HD74HC Series Common Information September 2000 Customer Service Division Semiconductor & Integrated Circuits Hitachi, Ltd. Disclaimer 1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi’s sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor products. Outline of Hitachi High-Speed CMOS Logic Outline of Hitachi High-Speed CMOS Logic Features of High-Speed CMOS Logic Hitachi’s HS-CMOS logics–the HD74HC series–and the HCT series based on the EIA/JEDEC specification. Their specification are shown in the Maximum Ratings and the Electrical Characteristics Tables. The HS-CMOS has the characteristics of both standard CMOS logic series and LS-TTL series. The features of this logic are: • High-Speed equivalent to the LS-TTL’s • Capable of driving 10LS-TTL loads (Capable of driving 15LS-TTL loads in bus drivers) • Maximum input current of ± 1 µA at 6 V power supply • Wide supply voltage range: HC series 2 to 6 V HCT series 4.5 to 5.5 V • Wide noise margin • VCC assurance of Electrical Characteristics at 2.0, 4.5 and 6.0 V • Low Static Power Consumption 1/2 of EIA/JEDEC Type Name of High-Speed CMOS Logic The JEDEC has divided the HS-CMOS’s into two types: HC and HCT. The HC type has the CMOS logic level for inputs and outputs with buffers. The HCT type has the TTL logic level for inputs and the outputs have buffers. The industry-standarized maximum ratings and recommended operating range are shown below. Limits for the static characteristics are shown below (right): Table 1 is in the industry-standard and Table 2 is the Hitachi specifications. The Hitachi specifications is used throughout this data book. Additional specification are shown in the individual data sheets. Switching characteristics are specified under the following conditions: • Input pulse voltage: + VCC • Load capacitance: 50 pF • Input pulse rise/fall time: 6 ns Switching times measured from 50% point of input voltage to 50% point of output voltage • Three different supply voltages: 2.0, 4.5 and 6.0 V 1 Outline of Hitachi High-Speed CMOS Logic Input Levels of Each Series Type (VCC = 5 V) Input level Type VIH VIL Remarks HC series 3.5 V 1.5 V — HCT series 2.0 V 0.8 V TTL logic level for inputs Type Name of HS-CMOS Logic HD74 Package Code (P : Plastic DIP,FP:Small outline package (EIAJ TYPE), RP : Small outline package (JEDEC TYPE)) Individual device code 2 or 3-digit:same pin connection and function with its corresponding device in LS-TTL 4–digit:same pin connection and function with the 14000B series CMOS) Type code (HC,HCT) Absolute Maximum Ratings (Voltages Referenced to GND) Item Symbol Rating Unit Supply voltage VCC –0.5 to +7 V I/O voltage VIN, VOUT –0.5 to VCC +0.5 V I/O diode current I IK , I OK ±20 mA Output current IO ±25 mA VCC, GND current I CC, I GND ±50 mA Power dissipation PT 500 mW Storage temperature Range Tstg –65 to +150 ˚C Additional specification values are shown on the individual data sheets. 2 Outline of Hitachi High-Speed CMOS Logic Recommended Operating Range HD74HC Item Symbol Rating Unit Supply voltage VCC 2 to 6 V I/O voltage VIN, VOUT 0 to V CC V Operating temperature Ta –40 to +85 ˚C Input rise/fall time tr, tf 0 to 1000 ns Condition VCC = 2.0 V 0 to 500 VCC = 4.5 V 0 to 400 VCC = 6.0 V HD74HCT Item Symbol Rating Unit Supply voltage VCC 4.5 to 5.5 V I/O voltage VIN, VOUT 0 to V CC V Operating temperature Ta –40 to +85 ˚C Input rise/fall time tr, tf 0 to 1000 ns Condition VCC = 2.0 V 0 to 500 VCC = 4.5 V 0 to 400 VCC = 6.0 V HD74HC14, HC132 Item Symbol Rating Unit Condition Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V 0 to unlimited VCC = 4.5 V 0 to unlimited VCC = 6.0 V HD74HC123A, HC221, HC423A Item Symbol Rating Unit Condition A, B Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V CLR Input rise/fall time tr, tf 0 to unlimited VCC = 4.5 V 0 to unlimited VCC = 6.0 V 0 to 1000 ns VCC = 2.0 V 0 to 500 VCC = 4.5 V 0 to 400 VCC = 6.0 V 3 Outline of Hitachi High-Speed CMOS Logic HD74HC4538 Item Symbol Rating Unit Condition A, B Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V CD Input rise/fall time tr, tf 0 to unlimited VCC = 4.5 V 0 to unlimited VCC = 6.0 V 0 to 1000 ns VCC = 2.0 V 0 to 500 VCC = 4.5 V 0 to 400 VCC = 6.0 V HD74HC540, HC541 Item Symbol Rating Unit Condition A Input rise/fall time tr, tf 0 to unlimited ns VCC = 2.0 V G Input rise/fall time 4 tr, tf 0 to unlimited VCC = 4.5 V 0 to unlimited VCC = 6.0 V 0 to 1000 ns VCC = 2.0 V 0 to 500 VCC = 4.5 V 0 to 400 VCC = 6.0 V Outline of Hitachi High-Speed CMOS Logic Table 1 EIA/JEDEC Format for High-Speed CMOS Specifications Limits +25˚C Parameters Input voltage HC Series Symbol VCC(V) min max min max Unit Test Conditions VIH — 2.0 1.5 4.5 3.15 — 3.15 — 6.0 4.2 — 4.2 — 4.5 to 2.0 5.5 — 2.0 — 2.0 — 0.3 — 0.3 4.5 — 0.9 — 0.9 6.0 — 1.2 — 1.2 4.5 to — 5.5 0.8 — 0.8 2.0 1.9 — 1.9 — 4.5 4.4 — 4.4 — 6.0 5.9 — 5.9 — 4.5 3.98 — 3.84 — Iout = –4.0 mA 6.0 5.48 — 5.34 — Iout = –5.2 mA Bus driver 2.0 1.9 — 1.9 — type 4.5 4.4 — 4.4 — 6.0 5.9 — 5.9 — 4.5 3.98 — 3.84 — Iout = –6.0 mA 6.0 5.48 — 5.34 — Iout = –7.8 mA 4.5 4.4 4.4 4.5 3.98 — 3.84 — Bus driver 4.5 4.4 4.4 type 4.5 3.98 — 3.84 — 2.0 — 0.1 — 0.1 4.5 — 0.1 — 0.1 6.0 — 0.1 — 0.1 4.5 — 0.26 — 0.33 Iout = 4.0 mA 6.0 — 0.26 — 0.33 Iout = 5.2 mA Bus driver 2.0 — 0.1 — 0.1 type 4.5 — 0.1 — 0.1 6.0 — 0.1 — 0.1 HCT Series HC Series VIL HCT Series Output HC voltage Series type HCT Standard VOH Standard Series type HC –40 to +85˚C Standard Series type VOL — — — 1.5 V V V Vin = VIH or VIL Iout = –20 µA Vin = VIH or VIL Iout = –20 µA Vin = VIH or VIL Iout = –20 µA — Iout = –4.0 mA Vin = VIH or VIL Iout = –20 µA — Iout = –6.0 mA V Vin = VIH or VIL Iout = 20 µA Vin = VIH or VIL Iout = 20 µA 5 Outline of Hitachi High-Speed CMOS Logic Limits +25˚C Parameters Output HC voltage Symbol VCC(V) min max min Bus driver — 0.26 — 0.33 V Series type 6.0 — 0.26 — 0.33 HCT 4.5 — 0.1 0.1 4.5 — 0.26 — 0.33 Bus driver 4.5 — 0.1 0.1 type 4.5 — 0.26 — 0.33 6.0 — ±0.1 — ±1.0 µA Vin = VCC or GND 5.5 — ±0.1 — ±1.0 6.0 — ±0.1 — ±1.0 µA Vin = VIH or VIL 5.5 — ±0.1 — ±1.0 6.0 — ±0.5 — ±5.0 µA Vin = VIH or VIL 5.5 — ±0.5 — ±5.0 6.0 — 2.0 — 20 6.0 — 4.0 — 40 MSI 6.0 — 8.0 — 80 SSI 5.5 — 2.0 — 20 5.5 — 4.0 — 40 5.5 — 8.0 — 80 Standard Input leakage HC Series current HCT Series Analog switch off- HC Series state current state current HCT Series Quiescent HC SSI Series FF current HCT II I S(off) HCT Series 3-state output off- HC Series Series FF MSI 6 max Unit Test Conditions 4.5 Series type supply –40 to +85˚C I OZ I CC — — Vin = VIH or VIL Iout = 6.0 mA Iout = 7.8 mA Vin = VIH or VIL Iout = 20 µA Iout = 4.0 mA Vin = VIH or VIL Iout = 20 µA Iout = 6.0 mA |VS| = VCC or VCC – VEE Vout = VCC or GND µA Vin = VCC or GND Iout = 0 µA Outline of Hitachi High-Speed CMOS Logic Table 2 Hitachi High-Speed CMOS Series Specifications Limits +25˚C Parameters Input voltage HC Series Symbol VCC(V) min max min max Unit Test Conditions VIH — 2.0 1.5 4.5 3.15 — 3.15 — 6.0 4.2 — 4.2 — 4.5 to 2.0 5.5 — 2.0 — 2.0 — 0.5 — 0.5 4.5 — 1.35 — 1.35 6.0 — 1.8 — 1.8 4.5 to — 5.5 0.8 — 0.8 2.0 1.9 — 1.9 — 4.5 4.4 — 4.4 — 6.0 5.9 — 5.9 — 4.5 4.18 — 