.8 mA 2.4 V (min) VOUT(0) Logical ‘‘0’’ Output Voltage ISINK e 3.2 mA 0.4 V (max) VINT Interrupt Pin Output Voltage 10 kX Pullup 0.4 V (max) IS Supply Current Outputs Unloaded 19 mA 4 10 kX (min) kX (max) 14 pF pF REFERENCE INPUT CHARACTERISTICS VREF Input Voltage Range RREF Input Resistance CREF Input Capacitance 0 – 2.75 7 Full-Scale Data Input V 40 pF VBIAS INPUT CHARACTERISTICS VBIAS CBIAS VBIAS Input Voltage Range 0.3 – 1.4 V Input Leakage 1 mA Input Capacitance 9 pF BANDGAP REFERENCE CHARACTERISTICS (CL e 220mF) VREFOUT Output Voltage DVREF/DT Tempco (Note 23) 22 2.65 g 2% V Line Regulation 4.5V k VCC k 5.5V, IL e 4 mA 2 5 mV DVREF/DIL Load Regulation 0 k IL k 4 mA 0 k IL k 4 mA; CMJ Suffix b 1 k IL k 0 mA 2 2 2.5 6 15 mV mV mV ISC Short Circuit Current VREFOUT e 0V 12 ppm/§ C mA AC ELECTRICAL CHARACTERISTICS tDS Data Setup Time 10 ns (min) tDH Data Hold Time 0 ns (min) tCS Control Setup Time 15 ns (min) tCH Control Hold Time 0 ns (min) tMIN Clock Frequency 10 MHz (max) tH Minimum Clock High Time 20 ns (min) tL Minimum Clock Low Time 40 ns (min) 3 Converter Electrical Characteristics (Continued) The following specifications apply for AVCC e DVCC e 5V, VREF e 2.65V, VBIAS e 1.4V, RL e 2 kX (RL is the load resistor on the analog outputs – pins 1, 11, 14, and 19) and fCLK e 10 MHz unless otherwise specified. Boldface limits apply for TA e TJ from TMIN to TMAX. All other limits apply for TA e 25§ C. Symbol Parameter Typical (Note 3) Conditions Limit (Note 4) Units (Limits) AC ELECTRICAL CHARACTERISTICS (Continued) tCZ1 Output Hi-Z to Valid 1 37 ns (max) tCZ0 Output Hi-Z to Valid 0 42 ns (max) t1H CS to Output Hi-Z 10 kX with 60 pF 130 ns (max) t0H CS to Output Hi-Z 10 kX with 60 pF 117 ns (max) Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional. These ratings do not guarantee specific performance limits, however. For guaranteed specifications and test conditions, see the Converter Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions. Note 2: All voltages are measured with respect to ground, unless otherwise specified. Note 3: When the input voltage (VIN) at any pin exceeds the power supply rails (VIN k GND or VIN l V a ) the absolute value of current at that pin should be limited to 5 mA or less. Note 4: The sum of the currents at all pins that are driven beyond the power supply voltages should not exceed 20 mA. Note 5: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), HJA (package junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax e (TJmax b TA)/HJA or the number given in the Absolute Maximum Ratings, whichever is lower. The table below details TJmax and HJA for the various packages and versions of the DAC0854. Part Number TJmax (§ C) HJA (§ C/W) DAC0854BIN, DAC0854CIN DAC0854BIJ, DAC0854CIJ DAC0854BIWM, DAC0854CIWM DAC0854CMJ/883 125 125 125 150 46 53 64 53 Note 6: Human body model, 100 pF discharged through a 1.5 kX resistor. Note 7: See AN450 ‘‘Surface Mounting Methods and Their Effect on Production Reliability’’ of the section titled ‘‘Surface Mount’’ found in any current Linear Databook for other methods of soldering surface mount devices. Note 8: Typicals are at TJ e 25§ C and represent most likely parametric norm. Note 9: Limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 10: A monotonicity of 8 bits for the DAC0854 means that the output voltage changes in the same direction (or remains constant) for each increase in the input code. Note 11: Integral linearity error is the maximum deviation of the output from the line drawn between zero and full-scale (excluding the effects of zero error and fullscale error). Note 12: Full-scale error is measured as the deviation