SCAN15MB200 Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6 General Description Features The SCAN15MB200 is a dual-port 2 to 1 multiplexer and 1 to 2 repeater/buffer. High-speed data paths and flow-through pinout minimize internal device jitter and simplify board layout, while pre-emphasis overcomes ISI jitter effects from lossy backplanes and cables. The differential inputs and outputs interface to LVDS or Bus LVDS signals such as those on National’s 10-, 16-, and 18- bit Bus LVDS SerDes, or to CML or LVPECL signals. Integrated IEEE 1149.1 (JTAG) and 1149.6 circuitry supports testability of both single-ended LVTTL/CMOS and highspeed differential PCB interconnects. The 3.3V supply, CMOS process, and robust I/O ensure high performance at low power over the entire industrial -40 to +85˚C temperature range. n 1.5 Gbps data rate per channel n Configurable off/on pre-emphasis drives lossy backplanes and cables n LVDS/BLVDS/CML/LVPECL compatible inputs, LVDS compatible outputs n Low output skew and jitter n On-chip 100Ω input and output termination n IEEE 1149.1 and 1149.6 compliant n 15 kV ESD protection on LVDS inputs/outputs n Hot plug Protection n Single 3.3V supply n Industrial -40 to +85˚C temperature range n 48-pin LLP Package Typical Application 20132810 Block Diagram 20132801 FIGURE 1. SCAN15MB200 Block Diagram © 2006 National Semiconductor Corporation DS201328 www.national.com SCAN15MB200 Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6 May 2006 SCAN15MB200 Pin Descriptions Pin Name LLP Pin Number I/O, Type Description SWITCH SIDE DIFFERENTIAL INPUTS SIA_0+ SIA_0− 30 29 I, LVDS Switch A-side Channel 0 inverting and non-inverting differential inputs. LVDS, Bus LVDS, CML, or LVPECL compatible. SIA_1+ SIA_1− 19 20 I, LVDS Switch A-side Channel 1 inverting and non-inverting differential inputs. LVDS, Bus LVDS, CML, or LVPECL compatible. SIB_0+ SIB_0− 28 27 I, LVDS Switch B-side Channel 0 inverting and non-inverting differential inputs. LVDS, Bus LVDS, CML, or LVPECL compatible. SIB_1+ SIB_1− 21 22 I, LVDS Switch B-side Channel 1 inverting and non-inverting differential inputs. LVDS, Bus LVDS, CML, or LVPECL compatible. LINE SIDE DIFFERENTIAL INPUTS LI_0+ LI_0− 40 39 I, LVDS Line-side Channel 0 inverting and non-inverting differential inputs. LVDS, Bus LVDS, CML, or LVPECL compatible. LI_1+ LI_1− 9 10 I, LVDS Line-side Channel 1 inverting and non-inverting differential inputs. LVDS, Bus LVDS, CML, or LVPECL compatible. SWITCH SIDE DIFFERENTIAL OUTPUTS SOA_0+ SOA_0− 34 33 O, LVDS Switch A-side Channel 0 inverting and non-inverting differential outputs. LVDS compatible (Notes 1, 3). SOA_1+ SOA_1− 15 16 O, LVDS Switch A-side Channel 1 inverting and non-inverting differential outputs. LVDS compatible (Notes 1, 3). SOB_0+ SOB_0− 32 31 O, LVDS Switch B-side Channel 0 inverting and non-inverting differential outputs. LVDS compatible (Notes 1, 3). SOB_1+ SOB_1− 17 18 O, LVDS Switch B-side Channel 1 inverting and non-inverting differential outputs. LVDS compatible (Notes 1, 3). LINE SIDE DIFFERENTIAL OUTPUTS LO_0+ LO_0− 42 41 O, LVDS Line-side Channel 0 inverting and non-inverting differential outputs. LVDS compatible (Notes 1, 3). LO_1+ LO_1− 7 8 O, LVDS Line-side Channel 1 inverting and non-inverting differential outputs. LVDS compatible (Notes 1, 3). DIGITAL CONTROL INTERFACE MUX_S0 MUX_S1 38 11 I, LVTTL Mux Select Control Inputs (per channel) to select which Switch-side input, A or B, is passed through to the Line-side. PREA_0 PREA_1 PREB_0 PREB_1 26 23 25 24 I, LVTTL Output pre-emphasis control for Switch-side outputs. Each output driver on the Switch A-side and B-side has a separate pin to control the pre-emphasis on or off. PREL_0 PREL_1 44 5 I, LVTTL Output pre-emphasis control for Line-side outputs. Each output driver on the Line A-side and B-side has a separate pin to control the pre-emphasis on or