bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 2 2A Single Input I C, Standalone Switch-Mode Li-Ion Battery Charger with Integrated Current Sense Resistor Check for Samples: bq24257, bq24258 FEATURES 1 • High-efficiency Switch-mode Charger with Integrated Current Sense Resistor • BC1.2 D+, D– Detection with Dead Battery Provision (DBP) Pin to Sync with External USB-PHI • USB Charging Compliant • Selectable Input Current Limit of 100 mA, 150 mA, 500 mA, 900 mA. 1.5 A, and 2 A • In Host Mode (after I2C™ Communication and Before Watchdog Timer Times Out) – Programmable Battery Charge Voltage (VBATREG) – Programmable Battery Charge Current (ICHG) – Programmable Input Current Limit (ILIM) – Programmable Input Voltage Based Dynamic Power Management Threshold (VIN_DPM) – Programmable Input Overvoltage Protection Threshold (VOVP) – Programmable Safety Timer. • In Standalone Mode (before I2C™ Communication and After Watchdog Timer Times Out) – Resistor Programmable ICHG up to 2 A With Current Monitoring Output (ISET) – Resistor Programmable ILIM up to 2 A With Current Monitoring Output (ILIM) – Resistor Programmable VIN_DPM (VDPM) 234 • • • • • • • • • • Watchdog Timer with Disable Bit Integrated 4.9 V, 50 mA LDO Complete System Level Protection – Input UVLO, Input Overvoltage Protection (OVP), Battery OVP, Sleep Mode, VIN_DPM – Input Current Limit – Charge Current Limit – Thermal Regulation and Thermal Shutdown – Voltage Based, JEITA Compatible NTC Monitoring Input – Safety Timer 20 V Maximum Input Voltage Rating 10.5 V Maximum Operating Input Voltage Low RDS(on) Integrated Sense Resistor for up to 2 A Charging Rate Open Drain Status Outputs Synchronous Fixed-frequency PWM Controller Operating at 3 MHz for Small Inductor Support AnyBoot Robust Battery Detection Algorithm Charge Time Optimizer for Improved Charge Times at any Given Charge Current APPLICATIONS • • • • Mobile Phones, Smart Phones MP3 Players Handheld Devices Portable Media Player DESCRIPTION The bq2425x is a highly integrated single-cell Li-Ion battery charger with integrated current sense resistor targeted for space-limited, portable applications with high capacity batteries. The single cell charger has a single input that operates from either a USB port or AC wall adapter for a versatile solution. BC1.2 compatible D+, Ddetection allows for recognition of CDP, DCP, SDP, and non-standard USB adapters. The use of an accessory dead battery provision (DBP) pin allows for the system to sync a dead battery state in order to enable or disable the BC1.2 detection in the event of an external USB-PHI. 1 2 3 4 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. NanoFree is a trademark of Texas Instruments. 2 I C is a trademark of NXP B.V. Corporation. All other trademarks are the property of their respective owners. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2013, Texas Instruments Incorporated bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. DESCRIPTION CONTINUED The bq24257 has two modes of operation: 1) I2C mode, and 2) Standalone mode. In I2C mode, the host can adjust the charge parameters and monitor the status of the charger operation. In Standalone mode, the external resistor sets the input current limit, charge current limit, and the input DPM level. This mode also serves as the default settings when a DCP adapter is present. The bq24257 enters host mode while the I2C registers are accessed and the watchdog timer has not expired (if enabled). The bq24258 has only one mode of operation which is the Standalone. In this mode, the external resistor sets the input current limit, charge current limit, and the input DPM level. This mode also serves as the default settings when a DCP adapter is present. The EN1, EN2, and EN3 pin is available in the bq24258 spin to support USB 3.0 compliance. The battery is charged in four phases: trickle charge, pre-charge, constant current and constant voltage. In all charge phases, an internal control loop monitors the IC junction temperature and reduces the charge current if the internal temperature threshold is exceeded. Additionally, a voltage-based, JEITA compatible battery pack thermistor monitoring input (TS) is included that monitors battery temperature for safe charging. CPMID 1µF PMID IN VBUS DD+ GND SW LO 1.0PH CIN CBOOT 33 nF 2.2PF VDPM 3 MHz PWM BOOT PGND D- CSIN 1PF D+ Rsns LDO BAT 1 PF System Load VGPIO 22PF LDO SCL SCL SDA SDA Host GPIO1 TS PACK+ + STAT PACK- GPIO2 /CE GPIO3 /PG ILIM 2 TEMP ISET Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 AVAILABLE OPTIONS D+/D– or EN1, EN2, EN3 Default VOREG VLOWV TS or DBP Termination (1) Device Default OVP bq24257 6.5V D+/D- 4.2V 3V TS bq24258 10.5 EN1, EN2, EN3 4.2V 3V TS (1) (2) Chem i2c Addr Default USB ILIM 10% Li / LiPo Yes 0x6A 100mA 10% LiFePO4 No 0x6A N/A (2) Default behavior unless changed via i2C. Selectable via the EN1, EN2, EN3 pins. ORDERING INFORMATION Part Number bq24257 bq24258 (1) (2) (1) IC Marking bq24257 bq24258 Package Ordering Number Quantity DSBGA-YFF bq24257YFFR 3000 DSBGA-YFF bq24257YFFT 250 QFN-RGE bq24257RGER 3000 QFN-RGE bq24257RGET 250 DSBGA-YFF (2) bq24258YFFR 3000 DSBGA-YFF (2) bq24258YFFT 250 (2) bq24258RGER 3000 QFN-RGE (2) bq24258RGET 250 QFN-RGE This product is RoHS compatible, including a lead concentration that does not exceed 0.1% of total product weight, and is suitable for use in specified lead-free soldering processes. In addition, this product uses package materials that do not contain halogens, including bromine (Br) or antimony (Sb) above 0.1% of total product weight. Product Preview Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 3 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com ABSOLUTE MAXIMUM RATINGS (1) over operating free-air temperature range (unless otherwise noted) Pin voltage range (with respect to PGND) MIN MAX IN –1.3 20 V SW –0.7 12 V PMID, BOOT –0.3 20 V CSIN, BAT, DPB, LDO, SCL, SDA, STAT, D+, D–, CE, ISET, ILIM, VDPM –0.3 7 V –0.3 BOOT relative to SW Output Current (Continuous) Output Sink Current UNIT 5 V IN 2 A CSIN, BAT 4 A 5 mA Operating free-air temperature range STAT –40 85 °C Junction temperature, TJ –40 125 °C Storage temperature, TSTG –65 150 °C Lead temperature (soldering, 10 s) 300 °C 2 kV ESD Rating human body model (2) (1) (2) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The human body model is a 100-pF capacitor discharged through a 1.5-kΩ resistor into each pin. RECOMMENDED OPERATING CONDITIONS All voltages are with respect to PGND if not specified. Currents are positive into, negative out of the specified pin. Consult Packaging Section of the data book for thermal limitations and considerations of packages. VIN MIN MAX IN voltage range 4.35 (1) IN operating voltage range (bq24258) 4.35 10.5 IN operating voltage range (bq24257) 4.35 6.5 18 UNITS V IIN Input current 2 A ICHG Current in charge mode, BAT 2 A IDISCHG Current in discharge mode, BAT 4 A RISET Charge current programming resistor range RILIM Input current limit programming resistor range TJ Operating junction temperature range, TJ (1) Ω 75 Ω 105 0 125 ºC The inherent switching noise voltage spikes should not exceed the absolute maximum rating on either the BOOT or SW pins. A tight layout minimizes switching noise. THERMAL INFORMATION THERMAL METRIC (1) bq24257 bq24258 YFF RGE θJA Junction-to-ambient thermal resistance 76.5 32.9 θJCtop Junction-to-case (top) thermal resistance 0.2 32.8 θJB Junction-to-board thermal resistance 44 10.6 ψJT Junction-to-top characterization parameter 1.6 0.3 ψJB Junction-to-board characterization parameter 43.4 10.7 θJCbot Junction-to-case (bottom) thermal resistance N/A 2.3 (1) 4 UNITS °C/W For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 ELECTRICAL CHARACTERISTICS bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INPUT CURRENTS VUVLO < VIN < VOVP and VIN > VBAT + VSLP, PWM switching, CE enable IIN IBAT Supply current from IN 13 mA VUVLO < VIN < VOVP and VIN > VBAT + VSLP, PWM switching, CE disable Battery discharge current in high impedance SYSOFF mode , (BAT, SW,SYS) 5 0°C< TJ < 85°C, High-Z Mode 170 225 μA 0°C< TJ < 85°C, VBAT = 4.2 V, VIN = 0 V or 5V, High-Z Mode 16 22 μA 1 μA mΩ 0°C< TJ < 85°C, VBAT = 4.2 V, VIN = 0V, SYSOFF Mode BATTERY CHARGER RSNS Internal battery charger MOSFET onresistance I2C mode VBATREG Measured from BAT to SYS, VBAT = 4.2V (WCSP) 20 30 Measured from BAT to SYS, VBAT = 4.2V (QFN) 30 40 Operating in voltage