DISCRETE SEMICONDUCTORS DATA SHEET PESDxL4UW series Low capacitance quadruple ESD protection array Product specification Supersedes data of 2003 Aug 15 2004 Apr 06 Philips Semiconductors Product specification Low capacitance quadruple ESD protection array PESDxL4UW series FEATURES DESCRIPTION • Uni-directional ESD protection of four lines or bi-directional ESD protection of 3 lines Low capacitance quadruple ESD protection array in a five pad SOT665 ultra small plastic package designed to protect up to four transmission or data lines from ElectroStatic Discharge (ESD) damage. • Reverse standoff voltage: 3.3 and 5 V • Low diode capacitance • Ultra low leakage current PINNING • Ultra small SOT665 surface mount package PIN • ESD protection >20 kV • IEC 61000-4-2; level 4 (ESD); 15 kV (air) or 8 kV (contact). DESCRIPTION 1 cathode 1 2 common anode 3 cathode 2 APPLICATIONS 4 cathode 3 • Cellular handsets and accessories 5 cathode 4 • Portable electronics • Computers and peripherals handbook, halfpage • Communication systems 5 4 5 4 • Audio and video equipment. MARKING TYPE NUMBER 1 MARKING CODE PESD3V3L4UW A2 PESD5V0L4UW A1 2 3 1 2 3 MDB678 Fig.1 Simplified outline (SOT665) and symbol. ORDERING INFORMATION PACKAGE TYPE NUMBER NAME PESD3V3L4UW − DESCRIPTION plastic surface mounted package; 5 leads PESD5V0L4UW 2004 Apr 06 2 VERSION SOT665 Philips Semiconductors Product specification Low capacitance quadruple ESD protection array PESDxL4UW series LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 60134). SYMBOL PARAMETER peak pulse current Ipp CONDITIONS MIN. MAX. UNIT 8/20 µs; notes 1 and 2 PESD3V3L4UW − 3 A − 2.5 A Ppp peak pulse power 8/20 µs; notes 1 and 2 − 30 W IFSM non-repetitive peak forward current tp = 1 ms; square pulse − 3.5 A IZSM non-repetitive peak reverse current tp = 1 ms; square pulse PESD3V3L4UW − 0.9 A PESD5V0L4UW − 0.8 A PESD5V0L4UW Ptot total power dissipation Tamb = 25 °C; note 3 − 250 mW PZSM non-repetitive peak reverse power dissipation tp = 1 ms; square pulse; see Fig.4 − 6 W Tstg storage temperature −65 +150 °C Tj junction temperature ESD electrostatic discharge − 150 °C IEC 61000-4-2 (contact discharge) 20 − kV HBM MIL-Std 883 10 − kV Notes 1. Non-repetitive current pulse 8/20 µs exponentially decaying waveform see Fig.5. 2. Pins 1, 3, 4 or 5 to pin 2. 3. Device mounted on standard printed-circuit board. ESD standards compliance IEC 61000-4-2, level 4 (ESD) >15 kV (air); >8 kV (contact) HBM MIL-Std 883, class 3 >4 kV THERMAL CHARACTERISTICS SYMBOL PARAMETER CONDITIONS VALUE UNIT Rth(j-a) thermal resistance from junction to ambient all diodes loaded 370 K/W Rth(j-sp) thermal resistance from junction to solder point one diode loaded; note 1 135 K/W all diodes loaded; note 1 125 K/W Notes 1. Solder point of common anode (pin 2). 2004 Apr 06 3 Philips Semiconductors Product specification Low capacitance quadruple ESD protection array PESDxL4UW series ELECTRICAL CHARACTERISTICS Tj = 25 °C unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT Per diode − 1 1.2 V PESD3V3L4UW − − 3.3 V PESD5V0L4UW − − 5 V VF forward voltage VRWM reverse stand-off voltage IRM V(CL)R reverse leakage current PESD3V3L4UW VRWM = 3.3 V − 75 300 nA PESD5V0L4UW VRWM = 5 V − 5 25 nA clamping voltage Ipp = 1 A; note 1 − − 8 V Ipp = 3 A; note 1 − − 12 V Ipp = 1 A; note 1 − − 10 V Ipp = 2.5 A; note 1 − − 13 V 5.32 5.6 5.88 V 6.46 6.8 7.14 V PESD3V3L4UW − − 200 Ω PESD5V0L4UW − − 100 Ω f = 1 MHz; VR = 0 V − 22 28 pF f = 1 MHz; VR = 5 V − 12 17 pF f = 1 MHz; VR = 0 V − 16 19 pF f = 1 MHz; VR = 5 V − 8 11 pF PESD3V3L4UW PESD5V0L4UW VBR IF = 200 mA breakdown voltage IZ = 1 mA PESD3V3L4UW PESD5V0L4UW rdiff Cd differential resistance IR = 1 mA diode capacitance PESD3V3L4UW PESD5V0L4UW Notes 1. Pins 1, 3, 4 or 5 to pin 2. 2004 Apr 06 4 Philips Semiconductors Product specification Low capacitance quadruple ESD protection array PESDxL4UW series MDB602 10 MDB601 26 Cd handbook, halfpage handbook, halfpage IZSM (pF) 22 (A) 18 PESD3V3L4UW 1 PESD3V3L4UW 14 PESD5V0L4UW PESD5V0L4UW 10 10−1 10−2 10−1 1 tp (ms) 6 10 1 0 2 3 4 5 VR (V) Tj = 25 °C; f = 1 MHz. Fig.2 Non-repetitive peak reverse current as a function of pulse time (square pulse). Fig.3 MDB603 102 handbook, halfpage Diode capacitance as a function of reverse voltage; typical values. MLE218 120 handbook, halfpage Ipp (%) PZSM 100 % Ipp; 8 µs (W) 80 e−t PESD3V3L4UW 10 50 % Ipp; 20 µs PESD5V0L4UW 40 1 10−2 10−1 1 tp (ms) 0 10 0 10 20 30 t (µs) 40 PZSM = VZSM x IZSM. VZSM is the non-repetitive peak reverse voltage at IZSM. Fig.4 Maximum non-repetitive peak reverse power dissipation as a function of pulse duration (square pulse). 