4.13 — I OH = –4.0 mA 6.0 5.68 — 5.63 — I OH = –5.2 mA Bus driver 2.0 1.9 — 1.9 — type 4.5 4.4 — 4.4 — 6.0 5.9 — 5.9 — 4.5 4.18 — 4.13 — I OH = –6.0 mA 6.0 5.68 — 5.63 — I OH = –7.8 mA 4.5 4.4 4.4 4.5 4.18 — 4.13 — Bus driver 4.5 4.4 4.4 type 4.5 4.18 — 4.13 — 2.0 — 0.1 — 0.1 4.5 — 0.1 — 0.1 6.0 — 0.1 — 0.1 4.5 — 0.26 — 0.33 V 6.0 — 0.26 — 0.33 Bus driver 2.0 — 0.1 — 0.1 type 4.5 — 0.1 — 0.1 6.0 — 0.1 — 0.1 HCT Series HC Series VIL HCT Series Output HC voltage Series type HCT Standard VOH Standard Series type HC –40 to +85˚C Standard Series type VOL — — — 1.5 V V V Vin = VIH or VIL I OH = –20 µA Vin = VIH or VIL I OH = –20 µA Vin = VIH or VIL I OH = –20 µA — I OH = –4.0 mA Vin = VIH or VIL I OH = –20 µA — I OH = –6.0 mA V Vin = VIH or VIL I OL = 20 µA Vin = VIH or VIL I OL = 4.0 mA I OL = 5.2 mA Vin = VIH or VIL I OL = 20 µA 7 Outline of Hitachi High-Speed CMOS Logic Limits +25˚C Parameters Output HC voltage Bus driver Symbol VCC(V) min max min max Unit Test Conditions VOL 4.5 — 0.26 — 0.33 V Series type 6.0 — 0.26 — 0.33 HCT 4.5 — 0.1 0.1 4.5 — 0.26 — 0.33 Bus driver 4.5 — 0.1 0.1 type 4.5 — 0.26 — 0.33 6.0 — ±0.1 — ±1.0 µA Vin = VCC or GND 5.5 — ±0.1 — ±1.0 6.0 — ±0.1 — ±1.0 µA Vin = VIH or VIL 5.5 — ±0.1 — ±1.0 6.0 — ±0.5 — ±5.0 µA Vin = VIH or VIL 5.5 — ±0.5 — ±5.0 6.0 — 1.0 — 10 6.0 — 2.0 — 20 MSI 6.0 — 4.0 — 40 SSI 5.5 — 1.0 — 10 5.5 — 2.0 — 20 5.5 — 4.0 — 40 Standard Series type Input leakage HC Series current HCT Series Analog Switch HC Series Off-state Current HCT Series 3-state output Off- HC Series state Current HCT Series Quiescent HC SSI Supply Series FF Current HCT Series FF MSI 8 –40 to +85˚C II I S(off) I OZ I CC — — Vin = VIH or VIL I OL = 6.0 mA I OL = 7.8 mA Vin = VIH or VIL I OL = 20 µA I OL = 4.0 mA Vin = VIH or VIL I OL = 20 µA I OL = 6.0 mA |VS| = VCC or VCC – VEE Vout = VCC or GND µA Vin = VCC or GND Iout = 0 µA Outline of Hitachi High-Speed CMOS Logic Symbols and Terms Defined for HD74HC Series 1. Explanation of Symbols Used in Electrical Characteristics and Recommended Operating Conditions 1.1 DC characteristics Symbol Term Description VIH “H” level input voltage “H” level input voltage to ensure that a logic element operates under some constraint. VIL “L” level input voltage “L” level input voltage to ensure that a logic element operates under some constraint. VOL “L” level output voltage Output voltage in effect when, under the input condition for bringing the output Low, the rated output current is allowed to flow to the output terminal. VOH “H” level output voltage Output voltage in effect when, under the input condition for bringing the output High, the rated output current is allowed to flow to the output terminal. VT+ Forward input threshold voltage Input voltage in effect when the operation of a logic element varies as the input is allowed to go up from a voltage level lower than the forward input threshold voltage V T- . VT- Reverse input threshold voltage Input voltage in effect when the operation of a logic element varies as the input is allowed to go up from a voltage level lower than the reverse input threshold voltage V T+. VH Hysteresis voltage Differnce between forward input threshold voltage V T+ and reverse threshold voltage V T- . I OH “H” level output current Output current that flows out when, under the condition for bringing the output High, the rated output voltage VOUT is applied to the output terminal. I OL “L” level output current Output current that flows out when, under the condition for bringing the output High, the rated output voltage V OUT is applied to the output terminal. I IN Input leakage current Input current that flows in when the rated maximum input voltage is applied to the input terminal. I IH “H” level input current Input current that flows in when the rated “H” level voltage is applied to the input. I IL “L” level input current Input current that flows out when the rated “L” level voltage is applied to the input. I OZ Off-state output current (high impedance) Current that flows to the 3-state output of an element under the input condition for briging the output to High impedance. Is(off) Analog switch off-state current Current that flows to the analog switch of an element under the input condition for bringing the switch to off-state. I CC Quiescent supply current Current that flows to the supply terminal (VCC) under the rated input condition. 9 Outline of Hitachi High-Speed CMOS Logic 1.2 AC characteristics Symbol Term Description f max Maximum clock frequency Maximum clock frequency that maintains the stable changes in output logic level in the rated sequence under the I/O condition allowing clock pulses to change the output state. t TLH Rise (transient) time Rated time from “L” level to “H” level of a waveform during the defined transient period changing from “L” level to “H” level. t THL Fall (transient) time Rated time from “H” level to “L” level of a waveform during the defined transient period changing from “H” level to “L” level. t PLH Output rise propagation delay time Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the output changing from “L” level to “H” level. t PHL Output fall propagation delay time Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the output changing from “H” level to “L” level. t HZ 3-state output disable time (“H” level) Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from “H” level to the high impedance state. t LZ 3-state output disable time (“L” level) Delay time between the rated voltatge levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from “L” level to the high impedance state t ZH 3-state output enable time (“H” level) Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from the high impedance state to “H” level. t ZL 3-state output enable time (“L” level) Delay time between the rated voltage levels of an I/O voltage waveform under a defined load condition, with the 3-state output changing from the high impedance state to “L” level. tw Pulse width Duration of time between the rated levels from a leading edge to a trailing edge of a pulse waveform. th Hold time Time in which to hold date at the specified input terminal after a change at another related input terminal (e.g., clock input). t su Setup time Time in which to set up and keep data at the specified input terminal before a change at another related input terminal (e.g., clock input). t rm Removal time Time period between the time when data at the specified input terminal is released and the time when another related input terminal (e.g., clock input) can be changed. Cin Input capacitance Capacitance between GND terminal and an input terminal to which 0 V is applied. 