regulation, Programmable range SA mode TJ = 25°C Voltage regulation accuracy TJ = 0°C to 125°C 3.5 4.44 V 4.2 –0.5% 0.5% –0.75% 0.75% Fast charge current range VLOWV ≤ VBAT < VBATREG 500 2000 Fast charge current accuracy I2C mode –7% +7% ICHG_LOW Low Charge Current Setting Set via I2C 297 330 363 mA KISET Programmable fast charge current factor 232.5 250 267.5 AΩ VISET Maximum ISET pin voltage (in regulation) RISET-SHORT Short circuit resistance threshold ICHG ICHG = mA KISET RISET (0.5 A ≤ ICHG < 2 A) 0.42 Battery voltage rising bq24257 VLOWV Hysteresis for VLOWV IPRECHG Pr-charge current (VBATUVLO < VBAT < VLOWV) Ipre-charge is percentile of the external fast charge settings. Battery under voltage lockout threshold VBAT rising VBAT_UVLO 45 55 75 2.9 3 3.1 Battery voltage falling VBATSHRT Battery voltage rising Hysteresis for VBATSHRT Battery voltage falling IBATSHRT Trickle charge current (VBAT < VBATSHRT) tDGL(BATSHRT) Deglitch time for trickle charge tp precharge transition 10 12 2.37 2.5 2.63 Termination current threshold 1.9 Termination Current on SA only Termination current threshold tolerance tDGL(TERM) Deglitch time for charge termination Both rising and falling, 2-mV overdrive, tRISE, tFALL = 100 ns VRCH Recharge threshold voltage Below VBATREG tDGL(RCH) Deglitch time VBAT falling below VRCH, tFALL = 100 ns % ICHG V 200 mV 32 ms 2 2.1 V 100 25 ITERM V mV 8 Deglitch time for pre-charge to fast charge transition Battery short threshold Ω 100 Battery UVLO hysteresis tDGL(LOWV) V 35 mV 50 mA 256 us 10 %ICHG –10% 10% 64 70 115 ms 160 32 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 mV ms 5 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com ELECTRICAL CHARACTERISTICS (continued) bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT BATTERY DETECTION VBATREG_HI Battery detection high regulation voltage Same as VBATREG VBATREG V VBATREG_LO Battery detection low regulation voltage 360 mV offset from VBATREG VBATREG - 480mV V VBATDET_HI Battery detection comparator VBATREG = VBATREG_HI VBATREG - 120 mV V VBATDET_LO Battery detection comparator VBATREG = VBATREG_LO VBATREG + 120 mV V IDETECT Battery detection sink current) Always on during battery detection 7.5 tDETECT Battery detection time For both VBATREG_HI and VBATREG_LO 32 Tsafe Safety Timer Accuracy –10% mA ms 10% BATTERY CHARGER LiFePO4 (bq24258) VREG-OVCHG Over charge voltage regulation 3.76 3.8 3.84 V VFLT-CHG Float charge regulation 3.46 3.5 3.54 V VOVCHG Overcharge comparator for LiFePo 3.65 3.7 3.75 VBAT rising VOVCHG-HYS tDGL(OVCHG) VBAT falling Deglitch on the overcharge comparator V 300 mV 32 ms INPUT PROTECTION IIN Input current limiting IIN_LIMIT = 100 mA 90 95 100 IIN_LIMIT = 150 mA 135 142.5 150 IIN_LIMIT = 500 mA 450 475 500 IIN_LIMIT = 900 mA 810 860 910 IIN_LIMIT = 1500 mA 1400 1475 1550 IIN_LIMIT = 2000 mA 1850 1950 2050 ILIM = IIN_LIMIT = External ILIM Maximum input current limit programmable range for IN input KILIM Maximum input current factor for IN input VILIM Maximum ILIM pin voltage (in regulation) RILIM-SHORT Short circuit resistance threshold VREF_DPM VDPM_SHRT VUVLO tDGL(SLP) VOVP 6 240 270 2000 mA 300 AΩ V 105 Ω SA mode 4.2 10 V I2C mode 4.2 4.76 V 2% 65 VIN_DPM threshold accuracy Both I2C and SA mode -2% DPM regulation voltage External resistor setting only 1.15 VIN_DPM short threshold If VDPM is shorted to ground, VIN_DPM threshold will use internal default value IC active threshold voltage VIN rising IC active hysteresis VIN falling from above VUVLO Sleep-mode entry threshold, VSUPPLYVSLP RILIM 0.42 VIN_DPM threshold range VIN_DPM KILIM 500 ILIM = 500 mA to 2 A mA 83 1.2 1.25 0.3 3.15 3.35 V V 3.5 175 V mV VIN falling 0 50 100 mV Sleep-mode exit hysteresis VIN rising 40 100 160 mV Deglitch time for supply rising above VSLP+VSLP_EXIT Rising voltage, 2-mV over drive, tRISE = 100ns Input supply OVP threshold voltage (bq24258) IN rising IN_OVP -200mV IN_OVP IN_OVP +200mV Input supply OVP threshold voltage (bq24257) IN rising 6.3 6.5 6.7 VOVP hysteresis IN falling from VOVP 100 6.8 VBAT Submit Documentation Feedback 32 ms V mV Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 ELECTRICAL CHARACTERISTICS (continued) bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP Deglitch time for IN Rising above VOVP IN rising voltage, tRISE = 100ns Battery OVP threshold voltage VBAT threshold over VBATREG to turn off charger during charge VBATOVP hysteresis Lower limit for VBAT falling from above VBOVP 1 BOVP Deglitch Battery entering/exiting BOVP 1 RON(BLK) Internal blocking MOSFET onresistance Measured from IN to PMID (WCSP and QFN) RON(HS) Internal high-side MOSFET onresistance RON(LS) tDGL(OVP) VBOVP tDGL(BOVP) MAX UNIT 32 102.5 105 ms 107.5 % VBATREG ms PWM CONVERTER 60 100 mΩ Measured from IN to SW (WCSP and QFN) 100 150 mΩ Internal low-side MOSFET onresistance Measured from SW to PGND (WCSP and QFN) 110 165 mΩ ICbC Cycle-by-cycle current limit VSYS shorted 2.6 3.2 3.8 A fOSC Oscillator frequency 2.7 3 3.3 MHz DMAX Maximum duty cycle DMIN Minimum duty cycle TSHTDWN TREG 95% 0% Thermal trip 150 Thermal hysteresis 10 Thermal regulation threshold Charge current begins to cut off VLDO LDO Output Voltage VIN = 5.5V, ILDO = 0 to 50 mA ILDO Maximum LDO Output Current VLDO LDO Dropout Voltage (VIN – VLDO) °C 125 LDO 4.65 4.85 5.04 V 50 VIN = 5 V, ILDO = 50 mA mA 200 300 30 30.4 mV BATTERY-PACK NTC MONITOR VHOT High temperature threshold VTS falling VHYS(HOT) Hysteresis on high threshold VTS VWARM Warm temperature threshold VTS falling VHYS(WARM) Hysteresis on warm temperature threshold VTS rising VCOOL Cool temperature threshold VTS rising VHSY(COOL) Hysteresis on cool temperature threshold VTS falling VCOLD Low temperature threshold VTS rising VHYS(COLD) Hysteresis on low threshold VTS falling VTS_DIS TS disable threshold tDGL(TS) Deglitch time on TS change 29.6 1 rising 37.9 38.3 38.7 %VLDO 1 56.5 56.5 56.9 %VLDO 1 59.6 60 60.4 1 70 %VLDO 73 %VLDO %VLDO 32 ms INPUTS (DBP, EN1, EN2, EN3, CE, SCL, SDA) VIH Input high threshold VIL Input low threshold 1 V 0.4 V 0.4 V 1 uA STATUS OUTPUTS (STAT, PG, CHG) VOL Low-level output saturation voltage IO = 5 mA, sink current IIH High-level leakage current Hi-Z and 5 V applies TIMERS tSAFETY tWATCH-DOG 45 min safety timer 2700 s 6 hr safety timer 21600 s 9 hr safety timer 32400 s Watch dog timer 50 s Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 7 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com ELECTRICAL CHARACTERISTICS (continued) bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT D+, D– DETECTION IDP_SRC D+ current source for DCD DCD 7 13 µA RDM_DWN D– pull-down resistance for DCD DCD 14.25 24.8 kΩ VDP_LOW D+ low comparator threshold for DCD DCD 0.85 0.9 0.95 V VDP_SRC D+ source voltage for Primary Detection Primary Detection 0.5 0.6 0.7 V IDP_SRC_PD D+ source voltage output current for Primary Detection Primary Detection 200 IDM_SINK D– sink current for Primary Detection Primary Detection 50 100 150 µA VDAT_REF Primary Detection threshold Primary Detection 250 325 400 mV VLGC Primary Detection threshold Primary Detection 0.85 0.9 0.95 V VDM_SRC D– source voltage for Secondary Detection Secondary Detection 0.5 0.6 0.7 V IDM_SRC_PD D– source voltage output current for Secondary Detection Secondary Detection 200 IDP_SINK D+ sink current for Secondary Detection Secondary Detection 50 100 150 µA VDAT_REF Secondary Detection threshold Secondary Detection 250 325 400 mV VATT_LO Apple/TomTom detection low threshold Apple, TomTom Detection 1.8 1.85 1.975 V VATT_HI Apple/TomTom detection high threshold Apple, TomTom Detection 3.2 3.5 4.05 V CI Input Capacitance ID_LKG Leakage Current into D+/D– 8 µA µA D– , switch open 4.5 D+, switch open 4.5 pF D–, switch open -1 1 µA D+, switch open -1 1 µA Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 BLOCK DIAGRAM PMID Q1 LDO LDO IN Charge Pump Q2 VREF_CBCLIM ILIM _ + BOOT CbC Comparator IIN_LIM Amp _ VDPM + VREF_INLIM VIN_DPM Amp + VREF_DPM PWM LOOP SELECT COMPENSATION DRIVER _ Host SW + VDPM_DAC _ V LDO I2C Only Q3 TJ PGND + 125C ICHG Amp _ ISET + VBATREG Amp Sleep Comparator _ CSIN _ + VREF_BATREG VREF_ICHG VBAT +VSLP + VREF_TERM EN2 / D- + EN1 / D+ LDO Termination Comparator Input current limit decoder / D+ and DDecoder Q4 Recharge Comparator + Batt Detect Or Precharge Curent Source VBATREG ± 0.12V VBAT BAT SCL I2C Controller SDA Charge Pump CHARGE CONTROLLER / PG - BATSHORT Comparator STAT , + VBAT VBATSHRT Supplement