REVISIONS LTR A DESCRIPTION DATE (YR-MO-DA) APPROVED 96-01-10 K. A. Cottongim Add device type 03. Rewrite entire document REV SHEET REV SHEET REV STATUS OF SHEETS PMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REV A A A A A A A A A A A A A A SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 14 PREPARED BY Gary Zahn DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 CHECKED BY Michael C. Jones APPROVED BY Kendall A. Cottongim MICROCIRCUIT, HYBRID, DIGITAL-LINEAR, 14-BIT, SAMPLING ANALOG TO DIGITAL CONVERTER DRAWING APPROVAL DATE 95-06-06 SIZE REVISION LEVEL A A SHEET DESC FORM 193 JUL 94 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. CAGE CODE 5962-93198 67268 1 OF 14 5962-E269-96 1. SCOPE 1.1 Scope. This drawing documents two product assurance classes, high reliability (device class H) and space application (device class K) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN. 1.2 PIN. The PIN shall be as shown in the following example: 5962 - Federal stock class designator RHA designator (see 1.2.1) 93198 \ 01 H Device type (see 1.2.2) / X A Device class designator (see 1.2.3) Case outline (see 1.2.4) Lead finish (see 1.2.5) \/ Drawing number 1.2.1 Radiation hardness assurance (RHA) designator. Device classes H and K RHA marked devices shall meet the MIL-H-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) shall identify the circuit function as follows: Device type 01 02 03 Generic number Circuit function ADS-944 ADS-30189 ADS-30214 14-bit, 5 MHz sampling, A/D converter 14-bit, 5 MHz sampling, A/D converter 14-bit, 5 MHz sampling, A/D converter 1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as follows: Device class H or K Device performance requirements documentation Certification and qualification to MIL-PRF-38534 1.2.4 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows: Outline letter X Descriptive designator Terminals See figure 1 Package style 32 Dual-in-line 1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534 for classes H and K. 1.3 Absolute maximum ratings. 1/ Positive supply voltage range (+VCC) . . . . . . . . . . . . . . . . . . . . . . . Negative supply voltage range (-VEE) . . . . . . . . . . . . . . . . . . . . . . . Positive analog and digital supply voltage range (+VDD) . . . . . . . . . Negative analog and digital supply voltage range (-VDD) . . . . . . . . Digital inputs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Analog input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Lead temperature (soldering, 10 seconds) . . . . . . . . . . . . . . . . . . . Power dissipation (PD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Junction temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Thermal impedence: Junction-to-case (JC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Junction-to-ambient (JA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Storage temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1/ 0 V to +16 V dc 0 V to -16 V dc 0 V to +6 V dc 0 V to -6 V dc -0.3 V dc to +VDD + 0.3 V dc -5 V dc to +5 V dc +300(C 3.3 W +175(C 7(C/W 28(C/W -65(C to +150(C Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 2 1.4 Recommended operating conditions. Positive supply voltage range (+VCC) . . . . . . . . . . . . . . . . . . . . . . . Negative supply voltage range (-VEE) . . . . . . . . . . . . . . . . . . . . . . . Positive analog and digital supply voltage range (+VDD) . . . . . . . . . Negative analog and digital supply voltage range (-VDD) . . . . . . . . Ambient operating temperature range (TA) . . . . . . . . . . . . . . . . . . . +14.25 V dc to +15.75 V dc -14.25 V dc to -15.75 V dc +4.75 V dc to +5.25 V dc 1/ -4.95 V to -5.45 V dc 2/ -55(C to +125(C 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbook. The following specification, standards, and handbook form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solitation. SPECIFICATION DEPARTMENT OF DEFENSE MIL-PRF-38534 - Hybrid Microcircuits, General Specification for. DEPARTMENT OF DEFENSE MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration Management. MIL-STD-1835 - Microcircuit Case Outlines. HANDBOOK DEPARTMENT OF DEFENSE MIL-HDBK-780 - Standardized Military Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbook are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item performance requirements for device classes H and K shall be in accordance with MIL-PRF-38534 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38534 and herein. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2. 1/ 2/ +4.9 V dc minimum at TA = -55(C -5.1 V dc minimum at TA = -55(C SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 3 3.2.3 Output coding table. The output coding table shall be as specified on figure 3. 3.2.4 Timing diagram. The timing diagram shall be as specified on figure 4. 3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as specified in table I and shall apply over the full specified operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table I. 3.5 Marking of Device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked as listed in QML-38534. 