ETC HBFP-0450

High Performance Isolated
Collector Silicon Bipolar
Transistor
Technical Data
HBFP-0450
Features
• Ideal for High Performance,
Medium Power, and Low
Noise Applications
4-lead SC-70 (SOT-343)
Surface Mount Plastic
Package
• Typical Performance at
1.8 GHz
Low Noise Application
Noise Figure of 1.2 dB,
Associated Gain of 13 dB,
and P1dB of 11 dBm at 2 V
and 10 mA
• Miniature 4-lead SC-70
(SOT-343) Plastic Package
• Transition Frequency
fT = 25 GHz
Pin Configuration
Base
Emitter
08x
Medium Power Application
P1dB of 19 dBm, Noise
Figure of 1.7 dB, and
Associated Gain of 15 dB
at 3 V and 50 mA
Emitter
Description
Agilent’s HBFP-0450 is a high
performance isolated
collector silicon bipolar junction
transistor housed in a 4-lead SC-70
(SOT-343) surface mount plastic
package.
This product is based on a 25 GHz
transition frequency fabrication
process, which enables the
products to be used for high
performance, medium power, low
noise applications up to 6 GHz.
Applications
• Driver amplifier for Cellular
and PCS base stations
Collector
Note:
Package marking provides orientation
and identification.
08 = Device code
x = Date code character. A new
character is assigned for each
month, year
• Driver amplifier and medium
power amplifier for Cellular
and PCS handsets
• High dynamic range LNA for
ISM, wireless data, and
WLL applications
• Oscillator, mixer, and LO
Buffer applications
2
HBFP-0450 Absolute Maximum Ratings
Symbol
VEBO
VCBO
VCEO
IC
PT
Tj
TSTG
Parameter
Units
Absolute
Maximum[1]
V
V
V
mA
mW
°C
°C
1.5
15.0
4.5
100
450
150
-65 to 150
Emitter-Base Voltage
Collector-Base Voltage
Collector-Emitter Voltage
Collector Current
Power Dissipation [2]
Junction Temperature
Storage Temperature
Thermal Resistance:
θ jc = 180°C/W
Notes:
1. Operation of this device above any
one of these parameters may cause
permanent damage.
2. PT due to Maximum Ratings.
3. Thermal resistance measured using
Liquid Crystal Measurement
method.
Electrical Specifications, TC = 25°C
Symbol
Parameters and Test Conditions
DC Characteristics
BVCEO Collector-Emitter Breakdown Voltage
I CBO
Collector-Cutoff Current
I EBO
Emitter-Base Cutoff Current
hFE
DC Current Gain
RF Characteristics
P-1dB Power Output at 1 dB
Compression Point
IC = 1 mA, open base
Units
Min.
V
4.5
Typ.
VCB = 5 V, IE = 0
nA
500
VEB = 1.5 V, IC = 0
µA
100
VCE = 2 V, IC = 20 mA
—
IC = 50 mA, VCE = 3 V, f = 1.8 GHz
IC = 50 mA, VCE = 2 V, f = 1.8 GHz
dB
50
80
3rd Order Intercept Pt at Output
IC = 50 mA, VCE = 3 V, f = 1.8 GHz dBm
29
G -1dB
Gain at 1 dB Compression Point
IC = 50 mA, VCE = 3 V, f = 1.8 GHz dBm
IC = 50 mA, VCE = 2 V, f = 1.8 GHz
16
15.5
FMIN
Minimum Noise Figure
IC = 50 mA, VCE = 3 V, f = 1.8 GHz
IC = 50 mA, VCE = 2 V, f = 1.8 GHz
dB
1.7
1.8
Ga
Associated Gain
IC = 50 mA, VCE = 3 V, f = 1.8 GHz
IC = 50 mA, VCE = 2 V, f = 1.8 GHz
dB
15
14.5
NF
Minimum Noise Figure
IC = 10 mA, VCE = 2 V, f = 1.8 GHz
IC = 20 mA, VCE = 2 V, f = 1.8 GHz
dB
1.2
1.3
IC = 10 mA, VCE = 2 V, f = 1.8 GHz
IC = 20 mA, VCE = 2 V, f = 1.8 GHz
dB
P-1dB
Associated Gain
Power Output at 1 dB
Compression Point
IC = 10 mA, VCE = 2 V, f = 1.8 GHz dBm
IC = 20 mA, VCE = 2 V, f = 1.8 GHz
150
19
17
IP 3
Ga
Max.