off. ENA_0 ENA_1 ENB_0 ENB_1 36 13 35 14 I, LVTTL Output Enable Control for Switch A-side and B-side outputs. Each output driver on the A-side and B-side has a separate enable pin. ENL_0 ENL_1 45 4 I, LVTTL Output Enable Control for The Line-side outputs. Each output driver on the Line-side has a separate enable pin. TDI 2 I, LVTTL Test Data Input to support IEEE 1149.1 features TDO 1 O, LVTTL Test Data Output to support IEEE 1149.1 features TMS 46 I, LVTTL Test Mode Select to support IEEE 1149.1 features TCK 47 I, LVTTL Test Clock to support IEEE 1149.1 features TRST 3 I, LVTTL Test Reset to support IEEE 1149.1 features POWER www.national.com 2 Pin Name LLP Pin Number SCAN15MB200 Pin Descriptions (Continued) I/O, Type Description VDD 6, 12, 37, 43, 48 I, Power VDD = 3.3V ± 0.3V. GND (Note 2) I, Power Ground reference for LVDS and CMOS circuitry. For the LLP package, the DAP is used as the primary GND connection to the device. The DAP is the exposed metal contact at the bottom of the LLP-48 package. It should be connected to the ground plane with at least 4 vias for optimal AC and thermal performance. Note 1: For interfacing LVDS outputs to CML or LVPECL compatible inputs, refer to the applications section of this datasheet (planned). Note 2: Note that the DAP on the backside of the LLP package is the primary GND connection for the device when using the LLP package. Note 3: The LVDS outputs do not support a multidrop (BLVDS) environment. The LVDS output characteristics of the SCAN15MB200 device have been optimized for point-to-point backplane and cable applications. 3 www.national.com SCAN15MB200 Connection Diagrams 20132802 LLP Top View DAP = GND 20132803 Directional Signal Paths Top View (Refer to pin names for signal polarity) www.national.com 4 Multiplexer Truth Table The output characteristics of the SCAN15MB200 have been optimized for point-to-point backplane and cable applications, and are not intended for multipoint or multidrop signaling. A 100Ω output (source) termination resistor is incorporated in the device to eliminate the need for an external resistor, providing excellent drive characteristics by locating the source termination as close to the output as physically possible. Data Inputs (Note 5) Control Inputs SIB_0 MUX_S0 ENL_0 LO_0 X valid 0 1 SIB_0 valid X 1 1 SIA_0 X X X 0 (Note 6) Z X = Don’t Care Z = High Impedance (TRI-STATE) Repeater/Buffer Truth Table Pre-Emphasis Controls Data Input The pre-emphasis is used to compensate for long or lossy transmission media. Separate pins are provided for each output to minimize power consumption. Pre-emphasis is programmable to be off or on per the Pre-emphasis Control Table. PREx_n (Note 4) Output Pre-emphasis 0 0% 1 100% Output SIA_0 Control Inputs LI_0 ENA_0 ENB_0 (Note 5) Outputs SOA_0 SOB_0 X 0 0 valid 0 1 Z (Note 6) Z (Note 6) Z LI_0 valid 1 0 LI_0 Z valid 1 1 LI_0 LI_0 X = Don’t Care Z = High Impedance (TRI-STATE) Note 4: Applies to PREA_0, PREA_1, PREB_0, PREB_1, PREL_0, PREL_1 Note 5: Same functionality for channel 1 Note 6: When all enable inputs from both channels are Low, the device enters a powerdown mode. Refer to the applications section titled TRI-STATE and Powerdown modes. 5 www.national.com SCAN15MB200 Output Characteristics SCAN15MB200 Absolute Maximum Ratings (Note 7) Supply Voltage (VDD) EIAJ, 0Ω, 200pF CDM −0.3V to +4.0V CMOS Input Voltage -0.3V to (VDD+0.3V) LVDS Receiver Input Voltage (Note 8) -0.3V to (VDD+0.3V) LVDS Driver Output Voltage -0.3V to (VDD+0.3V) LVDS Output Short Circuit Current +40 mA Junction Temperature +150˚C Storage Temperature −65˚C to +150˚C Lead Temperature (Solder, 4sec) 260˚C Max Pkg Power Capacity @ 25˚C 5.2W Thermal Resistance (θJA) Package Derating above +25˚C Supply Voltage (VCC) 8kV 15kV 3.0V to 3.6V Input Voltage (VI) (Note 8) 0V to VCC Output Voltage (VO) 0V to VCC Operating Temperature (TA) Industrial −40˚C to +85˚C Note 7: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of products outside of recommended operation conditions. 