AOD3N40 400V,2.6A N-Channel MOSFET General Description Product Summary The AOD3N40 has been fabricated using an advanced high voltage MOSFET process that is designed to deliver high levels of performance and robustness in popular ACDC applications. By providing low RDS(on), Ciss and Crss along with guaranteed avalanche capability this device can be adopted quickly into new and existing offline power supply designs. VDS 500V@150℃ ID (at VGS=10V) 2.6A RDS(ON) (at VGS=10V) < 3.1Ω 100% UIS Tested! 100% Rg Tested! TO252 DPAK Top View D Bottom View D D G G S S S G AOD3N40 Absolute Maximum Ratings TA=25°C unless otherwise noted Parameter Symbol Drain-Source Voltage VDS Gate-Source Voltage Continuous Drain CurrentB VGS TC=25°C TC=100°C Pulsed Drain Current C Maximum 400 Units V ±30 V 2.6 ID 1.6 A IDM 5.6 IAR 1.5 A EAR 34 mJ Single pulsed avalanche energy H Peak diode recovery dv/dt TC=25°C B o Power Dissipation Derate above 25 C EAS dv/dt 68 5 50 mJ V/ns W Junction and Storage Temperature Range Maximum lead temperature for soldering purpose, 1/8" from case for 5 seconds TJ, TSTG 0.4 -50 to 150 W/ oC °C 300 °C Avalanche Current C Repetitive avalanche energy C Thermal Characteristics Parameter Maximum Junction-to-Ambient A,G Maximum Case-to-sink A Maximum Junction-to-Case Rev0: Oct 2011 D,F PD TL Symbol RθJA RθCS RθJC Typical 46 Maximum 55 Units °C/W 2.1 0.5 2.5 °C/W °C/W Page 1 of 6 AOD3N40 Electrical Characteristics (TJ=25°C unless otherwise noted) Symbol Parameter Conditions Min ID=250µA, VGS=0V, TJ=25°C 400 Typ Max Units STATIC PARAMETERS BVDSS Drain-Source Breakdown Voltage BVDSS /∆TJ Zero Gate Voltage Drain Current IDSS Zero Gate Voltage Drain Current IGSS ID=250µA, VGS=0V, TJ=150°C 500 V ID=250µA, VGS=0V 0.4 V/ oC VDS=400V, VGS=0V 1 VDS=320V, TJ=125°C 10 Gate-Body leakage current VDS=0V, VGS=±30V VGS(th) Gate Threshold Voltage VDS=5V ID=250µA ±100 3.4 µA 4 4.5 nΑ V 3.1 Ω 1 V RDS(ON) Static Drain-Source On-Resistance VGS=10V, ID=1A 2.5 gFS Forward Transconductance VDS=40V, ID=1A 1.7 VSD Diode Forward Voltage IS=1A,VGS=0V 0.8 IS Maximum Body-Diode Continuous Current 2.6 A ISM Maximum Body-Diode Pulsed Current 5.6 A DYNAMIC PARAMETERS Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance Rg Gate resistance VGS=0V, VDS=25V, f=1MHz VGS=0V, VDS=0V, f=1MHz SWITCHING PARAMETERS Qg Total Gate Charge VGS=10V, VDS=320V, ID=2.6A S 145 186 225 pF 15 26 37 pF 1.2 2.1 4.1 pF 2.2 4.4 6.6 Ω 3.3 4.2 5.1 nC 1.2 1.7 2.1 nC 0.5 1.0 1.5 nC Qgs Gate Source Charge Qgd Gate Drain Charge tD(on) Turn-On DelayTime tr Turn-On Rise Time tD(off) Turn-Off DelayTime tf trr Turn-Off Fall Time IF=2.6A,dI/dt=100A/µs,VDS=100V 110 140 170 Qrr Body Diode Reverse Recovery Charge IF=2.6A,dI/dt=100A/µs,VDS=100V 0.5 0.64 0.8 Body Diode Reverse Recovery Time VGS=10V, VDS=200V, ID=2.6A, RG=25Ω 14 ns 10 ns 18 ns 8 ns ns µC A. The value of R θJA is measured with the device in a still air environment with T A =25°C. B. The power dissipation PD is based on TJ(MAX)=150°C in a TO252 package, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation limit for cases where additional heatsinking is used. C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient. E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max. F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=150°C. G.These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C. H. L=60mH, IAS=1.5A, VDD=150V, RG=10Ω, Starting