13.0
13
14
11
14
1.7
3
HBFP-0450 Typical Performance
20
4.0
18
3.5
Fmin (dB)
3.0
2.5
2.0
1.5
10 mA
20 mA
50 mA
70 mA
1.0
0.5
0
0
2
4
6
8
3.5
10 mA
20 mA
50 mA
70 mA
16
14
3.0
2.5
Fmin (dB)
ASSOCIATED GAIN (dB)
4.5
12
10
8
6
1.5
1V
2V
3V
1.0
4
0.5
2
0
0
2
0
10
4
8
6
2
0
10
FREQUENCY (GHz)
FREQUENCY (GHz)
Figure 1. Minimum Noise Figure vs.
Frequency and Collector Current
at 2 V.
4
8
6
10
FREQUENCY (GHz)
Figure 2. Associated Gain vs.
Frequency and Collector Current
at 2 V.
Figure 3. Minimum Noise Figure vs.
Frequency and Voltage at 20 mA.
5
20
20
18
1V
2V
3V
16
4
Fmin (dB)
14
12
10
8
3
2
0.9 GHz
1.8 GHz
2.5 GHz
4 GHz
6 GHz
6
4
1
2
0
0
0
2
4
6
8
FREQUENCY (GHz)
Figure 4. Associated Gain vs.
Frequency and Voltage at 20 mA.
10
ASSOCIATED GAIN (dB)
18
ASSOCIATED GAIN (dB)
2.0
16
14
0.9 GHz
1.8 GHz
2.5 GHz
4 GHz
6 GHz
12
10
8
6
4
2
0
0
20
40
60
80
100 120 140
COLLECTOR CURRENT (mA)
Figure 5. Minimum Noise Figure vs.
Collector Current at 2 V.
0
20
40
60
80
100 120 140
COLLECTOR CURRENT (mA)
Figure 6. Associated Gain vs.
Collector Current at 2 V.
4
P1dB (dBm)
P1dB (dBm)
15
10
0.9
1.8
3
4
5
6
5
25
25
20
20
60
15
45
10
30
5
15
15
10
20 mA
50 mA
80 mA
5
0
Pout (dBm) & GAIN (dB)
20
0
0
20
40
60
80
Pout @ 900
Ic @ 900
Gain @ 1800
Gain @ 900
Pout @ 1800
Ic @ 1800
100
1
0
COLLECTOR CURRENT (mA)
2
0
-15
3
-11
-7
VOLTAGE (V)
Figure 7. P1 dB vs. Collector Current
and Frequency.
-3
1
5
9
75
Ic (mA)
HBFP-0450 Typical Performance, continued
0
13
Pin (dBm)
Figure 8. P1dB vs. Voltage at 1.8 GHz.
Figure 9. Pout (dBm), Gain (dB), and
Ic (mA) vs. Pin (dBm) at 2 V, 50 mA.
900 MHz: ΓS: Mag: 0.68, Ang: 121°; ΓL: Mag: 0.38, Ang: 171°
1800 MHz: ΓS: Mag: 0.44, Ang: 158°; ΓL: Mag: 0.28, Ang: 159°
60
30
20
40
10
0
-15
20
-11
-7
-3
1
5
9
0
13
Pin (dBm)
Figure 10. Pout (dBm), Gain (dB), and
Ic (mA) vs. Pin (dBm) at 3 V, 80 mA.