3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be made available to the preparing activity (DESC-EL) upon request. 3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this drawing. The certificate of compliance (original copy) submitted to DESC-EL shall affirm that the manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein. 3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of microcircuits delivered to this drawing. 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. . 4.2 Screening. Screening shall be in accordance with MIL-PRF-38534, and shall be conducted on all devices prior to conformance and periodic inspections. The following additional criteria shall apply: a. b. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DESC-EC or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1015 of MIL-STD-883. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests prior to burn-in are optional at the discretion of the manufacturer. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 4 TABLE I. Electrical performance characteristics. Test Power supply currents Power supply rejection ratios Symbol +ICC -IEE +IDD -IDD ±PSRR Conditions 1/ -55(C TC +125(C unless otherwise specified +VCC = +15.0 V dc -VEE = -15.0 V dc +VDD = +5.0 V dc -VDD = -5.2 V dc For each +VCC, -VEE, and ±VDD VIN RIN VIH VIL IIL IIH Device Group A subgroups type Limits Unit mA %FSR/%V All All Min 1,2,3 4 All All 500 ±1.25 V 6 +2.0 +0.8 +20 -20 1,2,3 4,5,6 Max +45 -65 +168 -175 ±0.05 ANALOG INPUT Input voltage range Input resistance 2/ DIGITAL INPUTS 2/ Logic "0" Logic "1" Logic loading "1" Logic loading "0" 3/ 1,2,3 1,2,3 1,2,3 1,2,3 All All All All V V µA µA See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55(C TC +125(C unless otherwise specified Group A subgroups Device type Min Max Unit VOH VOL IOL IOH +2.4 +0.4 +4 -4 f = 10 kHz f = 10 kHz, TC = -55(C, 4/ ±VDD = -4.95 V dc and +4.80 V dc 4,5,6 4 5,6 6 4 5,6 4 5,6 4 5,6 Limits DIGITAL OUTPUTS 2/ Logic "1" Logic "0" Logic loading "0" Logic loading "1" 1,2,3 1,2,3 1,2,3 1,2,3 All All All All V V mA mA STATIC PERFORMANCE Resolution 2/ Differential nonlinearity Full scale absolute accuracy Bipolar Offset error Gain error RES DNL BPOE A E All All 03 All All All 14 -0.95 -0.95 -0.99 +1.20 +1.50 +1.50 ±0.4 ±0.8 ±0.4 ±0.9 ±0.4 ±1.5 Bits LSB %FSR %FSR %FSR See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Symbol Conditions 1/ -55(C TC +125(C unless otherwise specified Group A subgroups Device type Min 4 5,6 4 5,6 4 5,6 4 5,6 4,5,6 Max Unit dB dB dB dB dB Limits DYNAMIC PERFORMANCE Peak harmonics (-0.5 dB) Total harmonic distortion (-0.5 dB) Signal to noise ratio (-0.5 dB, without distortion) Signal to noise ratio (-0.5 dB, with distortion) Signal to noise ratio (DC to 100 kHz) 1/ 2/ 3/ 4/ SNR 1 MHz to 1 MHz to 1 MHz to 1 MHz to 98 kHz 2.5 MHz 2.5 MHz 2.5 MHz 2.5 MHz All All 01,03 All 02 73 71 68 62 75 -70 -61 -68 -60 +VCC = +14.25 V dc to +15.75 V dc, -VCC = -14.25 V dc to -15.75 V dc, +VDD = +4.9 V dc to +5.25 V dc, and -VDD = -5.1 V dc to -5.45 V dc. Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested. When Comp. bits (pin 8) is low, logic loading "0" will be -350 µA for this pin. These test conditions are additional for device type 03 only. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 7 Case outline X FIGURE 1. Case outline. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 8 Case outline X - Continued. Symbol A A1 b b2 c D e E eA L Q S1 Millimeters Min 0.41 0.89 0.23 42.93 Max 5.97 5.72 0.53 1.14 0.38 43.69 2.54 BSC 27.43 22.61 4.45 0.38 2.29 28.19 23.37 5.08 0.89 2.79 Inches Min 0.016 0.035 0.009 1.69 Max 0.235 0.225 0.021 0.045 0.015 1.72 0.100 BSC 1.08 0.89 0.175 0.015 0.09 1.11 0.92 0.200 0.035 0.11 NOTE: 1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units shall rule. FIGURE 1. Case outline(s) - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 9 Device types Case outline Terminal number 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 All X Terminal symbol +5 V analog supply -5.2 V digital supply Analog input Analog ground Offset adjust Analog ground Gain adjust Comp. bits Output enable +5 V digital supply Analog Ground +15 V supply -15 V supply -5.2 V analog supply Digital ground EOC Bit 14 (LSB) Bit 13 Bit 12 Bit 11 Bit 10 Bit 9 Bit 8 Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 (MSB) Bit 1 (MSB) Start convert FIGURE 2. Terminal connections. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 10 Output coding MSB LSB 11 1111 1111 1111 11 1000 0000 0000 11 0000 0000 0000 10 0000 0000 0000 01 0000 0000 0000 00 1000 0000 0000 00 0000 0000 0001 00 0000 0000 0000 Offset binary MSB LSB 00 0000 0000 0000 00 0111 1111 1111 00 1111 1111 1111 01 1111 1111 1111 10 1111 1111 1111 11 0111 1111 1111 11 1111 1111 1110 11 1111 1111 1111 Comp. offset binary MSB LSB 01 1111 1111 1111 01 1000 0000 0000 01 0000 0000 0000 00 0000 0000 0000 11 0000 0000 0000 10 1000 0000 0000 10 0000 0000 0001 10 0000 0000 0000 Two's comp. Input range ±1.25 V +1.249847 V +0.937500 V +0.625000 V +0.000000 V -0.625000 V -0.937500 V -1.249847 V -1.250000 V Bipolar scale +FS -1 LSB +3/4 FS +1/2 FS 0 -1/2 FS -3/4 FS -FS +1 LSB -FS FIGURE 3. Output coding. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 11 NOTES: 1/ START CONVERT pulse width: 40 to 80 ns or 130 to 160 ns. 2/ Scale division is 10 ns/division. FIGURE 4. Timing diagram. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 12 TABLE II. Electrical test requirements. MIL-PRF-38534 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group C end-point electrical parameters MIL-STD-883, group E end-point electrical parameters for RHA devices Subgroups (in accordance with MIL-PRF-38534, group A test table) 1*,2,3,4,5,6 1,2,3,4,5,6 1,4 Subgroups ** (in accordance with method 5005, group A test table) * PDA applies to subgroup 1. ** When applicable to this standard microcircuitdrawing, the subgroups shall be defined. 4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance with MIL-PRF-38534 and as specified herein. 4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 shall be omitted. 4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534. 4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. Steady-state life test, method 1005 of MIL-STD-883. (1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to either DESC-EC or the acquiring activity upon request. Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. (2) TA as specified in accordance with table I of method 1005 of MIL-STD-883. (3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. 4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 13 4.3.5 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). RHA levels for device classes H and K shall be M, D, R, and H. RHA quality conformance inspection sample tests shall be performed at the RHA level specified in the acquisition document. a. RHA tests for device classes H and K for levels M, D, R, and H shall be performed through each level to determine at what levels the devices meet the RHA requirements. These RHA tests shall be performed for initial qualification and after design or process changes which may affect the RHA performance of the device. b. End-point electrical parameters shall be as specified in table II herein. c. Prior to total dose irradiation, each selected sample shall be assembled in its qualified package. It shall pass the specified group A electrical parameters in table I for subgroups specified in table II herein. d. For device classes H and K, the devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38534 for RHA level being tested, and meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25(C ±5 percent, after exposure. e. Prior to and during total dose irradiation testing, the devices shall be biased to establish a worst case condition as specified in the radiation exposure circuit. f. For device classes H and K, subgroups 1 and 2 in table V, method 5005 of MIL-STD-883 shall be tested as appropriate for device construction. g. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.4 Record of users. Military and industrial users shall inform Defense Electronics Supply Center when a system application requires configuration control and the applicable SMD. DESC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DESC-EC, telephone (513) 296-6047. 6.5 Comments. Comments on this drawing should be directed to DESC-EC, Dayton, Ohio 45444, or telephone (513) 296-5373. 6.6 Sources of supply for device classes H and K. Sources of supply for device classes H and K are listed in QML-38534. The vendors listed in QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DESC-EC and have agreed to this drawing. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE ELECTRONICS SUPPLY CENTER DAYTON, OHIO 45444 DESC FORM 193A JUL 94 5962-93198 A REVISION LEVEL A SHEET 14 STANDARD MICROCIRCUIT DRAWING SOURCE APPROVAL BULLETIN DATE: 96-01-10 Approved sources of supply for SMD 5962-93198 are listed below for immediate acquisition only and shall be added to QML-38534 during the next revision. QML-38534 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DESC-EC. This bulletin is superseded by the next dated revision of QML-38534. Standard microcircuit drawing PIN 1/ 5962-9319801HXA 5962-9319801HXC 5962-9319802HXA 5962-9319802HXC 5962-9319803HXA 5962-9319803HXC Vendor CAGE number 50721 50721 50721 50721 50721 50721 Vendor similar PIN 2/ ADS-944/883B ADS-944/883B ADS-30189 ADS-30189 ADS-30214 ADS-30214 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. The device manufacturers listed herein are authorized to supply alternate lead finishes "A", "B", or "C" at their discretion. Contact the listed approved source of supply for further information. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number 50721 Vendor name and address Datel Incorporated 11 Cabot Boulevard Maysfield MA 02048-1194 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in this information bulletin.