microcircuit, hybrid, digital, high voltage drivers

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Changed to reflect MIL-H-38534 processing. Editorial changes
throughout.
92-03-23
K. A. Cottongim
B
Changed in accordance with NOR 5962-R111-95.
95-04-11
K. A. Cottongim
C
Add vendor CAGE codes 31757 and 51651. Changes to table I.
98-03-05
K. A. Cottongim
D
Changes to table I, conditions column for device type 02. Add case
outline Y.
99-02-19
K. A. Cottongim
E
Updated drawing to the latest requirements. -sld
05-04-04
Raymond Monnin
THE ORIGINAL FIRST PAGE OF THIS DRAWING HAS BEEN REPLACED.
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PMIC N/A
PREPARED BY
Charles E. Besore
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
CHECKED BY
D. A. DiCenzo
http://www.dscc.dla.mil/
APPROVED BY
Robert P. Evans
DRAWING APPROVAL DATE
87-11-10
REVISION LEVEL
E
MICROCIRCUIT, HYBRID, DIGITAL, HIGH
VOLTAGE DRIVERS
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
1 OF
5962-87617
11
5962-E284-05
1. SCOPE
1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to processed in accordance with MILPRF-38534.
1.2 PIN. The PIN shall be as shown in the following example:
5962-87617
⎪
⎜
Drawing number
01
⎪
⎪
Device type
(see 1.2.1)
X
⎪
⎪
Case outline
(see 1.2.2)
A
⎪
⎪
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) identify the circuit function as follows:
Device type
Generic number
01
02
0006, 51992, 11105, 11563
0008
Circuit function
1.5 amperes, high voltage driver
3.0 amperes, high voltage, high current driver
1.2.2 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
X
Y
Descriptive designator
Terminals
See figure 1
See figure 1
10
10
Package style
Can (with standoff)
Can (without standoff)
1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/ 2/
Peak power supply voltage (VP), for less than 0.1 s...................
Continuous supply voltage (VS)..................................................
Input voltage (VIN) ......................................................................
Input extender current (IX)..........................................................
Peak output current (IOUT), 50 ms on, 1 s off:
Device type 01 .........................................................................
Device type 02 .........................................................................
Continuous output current (IOUTC ):
Device type 01 .........................................................................
Device type 02 .........................................................................
Thermal resistance, junction-to-case (θJC) .................................
Power dissipation (PD), TA = +25°C:
Device type 01 .........................................................................
Device type 02 .........................................................................
Junction temperature (TJ ) .........................................................
Storage temperature range........................................................
Lead temperature (soldering, 10 seconds).................................
+60 V dc
+45 V dc
+5.5 V dc
5.0 mA
1.5 A
3.0 A
0.4 A
0.5 A
(See MIL-STD-1835)
750 mW 3/
950 mW 3/
+175°C
-65°C to +150°C
+300°C
1.4 Recommended operating conditions.
Ambient operating temperature range (TA) .................................
-55°C to +125°C
1/ Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ Unless otherwise specified, all voltages are referenced to ground.
3/ Derate at 210°C/W above TA = +25°C.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
2
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from
the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of
this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device class H shall be in accordance with MILPRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the device
manufacturer's Quality Management (QM) plan or as designated for applicable device class. Therefore, the tests and
inspections herein may not be performed for applicable device class (see MIL-PRF-38534). Futhermore, the manufacturers may
take exceptions or use alternate methods to the tests and inspections herein and not perform them. However, the performance
requirements as defined in MIL-PRF-38534 shall be met for the applicable device class. The modification in the QM plan shall
not affect the form, fit, or function as described herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in
MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.2.3 Switching time waveform(s). The switching time waveform(s) shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
3
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
Group A
subgroups
Conditions
-55°C ≤ TA ≤+125°C
unless otherwise specified
Logic "1" input voltage 1/
VIH
Logic "0" input voltage 1/
VIL
Logic "1" output voltage
VOH
Min
10 V ≤ VCC ≤ 45 V
1,2,3
01,02
VCC = 10 V, VIN = 2 V, 1/
IOUT = 150 mA
1, 2, 3
VCC = 45 V, VIN = 2 V,
IOUT = 1.6 A
Logic "1" input current 1/
IIH
2.0
01
IIL
Input breakdown voltage 1/
BVIN
"Off" power supply current
ICC(off)
1, 2, 3
02
1/
ICC(on)
V
26.5
43.0
VCC = 45 V, VIN = 0.8 V,