41.7mW/˚C LVDS pins to GND only 1000V Recommended Operating Conditions 24˚C/W ESD Last Passing Voltage HBM, 1.5kΩ, 100pF 250V Note 8: VID max < 2.4V Electrical Characteristics Over recommended operating supply and temperature ranges unless other specified. Symbol Parameter Conditions Min Typ (Note 9) Max Units LVTTL DC SPECIFICATIONS (MUX_Sn, PREA_n, PREB_n, PREL_n, ENA_n, ENB_n, ENL_n, TDI, TDO, TCK, TMS, TRST) VIH High Level Input Voltage 2.0 VDD V VIL Low Level Input Voltage GND 0.8 V IIH High Level Input Current VIN = VDD = VDDMAX −10 +10 µA IIHR High Level Output Current PREA_n, PREB_n, PREL_n 40 200 µA IIL Low Level Input Current VIN = VSS, VDD = VDDMAX −10 +10 µA -40 -200 µA IILR Low Level Input Current TDI, TMS, TRST CIN1 Input Capacitance Any Digital Input Pin to VSS 2.0 pF COUT1 Output Capacitance Any Digital Output Pin to VSS 4.0 pF VCL Input Clamp Voltage ICL = −18 mA −0.8 V VOH High Level Output Voltage (TDO) IOH = −12 mA, VDD = 3.0 V 2.4 V IOH = −100 µA, VDD = 3.0 V VDD-0.2 V −1.5 VOL Low Level Output Voltage (TDO) IOL = 100 µA, VDD = 3.0 V 0.2 V IOS Output Short Circuit Current TDO -15 -125 mA IOZ Output TRI-STATE Current TDO -10 +10 µA 100 mV IOL = 12 mA, VDD = 3.0 V 0.5 V LVDS INPUT DC SPECIFICATIONS (SIA ± , SIB ± , LI ± ) VTH Differential Input High Threshold (Note 10) VCM = 0.8V or 1.2V or 3.55V, VDD = 3.6V VTL Differential Input Low Threshold (Note 10) VCM = 0.8V or 1.2V or 3.55V, VDD = 3.6V −100 VID Differential Input Voltage VCM = 0.8V to 3.55V, VDD = 3.6V 100 VCMR Common Mode Voltage Range VID = 150 mV, VDD = 3.6V 0.05 CIN2 Input Capacitance IN+ or IN− to VSS IIN Input Current VIN = 3.6V, VDD = VDDMAX or 0V −15 +15 µA VIN = 0V, VDD = VDDMAX or 0V −15 +15 µA www.national.com 6 0 0 mV 2400 3.55 2.0 mV V pF (Continued) Over recommended operating supply and temperature ranges unless other specified. Symbol Parameter Conditions Min Typ (Note 9) Max Units 250 360 500 mV 35 mV 1.475 V 35 mV -40 mA LVDS OUTPUT DC SPECIFICATIONS (SOA_n ± , SOB_n ± , LO_n ± ) VOD Differential Output Voltage, 0% Pre-emphasis (Note 10) ∆VOD Change in VOD between Complementary States -35 RL is the internal 100Ω between OUT+ and OUT− VOS Offset Voltage (Note 11) 1.05 ∆VOS Change in VOS between Complementary States 1.22 -35 IOS Output Short Circuit Current OUT+ or OUT− Short to GND −21 COUT2 Output Capacitance OUT+ or OUT− to GND when TRI-STATE 4.0 All inputs and outputs enabled and active, terminated with differential load of 100Ω between OUT+ and OUT-. 225 275 mA ENA_0 = ENB_0 = ENL_0= ENA_1 = ENB_1 = ENL_1 = L 0.6 4.0 mA 170 250 ps 170 250 ps 1.0 2.5 ns 1.0 2.5 ns pF SUPPLY CURRENT (Static) ICC ICCZ Supply Current Supply Current - Powerdown Mode SWITCHING CHARACTERISTICS — LVDS OUTPUTS tLHT tHLT Differential Low to High Transition Use an alternating 1 and 0 pattern at Time 200 Mb/s, measure between 20% and Differential High to Low Transition 80% of VOD. (Note 16) Time tPLHD Differential Low to High Propagation Delay tPHLD Differential High to Low Propagation Delay tSKD1 Pulse Skew |tPLHD–tPHLD| (Note 16) 25 75 ps tSKCC Output Channel to Channel Skew Difference in propagation delay (tPLHD or tPHLD) among all output channels. (Note 16) 50 115 ps RJ - Alternating 1 and 0 at 750MHz (Note 13) 1.1 1.5 psrms DJ - K28.5 Pattern, 1.5 Gbps (Note 14) 20 34 psp-p TJ - PRBS 27-1 Pattern, 1.5 Gbps (Note 15) 14 28 psp-p Time from ENA_n, ENB_n, or ENL_n to OUT ± change from TRI-STATE to active. 0.5 1.5 µs LVDS Output Enable time from powerdown mode Time from ENA_n, ENB_n, or ENL_n to OUT ± change from Powerdown to active 10 20 µs LVDS Output Disable Time Time from ENA_n, ENB_n, or ENL_n to OUT ± change from active to TRI-STATE or powerdown. 