from the ideal 2.800V full-scale output when VREF e 2.650V and VBIAS e 1.400V. Note 13: Full-scale error tempco and zero error tempco are defined by the following equation: Error tempco e Ð Error (TMAX) b Error (TMIN) VSPAN ( ÐT 106 MAX b TMIN ( where Error (TMAX) is the zero error or full-scale error at TMAX (in volts), and Error (TMIN) is the zero error or full-scale error at TMIN (in volts); VSPAN is the output voltage span of the DAC0854, which depends on VBIAS and VREF. Note 14: Zero error is measured as the deviation from the ideal 0.310V output when VREF e 2.650V, VBIAS e 1.400V, and the digital input word is all zeros. Note 15: Power Supply Sensitivity is the maximum change in the offset error or the full-scale error when the power supply differs from its optimum 5V by up to 0.25V (5%). The load resistor RL e 5 kX. Note 16: Positive or negative settling time is defined as the time taken for the output of the DAC to settle to its final full-scale or zero output to within g 0.5 LSB. This time shall be referenced to the 50% point of the positive edge of CS, which initiates the update of the analog outputs. Note 17: Digital crosstalk is the glitch measured on the output of one DAC while applying an all 0s to all 1s transition at the input of the other DACs. Note 18: All DACs have full-scale outputs latched and DI is clocked with no update of the DAC outputs. The glitch is then measured on the DAC outputs. Note 19: Clock feedthrough is measured for each DAC with its output at full-scale. The serial clock is then applied to the DAC at a frequency of 10 MHz and the glitch on each DAC full-scale output is measured. Note 20: Channel-to-channel isolation is a measure of the effect of a change in one DAC’s output on the output of another DAC. The VREF of the first DAC is varied between 1.4V and 2.65V at a frequency of 15 kHz while the change in full-scale output of the second DAC is measured. The first DAC is loaded with all 0s. Note 21: Glitch energy is the difference between the positive and negative glitch areas at the output of the DAC when a 1 LSB digital input code change is applied to the input. The glitch energy will have its largest value at one of the three major transitions. The peak value of the maximum glitch is separately specified. Note 22: Power Supply Rejection Ratio is measured by varying AVCC e DVCC between 4.75V and 5.25V with a frequency of 10 kHz and measuring the proportion of this signal imposed on a full-scale output of the DAC under consideration. Note 23: The bandgap reference tempco is defined by the following equation: Tempco e Ð VREF (TMAX) b VREF (TMIN) VREF (TROOM) ( ÐT 106 MAX b TMIN ( where TROOM e 25§ C, VREF (TMAX) is the reference output at TMAX, and similarly for VREF (TMIN) and VREF (TROOM). Note 24: A Military RETS specification is available upon request. 4 Typical Converter Performance Characteristics Zero Error vs Temperature Full-Scale Error vs Temperature Supply Current vs Temperature Zero Error PSRR vs Temperature Full-Scale Error PSRR vs Temperature Supply Current vs Clock Frequency TL/H/11261 – 2 Typical Reference Performance Characteristics Bandgap Voltage vs Temperature Line Regulation vs Temperature TL/H/11261 – 3 TL/H/11261 – 4 5 TRI-STATE Test Circuits and Waveforms TL/H/11261 – 6 TL/H/11261–5 TL/H/11261 – 8 TL/H/11261–7 Timing Waveforms Data Input Timing Data Output Timing TL/H/11261 – 10 TL/H/11261–9 Timing Diagrams TL/H/11261 – 11 FIGURE 1. Write to One DAC with Update of Output (AU e 1) 6 Timing Diagrams (Continued) TL/H/11261 – 12 * DACs are written to LSB first. DAC1 is written to first, then DACs 2, 3, and 4. FIGURE 2. Write to All DACs with