ΓS: Mag: 0.72, Ang: 169°
ΓL: Mag: 0.26, Ang: 168°
POWER GAIN (dB)
80
Ic (mA)
Pout (dBm) & GAIN (dB)
40
30
30
25
25
20
1 GHz
2 GHz
15
3 GHz
4 GHz
10
5 GHz
POWER GAIN (dB)
Pout @ 1800 100
Gain @ 1800
Ic @ 1800
50
1 GHz
20
2 GHz
3 GHz
15
4 GHz
10
5 GHz
6 GHz
5
6 GHz
5
0
-5
0
0
30
60
90
120
150
COLLECTOR CURRENT (mA)
Figure 11. Power Gain vs. Collector
Current and Frequency at 2 V.
0
1
2
3
4
VOLTAGE (V)
Figure 12. Power Gain vs. Voltage
and Frequency at 50 mA.
5
5
HBFP-0450 Typical Scattering Parameters,
VCE = 2 V, IC = 10 mA
S21
S11
Freq.
GHz
Mag
Ang
0.1
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
0.74
0.73
0.71
0.71
0.72
0.73
0.73
0.74
0.74
0.75
0.76
0.79
0.81
0.84
0.85
0.87
-39
-128
-161
-166
175
167
162
150
140
120
102
83
65
49
35
20
S12
dB
Mag
Ang
dB
Mag
Ang
Mag
Ang
26.20
20.68
16.16
15.29
11.85
10.26
9.37
7.46
5.94
3.67
1.97
0.47
-1.00
-2.33
-3.47
-4.45
20.409
10.813
6.425
5.816
3.913
3.260
2.941
2.360
1.981
1.526
1.255
1.055
0.891
0.765
0.671
0.599
157
107
87
83
68
60
55
44
34
14
-5
-25
-43
-60
-75
-91
-31.37
-22.85
-21.83
-21.72
-20.92
-20.45
-20.18
-19.33
-18.56
-17.02
-15.65
-14.70
-14.07
-13.64
-13.19
-12.84
0.027
0.072
0.081
0.082
0.090
0.095
0.098
0.108
0.118
0.141
0.165
0.184
0.198
0.208
0.219
0.228
71
33
24
23
20
19
19
17
15
8
-2
-15
-28
-40
-53
-67
0.93
0.53
0.37
0.35
0.31
0.30
0.30
0.30
0.30
0.31
0.33
0.37
0.43
0.48
0.52
0.55
-26
-90
-122
-129
-154
-165
-172
175
164
146
126
106
88
72
57
40
HBFP-0450 Noise Parameters: VCE = 2 V, IC = 10 mA
Γopt
Freq.
Fmin
GHz
dB
Mag
0.5
0.9
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
0.80
0.91
1.08
1.15
1.21
1.36
1.51
1.8
2.09
2.39
0.36
0.38
0.41
0.46
0.48
0.53
0.59
0.65
0.70
0.73
S22
RN /50
Ga
Ang
—
dB
124
140
160
177
-178
-162
-150
-127
-106
-85
0.24
0.16
0.08
0.05
0.05
0.06
0.09
0.25
0.55
1.09
22.7
18.4
14.7
13.5
12.6
10.9
9.6
7.6
6.2
5.0
Note: RN represents normalized noise resistance.
S and noise parameters are measured
on a microstrip line made on 0.025 inch
thick alumina carrier. The input
reference plane is at the end of the base
lead, the output reference plane is at the
end of the collector lead. S and noise
parameters include the effect of four
plated through via holes connecting
emitter landing pads on the top of test
carrier to the microstrip ground plane
on the bottom side of the carrier. Two
0.020 inch diameter via holes are placed
within 0.010 inch from each emitter lead
contact point, one via on each side of
that point.
100
10
1
IPG
MSG/MAG
0.1
1.00E+08
1.00E+09
FREQUENCY
1.00E+10
Figure 13. HBFP-0450 Power Gain
at 2 V, 10 mA.
6
HBFP-0450 Typical Scattering Parameters,
VCE = 2 V, IC = 20 mA
S21
S11
Freq.