12 ns tJIT tON tON2 tOFF Jitter (0% Pre-emphasis) (Note 12) LVDS Output Enable Time Use an alternating 1 and 0 pattern at 200 Mb/s, measure at 50% VOD between input to output. 7 www.national.com SCAN15MB200 Electrical Characteristics SCAN15MB200 Electrical Characteristics (Continued) Over recommended operating supply and temperature ranges unless other specified. Symbol Parameter Typ (Note 9) Conditions Min Max Units RL = 500Ω, CL = 35 pF 25.0 MHz 3.0 ns SWITCHING CHARACTERISTICS - SCAN FEATURES fMAX Maximum TCK Clock Frequency tS TDI to TCK, H or L tH TDI to TCK, H or L 0.5 ns tS TMS to TCK, H or L 3.0 ns tH TMS to TCK, H or L 0.5 ns tW TCK Pulse Width, H or L 10.0 ns tW TRST Pulse Width, L 2.5 ns tREC Recovery Time, TRST to TCK 2.0 ns Note 9: Typical parameters are measured at VDD = 3.3V, TA = 25˚C. They are for reference purposes, and are not production-tested. Note 10: Differential output voltage VOD is defined as ABS(OUT+–OUT−). Differential input voltage VID is defined as ABS(IN+–IN−). Note 11: Output offset voltage VOS is defined as the average of the LVDS single-ended output voltages at logic high and logic low states. Note 12: Jitter is not production tested, but guaranteed through characterization on a sample basis. Note 13: Random Jitter, or RJ, is measured RMS with a histogram including 1500 histogram window hits. The input voltage = VID = 500mV, 50% duty cycle at 750MHz, tr = tf = 50ps (20% to 80%). Note 14: Deterministic Jitter, or DJ, is measured to a histogram mean with a sample size of 350 hits. Stimulus and fixture jitter has been subtracted. The input voltage = VID = 500mV, K28.5 pattern at 1.5 Gbps, tr = tf = 50ps (20% to 80%). The K28.5 pattern is repeating bit streams of (0011111010 1100000101). Note 15: Total Jitter, or TJ, is measured peak to peak with a histogram including 3500 window hits. Stimulus and fixture jitter has been subtracted. The input voltage = VID = 500mV, 27-1 PRBS pattern at 1.5 Gbps, tr = tf = 50ps (20% to 80%). Note 16: Not Production tested. Guaranteed by statistical analysis on a sample basis at the time of characterization. www.national.com 8 SCAN15MB200 Typical Performance Characteristics Power Supply Current vs. Bit Data Rate Total Jitter vs. Bit Data Rate 20132820 20132821 Total Jitter measured at 0V differential while running a PRBS 27-1 pattern with one channel active, all other channels are disabled. VDD = 3.3V, TA = +25˚C, VID = 0.5V, pre-emphasis off. Dynamic power supply current was measured with all channels active and toggling at the bit data rate. Data pattern has no effect on the power consumption. VDD = 3.3V, TA = +25˚C, VID = 0.5V, VCM = 1.2V Total Jitter vs. Temperature 20132822 Total Jitter measured at 0V differential while running a PRBS 27-1 pattern with one channel active, all other channels are disabled. VDD = 3.3V, VID = 0.5V, VCM = 1.2V, 1.5 Gbps data rate, pre-emphasis off. FIGURE 2. LLP Performance Characteristics 9 www.national.com SCAN15MB200 voltage will be at the normal LVPECL levels – around 2 V. This scheme works well with LVDS receivers that have rail-to-rail common mode voltage, VCM, range. Most National Semiconductor LVDS receivers have wide VCM range. The exceptions are noted in devices’ respective datasheets. Those LVDS devices that do have a wide VCM range do not vary in performance significantly when receiving a signal with a common mode other than standard LVDS VCM of 1.2 V. TRI-STATE and Powerdown Modes The SCAN15MB200 has output enable control on each of the six onboard LVDS output drivers. This control allows each output individually to be placed in a low power TRISTATE mode while the device remains active, and is useful to reduce power consumption on unused channels. In TRISTATE mode, some outputs may remain active while some are in TRI-STATE. When all six of the output enables (all drivers on both channels) are deasserted (LOW), then the device enters a Powerdown mode that consumes only 0.5mA (typical) of supply current. In this mode, the entire device is essentially powered off, including all receiver inputs, output drivers and internal bandgap reference generators. When returning to active mode from Powerdown mode, there is a delay until valid data is presented at the outputs because of the ramp to power up the internal bandgap reference generators. Any single output enable that remains active will hold the device in active mode even if the other five outputs are in TRI-STATE. 