TI BQ24257RGET

bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
2
2A Single Input I C, Standalone Switch-Mode Li-Ion Battery Charger with Integrated
Current Sense Resistor
Check for Samples: bq24257, bq24258
FEATURES
1
• High-efficiency Switch-mode Charger with
Integrated Current Sense Resistor
• BC1.2 D+, D– Detection with Dead Battery
Provision (DBP) Pin to Sync with External
USB-PHI
• USB Charging Compliant
• Selectable Input Current Limit of 100 mA,
150 mA, 500 mA, 900 mA. 1.5 A, and 2 A
• In Host Mode (after I2C™ Communication and
Before Watchdog Timer Times Out)
– Programmable Battery Charge Voltage
(VBATREG)
– Programmable Battery Charge Current
(ICHG)
– Programmable Input Current Limit (ILIM)
– Programmable Input Voltage Based
Dynamic Power Management Threshold
(VIN_DPM)
– Programmable Input Overvoltage
Protection Threshold (VOVP)
– Programmable Safety Timer.
• In Standalone Mode (before I2C™
Communication and After Watchdog Timer
Times Out)
– Resistor Programmable ICHG up to 2 A With
Current Monitoring Output (ISET)
– Resistor Programmable ILIM up to 2 A With
Current Monitoring Output (ILIM)
– Resistor Programmable VIN_DPM (VDPM)
234
•
•
•
•
•
•
•
•
•
•
Watchdog Timer with Disable Bit
Integrated 4.9 V, 50 mA LDO
Complete System Level Protection
– Input UVLO, Input Overvoltage Protection
(OVP), Battery OVP, Sleep Mode, VIN_DPM
– Input Current Limit
– Charge Current Limit
– Thermal Regulation and Thermal Shutdown
– Voltage Based, JEITA Compatible NTC
Monitoring Input
– Safety Timer
20 V Maximum Input Voltage Rating
10.5 V Maximum Operating Input Voltage
Low RDS(on) Integrated Sense Resistor for up to
2 A Charging Rate
Open Drain Status Outputs
Synchronous Fixed-frequency PWM Controller
Operating at 3 MHz for Small Inductor Support
AnyBoot Robust Battery Detection Algorithm
Charge Time Optimizer for Improved Charge
Times at any Given Charge Current
APPLICATIONS
•
•
•
•
Mobile Phones, Smart Phones
MP3 Players
Handheld Devices
Portable Media Player
DESCRIPTION
The bq2425x is a highly integrated single-cell Li-Ion battery charger with integrated current sense resistor
targeted for space-limited, portable applications with high capacity batteries. The single cell charger has a single
input that operates from either a USB port or AC wall adapter for a versatile solution. BC1.2 compatible D+, Ddetection allows for recognition of CDP, DCP, SDP, and non-standard USB adapters. The use of an accessory
dead battery provision (DBP) pin allows for the system to sync a dead battery state in order to enable or disable
the BC1.2 detection in the event of an external USB-PHI.
1
2
3
4
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoFree is a trademark of Texas Instruments.
2
I C is a trademark of NXP B.V. Corporation.
All other trademarks are the property of their respective owners.
UNLESS OTHERWISE NOTED this document contains
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013, Texas Instruments Incorporated
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION CONTINUED
The bq24257 has two modes of operation: 1) I2C mode, and 2) Standalone mode. In I2C mode, the host can
adjust the charge parameters and monitor the status of the charger operation. In Standalone mode, the external
resistor sets the input current limit, charge current limit, and the input DPM level. This mode also serves as the
default settings when a DCP adapter is present. The bq24257 enters host mode while the I2C registers are
accessed and the watchdog timer has not expired (if enabled).
The bq24258 has only one mode of operation which is the Standalone. In this mode, the external resistor sets
the input current limit, charge current limit, and the input DPM level. This mode also serves as the default
settings when a DCP adapter is present. The EN1, EN2, and EN3 pin is available in the bq24258 spin to support
USB 3.0 compliance.
The battery is charged in four phases: trickle charge, pre-charge, constant current and constant voltage. In all
charge phases, an internal control loop monitors the IC junction temperature and reduces the charge current if
the internal temperature threshold is exceeded. Additionally, a voltage-based, JEITA compatible battery pack
thermistor monitoring input (TS) is included that monitors battery temperature for safe charging.
CPMID
1µF
PMID
IN
VBUS
DD+
GND
SW
LO
1.0PH
CIN
CBOOT
33 nF
2.2PF
VDPM
3 MHz
PWM
BOOT
PGND
D-
CSIN
1PF
D+
Rsns
LDO
BAT
1 PF
System Load
VGPIO
22PF
LDO
SCL
SCL
SDA
SDA
Host GPIO1
TS
PACK+
+
STAT
PACK-
GPIO2
/CE
GPIO3
/PG
ILIM
2
TEMP
ISET
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
AVAILABLE OPTIONS
D+/D– or
EN1, EN2, EN3
Default
VOREG
VLOWV
TS or
DBP
Termination (1)
Device
Default
OVP
bq24257
6.5V
D+/D-
4.2V
3V
TS
bq24258
10.5
EN1, EN2, EN3
4.2V
3V
TS
(1)
(2)
Chem
i2c
Addr
Default USB
ILIM
10%
Li / LiPo
Yes
0x6A
100mA
10%
LiFePO4
No
0x6A
N/A (2)
Default behavior unless changed via i2C.
Selectable via the EN1, EN2, EN3 pins.
ORDERING INFORMATION
Part Number
bq24257
bq24258
(1)
(2)
(1)
IC Marking
bq24257
bq24258
Package
Ordering Number
Quantity
DSBGA-YFF
bq24257YFFR
3000
DSBGA-YFF
bq24257YFFT
250
QFN-RGE
bq24257RGER
3000
QFN-RGE
bq24257RGET
250
DSBGA-YFF (2)
bq24258YFFR
3000
DSBGA-YFF (2)
bq24258YFFT
250
(2)
bq24258RGER
3000
QFN-RGE (2)
bq24258RGET
250
QFN-RGE
This product is RoHS compatible, including a lead concentration that does not exceed 0.1% of total product weight, and is suitable for
use in specified lead-free soldering processes. In addition, this product uses package materials that do not contain halogens, including
bromine (Br) or antimony (Sb) above 0.1% of total product weight.
Product Preview
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
3
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
Pin voltage range (with respect
to PGND)
MIN
MAX
IN
–1.3
20
V
SW
–0.7
12
V
PMID, BOOT
–0.3
20
V
CSIN, BAT, DPB, LDO, SCL, SDA, STAT, D+, D–, CE, ISET, ILIM, VDPM
–0.3
7
V
–0.3
BOOT relative to SW
Output Current (Continuous)
Output Sink Current
UNIT
5
V
IN
2
A
CSIN, BAT
4
A
5
mA
Operating free-air temperature range
STAT
–40
85
°C
Junction temperature, TJ
–40
125
°C
Storage temperature, TSTG
–65
150
°C
Lead temperature (soldering, 10 s)
300
°C
2
kV
ESD Rating human body model (2)
(1)
(2)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
The human body model is a 100-pF capacitor discharged through a 1.5-kΩ resistor into each pin.
RECOMMENDED OPERATING CONDITIONS
All voltages are with respect to PGND if not specified. Currents are positive into, negative out of the specified pin. Consult
Packaging Section of the data book for thermal limitations and considerations of packages.
VIN
MIN
MAX
IN voltage range
4.35
(1)
IN operating voltage range (bq24258)
4.35
10.5
IN operating voltage range (bq24257)
4.35
6.5
18
UNITS
V
IIN
Input current
2
A
ICHG
Current in charge mode, BAT
2
A
IDISCHG
Current in discharge mode, BAT
4
A
RISET
Charge current programming resistor range
RILIM
Input current limit programming resistor range
TJ
Operating junction temperature range, TJ
(1)
Ω
75
Ω
105
0
125
ºC
The inherent switching noise voltage spikes should not exceed the absolute maximum rating on either the BOOT or SW pins. A tight
layout minimizes switching noise.
THERMAL INFORMATION
THERMAL METRIC (1)
bq24257
bq24258
YFF
RGE
θJA
Junction-to-ambient thermal resistance
76.5
32.9
θJCtop
Junction-to-case (top) thermal resistance
0.2
32.8
θJB
Junction-to-board thermal resistance
44
10.6
ψJT
Junction-to-top characterization parameter
1.6
0.3
ψJB
Junction-to-board characterization parameter
43.4
10.7
θJCbot
Junction-to-case (bottom) thermal resistance
N/A
2.3
(1)
4
UNITS
°C/W
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
ELECTRICAL CHARACTERISTICS
bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
INPUT CURRENTS
VUVLO < VIN < VOVP and VIN > VBAT + VSLP,
PWM switching, CE enable
IIN
IBAT
Supply current from IN
13
mA
VUVLO < VIN < VOVP and VIN > VBAT + VSLP,
PWM switching, CE disable
Battery discharge current in high
impedance SYSOFF mode , (BAT,
SW,SYS)
5
0°C< TJ < 85°C, High-Z Mode
170
225
μA
0°C< TJ < 85°C, VBAT = 4.2 V,
VIN = 0 V or 5V, High-Z Mode
16
22
μA
1
μA
mΩ
0°C< TJ < 85°C, VBAT = 4.2 V,
VIN = 0V, SYSOFF Mode
BATTERY CHARGER
RSNS
Internal battery charger MOSFET onresistance
I2C mode
VBATREG
Measured from BAT to SYS, VBAT = 4.2V
(WCSP)
20
30
Measured from BAT to SYS, VBAT = 4.2V
(QFN)
30
40
Operating in voltage regulation,
Programmable range
SA mode
TJ = 25°C
Voltage regulation accuracy
TJ = 0°C to 125°C
3.5
4.44
V
4.2
–0.5%
0.5%
–0.75%
0.75%
Fast charge current range
VLOWV ≤ VBAT < VBATREG
500
2000
Fast charge current accuracy
I2C mode
–7%
+7%
ICHG_LOW
Low Charge Current Setting
Set via I2C
297
330
363
mA
KISET
Programmable fast charge current
factor
232.5
250
267.5
AΩ
VISET
Maximum ISET pin voltage (in
regulation)
RISET-SHORT
Short circuit resistance threshold
ICHG
ICHG =
mA
KISET
RISET
(0.5 A ≤ ICHG < 2 A)
0.42
Battery voltage rising bq24257
VLOWV
Hysteresis for VLOWV
IPRECHG
Pr-charge current
(VBATUVLO < VBAT < VLOWV)
Ipre-charge is percentile of the external
fast charge settings.
