NSC DS26F31MQML

DS26F31MQML
Quad High Speed Differential Line Drivers
General Description
The DS26F31M is a quad differential line driver designed for
digital data transmission over balanced lines. The
DS26F31M meets all the requirements of EIA Standard RS422 and Federal Standard 1020. It is designed to provide
unipolar differential drive to twisted-pair or parallel-wire
transmission lines.
The DS26F31M offers improved performance due to the use
of state-of-the-art L-FAST bipolar technology. The L-FAST
technology allows for higher speeds and lower currents by
utilizing extremely short gate delay times. Thus, the
DS26F31M features lower power, extended temperature
range, and improved specifications.
The circuit provides an enable and disable function common
to all four drivers. The DS26F31M features TRI-STATE ®
outputs and logical OR-ed complementary enable inputs.
The inputs are all LS compatible and are all one unit load.
The DS26F31M offers optimum performance when used
with the DS26F32 Quad Differential Line Receiver.
Features
n
n
n
n
n
Operation from single +5.0V supply
Outputs won’t load line when VCC = 0V
Output short circuit protection
Meets the requirements of EIA standard RS-422
High output drive capability for 100Ω terminated
transmission lines
Ordering Information
NS Part Number
SMD Part Number
NS Package Number
DS26F31ME/883
5962–7802302M2A
E20A
Package Description
20LD Leadless Chip Carrier
DS26F31MJ/883
5962–7802302MEA
J16A
16LD Ceramic DIP
DS26F31MW/883
5962–7802302MFA
W16A
DS26F31MWG/883
5962–7802302MZA
WG16A
16LD Ceramic FlatPack
DS26F31MJ-QMLV
5962–7802302VEA
J16A
16LD Ceramic DIP
DS26F31MJFQMLV
5962F7802302VEA
300k rd(Si)
J16A
16LD Ceramic DIP
DS26F31MW-QMLV
5962–7802302VFA
W16A
16LD Ceramic FlatPack
DS26F31MWFQMLV
5962F7802302VFA
300k rd(Si)
W16A
16LD Ceramic FlatPack
DS26F31MWGFQMLV
5962F7802302VZA
300k rd(Si)
WG16A
16LD Ceramic SOIC
16LD Ceramic SOIC
TRI-STATE ® is a registered trademark of National Semiconductor Corporation.
© 2006 National Semiconductor Corporation
DS201632
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DS26F31MQML Quad High Speed Differential Line Drivers
March 2006
DS26F31MQML
Connection and Logic Diagrams
20-Lead Ceramic Leadless Chip Carrier (E)
16-Lead Ceramic DIP Pictured
20163207
See NS Package Number E20A
20163201
Top View
See NS Package Numbers J16A, W16A, or WG16A
20163202
FIGURE 1. Logic Symbol
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2
DS26F31MQML
Absolute Maximum Ratings (Note 1)
−65˚C ≤ TA ≤ +175˚C
Storage Temperature Range
Lead Temperature
(Soldering, 60 sec.)