10 Outline of Hitachi High-Speed CMOS Logic 2. Explanation of Symbols Used in Function Table Symbol Description H High level (in steady state; noted "H" or “H” level in sentences) L Low level (in steady state; noted "L" or “L” level in sentences) Transition from L level to H level Transition from H level to L level X Either H or L Z 3-state output off (high impedance) a·····h Input level of steady state for each of inputs A-H Q0 Q level immediately before the indicated input condition is established Q0 Complement of Q Qn Q level immediately before the latest active change ( or ) occurs Single H level pulse Single L level pulse TOGGLE Each output is changed to the complement of the preceding state by an active input change ( or ) Measuring Method of AC Characteristics Loading Circuit VCC VCC Measuring point Output Measuring point CL (a) CMOS output Notes: Output RL Measuring point CL (b) Open drain output Output RL S1 CL RL (c) 3-state output 1. C L includes the floating capacitance of probe and jig. 2. R L = 1 kΩ (except for a particular specification) 11 Outline of Hitachi High-Speed CMOS Logic Waveforms (Mutual relationship of waveforms) Pulse Width (TW) 74HC Series tr = 6ns H-level Pulse 90% 50% 10% tf = 6ns VCC 90% 50% 10% GND tw tw L-level Pulse 90% 50% 10% VCC 90% 50% 10% GND tf = 6ns tr = 6ns tr = 6ns tf = 6ns 74HCT Series H-level Pulse 2.7V 1.3V 0.3V 3.0V 2.7V 1.3V 0.3V GND tw tw L-level Pulse 2.7V 1.3V 0.3V tf = 6ns 12 3.0V 2.7V 1.3V 0.3V GND tr = 6ns Outline of Hitachi High-Speed CMOS Logic Setup Time and Hold Time 74HC Series tr VCC 90% Clock or Latch Enable Input *1 50% 10% tsu GND th VOH Positive Data Input 50% 50% tsu Negative Data Input VOL th 50% VOH 50% VOL 74HCT Series tr 3.0V 90% Clock or Latch Enable Input *1 1.3V 10% tsu GND th 3.0V Positive Data Input 1.3V 1.3V tsu Negative Data Input 1.3V GND th 3.0V 1.3V GND Note: Waveform for negative edge sensitive circuits will be inverted. 13 Outline of Hitachi High-Speed CMOS Logic Removal Time 74HC Series tr 90% Clock Input *1 VCC 50% 10% GND trem Active Low Clear or Enable 50% 10% tr Active High Clear or Enable VCC 90% GND trem VCC 90% 50% 10% GND tf 74HCT Series tr 90% Clock Input *1 3.0V 1.3V 10% trem Active Low Clear or Enable 90% 10% GND 3.0V 90% 1.3V 10% tf Note: 14 3.0V 1.3V tr Active High Clear or Enable GND Waveform for negative edge sensitive circuits will be inverted. GND Outline of Hitachi High-Speed CMOS Logic Waveforms (Mutual relationship of waveforms) Propagation Delay Time, Output Rise Time and Output Fall time 74HC Series tr = 6ns Input tf = 6ns tTLH 90% 50% 10% Same-phase Output tPLH tPHL Inverse-phase Output VCC 90% 50% 10% 90% 50% 10% 90% 50% 10% tTHL GND tTHL 90% 50% 10% tPHL tPLH 90% 50% 10% VOH VOL VOH VOL tTLH 15 Outline of Hitachi High-Speed CMOS Logic 74 HCT Series tr = 6ns Input tf = 6ns tTLH 90% 1.3V 10% Same-phase Output tPLH tPHL Inverse-phase Output 90% 1.3V 10% tTHL 16 3.0V 2.7V 1.3V 0.3V 2.7V 1.3V 0.3V GND tTHL 90% 1.3V 10% tPHL tPLH 90% 1.3V 10% tTLH VOH VOL VOH VOL Outline of Hitachi High-Speed CMOS Logic Waveforms (Mutual relationship of waveforms) Three-state Output, Enable Time and Disable Time 74HC Series tf = 6ns 90% Output Control 50% (L-level Enable) 10% tr = 6ns VCC 90% 50% 10% GND S1 : VCC VOH S1 : VCC 50% Waveform 1 10% tZL VOL tLZ tHZ Waveform 2 S1 : GND VOH 90% tZH 50% S1 : GND VOL 74HCT Series tf = 6ns 2.7V Output Control 1.3V (L-level Enable) 0.3V tr = 6ns 3.0V 2.7V 1.3V 0.3V GND S1 : VCC VOH S1 : VCC 1.3V Waveform 1 tZL 10% tZH 90% VOL tLZ tHZ Waveform 2 Notes: S1 : GND VOH 1.3V S1 : GND VOL 1. Waveform 1 is an output under the internal condition like “L” except for the output disabled by the output control. 2. Waveform 2 is an output under the internal condition like “H” except for the output disabled by the output control. 17 Precautions in System Design Precautions in System Design In the system design, the problems to be considered are described in the following items: 1. Transfer Characteristics Since the transfer characteristics of gate circuit varies with the number of working inputs, care must be taken to the noise margin. In the multiple input NOR gate, the P channel MOS is connected to V CC in series and the N channel MOS is connected to GND in parallel. In the NAND gate, the connection is reverse. The output voltage V OUT in the transition area becomes a value obtained by distributing the supply voltage at a split ratio according to the ON resistance of P channel MOS and N channel MOS. In the multiple input NOR and NAND gates, the fall of transfer characteristic, that is, VIN(voltage noise margin) that enters in the transition area changes according to the number of inputs as shown in Figure 1. Number of inputs 3 2 1 Vout 4 Vin Number of inputs 3 2 1 Vout 4 Vin Figure 1 As seen from the above, it becomes clear that: • In the NOR gate, “0” level noise margin VNL decreases, and “1” level noise margin VNH increases according to the number of working inputs. • In the NAND gate, the noise margins are fully reversed. 18 Precautions in System Design 2. Output Impedance The output impedance of CMOS logic gate is influenced by the circuit configuration, the number of working inputs, logical state and supply voltage. There are two regions of output impedance depending on the operation: • Constant impedance area in which P and N channel MOS’ operate in the nonsaturated state. • Constant current area in which P and N channel MOS’ operate in the pinch-off state. In designing a system including an interface circuit, the above must be considered. 3. Output Short-Circuit Because no protective circuitry is provided to limit the output current, an output inadvertently shorted to VCC or GND on the HS-CMOS logic IC is limited to the current value determined by the pinch-off effect of the P-channel MOS and N-channel MOS for the output. Notice that such output short-circuit current, if allowed to flow for a long time, could result in increased power dissipation or in a melted wire due to excessive current density through metalization or other performance failures. For operating stability and reliability, the maximum output current should remain within the maximum rating. 4. Unused Inputs As shown in Figure 2, unused inputs must be: (1) Directly connected to VCC for NAND gate circuits. (2) Directly connected to GND for NOR gate circuits. (3) Connected to VCC or GND through a proper resistor (10 kΩ or 100 kΩ.). This is required because the extremely high input impedance of CMOS logic makes it subject to noise. This noise causes the output logic level to be unstable. Furthermore, in some cases, if a gate is not used or a flip-flop is not used, both p-channel MOS and n-channel MOS may conduct, causing ICC to flow. VCC Vin VCC Vin VCC Vout 100 kΩ Vout GND 100 kΩ GND Figure 2 Examples of Handling Unused Inputs 19 Precautions in System Design 5. Input Impedance Since all the input protective diodes are biased reversely in the ordinary operations, the input impedance of CMOS logic IC is extremely high. When converted into a leak current, it is about several tens (pA) at a temperature of 25˚C or about one (nA) even at 100˚C. Thus, the matching for operating the CMOS logic IC has only to be considered at a voltage level. In the actual interface to other IC’s, however, remember that fan-out is limited according to a capacitance value because inputs measured in capacity. 