ETC CY74FCT841CTQCT

CY54FCT841T, CY74FCT841T
10-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS035A – SEPTEMBER 1994 – REVISED OCTOBER 2001
D
D
D
D
D
D
D
D
D
D
D
D
CY54FCT841T . . . D PACKAGE
CY74FCT841T . . . P, Q, OR SO PACKAGE
(TOP VIEW)
Function, Pinout, and Drive Compatible
With FCT, F, and AM29841 Logic
Reduced VOH (Typically = 3.3 V) Versions of
Equivalent FCT Functions
Edge-Rate Control Circuitry for
Significantly Improved Noise
Characteristics
Ioff Supports Partial-Power-Down Mode
Operation
Matched Rise and Fall Times
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
Fully Compatible With TTL Input and
Output Logic Levels
High-Speed Parallel Latches
Buffered Common Latch-Enable Input
3-State Outputs
CY54FCT841T
– 32-mA Output Sink Current
– 12-mA Output Source Current
CY74FCT841T
– 64-mA Output Sink Current
– 32-mA Output Source Current
OE
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
GND
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
VCC
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
Y9
LE
description
The ’FCT841T bus-interface latches are designed to eliminate additional packages required to buffer existing
latches and provide additional data width for wider address/data paths or buses carrying parity. The ’FCT841T
devices are buffered 10-bit-wide versions of the FCT373 function.
The ’FCT841T devices’ high-performance interface is designed for high-capacitance-load drive capability, while
providing low-capacitance bus loading at both inputs and outputs. Outputs are designed for low-capacitance
bus loading in the high-impedance state.
These devices are fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the
outputs, preventing damaging current backflow through the device when it is powered down.
PIN DESCRIPTION
NAME
I/O
D
I
Latch data inputs
LE
I
Latch-enable input. The latches are transparent when LE is high.
Input data is latched on the high-to-low transition.
Y
O
3-state latch outputs
OE
I
Output-enable control. When OE is low, the outputs are enabled.
When OE is high, the outputs are in the high-impedance (off) state.
DESCRIPTION
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright  2001, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
POST OFFICE BOX 655303
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1
CY54FCT841T, CY74FCT841T
10-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS035A – SEPTEMBER 1994 – REVISED OCTOBER 2001
ORDERING INFORMATION
QSOP – Q
SOIC – SO
40°C to 85°C
–40°C
SPEED
(ns)
ORDERABLE
PART NUMBER
Tape and reel
5.5
CY74FCT841CTQCT
Tube
5.5
CY74FCT841CTSOC
Tape and reel
5.5
CY74FCT841CTSOCT
Tube
6.5
CY74FCT841BTPC
Tube
9
CY74FCT841ATSOC
Tape and reel
9
CY74FCT841ATSOCT
PACKAGE†
TA
DIP – P
SOIC – SO
TOP-SIDE
MARKING
FCT841C
FCT841C
CY74FCT841BTPC
FCT841A
–55°C to 125°C
CDIP – D
Tube
10
CY54FCT841ATDMB
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are
available at www.ti.com/sc/package.
FUNCTION TABLE
INTERNAL
OUTPUTS
INPUTS
OE
LE
D
O
Y
H
X
X
X
Z
H
H
L
L
Z
H
H
H
H
Z
H
L
X
NC
Z
L
H
L
L
L
L
H
H
H
H
L
L
X
NC
NC
FUNCTION
Z
Latched (Z)
Transparent
Latched
H = High logic level, L = Low logic level, X = Don’t care,
NC = No change, Z = High-impedance state
logic diagram (positive logic)
OE
LE
1
13
LE
2
D0
D
23
Q
To Nine Other Channels
2
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
Y0
CY54FCT841T, CY74FCT841T
10-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS035A – SEPTEMBER 1994 – REVISED OCTOBER 2001
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range to ground potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC output voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC output current (maximum sink current/pin) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 mA
Package thermal impedance, θJA (see Note 1): P package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67°C/W
(see Note 2): Q package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61°C/W
(see Note 2): SO package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46°C/W