300˚C
Supply Voltage
7.0V
Input Voltage
7.0V
Output Voltage
5.5V
Maximum Power Dissipation at 25˚C (Note 3)
450mW
Thermal Resistance
θJA
Ceramic DIP, derate above +25˚C @ 11.4mW/˚C
88˚C/mW
Ceramic Flatpack, derate above +25˚C @ 6.6 mW/˚C
151˚C/mW
Leadless Chip Carrier, derate above +25˚C @ 12.3 mW/˚C
81˚C/mW
θJC
Ceramic DIP
14˚C/mW
Ceramic Flatpack
13˚C/mW
Leadless Chip Carrier
15˚C/mW
Recommended Operating Range
−55˚C ≤ TA ≤ +125˚C
Temperature
Supply Voltage
4.5V to 5.5V
Radiation Features
DS26F31MJFQMLV
300 krads (Si)
DS26F31MWFQMLV
300 krads (Si)
DS26F31MWGFQMLV
300 krads (Si)
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Temp ˚C
1
Static tests at
25
2
Static tests at
125
3
Static tests at
-55
4
Dynamic tests at
25
5
Dynamic tests at
125
6
Dynamic tests at
-55
7
Functional tests at
25
8A
Functional tests at
125
8B
Functional tests at
-55
9
Switching tests at
25
10
Switching tests at
125
11
Switching tests at
-55
12
Settling time at
25
13
Settling time at
125
14
Settling time at
-55
3
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DS26F31MQML
DS26F31M Electrical Characteristics
DC Parameters (Note 8)
Symbol
Parameter
Conditions
Notes
Min
2.0
VIH
Logical "1" Input Voltage
VCC = 4.5V
(Note 4)
VIL
Logical "0" Input Voltage
VCC = 5.5V
(Note 4)
VOH
Logical "1" Output Voltage
VCC = 4.5V, IOH = -20mA,
VIL = 0.8V, VIH = 2V
VOL
Logical "0" Output Voltage
VCC = 4.5V, IOL = 20mA,
VIL = 0.8V, VIH = 2V
Max
Units
Subgroups
V
1, 2, 3
0.8
V
1, 2, 3
V
1, 2, 3
0.5
V
1, 2, 3
1, 2, 3
2.5
IIH
Logical "1" Input Current
VCC = 5.5V, VI = 2.7V
(Note 7)
-2.0
20
µA
IIL
Logical "0" Input Current
VCC = 5.5V, VI = 0.4V
(Note 7)
100
-200
µA
1, 2, 3
II
Input Reverse Current
VCC = 5.5V, VI = 7V
(Note 7)
-0.01
0.1
mA
1, 2, 3
IOZ
TRI-STATE Output Current
VCC = 5.5V, VO = 0.5V
-20
µA
1, 2, 3
VCC = 5.5V, VO = 2.5V
20
µA
1, 2, 3
-1.5
V
1, 2, 3
mA
1, 2, 3
VI
Input Clamp Voltage
VCC = 4.5V, II = -18mA
ISC Min
Output Short Circuit Current
VCC = 5.5V, VO = 0V
ISC Max
Output Short Circuit Current
VCC = 5.5V, VO = 0V
-150
mA
1, 2, 3
ICC Dis
Power Supply Current
VCC = 5.5V, VI = 0.8V or 2V,
VEn = 0.8V, VEn = 2V
50
mA
1, 2, 3
ICC En
Power Supply Current
VCC = 5.5V, VEn = 2V,
VEn = 0.8V
40
mA
1, 2, 3
Max
Units
Subgroups
(Note 5)
16
nS
9
(Note 5)
24
nS
10, 11
-30
AC Parameters - Propagation Delay Time
The following conditions apply, unless otherwise specified.
AC:
VCC = 5V, CL = 50pF or equivalent impedance provided by diode load
Symbol
tPLH
Parameter
Conditions
Input to Output
CL = 30pF
tPHL
Input to Output
CL = 30pF
tLZ
Disable Time
CL = 10 pF
tHZ
Disable Time
CL = 10 pF
tZL
Enable Time
CL = 30pF
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4
Notes
Min
(Note 6)
15
nS
9
(Note 6)
23
nS
10, 11
(Note 5)
17
nS
9
10, 11
(Note 5)
25
nS
(Note 6)
15
nS
9
(Note 6)
23
nS
10, 11
(Note 5)
38
nS
9
(Note 5)
56
nS
10, 11
(Note 6)
35
nS
9
(Note 6)
53
nS
10, 11
(Note 5)
23
nS
9
(Note 5)
30
nS
10, 11
(Note 6)
20
nS
9
10, 11
(Note 6)
27
nS
(Note 5)
28
nS
9
(Note 5)
40
nS
10, 11
(Note 6)
25
nS
9
(Note 6)
37
nS
10, 11
(Continued)
AC Parameters - Propagation Delay Time
(Continued)
The following conditions apply, unless otherwise specified.