Battery under voltage lockout
threshold
VBAT rising
VBAT_UVLO
45
55
75
2.9
3
3.1
Battery voltage falling
VBATSHRT
Battery voltage rising
Hysteresis for VBATSHRT
Battery voltage falling
IBATSHRT
Trickle charge current
(VBAT < VBATSHRT)
tDGL(BATSHRT)
Deglitch time for trickle charge tp precharge transition
10
12
2.37
2.5
2.63
Termination current threshold
1.9
Termination Current on SA only
Termination current threshold
tolerance
tDGL(TERM)
Deglitch time for charge termination
Both rising and falling, 2-mV overdrive,
tRISE, tFALL = 100 ns
VRCH
Recharge threshold voltage
Below VBATREG
tDGL(RCH)
Deglitch time
VBAT falling below VRCH, tFALL = 100 ns
% ICHG
V
200
mV
32
ms
2
2.1
V
100
25
ITERM
V
mV
8
Deglitch time for pre-charge to fast
charge transition
Battery short threshold
Ω
100
Battery UVLO hysteresis
tDGL(LOWV)
V
35
mV
50
mA
256
us
10
%ICHG
–10%
10%
64
70
115
ms
160
32
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
mV
ms
5
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
BATTERY DETECTION
VBATREG_HI
Battery detection high regulation
voltage
Same as VBATREG
VBATREG
V
VBATREG_LO
Battery detection low regulation
voltage
360 mV offset from VBATREG
VBATREG
- 480mV
V
VBATDET_HI
Battery detection comparator
VBATREG = VBATREG_HI
VBATREG
- 120 mV
V
VBATDET_LO
Battery detection comparator
VBATREG = VBATREG_LO
VBATREG
+ 120 mV
V
IDETECT
Battery detection sink current)
Always on during battery detection
7.5
tDETECT
Battery detection time
For both VBATREG_HI and VBATREG_LO
32
Tsafe
Safety Timer Accuracy
–10%
mA
ms
10%
BATTERY CHARGER LiFePO4 (bq24258)
VREG-OVCHG
Over charge voltage regulation
3.76
3.8
3.84
V
VFLT-CHG
Float charge regulation
3.46
3.5
3.54
V
VOVCHG
Overcharge comparator for LiFePo
3.65
3.7
3.75
VBAT rising
VOVCHG-HYS
tDGL(OVCHG)
VBAT falling
Deglitch on the overcharge
comparator
V
300
mV
32
ms
INPUT PROTECTION
IIN
Input current limiting
IIN_LIMIT = 100 mA
90
95
100
IIN_LIMIT = 150 mA
135
142.5
150
IIN_LIMIT = 500 mA
450
475
500
IIN_LIMIT = 900 mA
810
860
910
IIN_LIMIT = 1500 mA
1400
1475
1550
IIN_LIMIT = 2000 mA
1850
1950
2050
ILIM =
IIN_LIMIT = External
ILIM
Maximum input current limit
programmable range for IN input
KILIM
Maximum input current factor for IN
input
VILIM
Maximum ILIM pin voltage (in
regulation)
RILIM-SHORT
Short circuit resistance threshold
VREF_DPM
VDPM_SHRT
VUVLO
tDGL(SLP)
VOVP
6
240
270
2000
mA
300
AΩ
V
105
Ω
SA mode
4.2
10
V
I2C mode
4.2
4.76
V
2%
65
VIN_DPM threshold accuracy
Both I2C and SA mode
-2%
DPM regulation voltage
External resistor setting only
1.15
VIN_DPM short threshold
If VDPM is shorted to ground, VIN_DPM
threshold will use internal default value
IC active threshold voltage
VIN rising
IC active hysteresis
VIN falling from above VUVLO
Sleep-mode entry threshold, VSUPPLYVSLP
RILIM
0.42
VIN_DPM threshold range
VIN_DPM
KILIM
500
ILIM = 500 mA to 2 A
mA
83
1.2
1.25
0.3
3.15
3.35
V
V
3.5
175
V
mV
VIN falling
0
50
100
mV
Sleep-mode exit hysteresis
VIN rising
40
100
160
mV
Deglitch time for supply rising above
VSLP+VSLP_EXIT
Rising voltage, 2-mV over drive, tRISE =
100ns
Input supply OVP threshold voltage
(bq24258)
IN rising
IN_OVP
-200mV
IN_OVP
IN_OVP
+200mV
Input supply OVP threshold voltage
(bq24257)
IN rising
6.3
6.5
6.7
VOVP hysteresis
IN falling from VOVP
100
6.8
VBAT
Submit Documentation Feedback
32
ms
V
mV
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
ELECTRICAL CHARACTERISTICS (continued)
bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
Deglitch time for IN Rising above
VOVP
IN rising voltage, tRISE = 100ns
Battery OVP threshold voltage
VBAT threshold over VBATREG to turn off
charger during charge
VBATOVP hysteresis
Lower limit for VBAT falling from above
VBOVP
1
BOVP Deglitch
Battery entering/exiting BOVP
1
RON(BLK)
Internal blocking MOSFET onresistance
Measured from IN to PMID (WCSP and
QFN)
RON(HS)
Internal high-side MOSFET onresistance
RON(LS)
tDGL(OVP)
VBOVP
tDGL(BOVP)
MAX
UNIT
32
102.5
105
ms
107.5 % VBATREG
ms
PWM CONVERTER
60
100
mΩ
Measured from IN to SW (WCSP and
QFN)
100
150
mΩ
Internal low-side MOSFET onresistance
Measured from SW to PGND (WCSP and
QFN)
110
165
mΩ
ICbC
Cycle-by-cycle current limit
VSYS shorted
2.6
3.2
3.8
A
fOSC
Oscillator frequency
2.7
3
3.3
MHz
DMAX
Maximum duty cycle
DMIN
Minimum duty cycle
TSHTDWN
TREG
95%
0%
Thermal trip
150
Thermal hysteresis
10
Thermal regulation threshold
Charge current begins to cut off
VLDO
LDO Output Voltage
VIN = 5.5V, ILDO = 0 to 50 mA
ILDO
Maximum LDO Output Current
VLDO
LDO Dropout Voltage (VIN – VLDO)
°C
125
LDO
4.65
4.85
5.04
V
50
VIN = 5 V, ILDO = 50 mA
mA
200
300
30
30.4
mV
BATTERY-PACK NTC MONITOR
VHOT
High temperature threshold
VTS falling
VHYS(HOT)
Hysteresis on high threshold
VTS
VWARM
Warm temperature threshold
VTS falling
VHYS(WARM)
Hysteresis on warm temperature
threshold
VTS rising
VCOOL
Cool temperature threshold
VTS rising
VHSY(COOL)
Hysteresis on cool temperature
threshold
VTS falling
VCOLD
Low temperature threshold
VTS rising
VHYS(COLD)
Hysteresis on low threshold
VTS falling
VTS_DIS
TS disable threshold
tDGL(TS)
Deglitch time on TS change
29.6
1
rising
37.9
38.3
38.7
%VLDO
1
56.5
56.5
56.9
%VLDO
1
59.6
60
60.4
1
70
%VLDO
73
%VLDO
%VLDO
32
ms
INPUTS (DBP, EN1, EN2, EN3, CE, SCL, SDA)
VIH
Input high threshold
VIL
Input low threshold
1
V
0.4
V
0.4
V
1
uA
STATUS OUTPUTS (STAT, PG, CHG)
VOL
Low-level output saturation voltage
IO = 5 mA, sink current
IIH
High-level leakage current
Hi-Z and 5 V applies
TIMERS
tSAFETY
tWATCH-DOG
45 min safety timer
2700
s
6 hr safety timer
21600
s
9 hr safety timer
32400
s
Watch dog timer
50
s
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
7
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
ELECTRICAL CHARACTERISTICS (continued)
bq24257 App Circuit, VUVLO < VIN < VOVP AND VIN > VBAT+VSLP, TJ = 0°C – 125°C and TJ = 25°C for typical values (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
D+, D– DETECTION
IDP_SRC
D+ current source for DCD
DCD
7
13
µA
RDM_DWN
D– pull-down resistance for DCD
DCD
14.25
24.8
kΩ
VDP_LOW
D+ low comparator threshold for DCD
DCD
0.85
0.9
0.95
V
VDP_SRC
D+ source voltage for Primary
Detection
Primary Detection
0.5
0.6
0.7
V
IDP_SRC_PD
D+ source voltage output current for
Primary Detection
Primary Detection
200
IDM_SINK
D– sink current for Primary Detection
Primary Detection
50
100
150
µA
VDAT_REF
Primary Detection threshold
Primary Detection
250
325
400
mV
VLGC
Primary Detection threshold
Primary Detection
0.85
0.9
0.95
V
VDM_SRC
D– source voltage for Secondary
Detection
Secondary Detection
0.5
0.6
0.7
V
IDM_SRC_PD
D– source voltage output current for
Secondary Detection
Secondary Detection
200
IDP_SINK
D+ sink current for Secondary
Detection
Secondary Detection
50
100
150
µA
VDAT_REF
Secondary Detection threshold
Secondary Detection
250
325
400
mV
VATT_LO
Apple/TomTom detection low
threshold
Apple, TomTom Detection
1.8
1.85
1.975
V
VATT_HI
Apple/TomTom detection high
threshold
Apple, TomTom Detection
3.2
3.5
4.05
V
CI
Input Capacitance
ID_LKG