GHz
Mag
Ang
0.1
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
0.64
0.70
0.70
0.70
0.71
0.72
0.73
0.73
0.74
0.74
0.76
0.78
0.81
0.83
0.85
0.87
-53
-144
-170
-174
169
162
157
147
137
118
100
82
64
48
34
19
S12
dB
Mag
Ang
dB
Mag
Ang
Mag
Ang
29.07
21.90
17.10
16.20
12.69
11.09
10.18
8.26
6.73
4.46
2.75
1.23
-0.23
-1.54
-2.64
-3.58
28.415
12.449
7.159
6.455
4.308
3.584
3.23
2.589
2.171
1.672
1.373
1.152
0.974
0.838
0.738
0.662
153
101
84
80
67
60
55
45
35
16
-3
-22
-40
-56
-72
-88
-32.04
-24.88
-23.61
-23.35
-21.94
-21.11
-20.63
-19.41
-18.34
-16.48
-15.09
-14.11
-13.60
-13.23
-12.88
-12.58
0.025
0.057
0.066
0.068
0.080
0.088
0.093
0.107
0.121
0.150
0.176
0.197
0.209
0.218
0.227
0.235
67
33
30
30
30
29
29
26
23
13
1
-13
-27
-40
-53
-67
0.89
0.49
0.38
0.37
0.35
0.35
0.35
0.36
0.37
0.38
0.39
0.43
0.48
0.52
0.55
0.58
-35
-110
-143
-149
-172
-179
173
161
152
134
115
96
79
65
49
33
HBFP-0450 Noise Parameters: VCE = 2 V, I C = 20 mA
Γopt
Freq.
Fmin
GHz
dB
Mag
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
0.97
1.07
1.10
1.22
1.3
1.34
1.47
1.6
1.87
2.12
2.37
0.33
0.37
0.38
0.45
0.49
0.50
0.55
0.59
0.64
0.68
0.73
S22
RN /50
Ga
Ang
—
dB
152
165
168
-178
-167
-164
-152
-142
-121
-102
-83
0.19
0.13
0.12
0.08
0.06
0.06
0.08
0.12
0.29
0.57
1.04
24.1
19.6
18.8
15.6
14.3
13.5
11.7
10.2
8.1
6.6
5.5
S and noise parameters are measured
on a microstrip line made on 0.025 inch
thick alumina carrier. The input
reference plane is at the end of the base
lead, the output reference plane is at the
end of the collector lead. S and noise
parameters include the effect of four
plated through via holes connecting
emitter landing pads on the top of test
carrier to the microstrip ground plane
on the bottom side of the carrier. Two
0.020 inch diameter via holes are placed
within 0.010 inch from each emitter lead
contact point, one via on each side of
that point.
100
Note: RN represents normalized noise resistance.
IPG
MSG/MAG
10
1
1.00E+08
1.00E+09
FREQUENCY
1.00E+10
Figure 14. HBFP-0450 Power Gain
at 2 V, 20 mA.
7
HBFP-0450 Typical Scattering Parameters,
VCE = 2 V, IC = 50 mA
S21
S11
Freq.
GHz
Mag
Ang
0.1
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
0.54
0.69
0.70
0.71
0.72
0.73
0.73
0.74
0.74
0.75
0.76
0.78
0.81
0.83
0.85
0.86
-74
-156
-178
179
165
158
154
144
134
116
99
81
63
48
33
19
S12
dB
Mag
Ang
dB
Mag
Ang
Mag
Ang
31.05
22.41
17.44
16.53
12.98
11.38
10.47
8.55
7.02
4.76
3.05
1.52
0.06
-1.24
-2.30
-3.24
35.689
13.198
7.450
6.707
4.456
3.705
3.337
2.675
2.245
1.730
1.421
1.191
1.007
0.867
0.767
0.689
147
97
81
78
66
59
55
45
36
17
-1
-20
-38
-54
-69
-85
-33.15
-26.56
-24.88
-24.44
-22.38
-21.41
-20.72
-19.25
-18.06
-16.08
-14.66
-13.72
-13.23
-12.92
-12.62
-12.40
0.022
0.047
0.057
0.060
0.076
0.085
0.092
0.109
0.125
0.157
0.185
0.206
0.218
0.226
0.234
0.240
63
36
37
38
38
37
36
32
28
16
2
-12
-27
-40
-54
-68
0.84
0.48
0.42
0.41
0.41
0.41
0.42
0.42
0.43
0.44
0.45
0.49
0.53
0.57
0.60
0.61
-45
-128
-159
-164
178
169
164
154
145
127
109
90
74
60
45
29
HBFP-0450 Noise Parameters: VCE = 2 V, I C = 50 mA
Γopt
Freq.