AC:
Symbol
tZH
VCC = 5V, CL = 50pF or equivalent impedance provided by diode load
Parameter
Conditions
Enable Time
Min
(Note 5)
CL = 30 pF
Skew
Notes
Output to Output
CL = 30pF
Max
Units
Subgroups
32
nS
9
10, 11
(Note 5)
52
nS
(Note 6)
30
nS
9
(Note 6)
50
nS
10, 11
(Note 5)
6.0
nS
9
(Note 5)
9.0
nS
10, 11
(Note 6)
4.5
nS
9
(Note 6)
7.0
nS
10, 11
DC Drift Parameters
This section applies to -QMLV devices only and shall be read & recorded at TA = +25˚C before and after each burn-in & Subgroup B5, and shall not change by more than the limits indicated. The delta rejects shall be included in the PDA calculations.
Symbol
Parameter
Conditions
Notes
Min
Max
Units
Subgroups
VOH
Logical "1" Output Voltage
VCC = 4.5V, IOH = -20mA,
VIL = 0.8V, VIH = 2V.
-250
250
mV
1
VOL
Logical "0" Output Voltage
VCC = 4.5V, IOL = 20mA,
VIL = 0.8V, VIH = 2V.
-50
50
mV
1
ICC En
Power Supply Current
VCC = 5.5V, VI = 0.8V or 2V,
VEn = 2V, VEn = 0.8V.
-8.0
8.0
mA
1
ICC Dis
Power Supply Current
VCC = 5.5V, VI = 0.8V or 2V,
VEn = 0.8V, VEn = 2V.
-8.0
8.0
mA
1
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: All currents into the device pins are positive; all currents out of the device pins are negative. All voltages are referenced to ground unless otherwise
specified.
Note 3: Power dissipation must be externally controlled at elevated temperatures.
Note 4: Parameter tested go-no-go only.
Note 5: Tested at 50pF, system capacitance exceed 10 and 30pF.
Note 6: Testing at 50pF guarantees limits at 10 and 30pF.
Note 7: The minimum limits apply to device Class Q & V. The limits specified for the INPUT LOW CURRENT represents the numerical range in which this parameter
will pass.
Note 8: Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics, except as listed in the Post Radiation Limits Table —
if applicable. Radiation end point limits for the noted parameters are guaranteed only for the conditions, as specified.
5
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DS26F31MQML
DS26F31M Electrical Characteristics
DS26F31MQML
Test Circuit and Timing Waveforms
20163203
FIGURE 2. AC Load Test Circuit for TRI-STATE Outputs
20163204
FIGURE 3. Propagation Delay (Notes 1, 2)
20163205
FIGURE 4. Enable and Disable Times (Note 2)
Note 9: Diagram shown for Enable Low. Switches S1 and S2 open.
Note 10: S1 and S2 of Load Circuit are closed except where shown.
Note 11: Pulse Generator for all Pulses: Rate ≤ 1.0 MHz, ZO = 50Ω, tr ≤ 6.0 ns, tf ≤ 6.0 ns.
Note 12: CL includes probe and jig capacitance.
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6
DS26F31MQML
Typical Application
20163206
FIGURE 5. Typical Application
7
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DS26F31MQML
Revision History
Released
03/01/06
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Revision
A
Section
Originator
New Release, Corporate format
L. Lytle
8
Changes
1 MDS data sheet converted into one Corp.
data sheet format. MNDS26F31M-X-RH Rev
0B0 will be archived.
DS26F31MQML
Physical Dimensions
inches (millimeters) unless otherwise noted
20-Lead Ceramic Leadless Chip Carrier (E)
NS Package Number E20A
16-Lead Ceramic Dual-In-Line Package (J)
NS Package Number J16A
9
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DS26F31MQML
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
16-Lead Ceramic Flatpak (W)
NS Package Number W16A
16-Lead Ceramic SOIC (WG)
NS Package Number WG16A
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10
DS26F31MQML Quad High Speed Differential Line Drivers
Notes
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves
the right at any time without notice to change said circuitry and specifications.
For the most current product information visit us at www.national.com.
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