Comparator V SYS + DISABLE VBAT V BSUP VLDO + /CE TS -10°C + TS 0°C + TS 10 °C + TS 45 °C + TS 60°C TS Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 9 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com B C CSIN PGND BAT CSIN SW IN SW SW PGND IN IN IN PGND 5 PMID CSIN 4 BOOT BAT BAT 3 ILIM 2 VDPM A 1 LDO PIN OUTS 24 23 22 21 20 19 /CE 1 18 SW D+ 2 17 SW D- 3 16 PGND bq24257 D ISET D- D+ /CE PMID E /PG SCL STAT VDPM BOOT AGND 4 15 PGND SDA 5 14 CSIN SCL 6 13 CSIN ISET BAT BAT BOOT PMID IN ILIM 12 TS LDO 11 ILIM PGND 10 /PG SDA 9 VDPM TS 24 23 22 21 20 19 STAT F 8 LDO 7 bq24257 WCSP A B C 1 2 3 4 5 BAT CSIN PGND SW IN BAT BAT CSIN CSIN PGND SW PGND SW IN IN /CE 1 18 SW NC 2 17 SW EN3 3 16 PGND bq24258 E /PG EN2 STAT VDPM BOOT F TS EN1 PGND LDO ILIM PGND EN1 5 14 CSIN EN2 6 13 CSIN 7 8 9 10 11 12 BAT PMID BAT /CE ISET PGND TS EN3 15 /PG ISET 4 STAT D AGND bq24258 WCSP 10 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 PIN FUNCTIONS PIN NAME bq24257 bq24257 bq24258 bq24258 YFF RGE YFF RGE I/O DESCRIPTION IN A5,B5,C5 19 A5,B5,C5 19 I Input power supply. IN is connected to the external DC supply (AC adapter or USB port). Bypass IN to PGND with >2 μF ceramic capacitor PMID D5 20 D5 20 I Connection between blocking FET and high-side FET. Connect a 1 μF capacitor from PMID to PGND as close to the PMID and PGND pins as possible SW A4,B4,C4 17-18 A4,B4,C4 17-18 O Inductor Connection. Connect to the switching side of the external inductor. BOOT E5 21 E5 21 I High Side MOSFET Gate Driver Supply. Connect a 0.033 μF ceramic capacitor (voltage rating > 15 V) from BOOT to SW to supply the gate drive for the high side MOSFETs. PGND A3,B3,C3, F3 15-16 A3,B3,C3, D3,F3 15-16 CSIN A2,B2,C2 13-14 A2,B2,C2 13-14 I System Voltage Sense and SMPS output filter connection. Connect CSIN to the system output at the output bulk capacitors. Bypass CSIN locally with at least 1 μF. BAT A1,B1,C1 11-12 A1,B1,C1 11-12 I/O Battery Connection. Connect to the positive terminal of the battery. Additionally, bypass BAT with at least 20 μF capacitor to GND. TS F1 9 F1 9 I Battery Pack NTC Monitor. Connect TS to the center tap of a resistor divider from LDO to GND. The NTC is connected from TS to GND. The TS function provides 4 thresholds for JEITA or PSE compatibility. See the NTC Monitor section for more details on operation and selecting the resistor values. VDPM E4 23 E4 23 I Input DPM Programming Input. Connect a resistor divider between IN and GND with VDPM connected to the center tap to program the Input Voltage based Dynamic Power Management threshold (VIN_DPM). The input current is reduced to maintain the supply voltage at VIN_DPM. The reference for the regulator is 1.2 V. Short pin to GND if external resistors are not desired—this sets a default of 4.36 V for the input DPM threshold. ISET D1 10 D1 10 I Charge Current Programming Input. Connect a resistor from ISET to GND to program the fast charge current. ILIM F5 22 F5 22 I Input Current Limit Programming Input. Connect a resistor from ILIM to GND to program the input current limit for IN. The current limit is programmable from 0.5A to 2A. ILIM has no effect on the USB input. If an external resistor is not desired, short to GND for a 2 A default setting. CE D4 1 D4 1 I Charge Enable Active-Low Input. Connect CE to a high logic level to place the battery charger in standby mode. EN1 -- -- F2 5 I EN2 -- -- E2 6 I Input Current Limit Configuration Inputs. Use EN1, EN2, and EN3 to control the maximum input current and enable USB compliance. See Table 1 for programming details. EN3 -- -- D2 3 I PG E1 8 E1 8 O Power Good Open Drain Output. /PG is pulled low when a valid supply is connected to IN. A valid supply is between VBAT+VSLP and VOVP. If no supply is connected or the supply is out of this range, /PG is high impedance. STAT E3 7 E3 7 O Status Output. STAT is an open-drain output that signals charging status and fault interrupts. STAT pulls low during charging. STAT is high impedance when charging is complete or the charger is disabled. When a fault occurs, a 256 μs pulse is sent out as an interrupt for the host. STAT is enabled/disabled using the EN_STAT bit in the control register. STAT will indicate recharge cycles. Connect STAT to a logic rail using an LED for visual indication or through a 10 kΩ resistor to communicate with the host processor. Power Ground terminal. Connect to the ground plane of the circuit. For QFN only, connect to the thermal pad of the IC. NC -- -- -- 2 SCL E2 6 -- -- Not connected SDA F2 5 D+ D3 2 -- -- I D- D2 3 -- -- I LDO F4 24 F4 24 O AGND -- 4 -- 4 I I2C Interface Clock. Connect SCL to the logic rail through a 10 kΩ resistor. I/O I2C Interface Data. Connect SDA to the logic rail through a 10 kΩ resistor. BC1.2 compatible D+/D- Based Adapter Detection. Detects DCP, SDP, and CDP. Also complies with the unconnected dead battery provision clause. D+ and D- are connected to the D+ and D- outputs of the USB port at power up. Also includes the detection of Apple™ and TomTom™ adapters where a 500mA input current limit is enabled. LDO output. LDO is regulated to 4.9 V and drives up to 50 mA. Bypass LDO with a 1μF ceramic Capacitor. LDO is enabled when VUVLO < VIN < 19 V. Analog Ground for QFN only. Connect to the thermal pad and the ground plane of the circuit. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 11 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com TYPICAL APPLICATION CIRCUITS CPMID 1µF PMID IN VBUS DD+ GND SW LO 1.0PH CIN CBOOT 33 nF 2.2PF VDPM 3 MHz PWM BOOT PGND D- CSIN 1PF D+ Rsns LDO BAT 1 PF System Load VGPIO 22PF LDO SCL SCL SDA SDA TS TEMP PACK+ + Host GPIO1 STAT PACK- GPIO2 /CE GPIO3 /PG ILIM ISET Figure 1. bq24257 Typical Application Circuit 12 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 CPMID 1µF PMID IN VIN SW LO 1.0PH CIN CBOOT 33 nF 2.2PF 3 MHz PWM VDPM BOOT PGND LDO CSIN 1 PF 1PF STAT Rsns /PG BAT System Load 22PF LDO Host GPIO EN1 GPIO EN2 GPIO EN3 GPIO /CE TS TEMP PACK+ + PACK- ILIM ISET Figure 2. bq24258 Typical Application Circuit Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 13 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com TYPICAL CHARACTERISTICS . Battery Detection Battery Removal VBAT = 3.8 V VIN = 5 V VREG = 4.2 V ICHG = 0.5 A ILIM = 1 A VBAT = 3.8 V VIN = 6 V VREG = 4.2 V ICHG = 1 A ILIM = 1 A Figure 3. Figure 4. Efficiency vs Battery Voltage System Voltage Regulation vs Load Current 88 4.350 ICHG = 2 A VIN = 5 V VREG = 4.2 V 86 84 4.345 4.340 VSYS-REG (V) Efficiency (%) 4.335 82 80 78 4.330 4.325 4.320 4.310 74 4.305 72 4.300 bq24257 0.0 70 2.9 3.1 3.3 3.5 3.7 3.9 4.1 VBAT (V) 0.5 1.5 ISYS (A) 2.0 2.5 C004 C001 Figure 5. Figure 6. Efficiency vs Output Current Efficiency vs Output Current 100 100 95 95 90 90 85 85 80 75 70 65 80 75 70 65 60 VIN ==55V V VIN 60 55 VIN ==77V V VIN 55 VREG = 4.2 V VIN ==10 V VIN 10V 50 0 200 400 600 800 1000 1200 1400 1600 1800 2000 Output Current (mA) VIN ==55V V VIN VIN ==77V V VIN VREG = 3.6 V VIN ==10 V VIN 10V 50 0 200 C002 Figure 7. 14 1.0 4.3 Efficiency (%) Efficiency (%) VIN = 5 V No Battery ILIM = 2 A VREG = 4.2 V No Bat Charge Disable 4.315 76 400 600 800 1000 1200 1400 1600 1800 2000 Output Current (mA) C003 Figure 8. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 TYPICAL CHARACTERISTICS (continued) . VBAT IQ Input IQ with Charge DIS and EN 18 20 VIN = 0 V Charge Enabled SYSOFF = 0 BAT & SYS are Shorted 14 IBAT ( A) 12 CE EN Charge EN and DIS No Battery and System 18 CE DIS 16 Input Current (mA) 16 10 8 6 4 14 12 10 8 6 2 4 0 2 0 ±2 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 VBAT (V) 5.0 0 C007 5 10 15 20 25 Input Voltage (V) Figure 9. Figure 10. Input IQ with Charge Enable and Hz Startup C008 500 Charge EN Hi-Z EN 450 Input Current ( A) 400 350 300 250 200 150 ICHG = 1 A ILIM = 1.5 A 100 ISYS = 0 A 50 VBAT = 3.6 V 0 0 5 10 15 20 Input Voltage (V) 25 C009 Figure 11. Figure 12. Input OVP Event with INT VDPM Startup, 4.2 V ICHG = 1 A ILIM = 1 A VBAT = 3.9 V VOVP = 10.5 V ICHG = 2 A ILIM = 0.5 A ISYS = 0 A VBAT = 3.6 V VDPM = 4.36 V Figure 13. Figure 14. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 15 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com TYPICAL CHARACTERISTICS (continued) . 1.0 µH CCM Operation ICHG = 1 A ISYS = 0 A VBAT = 3.3 V VIN = 5.2 V Figure 15. 