Features • Low-voltage and Standard-voltage Operation – 2.7 (VCC = 2.7V to 5.5V) • User Selectable Internal Organization – 16K: 2048 x 8 or 1024 x 16 3-wire Serial Interface Sequential Read Operation Schmitt Trigger, Filtered Inputs for Noise Suppression 2 MHz Clock Rate (5V) Compatibility Self-timed Write Cycle (10 ms max) High Reliability – Endurance: 1 Million Write Cycles – Data Retention: 100 Years • Automotive Grade and Extended Temperature Devices Available • 8-pin PDIP, 8-pin JEDEC SOIC, and 8-pin TSSOP Packages • • • • • • 3-wire Serial EEPROM 16K (2048 x 8 or 1024 x 16) Description The AT93C86 provides 16384 bits of serial electrically erasable programmable read only memory (EEPROM) organized as 1024 words of 16 bits each when the ORG Pin is connected to V CC and 2048 words of 8 bits each when it is tied to ground. The device is optimized for use in many industrial and commercial applications where low power and low voltage operations are essential. The AT93C86 is available in space saving 8-pin PDIP, 8-pin JEDEC SOIC and 8-pin TSSOP packages. AT93C86 The AT93C86 is enabled through the Chip Select pin (CS), and accessed via a 3-wire serial interface consisting of Data Input (DI), Data Output (DO), and Shift Clock (SK). (continued) Pin Configurations Pin Name Function CS Chip Select SK Serial Data Clock DI Serial Data Input DO Serial Data Output GND Ground VCC Power Supply ORG Internal Organization DC Don’t Connect 8-pin PDIP 1 2 3 4 CS SK DI DO VCC DC ORG GND 8 7 6 5 8-pin SOIC CS SK DI DO 1 2 3 4 8 7 6 5 VCC DC ORG GND 8-pin TSSOP CS SK DI DO 1 2 3 4 8 7 6 5 VCC DC ORG GND Rev. 1237C–SEEPR–02/02 1 Upon receiving a READ instruction at DI, the address is decoded and the data is clocked out serially on the data output pin DO. The WRITE cycle is completely self-timed and no separate ERASE cycle is required before WRITE. The WRITE cycle is only enabled when the part is in the ERASE/WRITE ENABLE state. When CS is brought “high” following the initiation of a WRITE cycle, the DO pin outputs the READY/BUSY status of the part. The AT93C86 is available in a 2.7V to 5.5V version. Absolute Maximum Ratings* *NOTICE: Operating Temperature.................................. -55°C to +125°C Storage Temperature ..................................... -65°C to +150°C Voltage on any Pin with Respect to Ground .....................................-1.0V to +7.0V Maximum Operating Voltage .......................................... 6.25V Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability DC Output Current........................................................ 5.0 mA Block Diagram Vcc GND MEMORY ARRAY ORG 2048 x 8 OR 1024 x 16 ADDRESS DECODER DATA REGISTER OUTPUT BUFFER DI Note: 2 CS MODE DECODE LOGIC SK CLOCK GENERATOR DO 1. When the ORG pin is connected to Vcc, the x 16 organization is selected. When it is connected to ground, the x 8 organization is selected. If the ORG pin is left unconnected and the application does not load the input beyond the capability of the internal 1 Meg ohm pullup, then the x 16 organization is selected. This feature is not available on the 1.8V devices. AT93C86 1237C–SEEPR–02/02 AT93C86 Pin Capacitance(1) Applicable over recommended operating range from TA = 25°C, f = 1.0 MHz, VCC = +5.0V (unless otherwise noted). Symbol Test Conditions COUT CIN Note: Max Units Conditions Output Capacitance (DO) 5 pF VOUT = 0V Input Capacitance (CS, SK, DI) 5 pF VIN = 0V 1. This parameter is characterized and is not 100% tested. DC Characteristics Applicable over recommended operating range from: TAI = -40°C to +85°C, VCC = +2.7V to +5.5V, TAC = 0°C to +70°C, VCC = +2.7V to +5.5V (unless otherwise noted). Symbol Parameter VCC1 Supply Voltage VCC2 Supply Voltage ICC Supply Current ISB1 Standby Current ISB2 IIL Test Condition Min Typ Max Unit 2.7 5.5 V 4.5 5.5 V READ at 1.0 MHz 0.5 2.0 mA WRITE at 1.0 MHz 0.5 2.0 mA VCC = 2.7V CS = 0V 6.0 10.0 µA Standby Current VCC = 5.0V CS = 0V 17 30 µA Input Leakage VIN = 0V to VCC 0.1 1.0 µA Output Leakage VIN = 0V to VCC 0.1 1.0 µA VIL1 VIH1(1) Input Low Voltage Input High Voltage 4.5V ≤ VCC ≤ 5.5V -0.6 VCC x 0.7 VCC x 0.3 VCC + 1 V VIL2 (1) VIH2(1) Input Low Voltage Input High Voltage VCC ≤ 2.7V -0.6 VCC x 0.7 VCC x 0.3 VCC + 1 V VOL1 VOH1 Output Low Voltage Output High Voltage 4.5V ≤ VCC ≤ 5.5V 0.4 V VOL2 VOH2 Output Low Voltage Output High Voltage VCC ≤ 2.7V IOL (1) Note: VCC = 5.0V IOL = 2.1 mA IOH = -0.4 mA 2.4 IOL = 0.15 mA IOH = -100 µA V 0.2 VCC - 0.2 V V 1. VIL min and VIH max are reference only and are not tested. 3 1237C–SEEPR–02/02 AC Characteristics Applicable over recommended operating range from TA = -40°C to + 85°C, VCC = As Specified, CL = 1 TTL Gate and 100 pF (unless otherwise noted). Symbol Parameter Test Condition Min Typ fSK SK Clock Frequency 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 0 0 tSKH SK High Time 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 250 250 ns tSKL SK Low Time 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 250 250 ns tCS Minimum CS Low Time 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 250 250 ns tCSS CS Setup Time Relative to SK 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 50 50 ns tDIS DI Setup Time Relative to SK 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 100 100 ns tCSH CS Hold Time Relative to SK 0 ns tDIH DI Hold Time Relative to SK 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 100 100 ns tPD1 Output Delay to ‘1’ AC Test 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 250 250 ns tPD0 Output Delay to ‘0’ AC Test 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 250 250 ns tSV CS to Status Valid AC Test 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 250 250 ns tDF CS to DO in High Impedance AC Test CS = VIL 4.5V ≤ VCC ≤ 5.5V 2.7V ≤ VCC ≤ 5.5V 100 100 ns 10 ms tWP Write Cycle Time 0.1 Endurance Note: 4 (1) 4.5V ≤ VCC ≤ 5.5V 5.0V, 25°C, Page Mode 4 1M Max Units 2 1 MHz ms Write Cycles 1. This parameter is characterized and is not 100% tested. AT93C86 1237C–SEEPR–02/02 AT93C86 Instruction Set for the AT93C86 Address Instruction Data SB Op Code x8 x 16 READ 1 10 A10 - A0 A9 - A0 Reads data stored in memory, at specified address. EWEN 1 00 11XXXXXXXX 11XXXXXXXX Write enable must precede all programming modes. ERASE 1 11 A10 - A0 A9 - A0 WRITE 1 01 A10 - A0 A9 - A0 ERAL 1 00 10XXXXXXXX 10XXXXXXXX WRAL 1 00 01XXXXXXXX 01XXXXXXXX EWDS 1 00 00XXXXXXXX 00XXXXXXXX Functional Description x8 x 16 Comments Erases memory location A n - A0. D7 - D0 D15 - D0 Writes memory location An - A0. Erases all memory locations. Valid only at V CC = 4.5V to 5.5V. D 7 - D0 D15 - D0 Writes all memory locations. Valid when VCC = 4.5V to 5.5V and Disable Register cleared. Disables all programming instructions. The AT93C86 is accessed via a simple and versatile 3-wire serial communication interface. Device operation is controlled by seven instructions issued by the host processor. A valid instruction starts with a rising edge of CS and consists of a Start Bit (logic “1”) followed by the appropriate Op Code and the desired memory Address location. READ (READ): The Read (READ) instruction contains the Address code for the memory location to be read. After the instruction and address are decoded, data from the selected memory