6. Parallel Connection of Gate Circuits If it is necessary to increase source or sinking current, the same type gate circuits can be connected in parallel as shown in Figure 3. IOS0 IOS1 IOS1 IOS0 IOS1 IOS1 Increase of source current Increase of sinking current Increase of sinking current Figure 3 Examples of Parallel Connection The switching speed improved at the same time. The source and sinking current capacities also increase in proportion to the number of inputs. 7. Wired OR Connection The wired OR connection is unrecommendable and shall not be used in CMOS logic IC’s. The reason is that if the two gate outputs are connected with A = B = 0 and C = D = 1 as shown in Figure 4, the output voltage is a value with which the supply voltage is divided by each of the resistance values of active P and N channel MOS’, on an about half level (VCC - GND). A B Y C D Figure 4 Wired OR Connection 20 Precautions in System Design 8. Input Capacitance In the CMOS logic IC, there is capacitance between the input and the GND. In addition to the major capacitance between the gate and the substrate, the capacitance of package, leads and input protection circuit are also included. The change input capacitance depending on the input voltage results mainly from the capacitance between the gate and the substrate. This input capacitance has an advantage of temporarily storing date in it by opening/closing the transmission gate. On the other hand, however, remember that the input capacitance may slow down switching speed of mutually connected gate and also may increase the power dissipation. The input capacitance is usually about 5 (pF) as specified in the standard. 9. Output Capacitance The whole output capacitance of CMOS logic IC is the sum of the drain capacitance of output MOS and the external load capacitance. It may be considered that the former is about 10 (pF) per output. The propagation delay time increases linealy in proportion to the increase of external load capacitance as described previously. The power dissipation also increases according to it. Especially, be careful in attaching a large capacity of around 1 (1µF) outside. The peak current at the gate transition, as described previously, is limited by the output characteristics of P and N channel MOS’. In the buffer circuit, the peak current may increase (to 100 mA or more). Pay sufficient attention to the fact that the rise of temperature in the chip may cause metal migration on the metal wiring layer. If the peak current for gate circuit is set to about 50 mA and the one for buffer circuit is set to about 100 mA, no consideration is required. 21 Precautions in System Design 10. Features of 3-state Output Circuit In a system that requires bus configuration, the 3-state output element is brought from the necessity to place unnecessary circuits in the high output impedance state through control input to operate necessary circuit selectively when tow or more circuit is connected to one bus line. Figure 5 shows the typical 3-state circuit. When the Disable input of control terminal is at “1” level, the output is at low impedance by the switch operation. When at “0” level, the output is at extremely high impedance of 104 (MΩ) at a room temperature. Remember that the number of 3-state elements connectable to one bus line is limited by the switching speed and supply voltage. VCC Disable Out In GND Figure 5 3-state Output Circuit 22 Precautions in System Design 11. Static Power Dissipation In the CMOS logic IC, the P channel MOS and N channel MOS are mutually connected each other. Therefore, either P channel or N channel is cut off in the input potential level static state. There is no path in which the current from the power supply flows. Actually, the reverse bias leak current in all the P-N junction in the chip including parasitic P-N junction flows only. The supply current in this state is referred to as static current consumption, and the power dissipation as static power dissipation. The static current consumption is a total of leak currents, and its values are extremely small as listed in Table 1. Thus, the static current consumption is almost proportional to the supply voltage and increases exponentially in proportion to temperature. Table 1 Static Current Consumption ICC(max) Type HC series HCT series VCC +25˚C –40 to +85˚C 6.0 V 1.0 µA 10 µA FF 2.0 µA 20 µA MSI 4.0 µA 40 µA 1.0 µA 10 µA FF 2.0 µA 20 µA MSI 4.0 µA 40 µA SSI SSI 5.5 V 12. Dynamic Power Dissipation Assuming that the square pulse waves (tr = tf = 0) as shown in Figure 7 are applied to the input of the inverter shown in Figure 6, the output steps from “0” level to “1” level in response to the input fall from “1” level to “0” level. VCC ICC(P) Vin Vout ICC(N) CL GND Figure 6 Inveter circuit 23 Precautions in System Design T Vin Vout ICC(P) ICC(N) Figure 7 Operating Voltage and current of inverter circuit Actually, V OUT is not converted into square waveforms. The reason is that the sum total CL of the outputs such as external load capacitance and drain capacitance are inverted by charging them from 0 to VCC. For charging, supply current ICC(P) flows through the active P channel MOS from VCC. Contrary to this, when the input goes from “0” level to “1” level, C L discharges and ICC(N) flows into GND through the N channel MOS. The supply current caused by the charge/discharge is dynamic current dissipation, and the power dissipation is dynamic power dissipation. If the average power dissipation is taken as PT , it is obtained theoritically as follows: The power dissipation when ICC(P) flows into the P channel MOS in Figure 6 is ICC(P) (VCC - VOUT). If an average is taken by the one cycle of input pulse, the average power dissipation PTP of P channel MOS is: PTP = 1/T T ∫0 ICC(P) ⋅ (VCC - VOUT) dt I CC(P) = CL · d(V CC - VOUT )/dt In the same manner, the average power dissipation of N channel MOS is: PTN = 1/T T ∫0 ICC(N) ⋅ (VOUT - GND) dt I CC(N) = CL · d(V OUT - GND)/dt Thus, the average dynamic power dissipation PT is: PT = PTP + PTN = 1/T · CL · V CC2 = f · CL · V CC2 f : Input pulse frequency It is clear that the dynamic power dissipation varies with the frequency, load capacitance and supply voltage. Figure 8 shows the aspect. 24 Power Dissipation PT (mW) Precautions in System Design 100 10 CL = 150 pF CL = 50 pF 1.0 0.1 CL = 15 pF CL = OPEN 0.01 0.001 0.0001 1 k 10 k 100 k 1 M 10 M 100 M Operating frequency f (Hz) Figure 8 Power Dissipation VS. Operating Frequency This relation shows a case where the square wave input with tr = tf = 0 is assumed. In an actual case, the input pulse is considered a trapezoidal waveform. Thus, remember that the transition state in which both P channel MOS and N channel MOS are simultaneously activate and DC current flows from V CC into GND during this time. If input is used at an intermediate level, such as crystal oscillator circuit and a linear amplifier, and if the circuits such as a differentiation circuit, an integration circuit and an oscillation circuit process gentle waveforms, pay attention to the increase of power dissipation. 