ETC 54F02LMQB

MILITARY DATA SHEET
Original Creation Date: 03/06/96
Last Update Date: 07/30/96
Last Major Revision Date: 03/06/96
MN54F02-X REV 1A0
QUAD 2 INPUT NOR
General Description
This device contains four independent gates, each of which performs the logic NOR
function.
Industry Part Number
NS Part Numbers
54F02
54F02DMQB
54F02FMQB
54F02LMQB
Prime Die
M002
Processing
Subgrp Description
MIL-STD-883, Method 5004
1
2
3
4
5
6
7
8A
8B
9
10
11
Quality Conformance Inspection
MIL-STD-883, Method 5005
1
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp ( oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
MILITARY DATA SHEET
MN54F02-X REV 1A0
(Absolute Maximum Ratings)
(Note 1)
Storage Temperature
-65 C to +150 C
Ambient Temperature under Bias
-55 C to +125 C
Junction Temperature under Bias
-55 C to +175 C
Vcc Pin Potential to Ground Pin
-0.5V to +7.0V
Input Voltage
(Note 2)
-0.5V to +7.0V
Input Current
(Note 2)
-30 mA to +5.0mA
Voltage Applied to Output in HIGH State (with Vcc=0V)
Standard Output
TRI-STATE Output
Current Applied to Output in LOW State (Max)
-0.5V to Vcc
-0.5V to +5.5V
twice the rated Iol(mA)
Note 1:
Note 2:
Absolute Maximum ratings are those values beyond which the device may be damaged or
have its useful life impaired. Functional operation under these conditions is not
implied.
Either voltage limit or current limit is sufficient to protect inputs.
Recommended Operating Conditions
Free Air Ambient Temperature
Commercial
Military
Supply Voltage
Military
Commercial
0 C to +70 C
-55 C to +125 C
+4.5V to +5.5V
+4.5V to +5.5V
2
MILITARY DATA SHEET
MN54F02-X REV 1A0
Electrical Characteristics
DC PARAMETER
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C
SYMBOL
PARAMETER
CONDITIONS
NOTES
PINNAME
MIN
MAX
UNIT
SUBGROUPS
IIH
Input High
Current
VCC=5.5V, VM=2.7V, VINH=5.5V
1, 3 INPUTS
20
uA
1, 2,
3
IBVI
Input High
Current
VCC=5.5V, VM=7.0V, VINH=5.5V
1, 3 INPUTS
100
uA
1, 2,
3
IIL
Input LOW Current
VCC=5.5V, VM=0.5V, VINH=5.5V
1, 3 INPUTS
-0.6
mA
1, 2,
3
VOL
Output LOW
Voltage
VCC=4.5V, VIH=2.0V, IOL=20mA,
VINH=5.5V
1, 3 OUTPUTS
0.5
V
1, 2,
3
VOH
Output HIGH
Voltage
VCC=4.5V, VIL=0.8V, IOH=-1.0mA,
VINH=5.5V
1, 3 OUTPUTS 2.5
V
1, 2,
3
IOS
Short-Circuit
Current
VCC=5.5V, VINL=0.0V, VM=0.0V,
VINH=5.5V
1, 3 OUTPUTS -60
-150
mA
1, 2,
3
VCD
Input Clamp Diode
Voltage
VCC=4.5V, IM=-18mA, VINH=5.5V
1, 3 INPUTS
-1.2
V
1, 2,
3
ICCH
Supply Current
VCC=5.5V, VINL=0.0V
1, 3 VCC
5.6
mA
1, 2,
3
ICCL
Supply Current
VCC=5.5V, VINH=5.5V
1, 3 VCC
13.0
mA
1, 2,
3
ICEX
Output HIGH
Leakage Current
VCC=5.5V, VINH=5.5V, VINL=0.0V,
VM=5.5V
1, 3 OUTPUTS
250
uA
1, 2,
3
AC PARAMETER
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pf, RL=500 OHMS, TR=2.5ns, TF=2.5ns SEE AC FIGS
tpLH
tpHL
Propagation Delay
Propagation Delay
Note 1:
Note 2:
Note 3:
Note 4:
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55/125C
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55/125C
2, 4 An/Bn
to On
2.5
5.5
ns
9
2, 4 An/Bn
to On
2.5
7.5
ns
10, 11
2, 4 An/Bn
to On
1.5
4.3
ns
9
2, 4 An/Bn
to On
1.5
6.5
ns
10, 11
Screen tested 100% on each device at -55C, +25C & +125C temperature, subgroups A1, 2,
3, 7 & 8.
Screen tested 100% on each device at +25C temperature only, subgroup 9.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C, & -55C
temperature, subgroups A1, 2, 3, 7 & 8.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C subgroup A9, & at +125C
& -55C temperature, subgroups 10 & 11.
3