RL = 100 Ω
1, 2, 3
VCC = 45 V, VIN = 2.4 V
1,2,3
01
10
02
100
01,02
5.0
mV
µA
100
VCC = 45 V, VIN = 0.4 V
VCC = 45 V, VIN = 0.8 V
1, 2, 3
01,02
-1.0
mA
1,2,3
01,02
5.5
V
1,2,3
01
2.0
02
2.0
01,02
8.0
VCC = 45 V, VIN = 0 V
"On" power supply current
V
8.8
VCC = 45 V, VIN = 5.5 V
Logic "0" input current 1/
Max
26.5
VCC = 28 V, VIN = 2 V,
RL = 39 Ω
VOL
Unit
0.8
VCC = 28 V, VIN = 2 V,
RL = 82 Ω
Logic "0" output voltage
Limits
Device
type
VCC = 45 V, VIN = 2 V,
IOUT = 0 mA
1, 2, 3
mA
mA
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
5
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Group A
subgroups
Conditions
-55°C ≤ TA ≤+125°C
unless otherwise specified
tr
Rise time 2/
Min
VCC = 28 V, VIN = 5 V,
RL = 82 Ω, see figure 3
9, 10, 11
VCC = 28 V, VIN = 5 V,
RL = 39 Ω, see figure 3
Fall time 2/
tf
Turn on time 2/
tON
tOFF
Unit
Max
01
300
02
500
VCC = 28 V, VIN = 5 V,
RL = 82 Ω, see figure 3
9, 10, 11
01
1.7
VCC = 28 V, VIN = 5 V,
RL = 39 Ω, see figure 3
9,11
02
4.0
VCC = 28 V, VIN = 5 V,
RL = 82 Ω, see figure 3
9, 10, 11
10
ns
µs
6.0
VCC = 28 V, VIN = 5 V,
RL = 39 Ω, see figure 3
Turn off time 2/
Limits
Device
type
01
1.0
02
1.0
VCC = 28 V, VIN = 5 V,
RL = 82 Ω, see figure 3
9, 10, 11
01
8.0
VCC = 28 V, VIN = 5 V,
RL = 39 Ω, see figure 3
9,11
02
10
10
µs
µs
14
1/ Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested.
2/ Subgroups 10 and 11 shall be tested as part of device initial characterization and after design and process changes.
Parameter shall be guaranteed to the limits specified in table I for all lots not specifically tested.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
6
Case outline X.
Symbol
A
∅b
∅D
∅D1
∅D2
∅e
F
k
k1
L
Q
Millimeters
Min
Max
3.94
4.70
0.38
0.48
8.51
9.40
7.75
8.51
3.05
4.06
5.84 BSC
1.02
0.66
0.86
0.74
1.14
12.70
1.27
Inches
Min
Max
.155
.185
.015
.019
.335
.370
.305
.335
.120
.160
.230 BSC
.040
.026
.034
.029
.045
.500
.050
NOTES:
1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units
shall rule.
2. Pin numbers shown for reference only.
FIGURE 1. Case outline(s).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
7
Case outline Y.
Symbol
A
∅b
∅D
∅D1
∅e
F
k
k1
L
Millimeters
Min
Max
3.94
4.70
0.38
0.48
8.51
9.40
7.75
8.51
5.84 BSC
1.02
0.66
0.86
0.74
1.14
12.70
Inches
Min
Max
.155
.185
.015
.019
.335
.370
.305
.335
.230 BSC
.040
.026
.034
.029
.045
.500
NOTES:
1. The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound units
shall rule.
2. Pin numbers shown for reference only.
FIGURE 1. Case outline(s) - Continued.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
8
FIGURE 2. Terminal connections and functional diagram (top view).
FIGURE 3. Switching time waveforms.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
9
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
1
Final electrical parameters
1*, 2, 3, 9
Group A test requirements
1, 2, 3, 9, 10, 11
Group C end-point electrical
parameters
1, 2, 3
End-point electrical parameters
for Radiation Hardness Assurance
(RHA) devices
Not applicable
* PDA applies to subgroup 1.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
b.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in method 1015 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 4, 5, 6, 7, and 8 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
10
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified
in method 1005 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1005 of MIL-STD-883.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated as specified in MIL-PRF38534.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used
for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614)
692-1081.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK-103
and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-87617
A
REVISION LEVEL
E
SHEET
11
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 05-04-04
Approved sources of supply for SMD 5962-87617 are listed below for immediate acquisition information only and shall
be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This information bulletin is superseded
by the next dated revisions of MIL-HDBK-103 and QML-38534. DSCC maintains an online database of all current
sources of supply at http://www.dscc.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-8761701XA
5962-8761701XA
5962-8761701XA
5962-8761701XA
5962-8761701XC
5962-8761701XC
5962-8761701XC
5962-8761701XC
31757
51651
3/
U4388
31757
51651
3/
U4388
51992
MSK 0006H
11105-DESC
11563-DESC
51992
MSK 0006H
11105-DESC
11563-DESC
5962-8761701YA
5962-8761701YC
U4388
U4388
11105-DESC
11105-DESC
5962-8761702XA
5962-8761702XC
51651
51651
MSK 0008H
MSK 0008H
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the Vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
3/ Not available from a QML source.
Vendor CAGE
number
Vendor name
and address
31757
Micropac Industries, Inc.
Optoelectronic Division
905 East Walnut Street
Garland, TX 75040-6611
51651
M. S. Kennedy Corporation
4707 Dey Road
Liverpool, NY 13088
U4388
C-Mac Microelectronics, Ltd.
South Denes
Great Yarmouth
Norfolk NR30 3PX
England
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.