Fmin
GHz
dB
Mag
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
1.46
1.56
1.58
1.70
1.78
1.81
1.94
2.07
2.31
2.57
2.82
0.43
0.48
0.50
0.54
0.58
0.59
0.62
0.64
0.68
0.71
0.74
S22
RN /50
Ga
Ang
—
dB
-176
-170
-167
-160
-153
-151
-141
-133
-114
-96
-78
0.18
0.14
0.13
0.10
0.09
0.11
0.16
0.23
0.48
0.85
1.46
24.7
20.1
19.3
16.1
14.7
13.9
12.0
10.6
8.4
6.8
5.6
S and noise parameters are measured
on a microstrip line made on 0.025 inch
thick alumina carrier. The input
reference plane is at the end of the base
lead, the output reference plane is at the
end of the collector lead. S and noise
parameters include the effect of four
plated through via holes connecting
emitter landing pads on the top of test
carrier to the microstrip ground plane
on the bottom side of the carrier. Two
0.020 inch diameter via holes are placed
within 0.010 inch from each emitter lead
contact point, one via on each side of
that point.
100
Note: RN represents normalized noise resistance.
IPG
MSG/MAG
10
1
1.00E+08
1.00E+09
FREQUENCY
1.00E+10
Figure 15. HBFP-0450 Power Gain
at 2 V, 50 mA.
8
HBFP-0450 Typical Scattering Parameters,
VCE = 3 V, IC = 50 mA
S21
S11
Freq.
GHz
Mag
Ang
0.1
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
0.53
0.66
0.68
0.68
0.70
0.70
0.71
0.71
0.72
0.71
0.72
0.75
0.78
0.80
0.83
0.84
-66
-152
-176
-180
165
158
153
143
134
116
97
79
61
46
31
17
S12
dB
Mag
Ang
dB
Mag
Ang
Mag
Ang
31.15
23.12
18.27
17.36
13.77
12.15
11.23
9.30
7.77
5.50
3.80
2.28
0.84
-0.43
-1.47
-2.43
36.115
14.327
8.197
7.376
4.879
4.050
3.645
2.919
2.446
1.883
1.548
1.300
1.101
0.952
0.844
0.756
150
99
82
79
67
60
56
46
37
19
0
-19
-36
-52
-68
-83
-33.98
-26.74
-24.88
-24.44
-22.38
-21.31
-20.72
-19.25
-17.99
-15.92
-14.42
-13.47
-12.92
-12.51
-12.15
-11.90
0.020
0.046
0.057
0.060
0.076
0.086
0.092
0.109
0.126
0.160
0.190
0.212
0.226
0.237
0.247
0.254
64
39
39
39
40
39
38
34
30
18
4
-10
-25
-38
-52
-66
0.85
0.47
0.39
0.38
0.36
0.36
0.36
0.37
0.38
0.39
0.40
0.43
0.48
0.52
0.54
0.57
-39
-117
-147
-153
-174
176
171
160
150
133
114
96
79
65
51
35
HBFP-0450 Noise Parameters: VCE = 3 V, I C = 50 mA
Γopt
Freq.