Leakage Current into D+/D–
8
µA
µA
D– , switch open
4.5
D+, switch open
4.5
pF
D–, switch open
-1
1
µA
D+, switch open
-1
1
µA
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
BLOCK DIAGRAM
PMID
Q1
LDO
LDO
IN
Charge
Pump
Q2
VREF_CBCLIM
ILIM
_
+
BOOT
CbC
Comparator
IIN_LIM
Amp
_
VDPM
+
VREF_INLIM
VIN_DPM
Amp
+
VREF_DPM
PWM
LOOP SELECT
COMPENSATION
DRIVER
_
Host
SW
+
VDPM_DAC
_
V LDO
I2C Only
Q3
TJ
PGND
+
125C
ICHG
Amp
_
ISET
+
VBATREG
Amp
Sleep
Comparator
_
CSIN
_
+
VREF_BATREG
VREF_ICHG
VBAT +VSLP +
VREF_TERM
EN2 / D-
+
EN1 / D+
LDO
Termination
Comparator
Input
current limit
decoder /
D+ and DDecoder
Q4
Recharge Comparator
+
Batt Detect Or
Precharge
Curent Source
VBATREG ± 0.12V
VBAT
BAT
SCL
I2C
Controller
SDA
Charge
Pump
CHARGE
CONTROLLER
/ PG
-
BATSHORT Comparator
STAT
,
+
VBAT
VBATSHRT
Supplement Comparator
V SYS
+
DISABLE
VBAT
V BSUP
VLDO
+
/CE
TS -10°C
+
TS 0°C
+
TS 10 °C
+
TS 45 °C
+
TS 60°C
TS
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
9
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
B
C
CSIN
PGND
BAT
CSIN
SW
IN
SW
SW
PGND
IN
IN
IN
PGND
5
PMID
CSIN
4
BOOT
BAT
BAT
3
ILIM
2
VDPM
A
1
LDO
PIN OUTS
24
23
22
21
20
19
/CE
1
18
SW
D+
2
17
SW
D-
3
16
PGND
bq24257
D
ISET
D-
D+
/CE
PMID
E
/PG
SCL
STAT
VDPM
BOOT
AGND
4
15
PGND
SDA
5
14
CSIN
SCL
6
13
CSIN
ISET
BAT
BAT
BOOT
PMID
IN
ILIM
12
TS
LDO
11
ILIM
PGND
10
/PG
SDA
9
VDPM
TS
24
23
22
21
20
19
STAT
F
8
LDO
7
bq24257 WCSP
A
B
C
1
2
3
4
5
BAT
CSIN
PGND
SW
IN
BAT
BAT
CSIN
CSIN
PGND
SW
PGND
SW
IN
IN
/CE
1
18
SW
NC
2
17
SW
EN3
3
16
PGND
bq24258
E
/PG
EN2
STAT
VDPM
BOOT
F
TS
EN1
PGND
LDO
ILIM
PGND
EN1
5
14
CSIN
EN2
6
13
CSIN
7
8
9
10
11
12
BAT
PMID
BAT
/CE
ISET
PGND
TS
EN3
15
/PG
ISET
4
STAT
D
AGND
bq24258 WCSP
10
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
PIN FUNCTIONS
PIN NAME
bq24257
bq24257
bq24258
bq24258
YFF
RGE
YFF
RGE
I/O
DESCRIPTION
IN
A5,B5,C5
19
A5,B5,C5
19
I
Input power supply. IN is connected to the external DC supply (AC adapter or
USB port). Bypass IN to PGND with >2 μF ceramic capacitor
PMID
D5
20
D5
20
I
Connection between blocking FET and high-side FET. Connect a 1 μF capacitor
from PMID to PGND as close to the PMID and PGND pins as possible
SW
A4,B4,C4
17-18
A4,B4,C4
17-18
O
Inductor Connection. Connect to the switching side of the external inductor.
BOOT
E5
21
E5
21
I
High Side MOSFET Gate Driver Supply. Connect a 0.033 μF ceramic capacitor
(voltage rating > 15 V) from BOOT to SW to supply the gate drive for the high
side MOSFETs.
PGND
A3,B3,C3,
F3
15-16
A3,B3,C3,
D3,F3
15-16
CSIN
A2,B2,C2
13-14
A2,B2,C2
13-14
I
System Voltage Sense and SMPS output filter connection. Connect CSIN to the
system output at the output bulk capacitors. Bypass CSIN locally with at least 1
μF.
BAT
A1,B1,C1
11-12
A1,B1,C1
11-12
I/O
Battery Connection. Connect to the positive terminal of the battery. Additionally,
bypass BAT with at least 20 μF capacitor to GND.
TS
F1
9
F1
9
I
Battery Pack NTC Monitor. Connect TS to the center tap of a resistor divider
from LDO to GND. The NTC is connected from TS to GND. The TS function
provides 4 thresholds for JEITA or PSE compatibility. See the NTC Monitor
section for more details on operation and selecting the resistor values.
VDPM
E4
23
E4
23
I
Input DPM Programming Input. Connect a resistor divider between IN and GND
with VDPM connected to the center tap to program the Input Voltage based
Dynamic Power Management threshold (VIN_DPM). The input current is
reduced to maintain the supply voltage at VIN_DPM. The reference for the
regulator is 1.2 V. Short pin to GND if external resistors are not desired—this
sets a default of 4.36 V for the input DPM threshold.
ISET
D1
10
D1
10
I
Charge Current Programming Input. Connect a resistor from ISET to GND to
program the fast charge current.
ILIM
F5
22
F5
22
I
Input Current Limit Programming Input. Connect a resistor from ILIM to GND to
program the input current limit for IN. The current limit is programmable from
0.5A to 2A. ILIM has no effect on the USB input. If an external resistor is not
desired, short to GND for a 2 A default setting.
CE
D4
1
D4
1
I
Charge Enable Active-Low Input. Connect CE to a high logic level to place the
battery charger in standby mode.
EN1
--
--
F2
5
I
EN2
--
--
E2
6
I
Input Current Limit Configuration Inputs. Use EN1, EN2, and EN3 to control the
maximum input current and enable USB compliance. See Table 1 for
programming details.
EN3
--
--
D2
3
I
PG
E1
8
E1
8
O
Power Good Open Drain Output. /PG is pulled low when a valid supply is
connected to IN. A valid supply is between VBAT+VSLP and VOVP. If no supply
is connected or the supply is out of this range, /PG is high impedance.
STAT
E3
7
E3
7
O
Status Output. STAT is an open-drain output that signals charging status and
fault interrupts. STAT pulls low during charging. STAT is high impedance when
charging is complete or the charger is disabled. When a fault occurs, a 256 μs
pulse is sent out as an interrupt for the host. STAT is enabled/disabled using the
EN_STAT bit in the control register. STAT will indicate recharge cycles. Connect
STAT to a logic rail using an LED for visual indication or through a 10 kΩ
resistor to communicate with the host processor.
Power Ground terminal. Connect to the ground plane of the circuit. For QFN
only, connect to the thermal pad of the IC.
NC
--
--
--
2
SCL
E2
6
--
--
Not connected
SDA
F2
5
D+
D3
2
--
--
I
D-
D2
3
--
--
I
LDO
F4
24
F4
24
O
AGND
--
4
--
4
I
I2C Interface Clock. Connect SCL to the logic rail through a 10 kΩ resistor.
I/O
I2C Interface Data. Connect SDA to the logic rail through a 10 kΩ resistor.
BC1.2 compatible D+/D- Based Adapter Detection. Detects DCP, SDP, and
CDP. Also complies with the unconnected dead battery provision clause. D+
and D- are connected to the D+ and D- outputs of the USB port at power up.
Also includes the detection of Apple™ and TomTom™ adapters where a 500mA
input current limit is enabled.
LDO output. LDO is regulated to 4.9 V and drives up to 50 mA. Bypass LDO
with a 1μF ceramic Capacitor. LDO is enabled when VUVLO < VIN < 19 V.
Analog Ground for QFN only. Connect to the thermal pad and the ground plane
of the circuit.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
11
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
TYPICAL APPLICATION CIRCUITS
CPMID
1µF
PMID
IN
VBUS
DD+
GND
SW
LO
1.0PH
CIN
CBOOT
33 nF
2.2PF
VDPM
3 MHz
PWM
BOOT
PGND
D-
CSIN
1PF
D+
Rsns
LDO
BAT
1 PF
System Load
VGPIO
22PF
LDO
SCL
SCL
SDA
SDA
TS
TEMP
PACK+
+
Host GPIO1
STAT
PACK-
GPIO2
/CE
GPIO3
/PG
ILIM
ISET
Figure 1. bq24257 Typical Application Circuit
12
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
CPMID
1µF
PMID
IN
VIN
SW
LO
1.0PH
CIN
CBOOT
33 nF
2.2PF
3 MHz
PWM
VDPM
BOOT
PGND
LDO
CSIN
1 PF
1PF
STAT
Rsns
/PG
BAT
System Load
22PF
LDO
Host
GPIO
EN1
GPIO
EN2
GPIO
EN3
GPIO
/CE
TS
TEMP
PACK+
+
PACK-
ILIM
ISET
Figure 2. bq24258 Typical Application Circuit
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
13
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
TYPICAL CHARACTERISTICS
.