13. Caution of Supply Voltage To decouple noises, the capacitance of 0.01 to 0.1 (µF) should be attached externally between VCC and GND. 14. Caution of Fan-out The number of fan-outs of CMOS logic IC is virtually unlimited in terms of DC. The reason is that the input current is the P-N junction leak current of input protection circuit at most and its value is actually approximate to 0 because the input is connected to the gate electrodes and insulated from the substrate. Therefore, the number of fan-outs is not a problem in terms of DC. In AC, there is a slightly different circumstance. Since the input has a capacity of about 5 (pF), the output capacitance increases if the input is connected to the output. If the input capacitance is taken as 5 (pF), for example, the whole load capacitance CL (pF) at the time the number of fan-outs is n and load capacitance is CO (pF) is: C L = 5 • n + CO (pF) On the other hand, the propagation delay time increases in proportion to the output load capacitance CL. The operating speed decreases according to the number of inputs (fan-outs) connected to the output. Therefore, remember that the number of fan-outs is fairly limited if a high-speed operation is required. 25 Precautions in System Design 15. Cautions on Actual Operation (1) The rise time and fall time of input waveforms should be 500 ns or less. Since the voltage gain is very high near the threshold, the slightest ripples on the input voltage may cause the output to produce a corresponding waveform, making the output operation unstable. (2) The power line should be sufficiently filtered for the device. The input threshold voltage of the IC varies with the supply voltage. A ripple on the power line may change the input threshold, causing the same malfunction as noted in (1) above. (3) Beware of a ringing (waveform distortion). Because the switching from “1” level to “0” level on vice versa is very fast, the load capacitance plus the wiring inductance may cause a ringing. Care should be taken to arrange the circuit configuration, PCB layout and wiring appropriately. 26 Application Note Application Note 1. Input Protection Circuit An Si-gate process is applied to Hitachi’s high-speed CMOS logic ICs.They have a thinner gate oxide compared to conventional Al-gate CMOS logic ICs and are composed into finer patterns. Therefore, an input protection circuit is necessary for the gate to be protected from surges at the input pins. Since Al-gate CMOS logic ICs use a diffusion resistor as the input protection resistor (as shown in Figure 1a), input over-current flows directly to the power supply and the destruction of the protection diode may occur. On the other hand, using polysilicone as its input protection resistor (shown in Figure 1b), high-speed CMOS logic ICs take the role of a current limiter to counter input over voltage. Input Internal logic circuit VCC GND P+diffusion resistor N+ N sub Input + P diffusion resistor P well Internal logic circuit VCC GND (a) Al-gate CMOS logic Input Internal logic circuit GND VCC Poly-Si resistor Poly-Si resistor + P N sub + N diffusion resistor P well Input N+diffusion resistor Internal logic circuit VCC GND (b) Si-gate CMOS logic Figure 1 Input Protection Deevice and Equivalent Circuit 27 Application Note 2. Electric Static Discharge Immunity (ESD Immunity) ESD immunity is evaluated by the capacitor discharge method shown in the test circuit of Figure 2. The capacitor is 200 pF, accounting for the electrostatic capacitance of human bodies. Figure 3 shows an example of ESD immunity of integrated circuits for each products series. The ESD for high-speed CMOS logic is over ±200 V, which is the same level or better than LS-TTL. Test Pin C = 200 pF GND Figure 2 ESD Immunity Test Circuit 95 HD74HC/HCT Series (HS-CMOS) HD74S Series (S-TTL) HD74LS Series (LS-TTL) HD14000B Series (CMOS Logic) HD17000 Series (industrial linear) 8-bit microcomputer (CMOS) 256k DRAM (NMOS) 90 Accumulated failure rate 80 70 60 50 40 30 20 10 5 4 3 2 1 0 100 200 300 400 500 Applied voltage (V) Figure 3 ESD Immunity for Each Series 28 Application Note 3. Latch-Up 3.1 Latch-up Latch-up is an inevitable phenomenon occurring from the basical structure of CMOS logic ICs. Since CMOS has PMOS and NMOS on one chip, NPN and PNP transistors are made. These two types of transistors are combined into a PNPN structure, in which a parasitic thyristor is formed (see Figure 4). If excessive noise is applied to the input or output pins when the IC is operating, the parasitic thyristor will turn on and the abnormal current will flow through the power supply pin to ground. If the power supply is turned off, the IC will be restored to its normal state, however, the internal AI wiring of the IC may melt thus causing the IC to be destroyed. There are countermeasures to prevent latch-up as listed below (1) Separate PMOS from NMOS. (2) Shut down electrical paths between PNP and NPN transistors which form parasitic thyristors by its layout pattern. (3) Isolate each MOS transistor with an insulator to prevent the formation of parasitic thyristors. Hitachi’s high-speed CMOS logic utilizes method (2) VCC VCC In R1 Out γB1 P+ P+ P+ N+ Q1 N+ Q1 P+ Q2 Q2 γB2 R1 R2 N-sub (a) Parasitic PNP, NPN transistor (b) Equivalent circuit Figure 4 Parasitic Thyristor 29 Application Note 3.2 Latch-Up immunity Latch-up immunity is evaluated by the test circuit shown in Figure 5. Table 1 lists the test results of latch-up immunity of Hitachi’s high-speed CMOS logic. The starting voltage of high-speed CMOS logic is over ±300 V which causes almost no problems for practical use. ICC A VCC Test pin VCC = 7V C = 200pF All other input pins are connected to either VCC or GND. GND Figure 5 Latch-Up Immunity Test Circuit Table 1 Latch-Up Starting Voltage Test Results Latch-up starting voltage Positive Over 300 V Negative Over 300 V Measured samples HD74HC00 HD74HC02 HD74HC04 HD74HC08 HD74HC14 HD74HC32 HD74HC74 30 Application Note HD74HC138 HD74HC139 HD74HC157 HD74HC158 HD74HC175 HD74HC273 HD74HC373 HD74HC533 5 pieces per type 4. Electrical Characteristics 4.1 DC characteristics (1) Logic threshold voltage (VTH) The Logic threshold voltage (VTH) of Hitachi’s high-speed CMOS logic ICs (HD74HC Series) is at half the level of VCC in order to set up the widest noise margin possible. (2) Output current characteristics Hitachi’s high-speed CMOS logic ICs have symmetrical characteristics between IOH and IOL. Thus, the balance between t PLH and tPHL is mostly kept even when connecting with a comparatively large load capacitance. Figures 7 and 8 show the output current characteristics. 31 Application Note Output voltage VOUT (V) 6 VCC = 6 V VCC = 4.5 V 4 VCC = 2 V 2 2 0 4 6 Input voltage VIN (V) Figure 6 Output Voltage vs Input Voltage 120 120 100 Low output current IOL (mA) Low output current IOL (mA) VCC = 6 V 80 VCC = 6 V 60 4.5 V 40 100 80 4.5 V 60 40 20 20 2V 2V 0 2 4 Low output voltage VOL (V) (b) Standard output (HD74HC00) 6 0 2 6 (b) Bus driver output (HD74HC244) Figure 7 Output Current vs Voltage (Low Level) 32 4 Low output voltage VOL (V) Application Note 0 0 High output voltage IOH (mA) High output voltage IOH (mA) VCC = 2 V –20 4.5 V –40 6V –60 –80 VCC = 2 V –20 –40 4.5 V –60 6V –80 –100 –100 0 2 4 0 6 2 4 6 High output voltage VOH (V) High output voltage VOH (V) (a) Standard output (HD74HC00) (b) Bus driver output (HD74HC244) Figure 8 Output Current vs Voltage (High Level) 4.2 AC characteristics tPLH and tPHL of Hitachi’s high-speed CMOS logic ICs are set up to be about the same to simplify system timing design. (1) Propagation delay time, output rise and fall time vs supply voltage characteristics. 