Fmin
GHz
dB
Mag
0.5
0.9
1.8
2.0
2.5
3.0
4.0
5.0
6.0
1.32
1.44
1.70
1.76
1.90
2.03
2.33
2.61
2.89
0.43
0.48
0.61
0.60
0.61
0.64
0.66
0.69
0.73
S22
RN /50
Ga
Ang
—
dB
180
-172
-151
-149
-139
-130
-112
-93
-75
0.13
0.10
0.09
0.11
0.17
0.24
0.50
0.88
1.49
25.8
20.9
15.3
14.4
12.5
11.0
8.6
7.0
5.8
S and noise parameters are measured
on a microstrip line made on 0.025 inch
thick alumina carrier. The input
reference plane is at the end of the base
lead, the output reference plane is at the
end of the collector lead. S and noise
parameters include the effect of four
plated through via holes connecting
emitter landing pads on the top of test
carrier to the microstrip ground plane
on the bottom side of the carrier. Two
0.020 inch diameter via holes are placed
within 0.010 inch from each emitter lead
contact point, one via on each side of
that point.
Note: RN represents normalized noise resistance.
100
IPG
MSG/MAG
10
1
1.00E+08
1.00E+09
FREQUENCY
1.00E+10
Figure 16. HBFP-0450 Power Gain
at 3 V, 50 mA.
9
HBFP-0450 Typical Scattering Parameters,
VCE = 3 V, IC = 80 mA
S21
S11
Freq.
GHz
Mag
Ang
0.1
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
7.0
8.0
9.0
10.0
0.44
0.63
0.65
0.65
0.68
0.68
0.71
0.72
0.72
0.72
0.72
0.75
0.78
0.80
0.83
0.84
-72
-155
-174
-177
171
166
152
142
133
115
97
78
61
45
31
16
S12
dB
Mag
Ang
dB
Mag
Ang
Mag
Ang
31.13
23.14
18.52
17.68
14.06
12.34
11.19
9.26
7.73
5.47
3.77
2.25
0.80
-0.45
-1.48
-2.45
36.031
14.355
8.429
7.659
5.045
4.139
3.628
2.905
2.436
1.877
1.543
1.295
1.097
0.949
0.843
0.754
150
100
84
81
69
64
56
46
37
19
0
-18
-36
-52
-67
-83
-34.42
-27.33
-24.88
-24.29
-22.16
-21.11
-20.63
-19.17
-17.92
-15.81
-14.33
-13.39
-12.84
-12.43
-12.08
-11.87
0.019
0.043
0.057
0.061
0.078
0.088
0.093
0.11
0.127
0.162
0.192
0.214
0.228
0.239
0.249
0.255
65
42
43
44
44
44
39
35
31
19
5
-10
-25
-38
-52
-66
0.84
0.46
0.40
0.39
0.36
0.36
0.38
0.39
0.39
0.40
0.42
0.44
0.49
0.53
0.55
0.58
-39
-116
-144
-150
-178
175
169
158
149
131
113
95
78
64
50
34
HBFP-0450 Noise Parameters: VCE = 3 V, I C = 80 mA
Γopt
Freq.
Fmin
GHz
dB
Mag
0.5
0.9
1.0
1.5
1.8
2.0
2.5
3.0
4.0
5.0
6.0
1.61
1.73
1.76
1.91
1.99
2.06
2.20
2.36
2.65
2.90
3.20
0.58
0.63
0.66
0.70
0.72
0.73
0.74
0.74
0.76
0.77
0.78
S22
RN /50
Ga
Ang
—
dB
-177
-172
-168
-162
-158
-154
-147
-136
-117
-94
-70
0.08
0.07
0.07
0.10
0.09
0.14
0.24
0.34
0.66
1.12
1.89
25.3
20.7
19.9
16.7
15.5
14.4
12.5
11.1
9.1
7.6
6.4
Note: RN represents normalized noise resistance.
S and noise parameters are measured
on a microstrip line made on 0.025 inch
thick alumina carrier. The input
reference plane is at the end of the base
lead, the output reference plane is at the
end of the collector lead. S and noise
parameters include the effect of four
plated through via holes connecting
emitter landing pads on the top of test
carrier to the microstrip ground plane
on the bottom side of the carrier. Two
0.020 inch diameter via holes are placed
within 0.010 inch from each emitter lead
contact point, one via on each side of
that point.