Battery Detection
Battery Removal
VBAT = 3.8 V
VIN = 5 V
VREG = 4.2 V
ICHG = 0.5 A
ILIM = 1 A
VBAT = 3.8 V
VIN = 6 V
VREG = 4.2 V
ICHG = 1 A
ILIM = 1 A
Figure 3.
Figure 4.
Efficiency
vs
Battery Voltage
System Voltage Regulation
vs
Load Current
88
4.350
ICHG = 2 A
VIN = 5 V
VREG = 4.2 V
86
84
4.345
4.340
VSYS-REG (V)
Efficiency (%)
4.335
82
80
78
4.330
4.325
4.320
4.310
74
4.305
72
4.300
bq24257
0.0
70
2.9
3.1
3.3
3.5
3.7
3.9
4.1
VBAT (V)
0.5
1.5
ISYS (A)
2.0
2.5
C004
C001
Figure 5.
Figure 6.
Efficiency
vs
Output Current
Efficiency
vs
Output Current
100
100
95
95
90
90
85
85
80
75
70
65
80
75
70
65
60
VIN ==55V
V
VIN
60
55
VIN ==77V
V
VIN
55
VREG = 4.2 V
VIN ==10
V
VIN
10V
50
0
200
400
600
800 1000 1200 1400 1600 1800 2000
Output Current (mA)
VIN ==55V
V
VIN
VIN ==77V
V
VIN
VREG = 3.6 V
VIN ==10
V
VIN
10V
50
0
200
C002
Figure 7.
14
1.0
4.3
Efficiency (%)
Efficiency (%)
VIN = 5 V
No Battery
ILIM = 2 A
VREG = 4.2 V
No Bat
Charge Disable
4.315
76
400
600
800 1000 1200 1400 1600 1800 2000
Output Current (mA)
C003
Figure 8.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
TYPICAL CHARACTERISTICS (continued)
.
VBAT IQ
Input IQ with Charge DIS and EN
18
20
VIN = 0 V
Charge Enabled
SYSOFF = 0
BAT & SYS are Shorted
14
IBAT ( A)
12
CE EN
Charge EN and DIS
No Battery and System
18
CE DIS
16
Input Current (mA)
16
10
8
6
4
14
12
10
8
6
2
4
0
2
0
±2
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
VBAT (V)
5.0
0
C007
5
10
15
20
25
Input Voltage (V)
Figure 9.
Figure 10.
Input IQ with Charge Enable and Hz
Startup
C008
500
Charge EN
Hi-Z EN
450
Input Current ( A)
400
350
300
250
200
150
ICHG = 1 A
ILIM = 1.5 A
100
ISYS = 0 A
50
VBAT = 3.6 V
0
0
5
10
15
20
Input Voltage (V)
25
C009
Figure 11.
Figure 12.
Input OVP Event with INT
VDPM Startup, 4.2 V
ICHG = 1 A
ILIM = 1 A
VBAT = 3.9 V
VOVP = 10.5 V
ICHG = 2 A
ILIM = 0.5 A
ISYS = 0 A
VBAT = 3.6 V
VDPM = 4.36 V
Figure 13.
Figure 14.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
15
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
TYPICAL CHARACTERISTICS (continued)
.
1.0 µH CCM Operation
ICHG = 1 A
ISYS = 0 A
VBAT = 3.3 V
VIN = 5.2 V
Figure 15.
16
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
CHARGE PROFILE
The bq24257 family provides a switch-mode buck regulator with output non-power path and a charge controller
to provide optimum performance over the full battery charge cycle. The control loop for the buck regulator has 6
primary feedback loops that can set the duty cycle:
1. Constant Current (CC)
2. Constant Voltage (CV)
3. Input Current (IILIM)
4. Input Voltage (VIN_DPM)
5. Die Temperature
6. Cycle by Cycle Current
The feedback with the minimum duty cycle will be chosen as the active loop. The bq24257 supports a precision
Li-Ion or Li-Polymer charging system for single-cell applications. The bq24257 includes an integrated charge
sense resistor for highly accurate charge current sensing while reducing the external BOM requirements. The
figure below illustrates a typical charge profile.
Trickle
Charge
Precharge
Current Regulation
Phase (CC)
Voltage Regulation
Phase (CV)
Termination
VBATREG
ICHG
ICHG
VCSIN
VBAT
VLOWV
VBATSHRT
IPRECHG
ITERM
IBATSHRT
Charging on
Charge done
The bq24258 supports an advanced Lithium-Iron-Phosphate (LiFePO4) algorithm. This allows for the charger to
source the charge current up to the VREG-OVCHG level before entering the float charge region. See below for the
charge profile characteristics:
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
17
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Trickle
Charge
Precharge
www.ti.com
Current Regulation
Phase (CC)
VBATREG
(3.8V)
VOVRCHG
(3.7V)
VFLTCHG
(3.5V)
Discharge
Float Charge
ICHG
ICHG
VCSIN
VBAT
VLOWV
VBATSHRT
IPRECHG
IBATSHRT
EN1, EN2, EN3 Pins
If the D+, D- detection pins are not used (bq24257), input current limit pins are available for GPIO control. The
EN1, EN2, and EN3 pins are available in the bq24258 spin to support USB 3.0 compliance. When the input
current limit pins change state, the VIN_DPM threshold changes as well. See Table 1 for details:
Table 1. EN1, and EN2 Truth Table (1)
(1)
EN3
EN2
EN1
INPUT CURRENT LIMIT
VINDPM THRESHOLD
0
0
0
0
0
500mA
4.36V
1
Externally programmed by ILIM (up to 2.0A)
0
Externally programmed VDPM
1
0
100mA
4.36V
0
1
1
Input Hi-Z
None
1
0
0
900mA
4.36V
1
0
1
Externally programmed by ILIM (up to 2.0 A)
Externally programmed VDPM
1
1
0
150mA
4.36V
1
1
1
Input Hi-Z
None
If EN3 = 0, it will be USB 2.0 compliant; If EN3 = 1, USB 3.0 compliant.
I2C and STAND ALONE OPERATION
The bq24257 series offers a unique feature when compared to traditional host mode chargers—the default input
current limit, output current limit and VIN_DPM parameters can be set via external resistors. In traditional host
mode chargers, the default parameters are programmed during manufacturing to set the i2c registers at a
specific default. If an end application calls for an alternate default setting, the traditional charger is left with the
only option of changing the parameters at the manufacturing stage. This may not always be acceptable.
18
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Figure 16 illustrates the behavior of the bq24257 when transitioning between i2c mode and stand alone mode
(except for the bq24257).
Battery or Input
is Inserted
No
VIN or VBAT GOOD?
Yes
i2c command received?
No
ILIM=EN1/EN2
VDPM=External Default
ISET=External Default
Yes
ILIM=Register Value
VDPM=Register Value
ISET=Register Value
No
32s Watchdog Expired?
Yes
Figure 16. I2C and Stand Alone Mode Handoff
Once the battery or input is inserted and above the good thresholds, the device will determines if an i2c
command has been received in order to discern whether to operate from the i2c registers or the external
settings. Note that the bq24257 does not have EN1/EN2 pins and therefore the input current limit will be based
on the D+/D– results. When in host mode (i2c operation), the device will enter stand alone operation once the
watchdog timer expires.
External settings: ISET, ILIM and VIN_DPM
The fast charge current resistor (RISET) can be set by using the following formula:
K
250
RISET = ISET =
IFC
IFC
(1)
Where IFC is the desired fast charge current setting in Amperes.
The input current limit resistor (RILIM) can be set by using the following formula:
K
270
RILIM = ILIM =
IIC
IIC
(2)
Where IIC is the desired input current limit in Amperes.
Based on the application diagram reference designators, the resistor R1 and R2 can be calculated as follows to
set VIN_DPM:
R + R2
R + R2
= 1.2 ´ 1
VIN _ DPM = VREF _ DPM ´ 1
R2
R2
(3)
VIN_DPM should be chosen first along with R1. Choosing R1 first will ensure that R2 will be greater than the
resistance chosen. This is the case since VIN_DPM should be chosen to be greater than 2x VREF_DPM.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
19
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
If resistors are not desired for BOM count reduction, the VDPM and the ILIM pins can be shorted to set the
internal defaults. However, the ISET resistor must be populated as this will be interpreted as a fault. Table 2
summarizes the settings when the ILIM, ISET, and VIN_DPM pins are shorted to GND.
Table 2. ILIM, VDPM, and ISET Short Behaviors
PIN SHORTED
BEHAVIOR
ILIM
Input current limit = 2A
VDPM
VIN_DPM = 4.36V
ISET
Fault—Charging Suspended
BC1.2 D+/D– DETECTION
The bq24257 includes a fully BC1.2 compatible D+/D– source detection. This detection supports the following
types of ports:
• DCP (dedicated charge port)
• CDP (charging downstream port)
• SDP (standard downstream port)
• Apple™/TomTom™ ports
This D+/D– detection algorithm does not support ACA (accessory charge adapter) identification, but the input
current will default to 500mA when a charge port is attached to the ACA and bq24257 is connected to the OTG
port.