2004 Apr 06 Fig.5 5 8/20 µs pulse waveform according to IEC 61000-4-5. Philips Semiconductors Product specification Low capacitance quadruple ESD protection array handbook, full pagewidth ESD TESTER RZ 450 Ω PESDxL4UW series RG 223/U 50 Ω coax 4 GHz DIGITAL OSCILLOSCOPE 10 × ATTENUATOR 50 Ω CZ 5 1 D.U.T. PESDxL4UW 2 IEC 61000-4-2 network CZ = 150 pF; RZ = 330 Ω 3 4 vertical scale = 200 V/div horizontal scale = 50 ns/div vertical scale = 5 V/div horizontal scale = 50 ns/div PESD5V0L4UW GND2 PESD3V3L4UW GND GND1 unclamped +1 kV ESD voltage waveform (IEC 1000-4-2 network) clamped +1 kV ESD voltage waveform (IEC 1000-4-2 network) GND GND vertical scale = 200 V/div horizontal scale = 50 ns/div vertical scale = 5 V/div horizontal scale = 50 ns/div unclamped −1 kV ESD voltage waveform (IEC 1000-4-2 network) clamped −1 kV ESD voltage waveform (IEC 1000-4-2 network) Fig.6 ESD clamping test set-up and waveforms. 2004 Apr 06 6 MDB605 Philips Semiconductors Product specification Low capacitance quadruple ESD protection array PESDxL4UW series PACKAGE OUTLINE Plastic surface mounted package; 5 leads SOT665 D E A X Y S S HE 5 4 A 1 2 e1 c 3 bp w M A Lp e detail X 0 1 2 mm scale DIMENSIONS (mm are the original dimensions) UNIT A bp c D E e e1 HE Lp w y mm 0.6 0.5 0.27 0.17 0.18 0.08 1.7 1.5 1.3 1.1 1.0 0.5 1.7 1.5 0.3 0.1 0.1 0.1 OUTLINE VERSION REFERENCES IEC JEDEC EIAJ ISSUE DATE 01-01-04 01-08-27 SOT665 2004 Apr 06 EUROPEAN PROJECTION 7 Philips Semiconductors Product specification Low capacitance quadruple ESD protection array PESDxL4UW series DATA SHEET STATUS LEVEL DATA SHEET STATUS(1) PRODUCT STATUS(2)(3) Development DEFINITION I Objective data II Preliminary data Qualification This data sheet contains data from the preliminary specification. Supplementary data will be published at a later date. Philips Semiconductors reserves the right to change the specification without notice, in order to improve the design and supply the best possible product. III Product data This data sheet contains data from the product specification. Philips Semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. Relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN). Production This data sheet contains data from the objective specification for product development. Philips Semiconductors reserves the right to change the specification in any manner without notice. Notes 1. Please consult the most recently issued data sheet before initiating or completing a design. 2. The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com. 3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status. DEFINITIONS DISCLAIMERS Short-form specification The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Life support applications These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Limiting values definition Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Right to make changes Philips Semiconductors reserves the right to make changes in the products including circuits, standard cells, and/or software described or contained herein in order to improve design and/or performance. When the product is in full production (status ‘Production’), relevant changes will be communicated via a Customer Product/Process Change Notification (CPCN). Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no licence or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. Application information Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification. 2004 Apr 06 8 Philips Semiconductors – a worldwide company Contact information For additional information please visit http://www.semiconductors.philips.com. Fax: +31 40 27 24825 For sales offices addresses send e-mail to: [email protected]. SCA76 © Koninklijke Philips Electronics N.V. 2004 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands R76/02/pp9 Date of release: 2004 Apr 06 Document order number: 9397 750 12933