100
IPG
MSG/MAG
10
1
1.00E+08
1.00E+09
FREQUENCY
1.00E+10
Figure 17. HBFP-0450 Power Gain
at 3 V, 80 mA.
10
HBFP-0450 Die Model and SPICE Parameters
C
XX
RCX
R
CMP12
DIODEMODELFORM
R = .4 OH
# DIODE MODEL #
CCOX
C
RS=1.58036628E2
MODEL = DCS
C = .24E-12 F
CMP2
DIODE
AREA=
REGION=
MODEL = DBC
TEMP=
AREA=
REGION=
MODEL=DCS
TEMP=
XX
B
CMP3
DIODE
CMP1
NPNBJTSUBST
RBX
R
CJO=4.6442578E-13
ISR=
NR=
TT=
IKF=
EG=
NBV=
VJ=0.6
IBVL=
M=0.42
NBVL=
N=
FFE=
FC=0.8
IS=IE-24
BV=
IBV=
IMAX=
XTI=
TNOM=21
KF=
AF=
R=2.099499E-1 OH
C =6.227E-14 F
CEOX
C
CMP16
DIODE
TEMP=
MODEL=DBE
REGION=
AREA=
RE
R
AREA=10
REGION=
MODEL=BJTMODEL
MODEL = DBC
RS=
R=1.4 OH
R=1 OH
XX
E
bjt
BITMODELFORM
# DIODE MODEL #
CJO=2.393E-13
IS=I.40507E-16
R=1.565E-1 OH
RBAL
R
CMP10
DIODEMODELFORM
RSE
R
CJC=1.87E-14
ISE=5E-19
MODEL = BJTMODEL
NPN=yes
IS=3.01E-17
PNP=
CJE=9.48E-14
Diode and junction
Parasitics
Forward
Reverse
Noise
EG=1.17
RB=9.30144818E-1
BF=1E6
BR=1
VJC=.6775 IRB=3.029562E-5 AF=
IKF=1.4737E-1 IKR=1.1E-1
IMAX=
MJC=0.3319 RBM=.01
ISC=
KB=
XTI=3 XCJC=4.39790997E-1 RE=
NE=1.006
NC=2
AB=
RC=
FC=0.8
VAF=4.4E1
VAR=30.37 TNOM=21
FB=
NF=1
NR=1.005
KF=
TF=5.3706E-12 TR=4E-9
VJE=0.9907
XTF=20
Substrate
MJE=0.5063
VTF=0.8
ISS=
ITF=2.21805486E0
NS=
CJS=
PTF=0
VJS=
XTB=0.7
MJS=
APPROXOB=yes
BV=
IBV=
IMAX=
XTI=
TNOM=21
KF=
AF=
TT=
EG=
VJ=0.729
M=0.44
N=1
FC=0.8
ISR=
NR=
IKF=
NBV=
IBVL=
NBVL=
FFE=
CMP11
DIODEMODELFORM
# DIODE MODEL #
IS=IE-24
MODEL = DBE
# BJT MODEL #
BV=
IBV=
IMAX=
XTI=
TNOM=21
KF=
AF=
CJO=2.59257503E-13
RS=
ISR=
NR=
TT=
IKF=
EG=
NBV=
VJ=0.8971
IBVL=
M=2.292E-1
NBVL=
N=1.0029
FFE=
FC=0.8
This model can be used as a design tool. It has been tested on MDS for various specifications. However, for more
precise and accurate design, please refer to the measured data in this data sheet. For future improvements
Hewlett-Packard reserves the right to change these models without prior notice.