50 Ta = 25°C CL = 50 pF Propagation delay time tPLH, tPHL (ns) Propagation delay time tPLH, tPHL (ns) 50 20 tPLH 10 tPHL Ta = 25°C CL = 50 pF 20 tPHL 10 tPLH 5 5 0 2 4 Supply voltage VCC (V) (a) Standard output (HD74HC00) 6 0 2 4 6 Supply voltage VCC (V) (b) Bus driver output (HD74HC244) Figure 9 Propagation Delay Time vs Supply Voltage 33 Application Note 20 Ta = 25°C CL = 50 pF Output rise and fall time tTLH, tTHL (ns) Output rise and fall time tTLH, tTHL (ns) 20 10 tTLH 5 tTHL Ta = 25°C CL = 50 pF 10 2 tTHL tTLH 5 2 0 2 4 6 0 2 Supply voltage VCC (V) 4 6 Supply voltage VCC (V) Figure 10 Output Rise and Fall Time vs Supply Voltage (2) Propagation delay time, output rise and fall time vs load capacitance characteristics. 20 tPLH VCC = 4.5 V Ta = 25°C Propagation delay time tPLH, tPHL (ns) Propagation delay time tPLH, tPHL (ns) 20 tPHL 15 10 5 0 50 100 150 Load capacitance CL (pF) (a) Standard output (HD74HC00) 200 VCC = 4.5 V Ta = 25°C tPLH 15 tPHL 10 5 0 50 100 (b) Bus driver output (HD74HC244) Figure 11 Propagation Delay Time vs Load Capacitance 34 150 Load capacitance CL (pF) 200 Application Note 25 25 VCC = 4.5 V Ta = 25°C tTLH 20 20 tTLH Output rise and fall time tTLH, tTHL (ns) Output rise and fall time tTLH, tTHL (ns) VCC = 4.5 V Ta = 25°C tTHL 15 10 5 0 50 100 150 Load capacitance CL (pF) (a) Standard output (HD74HC00) 200 15 tTHL 10 5 0 50 100 150 200 Load capacitance CL (pF) (b) Bus driver output (HD74HC244) Figure 12 Output Rise and Fall Time vs Load Capacitance 35 Application Note 5. Power Dissipation 5.1 Calculating the power dissipation The power dissipation PT of high-speed CMOS logic can be calculated by (1). From this equation, the power dissipation depends on the load capacitance, frequency and supply voltage. PT = (CL + CPD)· f · VCC2 (1) Figure 13 shows examples of the operating frequency with the power supply current. CL = 50 pF Power supply current (per circuit) (mA) CL = 0 pF LS-TTL HD74LS74 1.0 CL = 50 pF CL = 0 pF 74 C 4H 7 0.1 c gi S HD lo O d ee CM sp h- g Hi 0.01 0 1.0 10 Operating frequency f (MHz) Figure 13 Operating Frequency vs Power Supply Current 36 Application Note 5.2 Power dissipation capacitance Power dissipation capacitance (Cpd) can be calculated by the following equations, PT1 = CPD · V CC2 · f1 = ICC1 · V CC (2) PT2 = CPD · V CC2 · f2 = ICC2 · V CC (3) therefore, CPD = PT2 – PT1 VCC 2 ⋅ (f2 – f1) 2 = ICC – ICC (4) 1 VCC ⋅ (f2 – f1) then, • • ICC1 : Supply current at frequency f1 ICC2 : Supply current at frequency f2 Table 2 lists the power dissipation capacitance of Hitachi’s high-speed CMOS logic. Furthermore, the power dissipation capacitance differs according to the input conditions. Table 3 shows typical examples. Table 2 Power Dissipation Capacitance of High-Speed CMOS Function Product part no. Note 1 Power dissipation capacitance typ. (pF) Gate HD74HC00 * 27 HD74HC04 * 24 D-type HD74HC74 * 41 J-K-type HD74HC76 * 49 COMPARATOR HD74HC85 P 48 DECORDER HD74HC138 P 90 COUNTER HD74HC161 P 57 BUFFER HD74HC240 * 42 MULTIPLEXER HD74HC258 P 78 LATCH HD74HC373 P 57 Flip-Flop Notes: 1. *:Per circuit; P:Per package. 2. Measurement circuit is shown in figure 14. 37 Application Note HD74HC00 HD74HC04 VCC VCC A A A B P.G. A Y Y P.G. VCC VCC HD74HC74 HD74HC76 A A fPG1 P.G.1 PR CLR CK Q fPG2 P.G.2 D Q J PR P.G. Q CK Q CLR fPG2=1/2PG1 HD74HC85 VCC HD74HC138 VCC A P.G. A<B A>B A=B A<B A>B Other A = B Inputs A P.G. G1 A B C G2A G2B Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Figure 14 Measurement Circuits for Dynamic Power Supply Current 38 Application Note VCC HD74HC240 HD74HC161 EP ET QA CLR QB LD QC CK A QD B Carry C D VCC HD74HC258 P.G. A Y VCC HD74HC373 A 1B S P.G. Other Inputs tr tr 90% 90% 10% 10% G A A P.G. VCC A 1Y 2Y 3Y 4Y P.G. EG 1D 2D 3D 4D 5D 6D 7D 8D OC 1Q 2Q 3Q 4Q 5Q 6Q 7Q 8Q Measurement conditions Ta = 25°C VCC = 6V f1 = 1MHz f2 = 5MHz duty = 50% tr = tf = 6ns Figure 14 Measurement Circuits for Dynamic Power Supply Current (cont) 39 Application Note Table 3 Power Dissipation Capacitance by Input Conditions Product part no. Input conditions HD74HC00 Single input Power dissipation capacitance (pF) 27 VCC A A B P.G. 27 Double input VCC A A B P.G. HD74HC161 57 Counting operation VCC A EP ET CLR LD CK A B C D P.G. QA QB QC QD Carry 113 Preset operation VCC A P.G.1 P.G.2 40 EP ET QA CLR QB CK QC A B QD C Carry D LD Application Note 6. Decoupling CMOS logic ICs have current spikes when switching. These spikes are produced by the repeated charging and discharging of the output capacitance when charging the output level from low to high or high to low. Because of the current spikes the potentials of VCC and GND change, and large current spikes flow when switching. Therefore ringing is produced at the output. (See Figure 15 a.) To prevent this, decoupling capacitors must be provided externally between VCC and GND. This is proven to be useful in instantly absorbing the current and ringing at the output as shown in Figure 15 b. Vertical 2 V/div Horizontal 100 ns/div Output voltage waveform GND VCC current waveform 0 Vertical 20 mA/div Horizontal 100 ns/div GND current waveform 0 (a) No decoupling capacitor (b) Decoupling capacitor (0.1 µF) Figure 15 HD74HC00 Spike Current Waveform 7. Precautions on Board Design High-speed CMOS logic has different electrical characteristics, such as switching speed and output current drivability, from the conventional standard logics (Al-gate CMOS, LS-TTL). The system design requires an application technique for high-speed CMOS logic. Here an interfacing technique between high-speed CMOS logic and LS-TTL will be explained. 7.1 Transmission line reflection (1) Analysis of transmission signals by the Bergeron diagram The Bergeron diagram is commonly used for the analysis of transmission signals in high-speed digital systems. Figure 17 is the analysis result of an actual transmission model which is shown in Figure 16. 