REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED REV SHEET REV SHEET REV STATUS OF SHEETS PMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REV SHEET 1 2 3 4 5 PREPARED BY Gary Zahn 6 7 8 9 10 11 12 DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 CHECKED BY Michael C. Jones APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, OPERATIONAL AMPLIFIER DRAWING APPROVAL DATE 96-10-28 SIZE REVISION LEVEL A SHEET DESC FORM 193 JUL 94 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. CAGE CODE 5962-94520 67268 1 OF 12 5962-E023-97 1. SCOPE 1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class G (lowest high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - 94520 01 H X A Federal stock class designator RHA designator (see 1.2.1) Device type (see 1.2.2) \ / Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) \/ Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: Device type 01 Generic number Circuit function OM3984 Operational amplifier, medium power 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as follows: Device class H or K Device performance documentation Certification and qualification to MIL-PRF-38534 1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter X Y Descriptive designator Terminals See figure 1 See figure 1 14 14 Package style Flat pack, surface mount Flat pack 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 2 1.3 Absolute maximum ratings. 1/ Supply voltage (±VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Differential input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Common mode input voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . Maximum power dissipation (PD) 2/ 3/ . . . . . . . . . . . . . . . . . . . . Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . . Thermal resistance, junction-to-case (JC) . . . . . . . . . . . . . . . . Junction temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±40 V dc ±VCC ±VCC 125 W -65(C to +150(C +300(C 2.2(C/W +200(C 1.4 Recommended operating conditions. Supply voltage (±VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Ambient operating temperature range (TA) . . . . . . . . . . . . . . . . ±34 V dc -55(C to +125(C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbook. The following specification, standards, and handbook form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. STANDARDS DEPARTMENT OF DEFENSE MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Microcircuit Case Outlines. HANDBOOK DEPARTMENT OF DEFENSE MIL-HDBK-780 - Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 1/ 2/ 3/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. Derate 2.2(C/W above +25(C. TA +25(C. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 3 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534). Futhermore, the manufacturers may take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the appilcable device class. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are defined in table I. 3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked as listed in QML-38534. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DSCC-VA) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. . SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 4 TABLE I. Electrical performance characteristics. Test Input offset voltage Input offset voltage drift Input bias currents Input offset current Power supply rejection ratio Common mode rejection ratio Supply currents Output voltage peak Symbol VIO VIO T ±IIB IOS +PSRR -PSRR CMRR ±ICC VOP Conditions -55(C TA +125(C ±VCC = ±34 V dc unless otherwise specified TA = +25(C TA = -55(C and +125(C -VCC = -34 V dc, +VCC = +10 to +40 V dc +VCC = +34 V dc, -VCC = -10 to -40 V dc VCM = ±22 V dc, f = dc VCM = 0 V, No load condition IO = .94 A peak, RL = 30 , 10 kHz sine wave, TA = +25(C RL = 10 k , 10 kHz sine wave, TA = -55(C and +125(C 6 6 Group A subgroups 1 2,3 1,2,3 1 2,3 1 2,3 1 2,3 1 2,3 1,2,3 4 5,6 Device type 01 01 01 01 01 01 01 01 01 Limits Min -1 -30 -50 -30 -20 -10 -20 -10 -20 95 90 -30 ±28.0 ±30 Max +1 +30 +50 +30 +20 +10 +20 +10 +20 +30 Unit mV µV/(C pA pA nA µV/V dB mA V See footnote at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Output current peak Voltage gain Slew rate 1/ Symbol Conditions -55(C TA +125(C ±VCC = ±34 V dc unless otherwise specified IOP AVS ±SR R L T A R L R L = 306, VOUT = ±28 V, = +25(C 1/ = 10 k6 = 10.06, TA = +25(C Group A subgroups 4 4 5 6 7 Device type 01 01 01 Limits Min ±0.75 95 90 85 ±6 Max Unit A dB V/µs Internal current limit circuitry is controlled by a single external resistor, RCL. To calculate the value of the current limit resistor, use RCL = (0.809/ILIM) - 0.057, where ILIM is equal to the desired output current (IOP). SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 6 Case outline X. DETAIL A mm 0.08 0.13 0.15 0.51 0.76 1.02 1.09 1.27 2.54 Inches .003 .005 .006 .020 .030 .040 .043 .050 .100 FIGURE 1. Case outline(s). SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 7 Case outline Y. Symbol A b C D E E1 e L Q S Millimeters Max Min 3.55 2.90 0.46 0.30 0.33 0.18 9.75 9.55 9.75 9.55 15.00 14.45 1.27 BSC 12.70 8.90 1.65 1.40 1.02 BSC Inches Max Min 0.140 0.115 0.018 0.012 0.013 0.007 0.385 0.375 0.385 0.375 0.590 0.570 0.050 BSC 0.500 0.350 0.065 0.055 0.040 BSC NOTES: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. FIGURE 1. Case outline(s) - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 8 Device type Case outlines Terminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 01 X and Y Terminal symbol +VCC +VCC VOUT VOUT -IN +IN -VCC -VCC -VCC VOUT VOUT +VCC +VCC VSC FIGURE 2. Terminal connections. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 9 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group C end-point electrical parameters MIL-STD-883, group E end-point electrical parameters for RHA devices Subgroups (in accordance with MIL-PRF-38534,group A test table) 1 1*, 2, 3 1, 2, 3 1, 2, 3 Subgroups ** (in accordance with method 5005, group A test table) * PDA applies to subgroup 1. ** When applicable to this standard microcircuit drawing, the subgroups shall be defined. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply: a. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 10 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, 6, 7, 8, 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. 4.3.5 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). RHA levels shall be M, D, R, and H. RHA quality conformance inspection sample tests shall be performed at the RHA level specified in the acquisition document. a. RHA tests for levels M, D, R, and H shall be performed through each level to determine at what levels the devices meet the RHA requirements. These RHA tests shall be performed for initial qualification and after design or process changes which may affect the RHA performance of the device. b. End-point electrical parameters shall be as specified in table II herein. c. Prior to total dose irradiation, each selected sample shall be assembled in its qualified package. It shall pass the specified group A electrical parameters in table I for subgroups specified in table II herein. d. The devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38534 for RHA level being tested, and meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25(C ±5 percent, after exposure. e. Prior to and during total dose irradiation testing, the devices shall be biased to establish a worst case condition as specified in the radiation exposure circuit. f. For device classes H and K, subgroups 1 and 2 in table V, method 5005 of MIL-STD-883 shall be tested as appropriate for device construction. g. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 11 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-7603. 6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43216-5000, or telephone (614) 692-0512. 6.6 Sources of supply. Sources of supply are listed in QML-38534. The vendors listed in QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94520 A REVISION LEVEL SHEET 12 STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN DATE: 96-10-28 Approved sources of supply for SMD 5962-94520 are listed below for immediate acquisition only and shall be added to QML-38534 during the next revision. QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next dated revision of QML-38534. Standard microcircuit drawing PIN 1/ 5962-9452001HXA 5962-9452001HXC 5962-9452001HYA 5962-9452001HYC Vendor CAGE number 69210 69210 69210 69210 Vendor similar PIN 2/ OM3894SFB OM3894SFC OM3894SXB OM3894SXC 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. The device manufacturers listed herein are authorized to supply alternate lead finishes "A", "B", or "C" at their discretion. Contact the listed approved source of supply for further information. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 69210 Vendor name and address Omnirel Corporation 205 Crawford Street Leominster, MA 01453-2353 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in this information bulletin.