16 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 CHARGE PROFILE The bq24257 family provides a switch-mode buck regulator with output non-power path and a charge controller to provide optimum performance over the full battery charge cycle. The control loop for the buck regulator has 6 primary feedback loops that can set the duty cycle: 1. Constant Current (CC) 2. Constant Voltage (CV) 3. Input Current (IILIM) 4. Input Voltage (VIN_DPM) 5. Die Temperature 6. Cycle by Cycle Current The feedback with the minimum duty cycle will be chosen as the active loop. The bq24257 supports a precision Li-Ion or Li-Polymer charging system for single-cell applications. The bq24257 includes an integrated charge sense resistor for highly accurate charge current sensing while reducing the external BOM requirements. The figure below illustrates a typical charge profile. Trickle Charge Precharge Current Regulation Phase (CC) Voltage Regulation Phase (CV) Termination VBATREG ICHG ICHG VCSIN VBAT VLOWV VBATSHRT IPRECHG ITERM IBATSHRT Charging on Charge done The bq24258 supports an advanced Lithium-Iron-Phosphate (LiFePO4) algorithm. This allows for the charger to source the charge current up to the VREG-OVCHG level before entering the float charge region. See below for the charge profile characteristics: Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 17 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Trickle Charge Precharge www.ti.com Current Regulation Phase (CC) VBATREG (3.8V) VOVRCHG (3.7V) VFLTCHG (3.5V) Discharge Float Charge ICHG ICHG VCSIN VBAT VLOWV VBATSHRT IPRECHG IBATSHRT EN1, EN2, EN3 Pins If the D+, D- detection pins are not used (bq24257), input current limit pins are available for GPIO control. The EN1, EN2, and EN3 pins are available in the bq24258 spin to support USB 3.0 compliance. When the input current limit pins change state, the VIN_DPM threshold changes as well. See Table 1 for details: Table 1. EN1, and EN2 Truth Table (1) (1) EN3 EN2 EN1 INPUT CURRENT LIMIT VINDPM THRESHOLD 0 0 0 0 0 500mA 4.36V 1 Externally programmed by ILIM (up to 2.0A) 0 Externally programmed VDPM 1 0 100mA 4.36V 0 1 1 Input Hi-Z None 1 0 0 900mA 4.36V 1 0 1 Externally programmed by ILIM (up to 2.0 A) Externally programmed VDPM 1 1 0 150mA 4.36V 1 1 1 Input Hi-Z None If EN3 = 0, it will be USB 2.0 compliant; If EN3 = 1, USB 3.0 compliant. I2C and STAND ALONE OPERATION The bq24257 series offers a unique feature when compared to traditional host mode chargers—the default input current limit, output current limit and VIN_DPM parameters can be set via external resistors. In traditional host mode chargers, the default parameters are programmed during manufacturing to set the i2c registers at a specific default. If an end application calls for an alternate default setting, the traditional charger is left with the only option of changing the parameters at the manufacturing stage. This may not always be acceptable. 18 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Figure 16 illustrates the behavior of the bq24257 when transitioning between i2c mode and stand alone mode (except for the bq24257). Battery or Input is Inserted No VIN or VBAT GOOD? Yes i2c command received? No ILIM=EN1/EN2 VDPM=External Default ISET=External Default Yes ILIM=Register Value VDPM=Register Value ISET=Register Value No 32s Watchdog Expired? Yes Figure 16. I2C and Stand Alone Mode Handoff Once the battery or input is inserted and above the good thresholds, the device will determines if an i2c command has been received in order to discern whether to operate from the i2c registers or the external settings. Note that the bq24257 does not have EN1/EN2 pins and therefore the input current limit will be based on the D+/D– results. When in host mode (i2c operation), the device will enter stand alone operation once the watchdog timer expires. External settings: ISET, ILIM and VIN_DPM The fast charge current resistor (RISET) can be set by using the following formula: K 250 RISET = ISET = IFC IFC (1) Where IFC is the desired fast charge current setting in Amperes. The input current limit resistor (RILIM) can be set by using the following formula: K 270 RILIM = ILIM = IIC IIC (2) Where IIC is the desired input current limit in Amperes. Based on the application diagram reference designators, the resistor R1 and R2 can be calculated as follows to set VIN_DPM: R + R2 R + R2 = 1.2 ´ 1 VIN _ DPM = VREF _ DPM ´ 1 R2 R2 (3) VIN_DPM should be chosen first along with R1. Choosing R1 first will ensure that R2 will be greater than the resistance chosen. This is the case since VIN_DPM should be chosen to be greater than 2x VREF_DPM. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 19 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com If resistors are not desired for BOM count reduction, the VDPM and the ILIM pins can be shorted to set the internal defaults. However, the ISET resistor must be populated as this will be interpreted as a fault. Table 2 summarizes the settings when the ILIM, ISET, and VIN_DPM pins are shorted to GND. Table 2. ILIM, VDPM, and ISET Short Behaviors PIN SHORTED BEHAVIOR ILIM Input current limit = 2A VDPM VIN_DPM = 4.36V ISET Fault—Charging Suspended BC1.2 D+/D– DETECTION The bq24257 includes a fully BC1.2 compatible D+/D– source detection. This detection supports the following types of ports: • DCP (dedicated charge port) • CDP (charging downstream port) • SDP (standard downstream port) • Apple™/TomTom™ ports This D+/D– detection algorithm does not support ACA (accessory charge adapter) identification, but the input current will default to 500mA when a charge port is attached to the ACA and bq24257 is connected to the OTG port. The D+/D– detection algorithm is only active when the device is in standalone mode (e.g. the host is not communicating with the device and the watch dog timer has expired). However, when the device is in host mode (that is, host is communicating via i2c to the device) writing a ‘1’ to register 0x04 bit location 4 (DPDM_EN) forces the device to perform a D+/D– detection on the next power port insertion. This allows the D+/D– detection to be enabled in both host mode and default mode. The D+/D– detection algorithm has 5 primary states. These states are termed the following: 1. Data Contact Detect 2. Primary Detection 3. Secondary Detection 4. Non-standard Adapter Detection (for Apple™ / TomTom™) 5. Detection Configuration The DCD state determines if the device has properly connected to the D+/D– lines. If the device is not in host mode and VBUS is inserted (or DPDM_EN is true) the device will enter the DCD state and enable the appropriate algorithm. If the DCD timer expires, the device will enter the Non-standard Adapter Detection (for Apple™ / TomTom™) state. Otherwise it will enter the Primary Detection state. When entering the Primary Detection state, the appropriate algorithm is enabled to determine whether to enter the secondary detection state for DCP and CDP or the secondary detection state for SDP/Non-Standard adaptors. The non-standard adapter detection state for Apple™ / TomTom™ tests for the unique conditions for these nonstandard adapters. If the algorithm passes the unique conditions found with these adapters, it will proceed to the Detection Configuration state. Otherwise it will revert back to the primary detection state. The secondary detection state determines whether the input port is a DCP, CDP, SDP, or other non-standard adapters. If the Primary Detection state indicated that the input port is either a DCP or CDP, the device will enable the appropriate algorithm to differentiate between the two. If the Primary Detection state indicated that the input port is either a SDP or non-standard adapter, the device will enable the appropriate algorithm to differentiate between these two ports. Once complete, the device will continue to the Detection Configuration state. 