ETC 54F676DMQB

MILITARY DATA SHEET
Original Creation Date: 05/10/96
Last Update Date: 07/30/96
Last Major Revision Date: 05/10/96
MN54F676-X REV 1A0
16-BIT SERIAL/PARALLEL-IN, SERIAL-OUT SHIFT REGISTER
General Description
The F676 contains 16 flip-flops with provision for synchronous parallel or serial entry
and serial output. When the Mode (M) input is HIGH, information present on the parallel
data (P0-P15) inputs is entered on the falling edge of the Clock Pulse (CP) input signal.
When M is LOW, data is shifted out of the most significant bit position while information
present on the Serial (SI) input shifts into the least significant bit position. A HIGH
signal on the Chip Select (CS) input prevents both parallel and serial operations.
Industry Part Number
NS Part Numbers
54F676
54F676DMQB
54F676FMQB
54F676LMQB
Prime Die
M676
Processing
Subgrp Description
MIL-STD-883, Method 5004
1
2
3
4
5
6
7
8A
8B
9
10
11
Quality Conformance Inspection
MIL-STD-883, Method 5005
1
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp ( oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
MILITARY DATA SHEET
MN54F676-X REV 1A0
Features
-
16-bit parallel-to-serial conversion
16-bit serial-in, serial-out
Chip select control
Slim 24 lead 300 mil package
2
MILITARY DATA SHEET
MN54F676-X REV 1A0
(Absolute Maximum Ratings)
(Note 1)
Storage Temperature
-65 C to +150 C
Ambient Temperature under Bias
-55 C to +125 C
Junction Temperature under Bias
-55 C to +175 C
Vcc Pin Potential to Ground Pin
-0.5V to +7.0V
Input Voltage
(Note 2)
-0.5V to +7.0V
Input Current
(Note 2)
-30mA to +5.0mA
Voltage Applied to Output in HIGH State (with Vcc=0V)
Standard Output
TRI-STATE Output
Current Applied to Output in LOW State (Max)
-0.5V to Vcc
-0.5V to +5.5V
twice the rated Iol(mA)
Note 1:
Note 2:
Absolute maximum ratings are values beyond which the device may be damaged or have
its useful life impaired. Functional operation under these conditions is not
implied.
Either voltage limit or current limit is sufficient to protect inputs.
Recommended Operating Conditions
Free Air Ambient Temperature
Commercial
Military
Supply Voltage
Military
Commercial
0 C to +70 C
-55 C to +125 C
+4.5V to +5.5V
+4.5V to +5.5V
3
MILITARY DATA SHEET
MN54F676-X REV 1A0
Electrical Characteristics
DC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC: VCC 4.5V to 5.5V, TEMP RANGE: -55C to 125C
SYMBOL
PARAMETER
CONDITIONS
NOTES
PINNAME
MIN
MAX
UNIT
SUBGROUPS
IIH
Input High
Current
VCC=5.5V, VM=2.7V, VINH=5.5V
1, 3 INPUTS
20
uA
1, 2,
3
IBVI
Input HIGH
Current
VCC=5.5V, VM=7.0V, VINH=5.5V
1, 3 INPUTS
100
uA
1, 2,
3
IIL
Input LOW Current
VCC=5.5V, VM=0.5V, VINL=0.0V,
VINH=5.5V
1, 3 INPUTS
-0.6
mA
1, 2,
3
VOL
Output LOW
Voltage
VCC=4.5V, VIH=0.8V, IOL=20mA,
VIH=2.0V, VINH=5.5V, VINL=0.0V
1, 3 OUTPUTS
0.5
V
1, 2,
3
VOH
Output HIGH
Voltage
VCC=4.5V, VIL=0.8V, IOH=-1.0mA,
VINH=5.5V, VIH=2.0V, VINL=0.0V
1, 3 OUTPUTS 2.5
V
1, 2,
3
IOS
Short-Circuit
Current
VCC=5.5V, VM=0.0V, VINH=5.5V,
VINL=0.0V
1, 3 OUTPUTS -60
-150
mA
1, 2,
3
VCD
Input Clamp Diode
Voltage
VCC=4.5V, Im=-18mA, VINH=5.5V
1, 3 INPUTS
-1.2
V
1, 2,
3
ICC
Supply Current
VCC=5.5V, VINH=5.5V, VINL=0.0V
1, 3 VCC
72
mA
1, 2,
3
ICEX
Output HIGH
Leakage Current
VCC=5.5V, VINH=5.5V, VINL=0.0V,
VM=5.5V
1, 3 OUTPUTS
250
uA
1, 2,
3
4
MILITARY DATA SHEET
MN54F676-X REV 1A0
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns
See AC FIGS
SYMBOL
PARAMETER
tpLH
Propagation Delay
tpHL
Propagation Delay
CONDITIONS
NOTES
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
PINNAME
MIN
MAX
UNIT
SUBGROUPS
2, 4 CP to
SO
4.5
11.0
ns
9
2, 4 CP to
SO
4.5
17.0
ns
10, 11
2, 4 CP to
SO
5.0
12.5
ns
9
2, 4 CP to
SO
5.0
14.5
ns
10, 11
ts(H/L)(1)
Setup Time HIGH
or LOW
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
SI to
CP
4.0
ns
9, 10,
11
th(H/L)(1)
Hold Time
or LOW
HIGH
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
SI to
CP
4.0
ns
9, 10,
11
ts(H/L)(2)
Setup Time HIGH
or LOW
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
M to CP 8.0
ns
9, 10,
11
th(H/L)(2)
Hold Time
or LOW
HIGH
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
M to CP 2.0
ns
9, 10,
11
ts(H/L)(3)
Setup Time HIGH
or LOW
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
Pn to
CP
3.0
ns
9, 10,
11
th(H/L)(3)
Hold Time
or LOW
HIGH
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
Pn to
CP
4.0
ns
9, 10,
11
ts(L)
Setup Time HIGH
or LOW
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
CS to
CP
10.0
ns
9
5
CS to
CP
12.0
ns
10, 11
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
5
CS to
CP
10.0
ns
9, 10,
11
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
TR/TF=1.0ns
5
CP
4.0
ns
9
5
CP
5.0
ns
10, 11
5
CP
7.0
ns
9
5
CP
9.0
ns
10, 11
5
90
MHZ
9
5
45
MHZ
10, 11
th(L)
Hold Time
or LOW
tw(H)
Pulse Width
tw(L)
fMAX
HIGH
Pulse Width
Maximum Clock
Frequency
Note 1:
Note 2:
Note 3:
Note 4:
Note 5:
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
TR/TF=1.0ns
VCC=5.5V @25C, VCC=4.5V & 5.5V
@-55/125C
TR/TF=1.0ns
Screen tested 100% on each device at -55 C, +25 C & +125 C temperature, Subgroups A1,
2, 3, 7 & 8.
Screen tested 100% on each device at +25 C temperature only, Subgroup A9.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C, +125 C & -55 C temp.,
Subgroups A1, 2, 3, 7 & 8.
Sample Tested (Method 5005, Table 1) on each MFG. lot at +25 C Subgroup A9, &
periodically at +125 C & -55 C temp., Subgroups 10 & 11.
Not tested at +25 C, +125 C or -55 C temperature (DESIGN CHARACTERIZATION DATA).
5