20132862 FIGURE 4. AC Coupled LVPECL to LVDS Interface When in Powerdown mode, any output enable that becomes active will wake up the device back into active mode, even if the other five outputs are in TRI-STATE. An AC coupled interface is preferred when transmitter and receiver ground references differ more than 1 V. This is a likely scenario when transmitter and receiver devices are on separate PCBs. Figure 4 illustrates an AC coupled interface between a LVPECL driver and LVDS receiver. R1 and R2, if not present in the driver device (Note 17), provide DC load for the emitter followers and may range between 140-220Ω for most LVPECL devices for this particular configuration. The 15MB200 includes an internal 100Ω resistor to terminate the transmission line for minimal reflections. The signal after ac coupling capacitors will swing around a level set by internal biasing resistors (i.e. fail-safe) which is either VDD/2 or 0 V depending on the actual failsafe implementation. If internal biasing is not implemented, the signal common mode voltage will slowly drift to GND level. Input Failsafe Biasing External pull up and pull down resistors may be used to provide enough of an offset to enable an input failsafe under open-circuit conditions. This configuration ties the positive LVDS input pin to VDD thru a pull up resistor and the negative LVDS input pin is tied to GND by a pull down resistor. The pull up and pull down resistors should be in the 5kΩ to 15kΩ range to minimize loading and waveform distortion to the driver. Please refer to application note AN1194, “Failsafe Biasing of LVDS Interfaces” for more information. Interfacing LVPECL to LVDS An LVPECL driver consists of a differential pair with coupled emitters connected to GND via a current source. This drives a pair of emitter-followers that require a 50Ω to VCC-2.0 load. A modern LVPECL driver will typically include the termination scheme within the device for the emitter follower. If the driver does not include the load, then an external scheme must be used. The 1.3 V supply is usually not readily available on a PCB, therefore, a load scheme without a unique power supply requirement may be used. 20132861 FIGURE 3. DC Coupled LVPECL to LVDS Interface Figure 3 is a separated π termination scheme for a 3.3 V LVPECL driver. R1 and R2 provides proper DC load for the driver emitter followers, and may be included as part of the driver device (Note 17). The 15MB200 includes a 100Ω input termination for the transmission line. The common mode www.national.com 10 Design-For-Test (DfT) Features An LVDS driver consists of a current source (nominal 3.5mA) which drives a CMOS differential pair. It needs a differential resistive load in the range of 70 to 130Ω to generate LVDS levels. In a system, the load should be selected to match transmission line characteristic differential impedance so that the line is properly terminated. The termination resistor should be placed as close to the receiver inputs as possible. When interfacing an LVDS driver with a non-LVDS receiver, one only needs to bias the LVDS signal so that it is within the common mode range of the receiver. This may be done by using separate biasing voltage which demands another power supply. Some receivers have required biasing voltage available on-chip (VT, VTT or VBB). IEEE 1149.1 SUPPORT The SCAN15MB200 supports a fully compliant