11
SOT343 Package Equivalent Circuit
C = 0.05 pF
CCBC
C
LLB
L
LT1
L
LLI
L
L = .22 nH
L = 0.2 nH
L = 0.7 nH
IN
C = 0.80 pF
C2T1
C C = 0.05 pF
AGROUND
C1T1
C
AGROUND
BASE
COLLECTOR
EMITTER
CMP44
L
LT3
L
LL3
L
L = 0.7 nH
L = 0.5 nH
L = 0.2 nH
C1T3
C
CCEB
C
LL2
L
L = 0.2 nH
C = 0.01 pF
AGROUND
C = 0.1 pF
AGROUND
C1T2
C
LT2
L
C = 0.04 pF
AGROUND
C2T2
C
L = 0.15 nH
LLE
L
AGROUND
C = 0.144 pF
CCEC
C
C = 0.04 pF
L = 0.1 nH
C2T3
C
C = 0.1 pF
AGROUND
OUT
12
Part Number Ordering Information
Part Number
Devices per Reel
Container
Tape Orientation
100
3000
10,000
3000
antistatic bag
7" Reel
13" Reel
7" Reel
none
standard
standard
reverse
HBFP-0450-BLK
HBFP-0450-TR1
HBFP-0450-TR2
HBFP-0450-TR3
Package Dimensions
Outline 43, SOT-343 (SC-70 4 Lead)
1.30 (0.051)
BSC
1.30 (.051) REF
2.60 (.102)
E
1.30 (.051)
E1
0.85 (.033)
0.55 (.021) TYP
1.15 (.045) BSC
e
1.15 (.045) REF
D
h
A
b TYP
A1
L
θ
DIMENSIONS
SYMBOL
A
A1
b
C
D
E
e
h
E1
L
θ
MAX.
MIN.
1.00 (0.039)
0.80 (0.031)
0.10 (0.004)
0 (0)
0.35 (0.014)
0.25 (0.010)
0.20 (0.008)
0.10 (0.004)
2.10 (0.083)
1.90 (0.075)
2.20 (0.087)
2.00 (0.079)
0.65 (0.025)
0.55 (0.022)
0.450 TYP (0.018)
1.35 (0.053)
1.15 (0.045)
0.35 (0.014)
0.10 (0.004)
10
0
DIMENSIONS ARE IN MILLIMETERS (INCHES)
C TYP
13
Device Orientation
TR1, TR2 TOP VIEW
4 mm
REEL
8 mm
08x
08x
END VIEW
08x
08x
CARRIER
TAPE
USER
FEED
DIRECTION
TR3 TOP VIEW
4 mm
END VIEW
COVER TAPE
08x
08x
08x
8 mm
08x
Tape Dimensions
For Outline 4T
P
P2
D
P0
E
F
W
D1
t1 (CARRIER TAPE THICKNESS)
K0
8° MAX.
A0
DESCRIPTION
5° MAX.
B0
SYMBOL
SIZE (mm)
SIZE (INCHES)
CAVITY
LENGTH
WIDTH
DEPTH
PITCH
BOTTOM HOLE DIAMETER
A0
B0
K0
P
D1
2.40 ± 0.10
2.40 ± 0.10
1.20 ± 0.10
4.00 ± 0.10
1.00 + 0.25
0.094 ± 0.004
0.094 ± 0.004
0.047 ± 0.004
0.157 ± 0.004
0.039 + 0.010
PERFORATION
DIAMETER
PITCH
POSITION
D
P0
E
1.55 ± 0.05
4.00 ± 0.10
1.75 ± 0.10
0.061 ± 0.002
0.157 ± 0.004
0.069 ± 0.004
CARRIER TAPE
WIDTH
THICKNESS
W
t1
8.00 ± 0.30
0.259 ± 0.013
0.315 ± 0.012
0.010 ± 0.0005
DISTANCE
CAVITY TO PERFORATION
(WIDTH DIRECTION)
F
3.50 ± 0.05
0.138 ± 0.002
CAVITY TO PERFORATION
(LENGTH DIRECTION)
P2
2.00 ± 0.05
0.079 ± 0.002
www.semiconductor.agilent.com
Data subject to change.
Copyright © 2000 Agilent Technologies, Inc.
Obsoletes 5968-5434E
5988-0133EN (9/00)