AOS Semiconductor Product Reliability Report AOZ8000HI, rev 1 Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com Mar 26, 2007 1 This AOS product reliability report summarizes the qualification result for AOZ8000HI. Review of the electrical test results confirm that AOZ8000HI pass AOS quality and reliability requirements for product release. The continuous qualification testing and reliability monitoring program ensure that all outgoing products will continue to meet AOS quality and reliability standards. Table of Contents: I. II. III. IV. V. Product Description Package and Die information Qualification Test Requirements Qualification Tests Result Quality Assurance Information I. Product Description: The AOZ8000HI is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. The product comes in RoHS compliant, SC70 package and is rated over a -40°C to +85°C ambient temperature range. . Absolute Maximum Ratings Parameter VP-VN 6V Peak Pulse Current (Ipp), tp=8/20uS 5A Peak Power Dissipation (8x20mS@ 25°C) SOT-23 50W Storage Temperature (TS) ESD Rating per IEC61000-4-2, contact (1) ESD Rating per IEC61000-4-2, air (2) ESD Rating per Human Body Model (2) Junction Temperature (Tj) -65°C to +150°C ±12kV ±15kV ±15kV -40°C to +125°C Notes: (1) IEC-61000-4-2 discharge with CDischarge=150pF, RDischarge=330Ω (2) Human Body Discharge per MIL-STD-883, Method 3015 CDischarge=100pF, RDischarge=1.5kΩ II. Package and Die Information: Product ID Process Package Type Die L/F material Die attach material Die bond wire Mold Material Plating Material AOZ8000HI UMC 0.5um 5/18V 2P3M process SC70 UE003A3 (size: 716 x 616 um) AgCu Ablebond 8006NS Au, 1mil CEL9220HF13 Pure Tin III. Qualification Tests Requirments 2 • • • 2 lots of AOZ8000HI up to 168 hrs of B/I for New Product release. 2 additional lots of AOZ8000HI up to 168 hrs of B/I for New UH_EPI process release. 2 lots of package qual testing (PCT, 250 cycles TC) for SC70 for package release to manufacturing. IV. Qualification Tests Result Test Item Test Condition Sample Size Result PreConditioning Per JESD 22-A113 0 85 C /85%RH, 3 cyc 0 reflow@260 C 2 lot (82 /lot) pass Lot 1 (wafer lot# F162T.51-20, marking: A02), 82 units, passed pre-conditioning. Lot 2 (wafer lot# F162T.51-20, marking: A03), 82 units, passed pre-conditioning. HTOL (pkg qual burn-in ) Per JESD 22-A108_B Vdd=6V 0 Temp = 125 C 2 lot (80 /lot) pass Lot 1 (wafer lot# F162T.51-20, marking: A02), 80 units, passed 500 hrs . Lot 2 (wafer lot# F162T.51-20, marking: A03), 80 units, passed 500 hrs . HTOL (old UE003A process) Per JESD 22-A108_B Vdd=6V Temp = 125 0C 2 lot (80 /lot) pass Lot 1 (wafer lot# F9AN1.51-8, marking: ABR11), 80 units, passed 1000 hrs . Lot 2 (wafer lot# F9AN1.51-10, marking: CBU11), 80 units, passed 500 hrs . HTOL (new UH_EPI process) Per JESD 22-A108_B Vdd=6V 0 Temp = 125 C 2 lot (80 /lot) pass Qual by extension using AOZ8000C (same die in SOT23 pkg.) HAST '130 +/- 2 0C, 85%RH, 33.3 2 lot (60 /lot) psi, at VCC min power dissapation pass Lot 1 (wafer lot# F162T.51-20, marking: A02), 60 units, passed HAST 100 hrs . Lot 2 (wafer lot# F162T.51-20, marking: A03), 60 units, passed HAST 100 hrs . Temperature Cycle '-65 0C to +150 0C, air to air (2cyc/hr) 2 lot (82 /lot) pass Lot 1 (wafer lot# F162T.51-20, marking: A02), 82 units, passed TC 500 cycles. Lot 2 (wafer lot# F162T.51-20, marking: A03), 82 units, passed TC 500 cycles. Pressure Pot 121C, 15+/-1 PSIG, RH= 100% 2 lot (82 /lot) pass Lot 1 (wafer lot# F162T.51-20, marking: A02), 82 units, passed PCT 96 hrs. Lot 2 (wafer lot# F162T.51-20, marking: A03), 82 units, passed PCT 96 hrs. ESD Rating Per IEC-61000-4-2, contact 3 units pass Lot 1 (wafer lot# FAYY3.02-3, marking: AB008), 3 units passed ±12kV ESD Rating Per IEC-61000-4-2, air 3 units pass Lot 1 (wafer lot# FAYY3.02-3, marking: AB008), 3 units passed ±15kV Latch-up Per JESD78A 3 units pass Lot 1 (wafer lot# FAYY3.02-3, marking: AB008), 3 units passed Latch-up. Comment Lot 1 (wafer lot# FNG88, marking: AC001), 80 units, passed 500 hrs . Lot 2 (wafer lot# FAYY3.02-3 marking: AB008), 80 units, passed 500 hrs . The qualification test results confirm that AOZ8000HI pass AOS quality and reliability requirements for product release. 3 V. Quality Assurance Information Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed Outgoing Defect Rate: < 50 ppm Quality Sample Plan: conform to Mil-Std -105D 4