Update of Outputs (AU e 1) TL/H/11261 – 13 FIGURE 3. Read One DAC, DO Changes on Falling Edge, DO LSB First (AU e 1) TL/H/11261 – 14 *DAC1 is read first, then DACs 2, 3, and 4. FIGURE 4. Read All DACs, DO LSB First, DO Changes on Falling Edge (AU e 1) 7 Block Diagram TL/H/11261 – 15 Pin Description VOUT1(19) VOUT2(1) VOUT3(14) VOUT4(11) VREFOUT(16) VBIAS1(2) VBIAS2(13) GND(7) DVCC(10) AVCC(17) AU(4) The voltage output connections of the four DACS. These provide output voltages in the range 0.3V–2.8V. VREF1(18) VREF2(20) VREF3(15) VREF4(12) CS(3) The internal voltage reference output. The output of the reference is 2.65V g 2%. This pin should be bypassed with a 220 mF capacitor. VBIAS1 is connected to the non-inverting inputs of output amplifiers 1 and 2, thereby setting the virtual ground voltage for DAC’s 1 and 2, while VBIAS2 performs this function for DAC’s 3 and 4. The allowed range is 0.3V –1.4V. The system ground pin. Connect to clean ground point. The digital and analog power supply pins. The power supply range of the DAC0854 is 4.5V – 5.5V. To guarantee accuracy, it is required that the AVCC and DVCC pins be bypassed separately with bypass capacitors of 10 mF tantalum in parallel with 0.1 mF ceramic. CLK(5) DI(9) DO(6) INT(8) 8 When this pin is taken low, all DAC outputs will be asynchronously updated. CS must be held high during the update. The voltage reference inputs for the four DACs. The allowed range is 0V – 2.75V. The Chip Select control input. This input is active low. The external clock input pin. The serial data input. The data is clocked in LSB first. Preceding the data byte are 4 or 6 bits of instructions. The serial data output. The data can be clocked out either MSB or LSB first, and on either the positive or negative edge of the clock. The power interrupt output. On an interruption of the power supply, this pin goes low. Since this pin has an open drain output, a 10 kX pull-up resistor must be connected to the supply. Applications Information The current output IOUT2 is applied to the internal output amplifier and converted to a voltage. The output voltage of each DAC is a function of VBIAS, VREF, and the digital input word, and is given by FUNCTIONAL DESCRIPTION The DAC0854 is a monolithic quad 8-bit digital-to-analog converter that is designed to operate on a single 5V supply. Each of the four units is comprised of an input register, a DAC register, a shift register, a current output DAC, and an output amplifier. In addition, the DAC0854 has an onboard bandgap reference and a logic unit which controls the internal operation of the DAC0854 and interfaces it to microprocessors. Each of the four internal 8-bit DACs uses a modified R-2R ladder to effect the digital-to-analog conversion (Figure 5). The resistances corresponding to the 2 most significant bits are segmented to reduce glitch energy and to improve matching. The bottom of the ladder has been modified so that the voltage across the LSB resistor is much larger than the input offset voltage of the buffer amplifier. The input digital code determines the state of the switches in the ladder network. The sum of currents IOUT1 and IOUT2 is fixed and is given by IOUT1 a IOUT2 e # VREF b VBIAS R VOUT e 2 (VREFbVBIAS) DATA 511 255 a VBIASb VREF 256 128 128 The output voltage range for each DAC is 0.3V – 2.8V. This range can be achieved by using the internal 2.65V reference and a voltage divider network which provides a VBIAS of 1.40V (Figure 6). In this case the DAC transfer function is VOUT e 2.5 (DATA) a 0.310 256 The output impedance of any external reference that is used will affect the accuracy of the conversion. In order that