41 Application Note As for the analysis conditions, Z0 = 125 Ω considering the standard system board, and the wiring length (l) is 1.5 m. The output impedance of the HD74HC04, which operates as a driver becomes the IOH - V OH characteristic curve when the output is high, and the input impedance of the HD74LS04 which operates as a receiver becomes the I IH - VIH characteristic curve. On the other hand, when the output level of the HD74HC04 is low, the output impedance becomes the IOL VOL characteristic curve and the input impedance becomes the IF - VF characteristic curve. The drawing of load line Z0 as these input/output impedance curves enables the reflection of the transmission signal to be analyzed. The intersection coordinates in Figure 17 shows the voltage and current values at the drive end of 2T (T being the propagation delay from the driver end to the receiver end) intervals when the coordinates are even numbers (2T, 4T) or zero, or the voltage and current values at the receiver end when the coordinates are odd numbers (T, 3T, 5T). Figure 18 shows the analysis result of the voltage waveform at the receiver end. 42 Application Note Driver Receiver l HD74HC240 HD74LS04 Z0 50 Ω l : 1.5 m Z0 : 125 Ω Voltage (V) (a) Digiral signal transmission model circuit +VP1 –VP2 +VP2 0 –VP1 time t (b) Receiver waveform model Note: The model circuit above (Figure 16a) is used for analysis when the high-speed CMOS logic HD74HC240 is connected as a driver, and the LS-TTL HD74LS04 as a receiver The waveform model for overshoot and undershoot at the receiver end is shown in Figure 16b. Figure 16 Digital Signal Transmission 43 Application Note V (V) 8 T 7 6 5T Z0 load line 2T 5 4T 0 4 3 3T HD74HC240 IOH – VOH characteristics 2 HD74HC240 IOL – VOL characteristics l : 1.5 m Z0 : 125 Ω Ta : 25°C 1 2T –100 –80 –60 –40 –20 3T 3T –1 20 40 60 80 100 I (mA) –2 HD74LS04 IF – VF characteristics Figure 17 Bergeron Diagram Analysis of the Transmission Model 8 7 Voltage (V) 6 5 4 3 2 +VP2 1 0 0 100 500 200 300 400 600 700 800 –1 Time t (ns) Figure 18 Analysis Results of the Waveform at the Receiver End (2) An example for measuring the reflection on the transmission line Figure 19 shows the measured results of the reflection of the transmission line using three types of transmission line media such as 1) coaxial cable (Z0 = 50 Ω), 2) twisted pair cable (Z 0 = 120 Ω), and 3) single lead wire (Z0 = 150 to 200 Ω). Figure 19 shows that the drivers and receivers operate normally with a wiring length of up to 2 m. However, careful precautions should be taken when considering impedance in practical system designing. 44 Application Note Waveform Driver HD74HC240 Waveform Waveform Wiring length l = 2 m HD74HC240 Receiver HD74LS04 PG 50 Ω Driving pulse ( for all inputs ) Coaxial cable Transmission line midium Driver HD74HC240 CL = 50 pF Note:The load circuit shown on the right is used when the HD74LS04 is used as a receiver. Receiver HD74HC240 Waveform Vertical Horizontal Driver HD74HC240 Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Measurement conditions VCC = 5 V Ta = 25°C f = 1 MHz duty = 50% tr = tf = 6 ns VCC RL = 1 kΩ , , 5 V/div 100 ns/div Receiver HD74HC240 Waveform GND Twisted pair cable (l = 2m) Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Single lead wire (l = 2m) (l = 2m) Figure 19 Reflection Ringing Waveforms (Driver: HD74HC240) 45 Application Note 7.2 Crosstalk Crosstalk is the capacitative coupling of signals from one line to another. Figure 20 shows an example of crosstalk noise levels using a twisted pair cable. Figure 20 also shows that the wiring length beyond 1 m causes malfunction. Careful precautions should be taken especially when the spacing between circuits is narrow. 46 Application Note Waveform Wiring length l PG 50 Ω CL = 50 pF Waveform2 Waveform3 Driver and receiver : HD74HC240 Vin CL = 50 pF Wiring lenght Vin = Low Waveform GND Waveform GND Waveform Waveform Waveform , Vertical 2 V/div Horizontal 100 ns/div GND GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND l = 1m Waveform Vertical 5 V/div Horizontal 100 ns/div Vin = High Waveform GND l = 2m Measurement conditions VCC = 5 V Ta = 25°C f = 1 MHz duty = 50% tr = tf = 6 ns Waveform l = 0.5m GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Waveform GND Figure 20 Crosstalk Noise Waveform (Driver: HD74HC240) 47 Application Note 8. Multivibrator The output pulse width (twq) of a multivibrator is determined by the external capacitance (cext) and external resistor (Rext), and calculated by the equation twq = K · Rext · Cext. The value of constant K determines the part number according to the JEDEC committee as listed in Table 4. Hitachi has 4 types of high-speed CMOS logic, HD74HC123A, 221, 423A, 4538. Constant K changes from the values of Table 4 when C ext is less than 0.01 µF. Figure 21 and 22 graph the output pulse width vs external capacitance, constant K vs power supply voltage characteristics of the HD74HC123A. Table 4 JEDEC SP of Multivibrators Product part no. Output pulse width 74HC123 t WQ = 0.45 · (Rext) · (Cext) 123A* t WQ = 1.0 · (Rext) · (Cext) 74HC221* t WQ = 0.7 · (Rext) · (Cext) 221A t WQ = 1.0 · (Rext) · (Cext) 74HC423 t WQ = 0.45 · (Rext) · (Cext) 423A* t WQ = 1.0 · (Rext) · (Cext) 74HC4538* t WQ = 0.7 · (Rext) · (Cext) Note: *Presently under mass production at Hitachi. 48 Application Note 100 m Rext = 1000 kΩ Ta = 25°C VCC = 5 V 100 kΩ Output pulse width tWQ (s) 10 m 10 kΩ 1m 1 kΩ 100 µ 10 µ 1µ 100 n 0.00001 µ 0.0001 µ 0.001 µ 0.01 µ 0.1 µ External capacitance Cext (F) 1.0 µ Figure 21 Output Pulse Width vs External Capacitance and Resistance 1.4 Rext = 10 kΩ Constant K Cext = 0.001 µF 1.2 Cext = 1 µF 1.0 0.8 0 Note: 4 2 Supply voltage VCC (V) 6 In order to prevent any malfunctions due to noise, connect a high-frequency performance capacitor between V CC and GND, and keep the wiring between the external components and Cext, Rext/Cext pins as short as possible. Figure 22 Constant K vs Supply Voltage 49 Application Note 9. Interfacing Hitachi’s high-speed CMOS logic has two types of input voltage levels, 74HC and 74HCT. The 74HC has a CMOS-type input level and the 74HCT has a TTL-type input level. Interfacing from high-speed CMOS logic to LS-TTL Since the output level of high-speed CMOS logic is of CMOS, the use of an interfacing circuit is not necessary. This is the same case for a microcomputer and memory IC with TTL input levels. VOH = 4.13V min > VIH = 2.0V min VOL = 0.37V max < VIL = 0.8V max VCC GND 74HC or 74HCT LS TTL Figure 23 Interfacing HS-CMOS to LS-TTL Interfacing from LS-TTL to high-speed CMOS logic (74HCT type) An interfacing circuit is not necessary. This is the same case for a microcomputer and memory IC with TTL output levels. VOH = 2.7V min > VIH = 2.0V min VOL = 0.4V max < VIL = 0.8V max VCC GND LS TTL 74HCT Figure 24 Interfacing LS-TTL to 74HCT Interfacing from LS-TTL to high-speed CMOS logic (74HC type) A pull-up resistor should be added as shown in Figure 25. The output voltage of LS-TTL (VOH) is 2.7 V (min), where as the input voltage of 74HC (VIH) is 3.15 V (min.). 