Ambient temperature range with power applied, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 135°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The package thermal impedance is calculated in accordance with JESD 51-3.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
recommended operating conditions (see Note 3)
CY54FCT841T
CY74FCT841T
MIN
NOM
MAX
MIN
NOM
MAX
4.5
5
5.5
4.75
5
5.25
UNIT
VCC
VIH
Supply voltage
VIL
IOH
Low-level input voltage
0.8
0.8
V
High-level output current
–12
–32
mA
IOL
TA
Low-level output current
32
64
mA
85
°C
High-level input voltage
2
Operating free-air temperature
–55
2
125
–40
V
V
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
3
CY54FCT841T, CY74FCT841T
10-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS035A – SEPTEMBER 1994 – REVISED OCTOBER 2001
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
VIK
VOH
VOL
Vhys
VCC = 4.5 V,
IIN = –18 mA
VCC = 4.75 V,
IIN = –18 mA
VCC = 4.5 V,
IOH = –12 mA
75 V
VCC = 4
4.75
VCC = 4.5 V,
IOL = 32 mA
VCC = 4.75 V,
IOL = 64 mA
VIN = 2.7 V
VIN = 2.7 V
VCC = 5.5 V,
VIN = 0.5 V
VCC = 5.25 V,
VIN = 0.5 V
VCC = 5.5 V,
VOUT = 2.7 V
VCC = 5.25 V,
VOUT = 2.7 V
VCC = 5.5 V,
VOUT = 0.5 V
VCC = 5.25 V,
VCC = 5.5 V,
VOUT = 0.5 V
VOUT = 0 V
VCC = 5.25 V,
VOUT = 0 V
Ioff
VCC = 0 V,
VOUT = 4.5 V
ICC
VCC = 5.5 V,
VCC = 5.25 V,
∆ICC
ICCD¶
–1.2
0.3
V
0.55
0.55
0.2
5
±1
±1
±1
±1
10
10
–10
–10
–120
–225
–60
–120
±1
VCC = 5.5 V, One input switching at 50% duty cycle,
Outputs open, OE = GND, LE = VCC,
VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
VCC = 5.25 V, One input switching at 50% duty cycle,
Outputs open, OE = GND, LE = VCC,
VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V
0.1
0.5
0.06
V
V
5
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
§
VCC = 5.5 V, VIN = 3.4 V , f1 = 0, Outputs open
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
V
3.3
0.3
–60
UNIT
3.3
0.2
VCC = 5.25 V,
IOS‡
2.4
All inputs
VCC = 5.5 V,
IOZL
–0.7
2.4
VIN = VCC
IOZH
–1.2
IOH = –15 mA
VCC = 5.25 V,
IIL
–0.7
CY74FCT841T
TYP†
MAX
MIN
2
VIN = VCC
IIH
MIN
IOH = –32 mA
VCC = 5.5 V,
II
CY54FCT841T
TYP†
MAX
TEST CONDITIONS
–225
±1
0.2
0.1
0.2
0.5
2
2
µA
µA
µA
µA
µA
mA
µA
mA
mA
0.12
mA/
MHz
0.06
0.12
† Typical values are at VCC = 5 V, TA = 25°C.
‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
¶ This parameter is derived for use in total power-supply calculations.
4
POST OFFICE BOX 655303
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CY54FCT841T, CY74FCT841T
10-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS035A – SEPTEMBER 1994 – REVISED OCTOBER 2001
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted) (continued)
PARAMETER
CY54FCT841T
TYP†
MAX
TEST CONDITIONS
5V
VCC = 5
5.5
V,
Outputs open,,
OE = GND,
LE = VCC
IC#
VCC = 5
5.25
25 V
V,
Outputs open,,
OE = GND,
LE = VCC
One bit switching
at f1 = 10 MHz
at 50% duty cycle
10 bits switching
at f1 = 2.5 MHz
at 50% duty cycle
One bit switching
at f1 = 10 MHz
at 50% duty cycle
10 bits switching
at f1 = 2.5 MHz
at 50% duty cycle
MIN
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
0.7
1.4
VIN = 3.4 V or GND
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
1
2.4
1
3.2||
VIN = 3.4 V or GND
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
4.1
13.2||
CY74FCT841T
TYP†
MAX
MIN
UNIT
mA
0.7
1.4
VIN = 3.4 V or GND
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
1
2.4
1
3.2||
VIN = 3.4 V or GND
4.1
13.2||
Ci
5
10
5
10
pF
Co
9
12
9
12
pF
† Typical values are at VCC = 5 V, TA = 25°C.
# IC
= ICC + ∆ICC × DH × NT + ICCD (f0/2 + f1 × N1)
Where:
IC
= Total supply current
ICC = Power-supply current with CMOS input levels
∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH
= Duty cycle for TTL inputs high
NT
= Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0
= Clock frequency for registered devices, otherwise zero
f1
= Input signal frequency
N1
= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| Values for these conditions are examples of the ICC formula.
