ETC LDT2907A

PRODUCT DATA
Micro International, Inc
PART NUMBER
LDT2907A and LDT2907AT
Micro-LID PNP Transistor
Micro International, Inc.
179-204 Belle Forrest Circle
Nashville, TN 37221
Tel: 615-662-1200 Fax 615-662-1226
www.microlid.com
[email protected]
Micro-LID Transistors
LDT2907A and LDT2907AT
Description:
The LDT2907A (untinned) and LDT2907AT (tinned) are PNP silicon transistors in
very small, rugged, surface mount, 4-post ceramic packages (Micro International
manufactured package p/n 4-075-1). The LDT2907A and LDT2907AT meet the
general specifications of the 2N2907A transistor. The 4-075-1 Micro-LID package
is a 4-post, leadless ceramic carrier which can be provided with gold metallized
or pre-tinned lands, and is approved for military, medical implant, sensor, and
high reliability applications. The LDT2907A and LDT2907AT can be provided
with special feature options such as additional temperature cycling and
screening.
Maximum Ratings:
Parameter
Symbol
Rating
Collector-Base Voltage
Vcbo
60 V
Collector-Emitter Voltage
Vceo
60 V
Emitter-Base Voltage
Vebo
5V
Collector Current
Ic
600 mA
Total Dissipation
Pt
350 mW
Operating Junction Temperature
Tj
150°C
Storage Temperature
Tstg
-65°C to 150°C
Operating Temperature
Toper
-55°C to 125°C
1/3 January 1997
www.microlid.com
[email protected]
Micro-LID Transistors
LDT2907A and LDT2907AT
________________________________________________________________________
Outline / Schematic:
TOP VIEW
3
3, 4
2
2
.040
1
1
4
.075
END VIEW
SIDE VIEW
.035
SUBSTRATE / CIRCUIT BOARD
Dimensions / Marking:
Length
Width
Height
.075′
′+ .003′
′
.040′
′+ .003′
′
.035′
′+ .003′
′
Post 1 (Emitter)
Post 2 (Base)
Post 3,4 (Collector)
.015′
′x .010′
′typ
.015′
′x .010′
′typ
.015′
′x .012′
′typ
Marking on back of package : Green Dot over Emitter and Red Dot in Center
(post down configuration)
Standard In-Process Screening Requirements:
Ø
Semiconductor die and Micro-LID package visual inspection
Ø
Wire pull test
Ø
24 hour stabilization bake at 150°C
Ø
10 temperature cycles from –55°C to 125°C
Ø
100% electrical test of dc characteristics at 25°C
Ø
Final visual inspection
________________________________________________________________
2/3 January 1997
www.microlid.com
[email protected]
Micro-LID Transistors
LDT2907A and LDT2907AT
Electrical Characteristics (25°C Ambient)
Parameter
Symbol
Min
Typ
Max
Collector-Base Breakdown
Ic = 10 uA, Ie = 0
BVcbo
60
--
--
V
Collector-Emitter Breakdown*
Ib = 0, Ic = 10 mA
BVceo
60
--
--
V
Emitter-Base Breakdown
Ic = 0, Ie = 10 uA
BVebo
5
--
--
V
Collector-Base Cutoff Current
Vcb = 50 V
Icbo
--
--
10
nA
DC Forward Current Gain*
Ic = 150 mA, Vce = 10 V
Hfe
100
--
300
Collector-Emitter Saturation
Ic = 150 mA, Ib = 15 mA
Vce (sat)
--
--
.4
V
Base-Emitter Saturation
Ic = 150 mA, Ib = 15 mA
Vbe (sat)
--
--
1.3
V
Collector Capacitance
Vcb = 10 V, Ie = 0
f = 1 MHz
Cobo
--
--
8
pF
* Pulse test, pulse width < 300 usec, duty cycle < 2%
3/3 January 1997
Units