The D+/D– detection algorithm is only active when the device is in standalone mode (e.g. the host is not
communicating with the device and the watch dog timer has expired). However, when the device is in host mode
(that is, host is communicating via i2c to the device) writing a ‘1’ to register 0x04 bit location 4 (DPDM_EN)
forces the device to perform a D+/D– detection on the next power port insertion. This allows the D+/D– detection
to be enabled in both host mode and default mode.
The D+/D– detection algorithm has 5 primary states. These states are termed the following:
1. Data Contact Detect
2. Primary Detection
3. Secondary Detection
4. Non-standard Adapter Detection (for Apple™ / TomTom™)
5. Detection Configuration
The DCD state determines if the device has properly connected to the D+/D– lines. If the device is not in host
mode and VBUS is inserted (or DPDM_EN is true) the device will enter the DCD state and enable the
appropriate algorithm. If the DCD timer expires, the device will enter the Non-standard Adapter Detection (for
Apple™ / TomTom™) state. Otherwise it will enter the Primary Detection state.
When entering the Primary Detection state, the appropriate algorithm is enabled to determine whether to enter
the secondary detection state for DCP and CDP or the secondary detection state for SDP/Non-Standard
adaptors.
The non-standard adapter detection state for Apple™ / TomTom™ tests for the unique conditions for these nonstandard adapters. If the algorithm passes the unique conditions found with these adapters, it will proceed to the
Detection Configuration state. Otherwise it will revert back to the primary detection state.
The secondary detection state determines whether the input port is a DCP, CDP, SDP, or other non-standard
adapters. If the Primary Detection state indicated that the input port is either a DCP or CDP, the device will
enable the appropriate algorithm to differentiate between the two. If the Primary Detection state indicated that the
input port is either a SDP or non-standard adapter, the device will enable the appropriate algorithm to
differentiate between these two ports. Once complete, the device will continue to the Detection Configuration
state.
20
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
DCP
Settings
No
VBAT > VBATGD?
Yes
Turn on V DP_SRC
And keep it on until
CLR_VDP is set to ‘1’ in i2c
DCP
External ILIM
Start 6 hr timer
Non
Standard
Adapter
SDP
Settings
CDP
Settings
VBAT > VBATGD
Yes
No
Turn on VDP_SRC
And keep it on until
CLR_VDP is set to ‘1’
CDP and
weak battery
CDP and
good battery
SDP and
weak battery
SDP and
good battery
Apple/TT or
Non-Standard
IILIM=100mA
Start 45 min timer
IILIM=1500mA
Start 6 hr timer
IILIM=100mA
Start 45 min timer
Hi-Z mode
IILIM=0.5A
Start 6 hr timer
Detection Done.
Set detection
status in register
Figure 17. Detection Configuration State
The detection configuration state sets the input current limit of the device along with the charge timer. The
exception to the CDP and the SDP settings are due to the Dead Battery Provision (DBP) clause for unconnected
devices. This clause states that the device can pull a maximum of 100mA when not connected due to a dead
battery. During the battery wakeup time, the device sources a voltage on the D+ pin in order to comply with the
DBP clause. Once the battery is good, the system can clear the D+ pin voltage by writing a ‘1’ to address 0x07
bit position 4 (CLR_VDP). The device must connect to the host within 1sec of clearing the D+ pin voltage per the
DPB clause.
A summary of the input current limits and timer configurations for each charge port type are found in Table 3.
Table 3. D+, D– Detection Results per Charge Port Type
CHARGE PORT TYPE
INPUT CURRENT LIMIT
CHARGE TIMER
DCP
External ILIM
6 hours
45 minutes
CDP Dead Battery
100 mA
CDP Good Battery
1500 mA
6 hours
SDP Dead Battery
100 mA
45 minutes
SDP Good Battery
Hi-Z
N/A
Non-Standard
500 mA
6 hours
TRANSIENT RESPONSE
The bq2425x includes an advanced hybrid switch mode control architecture. When the device is regulating the
charge current (fast-charge), a traditional voltage mode control loop is used with a Type-3 compensation
network. However, the bq2425x switches to a current mode control loop when the device enters voltage
regulation. Voltage regulation occurs in three charging conditions: 1) Minimum system voltage regulation, 2)
Battery voltage regulation (IBAT < ICHG), and 3) Charge Done. This architecture allows for superior transient
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
21
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
performance when regulating the voltage due to the simplification of the compensation when using current mode
control. The below transient response plot illustrates a 0 A to 2 A load step with 4.7 ms full cycle and 12% duty
cycle. A 3.9 V Li-Ion battery is used. The input voltage is set to 5 V, charge current is set to 0.5 A and the input
current is limited to 0.5 A. . Note that a high line impedance input supply was used to indicate a realistic input
scenario (adapter and cable). This is illustrated by the change in VIN seen at the input of the IC.
The figure shows a ringing at both the input voltage and the input current. This is caused by the input current
limit speed up comparator.
Figure 18. 2A Load step Transient
AnyBoot Battery Detection
The bq24257, bq24258 family includes a sophisticated battery detection algorithm used to provide the system
with the proper status of the battery connection. The AnyBoot battery algorithm also guarantees the detection of
voltage based battery protectors that may have a long closure time (due to the hysteresis of the protection switch
and the cell capacity). The AnyBoot battery detection algorithm is utilizes a dual-voltage based detection
methodology where the system rail will switch between two primary voltage levels. The period of the voltage level
shift is 64ms and therefore the power supply rejection of the down-system electronics will see this shift as
essentially DC.
The AnyBoot algorithm has essentially 3 states. The 1st state is used to determine if the device has terminated
with a battery attached. If it has terminated due to the battery not being present, then the algorithm moves to the
2nd and 3rd states. The 2nd and 3rd states shift the system voltage level between 4.2V and 3.72V. In each state
there are comparator checks to determine if a battery has been inserted. The two states guarantees the
detection of a battery even if the voltage of the cell is at the same level of the comparator thresholds. The
algorithm will remain in states 2 and 3 until a battery has been inserted. The flow diagram details for the Anyboot
algorithm are shown in Figure 19.
22
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Enter Battery
Detection
BATREG = Vreg
setting – 480mV
No
VBAT >
BATREG+120mV?
Yes
Yes
Battery Detected, STAT
register updated, and PTM
mode aborted (if enabled)
Yes
Battery Detected, STAT
register updated and
Exit Battery Detection
Yes
Battery Detected, STAT
register updated and
Exit Battery Detection
32ms Timer Expired?
No
No
25ms Timer Expired?
Yes
BATREG = 4.2V
No
VBAT < 4.08V?
Yes
32ms Timer Expired?
No
No
25ms Timer Expired?
Yes
ONLY ON FIRST LOOP ITERATION
“No Battery” Condition
BATREG = 4.2V
Update STAT Registers and send Fault Pulse
Yes
EN_PTM=1 and
NVM_EN_PTM=1?
Enter PTM mode
Exit Battery Detection
No
BATREG = 3.72V
No
VBAT > 3.84V?
Yes
32ms Timer Expired?
No
No
25ms Timer Expired?
Yes
Figure 19. AnyBoot Battery Detection Flow Diagram
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
23
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
Input Voltage Based DPM
During normal charging process, if the input power source is not able to support the programmed or default
charging current, the supply voltage deceases. Once the supply drops to VIN_DPM, the input current limit is
reduced down to prevent the further drop of the supply. When the IC enters this mode, the charge current is
lower than the set. This feature ensures IC compatibility with adapters with different current capabilities without a
hardware change.
Sleep Mode
The bq2425x enters the low-power sleep mode if the voltage on VIN falls below sleep-mode entry threshold,
VBAT + VSLP, and VIN is higher than the under-voltage lockout threshold, VUVLO. This feature prevents draining the
battery during the absence of VIN. When VIN < VBAT + VSLP, the bq2425x turns off the PWM converter, turns on
the battery FET, sends a single 256 μs pulse is sent on the STAT and INT outputs and the FAULT/STAT bits of
the status registers are updated in the I2C. Once VIN > VBAT + VSLP with the hysteresis, the FAULT bits are
cleared and the device initiates a new charge cycle.
Input Over-Voltage Protection
The bq2425x provides over-voltage protection on the input that protects downstream circuitry. The built-in input
over-voltage protection to protect the device and other components against damage from over voltage on the
input supply (Voltage from VIN to PGND). When VIN > VOVP, the bq2425x turns off the PWM converter, turns the
battery FET, sends a single 256 μs pulse is sent on the STAT and INT outputs and the FAULT/STAT bits of the
status registers and the battery/supply status registers are updated in the I2C. Once the OVP fault is removed,
the FAULT bits are cleared and the device returns to normal operation. The OVP threshold for the bq2425x is
programmable from 6.5 V to 10.5 V using VOVP bits in register #7.
NTC MONITOR (contact the local TI representative for function availability)
The bq24257 includes the integration of an NTC monitor pin that complies with the JEITA specification (PSE also
available upon request). The voltage based NTC monitor allows for the use of any NTC resistor with the use of
the circuit shown below:
LDO
R2
TS
NTC
R3
Figure 20. Voltage Based NTC Circuit
The use of R3 is only necessary when the NTC does not have a beta near 3500K. When deviating from this
beta, error will be introduced in the actual temperature trip thresholds. The trip thresholds are summarized below
which are typical values provided in the specification table.
