ETC 5962

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Drawing updated to reflect current requirements. - lgt
01-06-13
Raymond Monnin
B
Corrections to table I test conditions and footnote. Editorial changes throughout. drw
04-06-14
Raymond Monnin
THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED.
REV
SHEET
REV
SHEET
REV STATUS
REV
B
B
B
B
B
B
B
B
B
OF SHEETS
SHEET
1
2
3
4
5
6
7
8
9
PMIC N/A
PREPARED BY
Rick C. Officer
STANDARD
MICROCIRCUIT
DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218
http://www.dscc.dla.mil
CHECKED BY
Charles E. Besore
APPROVED BY
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
Michael Frye
MICROCIRCUIT, LINEAR, WIDEBAND RMS-TO-DC
CONVERTER, MONOLITHIC SILICON
DRAWING APPROVAL DATE
90-01-02
AMSC N/A
REVISION LEVEL
B
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1 OF
5962-89637
9
5962-E311-04
1. SCOPE
1.1 Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in
accordance with MIL-PRF-38535, appendix A.
1.2 Part or Identifying Number (PIN). The complete PIN is as shown in the following example:
5962-89637
01
C
A
Drawing number
Device type
(see 1.2.1)
Case outline
(see 1.2.2)
Lead finish
(see 1.2.3)
1.2.1 Device type. The device type identify the circuit function as follows:
Device type
Generic number
Circuit function
AD637
Wideband RMS-to-DC converter
01
1.2.2 Case outline. The case outline is as designated in MIL-STD-1835 and as follows:
Outline letter
C
Descriptive designator
GDIP1-T14 or CDIP2-T14
Terminals
Package style
14
Dual-in-line
1.2.3 Lead finish. The lead finish is as specified in MIL-PRF-38535, appendix A.
1.3 Absolute maximum ratings.
Positive supply voltage (+VS) ....................................................................
Negative supply voltage (-VS)....................................................................
Output short circuit duration......................................................................
Storage temperature range.......................................................................
Lead temperature (soldering, 10 seconds)...............................................
Internal quiescent power dissipation .........................................................
Thermal resistance, junction to case (θJC)................................................
Thermal resistance, junction to ambient (θJA)...........................................
Junction temperature (TJ) .........................................................................
+18 V dc
-18 V dc
Indefinite
-65°C to +150°C
+300°C
108 mW
See MIL-STD-1835
95°C/W
+175°C
1.4 Recommended operating conditions.
Positive supply voltage (+VS) .................................................................... +15 V dc
Negative supply voltage (-VS).................................................................... -15 V dc
Ambient operating temperature range (TA)............................................... -55°C to +125°C
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
2
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of
this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or www.dodssp.daps.mil or from the
Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific
exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535, appendix A for non-JAN
class level B devices and as specified herein. Product built to this drawing that is produced by a Qualified Manufacturer Listing
(QML) certified and qualified manufacturer or a manufacturer who has been granted transitional certification to MIL-PRF-38535
may be processed as QML product in accordance with the manufacturers approved program plan and qualifying activity approval
in accordance with MIL-PRF-38535. This QML flow as documented in the Quality Management (QM) plan may make
modifications to the requirements herein. These modifications shall not affect form, fit, or function of the device. These
modifications shall not affect the PIN as described herein. A "Q" or "QML" certification mark in accordance with MIL-PRF-38535 is
required to identify when the QML flow option is used.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38535, appendix A and herein.
3.2.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.2 Functional block diagram. The functional block diagram shall be as specified on figure 2.
3.2.3 Case outline. The case outline shall be in accordance with 1.2.2 herein.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as
specified in table I and shall apply over the full ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests
for each subgroup are described in table I.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
3
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed in
1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103 (see 6.6 herein). For packages
where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not
marking the "5962-" on the device.
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to
MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in accordance
with MIL-PRF-38535 to identify when the QML flow option is used.
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to listing
as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535, appendix
A and the requirements herein.
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with
each lot of microcircuits delivered to this drawing.
3.8 Notification of change. Notification of change to DSCC-VA shall be required in accordance with MIL-PRF-38535, appendix
A.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
appendix A.
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
prior to quality conformance inspection. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1015 of MIL-STD-883.
(2) TA = +125°C, minimum.