TJ=25°C THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN, FUNCTIONS AND RELIABILITY WITHOUT NOTICE. Rev0: Oct 2011 www.aosmd.com Page 2 of 6 AOD3N40 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 5 10 -55°C VDS=40V 10V 4 7V ID(A) ID (A) 3 6V 2 125°C 1 25°C 1 VGS=5.5V 0 0.1 0 5 10 15 20 25 30 2 VDS (Volts) Fig 1: On-Region Characteristics 6 8 10 VGS(Volts) Figure 2: Transfer Characteristics 3 Normalized On-Resistance 7 6 VGS=10V 5 RDS(ON) (Ω Ω) 4 4 3 2 1 2.5 VGS=10V ID=1A 2 1.5 1 0.5 0 0 1 2 3 -100 4 1.2 -50 0 50 100 150 200 Temperature (°C) Figure 4: On-Resistance vs. Junction Temperature ID (A) Figure 3: On-Resistance vs. Drain Current and Gate Voltage 1.0E+01 1.0E+00 40 1.1 125°C 1.0E-01 1 25°C IS (A) BVDSS (Normalized) ID=30A 125° 1.0E-02 0.9 1.0E-03 25° 0.8 1.0E-04 -100 Rev0: Oct 2011 -50 0 50 100 150 200 TJ (oC) Figure 5: Break Down vs. Junction Temperature www.aosmd.com 0.2 0.4 0.6 0.8 1.0 VSD (Volts) Figure 6: Body-Diode Characteristics Page 3 of 6 AOD3N40 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 1000 15 Capacitance (pF) VGS (Volts) Ciss VDS=320V ID=2.6A 12 9 6 100 Coss 10 Crss 3 1 0 0 2 4 0.1 6 Qg (nC) Figure 7: Gate-Charge Characteristics 10 1 10 VDS (Volts) Figure 8: Capacitance Characteristics 100 800 10µs RDS(ON) limited 100µs 1ms 10ms DC 0.1 0.1s TJ(Max)=150°C TC=25°C 600 Power (W) ID (Amps) 1 400 200 TJ(Max)=150°C TC=25°C 0.01 0 1 10 100 1000 0.00001 0.0001 0.01 0.1 1 10 Pulse Width (s) Figure 10: Single Pulse Power Rating Junction-toCase (Note F) VDS (Volts) Figure 9: Maximum Forward Biased Safe Operating Area (Note F) 0.001 Zθ JC Normalized Transient Thermal Resistance 10 1 D=Ton/T TJ,PK=TC+PDM.ZθJC.RθJC RθJC=2.5°C/W In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse 0.1 PD 0.01 Single Pulse Ton T 0.001 0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 Pulse Width (s) Figure 11: Normalized Maximum Transient Thermal Impedance (Note F) Rev0: Oct 2011 www.aosmd.com Page 4 of 6 AOD3N40 60 3.0 50 2.5 Current rating ID(A) Power Dissipation (W) TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 40 30 20 10 2.0 1.5 1.0 0.5 0 0.0 0 25 50 75 100 125 TCASE (°C) Figure 12: Power De-rating (Note B) 150 0 25 50 75 100 125 TCASE (°C) Figure 13: Current De-rating (Note B) 150 400 TJ(Max)=150°C TA=25°C Power (W) 300 200 100 0 0.00001 0.0001 0.001 0.01 0.1 1 10 Pulse Width (s) Figure 14: Single Pulse Power Rating Junction-to-Ambient (Note G) 100 1000 Zθ JA Normalized Transient Thermal Resistance 10 1 D=Ton/T TJ,PK=TA+PDM.ZθJA.RθJA RθJA=55°C/W In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse 0.1 PD 0.01 Ton Single Pulse T 0.001 1E-05 0.0001 0.001 0.01 0.1 1 10 100 1000 Pulse Width (s) Figure 15: Normalized Maximum Transient Thermal Impedance (Note G) Rev0: Oct 2011 www.aosmd.com Page 5 of 6 AOD3N40 Gate Charge Test Circuit & Waveform Vgs Qg 10V + + VDC - VDC DUT Qgs Vds Qgd - Vgs Ig Charge Res istive Switching Test Circuit & Waveforms RL Vds Vds DUT Vgs + VDC 90% Vdd - Rg 10% Vgs Vgs t d(on) tr t d(off) t on tf t off Unclamped Inductive Switching (UIS) Test Circuit & Waveforms L EAR= 1/2 LI Vds 2 AR BVDSS Vds Id + Vgs Vgs VDC - Rg Vdd I AR Id DUT Vgs Vgs Diode Recovery Tes t Circuit & Waveforms Qrr = - Idt Vds + DUT Vgs Vds - Isd Vgs Ig Rev0: Oct 2011 L Isd + Vdd trr dI/dt IRM Vdd VDC - IF Vds www.aosmd.com Page 6 of 6