Table 4. Ratiometric TS Trip Thresholds for JEITA Compliant Charging
24
VHOT
30.0%
VWARM
38.3%
VCOOL
56.5%
VCOLD
60%
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
When sizing for R2 and R3, it is best to solve two simultaneous equations that ensure the temperature profile of
the NTC network will cross the VHOT and VCOLD thresholds. The accuracy of the VWARM and VCOOL thresholds will
depend on the beta of the chosen NTC resistor. The two simultaneous equations are shown below:
%VCOLD
æ R3 RNTC
ö
TCOLD ÷
ç
ç R3 + RNTC
÷
TCOLD ø
= è
´ 100
æ R3 RNTC
ö
TCOLD ÷
ç
+ R2
ç R3 + RNTC
÷
TCOLD ø
è
%VHOT
æ R3 RNTC
ö
THOT ÷
ç
ç R3 + RNTC
÷
THOT ø
= è
´ 100
æ R3 RNTC
ö
THOT ÷
ç
+ R2
ç R3 + RNTC
÷
THOT ø
è
(4)
Where the NTC resistance at the VHOT and VCOLD temperatures must be resolved as follows:
(
b 1
-1
TCOLD To
RNTC
TCOLD
RNTC
THOT
= Ro e
(
β 1
-1
THOT To
=Ro e
)
)
(5)
To be JEITA compliant, TCOLD must be 0°C and THOT must be 60°C. If an NTC resistor is chosen such that the
beta is 4000K and the nominal resistance is 10kΩ, the following R2 and R3 values result from the above
equations:
R2 = 5 kΩ
R3 = 9.82 kΩ
Figure 21 illustrates the temperature profile of the NTC network with R2 and R3 set to the above values.
Example NTC Network Profile of %LDO vs. TEMP
60
Tcool
LDO Percent (%)
55
50
45
40
Twarm
35
30
0
10
20
30
40
50
60
Temperature (C)
Figure 21. Voltage Based NTC Circuit Temperature Profile
For JEITA compliance, the TCOOL and TWARM levels are to be 10°C and 45°C respectively. However, there is
some error due to the variation in beta from 3500K. As shown above, the actual temperature points at which the
NTC network crosses the VCOOL and VWARM are 13°C and 47°C respectively. This error is small but should be
considered when choosing the final NTC resistor.
Once the resistors are configured, the internal JEITA algorithm will apply the below profile at each trip point for
battery voltage regulation and charge current regulation.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
25
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
4.25V max
4.20V typ
4.10V max
4.06V typ
Charge voltage
No charge
V BATREG
No charge
Maximum Charge Current: 1C
0.5C
ICHG
Charge current
No charge
No charge
0°C
(cold)
10°C
(cool)
Temperature
45°C
(warm)
60°C
(hot)
Figure 22. JEITA Profile for Voltage and Current Regulation Loops
Production Test Mode
To aid in end mobile device product manufacturing, the bq24257 includes a Production Test Mode (PTM), where
the device is essentially a DC-DC buck converter. In this mode the input current limit to the charger is disabled
and the output current limit is limited only by the inductor cycle-by-cycle current (e.g. 3.5A). The PTM mode can
be used to test systems with high transient loads such as GSM transmission without the need of a battery being
present.
As a means of safety, the Anyboot algorithm will determine if a battery is not present at the output prior to
enabling the PTM mode. If a battery is present and the software attempts to enter PTM mode, the device will not
enable PTM mode.
Fault Modes
The bq2425x family includes several hardware fault detections. This allows for specific conditions that could
cause a safety concern to be detected. With this feature, the host can be alleviated from monitoring unsafe
charging conditions and also allows for a “fail-safe” if the host is not present. Table 5 summarizes the faults that
are detected and the resulting behavior.
Table 5. Fault Condition
Fault Condition
Charger Behavior
Safety Timer Behavior
Input OVP
VSYS and ICHG Disabled
Suspended
Input UVLO
VSYS and ICHG Disabled
Reset
Sleep (VIN < VBAT)
VSYS and ICHG Disabled
Suspended
TS Fault (Batter Over Temp)
VSYS Active and ICHG Disabled
Suspended
Thermal Shutdown
VSYS and ICHG Disabled
Suspended
Timer Fault
VSYS Active and ICHG Disabled
Reset
No Battery
VSYS Active and ICHG Disabled
Suspended
ISET Short
VSYS Active and ICHG Disabled
Suspended
Input Fault and LDO Low
VSYS and ICHG Disabled
Suspended
Safety Timer
At the beginning of charging process, the bq24257 starts the safety timer. This timer is active during the entire
charging process. If charging has not terminated before the safety timer expires, the IC enters suspend mode
where charging is disabled. The safety timer time is selectable using the I2C interface. A single 256μs pulse is
sent on the STAT and INT outputs and the FAULT/ bits of the status registers are updated in the I2C.
This function prevents continuous charging of a defective battery if the host fails to reset the safety timer. The
safety timer runs at 2x the normal rate under the following conditions: Pre-charge or linear mode (minimum
system voltage mode), during thermal regulation where the charge current is reduced, during TS fault where the
charge current reduced due to temperature rise on the battery, input current limit. The safety timer is suspended
during OVP, TS fault where charge is disabled, thermal shut down, and sleep mode.
26
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Watchdog Timer
In addition to the safety timer, the bq24257 contains a 50-second watchdog timer that monitors the host through
the I2C interface. Once a write is performed on the I2C interface, a watchdog timer is reset and started. The
watchdog timer can be disabled by writing “0” on WD_EN bit of register #1. Writing “1” on that bit enables it and
reset the timer.
If the watchdog timer expires, the IC enters DEFAULT mode where the default charge parameters are loaded
and charging continues. The I2C may be accessed again to re-initialize the desired values and restart the
watchdog timer as long as the safety timer has not expired. Once the safety timer expires, charging is disabled.
Thermal Regulation and Thermal Shutdown
During the charging process, to prevent overheat of the chip, bq2425x monitors the junction temperature, TJ, of
the die and begins to taper down the charge current once TJ reaches the thermal regulation threshold, TREG.
The charge current is reduced when the junction temperature increases about above TREG. Once the charge
current is reduced, the system current is reduced while the battery supplements the load to supply the system.
This may cause a thermal shutdown of the IC if the die temperature rises too. At any state, if TJ exceeds
TSHTDWN, bq2425x suspends charging and disables the buck converter. During thermal shutdown mode, PWM is
turned off, all timers are suspended, and a single 256 μs pulse is sent on the STAT and INT outputs and the
FAULT/STAT bits of the status registers are updated in the I2C. A new charging cycle begins when TJ falls below
TSHTDWN by approximately 10°C.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
27
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
REGISTER MAPPING AND DESCRIPTION
Register #1
Memory location: 00, Reset state: x0xx xxxx
BIT
•
•
•
•
28
NAME
Read/Write
FUNCTION
B7(MSB)
WD_FAULT
Read only
Read: 0 – No fault
1 – WD timeout if WD enabled
B6
WD_EN
Read/Write
0 – Disable
1 – Enable (also resets WC timer)
B5
STAT_1
Read only
B4
STAT_0
Read only
B3
FAULT_3
Read only
B2
FAULT_2
Read only
B1
FAULT_1
Read only
B0(LSB)
FAULT_0
Read only
00 –
01 –
10 –
11 –
Ready
Charge in progress
Charge done
Fault
0000 –
0001 –
0010 –
0011 –
0100 –
0101 –
0110 –
0111 –
1000 –
1001 –
1010 –
Normal
Input OVP
Input UVLO
Sleep
Battery Temperature (TS) Fault
Battery OVP
Thermal Shutdown
Timer Fault
No Battery connected
ISET short
Input Fault & LDO Low
WD_FAULT – ‘0’ indicates no watch dog fault has occurred, where a ‘1’ indicates a fault has previously
occurred.
WD_EN – Enables or disables the internal watch dog timer. A ‘1’ enables the watch dog timer and a ‘0’
disables it.
STAT – Indicates the charge controller status
FAULT – Indicates the faults that have occurred. If multiple faults occurred, they can be read by sequentially
addressing this register (e.g. reading the register 2 or more times). Once all faults have been read and the
device is in a non-fault state, the fault register will show “Normal”. Regarding the "Input Fault & LDO Low" ,
the IC will indicates this fault if the LDO is low and at the same time the input is below UVLO or coming out of
UVLO with LDO still low.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Register #2
Memory location: 01, Reset state: 1010 1100
BIT
•
•
•
•
•
NAME
Read/Write
FUNCTION
Write:
1 – Reset all registers to default values
0 – No effect
B7(MSB)
Reset
Write only
B6
IIN_ILIMIT_2
Read/Write
B5
IIN_ILIMIT_1
Read/Write
B4
IIN_ILIMIT _0
Read/Write
B3
EN_STAT
Read/Write
0 – Disable STAT function
1 – Enable STAT function
B2
EN_TERM
Read/Write
0 – Disable charge termination
1 – Enable charge termination
B1
CE
Read/Write
0 – Charging is enabled
1 – Charging is disabled
B0(LSB)
HZ_MODE
Read/Write
0 – Not high impedance mode
1 – High impedance mode
000 – USB2.0 host with 100mA current limit
001 – USB3.0 host with 150mA current limit
010 – USB2.0 host with 500mA current limit
011 – USB3.0 host with 900mA current limit
100 – Charger with 1500mA current limit
101 – Charger with 2000mA current limit
110 – External ILIM current limit(5)
111- No input current limit with internal clamp at 3A (PTM MODE)
IIN_LIMIT – Sets the input current limit level. When in host mode this register sets the regulation level. However,
when in standalone mode (e.g. no i2c writes have occurred after power up or the WD timer has expired) the
external resistor setting for IILIM sets the regulation level.
EN_STAT – Enables and disables the STAT pin. When set to a ‘1’ the STAT pin is enabled and function
normally. When set to a ‘0’ the STAT pin is disabled and the open drain FET is in HiZ mode.
EN_TERM – Enables and disables the termination function in the charge controller. When set to a ‘1’ the
termination function will be enabled. When set to a ‘0’ the termination function will be disabled. When
termination is disabled, there are no indications of the charger terminating (i.e. STAT pin or STAT registers).