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests
prior to burn-in are optional at the discretion of the manufacturer.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions
+VS = +15 V, -VS = -15 V
-55°C ≤ TA ≤+125°C
unless otherwise specified
Group A
subgroups
Device
type
1
01
Limits
Min
Total error
ET
VIN = 0 V to ±10 V
2, 3
Total error versus
positive supply
∆ ET
∆ + VS
+5.0 V ≤ +VS ≤ +15 V
Total error versus
negative supply
∆ ET
∆ - VS
-5.0 V ≤ -VS ≤ -15 V
Unit
Max
1/
1/
1/
1, 2, 3
01
±150
µV/V
1
01
±300
µV/V
±500
2
DC reversal error
ETR
VIN = ±2.0 V, TA = +25°C
1
01
±.25
% of
reading
2.0 V fullscale
nonlinearity
NL1
10 mV ≤ |VIN| ≤ 2.0 V
1
01
±.04
% of FS
±.06
2, 3
7.0 V fullscale
nonlinearity
NL2
10 mV ≤ |VIN| ≤ 7.0 V
1
±.05
01
±.14
2, 3
Output offset voltage
VOSO
VIN = GND
1
% of FS
±1.0
01
mV
±6.0
2, 3
±.07
∆VOSO
∆T
VIN = GND
2, 3
01
VOP
RL = 2.0 kΩ
1, 2, 3
01
12
IREF1
TA = 25°C
1
01
5.0
80
µA
IREF2
TA = 25°C
1
01
1.0
100
µA
Buffer input offset
voltage
Buffer input current
VOS2
TA = 25°C
1
01
±2.0
mV
IIN
TA = 25°C
1
01
±10
nA
Denominator input
resistance
2/
Denominator input
offset voltage
2/
Power supply range
RDEN
TA = 25°C
4
01
30
kΩ
VOS3
TA = 25°C
1
01
±0.5
mV
VS
TA = 25°C
1
01
±18
V
Quiescent current
IQ
VS = ±18 V
1, 2, 3
01
3.0
mA
Standby current
ISB
VCS ≤ 0.2 V, TA = +25°C
1
01
450
µA
Output offset voltage
temperature coefficient
Output voltage swing
at RMS OUT
IREF0
2/
for 0 dB = 1.0 V rms
IREF range
2/
20
±3.0
mV/°C
V
1/
For subgroup 1, the maximum total error is ±1.0 mV ±0.5% of reading. For subgroup 2 and 3, the maximum total error is ±6.0
mV ±0.7% of reading. Total error represents the maximum deviation of the dc component of the output voltage from the
theoretical output value over a specified range of signal amplitude and frequency. It is shown as the sum of a fixed error and a
component proportional to the theoretical output (percentage of reading). The fixed error component includes all offset errors
and irreducible nonlinearities; the percentage of reading component includes the linear scale-factor error.
2/
If not tested, shall be guaranteed to the limits specified in table I.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
5
Device type
01
Case outline
C
Terminal number
Terminal symbol
1
BUF IN
2
NC
3
COMMON
4
OFFSET NULL
5
CS
VREF
6
7
dB
8
CAVG
9
RMS OUT
10
-VS
11
+VS
12
NC
13
VIN
14
BUF OUT
NC = No connection
FIGURE 1. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
6
FIGURE 2. Functional block diagram.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
7
TABLE II. Electrical test requirements.
MIL-STD-883 test requirements
Subgroups
(in accordance with
MIL-STD-883, method 5005,
table I)
Interim electrical parameters
(method 5004)
Final electrical test parameters
(method 5004)
Group A test requirements
(method 5005)
Groups C and D end-point
electrical parameters
(method 5005)
1
1*, 2, 3
1, 2, 3, 4**
1
* PDA applies to subgroup 1.
** Subgroups 4, if not tested shall be guaranteed to the limits specified in table I herein.
4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 5, 6, 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
4.3.2 Groups C and D inspections.
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test conditions, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1005 of MIL-STD-883.
(2)
TA = +125°C, minimum.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
8
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared
specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the
individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962) should
contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614)
692-0547.
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCCVA.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-89637
A
REVISION LEVEL
B
SHEET
9
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 04-06-14
Approved sources of supply for SMD 5962-89637 are listed below for immediate acquisition information only and shall
be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised
to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of
compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next dated revision of
MIL-HDBK-103 and QML-38535.
Standard
microcircuit drawing
PIN 1/
5962-8963701CA
Vendor
CAGE
number
24355
Vendor
similar
PIN 2/
AD637SQ/883B
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
24355
Vendor name
and address
Analog Devices, Inc.
Rt. 1 Industrial Park
P.O. Box 9106
Norwood, Ma. 02062
Point of Contact:
804 Woburn Street
Wilmington, MA 01887-3462
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.