NSC MNDM54LS20

MICROCIRCUIT DATA SHEET
Original Creation Date: 04/22/98
Last Update Date: 06/16/98
Last Major Revision Date: 04/22/98
MNDM54LS20-X REV 1A0
DUAL 4-INPUT NAND GATE
General Description
This device contains two independent gates, each of which performs the logic NAND
function.
Industry Part Number
NS Part Numbers
54LS20
DM54LS20E/883
DM54LS20J/883
DM54LS20W/883
Prime Die
L020
Processing
Subgrp Description
MIL-STD-883, Method 5004
1
2
3
4
5
6
7
8A
8B
9
10
11
Quality Conformance Inspection
MIL-STD-883, Method 5005
1
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Temp ( oC)
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
MICROCIRCUIT DATA SHEET
MNDM54LS20-X REV 1A0
Features
2
MICROCIRCUIT DATA SHEET
MNDM54LS20-X REV 1A0
(Absolute Maximum Ratings)
(Note 1)
Storage Temperature
-65 C to +150 C
Ambient Temperature under Bias
-55 C to +125 C
Input Voltage
-0.5V to +10.0V
VCC Pin Potential to Ground Pin
-0.5V to +7.0V
Junction Temperature under Bias
-55 C to +175 C
Current Applied to Output in LOW state (Max)
twice the rated Iol (ma)
Note 1:
Absolute Maximum ratings are those values beyond which the device may be damaged or
have its useful life impaired. Functional operation under these conditions is not
implied.
Recommended Operating Conditions
Free Air Ambient Temperature
Military
Supply Voltage
Military
-55 C to +125 C
+4.5V to +5.5V
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MICROCIRCUIT DATA SHEET
MNDM54LS20-X REV 1A0
Electrical Characteristics
DC PARAMETER
(The following conditions apply to all the following parameters, unless otherwise specified.)
DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C
SYMBOL
PARAMETER
CONDITIONS
NOTES
PINNAME
MIN
MAX
UNIT
SUBGROUPS
IIH
Input High
Current
VCC=5.5V, VM=2.7V, VINH=4.5V,
VINL=0.0V
1, 3 INPUTS
20.0
uA
1, 2,
3
IBVI
Input High
Current
VCC=5.5V, VM=10.0V, VINH=4.5V,
VINL=0.0V
1, 3 INPUTS
100
uA
1, 2,
3
IIL
Input LOW Current
VCC=5.5V, VM=0.4V, VINH=4.5V
1, 3 INPUTS
-0.4
mA
1, 2,
3
VOL
Output LOW
Voltage
VCC=4.5V, VIH=2.0V, IOL=4.0mA,
VINH=4.5V
1, 3 OUTPUTS
0.4
V
1, 2,
3
VOH
High Level Output
Voltage
VCC=4.5V, VIL=0.7V, VINH=4.5V,
IOH=-0.4mA
1, 3 OUTPUTS 2.5
V
1, 2,
3
IOS
Short Circuit
Output Current
VCC=5.5V, VINH=4.5V, VINL=0.0V,
VOUT=0.0V
1, 3 OUTPUTS -20.0
-100
mA
1, 2,
3
VCD
Input Clamp Diode
Voltage
VCC=4.5V, IM=-18mA, VINH=4.5V
1, 3 INPUTS
-1.5
V
1, 2,
3
ICCH
Supply Current
VCC=5.5V, VINL=0.0V
1, 3 VCC
0.8
mA
1, 2,
3
ICCL
Supply Current
VCC=5.5V, VINH=4.5V
1, 3 VCC
2.2
mA
1, 2,
3
-0.03
AC PARAMETER - 15pF
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=15pF, RL=2k ohms
Temp range: +25C
tpLH
Propagation Delay
VCC=5.0V
5
In to
On
10.0
ns
9
tpHL
Propagation Delay
VCC=5.0V
5
In to
On
15.0
ns
9
AC PARAMETER - 50pF
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pF, RL=2k ohms
Temp range: -55C to +125C
tpLH
tpHL
Propagation Delay
Propagation Delay
Note 1:
Note 2:
VCC=5.0V
VCC=5.0V
2, 4 In to
On
2.0
15.0
ns
9
2, 4 In to
On
2.0
20.0
ns
10, 11
2, 4 In to
On
2.0
17.0
ns
9
2, 4 In to
On
2.0
24.0
ns
10, 11
Screen tested 100% on each device at -55C, +25C & +125C temperature, subgroups A1, 2,
3, 7 & 8.
Screen tested 100% on each device at +25C temperature only, subgroup A9.
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MICROCIRCUIT DATA SHEET
MNDM54LS20-X REV 1A0
(Continued)
Note 3:
Note 4:
Note 5:
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C
temperature, subgroups A1, 2, 3, 7 & 8.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, subgroup A9.
Subgroups 10 & 11 are guaranteed, not tested.
Guaranteed, not tested.
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MICROCIRCUIT DATA SHEET
MNDM54LS20-X REV 1A0
Revision History
Rev
ECN #
1A0
M0001243 06/16/98
Rel Date
Originator
Changes
Linda Collins
Initial release: MNDM54LS20-X Rev. 1A0. Added note 4
to the AC (50pF) notes reference column. Reworded the
phrase in note 4 from 'and periodically at +125C &
-55C, subgroups 10 & 11' to 'Subgroups 10 & 11 are
guaranteed, not tested'.
6