CE – The charge enable bit which enables or disables the charge function. When set to a ‘0’, the charger
operates normally. When set to a ‘1’, the charger is disables by turning off the BAT FET between SYS and
BAT. The SYS pin continues to stay active via the switch mode controller if an input is present.
HZ_MODE – Sets the charger IC into low power standby mode. When set to a ‘1’, the switch mode controller
is disabled but the BAT FET remains ON to keep the system powered. When set to a ‘0’, the charger
operates normally.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
29
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
Register #3
Memory location: 02, Reset state: 1000 1111
BIT
NAME
Read/Write
B7(MSB)
VBATREG_5 (1)
Read/Write
Battery Regulation Voltage: 640mV (default 1)
B6
VBATREG_4 (1)
Read/Write
Battery Regulation Voltage: 320mV (default 0)
B5
VBATREG_3
(1)
Read/Write
Battery Regulation Voltage: 160mV (default 0)
B4
VBATREG_2 (1)
Read/Write
Battery Regulation Voltage: 80mV (default 0)
B3
VBATREG_1 (1)
Read/Write
Battery Regulation Voltage: 40mV (default 1)
B2
(1)
(1)
•
•
VBATREG_0
FUNCTION
Read/Write
Battery Regulation Voltage: 20mV (default 1)
B1(4)(5)
USB_DET_1/EN1
Read Only
B0(LSB)
USB_DET_0/EN0
Read Only
Return USB detection result or pin EN1/EN0 status –
00 – DCP detected / EN1=0, EN0=0
01 – CDP detected / EN1=0, EN0=1
10 – SDP detected / EN1=1, EN0=0
11 – Apple/TT or non-standard adaptor detected/EN1=1, EN0=1
Charge voltage range is 3.5V—4.44V with the offset of 3.5V and step of 20mV (default 4.2V)
VBATREG – Sets the battery regulation voltage
USB_DET/EN – Provides status of the D+/D– detection results for spins that include the D+/D– pins or the
state of EN1/EN2 for spins that include the EN1/EN2 pins.
Register #4
Memory location: 03, Reset state: 0000 0000
BIT
NAME
Read/Write
B7(MSB)
ICHG_4 (1) (2)
Read/Write
Charge current 800mA – (default 0)
B6
ICHG_3 (1) (2)
Read/Write
Charge current: 400mA – (default 0)
B5
ICHG_2
(1) (2)
Read/Write
Charge current: 200mA – (default 0)
B4
ICHG_1 (1) (2)
Read/Write
Charge current: 100mA – (default 0)
B3
ICHG_0 (1) (2)
Read/Write
Charge current: 50mA – (default 0)
B2
ITERM_2
(3)
Read/Write
Termination current sense threshold: 100mA (default 0)
B1
ITERM_1 (3)
Read/Write
Termination current sense threshold: 50mA (default 0)
B0(LSB)
ITERM_0 (3)
Read/Write
Termination current sense threshold: 25mA (default 0)
(1)
(2)
(3)
•
•
30
FUNCTION
Charge current offset is 500mA and default charge current is 500mA (maximum is 2.0A)
When all bits are 1’s, it is external ISET charging mode
Termination threshold voltage offset is 50mA. The default termination current is 50mA if ICHG is selected from I2C. Otherwise,
termination is set to 10% in external I_set mode with +/-10% accuracy.
ICHG – Sets the charge current regulation
ITERM – Sets the current level at which the charger will terminate
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Register #5
Memory location: 04, Reset state: xx00 x010
BIT
NAME
Read/Write
B7(MSB)
LOOP_STATUS1 (1)
Read Only
B6
LOOP_STATUS0 (1)
Read Only
B5
LOW_CHG
Read/Write
0 – Normal charge current set by 03h
1 – Low charge current setting 330mA (default 0)
B4
DPDM_EN
Read/Write
0 – Bit returns to 0 after D+/D– detection is performed
1 – Force D+/D– detection (default 0)
B3
CE_STATUS
Read Only
0 – CE low
1 – CE high
B2
VINDPM_2 (2)
Read/Write
Input VIN-DPM voltage: 320mV (default 0)
B1
VINDPM_1 (2)
Read/Write
Input VIN-DPM voltage: 160mV (default 1)
B0(LSB)
VINDPM_0 (2)
Read/Write
Input VIN-DPM voltage: 80mV (default 0)
(1)
(2)
•
•
•
•
FUNCTION
00 –
01 –
10 –
11 –
No loop is active that slows down timer
VIN_DPM regulation loop is active
Input current limit loop is active
Thermal regulation loop is active
LOOP_STATUS bits show if there are any loop is active that slow down the safety timer. If a status occurs, these bits announce the
status and do not clear until read. If more than one occurs, the first one is shown
VIN-DPM voltage offset is 4.20V and default VIN_DPM threshold is 4.36V.
LOOP_STATUS – Provides the status of the active regulation loop. The charge controller allows for only one
loop can regulate at a time.
LOW_CHG – When set to a ‘1’, the charge current is reduced 330mA independent of the charge current
setting in register 0x03. When set to ‘0’, the charge current is set by register 0x03.
DPDM_EN – Forces a D+/D– detection routine to be executed once a ‘1’ is written. This is independent of the
input being supplied.
CE_STATUS – Provides the status of the CE pin level. If the CE pin is forced high, this bit returns a ‘1’. If the
CE pin is forced low, this bit returns a ‘0’.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
31
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
Register #6
Memory location: 05, Reset state: 101x 1xxx
•
•
•
•
32
BIT
NAME
Read/Write
B7(MSB)
2XTMR_EN
Read/Write
0 – Timer not slowed at any time
1 – Timer slowed by 2x when in thermal regulation, VIN_DPM or DPPM (default 1)
FUNCTION
B6
TMR_1
Read/Write
B5
TMR_2
Read/Write
Safety Timer Time Limit
00 – 0.75 hour fast charge
01 – 6 hour fast charge (Default 01)
10 – 9 hour fast charge
11 – Disable safety timers
B4
SYSOFF
Read/Write
0 – SYSOFF disabled
1 – SYSOFF enabled
B2
TS_STAT2
Read only
B1
TS_STAT1
Read only
B0(LSB)
TS_STAT0
Read only
TS Fault Mode:
000 – Normal, No TS fault
100 – TS temp < TCOLD (Charging suspended for JEITA and Standard TS)
101 – TFREEZE < TS temp < TCOLD (Charging at 3.9V and 100mA and only for PSE option
only)
110 – TS temp < TFREEZE (Charging suspended for PSE option only)
111 – TS open (TS disabled)
2xTMR_EN – When set to a ‘0’, the 2x Timer function is enabled and allows for the timer to be extended if a
condition occurs where the charge current is reduced (that is, VIN_DPM, thermal regulation, and so on). When
set to a ‘1’, this function is disabled and the normal timer will always be executed independent of the current
reduce conditions.
SYSOFF – When set to a ‘1’ and the input is removed, the internal battery FET is turned off in order to reduce
the leakage from the BAT pin to less than 1µA. Note that this disconnects the battery from the system. When
set to a ‘0’, this function is disabled.
TS_EN – Enables and disables the TS function. When set to a ‘1’ the TS function is disabled otherwise it is
enabled. Only applies to spins that have a TS pin.
TS_STAT – Provides status of the TS pin state for spins that have a TS pin.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Register #7
Memory location: 06, Reset state: 1110 0000 for the bq24258 and 0010 0000 for the bq24257.
BIT
NAME
Read/Write
B7(MSB)
VOVP_2
Read/Write
B6
VOVP_1
Read/Write
B5
VOVP_0
Read/Write
B4
CLR_VDP
Read/Write
FUNCTION
OVP voltage:
000 – 6.0V; 001 – 6.5V; 010 – 7.0V; 011 – 8.0V
100 – 9.0V; 101 – 9.5V; 110 – 10.0V; 111 –10.5V
0 – Keep D+ voltage source on during DBP charging
1 – Turn off D+ voltage source to release D+ line
B3
FORCE_BATDET
Read/Write
B2
FORCE_PTM
Read/Write
B1
N/A
Read/Write
B0(LSB)
N/A
Read/Write
0 – Enter the battery detection routine only if TERM is true or EN_PTM is true
1 – Enter the battery detection routine
•
•
•
•
0 – PTM mode is disabled
1 – PTM mode is enabled if OTP_EN_PTM=1
VOVP – Sets the OVP level
CLR_VDP – When the D+/D– detection has finished, some cases require the D+ pin to force a voltage of
0.6V. This bit allows the system to clear the voltage prior to any communication on the D+/D– pins. A ‘1’
clears the voltage at the D+ pin if present.
FORCE_BATDET – Forces battery detection and provides status of the battery presence. A logic ‘1’ enables
this function.
FORCE_PTM – Puts the device in production test mode (PTM) where the input current limit is disabled. Note
that a battery must not be present prior to using this function. Otherwise the function will not be allowed to
execute. A logic ‘1’ enables the PTM function.
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
33
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
APPLICATION INFORMATION
Inductor Selection
The inductor selection depends on the application requirements. The bq2425x is designed to operate at around 1
µH. The value will have an effect on efficiency, and the ripple requirements, stability of the charger, package
size, and DCR of the inductor. The 1 μH inductor provides a good tradeoff between size and efficiency and
ripple.