IEEE 1149.1 interface. The Test Access Port (TAP) provides access to boundary scan cells at each LVTTL I/O on the device for interconnect testing. Differential pins are included in the same boundary scan chain but instead contain IEEE1149.6 cells. IEEE1149.6 is the improved IEEE standard for testing high-speed differential signals. Refer to the BSDL file located on National’s website for the details of the SCAN15MB200 IEEE 1149.1 implementation. IEEE 1149.6 SUPPORT AC-coupled differential interconnections on very high speed (1+ Gbps) data paths are not testable using traditional IEEE 1149.1 techniques. The IEEE 1149.1 structures and methods are intended to test static (DC-coupled), single ended networks. IEEE 1149.6 is specifically designed for testing high-speed differential, including AC coupled networks. The SCAN15MB200 is intended for high-speed signalling up to 1.5 Gbps and includes IEEE1149.6 on all differential inputs and outputs. 20132863 FAULT INSERTION Fault Insertion is a technique used to assist in the verification and debug of diagnostic software. During system testing faults are "injected" to simulate hardware failure and thus help verify the monitoring software can detect and diagnose these faults. In the SCAN15MB200 an IEEE1149.1 "stuckat" instruction can create a stuck-at condition, either high or low, on any pin or combination of pins. A more detailed description of the stuck-at feature can be found in NSC Applications note AN-1313. FIGURE 5. DC Coupled LVDS to LVPECL Interface Figure 5 illustrates interface between an LVDS driver and a LVPECL with a VT pin available. R1 and R2, if not present in the receiver (Note 17), provide proper resistive load for the driver and termination for the transmission line, and VT sets desired bias for the receiver. Packaging Information The Leadless Leadframe Package (LLP) is a leadframe based chip scale package (CSP) that may enhance chip speed, reduce thermal impedance, and reduce the printed circuit board area required for mounting. The small size and very low profile make this package ideal for high density PCBs used in small-scale electronic applications such as cellular phones, pagers, and handheld PDAs. The LLP package is offered in the no Pullback configuration. In the no Pullback configuration the standard solder pads extend and terminate at the edge of the package. This feature offers a visible solder fillet after board mounting. The LLP has the following advantages: • Low thermal resistance • Reduced electrical parasitics 20132864 FIGURE 6. AC Coupled LVDS to LVPECL Interface Figure 6 illustrates AC coupled interface between an LVDS driver and LVPECL receiver without a VT pin available. The resistors R1, R2, R3, and R4, if not present in the receiver (Note 17), provide a load for the driver, terminate the transmission line, and bias the signal for the receiver. • Improved board space efficiency • Reduced package height • Reduced package mass For more details about LLP packaging technology, refer to applications note AN-1187, "Leadless Leadframe Package" Note 17: The bias networks shown above for LVPECL drivers and receivers may or may not be present within the driver device. The LVPECL driver and receiver specification must be reviewed closely to ensure compatibility between the driver and receiver terminations and common mode operating ranges. 11 www.national.com SCAN15MB200 Interfacing LVDS to LVPECL SCAN15MB200 Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6 Physical Dimensions inches (millimeters) unless otherwise noted 48-Pin LLP NS Package Number SQA48a Ordering Code SCAN15MB200TSQ (250 piece Tape and Reel) SCAN15MB200TSQX (2500 piece Tape and Reel) National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications. For the most current product information visit us at www.national.com. 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