AOS Semiconductor Product Reliability Report AOZ3013PI Rev 1.0 Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc 475 Oakmead Pkwy Sunnyvale, CA 94085 U.S. Tel: (408) 830-9742 www.aosmd.com Oct 8, 2013 Page 1 of 5 This AOS product reliability report summarizes the qualification result for AOZ3013PI (epad SO8 package). Review of the electrical test results confirm that AOZ3013PI passed AOS quality and reliability requirements for product manufacturing release (RTM). The continuous qualification testing and reliability monitoring program ensure that all outgoing products will continue to meet AOS quality and reliability standards. Table of Contents: I. II. III. IV. V. VI. I. Product Description Package and Die information Qualification Test Requirements Qualification Tests Result Reliability Evaluation Revision History Product Description: AOZ3013PI is high efficiency, simple to use, 3A synchronous buck regulator. AOZ3013PI are Au&Cu mixed bonding wire version of AOZ3011PI product. Both are derivatives of AOZ105x product family and AOZ103x product family with improved manufacturability – updated LX pad location to eliminate down bonding. AOZ3013PI works from a 4.5V to 18V input voltage range, and output voltage adjustable down to 0.8V. It is offered in epad SO-8 package. Absolute Maximum Ratings Parameter Supply Voltage (VIN) LX to AGND LX to AGND EN to AGND FB to AGND COMP to AGND PGND to AGND Junction Temperature (TJ) Storage Temperature (TS) Thermal Characteristics Package Thermal Resistance (ΘJA) II. 20V -0.7V to VIN+0.3 V -5V to 22V(20ns) -0.3V to VIN+0.3 V -0.3V to 6 V -0.3V to 6 V -0.3V to 0.3 V +150°C -65°C to +150°C 50°C/W (typ.) Package and Die Information: Product ID Process Lead Frame Die Attach Bond wire Mold Material MSL AOZ3013PI (epad SO-8) UMC 5V/20V 2P3M 23BV A194FH 8006NS(WBC)/ 84-3J (controller IC) / 84-1 LMISR4 Au&Cu G630AY Level 2 Page 2 of 5 III. • • • • IV. Qualification Tests Requirement 1 lot of AOZ3013PI 168-hr Burn-in (HTOL) 1 lot of AOZ3013PI ESD test 17 lots of HTOL results (including previously released products with same processing) for final release to manufacturing. 4 lots of package qual testing for SO8_EP1 for final release to manufacturing. Qualification Tests Results Test Item Test Condition Sample Size HTOL Per JESD 22-A108_B Temp = 125 °C Result Comment 1 lot of AOZ3013PI Passed 1 AOZ3013PI lot (BA014) passed 168hrs. 3 lots of AOZ3011PI Passed 2 AOZ3011PI lots (BA001) passed 500 hrs. 1 AOZ3011PI lot (BA004) passed 500 hrs. 1 lot of AOZ3017PI Passed 1 AOZ3017PI lot (BA002) passed 500hrs. 1 lot AOZ1051PI Passed 1 AOZ1051PI lot (BA004) passed 500 hrs. 1 lot AOZ1051PI Passed 1 AOZ1051PI lot (BA007) passed 168 hrs. Passed 1 AOZ1096PI lot (BAB01) passed 168 hrs. Passed 1 AOZ1033AI lot (BA001) passed 168 hrs. Passed Passed 1 AOZ1034PI lot (BA011) passed 168 hrs. 1 AOZ1034PI lot (BA013) passed 1000 hrs. Passed 1 AOZ1036PI lot (BA020) passed 168 hrs. Passed 1 AOZ1038PI lot (BA006) passed 168 hrs. Passed 3 AOZ1037PI lots (BA003/BA006/BA011) passed 500 hrs. Passed 1 AOZ1037PI lot (BA013) passed 168 hrs. Passed 1 AOZ1031AI lots (BA030) passed 168 hrs. 1 lot AOZ1096PI 1 lot AOZ1033AI 1 lot AOZ1034PI 1 lot AOZ1034PI 1 lot AOZ1036PI 1 lot AOZ1038PI 3 lots AOZ1037PI 1 lot AOZ1037PI 1 lot AOZ1031AI ESD (HBM, MM, CDM) Per JESD 22-A114, JESD 22-A115-A, 1 AOZ3013PI lot 1 AOZ3013PI lot 1 AOZ3013PI lot Passed Passed Passed 1 AOZ3013PI lot (BA014) passed 2KV HBM 1 AOZ3013PI lot (BA014) passed 200V MM 1 AOZ3013PI lot (BA014) passed 1000V CDM Latch-up Per JESD 78 1 AOZ3013PI lot Passed 1 AOZ3013PI lot (BA014) passed Latch-up Page 3 of 5 SO8_EP1 Package Qual Data HTOL Per JESD 22-A108_B Temp = 125 °C 4 lots Passed 4 AOZ3013PI lots (BA003/BA004/BA005/BA007) passed 500hr. BI. PreConditioning Per JESD 22-A113 0 85 C /85%RH, 3 cyc 0 reflow@260 C 4 lots Passed 4 AOZ3013PI lots (BA003/BA004/BA005/BA007) passed preconditioning. HAST 130±2°C, 85%RH, 33.3PSI, at Vcc min power dissipation 4 lots Passed 4 AOZ3013PI lots (BA003/BA004/BA005/BA007) passed HAST 100 hrs. Temperature Cycle -65°C to +150°C air to air (2cyc/hr) 4 lots Passed 4 AOZ3013PI lots (BA003/BA004/BA005/BA007) passed TC 500. Pressure Pot 121°C, 15±1 PSIG, RH= 100% 4 lots Passed 4 AOZ3013PI lots (BA003/BA004/BA005/BA007) passed PCT 96hr. V. Reliability Evaluation The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the product. Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours. FIT rate (per billion): 10.8 MTTF = 92.59 million hrs. The failure rate (λ) is calculated as follows: λ= χ 2 [CL, (2 f + 2)] 2 × 1 SS × t × AF …….. [Equation 1] Where CL = % of confidence level f = number of failure SS = sample size t = stress time Looking up the χ2 2 table for zero failure (in HTOL) with 60% confidence, the value of Page 4 of 5 χ 2 [CL, (2 f + 2)] 2 is 0.92. The Acceleration Factor (AF) is calculated from the following formula: E 1 1 − AF = exp A • k TO TS …….. [Equation 2] Where EA = activation energy k = Boltzmann constant TO = operating TJ TS = stress TJ Applying typical operating environment, TO = 55°C; EA = 0.7eV and TS = 140°C 1 1 0.7 − AF = exp = 164 • 8.617 E − 5 273 + 55 273 + 140 Taking the result of HTOL (AOZ3013 Lot and previous similar products - see HTOL results in section IV), the total device stress time Substituting the values in equation 1, we have λ = 0.92 × 1 -1 = 1.08E-8 hr or 10.8 FIT (1 × 80 × 168 + 8 × 80 × 168 + 8 × 80 × 500 + 1 × 80 × 1000) × 164 MTTF = (1/ λ) = 92.59 million hours or 10570 years The calculation shows that under typical operating environment, the device failure rate is less than 10.8 FIT or an MTTF of over 92.59 million hour. The qualification test results confirm that AOZ3013PI passed AOS quality and reliability requirements for product manufacturing release (RTM). VI. Revision 1.0 Revision History Release Date Oct 8, 2013 Comments Initial Release Page 5 of 5