location is available at the serial output pin DO. Output data changes are synchronized with the rising edges of serial clock SK. It should be noted that a dummy bit (logic “0”) precedes the 8- or 16-bit data output string. ERASE/WRITE (EWEN): To assure data integrity, the part automatically goes into the Erase/Write Disable (EWDS) state when power is first applied. An Erase/Write Enable (EWEN) instruction must be executed first before any programming instructions can be carried out. Please note that once in the Erase/Write Enable state, programming remains enabled until an Erase/Write Disable (EWDS) instruction is executed or VCC power is removed from the part. ERASE (ERASE): The Erase (ERASE) instruction programs all bits in the specified memory location to the logical “1” state. The self-timed erase cycle starts once the ERASE instruction and address are decoded. The DO pin outputs the READY/BUSY status of the part if CS is brought high after being kept low for a minimum of 250 ns (tCS). A logic “1” at pin DO indicates that the selected memory location has been erased, and the part is ready for another instruction. WRITE (WRITE): The Write (WRITE) instruction contains the 8 or 16 bits of data to be written into the specified memory location. The self-timed programming cycle, tWP, starts after the last bit of data is received at serial data input pin DI. The DO pin outputs the READY/BUSY status of the part if CS is brought high after being kept low for a minimum of 250 ns (tCS). A logic “0” at DO indicates that programming is still in progress. A logic “1” indicates that the memory location at the specified address has been written with the data pattern contained in the instruction and the part is ready for further instructions. A READY/BUSY status cannot be obtained if the CS is brought high after the end of the self-timed programming cycle, tWP. 5 1237C–SEEPR–02/02 ERASE ALL (ERAL): The Erase All (ERAL) instruction programs every bit in the memory array to the logic “1” state and is primarily used for testing purposes. The DO pin outputs the READY/BUSY status of the part if CS is brought high after being kept low for a minimum of 250 ns (tCS). The ERAL instruction is valid only at VCC = 5.0V ± 10%. WRITE ALL (WRAL): The Write All (WRAL) instruction programs all memory locations with the data patterns specified in the instruction. The DO pin outputs the READY/BUSY status of the part if CS is brought high after being kept low for a minimum of 250 ns (tCS). The WRAL instruction is valid only at VCC = 5.0V ± 10%. ERASE/WRITE DISABLE (EWDS): To protect against accidental data disturb, the Erase/Write Disable (EWDS) instruction disables all programming modes and should be executed after all programming operations. The operation of the READ instruction is independent of both the EWEN and EWDS instructions and can be executed at any time. 6 AT93C86 1237C–SEEPR–02/02 AT93C86 Timing Diagrams Synchronous Data Timing Note: 1. This is the minimum SK period. Organization Key for Timing Diagrams AT93C86 (16K) I/O x8 x 16 AN A10 A9 DN D7 D15 7 1237C–SEEPR–02/02 READ Timing EWEN Timing tCS CS SK DI 1 0 0 1 ... 1 EWDS Timing tCS CS SK DI 1 0 0 0 ... 