20 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 DCP Settings No VBAT > VBATGD? Yes Turn on V DP_SRC And keep it on until CLR_VDP is set to ‘1’ in i2c DCP External ILIM Start 6 hr timer Non Standard Adapter SDP Settings CDP Settings VBAT > VBATGD Yes No Turn on VDP_SRC And keep it on until CLR_VDP is set to ‘1’ CDP and weak battery CDP and good battery SDP and weak battery SDP and good battery Apple/TT or Non-Standard IILIM=100mA Start 45 min timer IILIM=1500mA Start 6 hr timer IILIM=100mA Start 45 min timer Hi-Z mode IILIM=0.5A Start 6 hr timer Detection Done. Set detection status in register Figure 17. Detection Configuration State The detection configuration state sets the input current limit of the device along with the charge timer. The exception to the CDP and the SDP settings are due to the Dead Battery Provision (DBP) clause for unconnected devices. This clause states that the device can pull a maximum of 100mA when not connected due to a dead battery. During the battery wakeup time, the device sources a voltage on the D+ pin in order to comply with the DBP clause. Once the battery is good, the system can clear the D+ pin voltage by writing a ‘1’ to address 0x07 bit position 4 (CLR_VDP). The device must connect to the host within 1sec of clearing the D+ pin voltage per the DPB clause. A summary of the input current limits and timer configurations for each charge port type are found in Table 3. Table 3. D+, D– Detection Results per Charge Port Type CHARGE PORT TYPE INPUT CURRENT LIMIT CHARGE TIMER DCP External ILIM 6 hours 45 minutes CDP Dead Battery 100 mA CDP Good Battery 1500 mA 6 hours SDP Dead Battery 100 mA 45 minutes SDP Good Battery Hi-Z N/A Non-Standard 500 mA 6 hours TRANSIENT RESPONSE The bq2425x includes an advanced hybrid switch mode control architecture. When the device is regulating the charge current (fast-charge), a traditional voltage mode control loop is used with a Type-3 compensation network. However, the bq2425x switches to a current mode control loop when the device enters voltage regulation. Voltage regulation occurs in three charging conditions: 1) Minimum system voltage regulation, 2) Battery voltage regulation (IBAT < ICHG), and 3) Charge Done. This architecture allows for superior transient Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 21 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com performance when regulating the voltage due to the simplification of the compensation when using current mode control. The below transient response plot illustrates a 0 A to 2 A load step with 4.7 ms full cycle and 12% duty cycle. A 3.9 V Li-Ion battery is used. The input voltage is set to 5 V, charge current is set to 0.5 A and the input current is limited to 0.5 A. . Note that a high line impedance input supply was used to indicate a realistic input scenario (adapter and cable). This is illustrated by the change in VIN seen at the input of the IC. The figure shows a ringing at both the input voltage and the input current. This is caused by the input current limit speed up comparator. Figure 18. 2A Load step Transient AnyBoot Battery Detection The bq24257, bq24258 family includes a sophisticated battery detection algorithm used to provide the system with the proper status of the battery connection. The AnyBoot battery algorithm also guarantees the detection of voltage based battery protectors that may have a long closure time (due to the hysteresis of the protection switch and the cell capacity). The AnyBoot battery detection algorithm is utilizes a dual-voltage based detection methodology where the system rail will switch between two primary voltage levels. The period of the voltage level shift is 64ms and therefore the power supply rejection of the down-system electronics will see this shift as essentially DC. The AnyBoot algorithm has essentially 3 states. The 1st state is used to determine if the device has terminated with a battery attached. If it has terminated due to the battery not being present, then the algorithm moves to the 2nd and 3rd states. The 2nd and 3rd states shift the system voltage level between 4.2V and 3.72V. In each state there are comparator checks to determine if a battery has been inserted. The two states guarantees the detection of a battery even if the voltage of the cell is at the same level of the comparator thresholds. The algorithm will remain in states 2 and 3 until a battery has been inserted. The flow diagram details for the Anyboot algorithm are shown in Figure 19. 22 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Enter Battery Detection BATREG = Vreg setting – 480mV No VBAT > BATREG+120mV? Yes Yes Battery Detected, STAT register updated, and PTM mode aborted (if enabled) Yes Battery Detected, STAT register updated and Exit Battery Detection Yes Battery Detected, STAT register updated and Exit Battery Detection 32ms Timer Expired? No No 25ms Timer Expired? Yes BATREG = 4.2V No VBAT < 4.08V? Yes 32ms Timer Expired? No No 25ms Timer Expired? Yes ONLY ON FIRST LOOP ITERATION “No Battery” Condition BATREG = 4.2V Update STAT Registers and send Fault Pulse Yes EN_PTM=1 and NVM_EN_PTM=1? Enter PTM mode Exit Battery Detection No BATREG = 3.72V No VBAT > 3.84V? Yes 32ms Timer Expired? No No 25ms Timer Expired? Yes Figure 19. AnyBoot Battery Detection Flow Diagram Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 23 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com Input Voltage Based DPM During normal charging process, if the input power source is not able to support the programmed or default charging current, the supply voltage deceases. Once the supply drops to VIN_DPM, the input current limit is reduced down to prevent the further drop of the supply. When the IC enters this mode, the charge current is lower than the set. This feature ensures IC compatibility with adapters with different current capabilities without a hardware change. Sleep Mode The bq2425x enters the low-power sleep mode if the voltage on VIN falls below sleep-mode entry threshold, VBAT + VSLP, and VIN is higher than the under-voltage lockout threshold, VUVLO. This feature prevents draining the battery during the absence of VIN. When VIN < VBAT + VSLP, the bq2425x turns off the PWM converter, turns on the battery FET, sends a single 256 μs pulse is sent on the STAT and INT outputs and the FAULT/STAT bits of the status registers are updated in the I2C. Once VIN > VBAT + VSLP with the hysteresis, the FAULT bits are cleared and the device initiates a new charge cycle. Input Over-Voltage Protection The bq2425x provides over-voltage protection on the input that protects downstream circuitry. The built-in input over-voltage protection to protect the device and other components against damage from over voltage on the input supply (Voltage from VIN to PGND). When VIN > VOVP, the bq2425x turns off the PWM converter, turns the battery FET, sends a single 256 μs pulse is sent on the STAT and INT outputs and the FAULT/STAT bits of the status registers and the battery/supply status registers are updated in the I2C. Once the OVP fault is removed, the FAULT bits are cleared and the device returns to normal operation. The OVP threshold for the bq2425x is programmable from 6.5 V to 10.5 V using VOVP bits in register #7. NTC MONITOR (contact the local TI representative for function availability) The bq24257 includes the integration of an NTC monitor pin that complies with the JEITA specification (PSE also available upon request). The voltage based NTC monitor allows for the use of any NTC resistor with the use of the circuit shown below: LDO R2 TS NTC R3 Figure 20. Voltage Based NTC Circuit The use of R3 is only necessary when the NTC does not have a beta near 3500K. When deviating from this beta, error will be introduced in the actual temperature trip thresholds. The trip thresholds are summarized below which are typical values provided in the specification table. Table 4. Ratiometric TS Trip Thresholds for JEITA Compliant Charging 24 VHOT 30.0% VWARM 38.3% VCOOL 56.5% VCOLD 60% Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 When sizing for R2 and R3, it is best to solve two simultaneous equations that ensure the temperature profile of the NTC network will cross the VHOT and VCOLD thresholds. The accuracy of the VWARM and VCOOL thresholds will depend on the beta of the chosen NTC resistor. The two simultaneous equations are shown below: %VCOLD æ R3 RNTC ö TCOLD ÷ ç ç R3 + RNTC ÷ TCOLD ø = è ´ 100 æ R3 RNTC ö TCOLD ÷ ç + R2 ç R3 + RNTC ÷ TCOLD ø è %VHOT æ R3 RNTC ö THOT ÷ ç ç R3 + RNTC ÷ THOT ø = è ´ 100 æ R3 RNTC ö THOT ÷ ç + R2 ç R3 + RNTC ÷ THOT ø è (4) Where the NTC resistance at the VHOT and VCOLD temperatures must be resolved as follows: ( b 1 -1 TCOLD To RNTC TCOLD RNTC THOT = Ro e ( β 1 -1 THOT To =Ro e ) ) (5) To be JEITA compliant, TCOLD must be 0°C and THOT must be 60°C. If an NTC resistor is chosen such that the beta is 4000K and the nominal resistance is 10kΩ, the following R2 and R3 values result from the above equations: R2 = 5 kΩ R3 = 9.82 kΩ Figure 21 illustrates the temperature profile of the NTC network with R2 and R3 set to the above values. Example NTC Network Profile of %LDO vs. TEMP 60 Tcool LDO Percent (%) 55 50 45 40 Twarm 35 30 0 10 20 30 40 50 60 Temperature (C) Figure 21. Voltage Based NTC Circuit Temperature Profile For JEITA compliance, the TCOOL and TWARM levels are to be 10°C and 45°C respectively. However, there is some error due to the variation in beta from 3500K. As shown above, the actual temperature points at which the NTC network crosses the VCOOL and VWARM are 13°C and 47°C respectively. This error is small but should be considered when choosing the final NTC resistor. Once the resistors are configured, the internal JEITA algorithm will apply the below profile at each trip point for battery voltage regulation and charge current regulation. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 25 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com 4.25V max 4.20V typ 4.10V max 4.06V typ Charge voltage No charge V BATREG No charge Maximum Charge Current: 1C 0.5C ICHG Charge current No charge No charge 0°C (cold) 10°C (cool) Temperature 45°C (warm) 60°C (hot) Figure 22. JEITA Profile for Voltage and Current Regulation Loops Production Test Mode To aid in end mobile device product manufacturing, the bq24257 includes a Production Test Mode (PTM), where the device is essentially a DC-DC buck converter. In this mode the input current limit to the charger is disabled and the output current limit is limited only by the inductor cycle-by-cycle current (e.g. 3.5A). The PTM mode can be used to test systems with high transient loads such as GSM transmission without the need of a battery being present. As a means of safety, the Anyboot algorithm will determine if a battery is not present at the output prior to enabling the PTM mode. If a battery is present and the software attempts to enter PTM mode, the device will not enable PTM mode. Fault Modes The bq2425x family includes several hardware fault detections. This allows for specific conditions that could cause a safety concern to be detected. With this feature, the host can be alleviated from monitoring unsafe charging conditions and also allows for a “fail-safe” if the host is not present. Table 5 summarizes the faults that are detected and the resulting behavior. Table 5. Fault Condition Fault Condition Charger Behavior Safety Timer Behavior Input OVP VSYS and ICHG Disabled Suspended Input UVLO VSYS and ICHG Disabled Reset Sleep (VIN < VBAT) VSYS and ICHG Disabled Suspended TS Fault (Batter Over Temp) VSYS Active and ICHG Disabled Suspended Thermal Shutdown VSYS and ICHG Disabled Suspended Timer Fault VSYS Active and ICHG Disabled Reset No Battery VSYS Active and ICHG Disabled Suspended ISET Short VSYS Active and ICHG Disabled Suspended Input Fault and LDO Low VSYS and ICHG Disabled Suspended Safety Timer At the beginning of charging process, the bq24257 starts the safety timer. This timer is active during the entire charging process. If charging has not terminated before the safety timer expires, the IC enters suspend mode where charging is disabled. The safety timer time is selectable using the I2C interface. A single 256μs pulse is sent on the STAT and INT outputs and the FAULT/ bits of the status registers are updated in the I2C. This function prevents continuous charging of a defective battery if the host fails to reset the safety timer. The safety timer runs at 2x the normal rate under the following conditions: Pre-charge or linear mode (minimum system voltage mode), during thermal regulation where the charge current is reduced, during TS fault where the charge current reduced due to temperature rise on the battery, input current limit. The safety timer is suspended during OVP, TS fault where charge is disabled, thermal shut down, and sleep mode. 26 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Watchdog Timer In addition to the safety timer, the bq24257 contains a 50-second watchdog timer that monitors the host through the I2C interface. Once a write is performed on the I2C interface, a watchdog timer is reset and started. The watchdog timer can be disabled by writing “0” on WD_EN bit of register #1. Writing “1” on that bit enables it and reset the timer. If the watchdog timer expires, the IC enters DEFAULT mode where the default charge parameters are loaded and charging continues. The I2C may be accessed again to re-initialize the desired values and restart the watchdog timer as long as the safety timer has not expired. Once the safety timer expires, charging is disabled. Thermal Regulation and Thermal Shutdown During the charging process, to prevent overheat of the chip, bq2425x monitors the junction temperature, TJ, of the die and begins to taper down the charge current once TJ reaches the thermal regulation threshold, TREG. The charge current is reduced when the junction temperature increases about above TREG. Once the charge current is reduced, the system current is reduced while the battery supplements the load to supply the system. This may cause a thermal shutdown of the IC if the die temperature rises too. At any state, if TJ exceeds TSHTDWN, bq2425x suspends charging and disables the buck converter. During thermal shutdown mode, PWM is turned off, all timers are suspended, and a single 256 μs pulse is sent on the STAT and INT outputs and the FAULT/STAT bits of the status registers are updated in the I2C. A new charging cycle begins when TJ falls below TSHTDWN by approximately 10°C. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 27 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com REGISTER MAPPING AND DESCRIPTION Register #1 Memory location: 00, Reset state: x0xx xxxx BIT • • • • 28 NAME Read/Write FUNCTION B7(MSB) WD_FAULT Read only Read: 0 – No fault 1 – WD timeout if WD enabled B6 WD_EN Read/Write 0 – Disable 1 – Enable (also resets WC timer) B5 STAT_1 Read only B4 STAT_0 Read only B3 FAULT_3 Read only B2 FAULT_2 Read only B1 FAULT_1 Read only B0(LSB) FAULT_0 Read only 00 – 01 – 10 – 11 – Ready Charge in progress Charge done Fault 0000 – 0001 – 0010 – 0011 – 0100 – 0101 – 0110 – 0111 – 1000 – 1001 – 1010 – Normal Input OVP Input UVLO Sleep Battery Temperature (TS) Fault Battery OVP Thermal Shutdown Timer Fault No Battery connected ISET short Input Fault & LDO Low WD_FAULT – ‘0’ indicates no watch dog fault has occurred, where a ‘1’ indicates a fault has previously occurred. WD_EN – Enables or disables the internal watch dog timer. A ‘1’ enables the watch dog timer and a ‘0’ disables it. STAT – Indicates the charge controller status FAULT – Indicates the faults that have occurred. If multiple faults occurred, they can be read by sequentially addressing this register (e.g. reading the register 2 or more times). Once all faults have been read and the device is in a non-fault state, the fault register will show “Normal”. Regarding the "Input Fault & LDO Low" , the IC will indicates this fault if the LDO is low and at the same time the input is below UVLO or coming out of UVLO with LDO still low. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Register #2 Memory location: 01, Reset state: 1010 1100 BIT • • • • • NAME Read/Write FUNCTION Write: 1 – Reset all registers to default values 0 – No effect B7(MSB) Reset Write only B6 IIN_ILIMIT_2 Read/Write B5 IIN_ILIMIT_1 Read/Write B4 IIN_ILIMIT _0 Read/Write B3 EN_STAT Read/Write 0 – Disable STAT function 1 – Enable STAT function B2 EN_TERM Read/Write 0 – Disable charge termination 1 – Enable charge termination B1 CE Read/Write 0 – Charging is enabled 1 – Charging is disabled B0(LSB) HZ_MODE Read/Write 0 – Not high impedance mode 1 – High impedance mode 000 – USB2.0 host with 100mA current limit 001 – USB3.0 host with 150mA current limit 010 – USB2.0 host with 500mA current limit 011 – USB3.0 host with 900mA current limit 100 – Charger with 1500mA current limit 101 – Charger with 2000mA current limit 110 – External ILIM current limit(5) 111- No input current limit with internal clamp at 3A (PTM MODE) IIN_LIMIT – Sets the input current limit level. When in host mode this register sets the regulation level. However, when in standalone mode (e.g. no i2c writes have occurred after power up or the WD timer has expired) the external resistor setting for IILIM sets the regulation level. EN_STAT – Enables and disables the STAT pin. When set to a ‘1’ the STAT pin is enabled and function normally. When set to a ‘0’ the STAT pin is disabled and the open drain FET is in HiZ mode. EN_TERM – Enables and disables the termination function in the charge controller. When set to a ‘1’ the termination function will be enabled. When set to a ‘0’ the termination function will be disabled. When termination is disabled, there are no indications of the charger terminating (i.e. STAT pin or STAT registers). CE – The charge enable bit which enables or disables the charge function. When set to a ‘0’, the charger operates normally. When set to a ‘1’, the charger is disables by turning off the BAT FET between SYS and BAT. The SYS pin continues to stay active via the switch mode controller if an input is present. HZ_MODE – Sets the charger IC into low power standby mode. When set to a ‘1’, the switch mode controller is disabled but the BAT FET remains ON to keep the system powered. When set to a ‘0’, the charger operates normally. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 29 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com Register #3 Memory location: 02, Reset state: 1000 1111 BIT NAME Read/Write B7(MSB) VBATREG_5 (1) Read/Write Battery Regulation Voltage: 640mV (default 1) B6 VBATREG_4 (1) Read/Write Battery Regulation Voltage: 320mV (default 0) B5 VBATREG_3 (1) Read/Write Battery Regulation Voltage: 160mV (default 0) B4 VBATREG_2 (1) Read/Write Battery Regulation Voltage: 80mV (default 0) B3 VBATREG_1 (1) Read/Write Battery Regulation Voltage: 40mV (default 1) B2 (1) (1) • • VBATREG_0 FUNCTION Read/Write Battery Regulation Voltage: 20mV (default 1) B1(4)(5) USB_DET_1/EN1 Read Only B0(LSB) USB_DET_0/EN0 Read Only Return USB detection result or pin EN1/EN0 status – 00 – DCP detected / EN1=0, EN0=0 01 – CDP detected / EN1=0, EN0=1 10 – SDP detected / EN1=1, EN0=0 11 – Apple/TT or non-standard adaptor detected/EN1=1, EN0=1 Charge voltage range is 3.5V—4.44V with the offset of 3.5V and step of 20mV (default 4.2V) VBATREG – Sets the battery regulation voltage USB_DET/EN – Provides status of the D+/D– detection results for spins that include the D+/D– pins or the state of EN1/EN2 for spins that include the EN1/EN2 pins. Register #4 Memory location: 03, Reset state: 0000 0000 BIT NAME Read/Write B7(MSB) ICHG_4 (1) (2) Read/Write Charge current 800mA – (default 0) B6 ICHG_3 (1) (2) Read/Write Charge current: 400mA – (default 0) B5 ICHG_2 (1) (2) Read/Write Charge current: 200mA – (default 0) B4 ICHG_1 (1) (2) Read/Write Charge current: 100mA – (default 0) B3 ICHG_0 (1) (2) Read/Write Charge current: 50mA – (default 0) B2 ITERM_2 (3) Read/Write Termination current sense threshold: 100mA (default 0) B1 ITERM_1 (3) Read/Write Termination current sense threshold: 50mA (default 0) B0(LSB) ITERM_0 (3) Read/Write Termination current sense threshold: 25mA (default 0) (1) (2) (3) • • 30 FUNCTION Charge current offset is 500mA and default charge current is 500mA (maximum is 2.0A) When all bits are 1’s, it is external ISET charging mode Termination threshold voltage offset is 50mA. The default termination current is 50mA if ICHG is selected from I2C. Otherwise, termination is set to 10% in external I_set mode with +/-10% accuracy. ICHG – Sets the charge current regulation ITERM – Sets the current level at which the charger will terminate Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Register #5 Memory location: 04, Reset state: xx00 x010 BIT NAME Read/Write B7(MSB) LOOP_STATUS1 (1) Read Only B6 LOOP_STATUS0 (1) Read Only B5 LOW_CHG Read/Write 0 – Normal charge current set by 03h 1 – Low charge current setting 330mA (default 0) B4 DPDM_EN Read/Write 0 – Bit returns to 0 after D+/D– detection is performed 1 – Force D+/D– detection (default 0) B3 CE_STATUS Read Only 0 – CE low 1 – CE high B2 VINDPM_2 (2) Read/Write Input VIN-DPM voltage: 320mV (default 0) B1 VINDPM_1 (2) Read/Write Input VIN-DPM voltage: 160mV (default 1) B0(LSB) VINDPM_0 (2) Read/Write Input VIN-DPM voltage: 80mV (default 0) (1) (2) • • • • FUNCTION 00 – 01 – 10 – 11 – No loop is active that slows down timer VIN_DPM regulation loop is active Input current limit loop is active Thermal regulation loop is active LOOP_STATUS bits show if there are any loop is active that slow down the safety timer. If a status occurs, these bits announce the status and do not clear until read. If more than one occurs, the first one is shown VIN-DPM voltage offset is 4.20V and default VIN_DPM threshold is 4.36V. LOOP_STATUS – Provides the status of the active regulation loop. The charge controller allows for only one loop can regulate at a time. LOW_CHG – When set to a ‘1’, the charge current is reduced 330mA independent of the charge current setting in register 0x03. When set to ‘0’, the charge current is set by register 0x03. DPDM_EN – Forces a D+/D– detection routine to be executed once a ‘1’ is written. This is independent of the input being supplied. CE_STATUS – Provides the status of the CE pin level. If the CE pin is forced high, this bit returns a ‘1’. If the CE pin is forced low, this bit returns a ‘0’. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 31 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com Register #6 Memory location: 05, Reset state: 101x 1xxx • • • • 32 BIT NAME Read/Write B7(MSB) 2XTMR_EN Read/Write 0 – Timer not slowed at any time 1 – Timer slowed by 2x when in thermal regulation, VIN_DPM or DPPM (default 1) FUNCTION B6 TMR_1 Read/Write B5 TMR_2 Read/Write Safety Timer Time Limit 00 – 0.75 hour fast charge 01 – 6 hour fast charge (Default 01) 10 – 9 hour fast charge 11 – Disable safety timers B4 SYSOFF Read/Write 0 – SYSOFF disabled 1 – SYSOFF enabled B2 TS_STAT2 Read only B1 TS_STAT1 Read only B0(LSB) TS_STAT0 Read only TS Fault Mode: 000 – Normal, No TS fault 100 – TS temp < TCOLD (Charging suspended for JEITA and Standard TS) 101 – TFREEZE < TS temp < TCOLD (Charging at 3.9V and 100mA and only for PSE option only) 110 – TS temp < TFREEZE (Charging suspended for PSE option only) 111 – TS open (TS disabled) 2xTMR_EN – When set to a ‘0’, the 2x Timer function is enabled and allows for the timer to be extended if a condition occurs where the charge current is reduced (that is, VIN_DPM, thermal regulation, and so on). When set to a ‘1’, this function is disabled and the normal timer will always be executed independent of the current reduce conditions. SYSOFF – When set to a ‘1’ and the input is removed, the internal battery FET is turned off in order to reduce the leakage from the BAT pin to less than 1µA. Note that this disconnects the battery from the system. When set to a ‘0’, this function is disabled. TS_EN – Enables and disables the TS function. When set to a ‘1’ the TS function is disabled otherwise it is enabled. Only applies to spins that have a TS pin. TS_STAT – Provides status of the TS pin state for spins that have a TS pin. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Register #7 Memory location: 06, Reset state: 1110 0000 for the bq24258 and 0010 0000 for the bq24257. BIT NAME Read/Write B7(MSB) VOVP_2 Read/Write B6 VOVP_1 Read/Write B5 VOVP_0 Read/Write B4 CLR_VDP Read/Write FUNCTION OVP voltage: 000 – 6.0V; 001 – 6.5V; 010 – 7.0V; 011 – 8.0V 100 – 9.0V; 101 – 9.5V; 110 – 10.0V; 111 –10.5V 0 – Keep D+ voltage source on during DBP charging 1 – Turn off D+ voltage source to release D+ line B3 FORCE_BATDET Read/Write B2 FORCE_PTM Read/Write B1 N/A Read/Write B0(LSB) N/A Read/Write 0 – Enter the battery detection routine only if TERM is true or EN_PTM is true 1 – Enter the battery detection routine • • • • 0 – PTM mode is disabled 1 – PTM mode is enabled if OTP_EN_PTM=1 VOVP – Sets the OVP level CLR_VDP – When the D+/D– detection has finished, some cases require the D+ pin to force a voltage of 0.6V. This bit allows the system to clear the voltage prior to any communication on the D+/D– pins. A ‘1’ clears the voltage at the D+ pin if present. FORCE_BATDET – Forces battery detection and provides status of the battery presence. A logic ‘1’ enables this function. FORCE_PTM – Puts the device in production test mode (PTM) where the input current limit is disabled. Note that a battery must not be present prior to using this function. Otherwise the function will not be allowed to execute. A logic ‘1’ enables the PTM function. Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 33 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com APPLICATION INFORMATION Inductor Selection The inductor selection depends on the application requirements. The bq2425x is designed to operate at around 1 µH. The value will have an effect on efficiency, and the ripple requirements, stability of the charger, package size, and DCR of the inductor. The 1 μH inductor provides a good tradeoff between size and efficiency and ripple. Once the inductance has been selected, the peak current is needed in order to choose the saturation current rating of the inductor. Make sure that the saturation current is always greater than or equal to the calculated IPEAK. The following equation can be used to calculate the current ripple ΔIL = {VBAT (VIN – VBAT)}/(VIN x ƒs x L) (6) Then use current ripple to calculate the peak current as follows: IPEAK = ILOAD x (1 + ΔIL/2) (7) In this design example, the regulation voltage is set to 4.2 V, the input voltage is 5 V and the inductance is selected to be 1 µH. The maximum charge current that can be used in this application is 1 A and can be set by I2C command. The peak current is needed in order to choose the saturation current rating of the inductor. Using equation 6 and 7, ΔIL is calculated to be 0.224 A and the inductor peak current is 1.112 A. A 22 µF BAT cap is needed and 1 µF SYS cap is needed on the system trace. The default settings for external fast charge current and external setting of current limit are chosen to be IFC = 500 mA and ILIM = 1 A. RISET and RILIM need to be calculated using Equation 1 and Equation 2. The fast charge current resistor (RISET) can be set as follows: RISET = 250/0.5A = 500 Ω (8) The input current limit resistor (RILIM) can be set as follows: RILIM = 270/1A = 270 Ω (9) The external settings of VIN_DPM can be designed by calculating R1 and R2 according to equation 3 in this data sheet and the typical application circuit. VIN_DPM should be chosen first along with R1. VIN_DPM is chosen to be 4.6 V and R1 is set to 274KΩ in this design example. Using Equation 3, the value of R2 is calculated to be 100 KΩ. In this design example, the application needs to be JEITA compliant. Thus, TCOLD must be 0°C and THOT must be 60°C. If an NTC resistor is chosen such that the beta is 4500 K and the nominal resistance is 13 KΩ, the calculated R2 and R3 values are 5 KΩ and 8.8 KΩ respectively. These results are obtained from Equation 4 and Equation 5. Layout Guidelines 1. Place the BOOT, PMID, IN, BAT, and LDO capacitors as close as possible to the IC for optimal performance. 2. Connect the inductor as close as possible to the SW pin, and the SYS/CSIN cap as close as possible to the inductor minimizing noise in the path. 3. Place a 1-μF PMID capacitor as close as possible to the PMID and PGND pins, making the high frequency current loop area as small as possible. 4. The local bypass capacitor from SYS/CSIN to GND must be connected between the SYS/CSIN pin and PGND of the IC. This minimizes the current path loop area from the SW pin through the LC filter and back to the PGND pin. 5. Place all decoupling capacitors close to their respective IC pins and as close as possible to PGND (do not place components such that routing interrupts power-stage currents). All small control signals must be routed away from the high-current paths. 6. To reduce noise coupling, use a ground plane if possible, to isolate the noisy traces from spreading its noise all over the board. Put vias inside the PGND pads for the IC. 7. The high-current charge paths into IN, Micro-USB, BAT, SYS/CSIN, and from the SW pins must be sized appropriately for the maximum charge current to avoid voltage drops in these traces. 8. For high-current applications, the balls for the power paths must be connected to as much copper in the board as possible. This allows better thermal performance because the board conducts heat away from the IC. 34 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 bq24257 bq24258 www.ti.com SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 Figure 23. Recommended bq2425x PCB Layout for WCSP Package Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 35 bq24257 bq24258 SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013 www.ti.com PACKAGE SUMMARY YFF Package (Top View) YFF Package Symbol (Top Side Symbol for bq2425x) A1 A2 A3 A4 A5 B1 B2 B3 B4 B5 C1 C2 C3 C4 C5 D1 D2 D3 D4 D5 E1 E2 E3 E4 E5 F1 F2 F3 F4 F5 TI YMLLLLS bq24257 D E TI YMLLLLS bq24258 0-Pin A1 Marker, TI-TI Letters, YM- Year Month Date Code, LLLL-Lot Trace Code, S-Assembly Site Code The bq2425x devices are available in a 30-bump chip scale package (YFF, NanoFree™). The package dimensions are: D – 2.427mm ±0.035mm E – 2.027mm ±0.035mm REVISION HISTORY Changes from Original (February 2013) to Revision A • Changed from a Product Brief to full data sheet .................................................................................................................. 1 Changes from Revision A (March 2013) to Revision B • 36 Page Page Changed the Product Preview data sheet ............................................................................................................................ 1 Submit Documentation Feedback Copyright © 2013, Texas Instruments Incorporated Product Folder Links: bq24257 bq24258 PACKAGE OPTION ADDENDUM www.ti.com 7-Jul-2013 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Pins Package Drawing Qty Eco Plan Lead/Ball Finish (2) MSL Peak Temp Op Temp (°C) Device Marking (3) (4/5) BQ24257RGER ACTIVE VQFN RGE 24 3000 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 BQ24257 BQ24257RGET ACTIVE VQFN RGE 24 250 Green (RoHS & no Sb/Br) CU NIPDAU Level-2-260C-1 YEAR -40 to 85 BQ24257 BQ24257YFFR PREVIEW DSBGA YFF 30 3000 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 BQ24257 BQ24257YFFT PREVIEW DSBGA YFF 30 250 Green (RoHS & no Sb/Br) SNAGCU Level-1-260C-UNLIM -40 to 85 BQ24257 (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 7-Jul-2013 continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 2 PACKAGE MATERIALS INFORMATION www.ti.com 6-Jul-2013 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant BQ24257RGER VQFN RGE 24 3000 330.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2 BQ24257RGET VQFN RGE 24 250 180.0 12.4 4.25 4.25 1.15 8.0 12.0 Q2 Pack Materials-Page 1 PACKAGE MATERIALS INFORMATION www.ti.com 6-Jul-2013 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) BQ24257RGER VQFN RGE 24 3000 367.0 367.0 35.0 BQ24257RGET VQFN RGE 24 250 210.0 185.0 35.0 Pack Materials-Page 2 D: Max = 2.418 mm, Min =2.357 mm E: Max = 2.018 mm, Min =1.957 mm IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily performed. TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the third party, or a license from TI under the patents or other intellectual property of TI. Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered documentation. Information of third parties may be subject to additional restrictions. Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice. TI is not responsible or liable for any such statements. Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use of any TI components in safety-critical applications. In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and requirements. Nonetheless, such components are subject to these terms. No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties have executed a special agreement specifically governing such use. Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and regulatory requirements in connection with such use. TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of non-designated products, TI will not be responsible for any failure to meet ISO/TS16949. Products Applications Audio www.ti.com/audio Automotive and Transportation www.ti.com/automotive Amplifiers amplifier.ti.com Communications and Telecom www.ti.com/communications Data Converters dataconverter.ti.com Computers and Peripherals www.ti.com/computers DLP® Products www.dlp.com Consumer Electronics www.ti.com/consumer-apps DSP dsp.ti.com Energy and Lighting www.ti.com/energy Clocks and Timers www.ti.com/clocks Industrial www.ti.com/industrial Interface interface.ti.com Medical www.ti.com/medical Logic logic.ti.com Security www.ti.com/security Power Mgmt power.ti.com Space, Avionics and Defense www.ti.com/space-avionics-defense Microcontrollers microcontroller.ti.com Video and Imaging www.ti.com/video RFID www.ti-rfid.com OMAP Applications Processors www.ti.com/omap TI E2E Community e2e.ti.com Wireless Connectivity www.ti.com/wirelessconnectivity Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2013, Texas Instruments Incorporated