this error be less than (/2 LSB, the output impedance of the external reference must be less than 7.8X. J 256 255 TL/H/11261 – 16 FIGURE 5. Equivalent Circuit of R-2R Ladder and Output Amplifier TL/H/11261 – 17 FIGURE 6. Generating a VBIAS e 1.40V from the Internal Reference 9 Digital Interface Table I lists the instruction set for the WRITE mode when writing to only a single DAC, and Table II lists the instruction set for a global write. The DACs are always written to LSB first. All DACs will be written to if the global bit (G) is high; DAC 1 is written to first, then DACs 2, 3 and 4 (in that order). If the update bit is high, then the DAC output will be updated on the rising edge of CS; otherwise, the new data byte will be placed only in the input register. Chip Select (CS) must remain low for at least one clock cycle after the last data bit has been entered. (See Figures 1 and 2 ) The DAC0854 has two interface modes: a WRITE mode and a READ mode. The WRITE mode is used to convert an 8-bit digital input word into a voltage. The READ mode is used to read back the digital data that was sent to one or all of the DACs. These modes are selected by the appropriate setting of the RD/WR bit, which is part of the instruction byte. The instruction byte precedes the data byte at the DI pin. In both modes, a high level on the Start Bit (SB) alerts the DAC to respond to the remainder of the input stream. TABLE I. WRITE Mode Instruction Set (Writing to a Single DAC) SB RD/WR Bit Ý1 Bit Ý2 G U A1 A0 1 0 0 0 0 0 Write DAC 1, no update of DAC outputs 1 0 0 0 0 1 Write DAC 2, no update of DAC outputs 1 0 0 0 1 0 Write DAC 3, no update of DAC outputs 1 0 0 0 1 1 Write DAC 4, no update of DAC outputs 1 0 0 1 0 0 Write DAC 1, update DAC 1 on CS rising edge 1 0 0 1 0 1 Write DAC 2, update DAC 2 on CS rising edge 1 0 0 1 1 0 Write DAC 3, update DAC 3 on CS rising edge 1 0 0 1 1 1 Write DAC 4, update DAC 4 on CS rising edge Description Bit Ý3 Bit Ý4 Bit Ý5 Bit Ý6 TABLE II. WRITE Mode Instruction Set (Writing to all DACs) SB RD/WR G U Bit Ý 1 Bit Ý2 Bit Ý3 Bit Ý4 1 0 1 0 Write all DACs, no update of outputs 1 0 1 1 Write all DACs, update all outputs on CS rising edge Description 10 Digital Interface (Continued) Table III lists the instruction set for the READ mode. By the appropriate setting of the global (G) and address (A1 and A0) bits, one can select a specific DAC to be read, or one can read all the DACs in succession, starting with DAC 1. The R/F bit determines whether the data changes on the rising or the falling edge of the system clock. With the R/F bit high, the data changes on the rising edge that occurs 1(/2 clock cycles after the end of the instruction byte. With the R/F bit low, the data changes on the falling edge that oc- curs 1 clock cycle after the end of the instruction byte. One can choose to read the data back MSB first or LSB first by setting the M/L bit. (See Figures 3 and 4 ) An asynchronous update of all the DAC outputs can be achieved by taking AU low. The contents of the input registers are loaded into the DAC registers, with the update occurring on the falling edge of AU. CS must be held high during an asynchronous update. All DAC registers will have their contents reset to all zeros on power up. TABLE III. READ MODE Instruction Set SB RD/WR G R/F M/L A1 A0 Bit Ý1 Bit Ý2 Bit Ý3 Bit Ý4 Bit Ý5 Bit Ý6 Bit Ý7 1 1 0 0 0 0 0 Read DAC 1, LSB first, data changes on the falling edge 1 1 0 0 0 0 1 Read DAC 2, LSB first, data changes on the falling edge 1 1 0 0 0 1 0 Read DAC 3, LSB first, data changes on the falling edge 1 1 0 0 0 1 1 Read DAC 4, LSB first, data changes on the falling edge 1 1 0 0 1 0 0 