50 Application Note This implies that LS-TTL cannot drive 74HC types directly. This is the same case for a microcomputer and memory ICs with TTL output levels. VOH = 2.7V min < VIH = 3.15V min VOL = 0.4V max < VIL = 1.35V max Pull-up resistor VCC R GND LS TTL 74HC Figure 25 Interfacing LS-TTL to 74HC Interfacing from LS-TTL with 3-state output to high-speed CMOS logic. A pull-up or pull-down resistor should be added as shown in Figure 26. When the output of a LS-TTL is in the high-impedance state, the input of the high-speed CMOS becomes unstable. This is the same case for all devices with a tri-state output structure. VCC GND LS TTL with 3-state output 74HC 74HCT Figure 26 Interfacing LS-TTL with 3-state Output to 74HC or 74HCT 51 Application Note 10. Surface Mount Package 10.1 Mounting small outline packages (SOP, TSSOP) The explanation on the mounting of SOPs describes the characteristics and reliabilities of the small IC package. (1) Dip Soldering Initially, the package is temporarily fixed on to the board by an adhesive. Adhesive agent PCB Adhesive agent applied Electrode SOP attached SOP Adhesive agent Cured Dip soldering Direction of movement Residual flux removed Finished product Assembly completed Wave solder (solder vessel for surface mounting) Figure 27 Process Flow for Dip Soldering SOP With the component side of the board downward, the package is then passed through molten solder. Figure 27 depicts the process flow for dip soldering SOP. As compared with reflow methods, this method exerts an extremely high thermal stress on the semiconductor chips. The adverse effects from this thermal should be avoided by providing a preheating zone to lessen the thermal shock and by minimizing the soldering time. Figure 28 shows a typical temperature profile for dip soldering. The dip soldering temperature is 260˚C maximum at a period of 10 seconds maximum (2 to 4 seconds is recommended). 52 Application Note Temperature Dipping Preheating 1 to 3 min 2 to 4 sec T(max) = 260°C Cooling Solder melting point PCB surface temperature 80 to 150°C Natural or forced air cooling Time Figure 28 Temperature Profile of Dip Soldering (2) Reflow Soldering Reflow soldering is the basic method of mounting the SOP on to a board. The solder composition to be used is Sn63/Pb37 or Sn62/Pb36/Ag2 with a melting point of 183˚C to 193˚C. A recommended pasty flux is solder cream SP210-2 by Tamura Kaken. A pasty flux and organic solvent are also used during the process. Be careful to reflow solder at a low temperature for short periods of time. The recommended conditions are shown below. The allowable board temperature is 230˚C maximum and the maximum heating time is 15 sec. (3) Footprint dimension vs solderability The failure rate of soldering is affected by footprint dimensions. Figure 29 shows the soldering failure with the footprint dimension. The recommended dimensions are within the safety zone of this figure. When reflow sordering SOPs, the recommended thickness of a footprint is 0.2 mm min. 53 Application Note Foot print L W 2.0 1.5 Safety 1.6 1.4 1.3 1.2 Bridge formed by solder Length of footprint L (mm) 1.7 SOP Displacement 1.8 e1 1.9 1.1 1.0 0.9 0.8 0.7 Lack of solder 0.6 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 Width of footprint W (mm) Notes: 1. 2. 3. Pin pitch = 1.27 mm Recommended spacings between footprint centers. e1 = 7.62 mm (SOP-14, 16) e1 = 9.53 mm (SOP-20) Both W and L are footprint dimensions based on the lead direction of the SOP. Figure 29 Recommended Dimension of Footprint (4) Thermal Resistance of SOP Figure 30 shows the derating curves for SOPs of high-speed CMOS logic, and Table 6 lists the thermal resistance (θj-a) for SOPs. 54 Application Note Maximnm continuous dissipation Pt (mW) Derating curve of 14/16-pin SOP 1136 1000 961 Wind No. velocity (1) 0m/s (2) 1m/s (3) 3m/s (3) (2) 785 681 576 500 468 Derating factor 6.3mW/°C 7.7mW/°C 9.1mW/°C (1) (2) (3) at Tj (max) = 150 °C (1) at Tj (max) = 100 °C 25 30 35 40 45 50 55 60 65 70 75 80 85 Operating Ambient Temperature Ta (°C) Derating curve of 20-pin SOP Wind Derating No. velocity factor (1) 0m/s 6.7mW/°C (2) 1m/s 9.1mW/°C (3) 3m/s 10.5mW/°C Maximnm continuous dissipation Pt (mW) 1312 1137 1000 (3) 835 767 (2) 682 (1) 502 500 (2) (1) at Tj (max) = 150 °C (3) at Tj (max) = 100 °C 25 30 35 40 45 50 55 60 65 70 75 80 85 Operating Ambient Temperature Ta (°C) Note: When Ta is below 25˚C, P T becomes the same value as at Ta = 25˚C being independent of Ta. The data above was measured by using the ∆ VBE method on a glass-epoxy board (40×40×1.0 mm) with wiring density of 10%. Careful considerations are required for input and load conditions, Ta, cooling, etc., during actual use. Figure 30 Derating Curves of SOP 55 Application Note Table 6 Thermal Resistance of SOPs Maximum continuous dissipation Ta = 25˚C Number of Thermal pins Wind velocity Derating factor resistance Tj(max) = 150˚C Tj(max) = 100˚C 14 0 m/s 6.3 mW/˚C 160 ˚C/W 785 mW 468 mW 16 1 m/s 7.7 mW/˚C 130 ˚C/W 961 mW 576 mW 3 m/s 9.1 mW/˚C 110 ˚C/W 1136 mW 681 mW 0 m/s 6.7 mW/˚C 150 ˚C/W 835 mW 502 mW 1 m/s 9.1 mW/˚C 110 ˚C/W 1137 mW 682 mW 3 m/s 10.5 mW/˚C 95 ˚C/W 1312 mW 787 mW 20 (5) Thermal Resistance of TSSOP Figure 31 shows the derating curve of TSSOP with HD74BC/AC/HC devices, table 7 shows the thermal resistance (θj-a) and figure 32 shows the mounting method. Derating Curves of Thin Small Outline Package Derating Curves of Thin Small Outline Package (14, 16, 20 and 24 Pins) at Tj (max) = 100°C (14, 16, 20 and 24 Pins) at Tj (max) = 150°C 1000 1000 Note: Tolerable Power Dissipation PT (mW) Tolerable Power Dissipation PT (mW) 862 517 24 pin 500 454 20 pin 300 14/16 pin 757 24 pin 20 pin 500 14/16 pin 0 25 30 35 40 45 50 55 60 65 70 75 80 85 0 25 30 35 40 45 50 55 60 65 70 75 80 85 Operating Temperature Ta (°C) Operating Temperature Ta (°C) Fore the ambient temperature less than 25˚C, the power dissipation at 25˚C is applied. The data above are measured by ∆ VBE method mounting on glass epoxy board (40 × 40 × 1.6 mm) with 10% of wiring density. In the actual application, using conditions, ambient temperature and forced air-cooling conditions should be sufficiently examined. Figure 31 Derating Curve of TSSOP 56 Application Note Table 7 Thermal Resistance of TSSOP Package Tolerable power dissipation Number of Thermal pins Wind velocity Derating factor resistance at Tj(max) = 150˚C at Tj(max) = 100˚C 14 0 m/s 4.0 mW/˚C 250˚C/W 500 mW 300 mW 20 0 m/s 6.1 mW/˚C 165˚C/W 757 mW 454 mW 24 0 m/s 6.9 mW/˚C 145˚C/W 862 mW 517 mW 16 235°C max 10sec max 140 to 160°C ≅ 60sec 1 to 4°C/sec 1 to 5°C/sec Surface Temperature of Package Surface Temperature of Package (6) TSSOP Solder Mounting 215°C 30sec max 140 to 160°C ≅ 60sec 1 to 5°C/sec Time Time Infrared-ray Reflow Recommended Conditions Vapor-phase Reflow Recommended Conditions Recommended:For the whole heating on solder mounting, infrared-ray reflow and vapor-phase reflow are recommended. (Solder-dipping is not recommended.) Figure 32 Mounting Method of TSSOP 57 Application Note (7) Marking on Package (a) Small outline Package (EIAJ) 14, 16, 20 pins YMWC BC YMWC A HD74BC Series YMWC AC HC HD74AC Series Lot No. Type No. HD74HC Series (b) Small outline Package (JEDEC) 14, 16, 20 pins YMWC YMWC BC A AC YMWC HC HD74AC Series HD74BC Series Lot No. Type No. HD74HC Series Note: Meaning of marking on package example device name: HD74BC245AT Y: Year code (the last digit of year) M: Month code W: Week code C: Control code Type No.: delete HD74 and package code (T) from device name (c) Thin Shrink Small outline Package 14, 16, 20 pins • 14, 16, 20 pins YMWC B C YMWC A HD74BC Series Note: A C HD74AC Series Meaning of marking on package example device name: HD74BC245AT Y: Year code (the last digit of year) M: Month code W: Week code C: Control code Type No.: delete HD74 and package code (T) from device name 58 YMWC H C HD74HC Series Lot No. Type No.