0 WRITE Timing tCS CS SK DI DO 1 0 1 AN ... A0 DN ... D0 HIGH IMPEDANCE BUSY READY tWP 8 AT93C86 1237C–SEEPR–02/02 AT93C86 WRAL Timing(1) tCS CS SK 1 DI DO 0 0 0 1 ... DN ... D0 BUSY HIGH IMPEDANCE READY tWP Note: 1. Valid only at VCC = 4.5V to 5.5V. ERASE Timing tCS CS STANDBY CHECK STATUS SK DI 1 1 1 AN AN-1 AN-2 ... A0 tDF tSV DO HIGH IMPEDANCE HIGH IMPEDANCE BUSY READY tWP ERAL Timing(1) tCS CS CHECK STATUS STANDBY tSV tDF SK DI DO 1 0 0 1 0 BUSY HIGH IMPEDANCE HIGH IMPEDANCE READY tWP Note: 1. Valid only at VCC = 4.5V to 5.5V. 9 1237C–SEEPR–02/02 AT93C86 Ordering Information tWP (max) (ms) ICC (max) (µA) ISB (max) (µA) fMAX (kHz) 10 800 10.0 1000 Ordering Code Package AT93C86-10PI-2.7 AT93C86-10SI-2.7 AT93C86-10TI-2.7 8P3 8S1 8A2 Operation Range Industrial (-40°C to 85°C) Package Type 8P3 8-lead, 0.300" Wide, Plastic Dual Inline Package (PDIP) 8S1 8-lead, 0.150" Wide, Plastic Gull Wing Small Outline (JEDEC SOIC) 8A2 8-lead, 0.170" Wide, Thin Shrink Small Outline Package (TSSOP) Options -2.7 10 Low Voltage (2.7V to 5.5V) AT93C86 1237C–SEEPR–02/02 AT93C86 Packaging Information 8P3 – PDIP E 1 E1 N Top View c eA End View COMMON DIMENSIONS (Unit of Measure = inches) D e D1 A2 A MIN NOM A2 0.115 0.130 0.195 b 0.014 0.018 0.022 5 b2 0.045 0.060 0.070 6 b3 0.030 0.039 0.045 6 c 0.008 0.010 0.014 D 0.355 0.365 0.400 D1 0.005 E 0.300 0.310 0.325 4 E1 0.240 0.250 0.280 3 SYMBOL A b2 b3 b 4 PLCS Side View L Notes: 0.210 0.100 BSC eA 0.300 BSC 0.115 NOTE 2 3 3 e L MAX 0.130 4 0.150 2 1. This drawing is for general information only; refer to JEDEC Drawing MS-001, Variation BA for additional information. 2. Dimensions A and L are measured with the package seated in JEDEC seating plane Gauge GS-3. 3. D, D1 and E1 dimensions do not include mold Flash or protrusions. Mold Flash or protrusions shall not exceed 0.010 inch. 4. E and eA measured with the leads constrained to be perpendicular to datum. 5. Pointed or rounded lead tips are preferred to ease insertion. 6. b2 and b3 maximum dimensions do not include Dambar protrusions. Dambar protrusions shall not exceed 0.010 (0.25 mm). 01/09/02 R 2325 Orchard Parkway San Jose, CA 95131 TITLE 8P3, 8-lead, 0.300" Wide Body, Plastic Dual In-line Package (PDIP) DRAWING NO. REV. 8P3 B 11 1237C–SEEPR–02/02 8S1 – JEDEC SOIC 3 2 1 H N Top View e B A D COMMON DIMENSIONS (Unit of Measure = mm) Side View A2 C L SYMBOL MIN NOM MAX A – – 1.75 B – – 0.51 C – – 0.25 D – – 5.00 E – – 4.00 e E End View NOTE 1.27 BSC H – – 6.20 L – – 1.27 Note: This drawing is for general information only. Refer to JEDEC Drawing MS-012 for proper dimensions, tolerances, datums, etc. 10/10/01 R 12 2325 Orchard Parkway San Jose, CA 95131 TITLE 8S1, 8-lead (0.150" Wide Body), Plastic Gull Wing Small Outline (JEDEC SOIC) DRAWING NO. REV. 8S1 A AT93C86 1237C–SEEPR–02/02 AT93C86 8A2 – TSSOP 3 2 1 E E1 N Top View b A2 COMMON DIMENSIONS (Unit of Measure = mm) e A D SYMBOL D MIN NOM MAX NOTE 2.90 3.00 3.10 2, 5 3, 5 E Side View E1 4.30 4.40 4.50 A – – 1.20 A2 0.80 1.00 1.05 b 0.19 – 0.30 e L L1 End View Notes: 6.40 BSC L 4 0.65 BSC 0.45 L1 0.60 0.75 1.00 REF 1. This drawing is for general information only. Refer to JEDEC Drawing MO-153, Variation AA, for proper dimensions, tolerances, datums, etc. 2. Dimension "D" does not include mold Flash, protrusions or gate burrs. Mold Flash, protrusions and gate burrs shall not exceed 0.15 mm (0.006 in) per side. 3. Dimension "E1" does not include inter-lead Flash or protrusions. Inter-lead Flash and protrusions shall not exceed 0.25 mm (0.010 in) per side. 4. Dimension "b" does not include Dambar protrusion. Allowable Dambar protrusion shall be 0.08 mm total in excess of the b dimension at maximum material condition. Dambar cannot be located on the lower radius of the foot. Minimum space between protrusion and adjacent lead is 0.07 mm. 10/26/01 5. Dimension "D" and "E1" to be determined at Datum Plane H. R 2325 Orchard Parkway San Jose, CA 95131 TITLE 8A2, 8-lead, 4.4 mm Body, Plastic Thin Shrink Small Outline Package (TSSOP) DRAWING NO. 8A2 REV. 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