Read DAC 1, MSB first, data changes on the falling edge 1 1 0 0 1 0 1 Read DAC 2, MSB first, data changes on the falling edge 1 1 0 0 1 1 0 Read DAC 3, MSB first, data changes on the falling edge 1 1 0 0 1 1 1 Read DAC 4, MSB first, data changes on the falling edge 1 1 0 1 0 0 0 Read DAC 1, LSB first, data changes on the rising edge 1 1 0 1 0 0 1 Read DAC 2, LSB first, data changes on the rising edge 1 1 0 1 0 1 0 Read DAC 3, LSB first, data changes on the rising edge 1 1 0 1 0 1 1 Read DAC 4, LSB first, data changes on the rising edge 1 1 0 1 1 0 0 Read DAC 1, MSB first, data changes on the rising edge 1 1 0 1 1 0 1 Read DAC 2, MSB first, data changes on the rising edge 1 1 0 1 1 1 0 Read DAC 3, MSB first, data changes on the rising edge 1 1 0 1 1 1 1 Read DAC 4, MSB first, data changes on the rising edge 1 1 1 0 0 1 0 Read all DACs, LSB first, data changes on the falling edge 1 1 1 0 1 1 0 Read all DACs, MSB first, data changes on the falling edge 1 1 1 1 0 1 0 Read all DACs, LSB first, data changes on the rising edge 1 1 1 1 1 1 0 Read all DACs, MSB first, data changes on the rising edge Description Power Fail Function Power Supplies If a power failure occurs on the system using the DAC0854 then the INT pin will be pulled low on the next power-up cycle. To force this output high again and reset this flag, the CS pin will have to be brought low. When this is done the INT output will be pulled high again via an external 10 kX pull-up resistor. This feature may be used by the microprocessor to discard data whose integrity is in question. The DAC0854 is designed to operate from a a 5V (nominal) supply. There are two supply pins, AVCC and DVCC. These pins allow separate external bypass capacitors for the analog and digital portions of the circuit. To guarantee accurate conversions, the two supply pins should each be bypassed with a 0.1 mF ceramic capacitor in parallel with a 10 mF tantalum capacitor. 11 Typical Applications TL/H/11261 – 18 FIGURE 7. Trimming the Offset of a 5V Op Amp Biased at Mid Supply TL/H/11261 – 19 FIGURE 8. Trimming the Offset of a Dual Supply Op Amp Biased at Ground TL/H/11261 – 20 FIGURE 9. Bringing the Output Range Down to Ground 12 Physical Dimensions inches (millimeters) Order Number DAC0854CIJ or DAC0854CMJ/883 NS Package Number J20A Order Number DAC0854BIWM or DAC0854CIWM NS Package Number M20B 13 DAC0854 Quad 8-Bit Voltage-Output Serial D/A Converter with Readback Physical Dimensions inches (millimeters) (Continued) Order Number DAC0854BIN or DAC0854CIN NS Package Number N20A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation 2900 Semiconductor Drive P.O. Box 58090 Santa Clara, CA 95052-8090 Tel: 1(800) 272-9959 TWX: (910) 339-9240 National Semiconductor GmbH Livry-Gargan-Str. 10 D-82256 F4urstenfeldbruck Germany Tel: (81-41) 35-0 Telex: 527649 Fax: (81-41) 35-1 National Semiconductor Japan Ltd. Sumitomo Chemical Engineering Center Bldg. 7F 1-7-1, Nakase, Mihama-Ku Chiba-City, Ciba Prefecture 261 Tel: (043) 299-2300 Fax: (043) 299-2500 2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. National Semiconductor Hong Kong Ltd. 13th Floor, Straight Block, Ocean Centre, 5 Canton Rd. Tsimshatsui, Kowloon Hong Kong Tel: (852) 2737-1600 Fax: (852) 2736-9960 National Semiconductores Do Brazil Ltda. Rue Deputado Lacorda Franco 120-3A Sao Paulo-SP Brazil 05418-000 Tel: (55-11) 212-5066 Telex: 391-1131931 NSBR BR Fax: (55-11) 212-1181 National Semiconductor (Australia) Pty, Ltd. Building 16 Business Park Drive Monash Business Park Nottinghill, Melbourne Victoria 3168 Australia Tel: (3) 558-9999 Fax: (3) 558-9998 National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.