AOS Semiconductor Product Reliability Report AOZ8001JI, rev 1 Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 495 Mercury Drive Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com Mar 27, 2007 1 This AOS product reliability report summarizes the qualification result for AOZ8001JI. Review of the electrical test results confirm that AOZ8001JI pass AOS quality and reliability requirements for product release. The continuous qualification testing and reliability monitoring program ensure that all outgoing products will continue to meet AOS quality and reliability standards. Table of Contents: I. II. III. IV. V. Product Description Package and Die information Qualification Test Requirements Qualification Tests Result Quality Assurance Information I. Product Description: The AOZ8001JI is a transient voltage suppressor array designed to protect high speed data lines from ESD and lightning. The product comes in RoHS compliant, SOT-143 package and is rated over a -40°C to +85°C ambient temperature range. . Absolute Maximum Ratings Parameter VP-VN 6V Peak Pulse Current (Ipp), tp=8/20uS 5A Peak Power Dissipation (8x20mS@ 25°C) SOT-143 50W Storage Temperature (TS) ESD Rating per IEC61000-4-2, contact (1) ESD Rating per IEC61000-4-2, air (2) ESD Rating per Human Body Model (2) Junction Temperature (Tj) -65°C to +150°C ±12kV ±15kV ±15kV -40°C to +125°C Notes: (1) IEC-61000-4-2 discharge with CDischarge=150pF, RDischarge=330Ω (2) Human Body Discharge per MIL-STD-883, Method 3015 CDischarge=100pF, RDischarge=1.5kΩ II. Package and Die Information: Product ID Process Package Type Die L/F material Die attach material Die bond wire Mold Material Plating Material AOZ8001JI UMC 0.5um 5/18V 2P3M process SOT-143 UE003A3 (size: 716 x 616 um) AgCu Ablebond 8006NS+84-3J epoxy Au, 1mil CEL9220HF13 Pure Tin 2 III. Qualification Tests Requirments • • 3 lots of AOZ8001JI up to 168 hrs of B/I for New Product release. 2 lots of package qual testing (PCT, 250 cycles TC) for SOT-143 for package release to manufacturing. IV. Qualification Tests Result Test Item Test Condition Sample Size Result PreConditioning Per JESD 22-A113 0 85 C /85%RH, 3 cyc 0 reflow@260 C 3 lots (82 /lot) pass Lot 1 (wafer lot# F162T.51-20, marking: 143A), 82 units, passed pre-conditioning. Lot 2 (wafer lot# F162T.51-20, marking: 143B), 82 units, passed pre-conditioning. Lot 3 (wafer lot# F162T.51-20, marking: 143C), 82 units, passed pre-conditioning. HTOL (pkg qual burn-in ) Per JESD 22-A108_B Vdd=6V 0 Temp = 125 C 3 lots (80 /lot) pass HTOL (new UH_EPI process) Per JESD 22-A108_B Vdd=6V 0 Temp = 125 C 2 lot (80 /lot) pass HAST '130 +/- 2 0C, 85%RH, 33.3 3 lots (60 /lot) psi, at VCC min power dissapation pass Temperature Cycle '-65 0C to +150 0C, air to air (2cyc/hr) 3 lots (82 /lot) pass Pressure Pot 121C, 15+/-1 PSIG, RH= 100% 3 lots (82 /lot) pass ESD Rating Per IEC-61000-4-2, contact 3 units pass Lot 1 (wafer lot# F162T.51-20, marking: 143A), 80 units, passed 500 hrs . Lot 2 (wafer lot# F162T.51-20, marking: 143B), 80 units, passed 500 hrs . Lot 3 (wafer lot# F162T.51-20, marking: 143C), 82 units, passed pre-conditioning. Qual by extension using AOZ8000C (same die in SOT23 pkg.) Lot 1 (wafer lot# FNG88, marking: AC001), 80 units, passed 500 hrs . Lot 2 (wafer lot# FAYY3.02-3 marking: AB008), 80 units, passed 500 hrs . Lot 1 (wafer lot# F162T.51-20, marking: 143A), 60 units, passed HAST 100 hrs . Lot 2 (wafer lot# F162T.51-20, marking: 143B), 60 units, passed HAST 100 hrs . Lot 3 (wafer lot# F162T.51-20, marking: 143C), 82 units, passed pre-conditioning. Lot 1 (wafer lot# F162T.51-20, marking: 143A), 82 units, passed TC 500 cycles. Lot 2 (wafer lot# F162T.51-20, marking: 143B), 82 units, passed TC 500 cycles. Lot 3 (wafer lot# F162T.51-20, marking: 143C), 82 units, passed pre-conditioning. Lot 1 (wafer lot# F162T.51-20, marking: 143A), 82 units, passed PCT 96 hrs. Lot 2 (wafer lot# F162T.51-20, marking: 143B), 82 units, passed PCT 96 hrs. Lot 3 (wafer lot# F162T.51-20, marking: 143C), 82 units, passed pre-conditioning. Lot 1 (wafer lot# FAYY3.03-4, marking: 143D), 3 units passed ±12kV ESD Rating Per IEC-61000-4-2, air 3 units pass Lot 1 (wafer lot# FAYY3.03-4, marking: 143D), 3 units passed ±15kV Latch-up Per JESD78A 3 units pass Lot 1 (wafer lot# FAYY3.03-4, marking: 143D), 3 units passed Latch-up. Comment The qualification test results confirm that AOZ8001JI pass AOS quality and reliability requirements for product release. 3 V. Quality Assurance Information Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed Outgoing Defect Rate: < 50 ppm Quality Sample Plan: conform to Mil-Std -105D 4