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (see Figure 1)
CY54FCT841AT
MIN
tw
tsu
Pulse duration, LE high
th
Hold time, data after LE↑
Setup time, data before LE↑
MAX
CY74FCT841AT
MIN
MAX
CY74FCT841BT
MIN
MAX
CY74FCT841CT
MIN
MAX
UNIT
5
4
4
4
ns
2.5
2.5
2.5
2.5
ns
3
2.5
2.5
2.5
ns
POST OFFICE BOX 655303
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5
CY54FCT841T, CY74FCT841T
10-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS035A – SEPTEMBER 1994 – REVISED OCTOBER 2001
switching characteristics over operating free-air temperature range (see Figure 1)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST LOAD
tPLH
tPHL
D
Y
tPLH
tPHL
D
tPLH
tPHL
CY54FCT841AT
CY74FCT841AT
MIN
MAX
MIN
MAX
CL = 50 pF,,
RL = 500 Ω
1.5
10
1.5
9
1.5
10
1.5
9
Y
CL = 300 pF,,
RL = 500 Ω
1.5
15
1.5
13
1.5
15
1.5
13
LE
Y
CL = 50 pF,,
RL = 500 Ω
1.5
13
1.5
12
1.5
13
1.5
12
tPLH
tPHL
LE
Y
CL = 300 pF,,
RL = 500 Ω
1.5
20
1.5
16
1.5
20
1.5
16
tPZH
tPZL
Y
CL = 50 pF,,
RL = 500 Ω
1.5
13
1.5
11.5
OE
1.5
13
1.5
11.5
tPZH
tPZL
Y
CL = 300 pF,,
RL = 500 Ω
1.5
25
1.5
23
OE
1.5
25
1.5
23
tPHZ
tPLZ
Y
CL = 5 pF,,
RL = 500 Ω
1.5
9
1.5
7
OE
1.5
9
1.5
7
Y
CL = 50 pF,
RL = 500 Ω
1.5
10
1.5
8
OE
1.5
10
1.5
8
tPHZ
tPLZ
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
switching characteristics over operating free-air temperature range (see Figure 1)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST LOAD
tPLH
tPHL
D
Y
tPLH
tPHL
D
tPLH
tPHL
CY74FCT841CT
MIN
MAX
MIN
MAX
CL = 50 pF,,
RL = 500 Ω
1.5
6.5
1.5
5.5
1.5
6.5
1.5
5.5
Y
CL = 50 pF,,
RL = 500 Ω
1.5
13
1.5
13
1.5
13
1.5
13
LE
Y
CL = 50 pF,,
RL = 500 Ω
1.5
8
1.5
6.4
1.5
8
1.5
6.4
tPLH
tPHL
LE
Y
CL = 300 pF,,
RL = 500 Ω
1.5
15.5
1.5
15
1.5
15.5
1.5
15
tPZH
tPZL
Y
CL = 50 pF,,
RL = 500 Ω
1.5
8
1.5
6.5
OE
1.5
8
1.5
6.5
tPZH
tPZL
Y
CL = 300 pF,,
RL = 500 Ω
1.5
14
1.5
12
OE
1.5
14
1.5
12
tPHZ
tPLZ
Y
CL = 5 pF,,
RL = 500 Ω
1.5
6
1.5
5.7
OE
1.5
6
1.5
5.7
Y
CL = 50 pF
RL = 500 Ω,
1.5
7
1.5
6
OE
1.5
7
1.5
6
tPHZ
tPLZ
6
CY74FCT841BT
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
CY54FCT841T, CY74FCT841T
10-BIT LATCHES
WITH 3-STATE OUTPUTS
SCCS035A – SEPTEMBER 1994 – REVISED OCTOBER 2001
PARAMETER MEASUREMENT INFORMATION
7V
From Output
Under Test
From Output
Under Test
Test
Point
CL = 50 pF
(see Note A)
Open
TEST
GND
CL = 50 pF
(see Note A)
500 Ω
S1
500 Ω
S1
Open
7V
Open
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
500 Ω
LOAD CIRCUIT FOR
3-STATE OUTPUTS
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
3V
1.5 V
Timing Input
0V
tw
tsu
3V
1.5 V
Input
1.5 V
th
3V
1.5 V
Data Input
1.5 V
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
3V
1.5 V
Input
1.5 V
0V
tPLH
tPHL
1.5 V
1.5 V
VOL
tPHL
Out-of-Phase
Output
tPLZ
≈3.5 V
1.5 V
tPZH
VOH
1.5 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
1.5 V
0V
Output
Waveform 1
(see Note B)
tPLH
1.5 V
1.5 V
tPZL
VOH
In-Phase
Output
3V
Output
Control
Output
Waveform 2
(see Note B)
VOL + 0.3 V
VOL
tPHZ
1.5 V
VOH – 0.3 V
VOH
≈0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
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accordance with TI’s standard warranty. Testing and other quality control techniques are used to the extent TI
deems necessary to support this warranty. Except where mandated by government requirements, testing of all
parameters of each product is not necessarily performed.
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Mailing Address:
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Post Office Box 655303
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Copyright  2001, Texas Instruments Incorporated