Once the inductance has been selected, the peak current is needed in order to choose the saturation current
rating of the inductor. Make sure that the saturation current is always greater than or equal to the calculated
IPEAK. The following equation can be used to calculate the current ripple
ΔIL = {VBAT (VIN – VBAT)}/(VIN x ƒs x L)
(6)
Then use current ripple to calculate the peak current as follows:
IPEAK = ILOAD x (1 + ΔIL/2)
(7)
In this design example, the regulation voltage is set to 4.2 V, the input voltage is 5 V and the inductance is
selected to be 1 µH. The maximum charge current that can be used in this application is 1 A and can be set by
I2C command. The peak current is needed in order to choose the saturation current rating of the inductor. Using
equation 6 and 7, ΔIL is calculated to be 0.224 A and the inductor peak current is 1.112 A. A 22 µF BAT cap is
needed and 1 µF SYS cap is needed on the system trace.
The default settings for external fast charge current and external setting of current limit are chosen to be
IFC = 500 mA and ILIM = 1 A. RISET and RILIM need to be calculated using Equation 1 and Equation 2.
The fast charge current resistor (RISET) can be set as follows:
RISET = 250/0.5A = 500 Ω
(8)
The input current limit resistor (RILIM) can be set as follows:
RILIM = 270/1A = 270 Ω
(9)
The external settings of VIN_DPM can be designed by calculating R1 and R2 according to equation 3 in this data
sheet and the typical application circuit. VIN_DPM should be chosen first along with R1. VIN_DPM is chosen to be 4.6
V and R1 is set to 274KΩ in this design example. Using Equation 3, the value of R2 is calculated to be 100 KΩ.
In this design example, the application needs to be JEITA compliant. Thus, TCOLD must be 0°C and THOT must be
60°C. If an NTC resistor is chosen such that the beta is 4500 K and the nominal resistance is 13 KΩ, the
calculated R2 and R3 values are 5 KΩ and 8.8 KΩ respectively. These results are obtained from Equation 4 and
Equation 5.
Layout Guidelines
1. Place the BOOT, PMID, IN, BAT, and LDO capacitors as close as possible to the IC for optimal performance.
2. Connect the inductor as close as possible to the SW pin, and the SYS/CSIN cap as close as possible to the
inductor minimizing noise in the path.
3. Place a 1-μF PMID capacitor as close as possible to the PMID and PGND pins, making the high frequency
current loop area as small as possible.
4. The local bypass capacitor from SYS/CSIN to GND must be connected between the SYS/CSIN pin and
PGND of the IC. This minimizes the current path loop area from the SW pin through the LC filter and back to
the PGND pin.
5. Place all decoupling capacitors close to their respective IC pins and as close as possible to PGND (do not
place components such that routing interrupts power-stage currents). All small control signals must be routed
away from the high-current paths.
6. To reduce noise coupling, use a ground plane if possible, to isolate the noisy traces from spreading its noise
all over the board. Put vias inside the PGND pads for the IC.
7. The high-current charge paths into IN, Micro-USB, BAT, SYS/CSIN, and from the SW pins must be sized
appropriately for the maximum charge current to avoid voltage drops in these traces.
8. For high-current applications, the balls for the power paths must be connected to as much copper in the
board as possible. This allows better thermal performance because the board conducts heat away from the
IC.
34
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
bq24257
bq24258
www.ti.com
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
Figure 23. Recommended bq2425x PCB Layout for WCSP Package
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
35
bq24257
bq24258
SLUSBG0B – FEBRUARY 2013 – REVISED JULY 2013
www.ti.com
PACKAGE SUMMARY
YFF Package
(Top View)
YFF Package Symbol
(Top Side Symbol for bq2425x)
A1
A2
A3
A4
A5
B1
B2
B3
B4
B5
C1
C2
C3
C4
C5
D1
D2
D3
D4
D5
E1
E2
E3
E4
E5
F1
F2
F3
F4
F5
TI YMLLLLS
bq24257
D
E
TI YMLLLLS
bq24258
0-Pin A1 Marker, TI-TI Letters, YM- Year Month Date Code,
LLLL-Lot Trace Code, S-Assembly Site Code
The bq2425x devices are available in a 30-bump chip scale package (YFF, NanoFree™). The package
dimensions are:
D – 2.427mm ±0.035mm
E – 2.027mm ±0.035mm
REVISION HISTORY
Changes from Original (February 2013) to Revision A
•
Changed from a Product Brief to full data sheet .................................................................................................................. 1
Changes from Revision A (March 2013) to Revision B
•
36
Page
Page
Changed the Product Preview data sheet ............................................................................................................................ 1
Submit Documentation Feedback
Copyright © 2013, Texas Instruments Incorporated
Product Folder Links: bq24257 bq24258
PACKAGE OPTION ADDENDUM
www.ti.com
7-Jul-2013
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
(2)
MSL Peak Temp
Op Temp (°C)
Device Marking
(3)
(4/5)
BQ24257RGER
ACTIVE
VQFN
RGE
24
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ24257
BQ24257RGET
ACTIVE
VQFN
RGE
24
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
BQ24257
BQ24257YFFR
PREVIEW
DSBGA
YFF
30
3000
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24257
BQ24257YFFT
PREVIEW
DSBGA
YFF
30
250
Green (RoHS
& no Sb/Br)
SNAGCU
Level-1-260C-UNLIM
-40 to 85
BQ24257
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
7-Jul-2013
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
6-Jul-2013
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
Package Package Pins
Type Drawing
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
B0
(mm)
K0
(mm)
P1
(mm)
W
Pin1
(mm) Quadrant
BQ24257RGER
VQFN
RGE
24
3000
330.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
BQ24257RGET
VQFN
RGE
24
250
180.0
12.4
4.25
4.25
1.15
8.0
12.0
Q2
Pack Materials-Page 1
PACKAGE MATERIALS INFORMATION
www.ti.com
6-Jul-2013
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
BQ24257RGER
VQFN
RGE
24
3000
367.0
367.0
35.0
BQ24257RGET
VQFN
RGE
24
250
210.0
185.0
35.0
Pack Materials-Page 2
D: Max = 2.418 mm, Min =2.357 mm
E: Max = 2.018 mm, Min =1.957 mm
IMPORTANT NOTICE
Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other
changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest
issue. Buyers should obtain the latest relevant information before placing orders and should verify that such information is current and
complete. All semiconductor products (also referred to herein as “components”) are sold subject to TI’s terms and conditions of sale
supplied at the time of order acknowledgment.
TI warrants performance of its components to the specifications applicable at the time of sale, in accordance with the warranty in TI’s terms
and conditions of sale of semiconductor products. Testing and other quality control techniques are used to the extent TI deems necessary
to support this warranty. Except where mandated by applicable law, testing of all parameters of each component is not necessarily
performed.
TI assumes no liability for applications assistance or the design of Buyers’ products. Buyers are responsible for their products and
applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide
adequate design and operating safeguards.
TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or
other intellectual property right relating to any combination, machine, or process in which TI components or services are used. Information
published by TI regarding third-party products or services does not constitute a license to use such products or services or a warranty or
endorsement thereof. Use of such information may require a license from a third party under the patents or other intellectual property of the
third party, or a license from TI under the patents or other intellectual property of TI.
Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration
and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered
documentation. Information of third parties may be subject to additional restrictions.
Resale of TI components or services with statements different from or beyond the parameters stated by TI for that component or service
voids all express and any implied warranties for the associated TI component or service and is an unfair and deceptive business practice.
TI is not responsible or liable for any such statements.
Buyer acknowledges and agrees that it is solely responsible for compliance with all legal, regulatory and safety-related requirements
concerning its products, and any use of TI components in its applications, notwithstanding any applications-related information or support
that may be provided by TI. Buyer represents and agrees that it has all the necessary expertise to create and implement safeguards which
anticipate dangerous consequences of failures, monitor failures and their consequences, lessen the likelihood of failures that might cause
harm and take appropriate remedial actions. Buyer will fully indemnify TI and its representatives against any damages arising out of the use
of any TI components in safety-critical applications.
In some cases, TI components may be promoted specifically to facilitate safety-related applications. With such components, TI’s goal is to
help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and
requirements. Nonetheless, such components are subject to these terms.
No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) unless authorized officers of the parties
have executed a special agreement specifically governing such use.
Only those TI components which TI has specifically designated as military grade or “enhanced plastic” are designed and intended for use in
military/aerospace applications or environments. Buyer acknowledges and agrees that any military or aerospace use of TI components
which have not been so designated is solely at the Buyer's risk, and that Buyer is solely responsible for compliance with all legal and
regulatory requirements in connection with such use.
TI has specifically designated certain components as meeting ISO/TS16949 requirements, mainly for automotive use. In any case of use of
non-designated products, TI will not be responsible for any failure to meet ISO/TS16949.
Products
Applications
Audio
www.ti.com/audio
Automotive and Transportation
www.ti.com/automotive
Amplifiers
amplifier.ti.com
Communications and Telecom
www.ti.com/communications
Data Converters
dataconverter.ti.com
Computers and Peripherals
www.ti.com/computers
DLP® Products
www.dlp.com
Consumer Electronics
www.ti.com/consumer-apps
DSP
dsp.ti.com
Energy and Lighting
www.ti.com/energy
Clocks and Timers
www.ti.com/clocks
Industrial
www.ti.com/industrial
Interface
interface.ti.com
Medical
www.ti.com/medical
Logic
logic.ti.com
Security
www.ti.com/security
Power Mgmt
power.ti.com
Space, Avionics and Defense
www.ti.com/space-avionics-defense
Microcontrollers
microcontroller.ti.com
Video and Imaging
www.ti.com/video
RFID
www.ti-rfid.com
OMAP Applications Processors
www.ti.com/omap
TI E2E Community
e2e.ti.com
Wireless Connectivity
www.ti.com/wirelessconnectivity
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265
Copyright © 2013, Texas Instruments Incorporated